TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994 8504 Email: info-mmw@tqs.com Web: www.triquint.com
May 2, 2008
1
High Power Ka-Band Absorptive SPDT Switch TGS4304
Key Features and Performance
32 -
40 GHz Frequency Range
> 33 dBm Input P1dB @ VC = +10V
On Chip Biasing Resistors
On Chip DC Blocks
< 1.0 dB Midband
Insertion Loss
< 4ns Switching Speed
VPIN Technology
Chip Dimensions:
1.58 x 1.10 x 0.10 mm
(0.043 x 0.062 x 0.004 inches)
Description
The TriQuint TGS4304 is a GaAs
absorptive single-pole, double-throw
(SPDT) PIN monolithic switch designed
to operate over the Ka-Band frequency
range. This switch maintains a low
insertion loss with high power handling of
33dBm or greater input P1dB at VC
=
+10V. These advantages, along with the
small size of the chip, make the
TGS4304 ideal for use in communication
and transmit/receive applications.
The TGS4304 is 100% DC & RF tested
on-wafer to ensure performance
compliance.
Lead free and RoHS
compliant.
Primary Applications
Ka-Band Transmit / Receive
Point-to-Point Radio
Point-to-Multipoint Radio
Note: This device is early in the characterization process prior
to finalizing all electrical test specifications. Specifications are subject to
change without notice.
Measured Data
VA
= +5V, IA
0mA, VB
= -4V, IB
= 30mA
-5.0
-4.5
-4.0
-3.5
-3.0
-2.5
-2.0
-1.5
-1.0
-0.5
0.0
32 33 34 35 36 37 38 39 40
Frequency (GHz)
S21 (dB)
-30
-25
-20
-15
-10
-5
0
5
10
15
20
S11,S22 (dB)
S21
S11
S22
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994 8504 Email: info-mmw@tqs.com Web: www.triquint.com
May 2, 2008
2
TABLE I
MAXIMUM RATINGS
Symbol Parameter 1/ Value Notes
VC Control Voltage -5V to +25V 2/
IC Control Current 34 mA 2/
PIN Input Continuous Wave Power 35 dBm
TM Mounting Temperature (30 Seconds) 320 0C
TSTG Storage Temperature -65 to 150 0C
1/ These ratings represent the maximum operable values for this device.
2/ VC and IC are per bias pad.
3/ Operation above 30dBm requires control voltages above +7.5V.
TGS4304
TABLE II
RF CHARACTERIZATION TABLE
(T
A
= 25°C, Nominal)
(V
A
= +5V, I
A
= 0mA, V
B
= -4V, I
B
= 30mA)
Symbol Parameter Test Conditions Typ Units Notes
IL Insertion Loss
F = 32 – 34 GHz
F = 34 – 37 GHz
F = 37 – 40 GHz
1.3
0.9
1.3
dB
RL Return Loss F = 32 – 40 GHz 10 dB
P1dB
Output Power @
1dB Gain
Compression
V
C
= +5 V
V
C
= +7.5 V
Vc = +10 V
V
C
= +20 V
31
33
34
34.5
dBm 1/
Note: Table II Lists the RF Characteristics of typical devices as determined by fixtured
measurements.
1/ Frequency = 30GHz
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994 8504 Email: info-mmw@tqs.com Web: www.triquint.com
May 2, 2008
3
TGS4304
TABLE III
TRUTH TABLE
Selected RF
Output VAVB
RF Out A +5V @
~0mA
-4V @
30mA
RF Out B -4V @
30mA
+5V @
~0mA
Selected RF
Output IAIB
RF Out A +5V @
~0mA 30mA
RF Out B 30mA +5V @
~0mA
Operation at RF power levels >30 dBm requires increasing the positive
voltage level to put a larger reverse bias on the diodes while the negative
voltage level remains at -4V with a current of approximately 30mA. If you
are using -5V, use alternate assembly with off chip resistors.
Bond pads IA and IB bypass the on-chip series resistors to allow adjustment
of the current to the diodes in their forward biased state.
