
CY74FCT16543T
CY74FCT162543T
2
Maximum Ratings[3, 4]
(Above which the useful life may be impaired. For user
guidelines, not tested.)
Sto ra g e Temp e ra tur e ...... ..... ..... .....Co m ’ l −55°C to +125°C
Ambient Temperature with
Power Applied.................................Com’l −55°C to +125°C
DC Input Voltage .................................................−0.5V to +7.0V
DC Output Voltage..............................................−0.5V to +7.0V
DC Output Current
(Maximum Si nk Curr ent/Pin)...........................−60 to +120 mA
Power Dissipation.......................................................... 1.0W
Static Discharge Voltage ...........................................>2001V
(per MIL- STD-883, Method 3015 )
Pin Description
Name Description
OEAB A-to-B Outp ut Enable Inp ut (Active LOW)
OEBA B-to-A Outp ut Enable Inp ut (Active LOW)
CEAB A-to-B Enable Input (Active LOW)
CEBA B-to-A Enable Input (Active LOW)
LEAB A-to-B Latch Enab le Input (Active LOW )
LEBA B-to-A Latch Enab le Input (Active LOW )
AA-to -B Data Inputs or B-to- A Three-St ate Output s
BB-to -A Data Inputs or A-to- B Three-St ate Output s
Function Table[1]
Inputs Latch
Status Output
Buffers
CEAB LEAB OEAB A to B B
H X X Storing High Z
X H X Storing X
X X H X High Z
LLLTransparent Curr ent A
Inputs
L H L Storing Previous A
Inputs[2]
Operating Range
Range Ambient
Temperature VCC
Industrial −40°C to +85°C 5V ± 10%
Electrical Characteristics Ov er the Operating Range
Parameter Description T est Conditions Min. Typ.[5] Max. Unit
VIH Input HIGH Voltage 2.0 V
VIL Input LOW Volta ge 0.8 V
VHInput Hystere sis[6] 100 mV
VIK Input Clamp Diode Voltage VCC=Min., IIN=−18 mA −0.7 −1.2 V
IIH Input HIGH Current VCC= M a x ., V I=VCC ±1µA
IIL Input LOW Current VCC= M a x ., V I=GND ±1µA
IOZH High Impedance Output Cur-
rent (Three-State Output pins) VCC= M a x ., VOUT=2.7V ±1µA
IOZL High Impedance Output Cur-
rent (Three-State Output pins) VCC= M a x ., VOUT=0.5V ±1µA
IOS Short Circuit Current[7] VCC=M a x ., VOUT=GND −80 −140 −200 mA
IOOutput Drive Current[7] VCC=M a x ., VOUT=2.5V −50 −180 mA
IOFF Power-Off Disable VCC=0V, VOUT≤4.5V[8] ±1µA
Notes:
1. A-to-B data flow shown; B-to-A flow control is the same, except using CEBA, LEBA, and OEBA.
2. Data prior to LEAB LOW-to-HIGH Transition
H = HIGH Voltage Level. L = LOW Voltage Level.
X = Don’t Care. Z = High Impedance.
3. Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature
range.
4. Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
5. Typical values are at VCC= 5.0V, TA= +25°C ambient.
6. This parameter is guaranteed but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
8. Tested at +25°C.