AM29SL160CT-100EC - Advanced Micro Devices

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Am29SL160C

Data Sheet

This Data Sheet states AMD’s current specifications regarding the Products described herein. This Data Sheet may

be revised by subsequent versions or modifications due to changes in technical specifications. Publication# 21635 Rev: CAmendment/+2

Issue Date: Ju ne 11, 2002

Refer to AMD

’

s Website (www amd com) for the latest information

Am29SL160C

16 Megabit (2 M x 8-Bit/1 M x 16-Bit)

CMOS 1.8 Volt-only Super Low Voltage Flash Memory

DISTINCTIVE CHARACTERISTICS

ARCHITEC TURAL ADVANTAGES

■Secured Silicon (SecSi) Sector: 256-byte sector

—Factory locked and identifiable: 16 bytes available for

secure, random factory Electronic Serial Number;

verifiable as factory loc ked through autoselect

function. ExpressFlash option all o ws entire sector to

be available for factory-secured data

—Cus tomer lock able: Custom er may progr am own

custom data. Once locked, data cannot b e changed

■Zero Power Operation

— Sophisticated power management circuits reduce

power consumed during inactive periods to nearly

zero

■Package optio ns

—48-ball FBGA

— 48-p in TSOP

■Top or bottom boot block

■Manufactured on 0.32 µm process technol ogy

■Compatible with JEDEC standards

— Pinout and software compatible with single-power-

supply flash standard

PERFORMANCE CHARACTERISTIC S

■High performance

— Access time as fast 90 ns

— Program time: 8 µs/word typical using Accelerate

■Ultra low power consumption (typical values)

— 1 mA active read current at 1 MHz

— 5 mA active read current at 5 MHz

— 1 µA in standby or automatic sleep mode

■Minimum 1 million erase cycles guaranteed per

sector

■20 Year data retention at 125°C

— Reliable operation for the life of the system

SOFTWARE FEATURES

■Suppo rts Commo n Flash Memory Interface (CFI)

■Erase Suspend/Erase Resume

— Suspends erase operations to allow programming in

same bank

■Data# Polling and Toggle Bits

— Provides a software method of detecting the status of

program or erase cycles

■Unlock Bypass Program command

— Reduces overall programming time when issuing

multiple program command sequences

HARDWARE FEATURES

■Any combin ation of sectors can be erased

■Ready/Busy# output (RY/BY#)

— Hardware method for detecting program or erase

cycle completion

■Hardware reset pin (RESET#)

— Hardware method of resetting the internal state

machine to reading array data

■WP#/ACC input pin

— Write protect (WP#) function allows protection of two

outermost boot sectors, regardless of sector protect status

— A cceleration (ACC) function accelerates program

timing

■Sector protection

— Hardware method of locking a sector, either in-

system or using programming equipment, to prevent

any program or erase operation within that sector

— Temporary Sector Unprotect allows changing data in

protected sectors in-system

2 Am29SL160C June 11, 2002

GENERAL DESCRIPTION

The Am29SL160C is a 16 Mbit, 1.8 V volt-only Flash

memory organized as 2,097,152 bytes or 1,048,576

words. The data appear s on DQ0–DQ15 . The device i s

offered in 48-pin TSOP and 48-ball FBGA packages.

The word- wide dat a ( x16 ) ap pear s on DQ15–DQ0; the

byte-wide ( x8) dat a appears on DQ7–DQ0. This device is

designed to be programmed and erased in-system with a

singl e 1.8 volt VCC supply. No VPP is required f or program

or erase operations. The device can also be programmed

in s tandard EPROM programmers.

The standard device offers access times of 90, 100,

120, or 150 ns, allowing microprocessors to operate

without wait states. To eliminate bus contention the

device has separate chip enable (CE#), write enable

(WE#) and output enable (OE#) controls.

The device requires only a single 1.8 volt power

supply for both read and write functions. Internally

generated and regulated voltages are provided for the

program and erase operations.

The device is entirely command set compatible with the

JEDEC single-power-supply Flash standard. Com-

mands are written to the command register using

standard microprocessor write timings. Register con-

tents serve as input to an internal state-machine that

controls the erase and programming circuitry. Write

cycles also internally l atch addresses and data needed

for the programming and erase operations. Reading

data out of the device is similar to reading from other

Flash or EPROM devices.

Device programming occ ur s by executing the program

command sequence. This initiates the Embedded

Program algorithm—an internal algorithm that auto-

matically times the program pulse widths and verifies

proper cell margin. The Unlock Bypass mode facili-

tates faster programming times by requiring only two

write cycles to program data instead of four.

Device erasure occurs by executing the erase

command sequence. This initiates the Embedded

Erase algorithm—an internal algorithm that automati-

cally preprograms the array (if it is not already

programmed) before executing the erase operation.

During erase, the dev ic e automatically t imes the er as e

pulse widths and verifies proper cell margin.

The host system can detect whether a program or

erase operation is complete by observing the RY/BY#

pin, or by reading the DQ7 (Data# Polling) and DQ6

(toggle) status bits. After a program or erase cycle

has been completed, the device is ready to read array

data or accept another command.

The sector e rase architecture allows memory sectors

to be erased and reprogrammed without affecting the

data contents of other sectors. The device is fully

erased when shipped from the factory.

Hardware data protection measures include a low

VCC detector t hat automatically inhibits writ e operations

during power transitions. The hardware sector pro-

tection feature disables both program and erase

operations in any combination of the sectors of

memory. This can be achieved in-system or via pro-

gramming equipment.

The Erase Suspend feature enables the user to put

erase on hold for any period of time to read data from,

or program data to, any sector that is not selected for

erasure. T rue background erase c an thus be ac hieved.

The hard ware RESET# pin terminates any operation

in progress and resets the internal state machine to

readi ng array da t a. The RES E T# pin may be tied to the

system reset circuitry. A system reset would thus al so

reset the d evice , ena bli ng th e syste m m icropro cesso r to

read the boot-up firmware from the Flash memory.

The device offers two power-saving features. When

addresses have been stable for a specified amount of

time, the device enters the automatic sleep mode.

The system can also pl ace th e device i nto the standby

mode. Power consumption is greatly reduced in both

modes.

AMD’s Flash technology combines years of Flash

memory manufacturing experience to produce the

highest levels of quality, reliability and cost effective-

nes s. The device electrically erases all bits within a

sector simultaneously via Fowler-Nordheim tunneling.

The data is programmed using hot electron injection.

June 11, 2002 Am29SL160C 3
TABLE OF CONTENTS
Product Selector Guide  . . . . . . . . . . . . . . . . . . . . . 4
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . .  4
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . . 5
Special Handling Instructions for FBGA Packages  .................. 6
Pin Configuration  . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Logic Symbol   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Ordering Information  . . . . . . . . . . . . . . . . . . . . . . . 8
Device Bus Operations . . . . . . . . . . . . . . . . . . . . . . 9
Table 1. Am29SL160C Device Bus Operations  ...............................9
Word/Byte Configuration  .......................................................... 9
Requirements for Reading Array Data  ..................................... 9
Writing Commands/Command Sequences  ............................ 10
Accelerated Program Operation  ............................................. 10
Program and Erase Operation Status  .................................... 10
Standby Mode  ........................................................................ 10
Automatic Sleep Mode  ........................................................... 10
RESET#: Hardware Reset Pin  ............................................... 10
Output Disable Mode .............................................................. 11
Table 2. Am29SL160CT Top Boot Sector Architecture  ..................12
Table 3. Am29SL160CB Bottom Boot Sector Architecture .............13
Autoselect Mode ..................................................................... 14
Table 4. Am29SL160C Autoselect Codes (High Voltage Method) ..14
Sector/Sector Block Protection and Unprotection  .................. 15
Table 5. Top Boot Sector/Sector Block Addresses
for Protection/Unprotection .............................................................15
Table 6. Bottom Boot Sector/Sector Block 
Addresses for Protection/Unprotection ...........................................15
Write Protect (WP#) ................................................................ 16
Temporary Sector Unprotect  .................................................. 16
Figure 1. In-System Sector Protect/Unprotect Algorithms .............. 17
Figure 2. Temporary Sector Unprotect Operation........................... 18
Secured Silicon (SecSi) Sector Flash Memory Region  .......... 18
Table 7. SecSi Sector Addresses  ...................................................18
Hardware Data Protection  ...................................................... 18
Low VCC Write Inhibit  .............................................................. 18
Write Pulse “Glitch” Protection  ............................................... 18
Logical Inhibit .......................................................................... 18
Power-Up Write Inhibit ............................................................ 18
Common Flash Memory Interface (CFI). . . . . . .  19
Table 8. CFI Query Identification String  ..........................................19
Table 9. System Interface String .....................................................20
Table 10. Device Geometry Definition  ............................................20
Table 11. Primary Vendor-Specific Extended Query ......................21
Command Definitions . . . . . . . . . . . . . . . . . . . . .  21
Reading Array Data  ................................................................ 21
Reset Command ..................................................................... 21
Autoselect Command Sequence  ............................................ 22
Enter SecSi Sector/Exit SecSi Sector Command Sequence .. 22
Word/Byte Program Command Sequence  ............................. 22
Unlock Bypass Command Sequence  ..................................... 22
Figure 3. Program Operation .......................................................... 23
Chip Erase Command Sequence  ........................................... 24
Sector Erase Command Sequence  ........................................ 24
Erase Suspend/Erase Resume Commands ........................... 24
Figure 4. Erase Operation............................................................... 25
Command Definitions  ............................................................. 26
Table 12. Am29SL160C Command Definitions  ............................. 26
Wr ite O pe r a tion S t a tus  . . . . . . . . . . . . . . . . . . . .  27
DQ7: Data# Polling ................................................................. 27
Figure 5. Data# Polling Algorithm ..................................................  27
RY/BY#: Ready/Busy# ............................................................ 28
DQ6: Toggle Bit I  .................................................................... 28
DQ2: Toggle Bit II  ................................................................... 28
Reading Toggle Bits DQ6/DQ2 ............................................... 28
DQ5: Exceeded Timing Limits  ................................................ 29
DQ3: Sector Erase Timer  ....................................................... 29
Figure 6. Toggle Bit Algorithm........................................................  29
Table 13. Write Operation Status ................................................... 30
Absolute Maximum R a t ings  . . . . . . . . . . . . . . . .  31
Figure 7. Maximum Negative Overshoot Waveform ......................  31
Figure 8. Maximum Positive Overshoot Waveform........................  31
Operating Ranges   . . . . . . . . . . . . . . . . . . . . . . . .  31
DC Cha ra c teristic s  . . . . . .  . . . . . . . . . . . . . . . . . .  32
Figure 9. ICC1 Current vs. Time (Showing Active and Automatic 
Sleep Currents)..............................................................................  33
Figure 10. Typical ICC1 vs. Frequency ............................................  33
Test  C onditions  . . . . . . . . . . . . . . . . . . . . . . . . . .  34
Figure 11. Test Setup.....................................................................  34
Table 14. Test Specifications  ......................................................... 34
Figure 12. Input Waveforms and Measurement Levels .................  34
AC Cha ra c teristic s  . . . . . .  . . . . . . . . . . . . . . . . . .  35
Read Operations  .................................................................... 35
Figure 13. Read Operations Timings .............................................  35
Hardware Reset (RESET#)  .................................................... 36
Figure 14. RESET# Timings ..........................................................  36
Word/Byte Configuration (BYTE#)  ........................................ 37
Figure 15. BYTE# Timings for Read Operations............................  37
Figure 16. BYTE# Timings for Write Operations............................  37
Erase/Program Operations ..................................................... 38
Figure 17. Program Operation Timings..........................................  39
Figure 18. Chip/Sector Erase Operation Timings ..........................  40
Figure 19. Data# Polling Timings (During Embedded Algorithms).  41
Figure 20. Toggle Bit Timings (During Embedded Algorithms)......  41
Figure 21. DQ2 vs. DQ6.................................................................  42
Figure 22. Temporary Sector Unprotect Timing Diagram ..............  42
Figure 23. Accelerated Program Timing Diagram..........................  43
Figure 24. Sector Protect/Unprotect Timing Diagram ....................  43
Figure 25. Alternate CE# Controlled Write Operation Timings ......  45
Erase And Pro grammi ng Performance   . . . . . . .  46
La t c h up Cha r a c t e r is tics. . . . . . . . . . . . . . . . . . . . 46
TS O P  Pin Ca pa c i t a nc e .  . . . . . . . . . . . . . . . . .  . . . 46
Dat a  Ret e ntion. . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Physical Dimensions*  . . . . . . . . . . . . . . . . . . . . .  47
TS 048—48-Pin Standard TSOP ............................................ 47
FBC048—48-Ball Fine-Pitch Ball Grid Array (FBGA)
8 x 9 mm package  .................................................................. 48
Revis ion Summ a r y  . . . . . . . . . . . . . . . . . . . . . . . .  49
Revision B (December 14, 1999) ............................................ 49
Revision C (February 21, 2000) .............................................. 49
Revision C+1 (November 14, 2000)  ....................................... 49
Revision C+2 (June 11, 2002)  ................................................ 50

4 Am29SL160C June 11, 2002

PRODUCT SELECTOR GUIDE

Note:See “AC Characteristics” for full specifications .

