DATA SH EET
Product data sheet
Supersedes data of 2000 May 01 2000 Sep 25
DISCRETE SEMICONDUCTORS
BZA800A-series
Quadruple ESD transient voltage
suppressor
db
ook, halfpage
MBD127
2000 Sep 25 2
NXP Semiconductors Product data sheet
Quadruple ESD transient voltage
suppressor BZA800A-series
FEATURES
ESD rating >8 kV, according to IEC10 00-4-2
SOT353 (SC-88A) surface mount pack age
Common anode configuration.
APPLICATIONS
Computers and pe ripherals
Audio and video eq uipment
Communication syste ms.
DESCRIPTION
Monolithic transient voltage suppressor diode in a five lead
SOT353 (SC-88A) package for 4-bit wide ESD transie nt
suppression.
MARKING
PINNING
TYPE NUMBER MARKING CODE
BZA856A Z1
BZA862A Z2
BZA868A Z3
BZA820A Z4
PIN DESCRIPTION
1cathode 1
2common anode
3cathode 2
4cathode 3
5cathode 4
handbook, halfpage
MGT580
1
5
4
32
31
4
5
2
Fig.1 Simplified outline SOT353 (SC- 8 8A) .
2000 Sep 25 3
NXP Semiconductors Pr oduct data sheet
Quadruple ESD transient voltage
suppressor BZA800A-series
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134).
Note
1. DC working current limite d by Ptot(max).
THERMAL CHARACTE RISTICS
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
Per diode
IZworking curr ent Tamb = 25 °Cnote 1 mA
IFcontinuous forward current Tamb = 25 °C200 mA
IFSM non-repetitive peak forward cu rr ent tp = 1 ms; square pulse 3.75 A
Ptot total power dissipation Tamb = 25 °C335 mW
PZSM non repetitive peak reverse power
dissipation: square pulse; tp = 1 ms; see Fig.3
BZA856A, BZA862A, BZA868A, 24 W
BZA820A 17 W
Tstg storage temperature 65 +150 °C
Tjjunction temperature 150 °C
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth j-a thermal resistance from junction to ambient all diodes loaded 370 K/W
2000 Sep 25 4
NXP Semiconductors Pr oduct data sheet
Quadruple ESD transient voltage
suppressor BZA800A-series
ELECTRICAL CHARACTERISTIC S
Tj = 25 °C unless otherwise specified.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
VFforward voltage IF = 200 mA 1.3 V
IRreverse current
BZA856A VR = 3 V 2 000 nA
BZA862A VR = 4 V 700 nA
BZA868A VR = 4.3 V 200 nA
BZA820A VR = 15 V 100 nA
VZworking voltage IZ = 1 mA
BZA856A 5.32 5.6 5.88 V
BZA862A 5.89 6.2 6.51 V
BZA868A 6.46 6.8 7.14 V
BZA820A 19 20 21 V
rdiff differential resistance IZ = 1 mA
BZA856A 400
BZA862A 300
BZA868A 200
BZA820A 125
SZtemperatur e coe fficient IZ = 1 mA
BZA856A 0.2 mV/K
BZA862A 1.8 mV/K
BZA868A 3mV/K
BZA820A 16 mV/K
Cddiode capacitance f = 1 MHz; VR = 0
BZA856A 240 pF
BZA862A 200 pF
BZA868A 180 pF
BZA820A 50 pF
IZSM non-repetitive peak reverse current tp = 1 ms; Tamb = 25 °C
BZA856A 3.2 A
BZA862A 2.9 A
BZA868A 2.6 A
BZA820A 0.6 A
2000 Sep 25 5
NXP Semiconductors Pr oduct data sheet
Quadruple ESD transient voltage
suppressor BZA800A-series
handbook, halfpage
10
1
MGT583
102101110
tp (ms)
IZSM
(A)
BZA856A
BZA862A
BZA868A
BZA820A
101
Fig.2 Maximum non-repetitive pea k re verse
current as a func tion of pulse time.
handbook, halfpage
102
10
1
MGT584
BZA856A, BZA862A, BZA868A
BZA820A
102101110
tp (ms)
PZSM
(W)
Fig.3 Maximum non-repetitive pea k re verse
power dissipation as a func tion of pulse
duration (squ are pulse).
PZSM = VZSM × IZSM.
VZSM is the non-repetitive peak reverse voltage at IZSM.
handbook, halfpage
05 15
200
0
160
MGT585
10
120
80
40
VR (V)
Cd
(pF)
BZA856A
BZA862A
BZA868A
BZA820A
Fig.4 Diode capacitance as a function of reverse
voltage; typical values.
Tj = 25 °C; f = 1 MHz.
handbook, halfpage
0 50 100 150
400
300
100
0
200
MGT586
Tamb (
°
C)
Ptot
(mW)
Fig.5 Power derating curve.
