Description
The AT27LV010 chip is a low power, low voltage 1,048,576 bit ultraviolet erasable and
electrically programmable read only memory (EPROM) organized as 128K x 8 bits. It re-
quires only one supply in the range of 3.0 to 5.5 V in normal read mode operation, making it
ideal for portable systems.
With a typical power draw of only 10 mW at 1 MHz and VCC at 3.3 V, the AT27LV010
draws le ss th an one-fif th the power of a s tandard 5 -V EP ROM. St andby mode supply c urr ent
is typically less than 1 µA at 3.3 V. (continued)
Pin Configurations
Pin Name Function
A0-A16 Addresses
O0-O7 Outputs
CE Chip Enable
OE Output Enable
PGM Program Strobe
NC No Connect
1 Megabit
(128K x 8)
Low Voltage
UV
Erasable
CMOS
EPROM
23
14
13
12
11
7
8
9
10
4
1
5
6
A11
A9
VCC
A14
A13
A8
O7
CE
A10
OE
O6
O5
O4
O3
22
24
25
21
20
18
19
17
26
27
32
A12
A7
GND
O2
O1
A0
O0
A1
A2
A6
A5
A3
A4
VPP
A15
A16 31
30 NC
PGM2
3
15
16
28
29
CDIP, PDIP Top View
VCC
VPP NCA12
A2
A0
A1
A4
A3
A5
A7 30
31
32
1
2
3
4
20
19
18
17
16
15
14
A15
A16 PGM
O7
O2
GNDO1 O3 O5O6O4
O0 CE
A10
OE
A9
A8
A13
A145
6
7
8
9
10
11
12
13
29
28
27
26
25
24
23
22
21
A6
A11
LCC, PLCC Top View
Features
Wide Power Supply Range, 3.0 V to 5.5 V
Fast Read Access Time - 120 ns
Compatible with JEDEC Standard AT27C010
Low Power 3.3-Volt CMOS Operation
20 µA max. Standby
29 mW max. Active at 5 MHz for VCC = 3.6 V
138 mW max. Active at 5 MHz for VCC = 5.5 V
Wide Selection of JEDEC Standard Packages
32-Lead 600-mil PDIP and Cerdip
32-Pad PLCC and LCC
32-Lead TSOP
High Reliability CMOS Technology
2000 V ESD Protection
200 mA Latchup Immunity
Rapid Programming - 100 µs/byte (typical)
Two-line Control
CMOS and TTL Compatible Inputs and Outputs
Integrated Product Identification Code
Commercial and Industrial Temperature Ranges
A11 A9
A13
A8
NC
PGM
A14
A12
A6
A7
A16
A15
VPPVCC
12
43
65
10 9
7
8
14 13
11
12 O0 O1
A0
A1
O3 O4
GND
O2
O6
O5
CE
O7
A10 OE
25
24
22 23
20 19
21
28
26 27
30 29
31
32
17
18 A3 A215
16
A5 A4
TSOP Top View
Type 1
AT27LV010
3-39
Operating Modes
Mode \ Pin CE OE PGM Ai VPP VCC Outputs
Read VIL VIL X
(1) Ai X VCC DOUT
Output Disable X VIH XXXV
CC High Z
Standby VIH XXXXV
CC High Z
Rapid Program(2) VIL VIH VIL Ai VPP VCC (2)DIN
PGM Verify(2) VIL VIL VIH Ai VPP VCC (2)DOUT
PGM Inhibit(2) VIH XX X V
PP VCC (2)High Z
Product
Identification(2),(4) VIL VIL XA9=VH (3)
A0=VIH or VIL
A1-A16=VIL XV
CC (2)Identification
Code
Notes: 1. X can be VIL or VIH.
2. Refer to Programming characteristics. Programming
modes require VCC 4.5 V.
3. VH = 12.0 ± 0.5 V.
4. Two identifier bytes may be selected. All Ai inputs are held
low (VIL), except A9 which is set to V H and A0 which is
toggled low (VIL) to select the Manufacturer’s Identification
byte and high (VIH) to select the Device Code byte.
Temperature Under Bias ..................-40oC to +85 oC
Storage Temperature......................-65oC to +125oC
Voltage on Any Pin with
Respect to Ground........................-2.0 V to +7.0 V(1)
Voltage on A9 with
Respect to Ground .....................-2.0 V to +14.0 V(1)
VPP Supply Voltage with
Respect to Ground......................-2.0 V to +14.0 V(1)
Integrated UV Erase Dose..............7258 W•sec/cm2
*NOTICE: Stresses beyond those listed under "Absolute Maxi-
mum Ratings" may cause permanent damage to the device.
This is a stress rating only and functional operation of the de-
vice at these or any other conditions beyond those indicated in
the operational sections of this specification is not implied.
Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.
Notes:
1. Minimum voltage is -0.6 V dc which may undershoot to -2.0
V for pulses of less than 20 ns. Maximum output pin voltage
is VCC + 0.75 V dc which may be exceeded if certain precau-
tions are observed (consult application notes) and which may
overshoot to +7.0 V for pulses of less than 20 ns.
Absolute Maximum Ratings*
The AT27LV010 comes in a choice of industry standard
JEDEC-approved packages, including: one-time programmable
(OTP) plastic PDIP, PLCC, and TSOP, as well as windowed
ceramic Cerdip and LCC. All devices feature two-line control
(CE, OE) to give designers the flexibility to prevent bus
contention.
The AT27LV010 operating with VCC at 3.0 V produces TTL
level outputs that are compatible with standard TTL logic de-
vices operating at VCC = 5.0 V.
Atmel’s 27LV010 has additional features to ensure high quality
and efficient production use. The Rapid Programming Algo-
rithm reduces the time required to program the part and guaran-
tees reliable programming. Programming time is typically only
100 µs/byte. The Integrated Product Identification Code elec-
tronically identifies the device and manufacturer. This feature is
used by industry standard programming equipment to select the
proper programming algorithms and voltages. The AT27LV010
programs identically as an AT27C010.
De s cr i pti o n (Continued)
Erasure Characteristics
The entire memory array of the AT27LV010 is erased (all out-
puts read as VOH) after exposure to ultraviolet light at a wave-
length of 2537 Å. Complete erasure is assured after a minimum
of 20 minutes exposure using 12,000 µW/cm2 intensity lamps
spaced one inch away from the chip. Minimum erase time for
lamps at other intensity ratings can be calculated from the min-
imum integra ted erasure d os e of 15 Wsec/cm2. To prevent un-
intentional erasure, an opaque label is recommended to cover
the clear window on any UV erasable EPROM which will be
subjected to continuous fluorescent indoor lighting or sunlight.
OE, CE AND
PROGRAM LOGIC
Y DECODER
X DECODER
Y-GATING
CELL MATRIX
IDENTIFICATION
OUTPUT
BUFFERS
GND
VPP
OE
CE
A0-A16
ADDRESS
INPUTS
DATA OUTPUTS
O0 - O7
VCC
PGM
Block Diagram
3-40 AT27LV010
A.C. Characteristics for Read Operation (VCC = 3.0V to 5.5V)
AT27LV010
-12 -15 -20 -25
Symbol Parameter Condition Min Max Min Max Min Max Min Max Units
tACC (3)Address to Output Delay CE = OE = VIL Com. 120 150 200 250 ns
Ind. 120 150 200 250 ns
tCE (2)CE to Output Delay OE = VIL 120 150 200 250 ns
tOE (2,3)OE to Output Delay CE = VIL 50 60 70 100 ns
tDF
(4,5)OE or CE High to Output
Float 40 50 50 50 ns
tOH Output Hold from Address,
CE or OE, whichever
occurred first 0 0 0 0 ns
Notes: 2, 3, 4, 5. - see AC Waveforms for Read Operation.
D.C. and A.C. Operating Conditions for Read Operation
AT27LV010
-12 -15 -20 -25
Operating Temperature
(Case) Com. 0oC - 70oC0
o
C - 70oC0
o
C - 70oC0
o
C - 70oC
Ind. -40oC - 85oC -40oC - 85oC -40oC - 85oC -40oC - 85oC
VCC Power Supply 3.0 V to 5.5 V 3.0 V to 5.5 V 3.0 V to 5.5 V 3.0 V to 5.5 V
D.C. and Operating Characteristics for Read Operation
(VCC = 3.0 V to 5.5 V unless otherwise specified)
Symbol Parameter Condition Min Max Units
ILI Input Load Current VIN = 0 V to VCC ±1µA
ILO Output Leakage Current VOUT = 0 V to VCC ±5µA
IPP1 (2)VPP (1) Read/Standby Current VPP = VCC 10 µA
ISB VCC (1) Standby Current ISB1 (CMOS), CE = VCC ± 0.3 V VCC = 3.6 V 20 µA
VCC = 5.5 V 100 µA
ISB2 (TTL ), CE = 2.0 to VCC + 0.5 V VCC = 3.6 V 100 µA
VCC = 5.5 V 1 mA
ICC VCC Active Current ICC1 f = 5 MHz, IOUT = 0 mA,
CE = VIL, VCC = 3.6 V Com. 8 mA
Ind. 10 mA
ICC2 f = 5 MHz, IOUT = 0 mA
CE = VIL, VCC = 5.5 V Com. 25 mA
Ind. 30 mA
VIL Input Low Voltage -0.6 0.8 V
VIH Input High Voltage 2.0 VCC+0.5 V
VOL Output Low Voltage IOL = 2.0 mA .4 V
IOL = 100 µA.2V
V
OH Output High Voltage IOH = -2.0 mA 2.4 V
IOH = -100 µAV
CC-0.2 V
Notes: 1. VCC must be applied simultaneously or before V PP, and
removed simultaneously or after VPP.2. VPP may be connected directly to VCC, except during program-
ming. The supply current would then be the sum of ICC and IPP.
