16
Item
Moisture Test
Moisture
Resistance
Test
Temperature
Cycle
Solderability
Resistance to
Solder Heat Test
Specification
• Class (I)
No more than ±5%
or ±0.5pF
whichever is larger
• Class (II)
X7R:±10%
Y5V/Z5U:±30%
• Class (I)
C<10pF:Q>200+10xC
10≤C<30pF:Q≥275+5/2xC
C≥30pF:Q≥350
• Class (II)
X7R:DF≤5.0%
Y5V/Z5U:DF≤7.5%
1000MΩor 50ΩF,
whichever is less
• Class (I)
No more than ±7.5%
or ±0.75pF
whichever is larger
• Class (II)
X7R:±10%
Y5V/Z5U:±30%
• Class (I)
C<30pF:Q>100+100/3xC
C≥30pF:Q≥200
• Class (II)
X7R:DF≤5.0%
Y5V/Z5U:DF≤7.5%
500MΩor 25ΩF, min
whichever is less
• Class (I)
No more than ±2.5%
or ±0.25pF
whichever is larger
• Class (II)
X7R:±5%
Y5V/Z5U:±20%
To satisfy the specified
initial value.
To satisfy the specified
initial value.
Termination area shall be at
least 95% covered with a new
solder coating. There shall be no
crack and ceramic exposure of
terminated surface by melting.
• Class (I)
No more than ±2.5%
or ±0.25pF
whichever is larger
• Class (II)
X7R:±5%
Y5V/Z5U:±20%
To satisfy the specified
initial value.
To satisfy the specified
initial value.
Test Method
The capacitors shall be subjected
to 40°C, 90-95%RH for 500 hours.
After above testing condition, samples
shall be kept in room temperature for
24 hours (Class I) or 48 hours (Class II),
and then shall be measured.
Apply rated voltage at 40°C,
90-95%RH for 500 hours.
The surge current shall not exceed
50mA. After testing with above condition,
samples shall be kept in room tempera-
ture for 24 hours (Class I) or 48 hours
(Class II), and then shall be measured.
Perform 5 cycles as follow:
1. Room temperature. Dwell for 15 minutes.
2. Minimum operating temperature, dwell for
30 minutes.
3. Room temperature, dwell for 30 minutes.
4. Maximum operating temperature, dwell for
30 minutes.
After above testing condition, samples shall
be kept in room temperature for 24 hours
(Class I) or 48 hours (Class II), and then shall
be measured.
The capacitors are completely
immersed during 4±0.5 seconds
in the molten solder with a
temperature of 230±5˚C
*Solder: Sn 63.
Immerse into molten solder at
270±5˚C for 3±0.5 seconds.
Preheat before immersion.
1. 80~100˚C for 2 minutes.
2. 150~180˚C for 2 minutes.
3. 270±5˚C for 3±0.5 seconds.
The capacitance measurement
shall be made after sample
keeping at room temperature for
24 hours.
Cal-Chip Electronics, Incorporated
Multilayer Ceramic Chip Capacitors
RELIABILITY AND TEST
CONDITIONS
∆C
Q
or
DF
IR
∆C
Q
or
DF
IR
∆C
Q
or
DF
IR
∆C
Q
or
DF
IR
GMC SERIES