AS7C31025B
3/31/03, v. 042003 Alliance Semiconductor P. 2 of 8
®
Functional description
The AS7C31025B is a high-performance CMOS 1,048,576-bit Static Random Access Memory (SRAM) device organized as 131,072 x 8 bits. It
is designed for memory applications where fast data access, low power, and simple interfacing are desired.
Equal address access and cycle times (tAA, tRC, tWC) of 8/10/12/15/20 ns with output ena b le access times (tOE) of 5, 5, 6, 7, 8 ns are ideal f or
high-performance applications. The chip enable input CE permits easy memory and expansion with multiple-bank memory systems.
When
CE
is high the device enters standby mode. A write cycle is accomplished by asserting write enable (
WE
) and chip enable (
CE
). Data on
the input pins I/O0 through I/O7 is written on the rising edge of
WE
(wr i te cycle 1) or
CE
(write cycle 2). To avoid bu s contention , external
devices should drive I/O pins only after outputs have been disabled withRXWSXWHQDEOH
OE
RUZULWHHQDEOH (
WE
).
A read cycle is accomplished by asser ting output enable (
OE
) and chip enable (
CE
), with write enable (
WE
) high. The chip drives I/O pins
with the data word referenced by the input address. When either chip enable or output enable is inactive or write enable is active, output
drivers stay in high-impedance mode.
All chip inputs and outputs are TTL-compatible, and operation is from a single 3.3 V supply. The AS7C31025B is packa ged in common industry
standard packages.
NOTE: Stresses gr eater than those listed under Absolute Maximum Ratings may cause permanent damage to the de vice. This is a stress rating only and functional oper-
ation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliab ility.
Key: X = don’t care, L = low, H = high.
Absolute maximum ratings
Parameter Symbol Min Max Unit
Voltage on VCC relative to GND Vt1 –0.50 +5.0 V
Voltage on any pin relative to GND Vt2 –0.50 VCC + 0.5 V
Power dissipation PD–1.0W
Storage temperature (plastic) Tstg –65 +150 o C
Ambient temperature with VCC applied Tbias –55 +125 o C
DC current into out pu t s (low) IOUT –20mA
Truth table
CE WE OE
Data Mode
H X X High Z Standby (ISB, ISB1)
L H H High Z Output disable (ICC)
LHL D
OUT Read (ICC)
LLX D
IN Write (ICC)