BLOCK DIAGRAM

Family Part Number Am29SL160C

Sp eed Optio ns -90 -100 -120 -150

Max access time, ns (tACC) 90 100 120 150

Max CE# access time, ns (tCE) 90 100 120 150

Max OE# access time, ns (tOE) 35355065

Input/Output

Buffers

X-Decoder

Y-Decoder

Chip Enable

Output Enable

Logic

Erase Voltage

Generator

PGM Voltage

Generator

Timer

VCC Detect or

State

Control

Command

VCC

VSS

WE#

BYTE#

WP#/ACC

CE#

OE#

STB

DQ0–DQ 15 (A-1)

Sector Switches

RY/BY#

RESET#

Data

Latch

Y-Gating

Cell Matrix

Address Latch

A0–A19

June 11, 2002 Am29SL160C 5

CONNECTION DIAGRAMS

A15

A18

A14

A13

A12

A11

A10

A19

WE#

RESET#

WP#/ACC

RY/BY#

A17

A16

DQ2

BYTE#

VSS

DQ15/A-1

DQ7

DQ14

DQ6

DQ13

DQ9

DQ1

DQ8

DQ0

OE#

VSS

CE#

DQ5

DQ12

DQ4

VCC

DQ11

DQ3

DQ10

Standard TSOP

6 Am29SL160C June 11, 2002

CONNECTION DIAGRAMS (Continued)

Special Hand lin g Instruc tio ns for FBGA

Packages

Special handling is required f or Flash Memory pr oducts

in FBGA packages.

Flash memory devices in FBGA packages may be

damaged if exposed to ultrasonic cleaning methods.

The package and/or data integrity may be compro-

mised if the package body is exposed to temperatures

above 150°C for prolonged periods of time.

A1 B1 C1 D1 E1 F1 G1 H1

A2 B2 C2 D2 E2 F2 G2 H2

A3 B3 C3 D3 E3 F3 G3 H3

A4 B4 C4 D4 E4 F4 G4 H4

A5 B5 C5 D5 E5 F5 G5 H5

A6 B6 C6 D6 E6 F6 G6 H6

DQ15/A-1 VSS

BYTE#A16A15A14A12A13

DQ13 DQ6DQ14DQ7A11A10A8A9

VCC DQ4DQ12DQ5A19NCRESET#WE#

DQ11 DQ3DQ10DQ2NCA18WP#/ACCRY/BY#

DQ9 DQ1DQ8DQ0A5A6A17A7

OE# VSS

CE#A0A1A2A4A3

48-Ball FBGA

(Top View, Balls Facing Down )

June 11, 2002 Am29SL160C 7

PIN CONFIGURATION

A0–A19 = 20 addresses

DQ0–DQ14 = 15 data inputs/outputs

DQ15/A-1 = DQ15 (data input/output , word mode),

A-1 (LSB address input, byte mode)

CE# = Chip enable

OE# = Output enable

WE# = Write enable

WP#/ACC = Hardware write protect /acc eler ation

RESET# = Hardware reset pin, active low

BYTE# = Selects 8-bit or 16-bit mode

RY/BY# = Ready/Busy# output

VCC = 1.8–2.2 V single power supply

VSS = Device ground

NC = Pin not connected internal ly

LOGIC SYMBOL

20 16 or 8

DQ0–DQ15

(A-1)

A0–A19

CE#

OE#

WE#

RESET#

BYTE#

RY/BY#

WP#/ACC

8 Am29SL160C June 11, 2002

ORDERING INFORMATION

Standard Products

AMD standard products are available in several packages and operating ranges. The order number (Valid Combi-

nation) is formed by a combination of the elements below.

Valid Combinations

Valid Combinations list configurations planned to be sup-

ported in volume for this device. Consult the local AMD sales

offic e to confirm availability of specific valid combinations and

to check on newly released combinations.

Am29SL160C T -90 E C N STANDARD PROCESSI NG

N = SecSi Sector factory-locked with random ESN

(Contact an AMD representative for more in formation)

TEMPERATURE RANGE

C = Commercial (0°C to +70°C)

I = Industria l (–40°C to +85°C)

E = Extended (–55°C to +125°C)

PACKAG E TYPE

E = 48-Pin Thin Small Outline Package (TSOP)

Standard Pinout (TS 048)

WC=48-ball Fine-Pitch Ball G rid Array (FBGA)

0.80 mm pitch, 8 x 9 mm package (FBC048)

SPEED OPT IO N

See Product Sel ector Guide and Valid Combinations

BO O T CODE SEC TOR ARC HIT ECTURE

T = Top sector

B = Bottom sector

DEVI CE NUMBER/DES CRIPTIO N

Am29SL160C

16 Megabit (2 M x 8-Bit/1 M x 16-Bit) CMOS Flash Memory

1.8 Volt-only Read, P rogram, and Erase

Valid Combinations for TSOP Packages

AM29SL160CT-90,

AM29SL160CB-90

EC, EI

AM29SL160CT-100,

AM29SL160CB-100

AM29SL160CT-120,

AM29SL160CB-120

AM29SL160CT-150,

AM29SL160CB-150

Valid Combinations for FBGA Packages

Order Number Package Marking

AM29SL160CT-90,

AM29SL160CB-90

WCC,

WCI

A160CT90V,

A160CB90V

C, I

AM29SL160CT-100,

AM29SL160CB-100 A160CT10V,

A160CB10V

AM29SL160CT-120,

AM29SL160CB-120 A160CT12V,

A160CB12V

AM29SL160CT-150,

AM29SL160CB-150 A160CT15V,

A160CB15V

June 11, 2002 Am29SL160C 9
DEVICE BUS OPERATIONS
This s ection desc ribes the  requirements and  use of  the
device bus operations, which are initiated through the
internal command register. The command register
itself does not occupy any addressable memory loca-
tion.  The register is composed of latches  that  stor e the
commands, along with the address and data informa-
tion needed to execute the command. The contents of
the register serve as inputs to the internal state
machine. The state machine outputs dictate the func-
tion of the device. Table 1 lists the device bus
operations, the inputs and control levels they require,
and the resulting output. The following subsections
describe each of these operations in further detail.
Table 1. Am29SL160C Device Bus Operations 
Legend:
L = Logi c Low  =  VIL, H = L ogi c High  = V IH, VID = 10 ± 1.0 V, VHH =  10 ± 0.5  V,  X = D on’ t C are, A IN = Ad dress In , DIN =  Data  In,
DOUT = Data Out
Notes:
1. Addres ses are A19:A0 in word mode (BYTE# = VIH), A19:A-1 in byte mode (BYTE# = VIL).
2. The sector protect and sector unprotect functions may also be implemented via programming equipment. See the “Sector/
Sector Block Protection and Unprotection” secti on.
3. If WP#/ACC = VIL, the two outermost boot sectors will be protected. If WP#/ACC = VIH, the two outermost boot sectors will be 
protected or unprotected as previously set by the system. If WP#/ACC  = VHH, all sectors, including the two  outermost boot 
sectors, will be unprotected. 
W ord/Byt e Configura tion
The BYTE# pin controls whether the device data I/O
pins DQ15–DQ0 operat e in the byte or wor d configur a-
tion. If the BYTE# pin is set at logic ‘1’, the device is in
word configuration, DQ15–DQ0 are active and con-
trolled by CE# and OE#.
If the BYTE# pin i s set at logic ‘0’, the device is i n byte
configuration, and only data I/O pins DQ0–DQ7 are
active and controlled by CE# and OE#. The data I/O
pins DQ8–DQ14 are tri-stated, and the DQ15 pin is
used as an input for the LSB (A-1) address function. 
Requireme nts for Reading Array Data
To read array data from the outputs, the system must
drive the CE# and OE# pins to VIL. CE# is the power
control and selects the device. OE# is the output
control and gates array data to the output pins. WE#
should remain at VIH. The BYTE# pin determines
whether the device outputs array data in words or
bytes.
The internal stat e machine is set for reading ar ray data
upon device power-up, or after a hardware reset. This
ensures that no spurious alteration of the memory
content occurs during the power transition. No
command is necessary in this mode to obtain array
Operation CE# OE# WE# RESET# WP#/ACC Addresses
(Note 1) DQ0–
DQ7
DQ8–DQ15
BYTE#
= VIH
BYTE# 
= VIL
Read L L H H X AIN DOUT DOUT DQ8–DQ14 = High-Z, 
DQ15 = A-1
Write 
(Program/Erase) L H L H (Note 3) AIN DIN DIN
Standby VCC ± 
0.2 V XXVCC ± 
0.2 V X X High-Z High-Z High-Z
Output Disa ble L H H H X X High-Z Hi gh-Z Hig h-Z
Reset X X X L X X High-Z High-Z High-Z
Sector Protect 
(Note 2) LHL V
ID XSector Address, 
A6 = L, A1 = H, 
A0 = L DIN XX
Sector Unprotect 
(Note 2) LHL V
ID (Note 3) Sector Address, 
A6 = H, A1 = H, 
A0 = L DIN XX
Tempor ary Sector  
Unprotect XXX V
ID (Note 3) AIN DIN DIN High-Z

10 Am29SL160C June 11, 2002
data. Standard microprocessor read cycles that assert
valid addresses on the device address inputs produce
valid data on the device data outputs. The device
remains enabled for read access until the command
regi ster contents are alter ed.
See “Reading Array Data” for more  information. Refer
to the AC  table for timing specifications and to Figure
13 for the timing diagram. ICC1 in the DC Characteris-
tics  t able r epr es ents the ac tive current spec ification f or
reading array data.
W riting Command s/Command Seq uences
To write a command or command sequence (which
includes programming data to the device and erasing
sectors of memory), the system must drive WE# and
CE# to VIL, and OE# to VIH.
For program operations, the BYTE# pin determines
whether the device accepts program data in bytes or
words. Refer to “Word/Byte Configuration” for more
information. 
The devic e f eatures an Unlock Bypass mode to facili-
tate faster programming. Once the device enters the
Unlock Bypass mode, only two write cycles are
required to program a word or byte, instead of four. The
“Word/Byte Program Command Sequence” section
has details on programming data to the device using
both standard and Unlock Bypass command
sequences.
An erase operation can erase one sector, multiple sec-
tors, or the entire device. Tables 2 and 3 indicate the
address space that each sector occupies. A “sector
address” consists of the address bits required to
uniquely select a sector. The “Command Definitions”
section has details on erasing a sector or the entire
chip, or suspending/ resuming the eras e operation.
After the system writes the autoselect command
sequence,  the de vi ce en ters  the autoselect mode. The
system can then read autoselect codes from the
internal register (which is separate from the memory
array) on DQ7–DQ0. Standard read cycle timings apply
in this mode. Refer to the Autoselect Mode and Autose-
lect Command Sequence sections for more
information.
ICC2 in the DC Characteristics table represents the
activ e current  specific ation for the write mo de. The “AC
Characteristics” section contains timing specification
tables and timing diagrams for write operations.
Accelera te d Program  Opera tion
The device offers accelerated program operation
through t he ACC function, whi ch is one of  two functions
provided by the WP#/ACC pin. This function is primarily
intended to allow faster in-system programming of the
device during the system production proc ess.
If the system ass erts VHH on the pin, the device auto-
matically enters the aforementioned Unlock Bypass
mode and uses the higher voltage on the pin to reduce
the time required for program operations. The system
would use  a two-cycle program com mand s equence as
required by the Unlock Bypass mode. Removing VHH
from the WP#/ACC pin returns the device to normal
operation.
Program and Eras e Operation  Status
During an erase or program operation, the system may
check the status of the operation by reading the status
bits on DQ7 –DQ0. Standard read cycle timings and ICC
read specifications apply. Refer to “Write Operation
Status” for more information, and to “AC Characteris-
tics” for timing diagrams.
Standby Mo de
When the system is not reading or writ ing to the de vi ce,
it can place the device in the standby mode. In this
mode, current consumption is  greatly reduced, and t he
outputs are placed in the high impedance state, inde-
pendent of the OE# input. 
The device enters  the CMOS  standby m ode when the
CE# and RESET# pins are both held at VCC  ± 0.2 V.
(Note that this is a more restricted voltage range than
VIH.)  If CE# and RESET# are held at VIH, but n ot within
VCC ± 0.2 V, the device wil l be in the standby  mode, but
the standby current will be greater. The device requires
standard access time (tCE) for read access when the
device is in either of these standby modes, before it is
ready to read data.
The device also enters the standby mode when the
RESET# pin is driven low. Refer to the next section,
RESET#: Hardware Reset Pin.
If the device is deselected during erasure or program-
ming, the device draws active current until the
operation is completed.
ICC3 in the DC Characteristics table represents the
standby current specification. 
Automa tic Sleep Mode
The automatic sleep mode minimizes Flash device
energy consumption. The device automatically enables
this mode when addresses remain stable for tACC + 50
ns. The automatic sleep mode is independent of the
CE#, WE#,  and OE#  control s ignals. S tandard addr ess
access timings provide new data when addresses are
changed. While in sleep mode, output data is latched
and always available to the system. ICC4 in the DC
Characteristics table represents the automatic sleep
mode current specification.
RESET#: Hardware Reset Pin
The RESET# pin provides a har dware method of reset-
ting the device to reading array data. When the

June 11, 2002 Am29SL160C 11

RESET# pin is dr iven low for at least a period of tRP, the

device immediately terminates any operation in

progress, tristates all output pins, and ignores all read/

write commands for the duration of t he RESET# puls e.

