TL/F/9936
54AC/74AC175 #54ACT/74ACT175 Quad D Flip-Flop
March 1993
54AC/74AC175 #54ACT/74ACT175
Quad D Flip-Flop
General Description
The ’AC/’ACT175 is a high-speed quad D flip-flop. The de-
vice is useful for general flip-flop requirements where clock
and clear inputs are common. The information on the D
inputs is stored during the LOW-to-HIGH clock transition.
Both true and complemented outputs of each flip-flop are
provided. A Master Reset input resets all flip-flops, indepen-
dent of the Clock or D inputs, when LOW.
Features
YICC reduced by 50%
YEdge-triggered D-type inputs
YBuffered positive edge-triggered clock
YAsynchronous common reset
YTrue and complement output
YOutputs source/sink 24 mA
Y’ACT175 has TTL-compatible inputs
YStandard Military Drawing (SMD)
Ð ’AC175: 5962-89552
Ð ’ACT175: 5962-89693
Logic Symbols
TL/F/99361
IEEE/IEC
TL/F/99362
Pin Names Description
D0–D3Data Inputs
CP Clock Pulse Input
MR Master Reset Input
Q0–Q3True Outputs
Q0–Q3Complement Outputs
Connection Diagrams
Pin Assignment
for DIP, Flatpak and SOIC
TL/F/99363
Pin Assignment
for LCC
TL/F/99364
FACTTM is a trademark of National Semiconductor Corporation.
C1995 National Semiconductor Corporation RRD-B30M75/Printed in U. S. A.
Functional Description
The ’AC/’ACT175 consists of four edge-triggered D flip-
flops with individual D inputs and Q and Q outputs. The
Clock and Master Reset are common. The four flip-flops will
store the state of their individual D inputs on the LOW-to-
HIGH clock (CP) transition, causing individual Q and Q out-
puts to follow. A LOW input on the Master Reset (MR) will
force all Q outputs LOW and Q outputs HIGH independent
of Clock or Data inputs. The ’AC/’ACT175 is useful for gen-
eral logic applications where a common Master Reset and
Clock are acceptable.
Truth Table
Inputs Outputs
@tn,MReH@t
n
a
1
D
nQ
nQ
n
LLH
HHL
H
e
HIGH Voltage Level
LeLOW Voltage Level
tneBit Time before Clock Pulse
tna1eBit Time after Clock Pulse
Logic Diagram
TL/F/99365
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
2
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Supply Voltage (VCC)b0.5V to a7.0V
DC Input Diode Current (IIK)
VIeb
0.5V b20 mA
VIeVCC a0.5V a20 mA
DC Input Voltage (VI)b0.5V to VCC a0.5V
DC Output Diode Current (IOK)
VOeb
0.5V b20 mA
VOeVCC a0.5V a20 mA
DC Output Voltage (VO)b0.5V to VCC a0.5V
DC Output Source
or Sink Current (IO)g50 mA
DC VCC or Ground Current
per Output Pin (ICC or IGND)g50 mA
Storage Temperature (TSTG)b65§Ctoa
150§C
Junction Temperature (TJ)
CDIP 175§C
PDIP 140§C
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recom-
mend operation of FACTTM circuits outside databook specifications.
Recommended Operating
Conditions
Supply Voltage (VCC)
’AC 2.0V to 6.0V
’ACT 4.5V to 5.5V
Input Voltage (VI) 0VtoV
CC
Output Voltage (VO) 0VtoV
CC
Operating Temperature (TA)
74AC/ACT b40§Ctoa
85§C
54AC/ACT b55§Ctoa
125§C
Minimum Input Edge Rate (DV/Dt)
’AC Devices
VIN from 30% to 70% of VCC
VCC @3.3V, 4.5V, 5.5V 125 mV/ns
Minimum Input Edge Rate (DV/Dt)
’ACT Devices
VIN from 0.8V to 2.0V
VCC @4.5V, 5.5V 125 mV/ns
DC Characteristics for ’AC Family Devices
74AC 54AC 74AC
Symbol Parameter VCC TAea
25§CTAeTAeUnits Conditions
(V) b55§Ctoa
125§Cb40§Ctoa
85§C
Typ Guaranteed Limits
VIH Minimum High Level 3.0 1.5 2.1 2.1 2.1 VOUT e0.1V
Input Voltage 4.5 2.25 3.15 3.15 3.15 V or VCC b0.1V
5.5 2.75 3.85 3.85 3.85
VIL Maximum Low Level 3.0 1.5 0.9 0.9 0.9 VOUT e0.1V
Input Voltage 4.5 2.25 1.35 1.35 1.35 V or VCC b0.1V
5.5 2.75 1.65 1.65 1.65
VOH Minimum High Level 3.0 2.99 2.9 2.9 2.9 IOUT eb
50 mA
Output Voltage 4.5 4.49 4.4 4.4 4.4 V
5.5 5.49 5.4 5.4 5.4
*VIN eVIL or VIH
3.0 2.56 2.4 2.46 b12 mA
4.5 3.86 3.7 3.76 V IOH b24 mA
5.5 4.86 4.7 4.76 b24 mA
VOL Maximum Low Level 3.0 0.002 0.1 0.1 0.1 IOUT e50 mA
Output Voltage 4.5 0.001 0.1 0.1 0.1 V
5.5 0.001 0.1 0.1 0.1
*VIN eVIL or VIH
3.0 0.36 0.50 0.44 12 mA
4.5 0.36 0.50 0.44 V IOL 24 mA
5.5 0.36 0.50 0.44 24 mA
IIN Maximum Input 5.5 g0.1 g1.0 g1.0 mAVIeVCC, GND
Leakage Current
*All outputs loaded; thresholds on input associated with output under test.
