2400-LV-US - KEITHLEY - Datasheet.Live

SEMICONDUCTOR

www.keithley.com

1.888.KEITHLEY (U.S. only)

A Greater Measure of Conﬁdence

The SourceMeter family was developed specifically for

test applications that demand tightly coupled precision

voltage and current sourcing and concurrent measure-

ment, including source read back. This family of instru-

ments can be easily programmed to drive laser diodes

throughout the characterization process. Any of them

can also be programmed to act as a synchronization

controller to ensure simultaneous measurements during

the test sequence. Selecting a fixed current range elimi-

nates the potential for range offsets that appear as kinks

during the LIV sweep testing. The Models 2400-LV and

2401 offer a drive current of up to 1A, ideal for testing

VCSEL devices.

The Model 2420 offers a tighter accuracy specification

that allows for precise control of transmitter laser devic-

es. In addition to higher accuracy, the Model 2420 offers a drive current of up to 3A for devices that

need drive currents greater than 1A, such as pump lasers used in EDFA amplifiers.

The Model 2440 5A SourceMeter SMU Instrument further broadens the capabilities offered by the

popular SourceMeter line. The dynamic range and functionality of the Model 2440 makes it ideal for

applications such as testing high power pump lasers for use in optical amplifiers, laser bar tests, and

testing other higher power components. Manufacturers of Raman pump laser modules and optical

amplifiers will find it invaluable for a wide range of design and production test applications.

A Keithley SourceMeter SMU instrument provides a complete, economical, high throughput solution

for component production testing, all in one compact, half-rack box. It combines source, measure,

and control capabilities in a form factor that’s unique to the industry. The SourceMeter is also suit-

able for making a wide range of low power DC measurements, including resistance at a specified cur-

rent or voltage, breakdown voltage, leakage current, and insulation resistance.

Single Box Solution

By linking source and measurement circuitry in a single unit, a SourceMeter SMU instrument offers

a variety of advantages over systems configured with separate source and measurement instruments.

For example, it minimizes the time required for test station development, setup, and maintenance,

while lowering the overall cost of system ownership. It simplifies the test process itself by eliminating

many of the complex synchronization and connection issues associated with using multiple instru-

ments. Its compact, half-rack size conserves “real estate” in the test rack or bench.

•Designed for production

testing of VCSELs, transmitter,

high power pump lasers, and

other high current electronic

components

•Key building block for

programmable LIV test system

for laser diode modules

•Very low noise current source

(50µA) for laser diode drive

•Up to 5A laser diode drive

current

•Trigger Link, Source Memory,

and buffer memory support

automatic test sequencing

•Reduced GPIB bus traffic

improves test throughput

•Expandable and flexible for

future requirements

•Built-in comparator for fast

pass/fail testing

•Digital I/O handler interface

•1000 readings/second at

4½ digits

•Optional contact check function

ACCESSORIES AVAILABLE

LASER DIODE MOUNTS

8542 Dual In-Line Telecom Laser Diode Mount Bundle

8544 Butterfly Telecom Laser Diode Mount Bundle

8544-TEC Butterfly Telecom Laser Diode Mount Bundle

with TEC, thermistor, and AD592CN temperature

sensor

COMMUNICATION INTERFACE

KPCI-488LPA IEEE-488 Interface/Controller for the PCI Bus

KUSB-488B IEEE-488 USB-to-GPIB Adapter for USB Port

SWITCHING HARDWARE

7001 Two-Slot Switch System

7002 Ten-Slot Switch System

7053 High-Current Switch Card

TEST LEADS AND PROBES

5806 Kelvin Clip Lead Set

CABLES/ADAPTERS

2499-DIGIO Digital I/O Expansion Assembly

7007-1 Shielded GPIB Cable, 1m (3.3 ft)

7007-2 Shielded GPIB Cable, 2m (6.6 ft)

7009-5 RS-232 Cable

8501-1 Trigger Link Cable, 1m (3.3 ft)

8501-2 Trigger Link Cable, 2m (6.6 ft)

8502 Trigger Link Adapter Box

RACK MOUNT KITS

4288-1 Single Fixed Rack Mount Kit

4288-2 Dual Fixed Rack Mount Kit

2400-LV, 2400-C,

2401, 2420, 2420-C,

2440, 2440-C

SourceMeter® SMU Instruments

for Optoelectronic I-V Testing

Tightly coupled source and measure for active component testing

SEMICONDUCTOR

A Greater Measure of Conﬁdence

www.keithley.com

1.888.KEITHLEY (U.S. only)