The device also resets the internal state machine to

reading array data. The operation that was interrupted

should be rei nitiated onc e the devic e is ready t o accept

another command sequence, to ensure data integrity.

Current is reduced for the duration of the RESET#

pulse. When RES ET# is held at VSS ± 0.2 V, the device

draws CMOS standby current (ICC4). If RESET# is held

at VIL but not within VSS ± 0.2 V, the standby current will

be greater.

The RESET# pin may be tied to the system reset cir-

cuitry. A system reset would thus also reset the Flash

memory, enabling the system to read the boot-up firm-

ware from the Flash memory.

If RESET# is asserted during a progr am or eras e oper-

ation, the RY/BY# pin remains a “0” (busy) until the

internal reset operation is complete, which requires a

time of tREADY (during Embedded Algorithms). The

system can thus monitor R Y/BY# to determine whether

the reset oper ation i s complete. If RESET# is as sert ed

when a program or erase operation is not executing

(RY/BY# pin is “1”), the reset operation is completed

within a time of tREADY (not during Embedded Algo-

rithms). The system can read data tRH after the

RESET# pin returns to VIH.

Refer to the “AC Char acteris tics” for RE SET# parame-

ters and to Figure 14 for the timing diagram.

Output Dis able Mo de

When the OE# input is at VIH, output from t he device is

disabled. T he output pins are placed i n the high imped-

ance state.

12 Am29SL160C June 11, 2002

Table 2. Am29SL160CT Top Boot Sector Architecture

Note: Address range is A19:A-1 in byte mode and A19:A0 in

word mode. See “Word/Byte Configuration” section for more

information.

Sector

Sector Address Sector Size

(Kbytes/Kwords)

Address Ran ge (in Hexadecimal

A19 A18 A17 A16 A15 A14 A13 A12 Byte Mode (x8) Word Mode (x16)

SA000000XXX 64/32 000000h–00FFFFh 00000h–07FFFh

SA100001XXX 64/32 010000h–01FFFFh 08000h–0FFFFh

SA200010XXX 64/32 020000h–02FFFFh 10000h–17FFFh

SA300011XXX 64/32 030000h–03FFFFh 18000h–1FFFFh

SA400100XXX 64/32 040000h–04FFFFh 20000h–27FFFh

SA500101XXX 64/32 050000h–05FFFFh 28000h–2FFFFh

SA600110XXX 64/32 060000h–06FFFFh 30000h–37FFFh

SA700111XXX 64/32 070000h–07FFFFh 38000h–3FFFFh

SA801000XXX 64/32 080000h–08FFFFh 40000h–47FFFh

SA901001XXX 64/32 090000h–09FFFFh 48000h–4FFFFh

SA1001010XXX 64/32 0A0000h–0AFFFFh 50000h–57FFFh

SA1101011XXX 64/32 0B0000h–0BFFFFh 58000h–5FFFFh

SA1201100XXX 64/32 0C0000h–0CFFFFh 60000h–67FFFh

SA1301101XXX 64/32 0D0000h–0DFFFFh 68000h–6FFFFh

SA1401110XXX 64/32 0E0000h–0EFFFFh 70000h–77FFFh

SA1501111XXX 64/32 0F0000h–0FFFFFh 78000h–7FFFFh

SA1610000XXX 64/32 100000h–10FFFFh 80000h–87FFFh

SA1710001XXX 64/32 110000h–11FFFFh 88000h–8FFFFh

SA1810010XXX 64/32 120000h–12FFFFh 90000h–97FFFh

SA1910011XXX 64/32 130000h–13FFFFh 98000h–9FFFFh

SA2010100XXX 64/32 140000h–14FFFFh A0000h–A7FFFh

SA2110101XXX 64/32 150000h–15FFFFh A8000h–AFFFFh

SA2210110XXX 64/32 160000h–16FFFFh B0000h–B7FFFh

SA2310111XXX 64/32 170000h–17FFFFh B8000h–BFFFFh

SA2411000XXX 64/32 180000h–18FFFFh C0000h–C7FFFh

SA2511001XXX 64/32 190000h–19FFFFh C8000h–CFFFFh

SA2611010XXX 64/32 1A0000h–1AFFFFh D0000h–D7FFFh

SA2711011XXX 64/32 1B0000h–1BFFFFh D8000h–DFFFFh

SA2811100XXX 64/32 1C0000h–1CFFFFh E0000h–E7FFFh

SA2911101XXX 64/32 1D0000h–1DFFFFh E8000h–EFFFFh

SA3011110XXX 64/32 1E0000h–1EFFFFh F0000h–F7FFFh

SA3111111000 8/4 1F0000h–1F1FFFh F8000h–F8FFFh

SA3211111001 8/4 1F2000h–1F3FFFh F9000h–F9FFFh

SA3311111010 8/4 1F4000h–1F5FFFh FA000h–FAFFFh

SA3411111011 8/4 1F6000h–1F7FFFh FB000h–FBFFFh

SA3511111100 8/4 1F8000h–1F9FFFh FC0004–FCFFFh

SA3611111101 8/4 1FA000h–1FBFFFh FD000h–FDFFFh

SA3711111110 8/4 1FC000h–1DFFFFh FE000h–FEFFFh

SA3811111111 8/4 1FE000h–1FFFFFh FF000h–FFFFFh

June 11, 2002 Am29SL160C 13

Table 3. Am29S L160CB Bottom Boot Sector Architecture

Note: Address range is A19:A-1 in byte mode and A19:A0 in word mode. See “Word/Byte Configuration” section for more information.

Sector

Sector Address Sector Size

(Kbytes/Kwords)

Address Range (in hexadecimal)

A19 A18 A17 A16 A15 A14 A13 A12 Byte Mode (x8) Word Mode (x16)

SA000000000 8/4 000000h–001FFFh 00000h–00FFFh

SA100000001 8/4 002000h–003FFFh 01000h–01FFFh

SA200000010 8/4 004000h–005FFFh 02000h–02FFFh

SA300000011 8/4 006000h–07FFFFh 03000h–03FFFh

SA400000100 8/4 008000h–009FFFh 04000h–04FFFh

SA500000101 8/4 00A000h–00BFFFh 05000h–05FFFh

SA600000110 8/4 00C000h–00DFFFh 06000h–06FFFh

SA700000111 8/4 00E000h–00FFFFh 07000h–07FFFh

SA8 0 0 0 0 1 X X X 64/32 010000h–01FFFFh 08000h–0FFFFh

SA9 0 0 0 1 0 X X X 64/32 020000h–02FFFFh 10000h–17FFFh

SA10 0 0 0 1 1 X X X 64/32 030000h–03FFFFh 18000h–1FFFFh

SA11 0 0 1 0 0 X X X 64/32 040000h–04FFFFh 20000h–27FFFh

SA12 0 0 1 0 1 X X X 64/32 050000h–05FFFFh 28000h–2FFFFh

SA13 0 0 1 1 0 X X X 64/32 060000h–06FFFFh 30000h–37FFFh

SA14 0 0 1 1 1 X X X 64/32 070000h–07FFFFh 38000h–3FFFFh

SA15 0 1 0 0 0 X X X 64/32 080000h–08FFFFh 40000h–47FFFh

SA16 0 1 0 0 1 X X X 64/32 090000h–09FFFFh 48000h–4FFFFh

SA17 0 1 0 1 0 X X X 64/32 0A0000h–0AFFFFh 50000h–57FFFh

SA18 0 1 0 1 1 X X X 64/32 0B0000h–0BFFFFh 58000h–5FFFFh

SA19 0 1 1 0 0 X X X 64/32 0C0000h–0CFFFFh 60000h–67FFFh

SA20 0 1 1 0 1 X X X 64/32 0D0000h–0DFFFFh 68000h–6FFFFh

SA21 0 1 1 1 0 X X X 64/32 0E0000h–0EFFFFh 70000h–77FFFh

SA22 0 1 1 1 1 X X X 64/32 0F0000h–0FFFFFh 78000h–7FFFFh

SA23 1 0 0 0 0 X X X 64/32 100000h–10FFFFh 80000h–87FFFh

SA24 1 0 0 0 1 X X X 64/32 110000h–11FFFFh 88000h–8FFFFh

SA25 1 0 0 1 0 X X X 64/32 120000h–12FFFFh 90000h–97FFFh

SA26 1 0 0 1 1 X X X 64/32 130000h–13FFFFh 98000h–9FFFFh

SA27 1 0 1 0 0 X X X 64/32 140000h–14FFFFh A0000h–A7FFFh

SA28 1 0 1 0 1 X X X 64/32 150000h–15FFFFh A8000h–AFFFFh

SA29 1 0 1 1 0 X X X 64/32 160000h–16FFFFh B0000h–B7FFFh

SA30 1 0 1 1 1 X X X 64/32 170000h–17FFFFh B8000h–BFFFFh

SA31 1 1 0 0 0 X X X 64/32 180000h–18FFFFh C0000h–C7FFFh

SA32 1 1 0 0 1 X X X 64/32 190000h–19FFFFh C8000h–CFFFFh

SA33 1 1 0 1 0 X X X 64/32 1A0000h–1AFFFFh D0000h–D7FFFh

SA34 1 1 0 1 1 X X X 64/32 1B0000h–1BFFFFh D8000h–DFFFFh

SA35 1 1 1 0 0 X X X 64/32 1C0000h–1CFFFFh E0000h–E7FFFh

SA36 1 1 1 0 1 X X X 64/32 1D0000h–1DFFFFh E8000h–EFFFFh

SA37 1 1 1 1 0 X X X 64/32 1E0000h–1EFFFFh F0000h–F7FFFh

SA38 1 1 1 1 1 X X X 64/32 1F0000h–1FFFFFh F8000h–FFFFFh

14 Am29SL160C June 11, 2002

Autoselect Mode

The autoselect mode provides manufacturer and

device identification, and sector protection verification,

through identifier codes output on DQ7–DQ0. This

mode is primarily intended for programming equipment

to aut omatically match a d evice to be progr ammed with

its corresponding programming algorithm. However,

the autoselect codes can also be accessed in-system

through the command register.

When using programming equipment, the autoselect

mode requi res VID on address pin A9. Address pins A6,

A1, and A0 must be as shown in Table 4. In addition,

when verifying sector protection, the sector address

must appear on the appropriate highest order address

bits (see Tables 2 and 3). Table 4 shows the r emain ing

address bits that are don’t care. When all necessary

bits have been set as required, the programming

equipment may then read the corresponding identifier

code on DQ7–DQ0.

To access the autoselect codes in-system, the host

system can issue the autoselect command via the

command register, as shown in Table 12. This method

does not require VID. See “Command Definitions” for

details on using the autoselect mode.

Table 4. Am29S L160C Autoselect Codes (High Voltage Method)

L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care.

Note: Outputs for data bits DQ8–DQ15 are for BYTE#=V IH. DQ8–DQ15 are don’t ca re when BYTE#=VIL.

Description Mode CE# OE# WE#

A19

A12

A11

A10 A9

A7 A6

A2 A1 A0

DQ8

DQ15

DQ7

DQ0

Manufacturer ID: AMD L L H X X VID X L X L L X 01h

Device ID:

Am29SL160CT

(Top Boot Block)

Word L L H XXV

ID XLXLH22h E4

Byte L L H X E4

Device ID:

Am29SL160CB

(Bottom Boot Block)

Word L L H XXV

ID XLXLH22h E7

Byte L L H X E7

Sect or P rot e ct ion Ve ri f i c a tion L L H SA X VID XLXHL X01h

(protected)

X00h

(unprotected)

SecS i Sector Indicator bit

(DQ7) LLHSAXV

ID XLXHH X 81h

(factory

locked)

June 11, 2002 Am29SL160C 15

Sector/Sector Block Protection and

Unprotection

(Note: For the following discussion, the term “sector”

applies to both sectors and sector blocks. A sector

block consis ts of two or m ore adjacent sectors that are

protec ted or unprotected at the same time (see Tables

5 and 6).

Table 5. Top Boot Sector/Sector Block Ad dresses

for Protection/Unprotection

Table 6. Bottom Boot Sector/Sector Block

Addresses for Protection/Unprotection

The hardware sector protection feature disables both

program and erase operations in any sector. The hard-

ware sector unprotection feature re-enables both

program and erase operations in previously protected

sectors. Sector protection/unprotection can be imple-

mented via two methods.

