Static Characteristics TJ = 25°C unless otherwise specifi ed
Dynamic Characteristics TJ = 25°C unless otherwise specifi ed
Source-Drain Diode Characteristics
1 Repetitive Rating: Pulse width and case temperature limited by maximum junction temperature.
2 Starting at TJ = 25°C, L = 3.39mH, RG =25Ω, IAS = 33A.
3 Pulse test: Pulse Width < 380μs, duty cycle < 2%.
4 Co(cr) is defi ned as a fi xed capacitance with the same stored charge as COSS with VDS = 67% of V(BR)DSS.
5 Co(er) is defi ned as a fi xed capacitance with the same stored energy as COSS with VDS = 67% of V(BR)DSS. To calculate Co(er) for any value of
V
DS less than V(BR)DSS, use this equation: Co(er) = -1.28E-7/VDS^2 + 5.36E-8/VDS + 2.00E-10.
6 RG is external gate resistance, not including internal gate resistance or gate driver impedance. (MIC4452)
Microsemi reserves the right to change, without notice, the specifi cations and information contained herein.
G
D
S
Unit
V
V/°C
Ω
V
mV/°C
μA
nA
Unit
S
pF
nC
ns
Unit
A
V
ns
μC
A
V/ns
Min Typ Max
600
0.57
0.075 0.09
2.5 4 5
-10
250
1000
±100
Min Typ Max
65
13190
135
1210
645
335
330
70
140
75
85
225
70
Min Typ Max
70
246
1.0
268 310
474 570
1.6
4.2
11.4
16.9
20
Test Conditions
VGS = 0V, ID = 250μA
Reference to 25°C, ID = 250μA
VGS = 10V, ID = 33A
VGS = VDS, ID = 2.5mA
V
DS = 600V TJ = 25°C
V
GS = 0V TJ = 125°C
VGS = ±30V
Test Conditions
VDS = 50V, ID = 33A
VGS = 0V, VDS = 25V
f = 1MHz
VGS = 0V, VDS = 0V to 400V
VGS = 0 to 10V, ID = 33A,
VDS = 300V
Resistive Switching
VDD = 400V, ID = 33A
RG = 2.2Ω 6 , VGG = 15V
Test Conditions
MOSFET symbol
showing the
integral reverse p-n
junction diode
(body diode)
ISD = 33A, TJ = 25°C, VGS = 0V
T
J = 25°C
T
J = 125°C
ISD = 33A 3 T
J = 25°C
V
DD = 100V TJ = 125°C
diSD/dt = 100A/μs TJ = 25°C
T
J = 125°C
ISD ≤ 33A, di/dt ≤1000A/μs, VDD = 400V,
TJ = 125°C
Parameter
Drain-Source Breakdown Voltage
Breakdown Voltage Temperature Coeffi cient
Drain-Source On Resistance 3
Gate-Source Threshold Voltage
Threshold Voltage Temperature Coeffi cient
Zero Gate Voltage Drain Current
Gate-Source Leakage Current
Parameter
Forward Transconductance
Input Capacitance
Reverse Transfer Capacitance
Output Capacitance
Effective Output Capacitance, Charge Related
Effective Output Capacitance, Energy Related
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Turn-On Delay Time
Current Rise Time
Turn-Off Delay Time
Current Fall Time
Parameter
Continuous Source Current
(Body Diode)
Pulsed Source Current
(Body Diode) 1
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
Peak Recovery dv/dt
Symbol
VBR(DSS)
∆VBR(DSS)/∆TJ
RDS(on)
VGS(th)
∆VGS(th)/∆TJ
IDSS
IGSS
Symbol
gfs
Ciss
Crss
Coss
Co(cr)
4
Co(er)
5
Qg
Qgs
Qgd
td(on)
tr
td(off)
tf
Symbol
IS
ISM
VSD
trr
Qrr
Irrm
dv/dt
050-8173 Rev C 9-2011
APT66F60B2_L