TOSHIBA TCD1708D TOSHIBA CCD LINEAR IMAGE SENSOR CCD (Charge Coupled Device) TCD1708D The TCD1708D is a high sensitive and low dark current 7450 elements CCD image sensor. The sensor is designed for facsimile, imagescanner and OCR. The device contains a row of 7450 elements photodiodes which provide a 24 lines/mm (600DPI) across a A3 size paper. The device is operated by 5V (pulse), and 5V power supply. FEATURES Number of Image Sensing Elements : 7450 elements @ Image Sensing Element Size @ Photo Sensing Region : Clock centers High sensitive and low voltage > 4.7 um by 4.7 em on 4.74m dark signal pn photodiode : 2 phase (5 V) MAXIMUM RATINGS (Note 1) WDIP22-G-400-2.54D (C) CHARACTERISTIC SYMBOL RATING UNIT Clock Pulse Voltage Ve Shift Pulse Voltage VSH _03~7 Reset Pulse Voltage VRS Vv Clamp Pulse Voltage Vcp Power Supply Voltage Vop -0.3~7 Operating Temperature Topr 0~60 a @ Storage Temperature Tstg -25~85 C (Note 1) : All voltage are with respect to SS terminals (Ground). Weight : 5.29 (Typ.) PIN CONNECTIONS \/ os] 1 1 22] os2 op | 2 21] ss ne[ 3 20] ne ce [a4 19] cp RS] 5 18] RS g23 [eo [17] $28 ss [7 16] $s g20 [2 15] g2e gio [3 14] gE ne | 10 13] ne ne} 7450 12] SH (TOP VIEW) 2001-10-15TOSHIBA TCD1708D CIRCUIT DIAGRAM CP RS) 2B $s p2e pie C5 (17 C6) (15) (14) ss @) SIGNAL OS2 @2- OUTPUT CCD ANALOG SHIFT REGISTER 2 BUFFER SHIFT GATE 2 12) SH elele| ou... AIR/alafal a PHOTO F/B) RI QI... a/9 alala slalsl?|?|? DIODE SIS (Sala ala SHIFT GATE 1 SIGNAL OS1 1)} OUTPUT CCD ANALOG SHIFT REGISTER 1 BUFFER OX) @ Gy) oD CP RS 2B SS 620 = 10 PIN NAME $1E,O Clock (Phase 1) $2E,O Clock (Phase 2) $2B Final Stage Clock (Phase 2) SH Shift Gate RS Reset Gate cP Clamp Gate OS1 Signal Output 1 OS2 Signal Output 2 OD Power SS Ground NC Non Connection 2 2001-10-15TOSHIBA TCD1708D OPTICAL / ELECTRICAL CHARACTERISTICS (Ta = 25C, Vop = 5V, V = VsH = Vrs = Vcp = 5V (PULSE), f = 1 MHz, tinT (INTEGRATION TIME) = 10 ms, LIGHT SOURCE = DAYLIGHT FLUORESCENT LAMP, LOAD RESISTANCE = 100 kQ) CHARACTERISTIC SYMBOL MIN. TYP. MAX. UNIT NOTE Sensitivity R 12 15 18 | V/Ix-s . . PRNU 4 10 % (Note 2) Photo Response Non Uniformity PRNU (3) = 6 1D mV (Note 8) Saturation Output Voltage VSAT 1.0 1.3 Vv (Note 3) Saturation Exposure SE 0.05 0.08 Ix-s (Note 4) Dark Signal Voltage VDRK 0.5 3 mV (Note 5) Dark Signal Non Uniformity DSNU 0.5 10 mv (Note 5) DC Power Dissipation PD _ 80 160 mw Total Transfer Efficiency TTE 92 98 % Output Impedance Zo 0.2 1 kO Dynamic Range DR 2600 (Note 6) . Vos! 2.0 2.5 3.5 DC Signal Output Voltage Vos2 70 75 35 Vv (Note 7) DC Differential Error Voltage \os1-Vosal _= 300 mV Random Noise NDe 1.0 mV (Note 9) (Note 2) : Measured at 50% of SE (Typ.) Definition of PRNU : PRNU = = x 100 (%) Where Z is average of total signal outputs and Ax is maximum deviation from % under uniform illumination. (Channel 1) In the case of 3725 elements (Channel 2), the condition is the same as above too. (Note 3) : Vsat is defined as minimum saturation output voltage of all effective pixels. V (Note 4) : Definition of SE:SE = AT (Ix-s) 3 2001-10-15TOSHIBA TCD1708D (Note 5) : Vprk is defined as average dark signal voltage of all effective pixels. DSNU is defined as different voltage between VDRK and VMDK when VMDK is maximum dark signal voltage. os - VDRK L DSNU VSAT VDRK VprK is proportional to tint (Integration Time). So the shorter tiy7 condition makes wider DR values. (Note 6) : Definition of DR: DR = (Note 7) : DC signal output voltage and DC compensation output voltage are defined as follows: os $s (Note 8) : PRNU (3) is defined as maximum voltage with next pixel, where measured 5% of SE (Typ.) 4 2001-10-15TOSHIBA TCD1708D (Note 9) : Random noise is defined as the standard deviation (sigma) of the output level difference between two adjacent effective pixels under no illumination (i.e. dark condition) calculated by the following procedure. 