Sector / Sector

Block A19–A12 Sector / Secto r Block Size

SA0 00000XX X 64 Kbytes

SA1-SA3 00001XXX,

00010XXX,

00011XXX 192 (3x64) Kbytes

SA4-SA7 001XXXXX 256 (4x64) Kbytes

SA8-SA11 010XXXXX 256 (4x64) Kbytes

SA12-SA15 011XXXXX 256 (4x64) Kbytes

SA16-SA19 100XXXXX 256 (4x64) Kbytes

SA20-SA23 101XXXXX 256 (4x64) Kbytes

SA24-SA27 110XXXXX 256 (4x64) Kbytes

SA28-SA30 11100XXX,

11101XXX,

11110XXX 192 (3x64) Kbytes

SA31 11111000 8 Kbytes

SA32 11111001 8 Kbytes

SA33 11111010 8 Kbytes

SA34 11111011 8 Kbytes

SA35 11111100 8 Kbytes

SA36 11111101 8 Kbytes

SA37 11111 110 8 Kbytes

SA38 1 111 111 1 8 Kbytes

Sector / Sector

Block A19–A12 Sector / Sector Block Size

SA38 11111X XX 6 4 Kbyte s

SA37-SA35 11110XXX,

11101XXX,

11100XXX 192 (3x64) Kbytes

SA34-SA31 110XXXXX 256 (4x64) Kbytes

SA30-SA27 101XXXXX 256 (4x64) Kbytes

SA26-SA23 100XXXXX 256 (4x64) Kbytes

SA22-SA19 011XXXXX 256 (4x64) Kbytes

SA18-SA15 010XXXXX 256 (4x64) Kbytes

SA14-SA11 001XXXXX 256 (4x64) Kbytes

SA10-SA8 00001XXX,

00010XXX,

00011XXX 192 (3x64) Kbytes

SA7 00000111 8 Kbytes

SA6 00000110 8 Kbytes

SA5 00000101 8 Kbytes

SA4 00000100 8 Kbytes

SA3 00000011 8 Kbytes

SA2 00000010 8 Kbytes

SA1 00000001 8 Kbytes

SA0 00000000 8 Kbytes

16 Am29SL160C June 11, 2002

The primary method requires VID on the RESET# pin

only, and can be implemented either in-system or via

programming equipment. Figure 1 shows the algo-

rithms and Figure 24 shows the timing diagram. This

method uses standard microprocessor bus cycle

timing. For sector unprotect, all unprotected sectors

must firs t be protect ed prior to the first sec tor unpr otect

write cycle.

The alternate method intended only for programming

equipment requires VID on address pin A9 and OE#.

This method is compatible with programmer routines

writte n for earl ier 3.0 volt-only AMD flash devices . Pub-

lic ation number 21622 contains further det ails. C ontact

an AMD representative to request the document con-

taining further details.

The device is shipped with all sectors unprotected.

AMD offers the option of programming and protecting

sectors at its factory prior to shipping the device

through AMD’s ExpressFlash™ Service. Contact an

AMD representative for details.

It i s possibl e to determine whether a sect or is pro tected

or unprotected. See “Autoselect Mode” for details.

Write Protect (WP#)

The write prot ect function prov ides a hardware method

of protecting certain boot sectors without using VID.

This function is one of two provided by the WP#/ACC

pin.

If the system asserts VIL on the WP#/ACC pin, the

device di sabl es program and er ase functions in the two

“outermost” 8 Kbyte boot sectors independently of

whether those sectors were protected or unprotected

using the method described in “Sector Protection/

Unprotection.” The two out ermost 8 Kbyte boot sectors

are the two sectors containing the lowest addr esses in

a bottom-boot-configured device, or the two sectors

containing the highest addresses in a top-boot-config-

ured device.

If the system asserts VIH on the WP#/ACC pin, the

device reverts to whether the two outermost 8 Kbyte

boot sectors were last set to be protected or unpro-

tected. That is, sector protection or unprotection for

these two sectors depends on whether they were last

protected or unprotected using the method described

in “Sector Protection/Unprotection.”

Note that if the system asserts VHH on the WP#/ACC

pin, all sectors, including the two outermost sectors,

will be unprotected. VHH is intended for accelerated in-

system programming of the device during system pro-

duction. It is advisable, therefore, not t o assert VHH on

this pin after the system has been placed in the field for

use. If faster programming is desired, the s ystem may

use the unlock bypass program command sequence.

Temporary Sector Unprotect

This feature allows temporary unprotection of previ-

ously protected sectors to change data in-system. The

Sector Unprotect mode is activated by setting the

RESET# pin to VID. During this mode, formerly pro-

tected sectors can be programmed or erased by

selecting the sector addresses. Once VID is removed

from the RESET# pin, all the previously protected

sectors are protected again. Figure 2 shows the algo-

rithm, and Figure 22 shows the timing diagrams, for

this feature.

June 11, 2002 Am29SL160C 17

Figure 1. In-System Sector Protect/Unprotect Algorithms

Sector Protect:

Write 60h to sector

address with

A6 = 0, A1 = 1,

A0 = 0

Set up sector

address

Wait 150 µs

Verify Sector

Protect: Write 40h

to sector address

with A6 = 0,

A1 = 1, A0 = 0

Read from

sector address

with A6 = 0,

A1 = 1, A0 = 0

START

PLSCNT = 1

RESET# = VID

Wait 1 µs

First Write

Cycle = 60h?

Data = 01h?

Remove VID

from RESET#

Write reset

command

Sector Protect

complete

Yes

PLSCNT

= 25?

Yes

Device failed

Increment

PLSCNT

Temporary Sector

Unprotect Mode No

Sector Unprotect:

Write 60h to sector

address with

A6 = 1, A1 = 1,

A0 = 0

Set up first sector

address

Wait 15 ms

Verify Sector

Unprotect: Write

40h to sector

address with

A6 = 1, A1 = 1,

A0 = 0

Read from

sector address

with A6 = 1,

A1 = 1, A0 = 0

START

PLSCNT = 1

RESET# = VID

Wait 1 µs

Data = 00h?

Last sector

verified?

Remove VID

from RESET#

Write reset

command

Sector Unprotect

complete

Yes

PLSCNT

= 1000?

Yes

Device failed

Increment

PLSCNT

Temporary Sector

Unprotect Mode

No All sectors

protected?

Yes

Protect all sectors:

The indicated portion

of the sector protect

algorithm must be

performed for all

unprotected sectors

prior to issuing the

first sector

unprotect address

Set up

next sector

address

Yes

Sector Protect

Algorithm Sector Unprotect

Algorithm

First Write

Cycle = 60h?

Protect another

sector?

Reset

PLSCNT = 1

18 Am29SL160C June 11, 2002

Figure 2. Temporary Sector Unprotect Operation

Secured Silicon (SecSi) Sector Flash

Memory Region

The Secured Silicon (SecSi) Sector is a flash memory

region that enables permanent part identification

through an Electroni c Serial Number (ESN). The SecSi

Sector in t his dev ice is 256 bytes in lengt h. T he devi ce

has a SecSi Sector indicator bit that allows the sy stem

to determine whether or not the SecSi Sector was

factory locked. This indicator bit is permanently set at

the factory and cannot be changed, which prevents a

factory-locked part from being cloned.

AMD offers this device only with the SecSi Sector

factory serialized and locked. The first sixteen bytes of

the SecSi Sector contain a random ESN. To utilize the

remainder SecSi Sector space, customers must

provide their code to AMD through AMD’s Express

Flash service. The factory will program and perma-

nently protect the SecSi Sector (in addition to

programming and protecting the remainder of the

device as required).

The system can read the SecSi Sector by writing the

Enter SecSi Sector command sequence (see “Enter

SecSi Sector/Exit SecSi Sector Command Sequence”

section). Table 7 shows the layout for the SecSi Sector .

Table 7. SecSi Sector Addresses

The device continues to read from the SecSi Sector

until the system issues the Exit SecSi Sector command

sequence, or until power is removed from the device.

On power-up, or follo wing a hardware reset, the devic e

reverts to sending commands to the boot sector s .

Hardware Data Protection

The command sequence requirement of unlock cycles

for programming or erasing provides data protection

against inadvertent writes (refer to Table 12 for

command definitions). In addition, the following hard-

ware data protection measures prevent accidental

erasure or programming, which might otherwise be

caused by spurious system level signals during VCC

power-up and power-down transitions, or from syst em

noise.

Low VCC Write In hibi t

When VCC is les s than VLKO, the device does not accept

any write cycles. This protects data during VCC

power-up and power-down. The command r egister and

all internal pr ogram/erase circuits are dis abled, and the

device resets . Subs equent wr ites ar e ignored unt il VCC

is greater than VLKO. The system must provide the

proper signals to the control pins to prevent uninten-

tional writes when VCC is greater than VLKO.

Write Pulse “Glitch ” Protection

Noise pulses of l ess than 5 ns (typical) on OE#, CE# or

WE# do not initiate a write cycle.

Logical Inhibit

Write cycles are inhibited by holding any one of OE# =

VIL, CE# = VIH or WE# = VIH. To initiate a write cycle,

CE# and WE# must be a logical zero while OE# is a

logical one.

Power-Up Write Inhibit

If WE# = CE# = VIL and OE# = VIH during power up, the

device does not accept commands on the rising edge

of WE#. The internal state machine is automatically

reset to reading array data on power-up.

START

Perform Erase or

Program Operations

RESET# = VIH

Temporary Sector

Unprotect Completed

(Note 2)

RESET# = VID

(Note 1)

Notes:

1. All protected sectors unprotected. (If WP# /ACC = VIL,

the outermost sectors will remain protected)

2. All previously protected sectors are protected once

again.

Description

Address Range

Word Mode (x16) Byte Mode (x8)

16-byte random ESN 00–07h 000–00Fh

User-defined code or

factory erased (all 1s) 08–7Fh 010–0FFh

June 11, 2002 Am29SL160C 19

COMMON FLASH MEMORY INTERFACE

(CFI)

The Common Flash Interface (CFI) specification out-

lines device and host system software interrogation

handshake, which allows specific vendor-specified

software algorithms to be used for entire families of

devices. Software support can then be device-indepen-

dent, JEDEC ID-independent, and forward- and

backward-compatible for the specified flash device

families. Flash vendors can standardize their existing

interfaces for long-term compatibili ty.

This device enters the CFI Query mode when the

system writes the CFI Query command, 98h, to

address 55h in word mode (or address AAh in byte

mode), any time the device is read y to read array data.

The system can read CFI information at the a ddresses

given in Tables 8–11. To terminate reading CFI data,

the system must write the reset command.

The system can also write the CFI query command

when the device is in the autoselect mode. The device

enters the CFI query m ode, and the system can read

CFI data at the addresses given in Tables 8–11. The

system must write the reset command to return the

device to the autoselect mode.

For further information, pleas e refer to the CFI Specifi-

cation and CFI Publicat ion 100, available v ia the W orld

Wide Web at http://www.amd.com/products/nvd/over-

view/cfi.html. Alternatively, contact an AMD

representative for copies of these documents.

Table 8. CFI Query Identification String

Addresses

(Word Mode) Addresses

(Byte Mode) Data Description

10h

11h

12h

20h

22h

24h

0051h

0052h

0059h Query Unique ASCII string “QRY”

13h

14h 26h

28h 0002h

0000h P rimary OE M Command Set

15h

16h 2Ah

2Ch 0040h

0000h Address for Primary Extended Table

17h

18h 2Eh

30h 0000h

0000h Alternate OEM Co mmand Set (00h = none exists)

19h

1Ah 32h

34h 0000h

0000h Ad dress for Alternate OEM Extended Table (00h = none exists)

20 Am29SL160C June 11, 2002

Table 9. System Interface String

Table 10. Device Geometry Definiti on

Addresses

(Word Mode) Addresses

(Byte Mode) Data Description

1Bh 36h 0018h VCC Min. (write/erase)

D7–D4: volt, D3–D0: 100 millivolt

1Ch 38h 0022h VCC Max. (write/erase)

D7–D4: volt, D3–D0: 100 millivolt

1Dh 3Ah 0000h VPP Min. voltage ( 00h = no VPP pin present)

1Eh 3Ch 0000h VPP Max. voltage (00h = no VPP pin present)

1Fh 3Eh 0004h Typical timeout per single byte/word write 2N µs

20h 40h 0000h Typical timeout for Min. size buffer write 2N µs (00h = not supported)

21h 42h 000Ah Typical timeout per individual block erase 2N ms

22h 44h 0 000h Typical timeout for full chip erase 2N ms (00h = not supported)

23h 46h 0005h Max. timeout for byte/word write 2N times typical

24h 48h 0000h Max. timeout for buffer write 2N time s typical

25h 4Ah 0004h Max. timeout per individual block erase 2N times typical

26h 4Ch 0000h Max. timeout for full chip erase 2N times typical (00h = not supported)

Addresses

(Word Mode) Addresses

(Byte Mode) Data Description

27h 4Eh 0015h Device Size = 2N byte

28h

29h 50h

52h 0002h

0000h Flash Device Interface description (refer to CFI publication 100)

2Ah

2Bh 54h

56h 0000h

0000h Max. number of bytes in multi-byte write = 2N

(00h = not supported)

2Ch 58h 0002h Number of Erase Block Regions within device

2Dh

2Eh

2Fh

30h

5Ah

5Ch

5Eh

60h

0007h

0000h

0020h

0000h

Eras e Block Region 1 Information

(refe r to the CFI specificatio n or CFI publication 100)

