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1. General description
Ultra low capacitance bidirectional ElectroStatic Discharge (ESD) protection diode in a
DFN1006-2 (SOD882) leadless ultra small Surface-Mounted Device (SMD) plastic
package designed to protect one signal line from the damage caused by ESD and other
transients.
2. Features and benefits
Ultra low diode capacitance Cd = 0.35 pF
High reverse standoff voltage VRWM = 18 V
Very small voltage dependency of the capacitance
ESD protection up to ±10 kV according to IEC 61000-4-2, level 4
3. Applications
NFC antenna protection
Protection of high-speed data lines
4. Quick reference data
5. Pinning information
PESD18VF1BL
Ultra low capacitance bidirectional ESD protection diode
Rev. 1— 2 September 2013 Product data sheet
Table 1. Quick reference data
Symbol Parameter Conditions Min Typ Max Unit
Cddiode capacitance f = 1 MHz; VR= 0 V 0.28 0.35 0.5 pF
VRWM reverse standoff
voltage --18V
Table 2. Pinning information
Pin Symbol Description Simplified outline Graphic symbol
1 K1 cathode (diode 1)
DFN1006-2 (SOD882)
2 K2 cathode (diode 2)
21
Transparent
top view
sym045
21
PESD18VF1BL All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 2 September 2013 2 of 11
NXP Semiconductors PESD18VF1BL
Ultra low capacitance bidirectional ESD protection diode
6. Ordering information
7. Marking
8. Limiting values
[1] Measured from pin 1 to pin 2.
[2] Device stressed with ten non-repetitive ESD pulses.
Table 3. Ordering information
Type number Package
Name Description Version
PESD18VF1BL DFN1006-2 leadless ultra small plastic package; 2 terminals SOD882
Table 4. Marking codes
Type number Marking code
PESD18VF1BL WM
Table 5. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
IPPM peak pulse current tp = 8/20 µs; IEC 61000-4-5;
IEC 61643-321 [1] -1A
Tjjunction temperature - 150 °C
Tamb ambient temperature -55 150 °C
Tstg storage temperature -65 150 °C
ESD maximum ratings
VESD electrostatic discharge voltage IEC 61000-4-2; contact discharge [1][2] -10kV
IEC 61000-4-2; air discharge [1][2] -15kV
MIL-STD-883; human body model;
HBM [1] -10kV
machine model ; MM [1] - 400 V
PESD18VF1BL All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 2 September 2013 3 of 11
NXP Semiconductors PESD18VF1BL
Ultra low capacitance bidirectional ESD protection diode
9. Characteristics
[1] Measured from pin 1 to pin 2.
[2] Non-repetitive current pulse, Transmission Line Pulse (TLP) tp = 100 ns; square pulse; ANSI / ESD STM5.1-2008.
Fig 1. 8/20 µs pulse waveform according to
IEC 61000-4-5 and IEC 61643-321
Fig 2. ESD pulse waveform according to
IEC 61000-4-2
t (μs)
0403010 20
001aaa630
40
80
120
IPP
(%)
0
et
100 % IPP; 8 μs
50 % IPP; 20 μs
001aaa631
I
PP
100 %
90 %
t
30 ns 60 ns
10 %
t
r
= 0.7 ns to 1 ns
Table 6. Characteristics
Symbol Parameter Conditions Min Typ Max Unit
VRWM reverse standoff
voltage --18V
IRM reverse leakage
current VR= 18 V - 1 30 nA
VCL clamping voltage IPP =1A; t
p = 8/20 µs; IEC 61000-4-5;
IEC 61643-321 [1] --17V
VBR breakdown voltage IR=10mA 192224V
Cddiode capacitance f = 1 MHz; VR= 0 V 0.28 0.35 0.5 pF
Rdyn dynamic resistance IR = 10 A [2] -0.8-
PESD18VF1BL All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 2 September 2013 4 of 11
NXP Semiconductors PESD18VF1BL
Ultra low capacitance bidirectional ESD protection diode
Fig 3. ESD clamping test setup and waveforms
Fig 4. Clamped +8 kV pulse waveform (IEC 61000-4-2
network)
Fig 5. Clamped -8 kV pulse waveform (IEC 61000-4-2
network)
50 Ω
Rd
Cs
DUT
(DEVICE
UNDER
TEST)
450 Ω
RG 223/U
50 Ω coax
ESD TESTER
IEC 61000-4-2 network
Cs = 150 pF; Rd = 330 Ω
