REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with N.O.R. 5962-R003-93. 92-11-25 M. A. FRYE B Drawing updated to reflect current requirements. Redrawn. - ro 06-12-11 R. MONNIN THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY RICK C. OFFICER STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http://www.dscc.dla.mil CHECKED BY CHARLES E. BESORE APPROVED BY MICHAEL A. FRYE DRAWING APPROVAL DATE 91-08-16 REVISION LEVEL B MICROCIRCUIT, LINEAR, HIGH SPEED, PRECISION, JFET, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON SIZE CAGE CODE A 67268 SHEET DSCC FORM 2233 APR 97 1 OF 5962-89976 10 5962-E097-07 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89976 01 G X Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number 01 02 03 04 Circuit function LT1055A LT1056A LT1055 LT1056 High speed precision JFET operational amplifier High speed precision JFET operational amplifier High speed precision JFET operational amplifier High speed precision JFET operational amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator G MACY1-X8 Terminals Package style 8 Can 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VS) ........................................................................................ 20 V dc Differential input voltage (VID) ........................................................................ 40 V dc Input voltage (VIN) .......................................................................................... Output short circuit duration ............................................................................ Power dissipation (PD) .................................................................................... Storage temperature range ............................................................................. Lead temperature (soldering, 10 seconds) ..................................................... Junction temperature (TJ) ............................................................................... 20 V dc Indefinite 500 mW -65C to +150C +300C +150C Thermal resistance, junction-to-case (JC) ..................................................... See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) ................................................ 150C/W 1.4 Recommended operating conditions. Supply voltage (VS) ........................................................................................ 15 V dc Common mode voltage (VCM) ........................................................................ 0 V Operating ambient temperature range (TA) .................................................... -55C to +125C STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89976 A REVISION LEVEL B SHEET 2 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 MIL-HDBK-780 - List of Standard Microcircuit Drawings. Standard Microcircuit Drawings. (Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for nonJAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MILPRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MILPRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device. 3.5.1 Certification/compliance mark. A compliance indicator "C" shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator "C" shall be replaced with a "Q" or "QML" certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89976 A REVISION LEVEL B SHEET 3 TABLE I. Electrical performance characteristics. Test Conditions -55C TA +125C Symbol Group A subgroups VS = 15 V, VCM = 0 V Device type Limits unless otherwise specified Input voltage range 1 VIN Min Max -11.0 11.0 -10.5 10.5 -150 150 -500 500 -180 180 -550 550 -400 400 -1200 1200 -450 450 -1250 1250 01,02 -4.0 4.0 03,04 -8.0 8.0 01 -10 10 pA -1.2 1.2 nA -10 10 pA -1.5 1.5 nA -20 20 pA -1.8 1.8 nA -20 20 pA -2.4 2.4 nA -50 50 pA -2.5 2.5 nA -50 50 pA -3.0 3.0 nA 01 2,3 Input offset voltage VIO 1/ 4 01 2,3 4 02 2,3 4 03 2,3 4 04 2,3 Average temperature coefficient of input offset voltage VIO / Input offset current IIO 2/ 3/ 2,3 T 1/ 1 2 1 02 2 1 03 2 1 04 2 Input bias current IIB 1/ 1 01 2 1 Unit 02 2 V V V/C See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89976 A REVISION LEVEL B SHEET 4 TABLE I. Electrical performance characteristics - Continued. Test Conditions -55C TA +125C Symbol Group A subgroups VS = 15 V, VCM = 0 V Device type unless otherwise specified Input bias current IIB 1/ 1 Max -50 50 pA -4.0 4.0 nA -50 50 pA -5.0 5.0 nA 01,02 100 pA 03,04 150 03 04 2 1 VCM = +10 V Common mode rejection ratio CMRR 1 VCM = 11 V 1 VCM = 11 V Supply current PSRR VS = 10 V to 18 V 1 VS = 10 V to 17 V 2,3 VS = 10 V to 