31h

32h

33h

34h

62h

64h

66h

68h

001Eh

0000h

0001h

Eras e Block Region 2 Information

35h

36h

37h

38h

6Ah

6Ch

6Eh

70h

0000h

Eras e Block Region 3 Information

39h

3Ah

3Bh

3Ch

72h

74h

76h

78h

0000h

Eras e Block Region 4 Information

June 11, 2002 Am29SL160C 21
Table 11. Primary Vendor-Specific Extended Query
COMMAND DEFINITIONS
Writing specific address and data commands or
sequences into the command register initiates device
operations. Table 12 defines the valid register
command sequences. Writing incorrect address and
data val ues or wr iting them in  the improper sequence
reset s the device to reading array data. 
All  addresses ar e latched  on t he falli ng edge  of WE#  or
CE#, whichever happens later. All data is latched on
the rising edge of WE# or CE#, whichever happens
first. Refer to the appropriate timing diagrams in the
“AC C haract eristi cs” section.
Reading Array Data
The device is automatically set to reading array data
after device power-up. No commands are required to
retrieve data. The device is also ready to read array
data after completing an Embedded Program or
Embedded Erase algorithm.
After the device accepts an Erase Suspend co mmand,
the device enters the Erase Suspend mode. The
system can read array data using the standard read
timings, except that if it reads at an address within
erase-suspended sectors, the device outputs status
data.  After completing  a programming operation in the
Erase Suspend mode, the system may once again
read array data with the same exception. See “Erase
Suspend/Erase Resume Commands” for more infor-
mation on this mode.
The system must issue the reset command to re-
enable the device for reading array data if DQ5 goes
high, or while in the autoselect mode. See the “Reset
Command” section, next.
See also “Requirem ents for Reading Array Data” in the
“Dev ice Bus Operations” section for more information.
The  tabl e provides the read  parameters, and Figure  13
shows the timing diagram.
Reset Command
Writing the reset command to the device resets the
device to reading array data. Address bits are don’t
care for this command. 
The reset command may be written between the
sequence cycles in an erase command sequence
before erasing begins. This resets the device to
reading array data. Once erasur e begins, however, the
device ignores reset commands until the operation is
complete.
The reset command may be written between the
sequence cycles in a program command sequence
Addresses
(Word Mode) Addresses
(Byte Mode) Data Description
40h
41h
42h
80h
82h
84h
0050h
0052h
0049h Query-unique ASCII string “PRI”
43h 86h 0031h Major v ersion number, A SCII
44h 88h 0030h Minor version number, ASCII
45h 8Ah 0000h Address Sensitive Unlock
0 = Required, 1 = No t Required
46h 8Ch 0002h Erase Suspend
0 = Not Supported, 1 = To Read Only, 2 = To Read & Write
47h 8Eh 0001h S ector Pr otect
0 = Not Supported, X = Number of sectors in per group
48h 90h 0001h Sector Temporary Unprotect
00 = Not Supported, 01 = Supported
49h 92h 0004h Sector Protect/Unprotect scheme 
01 = 29F040 mode, 02 = 29F016 mode,
03 = 29F400 mode, 04 = 29LV8 00A mode
4Ah 94h 0000h Si multaneous Operation
00 = Not Supported, 01 = Supported
4Bh 96h 0000h Burst Mode Type
00 = Not Supported, 01 = Supported
4Ch 98h 0000h Page Mode Type
00 = Not Supported, 0 1  = 4 Word Page, 02 = 8 Word Page

22 Am29SL160C June 11, 2002
before programming begins. This resets the device to
reading array data (also applies to programming in
Erase Suspend mode). Once programming begins,
however, the device ignores reset commands until the
operation is  complet e.
The reset command may be written between the
sequence  cycles i n an auto select com mand sequence.
Once in t he au toselect mode, t he reset  command must
be written to return to reading array data (also applies
to autoselect during Erase Suspend).
If DQ5 goes  high during a pr ogr am  or erase oper ation,
writing the reset command returns the device to
reading array data (also applies during Erase
Suspend).
See “AC Characteristics” for parameters, and to Figure
14 for the timing diagram.
Autoselect Command Sequence
The autoselect command sequence allows the host
system to access the manufacturer and device codes,
and determine whether or not a sector is protected.
Table 12 shows the address and data requirements.
This method is an  alternative to that shown in Table 4,
which is intended for PROM programmers and requires
VID on address bit A9.
The autoselect command sequence is initiated by
writing two unlock cycles, followed by the autoselect
command. The device then enters the autoselect
mode, and the system may read at any address any
number of times, without initiating another command
sequence. A read cycle at address XX00h retrieves the
manufacturer code. A read cycle at address 01h in
word mode (or 02h in byte mode) returns the device
code. A read cycle containing a sector address (SA)
and the address 02h in word mode (or 04h in byte
mode) returns 01h if  that sector is prot ected, or 00h if it
is unprotected. Refer to Tables 2 and 3 for valid sector
addresses.
The system m ust  write the reset command to exit the
autoselec t mode and return to reading array data.
Enter  SecSi Sector/E xit Sec Si Sector  Com-
mand Sequence
The SecSi Sec tor region pr ov ides  a s ec ur ed data area
containing a random, sixteen-byte electronic serial
number (ESN). The system can access the SecSi
Sector region by issuing the three-cycle Enter SecSi
Sector command sequence. The device continues to
access the SecSi Sector region until the system issues
the four-cycle Exit SecSi command sequence. The Exit
SecSi command sequence returns the device to
normal operation. Table 12 shows the address and
data requirements for both command sequences. See
also “Secured Silicon (SecSi) Sector Flash Memory
Region” for further information. 
Word/Byte Program Command Sequence
The system may program the  devic e by word or byte,
depending on the state of the BYTE# pin. Program-
ming is a four-bus-cycle operation. The program
command sequence is initiated by writing two unlock
write cycles,  followed by  the program set-up c ommand.
The program address  and data are written next, which
in turn initiate the Embedded Program algorithm. The
system is not required to provide further controls or tim-
ings. The device automatically generates the program
pulses and verifies the programmed cell margin. Table
12 shows the address and data requirements for the
byte program command sequence.
When the Embedded Program algorithm is complete,
the device then returns to reading array data and
addresses are no longer latched. The system can
determine the status of the program operation by using
DQ7, DQ6, or RY/BY#. See “Write Operation Status”
for information on these status bits. 
Any commands written to the device during the
Embedded Program Algor ithm are  ignored. Note t hat a
hardware reset immediately terminates the program-
ming operation. The Byte Program command
sequence should be reinitiated once the device has
reset to reading array data, to ensure data integrity.
Programming is allowed in any sequence and across
sector boundaries. A bit cannot be programmed
from a “0” back to a “1”. Attempti ng to do so may halt
the operation and set DQ5 to “1”, or cause the Data#
Polling algorithm to indicate the operation was suc-
cessful. However, a succeeding read will show that the
data is still “0” . Only eras e operations can conv ert a “0”
to a “1”.
Unlock Bypass Command Sequence
The unlock bypass feature allows the system to
program bytes or  wor ds  to the device faster than us ing
the standard progra m command sequence.  The unlock
bypass command sequence is initiated by first writing
two unlock cycles. This is followed by a third write cycle
containing the unlock bypass command, 20h. The
device then enters the unlock bypass mode. A two-
cycle unlock bypass program command sequence is all
that is required to program in t his mode.  The first cycle
in this sequence contains the unlock bypass program
command, A0h; the s econd cycle cont ains the program
address and data. Additional data is programmed in
the same manner. This mode dispenses with t he initial
two unlock cycles required in the standard program
command sequence, resulting in faster total program-
ming time. Table 12 shows the requirements for the
command sequence.
During the unlock bypass mode, only the Unlock
Bypass Program and Unlock Bypass  Reset commands
are v alid. To  exit the  unlock  bypass m ode, t he syst em
must issue the two-cycle unlock bypass reset

June 11, 2002 Am29SL160C 23

command sequence. The first cycle must contain the

data 90h; the second cycle the data 00h. Addresses

are don’t cares. The device then returns to reading

array data.

The device offers accelerated program operations

through the WP#/ACC pin. This function is intended

only to speed in-system programming of the device

during system production. When the system asserts

VHH on the WP#/ACC pin, the device automatically

enters the Unlock Bypass mode. The s ystem may then

write the two-cycle Unlock Bypass program command

sequence. The device uses the higher voltage on the

WP#/ACC pin to accelerate the operation. Note that

the W P#/A CC pin must not be at V HH for any operation

other than accelerated programming, or device

damage may result. In addition, the WP#/ACC pin must

not be left floating or unconnected; inconsistent

behavi or of the device may result.

Figure 3 illustrates the algorithm for the program oper-

ation. See the Erase/Program Operations table in “AC

Characteristics” for parameters, and to Figure 17 for

timing diagrams.

START

Write Program

Command Sequence

Data Poll

from System

Verify Data? No

Yes

Last Address?

Yes

Programming

Completed

Increment Address

Embedded

Program

algorithm

in progress

Note: See Table 12 for program command sequence.

Figure 3. Program Operation

24 Am29SL160C June 11, 2002
Chip Erase Command Sequence
Chip erase is a six bus cycle operation. The chip erase
command sequence is initiated by writing two unlock
cycles, followed by a set-up command. Two additional
unlock write cycles are then followed by  the chip  erase
command, which in turn invokes the Embedded Erase
algorithm. The device does not require the system to
preprogram pr ior  to erase . T he E m bedded E r as e algo-
rithm automaticall y  pr epr ograms and verif ies the entire
memory for an all zero data pattern prior to electrical
erase.  The system is not required to provide any con-
trols or timings during these operations. Table 12
shows the address and data requirements for the  chip
erase command sequence.
Any commands written to the chip during the
Embedded Erase algorithm are ignored. Note that a
hardware reset  duri ng the chip eras e operation im me-
diately terminates the operation. The Chip Erase
command sequence should be reinitiated once the
device has returned to reading array data, to ensure
data integrity.
The system can determine the status of the erase oper-
ation by us ing DQ7, DQ6, DQ2, or RY /BY#. See “W rite
Operation Status” for information on these status bits.
When the Embedded Erase algorithm is complete, the
device returns to reading ar ray data and ad dresses are
no longer latched. 
Figure 4 illustrates the algorithm for the erase opera-
tion. See the Erase/Program Operations tables in “AC
Characteristics” for parameters, and to Figure 18 for
timing diagrams.
Sector Erase Comman d Sequence
Sector erase is a six bus cycle operation. The sector
erase command sequence is initiated by writing two
unlock cycles, followed by a set-up command. Two
additional unlock write cycles are then followed by the
address of the sector to be erased, and the sector
erase comma nd. Table 12 s hows the add ress and  data
requi rements for  the sector eras e command sequence.
The devic e does not requir e the system to preprogr am
the memory prior  to erase. The Em bedded Erase algo-
rithm automati cally programs and verifi es the sec tor for
an all zero data pattern prior to electrical erase. The
system is not required to provide any controls or
timings during these operations. 
After the command sequence is writ ten, a sector erase
time-out of 50 µs begins. During the time-out period,
additional sector addresses and sector erase com-
mands may be writ ten.  Loading the sector eras e buff er
may be done in any sequence, and the number of
sectors may  be from  one sector t o all sector s. The t ime
between these additional cycles must be less than 50
µs, otherwis e the last ad dress and command might not
be accepted, and erasure may begin. It is recom-
mended that processor interrupts be disabled during
this time to ensure all commands are accepted. The
interrupts can be re-enabled aft er the las t Sector Erase
command is written. If the time between additional
sector erase commands can be assumed to be less
than 50 µs, the system need not monitor DQ3. Any
command other than Sector Erase or Erase
Suspend during the time-out period resets the
device to reading array data. The system must
rewrite the command sequence and any additional
sector addresses and commands.
The system can monitor DQ3 to determine if the sector
erase timer has timed out. (See the “DQ3: Sector
Erase Timer” section.) The time-out begins from the
rising edge of the final WE# pulse in the command
sequence.
Once the sector erase operation has begun, only the
Erase Suspend command  is valid.  All other  commands
are ignored. Note that a hardware reset during the
sector erase operation immediately terminates the
operation. The Sector Erase command sequence
should be reinitiated once the device has returned to
reading array data, to ensure data integrity.
When the Embedded Erase algorithm is complete, the
device returns to reading array data and addres ses are
no longer latched. The system can determine the
status of the erase operation by using DQ7, DQ6, DQ2,
or RY/BY#. (Ref er to “Wri te Operation Status” for i nfor-
mation on these status bits.)
Figure 4 illustrates the algorithm for the erase opera-
tion. Refer to the Erase/Program Operations  tables in
the “AC Characteristics” section for parameters, and to
Figure 18 for timing diagrams.
Erase Suspend/Erase Resume Commands
The Erase Suspend command allows the system to
interrupt a sector erase operation and then read data
from, or program data to, any sector not selected for
erasure. This command is valid only during the sector
erase operation, including the 50 µs time-out period
during the sector erase command sequence. The
Erase Suspend command is ignored if written during
the chip erase operation or Embedded Program algo-
rithm. W ri ting the Erase Suspend command during the
Sector Erase time-out immediately terminates the
time-out period and suspends the erase operation.
Addresses are “don’t-cares” when writing the Erase
Suspend command.
When the Erase Suspend command is written during a
sector erase oper ation, the dev ice requires a  maxi mum
of 20 µs to suspend the erase operation. However,
when the Erase Suspend command is written during
the sector erase time-out, the device immediately ter-
minates the time-out period and suspends the erase
operation.

June 11, 2002 Am29SL160C 25

After the erase operation has been suspended, the

system can read array data from or program data to

any sector not selected for erasure. (The devi ce “erase

suspends” all sectors selected for erasure.) Normal

read and writ e ti mi ngs and comman d definitions apply.

Reading at any address within erase-suspended

sectors produces status data on DQ7–DQ0. The

system can use DQ7, or DQ6 and DQ2 together, to

determine if a sector is activ ely erasing or is erase-s us-

pended. See “Write Operation Status” for information

on these status bits.

After an erase-suspended program operation is com-

plete, the system can once agai n read array dat a within

non-suspended sectors. The system can determine the

status of the program operation using t he DQ7 or DQ6

status bits, just as in the standard program operation.