1) 2) 3) 4) 5) 6) VIDEO OUTPUT VIDEO OUTPUT OUTPUT WAVEFORM (EFFECTIVE PIXELS UNDER DARK CONDITION) PIXEL n PIXEL n+ 1 Two adjacent pixels (pixel n and n + 1) in one reading are fixed as measurement points. Each of the output levels at video output periods averaged over 200 nanosecond period to get Vn and Vn + 1. Vn + 1 is subtracted from Vn to get AV. AV = Vn - Vn + 1 The standard deviation of AV is calculated after procedure 2) and 3) are repeated 30 times (30 readings). 30 wv. 1 30 . _ 1 AVil| - AV)? Aveo; 2,4Vl 301 21 (4Vil - 4) Procedure 2), 3) and 4) are repeated 10 times to get 10 sigma values. - 10 | o* 10 j 2, a @ value calculated using the above procedure is observed V2 times larger than that measured relative to the ground level. So we specify the random noise as follows. 1 V2 Random noise = 5 2001-10-15TOSHIBA TCD1708D OPERATING CONDITION CHARACTERISTIC SYMBOL MIN. TYP. MAX. UNIT Clock Pulse Voltage a = Wi2e 5 - 2 = V inal lock | "H" Level 4.75 5 5.25 Final Stage Clock Voltage 7." Level Vd2B 0 = 03 Vv H Level Vg0, EH V0, EH |vg0, EH" Shift Pulse Voltage (Note 10) | ,,,, VsH - 0.25 V L Level 0 0.3 Reset Pulse Voltage Hi" evel Vrs 47 2.25 V "L Level 0 0.3 H Level 4.75 5 5.25 Clamp Pulse Voltage 7" Level Vep 0 = 03 Vv Power Supply Voltage Vob 4.75 5 5.25 Vv (Note 10) : Vg0, EH means the high level voltage of V0 and VgE when SH pulse is high level. CLOCK CHARACTERISTICS (Ta = 25C) CHARACTERISTIC SYMBOL MIN. TYP. MAX. UNIT Clock Pulse Frequency f 1 15 MHz Reset Pulse Frequency fps 1 15 MHz Clock Capacitance (Note 11) CE 300 pF cgO 300 Final Stage Clock Capacitance CB 10 pF Shift Gate Capacitance CSH 300 pF Reset Gate Capacitance Crs _ 10 _ pF Clamp Gate Capacitance Ccp 10 pF (Note 11): Vop =5V 6 2001-10-15TCD1708D TOSHIBA POllad dd Zy POlHad SH Ly (ZX SLNAWAT3 8) SLNdLNO AWWNG (ZX SLN3IN413 262) GOMad LNOGVAY ANT LI (2 X SLN3WA313 79) SLNdLNO AWWNG (Z & SLNJINI14 ) tz x SLNAW313 &) 1 le J } o (x (ZX SLN3WN3749 SZZ) (@ X SLNAW414 8p) SLNdLNO G1HS LHON (2 x , . SLNIINI 14 P) SLNAdLNO TYNOIS SINIW3139 EL (2 x INAWA]T4 1} SiNdLNO SLNdLNO SINAGLNO 1S3L AWINa 7 AWWNG Oo 90 0 90 BID0 DBD UOU!luAu Hw wo wmlo oo @g Qo 9U OU OD OU ODO OU CO OID oO Co 9 = = = = = = ~ ~ ~ a Ne a= = = hk bh ka) lat Lad a lad MN ND NI Ww a = PF Bw Ww Wliw WwW NIP fF p NN NON w => Oo MN UW Ow = Oo NI (QWIL NOLLVYSSLNI) LN - >| ad8s04L0D1 LYVHD ONIIANIL 2001-10-15TOSHIBA TCD1708D TIMING REQUIREMENTS SH, 1 Timing t2 t3 t4 a + SH / \ t! tS #1E, O \ SH, RS, CP Timing SH / \ co t19 t17 . /\ RS, CP period (Note 12) t18 t16 g2, RS, CP, OS Timing $2B RS t6 7 t8 9 t10 FY = t17 t16 Y \_ t12 t13 t14 t11 0S1 OS2 [\ ZT LA g $1, 42 CROSS POINT #1 #2 GND \ \ \1.5 V (MIN.)\ 1.5 V (MIN) (Note 12) : Each RS and CP pins put to Low level during this period. 