FUJITSU SEMICONDUCTOR
DATA SHEET
Copyright 2013-2016 FUJITSU SEMICONDUCTOR LIMITED
2016.10
Memory FRAM
1M (128 K × 8) Bit SPI
MB85RS1MT
DESCRIPTION
MB85RS1MT is a FRAM (Ferroelect ric Random Access Memory) chip in a configuration of 131,072
words × 8 bits, using the ferroelectric process and silicon gate CMOS process technologies for forming the
nonvolatile memory cells.
MB85RS1MT adopts the Serial Peripheral Interface (SPI).
The MB85RS1MT is able to retain data without using a back-up battery, as is needed for SRAM.
The memory cells used in the MB85RS1MT can be used for 1013 read/write operations, which is a significant
improvement ove r the number of read and write operations supported by Flash memory and E2PROM.
MB85RS1MT does not take long time to write data like Flash memories or E2PROM, and MB85RS1MT takes
no wait time.
FEATURES
Bit configuration : 131,072 words × 8 bit s
Serial Peripheral Interface : SPI (Serial Peripheral Interface)
Correspondent to SPI mode 0 (0, 0) and mode 3 (1, 1)
Operating frequency : 1.8 V to 2.7 V, 25 MHz (Max)
2.7 V to 3.6 V, 30 MHz (Max)
For FSTRD command 2.7 V to 3.6 V, 40 MHz (Ma x)
High endurance : 1013 times / byte
Data retention : 10 years (+85 °C), 95 years ( + 55 °C), over 200 years ( + 35 °C)
Operating power supply voltage : 1.8 V to 3.6 V
Low power consumption : Operating power supply current 9.5 mA (M ax@30 MHz)
Standby current 120 μA (Max)
Sleep current 10 μA (Max)
Operation ambient temperature range : -40 °C to +85 °C
Package : 8-pin plastic SOP (FPT-8P-M02)
8-pin plastic WLP (WLP-8P-M01)
8-pin plastic DIP (DIP -8P-M03)
RoHS compliant
DS501-00022-6v0-E
MB85RS1MT
2DS501-00022-6v0-E
PIN ASSIGNMENT
VSS SI
SO
VDD
SCK
WP
CS
HOLD
8
7
6
54
3
2
1
SO
VDD
SCK
WP
CS
HOLD
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(
VSS SI
(TOP VIEW)
(FPT-8P-M02)
(BOTTOM VIEW)
(WLP-8P-M01)
(TOP VIEW)
(DIP-8P-M03)
1
2
3
4
8
7
6
5
CS
WP
SO
VSS
VDD
SCK
SI
HOLD
MB85RS1MT
DS501-00022-6v0-E 3
PIN FUNCTIONAL DESCRIPTIONS
Pin No. Pin Name Functional description
1
1E CS
Chip Select pin
This is an input pin to make chips select. When CS is “H” level, device is in deselect
(standby) statu s an d SO be co m es High- Z . Inp ut s fro m othe r pin s ar e ign or e d for this
time. When CS is “L” level, device is in select (active) status. CS has to be “L” level before
inputting op-code. The Chip Select pin is pulled up internally to the VDD pin.
3
2B WP
Write Protect pin
This is a pin to control writing to a st atus register. The writing of status register (see “
STATUS REGISTER”) is protected in related with WP and WPEN. See “ WRITING
PROTECT” for detail.
7
2D HOLD
Hold pin
This pin is used to interrupt serial input/output without making chips deselect. When
HOLD is “L” level, hold operation is activated, SO becomes High-Z, SCK and SI become
do not care. While the hold operation, CS has to be retained “L” level.
6
3C SCK Serial Clock pin
This is a clock input pin to input/ou tput serial d ata. SI is loaded synchronously t o a rising
edge, SO is output synchronously to a falling e dge.
5
3A SI Serial Data Input pin
This is an input pin of serial data. This inputs op-code, address, an d writing data.
2
1C SO Serial Data Output pin
This is an output pin of seri al data. Reading data of FRAM memory cell array and status
register data are output. This is High-Z during standby.
8
3E VDD Supply Voltage pin
4
1A VSS Ground pin
MB85RS1MT
4DS501-00022-6v0-E
BLOCK DIAGRAM
SCK
SO
SI Serial-Parallel Converter
FRAM Cell Array
131,0728
Column Decoder/Sense Amp/
Write Amp
FRAM
Status Register
Data Register
Parallel-Serial Converter
Control Circuit
Address Counter
Row Decoder
CS
WP
HOLD
MB85RS1MT
DS501-00022-6v0-E 5
SPI MODE
MB85RS1MT corresponds to the SPI mode 0 (CPOL = 0, CPHA = 0) , and SPI mode 3 (CPOL = 1, CPHA = 1) .
SCK
SI
CS
SCK
SI
CS
76543210
76543210
MSBLSB
MSBLSB
SPI Mode 0
SPI Mode 3
MB85RS1MT
6DS501-00022-6v0-E
SERIAL PERIPHERAL INTERFACE (S PI)
MB85RS1MT works as a slave of SPI. More than 2 devices can be connected by using microcontroller
equipped with SPI port. By using a microcontroller not equipped with SPI port, SI and SO can be bus
connected to use.
SCK
SS1
HOLD1
MOSI
MISO
SS2
HOLD2
SCK
CS HOLD
SISO SCK
CS HOLD
SISO
MB85RS1MT MB85RS1MT
SPI
Microcontroller
MOSI : Master Out Slave I n
MISO : Master In Slave Out
SS : Slave Select
System Configuration with SPI Port
System Configuration without SPI Port
Microcontroller
MB85RS1MT
DS501-00022-6v0-E 7
STATUS REGISTER
OP-CODE
MB85RS1MT accepts 9 kinds of command specified in op-code. Op-code is a code composed of 8 bits
shown in the table below. Do not input invalid codes other than those codes. If CS is risen while inputting
op-code, the command are not performed.
