MILITARY DATA SHEET Original Creation Date: 03/12/96 Last Update Date: 07/30/96 Last Major Revision Date: 03/12/96 MN54F38-X REV 1A0 QUAD 2-INPUT NAND BUFFER (OPEN COLLECTOR) General Description The device contains four independent gates, each of which performs the logic NAND function. The open-collector outputs require external pull-up resistors for proper logical operation. Industry Part Number NS Part Numbers 54F38 54F38DMQB 54F38FMQB 54F38LMQB Prime Die M038 Processing Subgrp Description MIL-STD-883, Method 5004 1 2 3 4 5 6 7 8A 8B 9 10 11 Quality Conformance Inspection MIL-STD-883, Method 5005 1 Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional tests at Switching tests at Switching tests at Switching tests at Temp ( oC) +25 +125 -55 +25 +125 -55 +25 +125 -55 +25 +125 -55 MILITARY DATA SHEET MN54F38-X REV 1A0 (Absolute Maximum Ratings) (Note 1) Storage Temperature -65 C to +150 C Ambient Temperature under Bias -55 C to +125 C Junction Temperature under Bias -55 C to +175 C Vcc Pin Potential to Ground Pin -0.5V to +7.0V Input Voltage (Note 2) -0.5V to +7.0V Input Current (Note 2) -30 mA to +5.0mA Voltage Applied to Output in HIGH State (with Vcc=0V) Standard Output TRI-STATE Output Current Applied to Output in LOW State (Max) -0.5V to Vcc -0.5V to +5.5V twice the rated Iol(mA) ESD Last Passing Voltage (Min) 4000V Note 1: Note 2: Absolute Maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Either voltage limit or current limit is sufficient to protect inputs. Recommended Operating Conditions Free Air Ambient Temperature Commercial Military Supply Voltage Military Commercial 0 C to +70 C -55 C to +125 C +4.5V to +5.5V +4.5V to +5.5V 2 MILITARY DATA SHEET MN54F38-X REV 1A0 Electrical Characteristics DC PARAMETER (The following conditions apply to all the following parameters, unless otherwise specified.) DC: VCC 4.5V to 5.5V, Temp range: -55C to 125C SYMBOL PARAMETER CONDITIONS NOTES PINNAME MIN MAX UNIT SUBGROUPS IIH Input High Current VCC=5.5V, VM=2.7V, VINH=5.5V, VINL=0.0V 1, 3 INPUTS 20 uA 1, 2, 3 IBVI Input High Current VCC=5.5V, VM=7.0V, VINH=5.5V, VINL=0.0V 1, 3 INPUTS 100 uA 1, 2, 3 IIL Input LOW Current VCC=5.5V, VM=0.5V, VINH=5.5V, VINL=0.0V 1, 3 INPUTS -1.2 mA 1, 2, 3 IOH Open Collector Output VCC=4.5V, VM=4.5V, VIL=0.8V, VINH=5.5V 1, 3 OUTPUTS 250 uA 1, 2, 3 VOLB Output LOW Voltage VCC=4.5V, VIL=0.8V, VIH=2.0V, IOLB=48mA, VINH=5.5V 1, 3 OUTPUTS .55 V 1, 2, 3 VCD Input Clamp Diode Voltage VCC=4.5V, IM=-18mA, VINH=5.5V 1, 3 INPUTS -1.2 V 1, 2, 3 ICCH Supply Current VCC=5.5V, VINL=0.0V, VINH=5.5V 1, 3 VCC 7.0 mA 1, 2, 3 ICCL Supply Current VCC=5.5V, VINL=0.0V, VINH=5.5V 1, 3 VCC 30.0 mA 1, 2, 3 AC PARAMETER (The following conditions apply to all the following parameters, unless otherwise specified.) AC: CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns SEE AC FIGS tpLH tpHL Propagation Delay Propagation Delay Note 1: Note 2: Note 3: Note 4: VCC=5.0V @25C, VCC=4.5V & 5.5V @-55/125C VCC=5.0V @25C, VCC=4.5V & 5.5V @-55/125C 2, 4 An/Bn to On 6.5 12.5 ns 9 2, 4 An/Bn to On 6.5 14.5 ns 10, 11 2, 4 An/Bn to On 1.0 5.0 ns 9 2, 4 An/Bn to On 1.0 5.5 ns 10, 11 Screen tested 100% on each device at +25C, +125C & -55C temperature, subgroups A1, 2, 3, 7 & 8. Screen tested 100% on each device at +25C temperature only, subgroup A9. Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C & -55C temperature, subgroups A1, 2, 3, 7 & 8. Sample tested (Method 5005, table 1) on each MFG. lot at +25C subgroup A9, and periodically at +125C & -55C temperature, subgroups 10 & 11. 3