COMA
BASE
OUT
C2
DBACK
LOW
C3
DIN
C1
VD
ERRLVL
ACKB
VA
COMD
40
µC
Sensor GPIO
IN
HART Modulator
LDO
Industrial 4-20mA Transmitter
0-24 mA Loop
+
-
LOOP
SUPPLY
LOOP
RECEIVER
Single Wire Interface
(SWIF)
and
Controller
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DAC161P997
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XFRMR
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DAC161P997
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DAC161P997 Single-Wire 16-bit DAC for 4- to 20-mA Loops
1 Features 3 Description
The DAC161P997 is a 16-bit ∑Δ digital-to-analog
1• 16-Bit Linearity converter (DAC) for transmitting an analog output
• Single-Wire Interface (SWIF), with Handshake current over an industry standard 4-20 mA current
• Digital Data Transmission (No Loss of Fidelity) loop. It offers 16-bit accuracy with a low output
current temperature coefficient (29 ppm/°C) and
• Pin Programmable Power-Up Condition excellent long-term output current drift (90 ppmFS)
• Self Adjusting to Input Data Rate while consuming less than 190 µA.
• Loop Error Detection and Rreporting The data link to the DAC161P997 is a Single Wire
• Programmable Output Current Error Level Interface (SWIF) which allows sensor data to be
• No External Precision Components transferred in digital format over an isolation
boundary using a single isolation component. The
• Simple Interface to HART Modulator DAC161P997’s digital input is compatible with
• Small Package: WQFN-16 (4 x 4 mm, 0.5 mm standard isolation transformers and opto-couplers.
Pitch) Error detection and handshaking features within the
• Key Specifications SWIF protocol ensure error free communication
across the isolation boundary. For applications where
– Output Current TempCo: 29 ppmFS/°C (Max) isolation is not required, the DAC161P997 interfaces
– Long-Term Output Current Drift: 90 ppmFS directly to a microcontroller.
(Typ) The loop drive of the DAC161P997 interfaces to a
– INL: 3.3/−2.1 µA(Max) HART (Highway Addressable Remote Transducer)
– Total Supply Current: 190 µA (Max) modulator, allowing injection of FSK modulated digital
data into the 4-20 mA current loop. This combination
2 Application of specifications and features makes the
DAC161P997 ideal for 2- and 4-wire industrial
• Two-Wire, 4-20 mA Current Loop Transmitter transmitters.
• Industrial Process Control The DAC161P997 is available in a 16–lead WQFN
• Actuator Control package and is specified over the extended industrial
• Factory Automation temperature range of -40°C to 105°C.
• Building Automation Device Information(1)
• Precision Instruments PART NUMBER PACKAGE BODY SIZE (NOM)
• Data Acquisition Systems DAC161P997 WQFN (16) 4.00 mm x 4.00 mm
• Test Systems (1) For all available packages, see the orderable addendum at
the end of the datasheet.
Simplified Schematic
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
DAC161P997
SNAS515G –JULY 2011–REVISED DECEMBER 2014
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Table of Contents
7.4 Device Functional Modes........................................ 11
1 Features.................................................................. 17.5 Programming .......................................................... 12
2 Application ............................................................. 17.6 Register Maps ........................................................ 18
3 Description............................................................. 18 Application and Implementation ........................ 20
4 Revision History..................................................... 28.1 Application Information............................................ 20
5 Pin Configuration and Functions......................... 38.2 Typical Application ................................................. 26
6 Specifications......................................................... 49 Power Supply Recommendations...................... 30
6.1 Absolute Maximum Ratings ...................................... 410 Layout................................................................... 30
6.2 ESD Ratings.............................................................. 510.1 Layout Guidelines ................................................. 30
6.3 Recommended Operating Conditions....................... 510.2 Layout Example .................................................... 30
6.4 Thermal Information.................................................. 511 Device and Documentation Support................. 31
6.5 Electrical Characteristics........................................... 511.1 Third-Party Products Disclaimer ........................... 31
6.6 Timing Requirements ............................................... 711.2 Trademarks........................................................... 31
6.7 Typical Characteristics.............................................. 811.3 Electrostatic Discharge Caution............................ 31
7 Detailed Description............................................ 10 11.4 Glossary................................................................ 31
7.1 Overview................................................................. 10 12 Mechanical, Packaging, and Orderable
7.2 Functional Block Diagram....................................... 10 Information........................................................... 31
7.3 Feature Description................................................. 10
4 Revision History
Changes from Revision F (January 2013) to Revision G Page
• Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section ................................................................................................. 1
• Changed the second Thead to tbody/row and changed role to hdr in the Timing Requirements table ................................ 7
• Deleted the Related links subsection and checked for setting of single-part ...................................................................... 31
Changes from Revision E (October 2013) to Revision F Page
• Changed O to Ωin table....................................................................................................................................................... 17
Changes from Revision D (March, 2013) to Revision E Page
• Changed application circuit .................................................................................................................................................. 26
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COMA
ESD
Clamp
VA
ESD
Clamp
COMA
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5 Pin Configuration and Functions
WQFN (RGH0016A)
16 pins
Top View
Pin Functions
PIN DESCRIPTION ESD PROTECTION
NAME NO.
