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Qualification Test Sequence ... cee cenrewcreer ee esssneeerns TOSting wrsassaccnccsnnccecsseceeseenenenersens Summary of Test Test Test Test Test Test Test Test Test Test Test Test Test Test Test Test Test Group Group Group Group Group Group Group Group Group Group Group Group Group Group Group Group Group Validation #1 #2 #3 #4 #5 #6 #7 #8 #9 #10 #11 #12 #13 #14 #15 #16 #17 eee eee ea eee weet ee ee eh hhh eh ee | ee epee e eer eaenee tree e eee eee eee eh ee hh ah Par a ee ee ee ee ee eh eae ew eeeern se eee eee eases ae ee ee ee ee ee Pe ee ee ee ee ee aanen Pe ee ae nearer eee ee ee eee rere eee eee eavpaedee ee eee meee eee eae eee ee ee eee eee peepee ee ee eee rae eer eae eee eee eee hee ee ee Pa eae ee ee ee ee eenee ener eee ree ee eer ee eee re eee aeneeee eam e rere eee Pee eee os eee owen saereeeenr eae treme eee eee eh ee aean eens ee eer neon a ee ee ee ee eee ere eaaeeae hee eee eee eee eee ee hee Ohh ae aeacer ere ee eee eee (CTL1001-201-063/LABREP (7) emer ee eee eer ere ar ee Page Page Page Page Page Page Page Page Page Page Page Page Page Page Page Page Page Page Page Page Page Page Page Page Page Page - Owens DUP www rN Pee bet pe et ete pet aA alin ee & ow reRIGHTS RESERVED. AMP PRODUCTS MAY BE COVERED BY U.S. AND BY AMP INCORPORATED HARRISBURG, PA. ALL INTERNATIONAL FOREIGN PATENTS ANDIOR PATENTS PENDING. COPYRIGHT 1988 - AMP QUALIFICATION TEST REPORT Connector, SDL System AMP* Specification 108-2047, Rev. 0 501-34 Rev. B 3? 6 <v' Product Specification: 108-2047, Rev. 0 5 CTL No.: CTL1001-201-063 Date! May 12, 1986 Classification: Unrestricted Distribution: 02 Revise Per ECN B-4862 *Trademark of AMP Incorporated Corporate Test Laboratory Harrisburg, Pennsylvania501-34 AM ED HARRISBURG, PENNSYLVANIA 17105 @ PHONE: 717-564-0100 @ TWX 510-6 57-4110 CORPORATE TEST LABORATORY Product Qualification Test Report Connector, SDL System 1.1 1.2 1.3 Introduction Purpose Testing was conducted to determine product performance when tested to the requirements of AMP Product Specification 108-2047, Rev. 0. Scope This report covers the electrical and mechanical performance of the SDL Connector System, made by the Connector and Electronic Products Group. Testing was performed between January 29, 1986 and April 25, 1986. Conclusions The SDL Connector System conforms to the performance requirements of the product specification. Ne failures were observed, even among those samples which exhibited crazing of the plug housing.501-34 Page 2 1.4 1.5 Product Description The system consists of a printed circuit board mounted shielded receptacle, shielded plug connector, and shielded cable. Receptacle housings are preloaded with contacts and a shield for direct receptacle assembly to a printed circuit board and the mounting panel. Plug housings are preloaded with contacts for mass termination of the plug to the shielded cable. The system is designed to be used in class 2 circuits at voltages as defined by The National Electrical Code Table 725~31 (a) and (b). Test Samples The following parts were tested: Quantity Part Number Description Wire 20 5-520423-1 SDL 4 Pos, Plug AWG 24, Flat 10 -520532-1 SDL 4 Pos. Plug AWG 28, Round 30 5-520421-1 SDL 4 Pos, Receptacle coon 10 5-520423-2 SOL 6 Pos. Plug AWG 24, Flat 10 5-5204212 SDL 6 Pos. Receptacie cere 150 5-520423-3 SOL 8 Pos. Plug AWG 24, Flat 140 5-520532-3 SOL 8 Pos, Plug AWG 28, Round 300 5-520421-3 SOL 8 Pos. Receptacle tata 10 5-520423-6 SDL 16 Pos. Plug AWG 24, Flat 10 5-520421-6 SDL 16 Pos. Receptacle coo1.6 Qualification Test Sequence 501-34 Page 3 Test or Examination 1 2 Examination of Product 1 1 Rated Current System Resistance, Dry Circuit Dielectric Withstanding Insulation Resistance Temp, vs. Current Current Cycling Surge Test Shielding Effectiveness 2,4 Vibration Mating Force 2 Unmating Force Plug to Receptacle Retention Receptacle to PCB Retention Cable to Plug Tensile Durability 3 Resistance to Soldering Thermal Shock Temperature/Humidity Cycling Heat Age Qa Summary of Testing 2,4 lest Group 7 8 93 10 ~=~+11 12..