SOD323 SILICON VARIABLE
CAPACITANCE DIODES
ISSUE 1 – NOVEMBER 1998
FEATURES
* Close Tolerance C-V Characteristics
* High Tuning Ratio
* Low IR
Enabling Excellent Phase Noise Performance
(IR Typically <200pA at 25V)
* Miniature surface mount package
ABSOLUTE MAXIMUM RATINGS.
PARAMETER SYMBOL MAX UNIT
Forward Current IF200 mA
Power Dissipation at Tamb
=25°C Ptot 330 mW
Operating and Storage Temperature Range Tj:Tstg -55 to +150 °C
ELECTRICAL CHARACTERISTICS (at Tamb
=25°C)
PARAMETER SYMBOL MIN TYP MAX UNIT CONDITIONS
Reverse Breakdown
Voltage
VBR 25 V IR=10µA
Reverse Voltage Leakage IR0.2 20 nA VR=20V
Temperature Coefficient
of Capacitance η300 400 ppm/°C VR=3V, f=1MHz
TUNING CHARACTERISTICS (at Tamb
=25°C)
PART NO
Nominal Capacitance (pF)
VR=2V, f=1MHz
Minimum
Q
@ VR=3V
f=50MHz
Capacitance Ratio
C2 / C20
at f=1MHz
MIN NOM MAX MIN MAX
ZMV829A 7.38 8.2 9.02 250 4.3 5.8
ZMV830A 9.0 10.0 11.0 300 4.5 6.0
ZMV831A 13.5 15.0 16.5 300 4.5 6.0
ZMV832A 19.8 22.0 24.2 200 5.0 6.5
ZMV833A 29.7 33.0 36.3 200 5.0 6.5
ZMV834A 42.3 47.0 51.7 200 5.0 6.5
ZMV835A 61.2 68.0 74.8 100 5.0 6.5
Note:
No suffix ±20% (e.g. ZMV830), suffix B ± 5% (e.g. ZMV830B)
Spice parameter data is available upon request for these devices
C
A
1
3
ZMV829/A/B
to
ZMV835/A/B