VA 15 Analog block positive supply rail
Analog block negative supply rail (local
COMA 1 COMMMON)
Digital block negative supply rail (local
COMD 2 COMMON)
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COMA
VA
COMA
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Pin Functions (continued)
PIN DESCRIPTION ESD PROTECTION
NAME NO.
VD 3 Digital block positive supply rail
DIN 4 SWIF input
DBACK 5 SWIF input loop back
SWIF acknowledge output - open drain,
ACKB 6 active LOW
ERRLVL 8 Sets the output current level at power-up
LOW 10 Must be tied to COMA, COMD potential
C1 14 External capacitor
C2 13 External capacitor, HART Input
C3 12 External capacitor
BASE 16 External NPN base drive
N.C. 11 User must not connect to this pin
ERRB 7 Error flag output open drain, active LOW
OUT 9 Loop output current source
Die Attach Pad. For best thermal
conductivity and best noise immunity
DAP - DAP should be soldered to the PCB pad -
which is connected directly to circuit
common node (COMA, COMD)
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)
MIN MAX UNIT
Supply relative to common (VA, VD to COMA, COMD) −0.3 6 V
Voltage between any 2 pins(2) 6 V
Current IN or OUT of any pin - except OUT(2) 5 mA
Output current at OUT 50 mA
Junction Temperature
Storage temperature range, Tstg −65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) When the input voltage (VIN) at any pin exceeds power supplies (VIN < COMA or VIN > VA), the current at that pin must not exceed 5
mA, and the voltage (VIN) at that pin relative to any other pin must not exceed 6.0V. See Pin Fuctions for additional details of input
structures.
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6.2 ESD Ratings VALUE UNIT
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±5500
V(ESD) Electrostatic discharge V
Charged-device model (CDM), per JEDEC specification JESD22- ±1250
C101(2)
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
MIN MAX UNIT
Supply Voltage Range 2.7 3.6 V
(VA - VD) 0 0 V
(COMA - COMD) 0 0 V
BASE load to COMA 0 15 pF
OUT load to COMA - -
Operating Temperature (TA) -40 105 °C
6.4 Thermal Information
THERMAL METRIC(1) WQFN (16-PINS) UNIT
RθJA Junction-to-ambient thermal resistance 35 °C/W
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
6.5 Electrical Characteristics
Unless otherwise noted, these specifications apply for VA = VD = 2.7 V to 3.6 V, TA= 25°C, external bipolar transistor:
2N3904, RE= 22Ω, C1= C2= C3= 2.2 nF.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
POWER SUPPLY
VA, VD Supply Voltage VA = VD 2.7 3.6 V
VA Supply Current 75 µA
DACCODE=0x0200(1)
VD Supply Current 115 µA
-40 to 105°C
Total Supply Current 190 µA
Power On Reset supply rail
VPOR 1.3 1.9 V
potential threshold
DC ACCURACY
N Resolution 16 Bits
0x2AAA < DACCODE < 0xD555
INL Integral Non-Linearity(2) (4mA < ILOOP < 20 mA) –2.1 3.3
-40 to 105°C µA
See(3)
DNL Differential Non-Linearity –0.2 0.2
-40 to 105°C
TUE Total Unadjusted Error 0x2AAA < DACCODE < 0xD555 –0.23% 0.23% FS
See(4)
OE Offset Error −9.16 9.16 µA
-40 to 105°C
Offset Error Temp. Coefficient 138 nA/°C
(1) At code 0x0200 the BASE current is minimal, i.e., device current contribution to power consumption is minimized. The SWIF link is
inactive, i.e., after transmitting code 0x200 to the DAC161P997, there are no more transitions in the channel during the supply current
measurement.
