7
Film Chip Capacitors
Electrical Properties and Test Conditions – CB Series
Test Description Performance
Capacitance C Measurement frequency 1 KHz 20°C Shall be within tolerance of the rated value
Dissipation Factor DF Measurement frequency 1 KHz 20°C DF < 100.10-4
Insulation Resistance IR Voltage applied: IR > 1000 Mohms for C < = 0.33µF
10V for Vr < 100V IR x C > 400sec. For C > 0.33µF
100V for Vr > = 100V
Dielectric Strength Surge Voltage = 1.4Vr applied There shall be no direct breakdown
for 1mm between terminals
Mounting Board = 1.6mm (0.063") thick epoxy C = within ± 2% of initial value
glass laminated or alumine substrate DF = < = 50.10-4 at 1 KHz
IR = within initial limit
Adhesion Force of 5 N applied for 10 secs. No visible damage
Board Bending Test Bending of 1 mm(0.039") C = within ± 2% of initial value
for 90 mm (3.543") length No visible damage
Thermal Shock 500 cycles –55/+125°C C = within ± 5% of initial value
ESR = no more than 3 times initial value
IR = not less than 50% of the initial limit
Damp Heat 40°C 93% RH / no voltage / 56 days C = within ± 7% of initial value
Steady State Delta DF = < 50.10-4 at 1 KHz
IR = not less than 50% of the initial limit
Accelerated Damp Heat 85ºC 85% RH 1.5V-500H C = within ± 7% of initial value
(Load Humidity) Delta DF = < = 70.10-4 at 1 KHz
IR = not less than 50% of the initial limit
Life Test 85ºC / 1.25Vr / 1000H C = within ± 8% of initial value
Delta DF = < 50.10-4 at 1 KHz
IR = not less than 50% of the initial limit
Life Test 105°C / Vr/1,000 Hours C = within ± 7% of initial value
125°C / Vr/1,000 Hours Delta DF = < 50.10-4 at 1 KHz
IR = not less than 50% of the initial limit
Charge/Discharge 10,000 cycle / Vr C = within ± 5% of initial value
DF = < 50.10-4 at 1 KHz
IR = not less than 50% of the initial limit
STANDARDIZATION
Reference Standard is CECC 32201