5962-8997602GA - ANALOG DEVICES

REVISIONS

LTR DESCRIPTION DATE (YR-MO-DA) APPROVED

A Changes in accordance with N.O.R. 5962-R003-93. 92-11-25 M. A. FRYE

B Drawing updated to reflect current requirements. Redrawn. - ro 06-12-11 R. MONNIN

THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.

REV

SHEET

REV

SHEET

REV STATUS REV B B B B B B B B B B

OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10

PMIC N/A PREPARED BY

RICK C. OFFICER

DEFENSE SUPPLY CENTER COLUMBUS

STANDARD

MICROCIRCUIT

DRAWING

CHECKED BY

CHARLES E. BESORE

COLUMBUS, OHIO 43218-3990

http://www.dscc.dla.mil

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

DEPARTMENTS

APPROVED BY

MICHAEL A. FRYE

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

DRAWING APPROVAL DATE

91-08-16

MICROCIRCUIT, LINEAR, HIGH SPEED,

PRECISION, JFET, OPERATIONAL AMPLIFIER,

MONOLITHIC SILICON

AMSC N/A

REVISION LEVEL

B SIZE

A CAGE CODE

67268

5962-89976

SHEET

1 OF

DSCC FORM 2233

APR 97 5962-E097-07

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-89976

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

B SHEET 2

DSCC FORM 2234

APR 97

1. SCOPE

1.1 Scope. T his drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in

accordance with MIL-PRF-38535, appendix A.

1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:

5962-89976 01 G X

Drawing number Device type

(see 1.2.1) Case outline

(see 1.2.2) Lead finish

(see 1.2.3)

1.2.1 Device type(s). The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function

01 LT1055A High speed precision JFET operational amplifier

02 LT1056A High speed precision JFET operational amplifier

03 LT1055 High speed precision JFET operational amplifier

04 LT1056 High speed precision JFET operational amplifier

1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style

G MACY1-X8 8 Can

1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A.

1.3 Absolute maximum ratings.

Supply voltage (VS) ........................................................................................ ±20 V dc

Differential input voltage (VID) ........................................................................ ± 40 V dc

Input voltage (VIN) .......................................................................................... ±20 V dc

Output short circuit duration ............................................................................ Indefinite

Power dissipation (PD) .................................................................................... 500 mW

Storage temperature range ............................................................................. -65°C to +150°C

Lead temperature (soldering, 10 seconds) ..................................................... +300°C

Junction temperature (TJ) ............................................................................... +150°C

Thermal resistance, junction-to-case (θJC) ..................................................... See MIL-STD-1835

Thermal resistance, junction-to-ambient (θJA) ................................................ 150°C/W

1.4 Recommended operating conditions.

Supply voltage (VS) ........................................................................................ ±15 V dc

Common mode voltage (VCM) ........................................................................ 0 V

Operating ambient temperature range (TA) .................................................... -55°C to +125°C

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-89976

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

B SHEET 3

DSCC FORM 2234

APR 97

2. APPLICABLE DOCUMENT S

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part

of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the

solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICAT ION

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

DEPARTMENT OF DEFENSE ST ANDARDS

MIL-STD-883 - Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

DEPARTMENT OF DEFENSE HANDBOOKS

MIL-HDBK-103 - List of Standard Microcircuit Drawings.

MIL-HDBK-780 - Standard Microcircuit Drawings.

(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or

from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-

JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer

Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-

PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying

activity approval in accordance with MIL-PRF -38535. This QML flow as documented in the Quality Management (QM) plan

may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device.

These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MIL-

PRF-38535 is required to identify when the QML flow option is used.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38535, appendix A and herein.

3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.

3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are

as specified in table I and shall apply over the full ambient operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical

tests for each subgroup are described in table I.

3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed

in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN

number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device.

3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance

to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in

accordance with MIL-PRF-38535 to identify when the QML flow option is used.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-89976

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

B SHEET 4

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics.