(2) INL is measured using “best fit” method in the output current range of 4 mA to 20 mA.
(3) Specified by design.
(4) Here offset is the y-intercept of the straight line defined by 4-mA and 20-mA points of the measured transfer characteristic.
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Electrical Characteristics (continued)
Unless otherwise noted, these specifications apply for VA = VD = 2.7 V to 3.6 V, TA= 25°C, external bipolar transistor:
2N3904, RE= 22Ω, C1= C2= C3= 2.2 nF.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
See(5)
GE Gain Error −0.22% 0.22% FS
-40 to 105°C
Gain Error Temp. Coefficient 5 29 ppmFS/°C
DACCODE = 0x2AAA
4 mA Loop Current Error −18 18
-40 to 105°C
DACCODE = 0xD555
20 mA Loop Current Error −55 55
-40 to 105°C µA
ERR_LOW = default
IERRL LOW ERROR Current 3361 3375 3391
-40 to 105°C
ERR_HIGH = default
IERRH HIGH ERROR Current 21702 21750 21817
-40 to 105°C
Long Term Drift — mean shift of
LTD 12 mA output current after 1000 90 ppmFS
hrs at 150°C
LOOP CURRENT OUTPUT (OUT)
Minimum tested at DACCODE =
Output Current 0x01C2(6) 0.18 24 mA
-40 to 105°C
Output Impedance 100 MΩ
COMA to OUT voltage drop IOUT = 24 mA 960 mV
BASE OUTPUT
BASE short circuit output current BASE forced to COMA potential 10 mA
DYNAMIC CHARACTERISTICS
Output Noise Density 1 kHz 20 nA/√Hz
Integrated Output Noise 1 Hz to 1 kHz band 300 nARMS
SWIF I/O CHARACTERISTICS
VIH DIN -40 to 105°C 0.7* VD V
VIL DIN -40 to 105°C 0.3*VD
CDIN DIN input capacitance 10 pF
I = 3 mA
VOH DBACK 2216
-40 to 105°C
I = 5 mA 1783
-40 to 105°C mV
I = 3 mA
VOL DBACK 547
-40 to 105°C
I = 5 mA 1260
-40 to 105°C
TD DIN to DBACK delay 8 ns
OPEN DRAIN OUTPUTS
I = 3 mA 550
-40 to 105°C
VOL ACKB mV
I = 5 mA 1370
-40 to 105°C
I = 300 µA 66
-40 to 105°C
VOL ERRB mV
I = 3 mA 602
-40 to 105°C
(5) Here Gain Error is the difference in slope of the straight line defined by measured 4-mA and 20-mA points of transfer characteristic, and
that of the ideal characteristic.
(6) This should be treated as the minimum LOOP current ensured specification.
