M IL SPECS WUE D MM 0000325 0033965 4 MMNILS [The documentation and process 1 INCH POUND he | |conversion measures necessary to | [comply with this revision shall be | MIL-S-19500/337F | [completed by 4 January 1994 4 October 1993 SUPERSEDING MIL-S-19500/337E 8 June 1987 of MILITARY SPECIFICATION SEMICONDUCTOR DEVICE, DIODE, SILICON, SWITCHING TYPES 1N46153, 1N4153-1, 1N4153UR-1, AND 1N4534 JAN, JANTX, JANTXV, AND JANS This specification 1s approved for use by all Departments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the detail requirements for silicon, switching diodes. Four levels product assurance are provided for each device type as specified in MIL-S-19500 (see 6.3.2). 1.2 Physical dimensions. See figure 1 (similar to DO-35 and DO-34) and figure 2 (D0-213AA). 7.3 Maximum ratings. | | | | | | | | \Vcpr) = [ruM 1/ | lo 2/ | oI FSM | Ipsm {Top and Tstg =| Zeux | Rost | Rosec | | | | [tp= 1s ltp= Tus | | | | | | | | | | | | | | | | | | | | | | Vide | V (pk) | mA dc | A (pk) | A (pk | C | C/W | c/w =| SC/W | | | | | | | | | | | | 75 | 50 | 150 {| 0.25 | 2.0 | -65 to +175 =! 650 | 250 | 100 | | | | | | | | | 1/ This voltage may be exceeded for normal measuring intervals (< 1 minute) provided the current 1s limited to a maximum of 100 yA dc. 2/ Derate at 1.0 mA dc/C above Ta = 25C. 1.4 Primary electrical characteristics at Ta = +25C, unless otherwise indicated. | | | | | | | | | Limits | VF4 | VF2 | VE3 | VES | VES | VF6 | | {Ip = 100 pA de fip= 250 pA dc | Ip=1 mA dc |Ifp=2 mA de |If= 10 mA dc JIf= 20 mA de | | | { | | | i | | | | | | | | [Min | 0.490Vde | O0.530Vdce | 0.590 Vde | 0.620Vde | O.700Vde | 0.740 V de | Max | O0.550vVde | 0.590 vVde | 0.670 Vde | O.700Vde | O.810Vde | 0.880 V de | | | | | rf | | | | [| Limit | IR1 | Ip2 | c | ter | | IVR = 50 Vv de (Ve =S5O0 Vdc |Vp =OVde | Ip = IR = 10 mA de | | | | Ta = 150C | f= 1MHz {Rt = 100 ohms, Ipp= 1.0 mA de | | | | | [_ | | | | | Cr boa oe | |Max | 50 nA de | 50 yA de | 2.0 pF | 4 ns | | | | | | | | | | | Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of | use in improving this document should be addressed to: Commander, Defense Electronics Supply Center, | ATTN: DESC-ECT, 1507 Wilmington Pike, Dayton, OH 45444-5270, by using the self-addressed Standardization | Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter. L AMSC N/A FSC 5961 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.MIL SPECS WHE D MM O0001eS 0033966 & MENILS MIL-S-19500/337F L G L Tf 28 - f aj. Mt 0 | | | | | Types | Dimensions | Notes | | | | | | | | | Ltr | Inches [ Millimeters | | | | | | | | | | [Min | Max | Min | Max | | | | | | | | | | | 1N4153 | G [..140 | .180 | 3.56] 4.57 |} | | 1N4153-1| | | | | | | | d | .056 | .075 | 1.42} 1.91 | | | | | | | | | Lot [1.000 [1.500 | 25.40] 38.10 | | | | | | | | | | | | | .050 | | 1.27 | | | | | | | | | | | | | | | | | L_ B | .018 | .022 | 0.46] 0.56 | | | | | | | | | | 1N4534 | G | .080 | 120 | 2.03] 3.05 | | | | | | | | | | | [| gD | .050 |} .075 | 1.27] 1.91 | | | | | | | | | | | { t [1,000 [1.500 | 25.40] 38.10 | | | | | | | | { a | .050 | | 1.27 | | | L | | | | | | | | | | i | | | L | #8 | .018 | .022 | 0.46] 0.56 | | Dimensions are in inches. Metric equivalents are given for general information only. Package contour optional within gD and length G. Heat slugs if any, shall be included within this cylinder but shall not be subject to the minimum Limit of gD. Lead diameter not controlled in zones L1 to allow for flash, lead finish build-up and minor irregularities other than heat slugs. FIGURE 1. Physical dimensions for 1N4153-1 (D0-35) and 1N4534 (DO-34).MIL SPECS WHE D MM O00032e5 0033567 & MMILS MIL-S-19500/337F Qo y Fo [ein Gy ey G = r T 1 | | Dimensions | | I | | Symbol | Inches | Millimeters | | T | | | Min | Max | Min | Max | | t t | | gd | .063 | .067 | 1.60 | 1.70 | | t ! | F | .016 | .022 | 0.41] 0.55 } F | t } | G | .130 | .146 | 3.30] 3.70 } pt { Gy | .100 ref | 2.54 ref | ; t | | Ss | .001 min | 0.03 min L L 1 J NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. FIGURE 2. Physical dimensions for 1N4153UR-1 (DO0-213AA).MIL SPECS 4S4E D MM 0000125 0033948 T MBNILS MIL-S-19500/337F 2. APPLICABLE DOCUMENTS 2.1 Government documents. 