Test

Symbol

Conditions

-55°C ≤ TA ≤ +125°C

VS = ±15 V, VCM = 0 V

Group A

subgroups

Device

type

Limits Unit

unless otherwise specified Min Max

Input voltage range VIN 1 01 -11.0 11.0 V

2,3 -10.5 10.5

Input offset voltage VIO 1/ 4 01 -150 150

µV

2,3 -500 500

4 02 -180 180

2,3 -550 550

4 03 -400 400

2,3 -1200 1200

4 04 -450 450

2,3 -1250 1250

∆VIO / 2/ 3/ 2,3 01,02 -4.0 4.0

µV/°C

Average temperature

coefficient of

input offset voltage ∆T 03,04 -8.0 8.0

Input offset current IIO 1/ 1 01 -10 10 pA

2 -1.2 1.2 nA

1 02 -10 10 pA

2 -1.5 1.5 nA

1 03 -20 20 pA

2 -1.8 1.8 nA

1 04 -20 20 pA

2 -2.4 2.4 nA

Input bias current IIB 1/ 1 01 -50 50 pA

2 -2.5 2.5 nA

1 02 -50 50 pA

2 -3.0 3.0 nA

See footnotes at end of table.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-89976

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

B SHEET 5

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics – Continued.

Test

Symbol

Conditions

-55°C ≤ TA ≤ +125°C

VS = ±15 V, VCM = 0 V

Group A

subgroups

Device

type

Limits Unit

unless otherwise specified Min Max

Input bias current IIB 1/ 1 03 -50 50 pA

2 -4.0 4.0 nA

1 04 -50 50 pA

2 -5.0 5.0 nA

VCM = +10 V 1 01,02 100 pA

03,04 150

CMRR VCM = ±11 V 1 01,02 86 dB

Common mode rejection

ratio VCM = ±10.5 V 2,3 85

VCM = ±11 V 1 03,04 83

VCM = ±10.5 V 2,3 82

PSRR VS = ±10 V to ±18 V 1 01,02 90 dB

Power supply rejection

ratio VS = ±10 V to ±17 V 2,3 88

VS = ±10 V to ±18 V 1 03,04 88

VS = ±10 V to ±17 V 2,3 86

Supply current IS 1 01 4.0 mA

2,3 14.0

1 02 6.5

2,3 14.0

1 03 4.0

2,3 14.0

1 04 7.0

2,3 14.0

See footnotes at end of table.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-89976

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

B SHEET 6

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics – Continued.

Test

Symbol

Conditions

-55°C ≤ TA ≤ +125°C

VS = ±15 V, VCM = 0 V

Group A

subgroups

Device

type

Limits Unit

unless otherwise specified Min Max

AVOL R

L = 2 kΩ, VO = ±10 V 4 01 150 V/mV

Large signal voltage 4/

gain RL = 1 kΩ, VO = ±10 V 130

RL = 2 kΩ, VO = ±10 V 5,6 40

RL = 2 kΩ, VO = ±10 V 4 02 150

RL = 1 kΩ, VO = ±10 V 130

RL = 2 kΩ, VO = ±10 V 5,6 40

RL = 2 kΩ, VO = ±10 V 4 03 120

RL = 1 kΩ, VO = ±10 V 100

RL = 2 kΩ, VO = ±10 V 5,6 35

RL = 2 kΩ, VO = ±10 V 4 04 120

RL = 1 kΩ, VO = ±10 V 100

RL = 2 kΩ, VO = ±10 V 5,6 35

Output voltage swing VOUT R

L = 2 kΩ 4,5,6 All -12 12 V

IN f

O = 10 Hz 7 All 4.0 fA /

Input noise 2/ 4/ 5/

current density fO = 1 kHz 4.0

EN f

O = 10 Hz 7 01,02 65 nV /

Input noise voltage 2/ 6/

density fO = 1 kHz 20

fO = 10 Hz 03,04 60

fO = 1 kHz 22

See footnotes at end of table.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-89976

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

B SHEET 7

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics – Continued.

Test

Symbol

Conditions

-55°C ≤ TA ≤ +125°C

VS = ±15 V, VCM = 0 V

Group A

subgroups

Device

type

Limits Unit

unless otherwise specified Min Max

Slew rate 2/ SR

RL = 2 kΩ minimum, 7,8b 01 10.0

V/µs

CL = 100 pF, AV = +5, 8a 5.0

VIN = ±2 V, measured at 7,8b 02 12.0

-7 V and +7 V 8a 6.0

7,8b 03 7.5

8a 3.5

7,8b 04 9.0

8a 4.0

1/ Offset voltage is measured under two different conditions. The first, approximately 0.5 seconds after application of power.

The second, at TA = +25°C only, with the chip heated to approximately 38°C for devices 01 and 03, and 45°C for devices

02 and 04, to account for chip temperature rise when the device is fully warmed up.

IO and IIB are measured fully warmed up also.

2/ If not tested, shall be guaranteed to the limits specified in table I herein.