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THD
TH1
TP
pri_tx: ³0´
pri_tx: ³1´
pri_tx: ³'´
ACKB: ³$´
TP
TB
TH0
TA
DAC161P997
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Electrical Characteristics (continued)
Unless otherwise noted, these specifications apply for VA = VD = 2.7 V to 3.6 V, TA= 25°C, external bipolar transistor:
2N3904, RE= 22Ω, C1= C2= C3= 2.2 nF.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Leakage current when output device
ACKB is off 1
-40 to 105°C
IOZ µA
Leakage current when output device
ERRB is off 1
-40 to 105°C
6.6 Timing Requirements MIN NOM MAX UNIT
SWIF TIMING, INTERNAL TIMER
Symbol rate: 1/TP 0.3 19.2 kHz
“D” symbol duty cycle: THD/TP 7/16 1/2 9/16
“0” symbol duty cycle: TH0/TP 3/16 1/4 5/16
"1” symbol duty cycle: TH1/TP 11/16 3/4 13/16
ACKB assert: TA/TP 1/16 1/4 4/8
ACKB deassert: TB/TP 12/8 7/4 31/16
TM Timeout PeriodM 90 100 110 ms
Figure 1. Single-Wire Interface (SWIF) Timing Diagram
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1 10 100 1k 10k 100k
-80
-70
-60
-50
-40
-30
-20
-10
0
MAGNITUDE RESPONSE (dB)
FREQUENCY (Hz)
C1=C2=C3=2.2nF
HART Adaptation
C1=C2=C3=1nF
1 10 100 1k 10k 100k
1
10
100
1k
10k
100k
1M
SETTLING TIME (s)
INPUT CODE STEP (lsb)
C1=C2=C3=2.2nF
HART Adaptation
C1=C2=C3=1nF
0 4 8 12 16 20 24
0
1
2
3
4
5
6
OUTPUT CURRENT RIPPLE A(rms)
OUTPUT CURRENT (mA)
Integration BW=1kHz
Integration BW=10kHz
0 20 40 60 80 100
0
5
10
15
20
25
30
35
FREQUENCY OF OCCURRENCE (%)
OE TEMPERATURE COEFFICIENT (nA/°C)
Tail of the distribution
follows Gaussian PDF
with: =3nA, 1=24nA/°C
2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6
100
110
120
130
140
150
160
170
180
190
200
TOTAL SUPPLY CURRENT (A)
SUPPLY VOLTAGE (V)
Data Rate = 300Baud
Data Rate = 19200Baud
0 2 4 6 8 10 12 14 16 18 20
0
5
10
15
20
25
FREQUENCY OF OCCURRENCE (%)
GE TEMPERATURE COEFFICIENT (ppm/°C)
Tail of the distribution
follows Gaussian PDF
with: =2.0, 1=4.8
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6.7 Typical Characteristics
Unless otherwise noted, data presented here was collected under these conditions VA= VD= 3.3V, TA= 25°C, external
bipolar transistor: 2N3904, RE= 22Ω, C1= C2= C3= 2.2 nF.
Figure 2. Supply Current vs Supply Voltage Figure 3. Gain Error TC Distribution
Figure 4. Integrated Noise vs ILOOP Figure 5. Offset Error TC Distribution
Figure 6. ΣΔ Modulator Filter Response Figure 7. Settling Time vs Input Step Size
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1 10 100 1k 10k 100k 1M
0
20
40
60
80
100
120
PSRR (dB)
FREQUENCY (Hz)
C1=C2=C3=1nF
C1=C2=C3=2.2nF
C1=C2=C3=10nF
C1=C2=C3=100nF
1 10 100 1k 10k 100k 1M
0
20
40
60
80
100
120
PSRR (dB)
FREQUENCY (Hz)
C1=C2=C3=1nF
C1=C2=C3=2.2nF
C1=C2=C3=10nF
C1=C2=C3=100nF
0 4 8 12 16 20 24
0
50
100
150
200
250
300
TOTAL SUPLLY CURRENT (A)
OUTPUT CURRENT (mA)
VA=VD=2.7V
VA=VD=3.0V
VA=VD=3.3V
VA=VD=3.6V
-40 -20 0 20 40 60 80 100 120
-2.5
-2.0
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
2.0
2.5
INL (A)
TEMPERATURE (°C)
Min INL
Max INL
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Typical Characteristics (continued)
Unless otherwise noted, data presented here was collected under these conditions VA= VD= 3.3V, TA= 25°C, external
bipolar transistor: 2N3904, RE= 22Ω, C1= C2= C3= 2.2 nF.
Figure 8. Supply Current vs ILOOP Figure 9. Output Linearity vs Temperature
Figure 10. PSRR: ILOOP=4 mA Figure 11. PSRR: ILOOP=20 mA
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SWIF 6'
+
-
CONTROLLER
OSC
POR
VA
C3C2C1
NC
DBACK
DIN
ERRLVL
ERRB
ACKB
BASE
OUT
COMD
COMA
VD
DACCODE
LCK
CONFIG1
CONFIG2
CONFIG3
ERR_HIGH
ERR_LOW
LOW
COMA
40
80k
15k 15k 15k
IREF
VA
COMD
COMD
DAC161P997
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7 Detailed Description
7.1 Overview
The DAC161P997 is a 16-bit DAC realized as a ∑Δ modulator. The DAC’s output is a current pulse train that is
filtered by the on-board low pass RC filter. The final output current is a multiplied copy of the filtered modulator
output. This architecture ensures an excellent linearity performance, while minimizing power consumption of the
device.