4 GHz DIGITAL
OSCILLOSCOPE
10x
ATTENUATOR
unclamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network)
0
6
2
10
V
(kV)
-2
t (ns)
-10 7030
4
8
40201005060
unclamped -8 kV ESD pulse waveform
(IEC 61000-4-2 network)
-8
-2
-6
2
V
(kV)
-10
t (ns)
-10 7030
-4
0
40201005060
aaa-003952
t (ns)
-50 50 150 250 3002001000
aaa-008158
20
60
100
VCL
(V)
-20
t (ns)
-50 50 150 250 3002001000
aaa-008159
-60
-20
20
VCL
(V)
-100
PESD18VF1BL All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 2 September 2013 5 of 11
NXP Semiconductors PESD18VF1BL
Ultra low capacitance bidirectional ESD protection diode
f = 1 MHz; VR = 0 V; Tamb = 25 °C
Fig 6. Diode capacitance as a function of reverse
voltage; typical values
Fig 7. V-I characteristics for a bidirectional ESD
protection diode
tp = 100 ns; Transmission Line Pulse (TLP)
Fig 8. Dynamic resistance
VR (V)
-20 2010-10 0
aaa-008157
0.30
0.25
0.35
0.4
Cd
(pF)
0.20
006aab325
-VCL -VBR -VRWM
VCL
VBR
VRWM
-IRM
IRM
-IR
IR
-IPP
IPP
-+
IPPM
-IPPM
PESD18VF1BL All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 2 September 2013 6 of 11
NXP Semiconductors PESD18VF1BL
Ultra low capacitance bidirectional ESD protection diode
10. Application information
The device is designed for the protection of one bidirectional data line from surge pulses
and ESD damage. The device is suitable on lines where the signal polarities are both
positive and negative with respect to ground.
Circuit board layout and protection device placement
Circuit board layout is critical for the suppression of ESD, Electrical Fast Transient (EFT)
and surge transients. The following guidelines are recommended:
1. Place the device as clos e to the input
terminal or conne cto r as possible.
2. Minimize the path length between the
device and the pr ot ec ted line .
3. Keep parallel signal paths to a
minimum.
4. Avoid running prot ec te d c on d uctors in
parallel with unprotected conductors.
5. Minimize all Printed-Circuit Board
(PCB) conductive loops including
power and ground loops.
6. Minimize the length of the transient
return path to ground.
7. Avoid using shared transient return
paths to a common ground point.
8. Use ground planes whenever
possible. For multilayer PCBs, use
ground vias.
Fig 9. Application diagram
aaa-002737
ESD protection diode
GND
line to be protected
PESD18VF1BL All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 2 September 2013 7 of 11
NXP Semiconductors PESD18VF1BL
Ultra low capacitance bidirectional ESD protection diode
11. Package outline
12. Soldering
Fig 10. Package outline DFN1006-2 (SOD882)
03-04-17Dimensions in mm
0.55
0.47
0.65
0.62
0.55
0.50
0.46
cathode marking on top side (if applicable)
1.02
0.95
0.30
0.22
0.30
0.22
2
1
Fig 11. Reflow soldering footprint for DFN1006-2 (SOD882)
solder lands
solder resist
occupied area
solder paste
sod882_fr
0.9
0.3
(2×)
R0.05 (8×)
0.6
(2×) 0.7
(2×)
0.4
(2×)
1.3
0.5
(2×)
0.8
(2×)
0.7
Dimensions in mm
PESD18VF1BL All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 2 September 2013 8 of 11
NXP Semiconductors PESD18VF1BL
Ultra low capacitance bidirectional ESD protection diode
13. Revision history
Table 7. Revision history
Data sheet ID Release date Data sheet status Change notice Supersedes
PESD18VF1BL v.1 20130902 Product data sheet - -
PESD18VF1BL All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 2 September 2013 9 of 11
NXP Semiconductors PESD18VF1BL
Ultra low capacitance bidirectional ESD protection diode
14. Legal information
14.1 Data sheet status
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term 'short data sheet' is explained in section "Definitions".