2.1.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2). SPECIFICATION MILITARY MIL-S-19500 - Semiconductor Devices, General Specification for. STANDARD MILITARY MIL-STD-750 - Test Methods for Semiconductor Devices. (unless otherwise indicated, copies of federal and military specifications, standards, and handbooks are available from the Standardization Document Order Desk, Building 4D, 700 Robbins Avenue, Philadelphia, PA 19120-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this document and the references cited herein (except for related associated detail specifications, specification sheets, or MS standards), the text of this document shall take precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Detail specification. The individual item requirements shall be in accordance with MIL-S-19500, and as specified herein. 3.2 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as specified im MIL-S-19500. 3.53 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-S-19500, and figures 1 and 2 herein. 3.3.1 Lead finish. Lead finish shall be solderable in accordance with MIL-STD-750, MIL-S-19500. Where a choice of lead finish is desired, it shail be specified in the acquisition document. 3.3.2 1N4153-1 construction. This device shall be constructed utilizing high temperature metatlurgically bonded double plug construction in accordance with the requirements of category I,II, or III (see MIL-S- 19500). 3.3.3 JANS constraction. JANS construction shall be metallurgically bonded, double plug, non-cavity thermally matched package. JANS metallurgical bonds are Limited to category I only in accordance with MIL-S-19500. 3.4 Marking. Marking shall be in accordance with MIL-S-19500. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection shall be in accordance with MIL-S-19500, and as specified herein.MIL SPECS 4HE D M@@ 0000125 0033969 1 MEMILS MIL-S-19500/337F 4.2 Qualification inspection. Qualification inspection shall be im accordance with MIL-S-19500, and as specified herein. 4.3 Screening (all_tevels). Screening shall be in accordance with MIL-S-19500 (table 11), and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the Limits of table I herein shall not be acceptable. |Screen (see | |table Il of | Measurement | IMIL-S-19500) | | | | JANS [JANTX and JANTXV Leveis \ JAN Level | | | | | | 3a |Temperature cycling |Temperature cycling |Temperature cycling (per | | | | [MIL-S-19500 JANTX fevel) | | | | | 3c 1/ |Thermal impedance | Thermal impedance | thermal impedance | I | (see 4.5.2) [(see 4.5.2) [(see 4.5.2) L | | | | | | 9 | Ip1 and V6 |Not applicable |Not applicable | | | | l | | | | | | 11 |Irnt ;e6 ; Alp1*# 100 percent of | Iptand VF6 | { Janitial value or 25 nA dc, | | | [whichever 1s greater; AVF6 | | | | 125 mV de change from initial value | | | | | | | | 12 |See 4.3.1 [See 4.3.1 | | | | it = 48 hours (min) | | | |Subgroups 2 and 3 |Subgroup 2 of table I | | | 13 2/ jof table I herein; |herein; A4Ipi = 100 % | | 3 |Airn1 < 100 percent of initial jof initial value or | | [value or 25 nA dc, whichever 1s }25 nA dc, whichever is | | {greater; AVe6 < 25 mV dc change \greater; AVF6 = 25 mV dc | | i |from initial value. [change from initial value. | 41/ Thermal impedance may be performed any time after temperature cycling 1s completed in screen 3. 2/ Thermal impedance does not need to be repeated in step 13 if previously done in screening. tia / PDA = 5%. 4.3.1. Power burn-in conditions. Devices shall be operated under one of the following conditions: Ta = Room ambient as defined in the general requirements of MIL-STD-750, paragraph 4.5. Condition 1: Ig = 150 mA dc, VR= 50 V (pk). Condition 2: If = 175 mA de. 4.4 Quality conformance inspection. Quality conformance inspection shall be in accordance with MIL-S-19500, and as specified herein. 