The DAC161P997 eases the design of robust, precise, long-term stable industrial systems by integrating all
precision elements on-chip. Only a few external components are needed to realize a low-power, high-precision
industrial 4-20 mA transmitter.
In case of a fault, or during initial power-up the DAC161P997 will output current in either upper or lower error
current band. The choice of band is user selectable via a device pin. The error current value is user
programmable via the SWIF link by the Master.
7.2 Functional Block Diagram
7.3 Feature Description
7.3.1 Error Detection and Reporting
The user can modify the CONFIG2:(LOOP | CHANNEL | PARITY | FRAME) bits to mask or enable the reporting
of any of the detectable fault conditions. The DAC161P997 reports errors by asserting the ERRB signal, and by
setting the current sourced by OUT to a value dictated by the state at ERRLVL pin and the contents of the
ERR_HIGH and ERR_LOW registers. Once the condition causing the fault is removed the OUT will return to the
last valid output level prior to the occurrence of the fault.
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Feature Description (continued)
Table 1 below summarizes the detectable faults, and means of reporting. The interval TM is governed by the
internal timer and is specified in Electrical Characteristics.
Table 1. Error Detection and Reporting
REPORTING
ERROR CAUSE Value used by the DAC to set OUT pin
ERRB current
The device cannot sustain the required output current at
OUT pin, typically caused by drop in loop supply, or
increased load impedance.
LOOP LOW ERR_LOW
The DAC161P997 automatically clears this fault after
interval of TM and attempts to establish output current
dictated by the value in the DACCODE register ERRLVL=1: ERR_HIGH
no valid symbols have been received on DIN in last
CHANNEL LOW
interval of TM ERRLVL=0: ERR_LOW
ERRLVL=1: ERR_HIGH
SWIF received a valid data frame, but a bit error has
PARITY LOW
been detected by parity check ERRLVL=0: ERR_LOW
ERRLVL=1: ERR_HIGH
invalid symbol received, or an incorrect number of valid
FRAME LOW
symbols were detected in the frame ERRLVL=0: ERR_LOW
7.3.2 Alarm Current
The DAC161P997 reports faults to the plant controller by forcing the OUT current into one of the error bands.
The error current bands are defined as either above 20 mA, or below 4mA. The error band selection is done via
the ERRLVL pin. The exact value of the output current used to indicate fault is dictated by the contents of
ERR_HIGH and ERR_LOW registers. See ERR_LOW and ERR_HIGH.
The default settings for LOW ERROR CURRENT and HIGH ERROR CURRENT are specified in Electrical
Characteristics
7.4 Device Functional Modes
SWIF is a versatile and robust solution for transmitting digital data over the galvanic isolation boundary using just
one isolation element: a pulse transformer.
Digital data format achieves the information transmission without the loss of fidelity which usually afflicts
transmissions employing PWM (Pulse Width Modulation) schemes. Digital transmission format also makes
possible data differentiation: user can specify whether given data word is a DAC input to be converted to loop
current, or it is a device configuration word.
SWIF was designed to use in conjunction with pulse transformer as an isolation element. The use of the
transformers to cross the isolation boundary is typical in the legacy systems due to their robustness, low-power
consumption, and low cost. However, system implementation is not limited to the transformer as a link since
SWIF easily interfaces with opto-couplers, or it can be directly driven by a CMOS gate.
SWIF incorporates a number of features that address robustness aspect of the data link design:
Bidirectional signal flow the DAC161P997 can issue an ACKNOWLEDGE pulse back to the master
transmitter, via the same physical channel, to confirm the reception of the valid data;
Error Detection SWIF protocol incorporates frame length detection and parity checks as a method of verifying
the integrity of the received data;
Channel Activity Detection SWIF can monitor the data channel and raise an error flag should the expected
activity drop below programmable threshold, due to , for example, damage to the physical channel.
In the typical system the Master is a micro controller. SWIF has been implemented on a number of popular micro
controllers where it places minimum demands on the hardware or software resources even of the simple 8-bit
devices.
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Device Functional Modes (continued)
SWIF gives the system designer flexibility is balancing the trade-offs between the data rate, activity monitoring
functionality and the power consumption in the transformer coupled data channel. At lowest data rates, with long
inactive inter-frame periods, the power consumed by SWIF is negligible. See Inter-Frame Period.
