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ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. FOD060L, FOD260L 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Line receiver, data transmission Features Data multiplexing FOD060L in SO8 and FOD260L in 8-pin DIP Switching power supplies Very high speed - 10 MBit/s Pulse transformer replacement Superior CMR -- 50 kV/s at 1,000V peak Computer-peripheral interface Fan-out of 8 over -40C to +85C Logic gate output Description Strobable output These optocouplers consist of an AlGaAS LED, optically coupled to a very high speed integrated photo-detector logic gate. Devices include a strobable output. This output features an open collector, thereby permitting wired OR outputs. The coupled parameters are guaranteed over the temperature range of -40C to +85C. A maximum input signal of 5 mA will provide a minimum output sink current of 13 mA (fan out of 8). An internal noise shield provides superior common mode rejection of typically 50 kV/s at 1,000V common mode. Wired OR-open collector Safety and regulatory approvals - UL1577 - DIN EN/IEC 60747-5-2 Applications Ground loop elimination LSTTL to TTL, LSTTL or 5-volt CMOS Package N/C 1 8 8 VCC 8 8 1 1 + 2 1 VF _ 8 8 1 7 VE 3 N/C 4 6 VO 5 GND 1 Truth Table (Positive Logic) Input Enable Output On H H L L NC* NC* L H H H L* H* Off On Off On* Off* *Devices with pin 7 not connected. A 0.1 F bypass capacitor must be connected between pins 5 and 8. (See Note 1) (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 www.fairchildsemi.com FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers October 2011 Symbol Parameter Value Units TSTG Storage Temperature -40 to +125 C TOPR Operating Temperature -40 to +85 C EMITTER IF DC/Average Forward Input Current VE Enable Input Voltage, not to exceed VCC by more than 500 mV VR PI 50 mA VCC + 0.5V V Reverse Input Voltage 5.0 V Power Dissipation 45 mW Supply Voltage VCC (1 minute max) 7.0 V Output Current 50 mA VO Output Voltage 7.0 V PO Collector Output Power Dissipation 85 mW DETECTOR IO Recommended Operating Conditions Symbol Parameter Min. Max. Units IFL Input Current, Low Level 0 250 A IFH Input Current, High Level *6.3 15 mA VCC Supply Voltage, Output 3.0 5.5 V VEL Enable Voltage, Low Level 0 0.8 V VEH Enable Voltage, High Level 2.0 VCC V TA Operating Temperature -40 +85 C N Fan Out (TTL load) RL Output Pull-up Resistor 330 4K 8 *6.3 mA is a guard banded value which allows for at least 20% CTR degradation. Initial input current threshold value is 5.0 mA or less. (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 www.fairchildsemi.com 2 FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Absolute Maximum Ratings (No derating required up to 85C) Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only. TA = 25C and VCC = 3.3V) Individual Component Characteristics Symbol Parameter Test Conditions Min. Typ. Max. Unit 1.8 V EMITTER VF Input Forward Voltage IF = 10 mA 1.4 TA = 25C 1.75 BVR Input Reverse Breakdown Voltage IR = 10 A CIN Input Capacitance VF = 0, f = 1 MHz 6.0 pF IF = 10 mA -1.9 mV/C VF/TA Input Diode Temperature Coefficient 5.0 V DETECTOR ICCH High Level Supply Current VE = 0.5 V, IF = 0 mA, VCC = 3.3 V 3.5 7 mA ICCL Low Level Supply Current VE = 0.5 V, IF = 0 mA, VCC = 3.3 V 3.2 10 mA IEL Low Level Enable Current VCC = 3.3 V, VE = 0.5 V -1.6 mA IEH High Level Enable Current VCC = 3.3 V, VE = 2.0 V -1.6 mA VEH High Level Enable Voltage VCC = 3.3 V, IF = 10 mA VEL Low Level Enable Voltage VCC = 3.3 V, IF = 10 mA (Note 2) 2.0 1.27 1.18 V 0.8 V Switching Characteristics (TA = -40C to +85C, VCC = 3.3 V, IF = 7.5 mA unless otherwise specified. Typical value is measured at TA = 25C and VCC = 3.3V) Symbol AC Characteristics TPLH Propagation Delay Time to Output High Level TPHL Propagation Delay Time to Output Low Level |TPHL - TPLH| Pulse Width Distortion Test