2000 Sep 25 6
NXP Semiconductors Pr oduct data sheet
Quadruple ESD transient voltage
suppressor BZA800A-series
handbook, full pagewidth
MGT587
450
50
Note 1: attenuator is only used for open
socket high voltage measurements
IEC 1000-4-2 network
CZ = 150 pF; RZ = 330
1/4 BZA800A
RG 223/U
50 coax
RZ
CZ
ESD TESTER DIGITIZING
OSCILLOSCOPE
10×
ATTENUATOR
note 1
GND
GND
GND
unclamped +1 kV ESD voltage waveform
(IEC 1000-4-2 network) clamped +1 kV ESD voltage waveform
(IEC 1000-4-2 network)
GND-1
GND-2
GND-3
GND-4
vertical scale = 100 V/div
horizontal scale = 50 ns/div
unclamped 1 kV ESD voltage waveform
(IEC 1000-4-2 network) clamped 1 kV ESD voltage waveform
(IEC 1000-4-2 network)
vertical scale = 100 V/div
horizontal scale = 50 ns/div vertical scale = 10 V/div
horizontal scale = 50 ns/div
vertical scale = 10 V/div
horizontal scale = 50 ns/div
BZA856A
BZA862A
BZA868A
BZA820A
Fig.6 ESD clamping test set-up an d waveforms.
2000 Sep 25 7
NXP Semiconductors Pr oduct data sheet
Quadruple ESD transient voltage
suppressor BZA800A-series
APPLICATION INFORMATION
Typical common anode application
A quadruple transient suppressor in a SOT353 package makes it possible to protect four separate lines using only one
package. Two simplified ex amples are shown in Figs 7 and 8.
handbook, full pagewidth
GND
keyboard,
terminal,
printer,
etc. I/O
BZA800A
A
B
C
D
FUNCTIONAL
DECODER
MGT581
Fig.7 Computer interface protec tion.
handbook, full pagewidth
MGT582
I/O
ROM
RAM
CPU
CLOCK
GND
VDD
VGG
data bus
control bus
address bus
BZA800A
Fig.8 Microprocessor protection.
2000 Sep 25 8
NXP Semiconductors Pr oduct data sheet
Quadruple ESD transient voltage
suppressor BZA800A-series
Device placement and printed-circuit board layout
Circuit board layout is of extreme importance in the
suppression of trans i ents. The clamping voltag e of the
BZA800A is determined by the peak transient current and
the rate of rise of that current (di/d t) . Since parasitic
inductances can furth er add to the clamping voltage
(V = L di/dt) the series cond uctor lengths on the
printed-circuit board should be kept to a minimum. This
includes the lead length of the suppression element.
In addition to minimizing conductor length the following
printed-circuit board layout guidelines are recommended:
1. Place the suppress ion element close to the input
terminals or connectors
2. Keep parallel signal paths to a minimum
3. Avoid running prote ction conductors in parallel with
unprotected conductors
4. Minimize all printed-circuit board loop areas including
power and ground loops
5. Minimize the length of the transient return path to
ground
6. Avoid using shared transient return paths to a common
ground point.
2000 Sep 25 9
NXP Semiconductors Pr oduct data sheet
Quadruple ESD transient voltage
suppressor BZA800A-series
PACKAGE OUTLINE
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC EIAJ
SOT353
wB
M
bp
D
e1
e
A
A1
Lp
Q
detail X
HE
E
v
M
A
AB
y
0 1 2 mm
scale
c
X
132
45
Plastic surface mounted package; 5 leads SOT353
UNIT A1
max bpcD
E
(2)
e
1
HELpQywv
mm 0.1 0.30
0.20 2.2
1.8
0.25
0.10 1.35
1.15 0.65
e
1.3 2.2
2.0 0.2 0.10.2
DIMENSIONS (mm are the original dimensions)
0.45
0.15 0.25
0.15
A
1.1
0.8
97-02-28SC-88A
2000 Sep 25 10
NXP Semiconductors Pr oduct data sheet
Quadruple ESD transient voltage
suppressor BZA800A-series
DATA SHEET STATUS
Notes
1. Please consult the most recently issued document befor e initiating or co mpleting a design.
2. The product s ta tus of device(s) described in this do cument may have changed since this document was published
and may differ in case of multiple devices. The latest product status information is available on th e Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the produc t s pecification.
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does not give any representations or warranties,
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published in this doc ument, including without limitation
specifications and product descriptions, at any time and
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Applications Applications that are described herein for
any of these products are for illustrative purposes only.
NXP Semiconductors makes no representation or
warranty that such applications will be suitable for the
specified use witho ut fu rth e r testing or modification.
Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values are stress ratin gs only and
operation of the device at these or any other conditions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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Quick refer ence data The Quick reference data is an
extract of th e product data given in the Limiting values and
Characteristics sections of this document, and as such is
not complete, exhaus tive or legally binding.
NXP Semiconductors
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Printed in The Netherlands 613514/03/pp11 Date of release: 2000 Sep 25 Document order number: 9397 750 07142