3/ Offset voltage drift with temperature is practically unchanged when the offset voltage is trimmed to zero with a 100 kΩ

potentiometer between the balance terminals and the wiper tied to VS+.

4/ fO symbolizes output frequency and VO symbolizes output voltage.

5/ Current noise is calculated using the formula: IN = ( 2 x q x IIB ) x 1/2 where q = 1.6 x 10-19 coulomb.

The noise of source resistors up to 1 GΩ swamps the contribution of current noise.

6/ Input noise voltage density at fO = 10 Hz is sample tested on every lot to a sample size series number of 15.

3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an

approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to

listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535,

appendix A and the requirements herein.

3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided

with each lot of microcircuits delivered to this drawing.

3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing.

3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's

facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the

reviewer.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-89976

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

B SHEET 8

DSCC FORM 2234

APR 97

Device types 01, 02, 03, and 04

Case outline G

Terminal

number Terminal symbol

1 BALANCE

2 INPUT-

3 INPUT+

4 VS-

5 BALANCE

6 OUT

7 VS+

8 NC

NC = No connection

FIGURE 1. Terminal connections.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-89976

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

B SHEET 9

DSCC FORM 2234

APR 97

4. VERIFICAT ION

4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,

appendix A.

4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices

prior to quality conformance inspection. The following additional criteria shall apply:

a. Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition C. The test circuit shall be maintained by the manufacturer under document revision level control

and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015

of MIL-STD-883.

(2) TA = +125°C, minimum.

b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter

tests prior to burn-in are optional at the discretion of the manufacturer.

4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-

883 including groups A, B, C, and D inspections. The following additional criteria shall apply.

4.3.1 Group A inspection.

a. Tests shall be as specified in table II herein.

b. Subgroups 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.

4.3.2 Groups C and D inspections.

a. End-point electrical parameters shall be as specified in table II herein.

b. Steady-state life test conditions, method 1005 of MIL-STD-883.

(1) Test condition C. The test circuit shall be maintained by the manufacturer under document revision level control

and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method

1005 of MIL-STD-883.

(2) TA = +125°C, minimum.

(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

STANDARD

MICROCIRCUIT DRAWING

SIZE

5962-89976

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

B SHEET 10

DSCC FORM 2234

APR 97

TABLE II. Electrical test requirements.

MIL-STD-883 test requirements Subgroups

(in accordance with

MIL-STD-883, method 5005,

table I)

Interim electrical parameters

(method 5004) ---

Final electrical test parameters

(method 5004) 1*, 2, 3, 4, 5, 6, 7

Group A test requirements

(method 5005) 1, 2, 3, 4, 5, 6, 7, 8a, 8b

Groups C and D end-point

electrical parameters

(method 5005)

* PDA applies to subgroup 1.

5. PACKAGING

5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.

6. NOTES

6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications

(original equipment), design applications, and logistics purposes.

6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-

prepared specification or drawing.

6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for

the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.

6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system

application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be

used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC

5962) should contact DSCC-VA, telephone (614) 692-0544.

6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone

(614) 692-0547.

6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-

HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by

DSCC-VA.

STANDARD MICROCIRCUIT DRAWING BULLETIN

DATE: 06-12-11

Approved sources of supply for SMD 5962-89976 are listed below for immediate acquisition information only and shall

be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised

to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate

of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next

dated revision of MIL-HDBK-103 and QML-38535. DSCC maintains an online database of all current sources of

supply at http://www.dscc.dla.mil/Programs/Smcr/.

Standard

microcircuit drawing

PIN 1/

Vendor

CAGE

number

Vendor

similar

PIN 2/

5962-8997601GA 3/ LT1055AMH/883

5962-8997602GA 3/ LT1056AMH/883

5962-8997603GA 3/ LT1055MH/883

5962-8997604GA 3/ LT1056MH/883

1/ The lead finish shown for each PIN representing

a hermetic package is the most readily available

from the manufacturer listed for that part. If the

desired lead finish is not listed contact the vendor

to determine its availability.

2/ Caution. Do not use this number for item

acquisition. Items acquired to this number may not

satisfy the performance requirements of this drawing.

3/ Not available from an approved source of supply.

The last known supplier is listed below.

Vendor CAGE Vendor name

number and address

64155 Linear Technology Corporation

720 Sycamore Drive

Milpitas, CA 95035

The information contained herein is disseminated for convenience only and the

Government assumes no liability whatsoever for any inaccuracies in the

information bulletin.