2001-10-15TOSHIBA TCD1708D CHARACTERISTIC SYMBOL MIN. (Note 1 3) | MAX. | UNIT Pulse Timing of SH and 1E, 10 t1, t5 200 500 ns SH Pulse Rise Time, Fall Time t2, t4 0 50 ns SH Pulse Width t3 1000 1500 5000 ns $2B Pulse Rise Time, Fall Time t6, t7 0 20 ns RS Pulse Rise Time, Fall Time t8, t10 0 20 ns RS Pulse Width t9 10 100 ns Video Data Delay Time (Note 14) t11 20 ns CP Pulse Rise Time, Fall Time t12, t14 0 20 ns CP Pulse Width t13 10 200 ns Pulse Timing of 2B and CP t15 0 50 ns Pulse Timing of RS and CP 16 0 o ns t17 10 100 Pulse Timing of SH and CP t18 200 ns Pulse Timing of SH and RS t19 200 ns (Note 13) : TYP. is the case of fps = 1.0 MHz (Note 14) : TLoad Resistance is 100 kQ 9 2001-10-15TOSHIBA TCD1708D CAUTION 1. Window Glass The dust and stain on the glass window of the package degrade optical performance of CCD sensor. Keep the glass window clean by saturating a cotton swab in alcohol and lightly wiping the surface, and allow the glass to dry, by blowing with filtered dry Nz. Care should be taken to avoid mechanical or thermal shock because the glass window is easily to damage. 2. Electrostatic Breakdown Store in shorting clip or in conductive foam to avoid electrostatic breakdown. CCD Image Sensor is protected against static electricity, but interior puncture mode device due to static electricity is sometimes detected. In handing the device, it is necessary to execute the following static electricity preventive measures, in order to prevent the trouble rate increase of the manufacturing system due to static electricity. a. Prevent the generation of static electricity due to friction by making the work with bare hands or by putting on cotton gloves and non-charging working clothes. b. Discharge the static electricity by providing earth plate or earth wire on the floor, door or stand of the work room. c. Ground the tools such as soldering iron, radio cutting pliers of or pincer. It is not necessarily required to execute all precaution items for static electricity. It is all right to mitigate the precautions by confirming that the trouble rate within the prescribed range. 3. Incident Light CCD sensor is sensitive to infrared light. Note that infrared light component degrades resolution and PRNU of CCD sensor. 4. Lead Frame Forming Since this package is not strong against mechanical stress, you should not reform the lead frame. We recommend to use a IC-inserter when you assemble to PCB. 5. Soldering Soldering by the solder flow method cannot be guaranteed because this method may have deleterious effects on prevention of window glass soiling and heat resistance. Using a soldering iron, complete soldering within ten seconds for lead temperatures of up to 260C, or within three seconds for lead temperatures of up to 350C. 10 2001-10-15TOSHIBA TCD1708D PACKAGE DIMENSIONS WDIP22-G-400-2.54D (C) Unit in mm (Note 1) 3 11.540.8 35 (4.74mx 7450) o7t01 22 Aake ere YT 1 -e no on oo 0 3 *! oO + H ~ N lO S| | % 7 2 (Note 2) t 1.740.3 4.19+0.5 (Note 1) : No.1 SENSOR ELEMENT ($1) TO EDGE OF PACKAGE. (Note 2) : TOP OF CHIP TO BOTTOM OF PACKAGE. (Note 3) : GLASS THICKNES (n = 1.5) Weight : 5.2g (Typ.) 11 2001-10-15TOSHIBA TCD1708D RESTRICTIONS ON PRODUCT USE 000707EBA @ TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the Handling Guide for Semiconductor Devices, or TOSHIBA Semiconductor Reliability Handbook etc.. @ The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (Unintended Usage). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. @ The products described in this document are subject to the foreign exchange and foreign trade laws. @ The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. @ The information contained herein is subject to change without notice. 12 2001-10-15