MCC 1N5221 THRU 1N5281 omponents 20736 Marilla Street Chatsworth !"# $ % !"# TM Micro Commercial Components Features * * * 500 mW Zener Diode 2.4 to 200 Volts Wide Voltage Range Available Glass Package High Temp Soldering: 250C for 10 Seconds At Terminals Maximum Ratings * * * * * DO-35 Operating Temperature: -55C to +150C Storage Temperature: -55C to +150C 500 mWatt DC Power Dissipation Power Derating: 4.0mW/C above 50C Forward Voltage @ 200mA: 1.1 Volts Figure 1 - Typical Capacitance D 100 A Cathode Mark pf 10 B At zero volts At -2 Volts V R D 1 0 100 C 200 VZ Typical Capacitance (pf) - versus - Zener voltage (VZ) Figure 2 - Derating Curve 400 DIMENSIONS mW DIM A B C D 200 INCHES MIN ------1.000 MAX .166 .079 .020 --- MM MIN ------25.40 MAX 4.2 2.00 .52 --- NOTE 50 100 150 Temperature C Power Dissipation (mW) - Versus - Temperature C 0 Revision: 3 www.mccsemi.com 2002/12/31 MCC 1N5221 thru 1N5281 ELECTRICAL CHARACTERISTICS @25C MCC PART NUMBER NOMINAL ZENER VOLTAGE VZ @ IZT VOLTS 1N5221 1N5222 1N5223 1N5224 1N5225 1N5226 1N5227 1N5228 1N5229 1N5230 1N5231 1N5232 1N5233 1N5234 1N5235 1N5236 1N5237 1N5238 1N5239 1N5240 1N5241 1N5242 1N5243 1N5244 1N5245 1N5246 1N5247 1N5248 1N5249 1N5250 1N5251 1N5252 1N5253 1N5254 1N5255 1N5256 1N5257 1N5258 1N5259 1N5260 1N5261 1N5262 1N5263 1N5264 1N5265 1N5266 1N5267 1N5268 1N5269 1N5270 1N5271 1N5272 1N5273 1N5274 1N5275 1N5276 1N5277 1N5278 1N5279 1N5280 1N5281 2.4 2.5 2.7 2.8 3.0 3.3 3.6 3.9 4.3 4.7 5.1 5.6 6.0 6.2 6.8 7.5 8.2 8.7 9.1 10 11 12 13 14 15 16 17 18 19 20 22 24 25 27 28 30 33 36 39 43 47 51 56 60 62 68 75 82 87 91 100 110 120 130 140 150 160 170 180 190 200 TEST CURRENT I ZT mA 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 9.5 9.0 8.5 7.8 7.4 7.0 6.6 6.2 5.6 5.2 5.0 4.6 4.5 4.2 3.8 3.4 3.2 3.0 2.7 2.5 2.2 2.1 2.0 1.8 1.7 1.5 1.4 1.4 1.3 1.1 1.0 0.95 0.90 0.85 0.80 0.74 0.68 0.66 0.65 TM Micro Commercial Components MAXIMUM ZENER IMPEDANCE `B' SUFFIX ONLY Z ZT @ IZT Z ZK @I ZK = 0.25mA OHMS OHMS MAXIMUM REVERSE LEAKAGE CURRENT IR @ VR A VOLTS 30 30 30 30 29 28 24 23 22 19 17 11 7.0 7.0 5.0 6.0 8.0 8.0 10 17 22 30 13 15 16 17 19 21 23 25 29 33 35 41 44 49 58 70 80 93 105 125 150 170 185 230 270 330 370 400 500 750 900 1100 1300 1500 1700 1900 2200 2400 2500 100 100 75 75 50 25 15 10 5.0 5.0 5.0 5.0 5.0 5.0 3.0 3.0 3.0 3.0 3.0 3.0 2.0 1.0 0.5 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 1200 1250 1300 1400 1600 1600 1700 1900 2000 1900 1600 1600 1600 1000 750 500 500 600 600 600 600 600 600 600 600 600 600 600 600 600 600 600 600 600 600 600 700 700 800 900 1000 1100 1300 1400 1400 1600 1700 2000 2200 2300 2600 3000 4000 4500 4500 5000 5500 5500 6000 6500 7000 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 2.0 2.0 3.0 3.5 4.0 5.0 6.0 6.5 6.5 7.0 8.0 8.4 9.1 9.9 10 11 12 13 14 14 15 17 18 19 21 21 23 25 27 30 33 36 39 43 46 47 52 56 62 68 69 76 84 91 99 106 114 122 129 137 144 152 MAX. ZENER VOLTAGE TEMP COEFFICIENT `B' SUFFIX ONLY % / C -0.085 -0.085 -0.080 -0.080 -0.075 -0.070 -0.065 -0.060 0.055 0.030 0.030 +0.038 +0.038 +0.045 +0.050 +0.058 +0.062 +0.065 +0.068 +0.075 +0.076 +0.077 +0.079 +0.082 +0.082 +0.083 +0.084 +0.085 +0.086 +0.086 +0.087 +0.088 +0.089 +0.090 +0.091 +0.091 +0.092 +0.093 +0.094 +0.095 +0.095 +0.096 +0.096 +0.097 +0.097 +0.097 +0.098 +0.098 +0.099 +0.099 +0.110 +0.110 +0.110 +0.110 +0.110 +0.110 +0.110 +0.110 +0.110 +0.110 +0.110 NOTE 1: Table as shown lists type numbers, which indicate a tolerance of 20% with guaranteed limits on only Vz, IR, and V F. Devices with guaranteed limits on all six parameters are indicated by suffix "A" for 10%, "B" for 5%, "C" for 2%, and "D" for 1% tolerance NOTE 2: The electrical characteristics are measured after allowing the device to stabilize for 20 seconds. NOTE 3: Temperature coefficient (aVZ). Test conditions for temperature coefficient are as follows: a. IZT = 7.5mA, TI = 25oC T2 = 125oC (1N5221 thru 1N5242) b. IZT = Rated IZT , TI = 25oC, T2 = 125oC (1N5243 thru 1N5281) Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature. Revision: 3 www.mccsemi.com 2002/12/31