4.4.1 Group A inspection. Group A inspection shall be conducted 1n accordance with MIL-S-19500, and table I herein. (End-point electrical measurements shall be in accordance with the applicable steps of table II herein.)MIL SPECS 44E D MM 0000125 0033970 & MBMILS MIL-S-19500/337F 4.4.2 Group B inspection. Group 8 inspection shalt be conducted in accordance with the conditions specified for subgroup testing in table IVa (JANS) and table IVb (JAN, JANTX, and JANTXV) of MIL-S-19500, and as follows. Electrical measurements (end points) and delta requirements shall be in accordance with the applicable steps of table II herein. 4.4.2.1 Group B inspection, table IVa (JANS) of MIL-S-19500. Subgroup Method Condition 83 4066 Not applicable. B4 1037 To = 150 mA de; Vp = 50 V (pk); Ta= 25C; ton = toff = 3 minutes minimum for 2,000 cycles. BS 1027 Ig = 150 mA dc; Vp = 50 V (pk); Ta = 125C B6 4081 ReJL at L = .375, = 250C/W, Reyec at L = 0, = 100C/W. 4.4.2.2 Group B inspection, table IVb (JAN, JANTX, and JANTXV) of MIL-S-19500. Subgroup Method Condition B3 1027 Ig = 150 mA de, VR= 50 V (pk), Ta = Room ambient as defined in the general requirements of MIL-STD-750, paragraph 4.5. B5 4081 ReJL at L = .375" = 250C/W, Reyec at L = 0, = 100C/W. 4.4.4 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in table V of MIL-S-19500, and as follows. Electrical measurements (end points) and delta requirements shall be in accordance with the applicable steps of table II herein. Subgroup Method Condition c2 2036 (Not applicable for UR suffix version devices.) Test condition A; weight = 4 lbs.; t = 15 s. Test condition E; weight = 16 oz. Hood C6 1026 Io = 150 mA dc, Vr = 50 V (pk). 4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows: 4.5.1 Pulse measurements. Conditions of pulse measurements shall be specified in paragraph 4.3.2.1 of MIL-STD-750. 4.5.2 Thermal_impedance Zesx_measurements for screening. The ZoJX measurements shall be performed in accordance with MIL-STD-750, method 3101. The maximum Limit (not to exceed the group A, subgroup 2 Limit) for ZeJx in screening (table I1 of MIL-S-19500) shall be derived by each vendor by means of statistical process control. When the process has exhibited control and capability, the capability data shall be used to establish the fixed screening Limit. In addition to screening, once a fixed Limit has beer established, monitor all future sealing lots using a random five piece sample from each lot to be plotted on the applicable X, R chart. If a lot exhibits an out of control condition, the entire Lot shall be removed from the Line and held for Engineering evaluation and disposition. a. Im measurement current - ---------+------ 1 mA ~ 10 mA. b. Iq forward heating current ------------- 300 mA (min). c. tyheating time -----------+---+----- 10 ms. d. tmp measurement delay time - ----------- 100 ys maximum.MM 0000125 0033971 T MMILS WHE D MIL SPECS MIL~S-19500/337F A_inspection. Grou TABLE 1. c > x ao vi = -|~ E - Cc JS = ~ Q oO Ee > a wo c Oo od wy - ~ Lad t CG a g e 5 wn ou 1 a = = QZ o & rd o = 4 SJ ~ ot < Qo - o ov a w c o = 9 9 eo o o o os 2 oO o ~ wa . ua wD wo CG CG ua TC yn Ye <x a Cc > > > = > > c > <= > a oO uw oO Ny oO = wo oO w us uw sO ~ wo 0 oa oO . st . wn wn nw oO OQ oO a oO oO ao mM an N Oo st st wn uw so ~ ~~ wm wn : ~ ~ o oO Qo a oO oO N ~ = e _ mn ~t uw xo - a nN ao eu =< a LL ua a ua a om @m ao ol i 3 > > > > > > > _ 7 wo ws N x Oo E ~ o ~ os B ~ oa G > = 5 cS eS 2S - oO - wx aD H 2 2 we vtes ao 3 o o a o a o e 3a CG > o & zo > Pron) < x< ov 3 o 3 of f3F"7 > = a < < ~ 6 we <x Go c - G 4 4 Ee eE 8 Q a> = o 64 oO N g oa = E a A uy > W n Oo WA Do Oo s - So w Ww it ocB - N - N - N wn + ow t i oO ~ ge ~ " " u W W " Ee a " Ei " n> Bui &, wo a we a a we a oo a <x eae <x ax ew oue ov al o al ~ _ & Lama - o> - an > > Wer ow 7 os o - - - - - oO - e) - - 7 m oO - = cc oc = = _ AN N g