=13 #14 #158 ~ 16 17 2,4 3,5 2,4 2,6 244 2,4 All samples were inspected and accepted as conforming to the requirements of the current Quality Inspection Plan. 2.1 Test Group #1 A. Mating Force Test Method The force necessary to mate the plug and receptacle was measured. The rate of engagement was 1.0" per minute.501-34, Rev. A Page 4 Test Results All samples conformed with the requirements of the specification. Wire Size/Type # Pos. Min. Max. Mean Spec. Max. AWG 24 Flat 4 2.5 3.5 2.96 7.5 AWG 24 Flat 6 2.5 6.0 3.76 8.0 AWG 24 Flat 8 2.3 4.5 3.16 8.5 AWG 28 Round 8 2.0 5.9 3.19 8.5 AWG 74 Flat 16 6.0 9.2 7.20 15.0 All Values in Pounds. Unmating Force Test Method The force necessary to unmate the plug and receptacle was measured. The locking latches were disengaged. The rate of disengagement was 1,0" per minute. Test Results All samples conformed with the requirements of the specification. Wire Size/Type # Pos, Min. Max. Mean Spec. Max. AWG 24 Flat 4 1.7 3.5 2.14 6.0 AWG 24 Flat 6 l,l 3.7 2.54 6.5 AWG 24 Flat 8 1.3 3.2 2.25 7,0 AWG 28 Round 8 1.5 2.8 2.17 7.0 AWG 24 Flat 16 4.5 6.8 5.47 8.0 All Values in Pounds. 2.2 Test Group #2 A. Shielding Effectiveness Test Method The radiated response from an unshielded reference sample was measured. All circuit conductors were excited between 70 MHz and 1.0 GHz. The procedure, using a shielded sample, was then repeated, The difference in response is effective shielding in "dB".B. 501-34 Page 5 Test Results 70 MHz. - 500 MHz. 500 MHz. - 1,0 GHz, Spec. Spec, Reading Min. Min, Min. Min. Initial 28 20 16 10 After 500 Cyctes Durability 26 20 20 10 After 3000 Cycles Durability 20 20 15 10 AIT Values in db. Durability Test Method Plug and receptacle assemblies were mated and unmated by hand a total of 3,000 times, at a rate of 20 cycles per minute. Test Results All samples conformed with the requirements of shielding effectiveness. 2.4 Test Group #3 A. System Resistance, Dry Circuit Test Method System resistance was measured on all contacts. Current was maintained at 100 milliamperes, and the open circuit voltage was 50 millivolts. Measurement was taken between the PCB and a point 3" back from the friction interface. All resistance values have had the resistance of 3" of wire subtracted from them. These wire values were 15.36 milliohms for AWG 28 and 6.26 milliohms for AWG 24,501-34 Page 6 B. Test Results Reading Wire Size/Type Min. Max. Mean Spec, Max. Initial AWG 28 Round 7.87 12,15 9.43 25 AWG 24 Flat 7.74 13.50 9.25 20 After 500 Cycles Durability AWG 28 = Round 7.97 16.98 9.74 30 AWG 24 = =Flat 7.77 15.56 9,83 25 After 1000 Cycles Durability AWG 28 Round 7.83 14.56 9,39 30 AWG 24 Flat 7.80 43.84 9,61 25 After 1500 Cycles Durability AWG 28 Round 7.74 13.65 9,26 30 AWG 274 Flat 7.83 12.75 9.55 25 After 2000 Cycles Durability AWG 26 Round 7.74 14,07 9,38 30 AWG 24 Flat 7.93 12,89 9,48 25 After 2500 Cycles Durability AWG 28 = Round 7.63 17,60 9.33 30 AWG 24 Flat 7.78 13.91 9.43 25 After 3000 Cycles Durability AWG 28 Round 7,53 14.30 9.21 30 AWG 24 Flat 7,50 14.44 9.18 25 All Values in Milliohms. Durability Test Method - See Paragraph 2.28. Test Results One test sample did experience crazing of plug housing after 400 cycles of durability. All samples, however, conformed with the requirements of System Resistance - Dry Circuit. 2.4 Test Group #4 A. Receptacle Retention to PCB Test Method The force necessary to dislodge the receptacle from the PCB was measured. The rate of travel was 2.0" per minute. Test Results All samples contormed with the requirements of the specification. Condition Min. Unsoldered * Soldered 8.1 All Values in Pounds. *No actual retention data available. attached to the sample to verify retention. 