[3] The product status of device(s) de scribed in th is document may have changed since this document w as published and may differ in case of multiple devices. The latest product
status information is available on the Internet at URLhttp://www.nxp.com.
14.2 Definitions
Preview — The document is a preview version only. The document is still
subject to formal approval, which may result in modificati ons or additions.
NXP Semiconductors does not give any representations or warranti es as to
the accuracy or completeness of informati on included herein and shall have
no liability for the consequences of use of such info rmation.
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
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information included herein and shall have no liab ility for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and tit le. A short data sh eet is intended
for quick reference only and shou ld not be rel ied u pon to cont ain det ailed and
full information. For detailed and full information see the relevant full data
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data sheet shall define the specification of the product as agreed between
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customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to off er functions and qualities beyond those described in the
Product data sheet.
14.3 Disclaimers
Limited warranty and liability — Information in this document is be lieved to
be accurate and reliable. However, NXP Semiconductors does not give any
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completeness of such information and shall have no liability for the
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limitation specifications and product descriptions, at any time and without
notice. This document supersed es an d r eplaces all inf ormation supplied pri or
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Quick reference data — The Quick reference data is an extract of the
product data given in the Limiting values and Character istics sections of this
document, and as such is not complete, exhaustive or legally binding.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty tha t such application s will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and ope ration of their applications
and products using NXP Semiconductors product s, and NXP Semiconductors
accepts no liability for any assistance with applications or cust omer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suit able and fit for the custome r’s applications and
products planned, as well as fo r the planned application and use of
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NXP Semiconductors does not accept any liability related to any default ,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party customer(s). Customer is responsible for doing all necessary
testing for th e customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third part y
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanent ly and irreversibly affect
the quality and reliability of the device.
Document status[1] [2] Product status[3] Definition
Objective [short] data sheet Development This document contains data from the objective specification for product development.
Preliminary [short] dat a sheet Qualification This document contains data from the preliminary specification.
Product [short] data sheet Production This document contains the product specification.
PESD18VF1BL All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 1 — 2 September 2013 10 of 11
NXP Semiconductors PESD18VF1BL
Ultra low capacitance bidirectional ESD protection diode
Terms and conditions of commercial sale — NXP Semiconductors
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agreed in a valid written individual agreement. In case an individual
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In the event that customer uses the product for design-in and use in
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14.4 Trademarks
Notice: All referenced b rands, produc t names, service names and trademarks
are the property of their respect i ve ow ners.
Adelante,Bitport,Bitsound,CoolFlux,CoReUse,DESFire,EZ-HV,FabKey,G
reenChip,HiPerSmart,HITAG,I²C-bus
logo,ICODE,I-CODE,ITEC,Labelution,MIFARE,MIFARE Plus,MIFARE
Ultralight,MoReUse,QLPAK,Silicon
Tuner,SiliconMAX,SmartXA,STARplug,TOPFET,TrenchMOS,TriMedia
andUCODE — are trademarks of NXP B.V.
HD Radio andHD Radio logo — are trademarks of iBiquity Digital
Corporation.
15. Contact information
For more information, please visit:http://www.nxp.com
For sales office addresses, please send an email to:salesaddresses@nxp.com
NXP Semiconductors PESD18VF1BL
Ultra low capacitance bidirectional ESD protection diode
© NXP B.V. 2013. All rights reserved.
For more information, please visit: http://www.nxp.co m
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 2 September 2013
Document identifier: PESD18VF1BL
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
16. Contents
1 General description . . . . . . . . . . . . . . . . . . . . . . .1
2 Features and benefits . . . . . . . . . . . . . . . . . . . . .1
3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1
4 Quick reference data . . . . . . . . . . . . . . . . . . . . . .1
5 Pinning information. . . . . . . . . . . . . . . . . . . . . . .1
6 Ordering information . . . . . . . . . . . . . . . . . . . . . .2
7 Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2
8 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . .2
9 Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . .3
10 Application information. . . . . . . . . . . . . . . . . . . .6
11 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . .7
12 Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7
13 Revision history. . . . . . . . . . . . . . . . . . . . . . . . . .8
14 Legal information. . . . . . . . . . . . . . . . . . . . . . . . .9
14.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . . .9
14.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
14.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
14.4 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . .10
15 Contact information. . . . . . . . . . . . . . . . . . . . . .10