GFD1300-550
1300 nm InGaAs PIN Photodiode
TYP
MIN
(TÙ = 25¡C unless otherwise stated)
UNITS TEST CONDITIONSPARAMETER SYMBOL MAX
ELECTRO-OPTICAL CHARACTERISTICS
êæ = 1300 nm
P² = 1
WSensitivit
R mV/
W6
VÏÙ = -5V
êæ = 1300 nm
VÏÙ = -5VIn
ut Power ran
e for 10ø× BER at 50 Mbit/s dBm-35 -10
In
ut Power ran
e for 10ø× BER at 100 Mbit/s -32 -10
VÙÙ = -5 VPower Su
l
Current IÙÙ mA510
êæ = 1300 nm
VÏÙ = -5VBandwidth f MHZ100
Ran
e of s
ectral sensitivit
êæ nm1200 1300 1600
Transim
edance k ì81012
Differential out
ut im
edance ì300 500
Photodiode res
onsivit
Rΰ A/W0.75
Photodiode dark cuurent I°/ΰ nA5
Photodiode ca
acitance Cΰ
f1
ABSOLUTE MAXIMUM RATINGS
(Tcase = 25¡C unless otherwise noted)
-7VSupply voltage
-4.75 to -5.46 VSupply voltage (VÙÙ - Våå)
-40 to +85¡CStorage temperature
-20 to +70¡COperating temperature
260¡C, 10 s, 2 mm
from core
Lead solder temperature
Stresses greater than those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods of time may affect
reliability.
Honeywell reserves the right to make
changes in order to improve design and
supply the best products possible.
514 h