1 5. Spec. Min. -0 5 A 1.0 ib. weight was501-34 Page 7 Cable to Plug Tensile Test Method The force necessary to cause discontinuities between the plug and wire was measured. The rate of travel was 2.0" per minute, Test Results All samples conformed with the requirements otf the specification. Wire Size/Type Min. Spec. Min. AWG 28 Round 25.5 20.0 AWG 24 Flat 28.3 20.0 All Values in Pounds. 2.5 Test Group #5 A. Plug to Receptacle Retention Test Method The force necessary to unmate a plug and receptacle was measured. The locking latches were engaged. The rate of disengagement was 2.0" per minute. Test Results All samples conformed with the requirements of the specification. Wire Type/Size # Pos. Min. Spec. Min. AWG 28 Round 8 22.2 20 AWG 24 Flat 8 51.0 20 All Values in Pounds. 2.6 Test Group #6 A. Shielding Effectiveness Test Method - See Paragraph 2.2A.501-34 Page 8 2.7 Test Results 70 MHz, - 500 MHz. Spec. Reading Min. Min, Initial 28 20 After Vibration 24 20 All Values in db. Vibration Test Method 500 MHz. Min. 17 16 - 1.0 GHz. Spec. Min. Mated samples were subjected to a random vibration test, parameters of this test condition were a random motion, starting at 50 Hz. with a power spectral density (PSD) of .005 and increasing at a rate of 6 db per octive to 100 Hz., from 100 Hz. to 1000 Hz. with a PSD of .02 and then decreasing at a rate of 6 db per octive to 2000 Hz. with a PSD of .005. total GRMS of the test was 5.35, The samples were subjected to this test for fifteen minutes in each of three mutually perpendicular axes for a total test time of 45 minutes. Test Results No discontinuities greater than one microsecond were detected. Samples met the shielding effectiveness requirements. Test Group #7 A. 16 10 The The System Resistance, Dry Circuit Test Method - See Paragraph 2.34, Test Results All samples conformed with the requirements of the specification, Reading Wire Size/Type # Pos, Min. Max. Mean Spec. Max. Initial AWG 28 Round 8 748 10.71 9.11 25 AWG 28) Flat 8 7.7) 11.49 9.44 20 After Vibration AWG 28 Round 8 7.08 11.37 9,11 30 AWG 24 = Flat 8 7.66 16.28 9.34 25 All Values in Miltliohms,501-34 Page 9 Vibration Test Method - See Paragraph 2.68, One (1) test sample did experience crazing of the plug housing following the vibration testing. All samples, however, conformed with the requirements of system resistance, dry circuit. 2.8 Test Group #8 A. System Resistance - 1.5 Amps Test Method System resistance was measured on all contacts, Samples were hand probed. Current was maintained at 1.50 amperes and 50 millivolts maximum open circuit voltage. Measurement was taken between the PCB and a point 3" back from the friction interface. All resistance values have had the resistance of 3" of wire subtracted from them. These wire values were 15.36 millichms for AWG 28 and 6.26 miliiohms for AWG 24, Test Results All samples conformed with the requirements of the specification. Reading Wire Size/Type Min. Max, Mean Spec, Max, Initial AWG 28 Round 15,85 24.04 18.40 45 AWG 24 Flat 13.58 19.81 16.12 35 After Current Cycling AWG 28 Round 15,24 21.17 17.78 50 AWG 24 = Flat 13.47 18.37 15.87 40 All Values in Millivolts. Temperature Rise vs. Current Test Method Twenty connector assemblies were wired with all contacts ina series circuit and a current of 1.5 amperes (AC) applied. Thermal stability was achieved, and temperature readings were recorded. The temperature probe points were located on the underside of the receptacle.501-34 Page 10 Test Results All samples conformed with the requirements of the specification. Reading Wire Size/Type Min. Max, Mean Spec. Max. Initial AWG 28 Round 10.7 14.8 12.9 30 AWG 24 Flat 7.7 10,5 8.6 30 After Current Cycling AWG 28 = Round 8.9 28.3 13.1 30 AWG 24 Flat 7.1 9,5 8.2 30 All Values in Deg. C. C. Current Cycling Test Method