Bit No. Bit Name Function
7 WPEN
Status Register Write Protect
This is a bit composed of nonvolatile memories (FRAM). WPEN protects
writing to a status register (refer to “ WRITING PROTECT”) relating with
WP input. Wr iting wit h t he WRSR comman d and read ing wit h the RDSR
command are possible.
6 to 4
Not Used Bits
These are bits composed of nonvolatile memories, writing with the WRSR
command is possible. The se bit s ar e no t u sed b ut th ey ar e r ea d with th e
RDSR command.
3 BP1 Block Protect
This is a bit composed of nonvolatile memory. This defines size of write
protect block for the WRITE command (refer to “ BLOCK PROTECT”).
Writing with th e WRSR comma nd and r ea ding with t he RDSR comman d
are possible.
2 BP0
1WEL
Write Enable Latch
This indicates FRAM Array and status registe r are writable. The WREN
command is for setting, and the WRDI command is for resettin g. With the
RDSR command, reading is possible but writing is not possible with the
WRSR command. WEL is reset after the following operations.
After power ON.
After WRDI command recognition.
The rising edge of CS after WRSR command recognition.
The rising edge of CS after WRITE command recognition.
0 0 This is a bit fixed to “0”.
Name Description Op-code
WREN Set Write Enable Latch 0000 0110B
WRDI Reset Write Enable Latch 0000 0100B
RDSR Read Status Register 0000 0101B
WRSR Write Status Register 0000 0001B
READ Read Memory Code 0000 0011B
WRITE Write Memory Code 0000 0010B
RDID Read Device ID 1001 1111B
FSTRD Fast Read Memory Code 0000 1011B
SLEEP Sleep Mode 1011 1001B
MB85RS1MT
8DS501-00022-6v0-E
COMMAND
WREN
The WREN command sets WEL ( Write Enable Latch ) . WEL has to be set with the WREN comma nd before
writing operation (WRSR command and WRITE command) . WREN command is applicable to “Up to
25 MHz (1.8 V to 2.7 V) and 30 MHz (2.7 V to 3.6 V) op eration”.
WRDI
The WRDI command resets WEL (Write Enable Latch) . Writing operation (WRSR command and WRITE
command) are not perfor med when WEL is reset. WRDI command is applicable to “Up to 25 MHz (1.8 V to
2.7 V) and 30 MHz (2.7 V to 3.6 V) operation”.
SO
SCK
SI
CS
00000110
High-Z
76543210
InvalidInvalid
SO
SCK
SI
CS
00000100
High-Z
76543210
InvalidInvalid
MB85RS1MT
DS501-00022-6v0-E 9
RDSR
The RDSR command reads status register data. After op-code of RDSR is input to SI, 8-cycle clock is input
to SCK. The SI value is invalid for this time. SO is output synchronously to a falling edge of SCK. In the
RDSR command, rep eated reading of status register is enabled by sending SCK cont inuously before ri sing
of CS. RDSR command is applicable to “Up to 25 MHz (1.8 V to 2.7 V) and 30 MHz (2.7 V to 3.6 V) operation”.
WRSR
The WRSR command writes data to the nonvolatile memory bit of status register. After performing WRSR
op-code to a SI pin, 8 bits writing data is input. WEL (Write Enable Latch) is not able to be written with WRSR
command. A SI value corresp ondent to bit 1 is ignored. Bi t 0 of t he status registe r is fixed to “0” and ca nnot
be written. The SI value corresponding to bit 0 is ignored. WP signal level shall be fixed before perfor ming
WRSR command, and do not change the WP signal level until the end of command sequence. WRSR
command is applicable to “Up to 25 MHz (1.8 V to 2.7 V) and 30 MHz (2.7 V to 3.6 V) operation”.
SO
SCK
SI
CS
00000101
High-Z
76543210
Invalid
MSB
76543210
Data Out
LSB
Invalid
SO
SCK
SI
CS
00000001
76543210
Data In
MSB
76543210
High-Z LSB
76543210
Instruction
MB85RS1MT
10 DS501-00022-6v0-E
READ
The READ command read s FRAM memory cell array d ata. Arbitrary 24 b its address and op-code of READ
are input to SI. The 7-bit upper address bit is invalid. Then, 8-cycle clock is input to SCK. SO is output
synchronously to the falling edge of SCK. While reading, the SI value is invalid. When CS is risen, the READ
command is completed, but keeps on reading with automatic address increment which is enabled by con-
tinuously sending clocks to SCK in unit of 8 cycles before CS rising. When it reaches the most significant
address, it rolls over to the starting address, and reading cycle keeps on infinitely. READ command is
applicable to “Up to 25 MHz (1.8 V to 2.7 V) and 30 MHz (2.7 V to 3.6 V) operation”.
WRITE
The WRITE comma nd writes data to FRAM memor y cell array. WRITE op- code, arbitrary 24 bits of ad dress
and 8 bits of writing data are inpu t to SI. The 7-bit up per addr ess bit is inva lid. When 8 bit s of writ ing data is
input, data is wr itte n to FRAM memory cell array. Risen CS will terminate the WR ITE command, but if you
continue sending the writing data for 8 bits each before CS rising, it is possible to continue writing with
automatic address increment. When it reaches the most significant address, it rolls over to the starting
address, and writing cycle can be continued infinitely. WRITE command is applicable to “Up to 25 MHz (1.8
V to 2.7 V) and 30 MHz (2. 7 V to 3.6 V) operation”.