= Advance Information
= Advance Information
AT27LV010
3-41
Pin Capacitance (f = 1 MHz, T = 25˚C) (1)
Typ Max Units Conditions
CIN 4 8 pF VIN = 0 V
COUT 812pFV
OUT = 0 V
Notes: 1. Typical values for 5-V supply voltage. This parameter is only sampled and is not 100% tested.
ADDRESS
OUTPUT
HIGH Z
OUTPUT
OE
CE
tACC
tOE
tDF
tOH
tCE
VALID
ADDRESS VALID
A.C. Waveforms for Read Operation (1)
Notes:
1. Timing measurement references are 0.8 V and
2.0 V. Input AC driving levels are 0.45 V and
2.4 V. See Input Test Waveforms and Measure-
ment Levels.
2. OE may be delayed up to tCE-tOE after the fall-
ing edge of CE without impact on t CE.
3. OE may be delayed up to tACC-tOE after the ad-
dress is valid without impact on tACC.
4. This parameter is only sampled and is not 100%
tested.
5. Output float is defined as the point when data is
no longer driven.
VALID
PROGRAM (VERIFY)
READ
6.5V
5.0V
VIH
VIL
tDS
tAS
tDH
tVCS
tAH
5.0V tVPS
tPW
tCES
13.0V
VIL
VIH
VIH
VIL
VIL
VIH
VIH
VIL
DATA OUT
tDFP
tOE
DATA IN
tOES
ADDRESS STABLE
ADDRESS
DATA
VCC
VPP
CE
PGM
OE
Programming Waveforms (1)
Notes:
1. The Input Timing Reference is 0.8 V for VIL and
2.0 V for VIH.
2. tOE and tDFP are characteristics of the device but
must be accommodated by the programmer.
3. When programming the AT27LV010 a 0.1-µF
capacitor is required across VPP and ground to
suppress spurious voltage transients.
3.3K
(1N914)
1.3V
CL
OUTPUT
PIN
Output Test Load
Note: CL = 100 pF
including jig capacitance.
0.45V
2.4V 2.0
0.8
AC
DRIVING
LEVELS
AC
MEASUREMENT
LEVEL
tR, tF < 20 ns (10% to 90%)
Input Test Waveform and Measurement Level
3-42 AT27LV010
A.C. Programming Characteristics
TA = 25 ± 5oC, VCC = 6.5 ± 0.25 V, VPP = 13.0 ± 0.25 V
Sym-
bol Parameter
Test
Conditions*
(see Note 1) Limits Units
Min Max
tAS Address Setup Time 2 µs
tCES CE Setup Time 2 µs
tOES OE Setup Time 2 µs
tDS Data Setup Time 2 µs
tAH Address Hold Time 0 µs
tDH Data Hold Time 2 µs
tDFP OE High to Out-
put Float Delay (Note 2) 0 130 ns
tVPS VPP Setup Time 2 µs
tVCS VCC Setup Time 2 µs
tPW PGM Program
Pulse Width (Note 3) 95 105 µs
tOE Data Valid from OE 150 ns
*A.C. Conditions of Test:
Input Rise and Fall Times (10% to 90%) . . . . . . . . . 20 ns
Input Pulse Levels . . . . . . . . . . . . . . . . . . . 0.45 V to 2.4 V
Input Timing Reference Level . . . . . . . . . . 0.8 V to 2.0 V
Output Timing Reference Level . . . . . . . . . 0.8 V to 2.0 V
Notes:
1. VCC must be applied simultaneously or before VPP and removed
simultaneously or after VPP.
2. This parameter is only sampled and is not 100% tested.
Output Float is defined as the point where data is no longer
driven — see timing diagram.
3. Program Pulse width tolerance is 100 µsec ± 5%.
Atmel’s 27LV010 Integrated
Product Identification Code(1)
Codes Pins Hex
Data
A0 O7 O6 O5 O4 O3 O2 O1 O0
Manufacturer0000111101E
Device Type100000101O5
Note: 1. The AT27LV010 has the same Product Identification
Code as the AT27C010/L. Both are programming
compatible.