Mated plug and receptacle assemblies were subjected to 500 cycles of current cycling. The test current was 125% of rated current (1.88 amps). Cycle time was 30 minutes (15 On, 15 Off). Test Results Test samples (2) did experience crazing of the plug housing a following the current cycling. All samples conformed with the requirements of temperature rise vs. current and system resistance at 1.5 amps. 2.9 Test Group #9 A, System Resistance, Dry Circuit Test Method - See Paragraph 2.3A. Test Results All samples conformed with the requirements of the specification. Reading Wire Size/Type # Pos. Min. Max. Hean Spec. Max. Initial AWG 28 ~=Round 8 8,04 10.84 9.38 25 AWG 24 Flat 8 7.89 12.56 9.36 20 After Heat Age AWG 28 Round 8 5.07 12.73 9.87 30 AWG 24 Flat 8 8.24 13,61 9,89 25 All Values in Milliohms,501-34 Page 11 B. Heat Age Test Method Mated samples were subjected to 1000 hours at 80C. Test Results Test samples (16) did experience crazing of the plug housing tollowing the heat age testing. All samples, however, conformed to the requirements of system resistance, dry circuit. 2,10 Test Group #10 A. Insulation Resistance Test Method Insulation resistance measurements were made between all adjacent circuits of mated, unmounted samples. A test voltage of 500 VDC was used with an electrification time of one minute, Test Results All samples conformed with the requirements of the specification. Reading Wire Size/Type Min. Max. Mean Spec, Min, 11 11 Initial AWG 28 Round 2.5x10, 3.6x10,, 3.0x10)) 5.0x10 AWG 24 Flat 1.6x10, 2.0x10,, 1.7x10), 5-0x10, After Surge Test AWG 28 = Round 1.8x10,, 3.0x10,, 2.4x10,, 5.0x10, AWG 24 Flat &.0x10 2.0x10 1.5x19 5.0x10 All Values in Ohms. B. Dielectric Withstanding Voltage Test Method A potential of 1000 vac, rms, was applied between all adjacent circuits of mated, unmounted samples. The potential was applied for one minute. Test Results No breakdowns or flashovers cccurred during testing. Leakage current did not exceed one milliampere.501-34 Page 12 C. Surge Test Test Method Mated plug and receptacle assemblies, with adjacent circuits parallel, were subjected to 5 surges of,each polarity at 1 minute intervals. The pulse was 2.0xi0 microseconds wide and had an amplitude of 1000 VDC. Test Results All samples conformed with the requirements of insulation resistance and dielectric withstanding voltage. 2.11 Test Group #11 A. Shielding Effectiveness Test Method ~- See Paragraph 2.2A, Test Results All samples conformed with the requirements of the specification, 70 MHz. - 500 MHz, 500 MHz. - 1.0 GHz, Spec. Spec. Reading Min. Min. Min, Min. initial 28 20 16 10 After T, Shock 27 20 21 10 All Values in db. B. Insulation Resistance Test Method - See Paragraph 2.10A. Test Results All samples conformed with the requirements of the specification, Reading Wire Size/Type Min, Max. Mean Spec. Min. 11 initial AWG 28 = Round 1.4x10,, 2.3x10)) 1.8x10)) 5.0x10 AWG 24 = Flat 9.0x10 T.4x10, 1.1x10,, 50x10, After T, Shock AWG 28 Round 40x10, 3.8x10, 3.0x10,, 5.0x10, AWG 24 Fiat 2,4x10 3.8x10 3,0x10 5.0x10 All Values in Ohms.501-34 Page 13 Dielectric Withstanding Voltage Test Method - See Paragraph 2.108. Test Results No breakdowns or flashovers occurred during testing. Leakage current did not exceed one milliampere. Thermal Shock Test Method Mated samples were subjected to 25 cycles of thermal shock. The temperature extremes were -55C and 85C. Dwell time at each extreme was 30 minutes. Test Results Test samples (15) did experience crazing of the plug housing following the thermal shock testing. All samples, however, conformed with the requirements of insulation resistance, dielectric withstanding voltage and shielding effectiveness. 