CS
SCK
SI Invalid
MSB LSB MSB Data Out LSB
High-Z
Invalid
450123 26276 7 8 9 10 11 12 13 14 15 38 3928 29 30 31 32 33 34 35 36 37
00000011X 32
XXXXXX16 54
SO 76 3
10
54 210
24-bit Address
OP-CODE
CS
SCK Data In
SI
MSB
24-bit Address
OP-CODE
LSB MSB LSB
High-Z
10 110123456789 14 15 26 31 3212 13 27 28 29 30 33 34 35 36 37 38 39
0000001 30XXXXX 210
SO
XX16 54 32107654
MB85RS1MT
DS501-00022-6v0-E 11
FSTRD
The FSTRD command reads FRAM memory cell array data. Arbitrary 24 bits address and op-code of FSTRD
are input to SI followed by 8 bits dummy. The 7-bit upper address bit is invalid. Then, 8-cycle clock is input
to SCK. SO is output synchronously to the falling edge of SCK. While reading, the SI value is invalid. When
CS is risen, th e FSTRD command is completed, but keeps on reading w ith automatic address increment
which is enabled by continuously sending clocks to SCK in unit of 8 cycles before CS rising. When it reaches
the most significant address, it rolls over to the starting address, and reading cycle keeps on infinitely. FSTRD
command is applicable to “Up to 25 MHz (1.8 V to 2.7 V) and 40 MHz (2.7 V to 3.6 V) operation”.
RDID
The RDID command rea ds fi xed De vice ID. Af t er per f orming RDID op-cod e t o SI, 3 2-cycle clock is in put t o
SCK. The SI value is invalid for this time. SO is output synchronously to a falling edge of SCK. The output
is in order of Manufacturer ID (8bit)/C ontinuation code (8bit)/Product ID (1st Byte)/Product ID (2nd Byte).
In the RDID command, SO holds the output state of the last bit in 32-bit Device ID until CS is risen. RDID
command is applicable to “Up to 25 MHz (1.8 V to 2.7 V) and 30 MHz (2.7 V to 3.6 V) operation”.
CS
SCK
SI Invalid
MSB LSB MSB Data Out LSB
High-Z
Invalid
450123 29306 7 8 9 10 11 12 13 1415 46 4731 32 38 39 40 41 42 43 44 45
00001011X
6
16 210X XX
SO 7
XXXXXX
0543
33
X
21
24-bit Address 8-bit Dummy
OP-CODE
SO
SCK
SI
CS
MSB
76543210
Data OutData Out
High-Z
LSB
111098333231393837363534
Invalid
30282931
10011111
201364578
bit
76543210Hex
Manufacturer ID 0000010 004
HFujitsu
Continuation code 011111117F
H
Proprietary use Density Hex
Product ID (1st Byte)0010011127
HDensity: 00111B = 1 Mbit
Proprietary use Hex
Product ID (2nd Byte)0000001103
H
MB85RS1MT
12 DS501-00022-6v0-E
SLEEP
The SLEEP command shifts the LSI to a low power mode called “SLEEP mode”. The transition to the SLEEP
mode is carried out at the rising edge of CS after operation code in the SLEEP command. However, when
at least one SCK clock is inputted before the rising edge of CS after operation code in the SLEEP command,
this SLEEP command is canceled.
After the SLEEP mode transition, SCK and SI inputs are ignored and SO changes to a Hi-Z state.
Returning to an normal operation from the SLEEP mode is carried out after tREC (Max 400 μs) time from the
falling edge of CS (see the figure below). It is possible to return CS to H level before tREC time. However, it
is prohibited to bring down CS to L level again during tREC period.
BLOCK PROTECT
Writing protect bl ock for WRITE comma nd is configured by th e value of BP0 and BP1 in th e status regist er.
BP1 BP0 Protected Blo ck
00None
0 1 18000H to 1FFFFH (upper 1/4)
1 0 10000H to 1FFFFH (upper 1/2)
1 1 00000H to 1FFFFH (all)
Enter Sleep Mode
CS
SCK
SI Invalid Invalid
Hi-Z
Sleep Mode Entry
67012345
SO
11011100
CS
CS
t
REC
Exit Sleep Mode
Sleep Mode Exit
From this time
Command input enable
MB85RS1MT
DS501-00022-6v0-E 13
WRITING PROTECT
Writing operation of the WRITE command and the WRSR command are protected with the value of WEL,
WPEN, WP as shown in the table.
HOLD OPERATION
Hold status is retained with out abort ing a command if HOLD is “L” level while CS is “L” level. The timing for
starting and ending hold status depends on the SCK to be “H” level or “L” level when a HOLD pin input is
transited to th e hold conditio n as shown in the diagram below. In case th e HOLD pin transited to “L” level
when SCK is “L” level, return the HOLD pin to “H” level at SCK being “L” level. In the same manner, in case
the HOLD pin transited to “L” level when SCK is “H” level, return the HOLD pin to “H” level at SCK being “H”
level. Arbitrary command operation is interrupted in hold status, SCK and SI inputs become do not care.
And, SO becomes High-Z while reading command (RDSR, READ). If CS is rising during hold status, a
command is aborted. In case the command is aborted before its recognition, WEL holds the value before
transition to hold status.
WEL WPEN WP Protected Blocks Unprotected Blocks Status Register
0 X X Protected Protected Protected
1 0 X Protected Unprotected Unprotected
1 1 0 Protected Unprotected Protected
1 1 1 Protected Unprotected Unprotected
SCK
CS
Hold Condition
HOLD
Hold Condition
MB85RS1MT
14 DS501-00022-6v0-E
ABSOLUTE MAXIMUM RATINGS
*: These parameters are based on the condition that VSS is 0 V.
WARNING: Semiconductor devices may be permanently damaged by application of stress (including, without
limitation, voltage, current or temperature) in excess of absolute maximum ratings.
