
MIXA150R1200VA
preliminary
-di /dt = A/µs
T = °C
V
CES
V1200
collector emitter voltage
collector emitter saturation voltage
T = 25°C
collect or current A
220
A
C
VJ
Symbol Definition
Ratings
typ. max.min.Conditions Unit
150
V
V
CE(sat)
total power dissipation 695 W
collector emitter leakage current
6.5 V
turn-on delay time 70 ns
t
reverse bias safe operating area
A
V
GES
V±20
V
GEM
max. transient ga te emitte r vo l t a g e
T = °C
C
V
P
tot
gate emitter threshold voltage
RBSOA
450
±30
T = °C
T = °C
VJ
V
max. DC gate voltage
I
C25
I
C
T = 25°C
VJ
I = A; V = 15 V
CGE
T = 25°C
VJ
V
GE(th)
I
CES
I = mA; V = V
CGECE
V = V ; V = 0 V
CE CES GE
I
GES
T = 25°C
VJ
gate emitter leakage current V = ±20 V
GE
2.1
2.1
5.95.4
mA
1mA
0.5
500
G(on)
total gate charge V = V; V = 15 V; I = A
CE
Q
GE C
470 nC
t
t
t
E
E
d(on)
r
d(off)
f
on
off
40 ns
250 ns
100 ns
14 mJ
16 mJ
current rise time
turn-off delay time
current fall time
turn-on energy per pulse
turn-off energy per pulse
inductive load
V = V; I = A
V = ±15 V; R = Ω
CE C
GE G
V = ±15 V; R = Ω
GE G
V = V
CEmax
1200
short circuit safe operating area
µs
SCSOA
10T = °C
VJ
V = V; V = ±15 V
CE GE
short circuit duration
t
short circuit current
I
SC
SC
R = Ω; non-repetitive
G
600 A
R
thJC
thermal resistance junction to case 0.18 K/W
V
RRM
V1200
max. repetitive rev ers e voltage T = 25°C
VJ
T = 25°C
forward current A
190
A
C
130T = °C
C
I
F25
I
F
T = 25°C
forward voltage V
2.20
V
VJ
1.95T = 125°C
VJ
V
F
I = A
F
T = 25°C
reverse current mA
0.3
mA
VJ
0.8T = 125°C
VJ
I
RR RRM
T = 125°C
VJ
Q
I
t
rr
RM
rr
20 µC
175 A
350 ns
reverse recovery charge
max. reverse recovery current
reverse recovery time
V =
I = A; V = 0 V
F
FGE
E
rec
10 mJ
reverse recovery energy
R
R
thJC
thermal resistance junction to case 0.28 K/W
V = V
T = 25°C
C
T = 25°C
VJ
T = °C
VJ
VJ
150
6
150
150
150
150
4.7
4.7
4.7
600
900
2500
600
I
CM
1.8
R
thCH
thermal resistance case to heatsink K/W
R
thCH
thermal resistance case to heatsink K/W
IGBT
Diode
600 V
V = V
CEmax
1200
80
80
80
80
125
125
125
125
125
nA
0.20
0.20
IXYS reserves the right to change limits, conditions and dimensions. 20130906aData according to IEC 60747and per semiconductor unless otherwise specified
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