RELIABILITY REPORT DATE: 9/10/13 QUALITY ENG : PURPOSE: Micrel QA New Product Qual PART NUMBER (NON-EEE VER) PART NUMBER (EEE VER) PACKAGE TYPE KSZ8081RNDCA KSZ8081RNACA/IA KSZ8081MNXCA/IA KSZ8081RNBCA/IA KSZ8081MLXCA/IA KSZ8091RNDCA KSZ8091RNACA/IA KSZ8091MNXCA/IA KSZ8091RNBCA/IA KSZ8091MLXCA/IA 24L 24L 32L 32L 48L FAB LOCATION PROCESS NAME QFN (MLF) QFN (MLF) QFN (MLF) QFN (MLF) LQFP DONGBU DONGBU DONGBU DONGBU DONGBU 0.11 0.11 0.11 0.11 0.11 KSZ8051MNLU (AUTOMOTIVE GRADE of KSZ8081XXXXX) 32L QFN (MLF) DONGBU 0.11 um ESD RATINGS LATCH-UP RATING FIT RATE: I/O Trigger @ 200 mA ESD-HBM: + 6000V ESD-MM: + 200V um um um um um DONGBU 0.11 um : 15.7 FIT or MTBF= 6.37x10E7 device hours (60% C.L.,TA= 55C, O/V @ ABS max Vcc or 1.5xVcc Ea= 0.7eV) QUALIFICATION RESULTS TEST DESCRIPTION METHOD/ CONDITIONS SPEC 100-1010 HTOL PART NO. KSZ8051MNL LOT ID. M114M0901MEH 168H 1000H 2000H rej/ss rej/ss rej/ss 0/77 0/77 0/77 COMMENTS TA= + 125C High Temperature Operating Life Test TEST DESCRIPTION Tj= + 140C METHOD/ CONDITIONS JEDEC ESD-HBM Electrostatic Discharge, Human Body Model ESD-MM Electrostatic Discharge, Machine Model JESD-22-A114 TA= +25C JEDEC JESD-22-A115/ AEC-Q100-003 TA= +25C FORM #18-1185 REV: J PAGE 1 OF 2 (automotive grade of KSZ8081/91) PART NO. KSZ8051MNLU LOT ID. TEST RESULTS (rej/ss) M11AD13MEG + 500V 0/3 +1000V 0/3 +1500V 0/3 +2000V 0/3 +3000V 0/3 +4000V 0/3 +5000V 0/3 +6000V 0/3 (automotive grade of KSZ8081/91 KSZ8051MNLU (automotive grade of KSZ8081/91 M11AD13MEG + 50V 0/3 + 100V 0/3 + 150V 0/3 + 200V 0/3 COMMENTS QUALIFICATION RESULTS CONTINUE: TEST DESCRIPTION METHOD/ CONDITIONS PART NO. LOT ID. TEST RESULTS (rej/ss) ESD-CDM Electrostatic Discharge, Charged Device Model JESD-22 KSZ8051MNLU M11AD13MEG + 500V 0/3 + 1000V 0/3 + 1500V 0/3 + 2000V 0/3 I/O 0/6 VO 0/6 DATE CODE 1000hrs (rej/ss) LU Latch-Up Method C101 Ta = +25C JESD78/ AEC-Q100- (automotive grade of KSZ8081/91) KSZ8051MNLU M11AD13MEG 011 COMMENTS (automotive grade of KSZ8081/91 TEST DESCRIPTION HTSL METHOD/ CONDITIONS PART NO. LOT ID. SPEC 100-1010 KSZ8051MNLU M114L0911MEJ 1143 0/45 KSZ8051MNLU M11AD13MEG 1214 0/45 DATE CODE 500C (rej/ss) High Temperature Storage Life Test TA= + 150C TEST DESCRIPTION METHOD/ CONDITIONS TEMPERATURE CYCLE (AIR/AIR) COND. C Pre-conditioning 3X Reflow PART NO. LOT ID. Ta= Delta65C/+150C KSZ8051MNLU M114L0911MEJ 1143 0/77 KSZ8051MNLU M114L092MEB 1206 0/77 Ref# MIL STD M1010 KSZ8051MNLU M11AD13MEG 1214 0/77 PART NO. LOT ID. DATE CODE 96 hrs (rej/ss) JESD22-102 KSZ8051MNLU M114L0911MEJ 1143 0/77 Ta= +121C/ 100%RH KSZ8051MNLU M114L092MEB 1206 Pre-conditioning 3X Reflow 0/77 KSZ8051MNLU M11AD13MEG 1214 0/77 PART NO. LOT ID. DATE CODE 96 hrs (rej/ss) METHOD/ CONDITIONS TEST DESCRIPTION METHOD/ CONDITIONS HAST JESD22- A110 KSZ8051MNLU M114L0911MEJ 1143 0/77 Highly Accelerated Stress Test Ta= 130C/ 85% R.H; KSZ8051MNLU M114L092MEB 1206 0/76 Vcc = 3.3V KSZ8051MNLU M11AD13MEG 1214 0/77 LOT ID. DATE CODE RESULTS 1206 0/15 TEST DESCRIPTION METHOD/ CONDITIONS PART NO. SOLDERABILITY TEST MIL-STD-883 TM.2003 KSZ8051MNLU +245C FORM #18-1185 COMMENTS Ref# JESD22-A104 TEST DESCRIPTION PRESSURE POT COMMENTS REV: J PAGE 2 OF 2 M114L092MEB COMMENTS COMMENTS COMMENTS Mouser Electronics Authorized Distributor Click to View Pricing, Inventory, Delivery & Lifecycle Information: Micrel: KSZ8091MNXCA