Tightly coupled source and measure for active component testing

High Throughput to Meet Demanding Production Test Schedules

A SourceMeter SMU instrument’s highly integrated architecture offers significant throughput advan-

tages. Many features of this family enable them to “take control” of the test process, eliminating

additional system bus traffic and maximizing total throughput. Built-in features that make this pos-

sible include:

•Source Memory List test sequencer with conditional branching

•Handler/prober interface

•Trigger Link compatibility with switching hardware and other instruments from Keithley

•High speed comparator, pass/fail limits, mathematical scaling

•Deep memory buffer

The SourceMeter SMU instruments also offer standard RS-232 and GPIB interfaces for integration

with a PC. Adding one of Keithley’s versatile switch systems enables fast, synchronized multi-

point testing.

Testing Optoelectronic Components

Use a SourceMeter SMU instrument to measure a component’s electrical performance characteristics

and to drive laser diodes and other components.

Ordering Information

2400-LV Low Voltage

SourceMeter

Measurements up to 20V and 1A, 20W

Power Output

2400-C General-Purpose

SourceMeter

Contact Check, Measurements up to

200V and 1A, 20W Power Output

2401 Low Voltage

SourceMeter

Measurements up to 20V and 1A, 20W

Power Output

2420 High-Current

SourceMeter

Measurements up to 60V and 3A, 60W

Power Output

2420-C High-Current

SourceMeter

Contact Check, Measurements up to 60V

and 3A, 60W Power Output

2440 5A SourceMeter

Measurements up to 40V and 5A, 50W

Power Output

2440-C 5A SourceMeter

Contact Check, Measurements up to 40V

and 5A, 50W Power Output

Accessories Supplied

Test Leads, User’s Manual, Service

Manual, and LabVIEW® Drivers

Choose the Model 2420 for testing higher power

resistors, thermistors, IDDQ, solar cells, batteries, and

high-current or medium power diodes, including

switching and Schottky diodes.

The Model 2440’s wide dynamic range is well-suited

for applications such as testing high-power pump lasers

for use in optical amplifiers and laser bar tests, as well

as testing other higher power components.

+1A

= duty cycle limited

–100mA

+20V–20V

+100mA

–1A

Models 2400-LV/2401

SourceMeter

Instruments

+1A

+60V

–100mA

+20V–20V–60V

+3A

+100mA

–1A

–3A

Model 2420

3A SourceMeter

Instrument

+1A

+40V

–100mA

+10V–10V–40V

+3A

+100mA

+5A

–1A

–3A

–5A

Model 2440

5A SourceMeter

Instrument

VV V

The Models 2400-LV and 2401 are ideal for testing a wide

variety of devices, including diodes, resistors, resistor

networks, active circuit protection devices, and portable

battery-powered devices and components.

Model 2400-LV/2400-C/2401 2420/2420-C 2440/2440-C

Description General Purpose 3 A 5 A

Power Output 20 W 60 W 50 W

Voltage Range ±1 µV to ±20 V ±1 µV to ±63 V ±1 µV to ±42 V

Current Range ±50 pA to ±1.05 A ±500 pA to ±3.15 A ±500 pA to ±5.25 A

Ohms Range <0.2 W to >200 W<0.2 W to >200 MW<2.0 W to >200 MW

Applications Optoelectronic components.

VCSELs.

Transmitter modules.

EDFA pumps.

5A pump laser diodes.

Raman amplifiers.

Types of Optoelectronic Components

•Laser diodes

•Laser diode modules

•Photodetectots

•Light-emitting diodes (LEDs)

•Photovoltaic cells

Typical Tests

•LIV test (laser diodes and LEDs)

•Kink test (laser diode)

•I-V characterization

2400-LV, 2400-C,

2401, 2420, 2420-C,

2440, 2440-C

SourceMeter® SMU Instruments

for Optoelectronic I-V Testing

SEMICONDUCTOR

www.keithley.com

1.888.KEITHLEY (U.S. only)

A Greater Measure of Conﬁdence

2400, 2420, 2440 specifications

SOURCEMETER SMU INSTRUMENT SPECIFICATIONS

The following tables summarize the capabilities of the Models 2400-LV, 2420, and 2440.