7.5 Programming
7.5.1 Single-Wire Interface (SWIF)
SWIF provides flexible and easy to implement digital data link between the Master (transmitter) and the Slave
(receiver). The Master encodes the digital data into a square (NRZ) CMOS level waveform which can be
generated using common microcontroller resources. The Slave (DAC161P997) translates the waveform back into
a bit stream which is then interpreted as the output current update or configuration data.
SWIF can operate in both Simplex (unidirectional) and Half-Duplex (bidirectional) modes. In the DAC161P997's
implementation of SWIF, an Acknowledge pulse constitutes the reverse data flowing from the Slave back to the
Master.
In its simplest implementation, the waveform can be directly coupled to the DAC161P997 input. In typical
systems, however, SWIF data is transmitted via the galvanic isolation element such as pulse transformer or an
opto-coupler. The details of the circuit implementations are discussed in Interface Circuit.
Frame Format through Symbol Set describe the data encoding and the SWIF protocol.
7.5.1.1 Frame Format
A frame begins with a minimum of one idle symbol. There can be more than one and each has the effect of
resetting the frame buffer of the DAC161P997. After idle symbol “D” a Tag Bit specifies the destination of the
frame. If the tag is symbol ‘0’ then frame’s destination is the DACCODE register. If tag is a ‘1’ the destination is
one of the configuration registers.
The following 16 symbols constitute the data payload. If current frame is a DAC frame, the entire payload is a
single DACCODE word. If it is a configuration frame, the first byte is the register address and the second byte is
the register data. Words are transmitted MSB first.
Two parity symbols follow the payload. The first parity symbol is determined by the bit parity of the tag bit and the
first byte of payload (HIGH Slice) – a total of nine symbols. The second parity symbol corresponds to bit parity of
the second byte of payload only (LOW Slice) – a total of 8 symbols.
P0 = [ ( Number of ones in LOW Slice ) mod 2 == 0 ]
P1 = [ ( Number of ones in HIGH Slice ) mod 2 == 0 ]
Symbol ‘D’ after the parity bits completes a valid frame.
The symbol “A” is optional, but if present it has to immediately follow the last “D” symbol of the frame. The
duration of acknowledge symbol “A” is always twice the duration of P0 symbol preceding it. See Figure 12.
SWIF does not require that all symbols in valid frames are sent by the Master at a fixed Baud rate. Each symbol
is evaluated individually and is recognized as valid as long as it conforms to the duration requirement (Tp) and its
duty cycle falls outside of noise margins. (See Table 2 below.)
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Frame Frame
Interframe
Period
Frame FrameD DD D
Interframe
Period
Frame Frame Frame
D0DATA[15:8] P1 P0 DDATA[7:0] A
D1REG. ADDRESS[7:0] P1 P0 DDATA[7:0] A
³+,*+VOLFH´ ³/2:VOLFH´
³+,*+VOLFH´ ³/2:VOLFH´
Tag Bit
Tag Bit
Parity Bits
Parity Bits
Configuration Data Frame
DAC Input Data Frame
DAC161P997
www.ti.com
SNAS515G –JULY 2011–REVISED DECEMBER 2014
Programming (continued)
Figure 12. Data Frame Format
7.5.1.2 Inter-Frame Period
The fastest DAC update rate is achieved when Master sends the valid frames back to back, Continuous Mode, at
the fastest Baud rate. This, however, results in the least power efficient implementation.
SWIF is designed to operate in the Burst Mode as well, where the valid frames are separated by the inter-frame
periods that do not carry any data. The inter-frame period can be occupied by a stream of idle ‘D’ or ‘L’ symbols.
Sending the ‘D’ symbol in the inter-frame period provides continuous verification of integrity of the data link. The
device by default monitors the activity of the SWIF link, and if the activity ceases the ERRB flag is asserted. See
CONFIG2 and Error Detection and Reporting.
Sending the ‘L’ in the inter-frame period results in the transmission line being inactive (transition-free) except
when the data frames are being transmitted. This is the most power efficient implementation of SWIF link, but it
does not facilitate link integrity reporting. To avoid ERRB being asserted due to the channel inactivity,
CONFIG2.CHANNEL should be cleared.