Conditions Min. Typ. Max. Unit RL = 350, CL = 15 pF (Fig. 9) (Note 3) 65 90 ns RL = 350, CL = 15 pF (Fig. 9) (Note 4) 43 75 ns RL = 350, CL = 15 pF (Fig. 9) 23 25 ns 40 ns Propagation Delay Skew RL = 350, CL = 15 pF (Note 5) 31 tr Output Rise Time (10-90%) RL = 350, CL = 15 pF (Fig. 9)(Note 6) 22 ns tf Output Fall Time (90-10%) RL = 350, CL = 15 pF (Fig. 12) (Note 7) 3 ns tELH Enable Propagation Delay Time to Output High Level VEH = 3 V, RL = 350, CL = 15 pF (Fig. 10) (Note 8) 47 ns tEHL Enable Propagation Delay Time to Output Low Level VEH = 3 V, RL = 350, CL = 15 pF (Fig. 10) (Note 9) 27 ns CMH Common Mode Transient Immunity (at Output High Level) RL = 350, TA =25C, IF = 0 mA, VOH (Min.) = 2.0V, |VCM| = 1,000 V (Fig. 11) (Note 10) 25,000 50,000 V/s CML Common Mode Transient Immunity (at Output Low Level) RL = 350, TA =25C, IF = 7.5 mA, VOL (Max.) = 0.8 V, |VCM| = 1,000 V (Fig. 11) (Note 11) 25,000 50,000 V/s tPSK (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 www.fairchildsemi.com 3 FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Electrical Characteristics (TA = -40C to +85C unless otherwise specified. Typical value is measured at Symbol DC Characteristics Test Conditions Min. Typ. Max. Unit IOH High Level Output Current IF = 250 A, VCC = 3.3 V, VO = 3.3 V, VE = 2.0 V (Note 2) 0.01 50 A VOL Low Level Output Voltage VCC = 3.3 V, IF = 5 mA, IOL = 13 mA, VE = 2.0 V (Note 2) 0.3 0.6 V IFT Input Threshold Current VCC = 3.3 V, VO = 0.6 V, IOL = 13 mA, VE = 2.0 V (Note 2) 1 5 mA Isolation Characteristics (TA = -40C to +85C Unless otherwise specified. Typical value is measured at TA = 25C and VCC = 3.3V) Symbol II-O VISO Characteristics Test Conditions Input-Output Insulation Leakage Current Relative humidity = 45%, TA = 25C, t = 5 s, VI-O = 3000 VDC (Note 12) Withstand Insulation Test Voltage IIO 2 A, RH < 50%, TA = 25C, t = 1 min.(Note 12) Min. 3750 FOD260L 5000 Resistance (Input to Output) VI-O = 500 V (Note 12) CI-O Capacitance (Input to Output) f = 1 MHz (Note 12) Max. Unit 1.0 A VRMS FOD060L RI-O Typ. 1012 0.6 pF Notes 1. The VCC supply to each optoisolator must be bypassed by a 0.1F capacitor or larger. This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins of each device. 2. Enable Input - No pull up resistor required as the device has an internal pull up resistor. 3. tPLH - Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse. 4. tPHL - Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse. 5. tPSK is the worst case difference between tPHL and tPLH for any devices at the stated test conditions. 6. tr - Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse. 7. tf - Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse. 8. tELH - Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input voltage pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse. 9. tEHL - Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input voltage pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse. 10. CMH - The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (i.e., VOUT > 2.0 V). Measured in volts per microsecond (V/s). 11. CML - The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state (i.e., VOUT < 0.8 V). Measured in volts per microsecond (V/s). 12. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and 8 shorted together. (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 www.fairchildsemi.com 4 FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Transfer Characteristics (TA = -40C to +85C Unless otherwise specified. Typical value is measured at TA = 25C and VCC = 3.3V) Fig. 1 Input Forward Current vs. Forward Voltage Fig. 2 Input Threshold Current vs. Ambient Temperature 2.5 100 ITH - Input Threshold Current (mA) VCC = 3.3V VO = 0.6V I F - Forward Current (mA) 10 TA = 100C 1 TA = -40C TA = 85C 0.1 TA = 0C TA = 25C 0.01 0.001 0.8 0.9 1.0 1.1 1.2 1.3 1.4 1.5 1.6 2.0 1.5 FOD060L RL = 350, 1k, 