Do not exceed any of these ratings.
RECOMMENDED OPERATING CONDITIONS
*1: These parameters are based on the condition t hat VSS is 0 V.
*2: Ambient temperature when only this device is working. Please consider it to be the almost same as the
package surface temperature.
WARNING: The recommended operating conditions are required in order to ensure the normal operation of
the semiconductor device. All of the device's electrical characteristics are warranted when the
device is operated under these conditions.
Any use of semiconductor devices will be under their recommended operating condition.
Operation under any conditions other than these conditions may adversely affect reliability of
device and could res ult in de vice failu re.
No warranty is made with respect to any use, operating conditions or combinations not represented
on this data sheet. If you are considering application under any conditions other than listed herein,
please contact sales representatives beforehand.
Parameter Symbol Rating Unit
Min Max
Power supply voltage* VDD 0.5 + 4.0 V
Input voltage* VIN 0.5 VDD + 0.5 V
Output voltage* VOUT 0.5 VDD + 0.5 V
Operation ambient temperature TA 40 + 85 °C
Storage temperature Tstg 55 + 125 °C
Parameter Symbol Value Unit
Min Typ Max
Power supply voltage*1 VDD 1.8 3.3 3.6 V
Operation ambient temperature*2 TA 40 + 85 °C
MB85RS1MT
DS501-00022-6v0-E 15
ELECTRICAL CHARACTERISTICS
1. DC Characteristics (within recomme nd e d operatin g co nd itio ns )
*1 : Applicable pin : CS, WP, HOLD, SCK, SI
*2 : Applicable pin : SO
Parameter Symbol Condition Value Unit
Min Typ Max
Input leakage current*1|ILI|
0 CS< VDD ⎯⎯200
μA
CS = VDD ⎯⎯ 1
WP, HOLD, SCK
SI = 0 V to VDD ⎯⎯ 1
Output leakage current*2|ILO|SO = 0 V to VDD ⎯⎯ 1μA
Operating power supply current IDD
SCK = 1 MHz 0.77 mA
SCK = 10 MHz 2.3 mA
SCK = 25 MHz 4.85 mA
SCK = 30 MHz 5.7 9.5 mA
Standby current ISB SCK = SI = CS = VDD 25 120 μA
Sleep current IZZ CS = VDD
All inputs VSS or VDD ⎯⎯10 μA
Input high voltage VIH VDD = 1.8 V to 3.6 V VDD × 0.7 VDD + 0.5 V
Input low voltage VIL VDD = 1.8 V to 3.6 V 0.5 VDD × 0.3 V
Output high voltage VOH IOH = 2 mA VDD 0.5 ⎯⎯V
Output low voltage VOL IOL = 2 mA ⎯⎯0.4 V
Pull up resistance for CS RP18 33 80 kΩ
MB85RS1MT
16 DS501-00022-6v0-E
2. AC Characteristics
*1 : All commands except FSTRD are applicable to “Up to 25 MHz operation” in VDD = 1.8 V to 2.7 V.
*2 : All commands except FSTRD are applicable to “Up to 30 MHz operation” in VDD = 2.7 V to 3.6 V.
AC Test Condition
Power supply voltage : 1.8 V to 3.6 V
Operation am b i en t tem p er a tur e : 40 °C to + 85 °C
Input voltage magnit ude : VDD × 0.7 VIH VDD
0 VIL VDD × 0.3
Input rising time : 5 ns
Input falling time : 5 ns
Input judge level : VDD/2
Output judge level : VDD/2
Parameter Symbol
Value
Unit
Up to 25 MHz operation*1
(VDD = 1.8 V to 2.7 V) Up to 30 MHz operation*2
(VDD = 2.7 V to 3.6 V)
Min Max Min Max
SCK clock frequency
(All commands except
FSTRD command) fCK 025030MHz
SCK clock frequency
(for FSTRD command) fCK 025040MHz
Clock high time tCH 15 11 ns
Clock low time tCL 15 11 ns
Chip select set up time tCSU 10 10 ns
Chip select hold time tCSH 10 10 ns
Output disable time tOD 12 12 ns
Output data valid time tODV 18 9ns
Output hold time tOH 00ns
Deselect time tD40 40 ns
Data in rising time tR50 50 ns
Data falling time tF50 50 ns
Data set up time tSU 55ns
Data hold time tH55ns
HOLD set uptime tHS 10 10 ns
HOLD hold time tHH 10 10 ns
HOLD output floating time tHZ 20 20 ns
HOLD output active time tLZ 20 20 ns
SLEEP recovery time tREC 400 400 μs
MB85RS1MT
DS501-00022-6v0-E 17
AC Load Equivalent Circuit
3. Pin Capacitance
Parameter Symbol Condition Value Unit
Min Max
Output capacitance COVDD = VIN = VOUT = 0 V,
f = 1 MHz, TA = +25 °C
6pF
Input capacit ance CI8pF
30 pF
Output
3.3 V
1.2 k
0.95 k
MB85RS1MT
18 DS501-00022-6v0-E
TIMING DIAGRAM
Serial Data Timing
Hold Timing
SCK
CS
Valid in
SI
SOHigh-Z
: H or L
t
CSU
t
CH
t
CH
t
CL
t
SU
t
H
t
ODV
t
OH
t
OD
t
CSH
t
D
High-Z
SCK
CS
SO
tHStHStHHtHH tHH tHH
tHZ tLZ tHZ tLZ
tHStHS
HOLD
High-ZHigh-Z
MB85RS1MT
DS501-00022-6v0-E 19
POWER ON/OFF SEQUENCE
If the device does not operate within the specified conditions of read cycle, write cycle or power on/off
sequence, memory data can not be guaranteed.
FRAM CHARACTERISTICS
*1 : Total number of reading and writing defines the minimum value of endurance, as an FRAM memory operates
with destructive readout mechanism.