See “Write Operation Status” for more information.

The system may also write the autoselect command

sequence when the device is in the Erase Suspend

mode. The device allows reading autoselect codes

even at addresses within erasing sectors, since the

codes are not stored in the memory array. When the

device exits the autoselect mode, the device reverts to

the Erase Suspend mode, and is ready for another

vali d operation. See “Autosele ct Command Sequence”

for more informa t ion.

The system must write the Erase Resume command

(address bits are “don’t care”) to exit the erase suspend

mode and continue the sec tor erase operation. Further

writes of the Resume command are ignored. Another

Erase Suspend command can be written after the

device has resumed erasing.

Notes:

1. See Table 12 for erase command sequence.

2. See “DQ3: Sector Erase Timer” for more information.

Figure 4. Erase Operation

START

Write Erase

Command Sequence

Data Poll

from System

Data = FFH?

Yes

Erasure Completed

Embedded

Erase

algorithm

in progress

26 Am29SL160C June 11, 2002
Co mmand Definiti ons
Table 12. Am29S L160C Command Definitions
Legend:
X = Don’t care
RA = Address of the memory location to be read. 
RD = Data read from location RA during read operation.
PA = Address of the memory location to be programm ed. Addresses 
latch  on the falling edge of the WE# or CE# pulse,  whichever happens 
later.
PD = Data to be programmed at location P A. Data latches on the ris ing 
edge of WE# or CE# pulse, whichever happens first.
SA = Address of the sector t o be verified (in autoselect mode) or 
erased. Address bits A19–A12 uniquely select any sector.
Notes:
1. See Table 1 for description of bus operations.
2. All values are in hexadecimal.
3. Except for the read cycle and the fourth cycle of the autoselect 
command sequence, all bus cycles are write cycles.
4. Data bits DQ15–DQ 8 are don’t cares in byte mode.
5. Unless otherwise noted, address bits A19–A11 are don’t cares.
6. No unlock or command cycles required when in read mode.
7. The Reset command is required to return to the read mode (or to 
the erase-suspend-read mode if previously in Erase Suspend) 
when in the autoselect  mode, or if  DQ5 goes high (while providing 
status information).
8. The fourth cycle of the autoselect command sequence is a read 
cycle. 
9. The data is  00h for  an unprotected sect or and 01h for a pr otect ed 
sector. Data bits DQ15–DQ8 are don’t care. See the Autoselect 
Command Sequence section for more information.
10. The Unlock Bypass command is required prior to the Unlock 
Bypass Program command.
11. The Unlock Bypass Reset command is required to return to the 
read mode when in the unlock bypass mode.
12. The system may read and program in non-er asing sectors, or 
enter the autoselect mode, when in the Er ase Suspend mode. 
The Erase Suspend command is valid only during a s ector erase 
operation.
13. The Erase Resume command is valid only during the Erase 
Suspend mode.
14. Command is valid when device is ready to read array data or 
when device is in autoselect mode.
Command
Sequence
(Note 1)
Cycles
Bus Cycles (Notes 2–5)
First Second Third  Fourth  Fifth Sixth 
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Read (Note 6) 1 RA RD
Reset (Note 7) 1 XXX F0
Autoselect (Note 8)
Manufacturer ID Word 4555 AA 2AA 55 555 90 X00 01
Byte AAA 555 AAA
Device ID
(Top Boot/Bottom 
Boot)
Word 4555 AA 2AA 55 555 90 X01 22E4/
22E7
Byte AAA 555 AAA X02 E4/E7
SecSi Sector Factory 
Protect Word 4555 AA 2AA 55 555 90 X03
Byte AAA 555 AAA X06
Sector Protect Verify 
(Note 9) Word 4555 AA 2AA 55 555 90 (SA)X02
Byte AAA 555 AAA (SA)X04
Enter SecSi Sector Region Word 3555 AA 2AA 55 555 88
Byte AAA 555 AAA
Exit SecSi Sector Region Word 4555 AA 2AA 55 555 90 XXX 00
Byte AAA 555 AAA
Program Word 4555 AA 2AA 55 555 A0 PA PD
Byte AAA 555 AAA
Unlock Bypass Word 3555 AA 2AA 55 555 20
Byte AAA 555 AAA
Unlock Bypass Program (Note 10) 2XXX A0 PA PD
Unlock Bypass Reset (Note 11) 2BA 90 XXX 00
Chip Erase Word 6555 AA 2AA 55 555 80 555 AA 2AA 55 555 10
Byte AAA 555 AAA AAA 555 AAA
Sector Erase Word 6555 AA 2AA 55 555 80 555 AA 2AA 55 SA 30
Byte AAA 555 AAA AAA 555
Erase Suspend (Note 12) 1 BA B0
Erase Resume (Note 13) 1 BA 30
CFI Query (Note 14) Word 155 98
Byte AA

June 11, 2002 Am29SL160C 27

WRITE OPERATION STATUS

The device provides several bits to determine the

status of a program or erase operation: DQ2, DQ3,

DQ5, DQ6, DQ7, and RY/BY#. Table 13 and the fol-

lowing s ubsections describe the functions of th ese bi ts.

DQ7 and DQ6 each offer a method for determining

whether a program or erase oper ation is comp lete or in

progress. The device also provides a hardware-based

output signal, RY/BY#, to determine whether an

embedded program or erase operation is in progress or

has been completed.

DQ7: Data# Polling

The Data# Polling bit, DQ7, indicates to the host

system whether an Embedded Algorithm is in progress

or completed, or whether the device is in Erase Sus-

pend. Data# Polling is valid after the rising edge of the

final WE# pulse in the program or erase command

sequence.

During the Embedded Program algorithm, the device

outputs on DQ7 the complement of the datum pro-

grammed to DQ7. This DQ7 status also applies to

programming during Erase Suspend. When the

Embedded Program algorithm is complete, the device

outputs the datum programmed to DQ7. The system

must provide the program address to read valid status

inform atio n on DQ7. I f a program addres s falls within a

protected sector, Data# Polling on DQ7 is active for

approximately 1 µs, t hen the device returns to reading

array data.

During the Embedded Erase algorithm, Data# Polling

produces a “0” on DQ7. When the Embedded Erase

algor ithm is complet e, or if the device enters the Erase

Suspend mode, Data# Polling produces a “1” on DQ7.

This is analogous to t he complement/true datum output

described for the Embedded Program algorithm: the

erase function changes all the bits in a sector to “1”;

prior to this, the device outputs the “complement,” or

“0.” The system mu st provide an addr ess wit hin any of

the sectors selected for erasure to read valid status

information on DQ7.

After an erase command sequence is written, if all

sectors selected for erasing are protected, Data#

Poll ing on DQ7 is active for approx imately 100 µs, then

the device returns to reading array data. If not all

selected sectors are protected, the Embedded Erase

algorithm erases the unprotected sectors, and ignores

the selected sectors that are protected.

When the system detects DQ7 has changed from the

complement to true data, it can read val id data at DQ7–

DQ0 on the following read cycle s. Thi s i s because DQ7

may change asynchronously with DQ0–DQ6 while

Output Enable (OE#) is asserted low. Figure 19, Data#

Polling Timings (During Embedded Algorithms), in the

“ AC Char acteristics” section illus trates this.

Table 13 shows the outputs for Data# Polling on DQ7.

Figure 5 shows the Data# Polling algorithm.

DQ7 = Data? Yes

DQ5 = 1?

Yes

FAIL PASS

Read DQ7–DQ0

Addr = VA

Read DQ7–DQ0

Addr = VA

DQ7 = Data?

START

Notes:

1. VA = Valid address for programming. During a sector

erase operation, a valid address is an address within any

sector selected for erasure. During chip erase , a valid

address is any non-protected sector address.

2. DQ7 shoul d be rechecked even if DQ5 = “1” because

DQ7 may change simultaneously with DQ 5.

Figure 5. Data# Polling Algorithm

28 Am29SL160C June 11, 2002
RY/BY#: Read y/Bu sy#
RY /BY # is  a dedicated, open-dr ain output pin  that  indi-
cates whether an Embedded Algorithm is in progress
or complete. The R Y/BY# status is valid af ter the rising
edge of  the final WE# p ulse in the command s equence.
Since RY/BY# is an open-drain output, several RY/BY#
pins can be tied together in parallel with a pull-up
resistor to VCC.
If the out put is low (Busy), the dev ice is actively erasing
or programming. (This includes programming in the
Erase Suspend mode.) If the output is high (Ready),
the devic e is ready to read array data (inc luding during
the Erase Suspend mode), or is in the standby mode.
Table 13 shows the out puts  for RY /BY#. Figures 14,  17
and 18 shows RY/BY# for reset, program, and erase
operations, respectively.
DQ6: Toggle Bit I
Toggle Bit I on DQ6 indicates whether an Embedded
Program or Erase algorithm is in progre ss or complete,
or whether the device has entered the Erase Suspend
mode. Toggle Bit I may be read at any address, and is
valid after the rising edge of the final WE# pulse in the
command sequence (prior to the program or erase
operation) ,  and during the sector erase time-out.
During an Embedded Program or Erase algorithm
operation, successive read cycles to any address
cause DQ6 to toggl e (The system may use either OE#
or CE# t o c ont ro l the read cycl es). When the operation
is complete, DQ6 stops toggling.
After an erase command sequence is written, if all
sectors selected for erasing are protected, DQ6
toggles for approximately 100 µs, then returns to
reading  array data. If not all selected sectors are pro-
tected, the Embedded Erase algorithm erases the
unprotected sec tors, and  ignores the selected sectors
that are protected. 
The system can use DQ6 and DQ2 together to deter-
mine whether a sector is actively erasing or is erase-
suspended. When the device is actively erasing (that
is, the Embedded E rase algorithm is  in progress ), DQ6
toggles. When the device enters the Erase Suspend
mode, DQ6 stops toggling. However, the system m ust
also use DQ2 to determine which sectors are erasing
or erase-suspended. Alternatively,  the system can use
DQ7 (see the subsection on DQ7: Data# Polling).
If a program address falls within a protected sector,
DQ6 toggles for approximately 1 µs after the program
command sequence is written, then returns to reading
array data.
DQ6 also toggles during the erase-suspend-program
mode, and stops toggling once the Embedded
Program algorithm  is complete.
Table 13 shows the outputs for Toggle Bit I on DQ6.
Figure 6 shows the toggle bit algorithm. Figure 20 in the
“AC Characteristics” section shows the toggle bit timing
diagrams. Figure 21 shows the differences between
DQ2 and DQ6 in graphical form. See also the subsec-
tion on DQ2: Toggle Bi t II.
DQ2: Toggle Bit II
The “Toggle Bit II” on DQ2,  when used with DQ6, indi-
cates whether a particular sector is actively erasing
(that is, the Embedded Erase algorithm is in progress),
or whether that sector is erase-suspended. Toggle Bit
II is valid aft er  the rising edge of the final WE# pulse in
the command sequence. The device toggles DQ2 with
each OE# or CE# read cycle. 
DQ2 toggles when the system reads at addresses
within those sectors that have been selected for era-
sure. But DQ2 cannot distingui sh whether the sect or is
actively erasing or is erase-suspended. DQ6, by com-
parison, indicates whether the device is actively
erasing,  or is  in Erase  Suspend,  but cannot distinguish
which sectors are selected for erasure. Thus, both
status bits are required for sector and mode informa-
tion. Refer  to Table 13 to compare out puts for  DQ2 and
DQ6. 
Figure 6 shows the toggle bit algorithm in flowchart
form, and the section “DQ2: Toggle Bit II” explains the
algorithm. See also the DQ6: Toggle Bit I subsection.
Figure 20 shows the toggle bit timing diagram. Figure
21 shows the differences between DQ2 and DQ6 in
graphical form. 
Reading Toggle Bits DQ6/DQ2
Refer to Figure 6 for the following discussion. When-
ever the system initially begins reading toggle bit
status, it  must read DQ7–DQ0 at l east twice in a r ow to
determine whether a toggle bit is toggling. T ypically , the
system would note and sto re the value of the toggle bit
after the first read. After the second read, the system
would compare the new value of t he toggle bit with the
first. If the toggle bit is not toggling, the device has com-
pleted the program or erase operation. The system can
read array data on DQ7–DQ0 on the following read
cycle.
However, if after the initial two read cycles, the system
determines that the toggle bit is still toggling, the
system also should note whether the value of DQ5 is
high (see the section on DQ5). If it is, the system
should then determine again whether the toggle bit is
toggling, since the toggle bit may have stopped tog-
gling just as DQ5 went high. If the toggle bit is no longer
toggling, the device has successfully completed the
program or erase operation. If it is still toggling, the
device did not completed the operation successfully,
and the system must writ e the reset command to retur n
to reading array data. 

June 11, 2002 Am29SL160C 29

The remaining scenario is that the system initially

determines that the toggle bit is toggling and DQ5 has

not gone high. The system may continue to monitor the

toggle bit and DQ5 through successive read cycles,

determining the status as described in the previous

paragraph. Alternatively, it may choose to perform

other system tasks. In this case, the system must start

at the beginning of the algorithm when it returns to

determine the status of the operation (top of Figure 6).

DQ5: Exceeded Timing Limits

DQ5 indicates whether the program or erase time has

exceeded a specified internal pulse count limit. Under

these conditions DQ5 produces a “1.” This is a failure

condition t hat indicates the progr am or erase c ycle was

not success ful ly com pl eted .