7.5.1.3 Symbol Set
The digital data encoding scheme is outlined in the table below. The signal names in the table correspond to the
nodes shown in Figure 27.
The signal waveforms due to a random symbol stream are shown in Figure 13.
Copyright © 2011–2014, Texas Instruments Incorporated Submit Documentation Feedback 13
Product Folder Links: DAC161P997
pri_tx_en_n
pri_tx
25 50 75
Symbol Period
25 50 75 25 50 75
pri_tx_en_n
driven by Slave
pri_rx
pri_tx
Symbol Period Symbol Period
pri_tx_en_n
pri_tx
25 50 75
Symbol Period
pri_tx_en_n
pri_tx
Symbol Period
25 50 75
pri_tx_en_n
pri_tx
25 50 75
Symbol Period
DAC161P997
SNAS515G –JULY 2011–REVISED DECEMBER 2014
www.ti.com
Programming (continued)
Table 2. Symbol Set Table
Character Mnemonic SWIF Symbol Comments
• Occupies one symbol period
• Transmit from Master only
• 25% duty-cycle square waveform
• Terminates LOW
“0”
• Occupies one symbol period
• Transmit from Master only
• 75% duty-cycle square waveform
• Terminates LOW
“1”
• Occupies one symbol period
• Transmit from Master only
• 50% duty-cycle square waveform
• Terminates LOW
“D”
• Occupies two symbol periods
• Master stops driving the SWIF and “listens” for
acknowledge pulse from the Slave
• Slave pulls ACKB LOW to reverse the direction of
data flow through the transformer
“A” • Slave's DBACK will drive the SWIF pri_rx line
between 50% points of the adjacent periods - in
this interval Master must de-assert pri_tx_en_n
• Terminates with pri_tx = LOW and pri_tx_en_n =
LOW
• Occupies one symbol period, but can be repeated
indefinitely
• Transmit from Master only
• Always LOW
“L” • Does not carry any meaningful information
• Used as an inter-frame symbol, i.e., sent by the
Master between valid data frames
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Product Folder Links: DAC161P997
8k
A
B
C
DIN
DBACK
to SWIF
decoder
DAC161P997
ACKB
COMD
³'011'$'´
Symbol
Period
25 50 75
Symbol
Period
25 50 75
Symbol
Period
25 50 75
Symbol
Period
25 50 75
Symbol
Period
25 50 75
Symbol
Period
25 50 75
Symbol
Period
25 50 75
pri_tx
pri_rx
pri_tx_en_n
driven by Slave
driven by Master
Symbol
Period
25 50 75
DAC161P997
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SNAS515G –JULY 2011–REVISED DECEMBER 2014
Figure 13. Symbol Stream Example
7.5.1.4 Interface Circuit
SWIF interface components are shown in Figure 14. The buffers A and B comprise a square waveform recovery
circuit in applications where a pulse transformer is used to cross the galvanic isolation boundary, see
Transformer Coupled Interface - Data Flow to the DAC. The ACKB output and its internal NMOS switch provide
the means of reversing the direction of data flow through the coupling transformer see Transformer Coupled
Interface - Acknowledge Pulse. In simple cases where the data link is DC coupled buffer A alone acts as a data
receiver. The buffer C is provided for cases where improved noise immunity is required, see DC-Coupled
Interface.
Figure 14. SWIF Front End
7.5.1.4.1 Transformer Coupled Interface - Data Flow to the DAC
In systems requiring galvanic isolation between the transmitter (micro-controller) and the receiver, the commonly
used coupling element is a pulse transformer. Transformer passes only the AC components of the square input
waveform resulting in an impulse train across the secondary winding. Buffers A and B form a latch circuit around
the secondary winding that recovers the square waveform from the impulse train.
Figure 15 shows the details of the square waveform transmission from the primary side and recovery of the
signal on the secondary side. Transmitter’s DC component is blocked by the capacitor CP. The transmitter’s
output waveform VO results in the impulse train VP across the primary winding. Similar impulse train then
appears across the secondary winding. If the magnitude of the impulse exceeds the threshold on the A buffer,
the latch formed by A and B buffers will change state. The new latch state will persist until an opposite polarity
impulse appears across the secondary winding.
Note that in Figure 15 the capacitor CS bottom plate floats, and thus does not affect the operation of this circuit.