*2 : Minimum va lues define retention time of the first reading/writing data right afte r shipment, and these value s
are calculated by qualification results.
NOTE ON USE
We recommend programming of the device after reflow. Data written before reflow cannot be guaranteed.
Parameter Symbol Value Unit
Min Max
CS level hold time at power OFF tpd 400 ns
CS level hold time at power ON tpu 250 ⎯μs
Power supply rising time tr 0.05 ms/V
Power supply falling time tf 0.1 ms/V
Item Min Max Unit Parameter
Read/Write Endurance*11013 Tim es/ by te Operation Ambient Temper at ur e TA = + 85 °C
Data Retention*2
10
Years
Operation Amb ie nt Tem p er at ur e T A = + 85 °C
95 Operation Amb ie nt Tem p er at ur e T A = + 55 °C
200 Operation Amb ie nt Tem p er at ur e T A = + 35 °C
GND
CS >V
DD
× 0.8
tpd tputr
tf
V
IL
(Max)
1.0 V
V
IH
(Min)
V
DD
(Min)
V
DD
CS : don't care CS >V
DD
× 0.8
CSCS
GND
V
IL
(Max)
1.0 V
V
IH
(Min)
V
DD
(Min)
V
DD
* : CS (M a x) < VDD + 0.5 V
MB85RS1MT
20 DS501-00022-6v0-E
ESD AND LATCH-UP
Current method of Latch-Up Resistance Test
Note : The voltage VIN is increased gradually and the current IIN of 300 mA at maximum shall flow.
Confirm the latch up does not occur under IIN = ± 300 mA.
In case the specific requirement is specified for I/O and IIN cannot be 300 mA, the voltage shall be
increased to the level that meets the specific requirement.
Test DUT Value
ESD HBM (Human Body Model)
JESD22-A114 compliant
MB85RS1MTPNF-G-JNE1
|2000 V|
ESD MM (Machine Model)
JESD22-A115 compliant |200 V|
ESD CDM (Charged Device Model)
JESD22-C101 compliant |1000 V|
Latch-Up (I-test)
JESD78 compliant
Latch-Up (V supply overvoltage test)
JESD78 compliant
Latch-Up (C ur re nt Method)
Proprietary method
Latch-Up (C -V Me th od )
Proprietary method |200 V|
A
VDD
VSS
DUT
V
I
IN
V
IN
+
-
Test terminal
Protection Resistance
VDD
(Max.Rating)
Reference
terminal
MB85RS1MT
DS501-00022-6v0-E 21
C-V method of Latch-Up Resistance Test
Note : Charge voltage alternately switching 1 and 2 approximately 2 sec interval. This switching process is
considered as one cycle. Repeat this process 5 times. However, if the lat ch-up condition occurs before
completing 5times, this test must be stopped immed iately.
REFLOW CONDITIONS AND FLOOR LIFE
[ JEDEC MSL ] : Moisture Sensitivity Level 3 (ISP/JEDEC J-STD-020D)
Current status on Contained Restricted Substances
This product complies with the r egulation s of REACH Regulat ions , EU Ro HS Directiv e and China RoHS .  
VDD
VSS
DUT
V
IN
+
-
SW
12
C
200pF
V
A
Test
terminal
Protection Resistance
VDD
(Max.Rating)
Reference
terminal
MB85RS1MT
22 DS501-00022-6v0-E
ORDERING IN FORMATION
*1 : Please contact ou r sales office about mi nimum shipping quantity.
*2 : Will be available in January, 2017.
Part number Package Shipping form Minimum shipping
quantity
MB85RS1MTPNF-G-JNE1 8-pin plastic SOP
(FPT-8P-M02) Tube *1
MB85RS1MTPNF-G-JNERE1 8-pin plastic SOP
(FPT-8P-M02) Embossed Carrier tape 1500
MB85RS1MTPW-G-APEWE1 8-pin plastic WLP
(WLP-8P-M01) Embossed Carrier tape 1500
MB85RS1MTPH-G-JNE1*2 8-pin plastic DIP
(DIP-8P-M03) Tube *1
MB85RS1MT
DS501-00022-6v0-E 23
PACKAGE DIMENSION
(Continued)
8-pin plastic SOP Lead pitch 1.27 mm
Package width ×
package length 3.9 mm × 5.05 mm
Lead shape Gullwing
Sealing method Plastic mold
Mounting height 1.75 mm MAX
We ight 0.06 g
8-pin plastic SOP
(FPT-8P-M02)
(
FPT-8P-M02
)
C
1.27(.050)
3.90±0.30 6.00±0.20
.199
–.008
+.010
–0.20
+0.25
5.05
0.13(.005)
M
(.154±.012) (.236±.008)
0.10(.004)
14
58
0.44±0.08
(.017±.003)
–0.07
+0.03
0.22
.009
+.001
–.003
45
°
0.40(.016) "A" 0~8
°
0.25(.010)
(Mounting height)
Details of "A" part
1.55±0.20
(.061±.008)
0.50±0.20
(.020±.008)
0.60±0.15
(.024±.006)
0.15±0.10
(.006±.004)
(Stand off)
0.10(.004)
*
1
*
2
2002-2012 FUJITSUSEMICONDUCT OR LIMITED F08004S-c-5-10
Dimensions in mm (inches).
Note: The values in parentheses are reference values.
Note 1) 1 : These dimensions include resin protrusion.
Note 2) 2 : These dimensions do not include resin protrusion.
Note 3) Pins width and pins thickness include plating thickness.
Note 4) Pins width do not include tie bar cutting remainder.