The DQ5 failure condition may appear if the system

tries to program a “1” to a location that is previously

programmed to “0.” Only an erase operation can

change a “0” back to a “1.” Under this condition, the

device halts the operation, and when the operat ion has

exceeded the timing limits , DQ5 produces a “1.”

Under both these conditions, the system must issue

the reset command to return the device to reading

array data.

DQ3: Sector Erase Timer

After writing a sector erase command sequence, the

system ma y read DQ3 to det ermine whether or not an

erase operation has begun. (The sector erase timer

does not apply to the chip erase command.) If addi-

tional sectors are selected for erasure, the entire time-

out also applies after each additional sector erase com-

mand. When the time-out is complete, DQ3 switches

from “0” to “1.” If the time between additional sector

erase commands from the system can be assumed to

be less than 50 µs, the system need not monitor DQ3.

See also the “Sector Erase Command Sequence”

section.

After the sector erase command sequence is written,

the system should read the status on DQ7 (Data#

Polling) or DQ6 (Toggle Bit I) to ensure the device has

accept ed the command sequence, and then read DQ3.

If DQ3 is “1” , the internally controlled erase cycl e has

begun; all further commands (other than Erase Sus-

pend) are ignored until the erase operation is complete.

If DQ3 is “0”, the device will accept additional sector

erase commands. To ensure the command has been

accept ed, the system s oftware should c heck th e status

of DQ3 prior to and following each subsequent sector

erase command. If DQ3 is high on the second status

check, the last command might not have been

accepted. Table 13 shows the outputs for DQ3.

START

Yes

DQ5 = 1?

Yes

Toggle Bit

= Toggle? No

Program/Erase

Operation Not

Complete, Write

Reset Command

Program/Erase

Operation Complete

Read DQ7–DQ0

Toggle Bit

= Toggle?

Read DQ7–DQ0

Twice

Read DQ7–DQ0

Notes:

1. Read toggle bit twice to determine whether or not it is

toggling. See text.

2. Recheck toggle bit because it may stop toggling as DQ5

changes to “1”. See text.

Figure 6. Toggle Bit Algorithm

(Notes

1, 2)

(Note 1)

30 Am29SL160C June 11, 2002

Table 13. Write Operation Status

Notes:

1. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation h as exceeded the maximum timing limits.

See “DQ5: Exceeded Timing Limits” for more information.

2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further details.

Operation DQ7

(Note 2) DQ6 DQ5

(N ote 1) DQ3 DQ2

(Note 2) RY/BY#

Standard

Mode Embedded Program Algorithm DQ7# Toggle 0 N/A No toggle 0

Embedded Erase Algorithm 0 Toggle 0 1 Toggle 0

Erase

Suspend

Mode

Reading within Erase

Suspended Sector 1 No toggle 0 N/A Togg le 1

Reading withi n Non-Erase

Suspended Sector Data Data Data Data Data 1

Erase-Suspend-Program DQ7# Toggle 0 N/A N/A 0

June 11, 2002 Am29SL160C 31

ABSOLUTE MAXIMUM RATINGS

Storage Temperature

Plast ic Packages . . . . . . . . . . . . . . . –65°C to +150°C

Ambient Temperature

with Power Appli e d . . . . . . . . . . . . . –65°C to +125°C

Voltage with Respect to Ground

VCC (No te 1). . . . . . . . . . . . . . . . .–0.5 V to +2.5 V

A9, OE#,

and RESET# (Note 2) . . . . . . . .–0.5 V to +11.0 V

All other pins (Note 1) . . . . .–0.5 V to VCC + 0.5 V

Output Short Circuit Current (Note 3) . . . . . . 100 mA

Notes:

1. Minimum DC voltage on input or I/O pins is –0.5 V . During

voltage transitions, input or I/O pins may overshoot VSS to

–2.0 V for periods of up to 20 ns. See Figure 7. Maximum

DC voltage on input or I/O pins is VCC +0.5 V. During

voltage transitions, input or I/O pins may overshoot to VCC

+2.0 V for periods up to 20 ns. See Figure 8.

2. Minimum DC input voltage on pins A9, OE#, RESET#,

and WP#/ACC is –0.5 V. During v o ltage transitions, A9,

OE#, WP#/ACC, and RESET# may overshoot VSS to –2.0

V for periods of up to 20 ns. See Figure 7. Maximum DC

input vol tage on pin A9 is +11.0 V which may overs hoot

to +12.5 V for periods up to 20 ns. Maximum DC input

voltage on pin WP#/ACC is +10.0 V which may overshoot

to +11.5 V for periods up to 20 ns.

3. No more than one output may be shorted to ground at a

time. Duration of the short circuit should not be greater

than one second.

Stresses above those listed under “Absolute Maximum

Ratings” may cause permanent damage to the device. This

is a stres s rating only; func tional operation of the device at

these or any other conditions above those indicated in the

operational sections of this data sheet is not implied.

Exposure of the device to absolute maximum rating

conditions for extended periods may affect device reliability.

OPERATING RANGES

Commercial (C) Devices

Ambient Temperature (TA) . . . . . . . . . . . 0°C to +70 °C

Industri al (I) Devices

Ambient Temperature (TA) . . . . . . . . . –40°C to +85°C

VCC Supply Voltages

VCC, all speed options . . . . . . . . . . . .+1.8 V to +2.2 V

Operating ranges define those limits between which the func-

tionality of the device is guaranteed.

20 ns

0.0 V

–0.5 V

20 ns

–2.0 V

Figure 7. Maximum Negative

Overshoot Waveform

20 ns

VCC

+2.0 V

VCC

+0.5 V

20 ns

2.0 V

Figure 8. Maximum Positive

Overshoot Waveform

32 Am29SL160C June 11, 2002
DC CHARACTERISTICS
CMOS Compatible
Notes:
1. The ICC current listed is typically less than 1 mA/MHz, with OE# at VIL. Typical VCC is 2.0 V.
2. The maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedde d Program is in progress.
4. Automatic sleep mode enables the low power mode wh en addresses  remain stable for tACC + 50 ns.
5. Not 100% tested.
Parameter Description Test Conditions Min Typ Max Unit
ILI Input Load Current VIN = VSS to VCC, 
VCC = VCC max ±1.0 µA
ILIT A9 Input Load Current VCC = VCC max; A9 = 11.0 V 35 µA
ILO Output Leakage Current VOUT = VSS to VCC, 
VCC = VCC max ±1.0 µA
ICC1 VCC A ctive Read Current 
(Notes 1, 2)
CE# = VIL, OE# = VIH,
Byte Mode 5 MHz 5 10
mA
1 MHz 1 3
CE# = VIL, OE# = VIH,
Word Mode 5 MHz 5 10
1 MHz 1 3
ICC2 VCC A ctive Write Current 
(Notes 2, 3, 5) CE# = VIL, OE# = VIH 20 30 mA
ICC3 VCC S t andby Current (Note 2) CE#, RESET#  = VCC±0.2 V 1 5 µA
ICC4 VCC Reset Current (Note 2) RESET# = VSS ± 0.2 V 1 5 µA
ICC5 Automatic Sleep Mode 
(Notes 2, 3) VIH = VCC ± 0.2 V; 
VIL = V SS ± 0.2 V 15µA
VIL Input Low Voltage –0.5 0 .2 x VCC V
VIH Input High Voltage 0.8 x VCC VCC + 0.3 V
VHH
Voltage for WP#/ACC Sector 
Protec t/Unpr ote ct and Program  
Acceleration 8.5 9.5 V
VID Voltage for Autosel ect and 
Temporary Sector U nprotect VCC = 2.0 V 9.0 11.0 V
VOL Output Low Voltage IOL = 100 µA, VCC = VCC min 0.1
VOH Output High Voltage IOH = –100 µA, VCC = VCC mi n V
CC–0.1
VLKO Low VCC Loc k-Out Voltag e 
(Note 4) 1.2 1.5 V

June 11, 2002 Am29SL160C 33

DC CHARACTERISTICS (Contin ued)

Zero Power Flash

00 500 1000 1500 2000 2500 3000 3500 4000

Supply Current in mA

Time in ns

Note: Addresses are switching at 1 MHz

Figure 9. ICC1 Current vs. Time (Showing Active and Automatic Sleep Currents)

12345

Frequency in MHz

Supply Current i n m A

Note: T = 25 °CFigure 10. Typical ICC1 vs. Frequency

1.8 V

2.2 V

34 Am29SL160C June 11, 2002

TEST CONDITIONS

Table 14. Test Specifications

Key To Switching W aveforms

Device

Under

Test

Figure 11. Test Setup

Test Condition -90,

-100 -120,

-150 Unit

Output Load 1 TTL gate

Output Load Capacitance, CL

(including jig capacitance) 30 100 pF

Input Rise and Fall Times 5 ns

Input P ulse Levels 0.0–2.0 V

Input timing measurement

reference levels 1.0 V

Output timing me asurement

reference levels 1.0 V

WAVEFORM INPUTS OUTPUTS

Steady

Changing from H to L

Changing from L to H

Don’t Care, Any Cha nge Permitted Changing, State Unknown

Does Not Apply Center Line is High Impedanc e State (High Z)

2.0 V

0.0 V 1.0 V 1.0 V OutputMeasurement LevelInput

Figure 12. Input Waveforms and Measurement Levels

June 11, 2002 Am29SL160C 35

AC CHARACTERISTICS

Read Operations

Notes:

1. Not 100% tested.

2. See Fig ure 11 and Table 14 for test specifications.

Parameter

Description

Speed Option

JEDEC S td Test Setup -90 -100 -120 -150 Unit

tAVAV tRC Read Cycle Time (Note 1) Min 90 100 120 150 ns

tAVQV tACC Address to Output Delay CE# = VIL

OE# = VIL Max 90 100 120 150 ns

tELQV tCE Chip Enable to Output Delay OE# = VIL Max 90 100 120 150 ns

tGLQV tOE Output Enable to Output Delay Max 35 35 50 65 ns

tEHQZ tDF Chip Enable to Output High Z (Note 1) Max 16 ns

tGHQZ tDF Output Enable to Output High Z (N ote 1) Max 16 ns

tOEH Output Enable

Hold Time (Note 1)

Read Min 0 ns

Toggle and

Data# Polling Min 30 ns

tAXQX tOH Output Hold T ime From Addresses, CE#

or OE#, Which ever Occur s First (Note 1) Min 0 ns

tCE

Outputs

WE#

Addresses

CE#

OE#

HIGH Z

Output V alid

HIGH Z

Addresses Stable

tRC

tACC

tOEH

tOE

0 V

RY/BY#

RESET#

tDF

tOH

Figure 13. Read Operations Timings

36 Am29SL160C June 11, 2002

AC CHARACTERISTICS

Hardware Reset (RESET#)

Note: Not 100% tested.

Parameter

Description All Speed OptionsJEDEC Std Test Setup Unit

tREADY RESET# Pin Low (During Embedded

Algor ithms) to Read or Write (see Note) Max 20 µs

tREADY RESET# Pin Low (NOT During Embedded

Algor ithms) to Read or Write (see Note) Max 500 ns

tRP RESET# Pulse Width Min 500 ns

tRH RESET# High Time Before Read (see Note) Min 200 ns

tRB RY/BY# Recovery Time Min 0 ns

RESET#

RY/BY#

tRP

tReady

Reset Timings NOT during Embedded Algorithms

tReady

CE#, OE#

tRH

CE#, OE#

Reset Timings during Embedded Algorithms

RESET#

tRP

tRB

Figure 14. RESET# Timings

June 11, 2002 Am29SL160C 37

AC CHARACTERISTICS

Word/Byte Configurat ion (BYTE #)

Parameter

Description

Speed Options

JEDEC Std -90 -100 -120 -150 Unit

tELFL/tELFH CE# to BYTE# Switching Low or High Max 10 ns

tFLQZ BYTE # Switching Low to Output HIGH Z Max 50 50 60 60 ns

tFHQV BYTE# Switching High to Output Active Min 90 100 120 150 ns

DQ15

Output

Data Output

(DQ0–DQ7)

CE#

OE#

BYTE#

tELFL

DQ0–DQ14 Data Output

(DQ0–DQ14)

DQ15/A-1 Address

Input

tFLQZ

BYTE#

Switching

from word

to byte

mode

DQ15

Output

Data Output

(DQ0–DQ7)

BYTE#

tELFH

DQ0–DQ14 Data Output

(DQ0–DQ14)

DQ15/A-1 Address

Input

tFHQV

BYTE#

Switching

from byte

to word

mode

Figure 15. BYTE# Timings for Read Operations

Note: Refer to the Erase/Program Operations table for tAS and tAH specifications .