3
DC Characteristics for ’AC Family Devices (Continued)
74AC 54AC 74AC
Symbol Parameter VCC TAea
25§CTAeTAeUnits Conditions
(V) b55§Ctoa
125§Cb40§Ctoa
85§C
Typ Guaranteed Limits
IOLD ²Minimum Dynamic 5.5 50 75 mA VOLD e1.65V Max
IOHD Output Current 5.5 b50 b75 mA VOHD e3.85V Min
ICC Maximum Quiescent 5.5 4.0 80.0 40.0 mAVIN eVCC
Supply Current or GND
²Maximum test duration 2.0 ms, one output loaded at a time.
Note: IIN and ICC @3.0V are guaranteed to be less than or equal to the respective limit @5.5V VCC.
ICC for 54AC @25§C is identical to 74AC @25§C.
DC Characteristics for ’ACT Family Devices
74ACT 54ACT 74ACT
Symbol Parameter VCC TAea
25§CTAeTAeUnits Conditions
(V) b55§Ctoa
125§Cb40§Ctoa
85§C
Typ Guaranteed Limits
VIH Minimum High Level 4.5 1.5 2.0 2.0 2.0 VVOUT e0.1V
Input Voltage 5.5 1.5 2.0 2.0 2.0 or VCC b0.1V
VIL Maximum Low Level 4.5 1.5 0.8 0.8 0.8 VVOUT e0.1V
Input Voltage 5.5 1.5 0.8 0.8 0.8 or VCC b0.1V
VOH Minimum High Level 4.5 4.49 4.4 4.4 4.4 VIOUT eb
50 mA
Output Voltage 5.5 5.49 5.4 5.4 5.4
*VIN eVIL or VIH
4.5 3.86 3.70 3.76 VI
OH
b24 mA
5.5 4.86 4.70 4.76 b24 mA
VOL Maximum Low Level 4.5 0.001 0.1 0.1 0.1 VIOUT e50 mA
Output Voltage 5.5 0.001 0.1 0.1 0.1
*VIN eVIL or VIH
4.5 0.36 0.50 0.44 VI
OL
24 mA
5.5 0.36 0.50 0.44 24 mA
IIN Maximum Input 5.5 g0.1 g1.0 g1.0 mAVIeVCC, GND
Leakage Current
ICCT Maximum 5.5 0.6 1.6 1.5 mA VIeVCC b2.1V
ICC/Input
IOLD ²Minimum Dynamic 5.5 50 75 mA VOLD e1.65V Max
IOHD Output Current 5.5 b50 b75 mA VOHD e3.85V Min
ICC Maximum Quiescent 5.5 4.0 80.0 40.0 mAVIN eVCC
Supply Current or GND
*All outputs loaded; thresholds on input associated with output under test.
²Maximum test duration 2.0 ms, one output loaded at a time.
Note: ICC for 54ACT @25§C is identical to 74ACT @25§C.