*
*
MB85RS1MT
24 DS501-00022-6v0-E
(Continued)
(Continued)
8-pin plastic WLP Lead pitch 0.5 mm
Package width ×
package length 2.28 mm × 3.092 mm
Sealing method Print
Mounting height 0.33 mm Max.
Weight TBD
8-pin plastic WLP
( WLP- 08P-M01 )
2015 FUJITSU SEMICONDUCTOR LIMITED
Dimensions in mm.
Note: The values in parentheses are reference values.
3.092±0.03
2.28±0.03

0.08±0.02
0.25±0.02
0.05
ࠉࠉ
2)127&+
1.2
0.946
0.11
0.74
ڧ,1'(;
0.8
ȍs
P 0.5
( WLP- 08P-M01 )
Lead shape Soldering ball
C
MB85RS1MT
DS501-00022-6v0-E 25
(Continued)
8-pin plastic DIP Lead pitch 2.54 mm
Sealing method
Plastic mold
8-pin plastic DIP
(DIP-8P-M03)
(DIP-8P-M03)
C
2006-2010 FUJITSUSEMICONDUCTOR LIMITED D08008S-c-1-4
0.25±0.05
(.010±.002)
15° MAX
.370 .012
+.016
0.30
+0.40
9.40
(.250±.010)
6.35±0.25
INDEX
14
85
0.50(.020)
MIN
TYP.
2.54(.100)
(.018±.003)
0.46±0.08
3.00(.118)MIN
4.36(.172)MAX
1.52
.060 0
+.012
0
+0.30
0
00.99+0.30
+.012
.039
.035
0.89+.014
+0.35
–.012
0.30
TYP.
7.62(.300)
Dimensions in mm (inches).
Note: The values in parentheses are reference values
Weight
0.46 g
MB85RS1MT
26 DS501-00022-6v0-E
MARKING
RS1MT
E11150
300
[MB85RS1MTPNF-G-JNE1]
[MB85RS1MTPNF-G-JNERE1]
[FPT-8P-M02]
1
S
R
M
T
Y
1
E
Y
W
W
C
X
X
[WLP-8P-M01]
[MB85RS1MTPW-G-APE1]
[MB85RS1MTPW-G-APEWE1]
MB85RS1MT
DS501-00022-6v0-E 27
[DIP-8P-M03]
[MB85RS1MTPH-G-JNE1]
RS1MT
E11600
300
MB85RS1MT
28 DS501-00022-6v0-E
PACKING INFORMATION
1. Tube
1.1 Tube Dimensions
Tube/stopper shape
Tube cross-sections and Maximum quantity
Package form Package code Maximum quantity
pcs/
tube pcs/inner
box pcs/outer
box
SOP, 8, plastic (2)
t = 0.5
Transparent polyethylene terephthalate
FPT-8P-M02 95 7600 30400
(Dimensions in mm)
(treated to ant i sta ti c)
Tube length: 520 mm
(treated to antistatic)
Stopper
Tube
Transparent polyethylene terephthalate
4.4
6.4
7.4
1.8
C2006 FUJITSU LIMITED F08008-SET1-PET:FJ99L-0022-E0008-1-K-1
2.6
©2006-2010 FUJITSU SEMICONDUCTOR LIMITED
F08008-SET1-PET:FJ99L-0022-E0008-1-K-3
MB85RS1MT
DS501-00022-6v0-E 29
1.2 Tube Dry pack packing specifications
*1:For a product of witch part number is suffixed with “E1”, a ” marks is display to the moisture barrier
bag and the inner boxes.
*2:The space in the outer box will be filled with empty inner boxes, or cushions, etc.
*3:Please refer to an attached sheet about the indication label.
Note: The packing specifications ma y not be applied when the product is delivered via a distributor .
Tube
Dry pack
Inner box
Outer box
For SOP
Stopper
Aluminum Iaminated bag
Index mark
Desiccant
Label I
*1*3
Heat seal
Aluminum Iaminated bag
(tubes inside)
Cushioning material
Inner box
Label I
*1*3
Cushioning material
Humidity indicator
Outer box
*2
Label II-A
*3
Label II-B
*3
IC
Use adhesive tapes.
GPb
MB85RS1MT
30 DS501-00022-6v0-E
1.3 Product labe l indi ca t ors
Label I: Label on Inner box/Moisture Barrier Bag/ (It sticks it on the reel for the emboss taping)
[C-3 Label (50mm × 100mm) Supplemental Label (20mm × 100mm)]
Label II-A: La bel on Outer box [D Label] (100mm × 100mm)
Label II-B: Outer boxes prod uct indicate
Note: Depending on shipment state, “Label II -A” and “Label II-B” on the external boxes might not be printed.
(Customer part number or FJ part number)
(Customer part number or FJ part number)
(FJ control number bar code)
XX/XX XXXX-XXX XXX
XXXX-XXX XXX
(Lot Number and quantity)
(Package count)
(Customer part number or FJ part number
bar code)
(Part number and quantity)
(FJ control number)
QC PASS
XXXXXXXXXXXXXX
XXXX/XX/XX (Packed years/month/day) ASSEMBLED IN xxxx
(3N)1 XXXXXXXXXXXXXX XXX
(Quantity)
(3N)2 XXXXXXXXXX
XXX pcs
XXXXXX
XXXXXXXXXXXXXX
(Customer part number or FJ part number)
XXXXXXXXXXXXXX
(Comment)
XXXXXXXXXXXXXX
(FJ control number )
XXXXXXXXXX
(LEAD FREE mark)
C-3 Label
Supplemental Label
Perforated line
XXXXXXXXXXXXX (Customer Name)
(CUST.)