Figure 16. BYTE# Timings for Write Operations

CE#

WE#

BYTE#

The falling edge of the last WE# signal

tHOLD (tAH)

tSET

(tAS)

38 Am29SL160C June 11, 2002

AC CHARACTERISTICS

Eras e/Pr og ra m Ope ra tio ns

Notes:

1. Not 100% tested.

2. See the “Erase And Programming Performance” section for more information.

Parameter S peed Options

JEDEC Std Description -90 -100 -120 -150 Unit

tAVAV tWC Write Cycle Time (Note 1) Min 90 100 120 150 ns

tAVWL tAS A ddress Setup Time Min 0 ns

tWLAX tAH Address Hold Time Min50506070ns

tDVWH tDS Data Setup Time Min50506070ns

tWHDX tDH Data Hold Tim e Min 0 ns

tGHWL tGHWL Read Recovery Time B e fore Write

(OE# High to WE# Low) Min 0 ns

tELWL tCS CE# S etup Time Min 0 ns

tWHEH tCH CE# Hold Time Min 0 ns

tWLWH tWP Write Pulse Width Min 50 50 60 70 ns

tWHWL tWPH Write Pulse Width High Min 30 ns

tWHWH1 tWHWH1

Programming Operation (Notes 1, 2) Byte Typ 10 µs

Word Typ 12

Accelerated Pr ogram Operation, Byte or Word

(Note 2) Typ 8 µs

tWHWH2 tWHWH2 Sector Erase Operation (Notes 1, 2) Typ 2 sec

tVCS VCC Setup Time Min 50 µs

tRB Recovery Time from RY/BY# Min 0 ns

tBUSY Progra m/Er ase Valid to RY/BY# Delay Min 200 ns

June 11, 2002 Am29SL160C 39

AC CHARACTERISTICS

OE#

WE#

CE#

VCC

Data

Addresses

tAH

tDH

tWP

tWHWH1

tWC tAS

tWPH

tVCS

555h PA PA

Read Status Data (last two cycles)

A0h

tCS

Status DOUT

Program Command Sequence (last two cycles)

RY/BY#

tBUSY

tCH

Notes:

1. PA = program address, PD = program data, DOUT is the true data at the program address.

2. Illustration shows device in word mode.

Figure 17. Program Operation Timings

40 Am29SL160C June 11, 2002

AC CHARACTERISTICS

OE#

CE#

Addresses

VCC

WE#

Data

2AAh SA

tAH

tWP

tWC tAS

tWPH

555h for chip erase

10 for Chip Erase

30h

tDS

tVCS

tCS

tDH

55h

tCH

Progress Complete

tWHWH2

Erase Command Sequence (last two cycles) Read Status Data

RY/BY#

tRB

tBUSY

Notes:

1. SA = sector address (for Sector Erase), V A = Valid Address for reading status data (see “Write Operation Status”).

2. Illustration shows device in word mode.

Figure 18. Chip/ Secto r Erase Operation T imi ngs

June 11, 2002 Am29SL160C 41

AC CHARACTERISTICS

WE#

CE#

OE#

High Z

tOE

High Z

DQ7

DQ0–DQ6

RY/BY#

tBUSY

Complement True

Addresses VA

tOEH

tCE

tCH

tOH

tDF

VA VA

Status Data

Complement

Status Data True

Valid Data

tACC

tRC

Note: V A = V alid addres s. Illust ration shows fir st status cycle after command s equence, last status read cycl e, and array data read cycle.

Figure 19. Data# Polling Timings (During Embedded Algorithms)

WE#

CE#

OE#

High Z

DQ6/DQ2

RY/BY#

BUSY

Addresses VA

OEH

VA VA

ACC

Valid DataValid StatusValid Status

(first read) (second read) (stops toggling)

Valid Status

Note: V A = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last status read

cycle, and array data read cycle.

Figure 20. Toggle Bit Timings (During Embedded Algorithms)

42 Am29SL160C June 11, 2002

AC CHARACTERISTICS

Temp orary Sector Unp r otect

Parameter

All S pe e d Op t ion sJEDEC Std Description Unit

tVIDR VID Rise and Fall Time Min 500 ns

tVHH VHH Rise and Fal l Time Min 500 ns

tRSP RESET# Setup Time for Temporary Sector

Unprotect Min 4 µs

Note: The system may use CE# or OE# to toggle DQ2 and DQ6. DQ2 toggles only when read at an address within an

erase-sus pen ded sector.

Figure 21. DQ2 vs. DQ6

Enter

Erase

Enter Erase

Suspend Program

Erase Suspend

Read Erase Suspend

Read

Erase

WE#

DQ6

DQ2

Erase

Complete

Erase

Suspend

Program

Resume

Embedded

Erasing

RESET#

tVIDR

VID

0 or 1.8 V

CE#

WE#

RY/BY#

tVIDR

tRSP

Program or Erase Command Sequence

0 or 1.8 V

Figure 22. Temporary Sector Unprotect Ti ming Diagram

June 11, 2002 Am29SL160C 43

AC CHARACTERISTICS

Figure 23. Accelerated Program Timing Diagram

WP#/ACC

tVHH

VHH

VIL or VIH

tVHH

VIL or VIH

Sector Protect: 150 µs

Sector Unprotect: 15 ms

1 µs

RESET#

SA, A6,

A1, A0

Data

CE#

WE#

OE#

60h 60h 40h

Valid* Valid* Valid*

Status

Sector Protect/Unprotect Verify

VID

VIH

* For sector protect, A6 = 0, A1 = 1, A0 = 0. For sector unprotect, A6 = 1, A1 = 1, A0 = 0.

Figure 24. Sector Protect/Unprotect Timing Diagram

44 Am29SL160C June 11, 2002

AC CHARACTERISTICS

Alternate CE# Controlled Erase/Program Operations

Notes:

1. Not 100% tested.

2. See the “Erase And Programming Performance” section for more information.

Parameter Speed Options

JEDEC Std Description -90 -100 -120 -150 Unit

tAVAV tWC Write Cycle Time (Note 1) Min 90 100 120 150 ns

tAVEL tAS Address Setup Time Min 0 ns

tELAX tAH Address Hold Time Min50506070ns

tDVEH tDS Data Setup Time Min 50 50 60 70 ns

tEHDX tDH Data Hold Time Min 0 ns

tGHEL tGHEL Read Recovery Time Before Write

(OE# High to WE# Low) Min 0 ns

tWLEL tWS WE# Setup Time Min 0 ns

tEHWH tWH W E# Hold Time Min 0 ns

tELEH tCP CE# Pulse Width Min 50 50 60 70 ns

tEHEL tCPH CE# Pulse Width High Min 30 ns

tWHWH1 tWHWH1

Programming Operation

(Notes 1, 2) Byte Typ 10 µs

Word Typ 12

Accelerated Program Operation, Byte or Word

(Note 2) Typ 8 µs

tWHWH2 tWHWH2 Sector Erase Operation (Notes 1, 2) Typ 2 sec

June 11, 2002 Am29SL160C 45

AC CHARACTERISTICS

tGHEL

tWS

OE#

CE#

WE#

RESET#

tDS

Data

tAH

Addresses

tDH

tCP

DQ7# D

OUT

tWC tAS

tCPH

Data# Polling

A0 for program

55 for erase

tRH

tWHWH1 or 2

RY/BY#

tWH

PD for program

30 for sector erase

10 for chip erase

555 for program

2AA for erase PA for program

SA for sector erase

555 for chip erase

tBUSY

Notes:

1. PA = program address, PD = program data, DQ7# = complement of the data written, DOUT = data written

2. Figure indicates the last two bus cycles of command sequen ce.

3. Word mode address used as an example.

Figure 25. Alternate CE# Controlled Write Operation Timings

46 Am29SL160C June 11, 2002

ERASE AND PROGRAMMING PERFORMANCE

Notes:

1. Typical program and erase times assume the following conditions: 25 °C, 2.0 V VCC, 1,000 ,000 cycl es. Additiona lly,

programming typicals assume checkerboard pattern.

2. Under worst ca se conditions of 90°C, VCC = 1.8 V, 1,000,000 cycles.

3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes

program faster than the maxi mum program times listed.

4. In the pre-programming step of the Embedded Erase algorithm, all bytes are pr ogrammed to 00h before erasure.

5. System-level overhead is the time req u ired to execute the two- or four-bus-cycle sequence for the pr ogram command. See

Table 12 for further informatio n on command definitions.

6. The device has a minimum guaranteed erase and program cycle endurance of 1,000,000 cycles.

LATCHUP CHARACTERISTICS

Includes all pins except VCC. Test conditi ons: VCC = 1.8 V, one pin at a time.

TSOP PIN CAPACITANCE

Notes:

1. Sampled, not 100% tested.

2. Test conditions TA = 25°C, f = 1.0 MHz.

DATA RETENTION

Parameter Typ (Note 1) Max (Note 2) Unit Comments

Sector Erase Time 2 15 s Excludes 00h programming

prior to erasure (Note 4)

Chip Erase Time 70 s

Byte Prog rammi ng Time 1 0 300 µs

Excludes system level

overhead (Note 5)

Word Programming Time 12 360 µs

Accelerated Program Time, Word/Byte 8 240 µs

Chip Programming Time

(Note 3)

Byte Mode 20 160 s

Word Mode 14 120 s

Description Min Max

Input voltage with respect to VSS on all pins except I/O pins

(including A9, OE#, and RESET#) –1.0 V 11.0 V

Input voltage with respect to VSS on all I/O pins –0.5 V VCC + 0.5 V

VCC Current –100 mA +100 mA

Parameter

Symbol Parameter Description Test Setup Typ Max Unit

CIN Input Capac itanc e V IN = 0 6 7.5 pF

COUT Output Cap ac itanc e VOUT = 0 8.5 12 pF

CIN2 Control Pin Capacitance VIN = 0 7.5 9 pF

Param e ter Test Conditions Min Unit

Minimum Patte rn Data Retention Time 150°C 10 Years

125°C 20 Years

June 11, 2002 Am29SL160C 47

PHYSICAL DIMENSIONS*

TS 048—48-Pin Standard TSOP

* For reference only. BSC is an ANSI standard for Basic Space Centering.

Dwg rev AA; 10/99

48 Am29SL160C June 11, 2002

PHYSICAL DIMENSIONS

FBC048—48-Ball Fine-Pitch Ball Grid Array (FBGA)

8 x 9 mm package

Dwg rev AF; 10/99

June 11, 2002 Am29SL160C 49

REVISION SUMMARY

Revision A (December 1998)

Init ial r eleas e.

Revision A+1 (January 1999)

Distin ctive Characteri st ics

WP#/ACC pin: In the third subbullet, deleted reference

to increased erase performance.

Device Bus Operations

Accelerated Program and Erase Operations: Deleted

all referenc es to accelerated eras e.

Sector/Sector Block Protection and Unprotection:

Changed section name and text to include tables and

refer ences to sector block protection and unprotection.

AC Characteristics

Accelerated Program Timing Diagram: Deleted refer-

ence in title to accelerated erase.

Revision A+2 (March 23, 1999)

Connection Diagrams

Corrected the TSOP pinout on pins 13 and 14.

Revision A+3 (April 12, 1999)

Global

Modified the description of accelerated programming to

emphasize that it is intended only to s peed in-system

programming of the device during the system produc-

tion process.

Distin ctive Characteri st ics

Secured Silicon (SecSi) Sector bullet: Added the 8-

byte unique serial number to description.

Device Bus Operations table

Modified Note 3 to indicate sector protection behavior

when VIH is asserted on WP#/ACC. Applied Note 3 to

the WP#/ACC column for write operations.

Ordering Information

Added the “N” designator to the optional processing

section.

Secured Silicon (SecSi) Sector Flash Memory

Region

Modified explanatory text to indicate that devices now

have an 8-byte unique ESN in addition to the 16-byte

random ESN. Added table for address range

clarification.

Revision A+4 (May 14, 1999)

Global

Deleted all referenc es to the unique ESN.

Revision A+5 (July 23, 1999)

Global

Added 90 ns speed option.

Revision A+6 (September 1, 1999)

AC Characteristics

Hardware Reset (RESET#) table: Deleted tRPD specifi-

cation. Erase/Program Operations table: Deleted tOES

specification.

Revision A+7 (September 7, 1999)

Distinctive Characteristics

Ultra low power consumption bullet: Corrected values

to match those in the DC Characteristics table.

AC Characteristics

Alternate CE# Controlled Erase/Program Operations:

Deleted tOES spe ci fication.

Revision B (December 14, 1999)

AC Characteristics—Figure 17. Program

Operations Timi ng and Figure 18. Chip/Sector

Erase Operations

Deleted tGHWL and changed OE# waveform to start at

high.

Physical Dimensions

Replaced figures with more detailed illust r ations.

Revision C (February 21, 2000)

Removed “Advance I nformation” designat ion from data

sheet. Data sheet parameters are now stable; only

speed, package, and temperature range combinations

are expected to change in futur e revisions.

Device Bus Operations table

Changed standby voltage specification to VCC ± 0.2 V.

Standby Mode

Changed standby voltage specification to VCC ± 0.2 V.

DC Characteristics table

Changed test conditions for ICC3, ICC4, ICC5 to VCC ± 0.2

Revision C+1 (November 14, 2000)

Global

Added dash to speed options and OPNs. Added table

of contents.

AC Characteristics—Read Operations

Changed tDF to 16 ns for all speeds.

50 Am29SL160C June 11, 2002

Revision C+2 (June 11, 2002)

Secured Silicon (SecSi) Sector Flash Memory

Region

Deleted ref erence to A-1 not bei ng used in addres sing,

and to address bits that are don’t cares. In Table 7,

changed lower address bit for user-defined code to 08h

(word mode) and 010h (byte mode).

Trademarks

AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc.

ExpressFlash is a trademark of Advanced Micro Devices, Inc.

Product names used in this publication are for identification purposes only and may be trademarks of their respective companies.