ND Oo 7 a So oO Oo oS Oo o oO oO oO Oo nN m wt ~t wt tr wT wT T wt wT swt st st wo 7. a Ee o vu 9 = a Dn c v c vo uv v 9 a oO Dp o Cc - ~ ~ xo c vu wo w ow v ov Sead 0 i a wo =~ - i. 7 9 N g n D D mp an DD c aa -m a ou a fo] ~~ ve w w v wv To c oO 0 oc oO % * = v a 3 > a > = ec v w oa + oa - a Oo ao 3 eo a 2 > o > a ~ = ~ ~ = =~ = > 2 cc occ c 2 a oO 3 0 o UD o Ee o oO o a Oo wo co = o o ov o oO co cw c - > > > > > > o c c Qe w vr 92 S u o - Oo = Ew w av a c ~ a ov 2 ~ ua wa uC uo] co a @ Oo 2 om = Ee a x 2 o o 2 a 2 ~a 3 fied a co ra rae o a a oa 3 ro v ew o 3 = 3 a on wn & o o 0 oO o . a4 n wv > - w o wn ad a nn a 3c X = = = = = = a oO a wy a uw 2 vo an a L au L a ew ce > o no a z 0 ao c > v a oc oO o o o a & r Oo 3 vu > - w a we aw we ae o~ no xz aj > a = See footnote at end of table.MIL SPECS 4YHE D MM 0000125 0033972 1 MEMILS MIL-S-19500/337F TABLE I. Group A_ inspection - Continued. MIL-STD-750 Limits Inspection | Symbol | Method | Conditions Min [ Max | | Subgroup 6 | I | | | | | Surge current 4066 |If = 150 mA dc; | [Ta = 25C | |lesm = 2 A(pk) | |ten 1 us surges, | | | | | | | | [1 surge/min. Electrical measurements {See table II, steps 1 and 3 Subgroup 7 | L | | i | | | | | | | | | | | Not applicable | | | | | | ! ! | | | | | | | | | | | | | | | | 1/ For sampling plan, see MIL-S-19500.MIL SPECS 44E D MM 0000125 0033973 3 MBNILS MIL-S-19500/337F TABLE II. Groups A, B, and C electrical measurements. jvalue or 25 nA dc, [whichever is greater | | | | | | | Step | Inspection MIL-STD-750 L Symbol Limits | Unit | | | | | | | | | | [Method | Conditions | [ Min | Max | | | | | | | | | | | 1. {Forward voltage | 4011 {Ip = 20 mA de IVF6 |.74 |.88 | Vde | | | | | | | | | | | 2. |Forward voltage | 4011 |I = 20 mA de [VE |.71 |.91 | Vde | | | | | | | | | | | 3 |Reverse current | 4016 |0C method; VR= 50 V de | Ip) | | 50 [nA de | | | | | | | | | | | 4. |Reverse current | 4016 |DC method; Vr = 50 V de fIe1 | }100 = |nA de | | | | | | | | | 5. [Forward current | 4011 |Ip = 20 mA de | AVE6 j= 25 mV de change | | | | | |from initial value | | | | | | | | | | | | | | | | | | 6. |Reverse current | 4016 |DC method, Vp= 50 de j{AIR1 |= 100% of initial | | | | | | | | | | | | | | | i | 1/ The electrical measurements for table IVa (JANS) of MIL-S-19500 are as follows: a. Subgroup 3, see table II herein, steps 1 and 3. b. Subgroups 4 and 5, see table II herein, steps 1, 3, 5, and 6. 2/ The electrical measurements for table Ivb (JAN, JANTX and JANTXV) of MIL-S~19500 are as follows: a. Subgroup 2, see table Il herein, steps 1 and 3. b. Subgroups 3 and 6, see table Il herein, steps 2 and 4. 3/ The electrical measurements for table V of MIL-S-19500 are as follows: a. Subgroups 2 and 3, see table II herein, steps 1 and 3. b. Subgroup 6, see table II herein, steps 1, 3, 5, and 6 (JANS); steps 2 and 4 (JAN, JANTX, and JANTXV).MIL SPECS 5. PACKAGING 5.1 Packaging requirements. 6. NOTES 44E D MM 0000125 0033974 5 MNILS MIL~S-19500/337F The requirements for packaging shall be tn accordance with MIL-S-19500. (This section contains information of a general or explanatory nature that may be helpful, but 1s not mandatory. ) 6.1 Notes. The notes specified in MIL-S-19500 are applicable to this specification. 6.2 Acquisition requirements. Acquisition documents must specify the following: a. Title, number, and date of the specification. b. Issue of DODISS to be cited in the solicitation, and if required, the specific issue of individual documents referenced (see 2.1). c. Lead finish (see 3.3.1). d. Product assurance level and type designation. 6.3 Changes from previous issue. respect to the previous issue due to the extensiveness of the changes. Custodians: Army - ER Navy - EC Air Force - 17 NASA - NA Review activities: Army - AR, MI, SM Navy - AS, CG Air Force = 19, 85, 99 OLA - ES CONCLUDING MATERIAL 10 Asterisks are not used in this revision to identify changes with Preparing activity: Navy - EC Agent: DLA - ES (Project 5961-1442)