XXX (FJ control number)
XXX (FJ control number)
XXX (FJ control number)
XXXXXXXXXXXXXX
(Part number)
(FJ control number + Product quantity)
(FJ control number + Product quantity
bar code)
(Part number + Product quantity bar code)
XXXXXXXXX (Delivery Address)
(DELIVERY POINT)
XXXXXXXXXXXXXX
(TRANS.NO.) (FJ control number)
XXXXXXXXXXXXXX
(PART NO.) (Customer part number or
FJ part number)
XXX/XXX
(Q’TY/TOTAL Q’TY) XX
(UNIT)
(CUSTOMER'S
REMARKS)
XXXXXXXXXXXXXXXXXXXX
(PACKAGE COUNT)
XXX/XXX
(PART NAME) XXXXXXXXXXXXXX (Part number)
(3N)3 XXXXXXXXXXXXXX XXX
(Part number + Product quantity)
(3N)4 XXXXXXXXXXXXXX XXX
(FJ control number)
(FJ control number bar code)
(3N)5 XXXXXXXXXX
D Label
XXXXXXXXXXXXXX (Part number)
(Lot Number)
XXXX-XXX
XXXX-XXX
(Count) (Quantity)
X XXX
X XXX
XXX
MB85RS1MT
DS501-00022-6v0-E 31
1.4 Dimensions for Containers
(1) Dimensions for in ner box
(2) Dimensions for outer box
LWH
540 125 75
(Dimensions in mm)
LWH
565 270 180
(Dimensions in mm)
LW
H
LW
H
MB85RS1MT
32 DS501-00022-6v0-E
2. Emboss Tape (FPT-8P-M02)
2.1 Tape Dimensions
PKG code Reel No Maximum storage capacity
pcs/reel pcs/inner box pcs/outer box
FPT-8P-M02 3 1500 1500 10500
(Dimensions in mm)
Material : Conductive polystyrene
Heat proof temperature : No heat resistance.
Package should not be baked
by using tape and reel.
C2012 FUJITSU SEMICONDUCTOR LIMITED SOL8-EMBOSSTAPE9 : NFME-EMB-X0084-1-P-1
8±0.1
6.4±0.1
3.9±0.2
4±0.1
5.5±0.05
5.5±0.1
2.1±0.1
0.4
1.75±0.1
0.3±0.05
2±0.05
+0.1
–0
ø1.5
+0.1
–0
ø1.5
+0.3
–0.1
12
B
BA A
SEC.A-A
SEC.B-B
MB85RS1MT
DS501-00022-6v0-E 33
2.2 IC orientation
2.3 Reel dimensions
Dimensions in mm
Reel No 123456789101112131415
Tape width
Symbol 8 12 16 24 32 44 56121624
A 254 ± 2 254 ± 2 330 ± 2 254 ± 2 330 ± 2 254 ± 2 330 ± 2 330 ± 2
B100 100 150 100 150 100 100 ± 2
C 13 ± 0.2 13
D 21 ± 0.8 20.5
E 2 ± 0.5
W1 8.4 12.4 16.4 24.4 32.4 44.4 56.4 12.4 16.4 24.4
W2
less than
14.4
less than 18.4 less than 22.4 less than 30.4 less than 38.4 less than 50.4
less than
62.4 less than
18.4 less than
22.4 less than
30.4
W3
7.9 ~ 10.9 11.9 ~ 15.4 15.9 ~ 19.4 23.9 ~ 27 .4 31.9 ~ 35.4 43.9 ~ 47.4 55.9 ~
59.4 12.4 ~
14.4 16.4 ~
18.4 24.4 ~
26.4
r1.0
(User Direction of Feed) (User Direction of Feed)
• ER type Index mark
(Reel side)
: Hub unit width dimensions
Reel cutout dimensions
W1
W2 r
E
W3
B
A
C
D
+2
-0
+2
-0
+2
-0
+2
-0
+2
-0
+2
-0
+0.5
-0.2
+1
-0.2
+2
-0
+2
-0
+2
-0
+2
-0
+2
-0
+2
-0
+2
-0
+1
-0
+1
-0
+0.1
-0
MB85RS1MT
34 DS501-00022-6v0-E
2.4 Taping (φ330mm Reel) Dry Pack Packing Specifications
*1:For a product of witch part number is suffixed with “E1”, a ” marks is display to the moisture barrier
bag and the inner boxes.
*2:The size of the outer box may be changed depending on the quantity of inner boxes.
*3:The space in the outer box will be filled with empty inner boxes, or cushions, etc.
*4:Please refer to an attached sheet about the indication label.
Note: The packing specifications ma y not be applied when the product is delivered via a distributor .
Embossed
tapes
Dry pack
Inner box
Outer box
Outside diameter: 330mm reel
Heat seal
Label I
*1, *4
Label II-B
*4
Label II-A
*4
Label I
*1, *4
Label I
*1, *4
Taping
Use adhesive tapes.
Outer box
*2, *3
φ
Inner box
Label I
*1, *4
Desiccant
Humidity indicator
Aluminum laminated bag
GPb
MB85RS1MT
DS501-00022-6v0-E 35
2.5 Product labe l indi ca t ors
Label I: Label on Inner box/Moisture Barrier Bag/ (It sticks it on the reel for the emboss taping)
[C-3 Label (50mm × 100mm) Supplemental Label (20mm × 100mm)]
Label II-A: La bel on Outer box [D Label] (100mm × 100mm)
Label II-B: Outer boxes prod uct indicate
Note: Depending on shipment state, “Label II -A” and “Label II-B” on the external boxes might not be printed.