2400-LV SOURCEMETER (I-V MEASUREMENTS)

Current Programming Accuracy Voltage Measurement Accuracy

Accuracy (1 Year)

Default Input 23°C ±5°C

Range Resolution Resistance ± (% rdg. + volts)

200.000 mV 1 µV > 10 GW 0.01 % + 300 µV

2.00000 V 10 µV > 10 GW 0.012% + 300 µV

20.0000 V 100 µV > 10 GW 0.015% + 1.5 mV

Accuracy (1 Year)

Programming 23°C ± 5°C

Range Resolution ± (% rdg. + amps)

1.00000 µA 50 pA 0.035% + 600 pA

10.0000 µA 500 pA 0.033% + 2 nA

100.000 µA 5 nA 0.031% + 20 nA

1.00000 mA 50 nA 0.034% + 200 nA

10.0000 mA 500 nA 0.045% + 2 µA

100.000 mA 5 µA 0.066% + 20 µA

1.00000 A 50 µA 0.27 % + 900 µA

Faster, Easier, and More Efficient Testing

and Automation

Coupled Source and Measure Capabilities

The tightly coupled nature of a SourceMeter SMU instrument provides

many advantages over separate instruments. The ability to fit a source and

a meter in a single half-rack enclosure saves valuable rack space and simpli-

fies the remote programming interface. Also, the tight control and a single

GPIB address inherent in a single instrument result in faster test times for

ATE applications due to reduced GPIB traffic.

Standard and Custom Sweeps

SourceMeter SMU instruments provide sweep solutions that greatly acceler-

ate testing with automation hooks for additional throughput improvement.

2420 SOURCEMETER (I-V MEASUREMENTS)

Current Programming Accuracy

Accuracy (1 Year)

Programming 23°C ± 5°C

Range Resolution ± (% rdg. + amps)

10.0000 µA 500 pA 0.033% + 2 nA

100.000 µA 5 nA 0.031% + 20 nA

1.00000 mA 50 nA 0.034% + 200 nA

10.0000 mA 500 nA 0.045% + 2 µA

100.000 mA 5 µA 0.066% + 20 µA

1.00000 A 50 µA 0.067% + 900 µA

3.00000 A 50 µA 0.059% + 2.7 mA

Voltage Measurement Accuracy

Accuracy (1 Year)

Default Input 23°C ±5°C

Range Resolution Resistance ± (% rdg. + volts)

200.000 mV 1 µV > 10 GW 0.012% + 300 µV

2.00000 V 10 µV > 10 GW 0.012% + 300 µV

20.0000 V 100 µV > 10 GW 0.015% + 1 mV

60.0000 V 1 mV > 10 GW 0.015% + 3 mV

2440 SOURCEMETER (I-V MEASUREMENTS)

Current Programming Accuracy

Accuracy (1 Year)3

Programming 23°C ± 5°C

Range Resolution ± (% rdg. + amps)

10.0000 µA 500 pA 0.033% + 2 nA

100.000 µA 5 nA 0.031% + 20 nA

1.00000 mA 50 nA 0.034% + 200 nA

10.0000 mA 500 nA 0.045% + 2 µA

100.000 mA 5 µA 0.066% + 20 µA

1.00000 A 50 µA 0.067% + 900 µA

5.00000 A 50 µA 0.10 % + 5.4 mA

Voltage Measurement Accuracy

Accuracy (1 Year)

Default Input 23°C ±5°C

Range Resolution Resistance ± (% rdg. + volts)

200.000 mV 1 µV > 10 GW 0.012% + 300 µV

2.00000 V 10 µV > 10 GW 0.012% + 300 µV

10.0000 V 100 µV > 10 GW 0.015% + 750 µV

40.0000 V 1 mV > 10 GW 0.015% + 3 mV

Optional Contact Check

The Contact Check option available on all Series 2400 SourceMeter SMU

instruments allows quick verification of a good connection to the DUT

before functional testing proceeds. This feature helps prevent the loss of

precious test time due to damaged, corroded, or otherwise faulty contacts

in a test fixture. The innovative contact check design completes the verifi-

cation and notification process in less than 350µs; comparable capabilities

in other test equipment can require up to 5ms to perform the same func-

tion. Contact check failure is indicated on the instrument’s front panel and

over the GPIB bus. The digital I/O interface can also be used to communi-

cate contact failure to the component handler in automated applications.

2400-LV, 2400-C,

2401, 2420, 2420-C,

2440, 2440-C

SourceMeter® SMU Instruments

for Optoelectronic I-V Testing