18 V 1 VS = 10 V to 17 V 2,3 1 IS 03,04 01,02 03,04 90 dB 88 86 01 4.0 mA 14.0 02 6.5 14.0 03 4.0 2,3 1 83 88 2,3 1 dB 82 2,3 1 86 85 2,3 VCM = 10.5 V Power supply rejection ratio 01,02 2,3 VCM = 10.5 V Unit Min 2 1 Limits 14.0 04 7.0 2,3 14.0 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89976 A REVISION LEVEL B SHEET 5 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C Group A subgroups VS = 15 V, VCM = 0 V Device type unless otherwise specified Large signal voltage gain 4/ AVOL Min 4 RL = 2 k, VO = 10 V 01 RL = 2 k, VO = 10 V 5,6 V/mV RL = 2 k, VO = 10 V 4 40 02 150 130 RL = 2 k, VO = 10 V 5,6 RL = 2 k, VO = 10 V 4 40 03 120 100 RL = 1 k, VO = 10 V RL = 2 k, VO = 10 V 5,6 RL = 2 k, VO = 10 V 4 35 04 120 100 RL = 1 k, VO = 10 V 5,6 RL = 2 k, VO = 10 V 35 Output voltage swing VOUT RL = 2 k 4,5,6 All Input noise 2/ 4/ 5/ current density IN fO = 10 Hz 7 All -12 fO = 1 kHz EN Max 130 RL = 1 k, VO = 10 V 2/ 6/ Unit 150 RL = 1 k, VO = 10 V Input noise voltage density Limits 7 fO = 10 Hz 01,02 fO = 1 kHz 03,04 fO = 10 Hz 12 V 4.0 fA / 4.0 Hz 65 nV / 20 Hz 60 22 fO = 1 kHz See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89976 A REVISION LEVEL B SHEET 6 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C Group A subgroups VS = 15 V, VCM = 0 V Device type Limits unless otherwise specified Slew rate 2/ SR Min 7,8b RL = 2 k minimum, 01 7,8b VIN = 2 V, measured at -7 V and +7 V 02 12.0 6.0 03 7.5 8a 7,8b V/s 5.0 8a 7,8b Max 10.0 8a CL = 100 pF, AV = +5, Unit 3.5 04 9.0 8a 4.0 1/ Offset voltage is measured under two different conditions. The first, approximately 0.5 seconds after application of power. The second, at TA = +25C only, with the chip heated to approximately 38C for devices 01 and 03, and 45C for devices 02 and 04, to account for chip temperature rise when the device is fully warmed up. IIO and IIB are measured fully warmed up also. 2/ If not tested, shall be guaranteed to the limits specified in table I herein. 3/ Offset voltage drift with temperature is practically unchanged when the offset voltage is trimmed to zero with a 100 k potentiometer between the balance terminals and the wiper tied to VS+. 4/ fO symbolizes output frequency and VO symbolizes output voltage. 5/ Current noise is calculated using the formula: IN = ( 2 x q x IIB ) x 1/2 where q = 1.6 x 10 The noise of source resistors up to 1 G swamps the contribution of current noise. 6/ Input noise voltage density at fO = 10 Hz is sample tested on every lot to a sample size series number of 15. -19 coulomb. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89976 A REVISION LEVEL B SHEET 7 Device types 01, 02, 03, and 04 Case outline G Terminal number Terminal symbol 1 BALANCE 2 INPUT- 3 INPUT+ 4 VS- 5 BALANCE 6 OUT 7 VS+ 8 NC NC = No connection FIGURE 1. Terminal connections. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89976 A REVISION LEVEL B SHEET 8 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition C. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition C. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA = +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89976 A REVISION LEVEL B SHEET 9 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Interim electrical parameters (method 5004) Final electrical test parameters (method 5004) Group A test requirements (method 5005) Groups C and D end-point electrical parameters (method 5005) Subgroups (in accordance with MIL-STD-883, method 5005, table I) --1*, 2, 3, 4, 5, 6, 7 1, 2, 3, 4, 5, 6, 7, 8a, 8b 1 * PDA applies to subgroup 1. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. 6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-0547. 6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MILHDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DSCC-VA. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-89976 A REVISION LEVEL B SHEET 10 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 06-12-11 Approved sources of supply for SMD 5962-89976 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DSCC maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/. Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-8997601GA 3/ LT1055AMH/883 5962-8997602GA 3/ LT1056AMH/883 5962-8997603GA 3/ LT1055MH/883 5962-8997604GA 3/ LT1056MH/883 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. 3/ Not available from an approved source of supply. The last known supplier is listed below. Vendor CAGE number 64155 Vendor name and address Linear Technology Corporation 720 Sycamore Drive Milpitas, CA 95035 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.