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994 8504 Email: info-mmw@tqs.com Web: www.triquint.com
May 2, 2008
4
TGS4304
Measured Performance
On State
Off State
-10
-9
-8
-7
-6
-5
-4
-3
-2
-1
0
30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45
Frequency (GHz)
S21 (dB)
-30
-25
-20
-15
-10
-5
0
5
10
15
20
S11,S22 (dB)
S21
S11
S22
-80
-70
-60
-50
-40
-30
-20
30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45
Frequency (GHz)
S31 (dB)
-30
-20
-10
0
10
20
30
S11,S33 (dB)
S31
S11
S33
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994 8504 Email: info-mmw@tqs.com Web: www.triquint.com
May 2, 2008
5
-3
-2.5
-2
-1.5
-1
-0.5
18 20 22 24 26 28 30 32 34 36
Pin (dBm)
Gain (dB)
Va=20 V
Va=15 V
Va=10 V
Va=7.5 V
Va=5 V
Measured Performance
30 GHz
|Ib| = 30 mA
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994 8504 Email: info-mmw@tqs.com Web: www.triquint.com
May 2, 2008
6
TGS4304
Measured Performance
On State
Measurements include connector / fixture losses of ~ 1dB
Off State
-50
-45
-40
-35
-30
-25
-20
-15
-10
-5
0
30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45
Frequency (GHz)
S31 (dB)
-40C
+24C
+85C
-10
-9
-8
-7
-6
-5
-4
-3
-2
-1
0
30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45
Frequency (GHz)
S21 (dB)
-40C
+24C
+85C
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994 8504 Email: info-mmw@tqs.com Web: www.triquint.com
May 2, 2008
7
Mechanical Drawing TGS4304
Units: millimeters (inches)
Thickness: 0.100 (0.004)
Chip edge to bond pad dimensions are shown to center of bond pad
Chip size tolerance: +/- 0.051 (0.002)
GND IS BACKSIDE OF MMIC
Bond Pad #1 (RF In) 0.15 x 0.10 (0.006 x 0.004)
Bond Pad #2 (RF Out A) 0.10 x 0.15 (0.004 x 0.006)
Bond Pad #3 (VA) 0.10 x 0.10 (0.004 x 0.004)
Bond Pad #4 (IA) 0.15 x 0.10 (0.006 x 0.004)
Bond Pad #5 (IB) 0.15 x 0.10 (0.006 x 0.004)
Bond Pad #6 (VB) 0.10 x 0.10 (0.004 x 0.004)
Bond Pad #7 (RF Out B) 0.10 x 0.15 (0.004 x 0.006)
0.00 [0.000]
0.10 [0.004]
0.79 [0.031]
0.49 [0.019]
0.34 [0.013]
1.09 [0.043]
1.24 [0.049]
1.48 [0.058]
1.58 [0.062]
0.00 [0.000]
0.10 [0.004]
0.45 [0.018]
1.00 [0.039]
1.10 [0.043]
1
2
3456
7
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994 8504 Email: info-mmw@tqs.com Web: www.triquint.com
May 2, 2008
8
Chip Assembly & Bonding Diagram
GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should
be observed during handling, assembly and test.
TGS4304
RF Input
RF Output A RF Output B
VA VB
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994 8504 Email: info-mmw@tqs.com Web: www.triquint.com
May 2, 2008
9
Alternate Chip Assembly & Bonding Diagram TGS4304
RF Input
RF Output A RF Output B
VA VB
RR
TABLE IV
BIAS RESISTOR VALUES
Maximum
Negative Bias
Voltage
R
-5V 33 Ohms
-7.5V 117 Ohms
-10V 200 Ohms
-15V 367 Ohms
-20V 533 Ohms
TriQuint Semiconductor Texas Phone: (972)994-8465 Fax: (972)994 8504 Email: info-mmw@tqs.com Web: www.triquint.com
May 2, 2008
10
GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should
be observed during handling, assembly and test.
Reflow process assembly notes:
Use AuSn (80/20) solder with limited exposure to temperatures at or above 300°C.
(30 seconds maximum)
An alloy station or conveyor furnace with reducing atmosphere should be used.
No fluxes should be utilized.
Coefficient of thermal expansion matching is critical for long-term reliability.
Devices must be stored in a dry nitrogen atmosphere.
Component placement and adhesive attachment assembly notes:
Vacuum pencils and/or vacuum collets are the preferred method of pick up.
Air bridges must be avoided during placement.
The force impact is critical during auto placement.
Organic attachment can be used in low-power applications.
Curing should be done in a convection oven; proper exhaust is a safety concern.
Microwave or radiant curing should not be used because of differential heating.
Coefficient of thermal expansion matching is critical.
Interconnect process assembly notes:
Thermosonic ball bonding is the preferred interconnect technique.
Force, time, and ultrasonics are critical parameters.
Aluminum wire should not be used.
Maximum stage temperature is 200°C.
Assembly Process Notes
TGS4304