RELIABILITY REPORT
DATE: 9/10/13
QUALITY ENG : PURPOSE:
Micrel QA New Product Qual
PART NUMBER
(NON-EEE VER) PART NUMBER (EEE
VER) PACKAGE TYPE FAB LOCATION PROCESS NAME
KSZ8081RNDCA
KSZ8081RNACA/IA
KSZ8081MNXCA/IA
KSZ8081RNBCA/IA
KSZ8081MLXCA/IA
KSZ8091RNDCA
KSZ8091RNACA/IA
KSZ8091MNXCA/IA
KSZ8091RNBCA/IA
KSZ8091MLXCA/IA
24L QFN (MLF)
24L QFN (MLF)
32L QFN (MLF)
32L QFN (MLF)
48L LQFP
DONGBU
DONGBU
DONGBU
DONGBU
DONGBU
0.11 um
0.11 um
0.11 um
0.11 um
0.11 um
KSZ8051MNLU (AUTOMOTIVE GRADE of
KSZ8081XXXXX) 32L QFN (MLF) DONGBU 0.11 um
ESD RATINGS LATCH-UP RATING FIT RATE:
ESD-HBM: + 6000V
ESD-MM: + 200V
I/O Trigger @ 200 mA
O/V @ ABS max Vcc or 1.5xVcc
DONGBU 0.11 um : 15.7 FIT
or MTBF= 6.37x10E7 device
hours (60% C.L.,TA= 55°C,
Ea= 0.7eV)
QUALIFICATION RESULTS
TEST DESCRIPTION
METHOD/
CONDITIONS
PART NO.
LOT ID.
168H
rej/ss
1000H
rej/ss
2000H
rej/ss
C
OMMENTS
HTOL
High Temperature
Operating Life
Test
SPEC 100-1010
TA= + 125°C
Tj= + 140°C
KSZ8051MNL
(automotive
grade of
KSZ8081/91)
M114M0901MEH 0/77
0/77
0/77
TEST DESCRIPTION METHOD/
CONDITIONS PART NO. LOT ID.
TEST RESULTS
(rej/ss) COMMENTS
ESD-HBM
Electrostatic
Discharge, Human
Body Model
JEDEC
JESD-22-A114
TA= +25°C
KSZ8051MNLU
(automotive
grade of
KSZ8081/91
M11AD13MEG + 500V
+1000V
+1500V
+2000V
+3000V
+4000V
+5000V
+6000V
0/3
0/3
0/3
0/3
0/3
0/3
0/3
0/3
ESD-MM
Electrostatic
Discharge, Machine
Model
JEDEC
JESD-22-A115/
AEC-Q100-003
TA= +25°C
KSZ8051MNLU
(automotive
grade of
KSZ8081/91
M11AD13MEG + 50V
+ 100V
+ 150V
+ 200V
0/3
0/3
0/3
0/3
FORM #18-1185 REV: J PAGE 1 OF 2
QUALIFICATION RESULTS CONTINUE:
TEST DESCRIPTION METHOD/
CONDITIONS PART NO. LOT ID.
TEST RESULTS
(rej/ss) COMMENTS
ESD-CDM
Electrostatic
Discharge, Charged
Device Model
JESD-22
Method C101
Ta = +25°C
KSZ8051MNLU
(automotive
grade of
KSZ8081/91)
M11AD13MEG + 500V
+ 1000V
+ 1500V
+ 2000V
0/3
0/3
0/3
0/3
LU
Latch-Up JESD78/ AEC-Q100-
011
KSZ8051MNLU
(automotive
grade of
KSZ8081/91
M11AD13MEG I/O
VO
0/6
0/6
TEST DESCRIPTION METHOD/
CONDITIONS PART NO. LOT ID.
DATE CODE 1000hrs
(rej/ss) COMMENTS
HTSL
High Temperature
Storage Life Test
SPEC 100-1010
TA= + 150°C
KSZ8051MNLU
KSZ8051MNLU
M114L0911MEJ
M11AD13MEG
1143
1214
0/45
0/45
TEST DESCRIPTION METHOD/
CONDITIONS PART NO. LOT ID.
DATE CODE 500C
(rej/ss) COMMENTS
TEMPERATURE
CYCLE (AIR/AIR)
COND. C
Pre-conditioning
3X Reflow
Ta= Delta-
65°C/+150°C
Ref# MIL STD
M1010
Ref# JESD22-A104
KSZ8051MNLU
KSZ8051MNLU
KSZ8051MNLU
M114L0911MEJ
M114L092MEB
M11AD13MEG
1143
1206
1214
0/77
0/77
0/77
TEST DESCRIPTION METHOD/
CONDITIONS PART NO. LOT ID.
DATE CODE 96 hrs
(rej/ss) COMMENTS
PRESSURE POT
Pre-conditioning
3X Reflow
JESD22-102
Ta= +121°C/
100%RH
KSZ8051MNLU
KSZ8051MNLU
KSZ8051MNLU
M114L0911MEJ
M114L092MEB
M11AD13MEG
1143
1206
1214
0/77
0/77
0/77
TEST DESCRIPTION METHOD/
CONDITIONS PART NO. LOT ID.
DATE CODE 96 hrs
(rej/ss) COMMENTS
HAST
Highly Accelerated
Stress Test
JESD22- A110
Ta= 130C/ 85% R.H;
Vcc = 3.3V
KSZ8051MNLU
KSZ8051MNLU
KSZ8051MNLU
M114L0911MEJ
M114L092MEB
M11AD13MEG
1143
1206
1214
0/77
0/76
0/77
TEST DESCRIPTION METHOD/
CONDITIONS PART NO. LOT ID.
DATE CODE RESULTS COMMENTS
SOLDERABILITY
TEST
MIL-STD-883
TM.2003
+245C
KSZ8051MNLU
M114L092MEB
1206
0/15
FORM #18-1185 REV: J PAGE 2 OF 2
Mouser Electronics
Authorized Distributor
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Micrel:
KSZ8091MNXCA