DM74S00M - Fairchild Semiconductor

August 1986

Revised May 2000

DM74S00 Quad 2-Input NAND Gate

DM74S00

Quad 2-Input NAND Gate

General Description

This device cont ai ns fo ur indep en den t ga tes ea ch of w hich

performs the logi c NA ND functi on .

Ordering Code:

Devices also available in Tape and R eel. Speci fy by append ing the suffix let t er “X” to the o rdering c ode.

Connection Diagram Function Table

Y = AB

H = HIGH Lo gic Level

L = LOW Logic L ev el

Order Number Package Number Package Description

DM74S00M M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow

DM74S00N N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

Inputs Output

ABY

LLH

LHH

HLH

HHL

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DM74S00

Absolute Maximum Ratings(Note 1) Note 1: The “Absolute Maximum Ratings” are those values beyond which

the saf ety of the device cannot be gu aranteed. Th e device shoul d not be

operated at these limits. The parametric values defined in the Electrical

Characteristics tables are not guaranteed at the absolute maximum ratings.

The “R ecomm ended Oper ating Co ndition s” table will def ine the condit ions

for actu al device operation.

Recommended Operating Conditions

Electrical Characteristics

over recommended operating free air temperature range (unless otherwise noted)

Switching Characteri stics

at VCC = 5V and TA = 25°C (See Section 1 for Test Waveforms and Output Load)

Note 2: All typical s are at VCC = 5V, TA = 25°C.

Note 3: Not more tha n one out put shoul d be shorte d at a t im e and the duration s hould not ex c eed one s ec ond.

Supply Voltage 7V

Input Voltag e 5.5 V

Operating Free Air Temperature Range 0°C to +70°C

Storage Temperature Range −65°C to +150°C

Symbol Parameter Min Nom Max Units

VCC Supply Voltage 4.75 5 5.25 V

VIH HIGH Level Input Voltage 2 V

VIL LOW Level Input Voltage 0.8 V

IOH HIGH Level Output Current −1mA

IOL LOW Level Output Current 20 mA

TAFree Air Ope rat ing Tem per atu re 0 70 °C

Symbol Parameter Conditions Min Typ Max Units

(Note 2)

VIInput Clamp Voltage VCC = Min, II = −18 mA −1.2 V

VOH HIGH Level VCC = Min, IOH = Max 2.7 3.4 V

Output Voltage VIL = Max

VOL LOW Level VCC = Min, IOL = Max 0.5 V

Output Voltage VIH = Min

IIInput Current @ Max Input Voltage VCC = Max, VI = 5.5V 1 mA

IIH HIGH Level Input Current VCC = Max, VI = 2.7V 50 µA

IIL LOW Level Input Current VCC = Max, VI = 0.5V −2mA

IOS Short Circuit Output Current VCC = Max (Note 3) −40 −100 mA

ICCH Supply Current with Outputs HIGH VCC = Max 10 16 mA

ICCL Supply Current with Outputs LOW VCC = Max 20 36 mA

RL = 280Ω

Symbol Parameter CL = 15 pF CL = 50 pF Units

MinMaxMinMax

tPLH Propagation Delay Time 24.52 7ns

LOW-to-HIGH Level Output

tPHL Propagation Delay Time 2528ns

HIGH-to-LOW Level Output

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DM74S00

Physical Dimensions inches (millimeters) unless otherwise noted

14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow

Package Number M14A

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DM74S00 Quad 2-Input NAND Gate

Physical Dimensions inches (millimeters) unless otherwise noted (Continued)

14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

Package Number N14A

Fairchild does not assu me any responsibility for use of any circuitry de scribed, no circuit patent licenses are implied and

Fairchild reserves the right at any time without notice to change said circuitry and specifications.

LIFE SUPPORT POLICY

FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT

DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD

SEMICONDUCTOR CORPORATION. As used herein:

1. Life suppor t de vices o r syste ms are devices or syste ms

which, (a) are intended for surgical implant into the

body, or (b) support or sustain life, and (c) whose failure

to perform when properly used in accordance with

instructions for use provided in the labeling, can be rea-

sonably expected to result in a significant injury to the

user.

2. A critical compon ent i n any compon ent of a lif e supp ort

device or system whose failure to perform can be rea-

sonabl y ex pect ed to ca use the fa ilu re of the li fe su pp ort

device or system, or to affect its safety or effectiveness.