2.12 Test Group #12 A. System Resistance, Dry Circuit Test Method - See Paragraph 2.3A. Test Results All samples conformed with the requirements of the specification. Reading Wire Size/Type # Pos. Min. Max. Mean Spec. Max. Initial AWG 28 ~=Round 8 7.48 16,22 3.37 25 AWG 24 Flat 8 7.88 12,12 9.38 20 After T. Shock AWG 28 ~=Round 8 8,26 16,02 10.63 30 AWG 24 Flat 8 7.88 12,18 9,57 25 All Values in Milliohms. Thermal Shock Test Method - See Paragraph 2.110, Test Results Test samples (13) did experience crazing of the plug housing tollowing the thermal shock testing. All samples, however, conformed with the requirements of system resistance, dry circuit.501-34 Page 14 2.13 Test Group #13 A. Shielding Effectiveness Test Method - See Paragraph 2.2A. Test Results All samples conformed with the requirements of the specification. 70 MHz. - 500 MHz. 500 MHz, - 1,0 GHz. Spec. Spec. Reading Min. Hin. Min. Min. Initial 28 20 16 10 After Temperature/Humidity 26 20 18 10 All Values in db, Temperature/Humidity Cycling lest Method Mated samples were subjected to 10 temperature/humidity cycles between 5 and 30C at 95% RH. A cycle consisted of 4 hours at 30C - 95% RH, a 3 hour transition to 5C, 3 hours at 5C - 95% RH, a 2 hour transition to 30C. Each cycle was a total of 12 hours. Test Results All samples conformed with the requirements of shielding effectiveness. 2.14 Test Group #14 As Insulation Resistance Test Method - See Paragraph 2.104. Test Results 411 samples conformed with the requirements of the specitication.2.15 Page 15 Reading Wire Size/Type Min. Max. Mean 11 11 11 Initial AWG 28 Round 2.5x10,, 3.9x10,, 3 1x10, AWG 24 Flat T.8x10, 2.0x10,, 1 9x10, After Temperature/ AWG 28 Round 1.7x10, 4 2.4x10, , 2 0x10, Humidity AWG 24 Flat 7.0x10 1.3x10 7.5x10 All Values in Ohms. B. Dielectric Withstanding Voltage Test Method - See Paragraph 2.10B. Test Results No breakdowns or flashovers occurred during testing. Leakage current did not exceed one milliampere. C. Temperature/Humidity Cycling Test Method - See Paragraph 2.135. Test Results All samples conformed to the requirements cf insulation resistance and dielectric withstanding voltage. Test Group #15 A. System Resistance, Dry Circuit Test Method - See Paragraph 2.34. Test Results All samples conformed with the requirements of the specification, Reading Wire Size/Type # Pos. Min. Max. Mean Initial AWG 28 Round 8 7.71 13.25 9.50 AWG 24 Flat 8 7,69 12.25 9.36 After Humidity AWG 78 ~=Round 8 7.85 14,34 9,37 AWG 24 Flat 8 7,68 15.79 9.43 All Values in Millichms, 5,0x10 5-0x10,, 5.0x10 50x10" Spec. Max, 25 20 30 25501-34 Page 16 2.16 2.17 B. Temperature/Humidity Cycling Test Method - See Paragraph 2.138. Test Results One test sample did experience crazing of the plug housing following the temperature/humidity cycling test. Al] samples, however, conformed to the requirements of System Resistance, Dry Circuit. Test Group #16 A. Resistance to Soldering Heat Test Method Printed circuit board mounted receptacles were immersed so that the bottom of the board rested on the molten solder. The solder temperature was 260C, and the immersion duration was 10 seconds. Test Results There was no physical damage observed. Test Group #17 A. Shielding Effectiveness Test Method - See Paragraph 2.74. Test Results All samples conformed with the requirements of the specification. 70 MHz. - 500 MHz, 500 MHz, - 1,0 GHz. Spec. Spec. Reading Min, Min, Min. Min. Initial 23 20 13 10 After Heat Age 21 20 16 10 All Values in db. B. Heat Age Test Method - See Paragraph 2.98. Test Results The test samples (18) did experience crazing at the plug housing following the heat age testing. All samples, however, conformed to the requirements ot shielding effectiveness.501-34 Page 1? 3. Validation Report prepared by, P77, T. M. Shinga Test Engineer Reliability Test Group Corporate Test Laboratory Report reviewed by, SE LLL. T. E. Nagle + Supervisor Reliability Test Group Corporate Test Laboratory Report approved by, Ne ah W. Zelner ( ) Manager, Product Ass ce Terminal Products Division