(Customer part number or FJ part number)
(Customer part number or FJ part number)
(FJ control number bar code)
XX/XX XXXX-XXX XXX
XXXX-XXX XXX
(Lot Number and quantity)
(Package count)
(Customer part number or FJ part number
bar code)
(Part number and quantity)
(FJ control number)
QC PASS
XXXXXXXXXXXXXX
XXXX/XX/XX (Packed years/month/day) ASSEMBLED IN xxxx
(3N)1 XXXXXXXXXXXXXX XXX
(Quantity)
(3N)2 XXXXXXXXXX
XXX pcs
XXXXXX
XXXXXXXXXXXXXX
(Customer part number or FJ part number)
XXXXXXXXXXXXXX
(Comment)
XXXXXXXXXXXXXX
(FJ control number )
XXXXXXXXXX
(LEAD FREE mark)
C-3 Label
Supplemental Label
Perforated line
XXXXXXXXXXXXX (Customer Name)
(CUST.)
XXX (FJ control number)
XXX (FJ control number)
XXX (FJ control number)
XXXXXXXXXXXXXX
(Part number)
(FJ control number + Product quantity)
(FJ control number + Product quantity
bar code)
(Part number + Product quantity bar code)
XXXXXXXXX (Delivery Address)
(DELIVERY POINT)
XXXXXXXXXXXXXX
(TRANS.NO.) (FJ control number)
XXXXXXXXXXXXXX
(PART NO.) (Customer part number or
FJ part number)
XXX/XXX
(Q’TY/TOTAL Q’TY) XX
(UNIT)
(CUSTOMER'S
REMARKS)
XXXXXXXXXXXXXXXXXXXX
(PACKAGE COUNT)
XXX/XXX
(PART NAME) XXXXXXXXXXXXXX (Part number)
(3N)3 XXXXXXXXXXXXXX XXX
(Part number + Product quantity)
(3N)4 XXXXXXXXXXXXXX XXX
(FJ control number)
(FJ control number bar code)
(3N)5 XXXXXXXXXX
D Label
XXXXXXXXXXXXXX (Part number)
(Lot Number)
XXXX-XXX
XXXX-XXX
(Count) (Quantity)
X XXX
X XXX
XXX
MB85RS1MT
36 DS501-00022-6v0-E
2.6 Dimensions for Containers
(1) Dimensions for in ner box
(2) Dimensions for outer box
Tape width L W H
12, 16
365 345
40
24, 32 50
44 65
56 75
(Dimensions in mm)
LWH
415 400 315
(Dimensions in mm)
L
W
H
L
W
H
MB85RS1MT
DS501-00022-6v0-E 37
MAJOR CHANGES IN THIS EDITION
A change on a page is indicated by a vertical line drawn on the left side of that page.
Page Section Change Results
1, 2, 22, 25, 27 DIP, 8pin Added DIP package.
1FEATURES Added Data retention under 85 °C.
19 FRAM CHARACTERISTICS Added Data retention under 85 °C.
MB85RS1MT
38 DS501-00022-6v0-E
MEMO
MB85RS1MT
DS501-00022-6v0-E 39
MEMO
MB85RS1MT
FUJITSU SEMICONDUCTOR LIMITED
Shin-Yokohama Chuo Building, 2-100-45 Shin-Yokohama,
Kohoku-ku, Yokohama, Kanagawa 222-0033, Japan
http://jp.fujitsu.com/fsl/en/
All Rights Reserved.
FUJITSU SEMICONDUCTOR LIMITED, its subsidiaries and affiliates (collectively, "FUJITSU SEMICONDUCTOR") reserves
the right to make changes to the information contained in this document without notice. Please contact your FUJITSU
SEMICONDUCTOR sales representatives before order of FUJITSU SEMICONDUCTOR device.
Information contained in this document, such as descriptions of function and application circuit examples is presented solely for
reference to examples of operations and uses of FUJITSU SEMICOND UCTOR device. FUJITSU SEMICONDUCTOR disclaims
any and all warranties of any kind, whether express or implied, rela ted to such information, including, without limitation, quality,
accuracy, performance, proper operation of the device or non-infringement. If you develop equipment or product incorporating the
FUJITSU SEMICONDUCTOR device based on such information, you must assume any responsibility or liability arising out of or
in connection with such information or any use thereof. FUJITSU SEMICONDUCTOR assumes no responsibility or liab ility for any
damages whatsoever arising out of or in connection with such information or any use thereof.
Nothing contained in this document shall be constr ued as granting or conferring any right under any patents, copyr ights, or any other
intellectual property rights of FUJITSU SEMICONDUCTOR or any third party by license or otherwise, express or implied.
FUJITSU SEMICONDUCTOR assumes no responsibility or liability for any infringe ment of any intellectual property rights or other
rights of third parties resulting from or in connection with the information contained herein or use thereof.
The products described in this document are designed, developed and manufactured as contemplated for general use including
without limitation, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed and
manufactured as con templated (1) for use accompanying fatal risks or dangers that, unless extremely high levels of safet y is secured,
could lead directly to death, personal injury, severe physical damage or other loss (including, without limitation, use in nuclear
facility, aircraft flight control system, air traffic control system, mass transport control system, medical life support system and
military application), or (2) for use requiring extremely high level of reliability (including, without limitation, submersible repeater
and artificial satellite). FUJITSU SEMICONDUCTOR shall not be liable for you and/or any third party for any claims or damages
arising out of or in connection with above-mentioned uses of the products.
Any semiconductor devices fail or malfunction with some probability. You are responsible for providing adequate designs and
safeguards against injury, damage or loss from such failures or malfunctions, by incorporating safety design measures into your
facility, equipments and products such as redundancy, fire protection, and prevention of overcurrent levels and other abnormal
operating conditions.
The products and technical information described in this document are subject to the Foreign Exchange and Foreign Trade Control
Law of Japan, and may be subject to export or import laws or regulations in U.S. or other countries. You are responsible for ensuring
compliance with such laws and regulations relating to export or re-export of the products and technical information de scribed herein.
All company names, brand names and trademarks herein are property of their respective owners.
Edited: System Memory Business Division