D.C. Programming Characteristics
TA = 25 ± 5oC, VCC = 6.5 ± 0.25 V, VPP = 13.0 ± 0.25 V
Sym-
bol Parameter Test
Conditions Limits Units
Min Max
ILI Input Load Current VIN=VIL,VIH 10 µA
VIL Input Low Level (All Inputs) -0.6 0.8 V
VIH Input High Level 2.0 VCC+1V
VOL Output Low Volt. IOL=2.1 mA .45 V
VOH Output High Volt. IOH=-400 µA2.4 V
ICC2 VCC Supply Current
(Pr ogram and Verify) 40 mA
IPP2 VPP Supply
Current CE=PGM=VIL 20 mA
VID A9 Product
Identification
Voltage 11.5 12.5 V
Rapid Programming Algorithm
A 100 µs PGM pulse width is used to program. The address is
set to the first location. VCC is raised to 6.5 V and V PP is raised
to 13.0 V. Each address is first programmed with one 100 µs
PGM pulse without verification. Then a verification/ repro-
gramming loop is executed for each address. In the event a byte
fails to pass verification, up to 10 successive 100 µs pulses are
applied with a verification after each pulse. If the byte fails to
verify after 10 pulses have been applied, the part is considered
failed. After the byte verifies properly, the next address is se-
lected until all have been checked. VPP is then lowered to 5.0 V
and VCC to 5.0 V. All bytes are read again and compared with
the original data to determine if the device passes or fails.
VCC = 5.0V
VCC = 6.5V
VPP=13.0V
ALL BYTES
COMPARE
DATA
TO ORIGINAL
PASSED
DEVICE
DEVICE
FAILED
FAIL
PASS
ADDR = FIRST LOCATION
START
X = 0
PROGRAM ONE 100 uS PULSE
INCREMENT X
YES
VERIFY
BYTE
X = 10?
FAIL
PASS
ADDR = FIRST LOCATION
ADDR.?
LAST
ADDRESS
INCREMENT NO
YES
PROGRAM ONE 100 uS PULSE NO
INCREMENT
ADDRESS
LAST
ADDR.?
YES
VPP=5.0V
NO
AT27LV010
3-43
tACC
(ns)
ICC (mA)
VCC = 3.6 V Ordering Code Package Operation Range
Active Standby
120 8 0.02 AT27LV010-12DC 32DW6 Commercial
AT27LV010-12JC 32J (0˚C to 70˚C)
AT27LV010-12LC 32LW
AT27LV010-12PC 32P6
AT27LV010-12TC 32T
120 10 0.02 AT27LV010-12DI 32DW6 Industrial
AT27LV010-12JI 32J (-40˚C to 85˚C)
AT27LV010-12LI 32LW
AT27LV010-12PI 32P6
AT27LV010-12TI 32T
150 8 0.02 AT27LV010-15DC 32DW6 Commercial
AT27LV010-15JC 32J (0˚C to 70˚C)
AT27LV010-15LC 32LW
AT27LV010-15PC 32P6
AT27LV010-15TC 32T
150 10 0.02 AT27LV010-15DI 32DW6 Industrial
AT27LV010-15JI 32J (-40˚C to 85˚C)
AT27LV010-15LI 32LW
AT27LV010-15PI 32P6
AT27LV010-15TI 32T
200 8 0.02 AT27LV010-20DC 32DW6 Commercial
AT27LV010-20JC 32J (0˚C to 70˚C)
AT27LV010-20LC 32LW
AT27LV010-20PC 32P6
AT27LV010-20TC 32T
200 10 0.02 AT27LV010-20DI 32DW6 Industrial
AT27LV010-20JI 32J (-40˚C to 85˚C)
AT27LV010-20LI 32LW
AT27LV010-20PI 32P6
AT27LV010-20TI 32T
250 8 0.02 AT27LV010-25DC 32DW6 Commercial
AT27LV010-25JC 32J (0˚C to 70˚C)
AT27LV010-25LC 32LW
AT27LV010-25PC 32P6
AT27LV010-25TC 32T
250 10 0.02 AT27LV010-25DI 32DW6 Industrial
AT27LV010-25JI 32J (-40˚C to 85˚C)
AT27LV010-25LI 32LW
AT27LV010-25PI 32P6
AT27LV010-25TI 32T
= Advance Information
Ordering Information
3-44 AT27LV010
Package Type
32DW6 32 Lead, 0.600" Wide, Windowed, Ceramic Dual Inline Package (Cerdip)
32J 32 Lead, Plastic J-Leaded Chip Carrier OTP (PLCC)
32LW 32 Pad, Windowed, Ceramic Leadless Chip Carrier (LCC)
32P6 32 Lead, 0.600" Wide, Plastic Dual Inline Package OTP (PDIP)
32T 32 Lead, Plastic Thin Small Outline Package OTP (TSOP)
Ordering Information
AT27LV010
3-45