4
AC Electrical Characteristics
74AC 54AC 74AC
VCC*TAea
25§CTAeb
55§CT
A
eb
40§C
Symbol Parameter (V) CLe50 pF to a125§Cto
a
85§C Units
CLe50 pF CLe50 pF
Min Typ Max Min Max Min Max
fmax Maximum Clock 3.3 149 214 95 139 MHz
Frequency 5.0 187 244 95 187
tPLH Propagation Delay 3.3 2.0 9.5 12.0 1.0 14.5 2.0 13.5 ns
CP to Qnor Qn5.0 1.5 7.0 9.0 1.5 10.5 1.0 9.5
tPHL Propagation Delay 3.3 2.5 8.5 13.0 1.0 15.0 2.0 14.5 ns
CP to Qnor Qn5.0 1.5 6.0 9.5 1.5 11.5 1.5 10.5
tPLH Propagation Delay 3.3 3.0 7.5 12.5 1.0 15.0 2.5 13.5 ns
MR to Qn5.0 2.0 5.5 9.0 1.5 11.0 1.5 10.0
tPHL Propagation Delay 3.3 3.0 8.5 11.0 1.0 13.5 2.5 12.5 ns
MR to Qn5.0 2.0 6.0 8.5 1.5 10.5 1.5 9.0
*Voltage Range 3.3 is 3.3V g0.3V
Voltage Range 5.0 is 5.0V g0.5V
AC Operating Requirements
74AC 54AC 74AC
VCC*TAea
25§CTAeb
55§CT
A
eb
40§C
Symbol Parameter (V) CLe50 pF to a125§Cto
a
85§C Units
CLe50 pF CLe50 pF
Typ Guaranteed Minimum
tsSetup Time, HIGH or LOW 3.3 2.0 4.5 5.0 4.5 ns
Dnto CP 5.0 1.0 3.0 3.5 3.0
thHold Time, HIGH or LOW 3.3 1.0 1.0 2.0 1.0 ns
Dnto CP 5.0 1.0 1.0 2.5 1.0
twCP Pulse Width 3.3 2.5 4.5 6.0 4.5 ns
HIGH or LOW 5.0 2.0 3.5 5.0 3.5
twMR Pulse Width, LOW 3.3 2.5 4.5 5.5 5.0 ns
5.0 2.0 3.5 5.0 3.5
trec Recovery Time 3.3 b2.0 0 1.5 0 ns
MR to CP 5.0 b1.0 0 1.5 0
*Voltage Range 3.3 is 3.3V g0.3V
Voltage Range 5.0 is 5.0V g0.5V
5
AC Electrical Characteristics
74ACT 54ACT 74ACT
VCC*TAea
25§CTAeb
55§CT
A
eb
40§C
Symbol Parameter (V) CLe50 pF to a125§Cto
a
85§C Units
CLe50 pF CLe50 pF
Min Typ Max Min Max Min Max
fmax Maximum Clock 5.0 175 236 95 145 MHz
Frequency
tPLH Propagation Delay 5.0 2.0 6.0 10.0 1.5 11.5 1.5 11.0 ns
CP to Qnor Qn
tPHL Propagation Delay 5.0 2.0 7.0 11.0 1.5 12.5 1.5 12.0 ns
CP to Qnor Qn
tPLH Propagation Delay 5.0 2.0 6.0 9.5 1.5 11.5 1.5 10.5 ns
MR to Qn
tPHL Propagation Delay 5.0 2.0 5.5 9.5 1.5 11.0 1.5 10.5 ns
MR to Qn
*Voltage Range 5.0 is 5.0V g0.5V
AC Operating Requirements
74ACT 54ACT 74ACT
VCC*TAea
25§CTAeb
55§CT
A
eb
40§C
Symbol Parameter (V) CLe50 pF to a125§Cto
a
85§C Units
CLe50 pF CLe50 pF
Typ Guaranteed Minimum
ts(H) Setup Time 5.0 3.0 2.0 3.5 2.0 ns
ts(L) Dnto CP 3.0 2.5 3.5 2.5
thHold Time, HIGH or LOW 5.0 0 1.0 1.5 1.0 ns
Dnto CP
twCP Pulse Width 5.0 4.0 3.0 5.0 3.5 ns
HIGH or LOW
twMR Pulse Width, LOW 5.0 4.0 3.0 5.0 4.0 ns
trec Recovery Time, MR to CP 5.0 0 0 1.5 0 ns
*Voltage Range 5.0 is 5.0V g0.5V
Capacitance
Symbol Parameter Typ Units Conditions
CIN Input Capacitance 4.5 pF VCC eOPEN
CPD Power Dissipation 45.0 pF VCC e5.0V
Capacitance
6
Ordering Information
The device number is used to form part of a simplified purchasing code where the package type and temperature range are
defined as follows:
74ACT 175 P C QR
Temperature Range Family Special Variations
74AC eCommercial X eDevices shipped in 13×reels
54AC eMilitary QR eCommercial grade device with
74ACT eCommercial TTL-Compatible burn-in
54ACT eMilitary TTL-Compatible QB eMilitary grade device with
environmental and burn-in
Device Type processing shipped in tubes
Package Code Temperature Range
PePlastic DIP CeCommercial (b40§Ctoa
85§C)
DeCeramic DIP MeMilitary (b55§Ctoa
125§C)
FeFlatpak
LeLeadless Ceramic Chip Carrier (LCC)
SeSmall Outline (SOIC)
Physical Dimensions inches (millimeters)
20 Terminal Ceramic Leadless Chip Carrier (L)
NS Package Number E20A
7
Physical Dimensions inches (millimeters) (Continued)
16-Lead Ceramic Dual-In-Line Package (D)
NS Package Number J16A
16-Lead Small Outline Integrated Circuit (S)
NS Package Number M16A
8
Physical Dimensions inches (millimeters) (Continued)
16-Lead Plastic Dual-In-Line Package (P)
NS Package Number N16E
9
54AC/74AC175 #54ACT/74ACT175 Quad D Flip-Flop
Physical Dimensions inches (millimeters) (Continued)
16-Lead Ceramic Flatpak (F)
NS Package Number W16A
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failure to perform, when properly used in accordance support device or system, or to affect its safety or
with instructions for use provided in the labeling, can effectiveness.
be reasonably expected to result in a significant injury
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