4k 1.0 FOD260L RL = 350, 1k, 4k 0.5 0.0 -40 1.7 -20 VF - Forward Voltage (V) 0.6 40 60 80 100 20 CC = 3.3V I OH - High Level Output Current (nA) V VOL - Low Level Output Voltage (V) 20 Fig. 4 High Level Output Current vs. Ambient Temperature Fig. 3 Low Level Output Voltage vs. Ambient Temperature VE = 2V IF = 5mA IO = 13mA 0.5 0.4 0.3 0.2 0.1 -40 -20 0 20 40 60 80 16 12 8 4 VO = VCC = 3.3V VE = 2V IF = 250 A 0 -40 0.0 100 -20 TA - Ambient Temperature (C) 35 30 V CC 40 60 80 100 80 = 3.3V V VE = 2V VOL = 0.6V IF = 5mA 20 15 10 CC = 3.3V IF = 7.5mA 70 25 RL = 350 tPLH - FOD060L tPLH - FOD260L 60 50 40 tPHL - FOD060L tPHL - FOD260L 30 5 0 -40 20 Fig. 6 Propagation Delay vs. Ambient Temperature tP - Propagation Delay (ns) 40 0 TA - Ambient Temperature (C) Fig. 5 Low Level Output Current vs. Ambient Temperature IOL - Low Level Output Current (mA) 0 TA - Ambient Temperature (C) 20 -20 0 20 40 60 80 100 -40 TA - Ambient Temperature (C) (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 -20 0 20 40 60 80 TA - Ambient Temperature (C) 100 www.fairchildsemi.com 5 FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Typical Performance Curves Fig. 7 Rise and Fall Times vs. Ambient Temperature Fig. 8 Pulse Width Distortion vs. Ambient Temperature 30 35 V = 3.3V V IF = 7.5mA PWD - Pulse Width Distortion (ns) tr, tf, - Rise, Fall Time (ns) 30 CC RL = 350 25 tr 20 15 10 5 25 CC = 3.3V IF = 7.5mA RL = 350 20 FOD260L 15 FOD060L 10 5 tf 0 -40 -20 0 20 40 60 80 0 -40 100 TA - Ambient Temperature (C) (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 -20 0 20 40 60 80 100 TA - Ambient Temperature (C) www.fairchildsemi.com 6 FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Typical Performance Curves I F = 7.5 mA +3.3V 1 Input Monitor (IF) t PHL 8 2 7 3 6 4 5 0.1F Bypass tPLH Output (VO ) RL 1.5 V Output (VO) CL 47 I F = 3.75 mA Input (I F) VCC 90% Output (VO ) GND 10% tf tr Fig. 9 Test Circuit and Waveforms for tPLH, tPHL, tr and tf. Pulse Generator tr = 5ns Z O = 50 Input Monitor (V E) +3.3V 3.0 V Input (VE ) VCC 1 8 1.5 V t EHL 7.5 mA 7 2 RL 0.1F bypass 1.5 V Output (VO ) 6 3 t ELH Output (VO ) CL 4 GND 5 Fig. 10 Test Circuit tEHL and tELH. (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 www.fairchildsemi.com 7 FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Pulse Gen. tf = tr = 5 ns ZO = 50 IF A 8 2 7 3 6 +3.3V 0.1f bypass 350 B VFF 4 GND Output (VO) 5 VCM Pulse Gen VCM 0V Peak CM H 3.3V Switching Pos. (A), IF = 0 VO VO (Min) VO (Max) Switching Pos. (B), IF = 7.5 mA VO 0.5 V CM L Fig. 11 Test Circuit Common Mode Transient Immunity (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 www.fairchildsemi.com 8 FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers VCC 1 Part Number Package Packing Method FOD060L Small outline 8-pin Tube (50 units per tube) FOD060LR2 Small outline 8-pin Tape and Reel (2.500 units per reel) FOD260L DIP 8-Pin Tube (50 units per tube) FOD260LS SMT 8-Pin (Lead Bend) Tube (50 units per tube) FOD260LSD SMT 8-Pin (Lead Bend) Tape and Reel (1,000 units per reel) FOD260LV DIP 8-Pin, DIN EN/IEC 60747-5-2 option Tube (50 units per tube) FOD260LSV SMT 8-Pin (Lead Bend), DIN EN/IEC 60747-5-2 option Tube (50 units per tube) FOD260LSDV SMT 8-Pin (Lead Bend), DIN EN/IEC 60747-5-2 option Tape and Reel (1,000 units per reel) FOD260LTV DIP 8-Pin, 0.4" Lead Spacing, DIN EN/IEC 60747-5-2 option Tube (50 units per tube) FOD260LTSV SMT 8-Pin, 0.4" Lead Spacing, DIN EN/IEC 60747-5-2 option Tube (50 units per tube) FOD260LTSR2 SMT 8-Pin, 0.4" Lead Spacing Tape and Reel (700 units per reel) FOD260LTSR2V SMT 8-Pin, 0.4" Lead Spacing, DIN EN/IEC 60747-5-2 option Tape and Reel (700 units per reel) Marking Information Small Outline 1 060L X YY S1 3 2 5 4 Definitions 1 Fairchild logo 2 Device number 3 One digit year code, e.g., `8' 4 Two digit work week ranging from `01' to `53' 5 Assembly package code (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 www.fairchildsemi.com 9 FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Ordering Information FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Marking Information (Continued) DIP and SMT 1 260L XX YY B V 3 2 6 5 4 Definitions 1 Fairchild logo 2 Device number 3 VDE mark (Note: Only appears on parts ordered with DIN EN/IEC 60747-5-2 option - See order entry table) 4 Two digit year code, e.g., `11' 5 Two digit work week ranging from `01' to `53' 6 Assembly package code (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 www.fairchildsemi.com 10 Small Outline 8.0 0.10 3.50 0.20 2.0 0.05 0.30 MAX O1.5 MIN 4.0 0.10 1.75 0.10 5.5 0.05 12.0 0.3 8.3 0.10 5.20 0.20 0.1 MAX O1.5 0.1/-0 6.40 0.20 User Direction of Feed Note: All dimensions are in millimeters. (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 www.fairchildsemi.com 11 FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Carrier Tape Specification Option S D0 P0 t K0 P2 E F A0 W1 d t P User Direction of Feed Symbol W W B0 Description D1 Dimension in mm Tape Width 16.0 0.3 Tape Thickness 0.30 0.05 P0 Sprocket Hole Pitch 4.0 0.1 D0 Sprocket Hole Diameter 1.55 0.05 E Sprocket Hole Location 1.75 0.10 F Pocket Location 7.5 0.1 2.0 0.1 P2 P Pocket Pitch A0 Pocket Dimensions 12.0 0.1 10.30 0.20 B0 10.30 0.20 K0 4.90 0.20 W1 d R (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 Cover Tape Width 13.2 0.2 Cover Tape Thickness 0.1 max Max. Component Rotation or Tilt 10 Min. Bending Radius 30 www.fairchildsemi.com 12 FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Carrier Tape Specification (Continued) Option TS D0 P0 t K0 P2 E F A0 W1 d t P User Direction of Feed Symbol W W B0 Description D1 Dimension in mm Tape Width 24.0 0.3 Tape Thickness 0.40 0.1 P0 Sprocket Hole Pitch D0 Sprocket Hole Diameter 1.55 0.05 4.0 0.1 E Sprocket Hole Location 1.75 0.10 F Pocket Location 11.5 0.1 P Pocket Pitch 16.0 0.1 A0 Pocket Dimensions 12.80 0.1 2.0 0.1 P2 10.35 0.1 B0 5.7 0.1 K0 W1 d R (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 Cover Tape Width 21.0 0.1 Cover Tape Thickness 0.1 max Max. Component Rotation or Tilt 10 Min. Bending Radius 30 www.fairchildsemi.com 13 FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Carrier Tape Specification (Continued) FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Reflow Profile Small Outline 300 260C 280 260 >245C = 42 Sec 240 220 200 180 Temperature (C) 160 Time above 140 183C = 90 Sec 120 1.822C/Sec Ramp up rate 100 80 60 40 33 Sec 20 0 0 60 120 180 270 360 Time (s) (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 www.fairchildsemi.com 14 FOD060L, FOD260L -- 3.3V/5V High Speed-10 MBit/s Logic Gate Optocouplers Reflow Profile (Continued) DIP and SMT Temperature (C) TP 260 240 TL 220 200 180 160 140 120 100 80 60 40 20 0 Max. Ramp-up Rate = 3C/S Max. Ramp-down Rate = 6C/S tP Tsmax tL Preheat Area Tsmin ts 120 240 360 Time 25C to Peak Time (seconds) Profile Freature Pb-Free Assembly Profile Temperature Min. (Tsmin) 150C Temperature Max. (Tsmax) 200C Time (tS) from (Tsmin to Tsmax) 60-120 seconds Ramp-up Rate (tL to tP) 3C/second max. Liquidous Temperature (TL) 217C Time (tL) Maintained Above (TL) 60-150 seconds Peak Body Package Temperature 260C +0C / -5C Time (tP) within 5C of 260C 30 seconds Ramp-down Rate (TP to TL) 6C/second max. Time 25C to Peak Temperature (c)2008 Fairchild Semiconductor Corporation FOD060L, FOD260L Rev. 1.0.5 8 minutes max. www.fairchildsemi.com 15 ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor's product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. "Typical" parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including "Typicals" must be validated for each customer application by customer's technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. 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