Copyright © 2011–2014, Texas Instruments Incorporated Submit Documentation Feedback 15
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Handshake pulse
(Acknowledge)
DIN
DBACK
A
B
DAC161P997
ACKB
COMD
N.C.
PRIMARY SIDE SECONDARY SIDE
CS
(Tx)
FET ON
DIN
DBACK
PRIMARY SIDE
A
B
DAC161P997
VOto SWIF
decoder
ACKB
SECONDARY SIDE
CS
CP
+
-
VP
VP
Tx
FET OFF
COMD
DAC161P997
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Figure 15. Transformer-Coupled SWIF Link With the DAC161P997 as Receiver
7.5.1.4.2 Transformer Coupled Interface - Acknowledge Pulse
Since the transformer is a symmetrical device (particularly one with 1:1 winding ratio), it is simple to reverse the
data flow through it.
Figure 16 shows the SWIF interface circuit during the transmission of the Acknowledge pulse from the
DAC161P997 on the secondary side back to the micro-controller on the primary side.
On the secondary side buffer B drives the square waveform across the transformer. Capacitor CS, whose bottom
plate is now grounded via the ACKB pin, blocks the DC component of the square waveform. Buffer A is inactive.
On the primary side a square waveform recovery is performed by the now familiar latch.
Figure 16. Transformer-Coupled SWIF Link With the DAC161P997 as Transmitter
7.5.1.4.3 DC-Coupled Interface
DC coupled signal path between the transmitter and the receiver is shown in Figure 17. Such circuit as the
internal buffer A is sufficient for the signal recovery as the signal presented at the DIN input is a square CMOS
level waveform.
In noisy environments it may be necessary to implement a Hysteresis loop around the DIN input to improve noise
immunity of the input circuit. Presence of the buffer C and its output resistor facilitate this. The Hysteresis can be
easily realized by inserting RIN between the transmitter and DIN input.
Note that when RIN = 0 the presence of the buffer C can be ignored.
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LLP LLS
LM
CWP
VP
I2
VS = VP
I1I1' = I2
+
-
CWS
++
- -
RPRS
I
8k
A
C
DIN
RIN
to SWIF
decoder
DAC161P997
Tx
DAC161P997
www.ti.com
SNAS515G –JULY 2011–REVISED DECEMBER 2014
Figure 17. DC-Coupled SWIF Input
7.5.1.4.4 Transformer Selection and SWIF Data Link Circuit Design
In general, the transformers developed for T1/E1 telecom applications are well suited as the interface element for
the DAC161P997 in the galvanically isolated industrial transmitter. The application circuit schematic utilizing
T1/E1 transformer as the isolation element is shown in Typical Application. A number of suggested off the shelf
transformers are listed in Table 3.
Table 3. Examples of Transformers Suitable in the DAC161P997 Applications
Manufacturer P/N LM(mH) LLP/LLS (µH) RP/RS(Ω) CWW (pF) Isolation Voltage (Vrms)
Pulse TX1491 1.2 1.2 2.7 35 1500
Coilcraft S5394–CLB 0.4 Not Specified 0.95 0.92 1500
Halo TG02-1205 1.2 Not Specified 0.7 30 1500
XFMRS XF7856-GD11 0.785 0.5 0.52 Not Specified 1500
Model suitable for simulating the behavior of the pulse transformer is shown in Figure 18. The model parameters
are readily available in the datasheets provided by the transformer manufacturers, see Table 3 for examples.
Figure 18. Pulse Transformer Model - Winding Ratio 1:1
Table 4. Transformer Model Parameters' Legend
Parameter Description
LMMagnetizing inductance, in Data Sheets shown as OCL (open circuit inductance)
LLP/S Leakage inductance of the primary (secondary) winding
Winding capacitance. Dominated by the CWW (winding to winding) component. Here it is assumed
CWP/S that CWS=CWP=½CWW
RP/S Winding resistance
The circuit behavior will be dominated by the DC blocking capacitance CPand the magnetizing inductance LM. In
the example circuit shown in Figure 19 the rising edge of VO ultimately results in an impulse at the input DIN,
see Figure 20. Once voltage at DIN is above VIH of the A buffer, the A buffer will change its state. However, the
latch will acquire a new state only if the voltage at DIN persists above VIH for TPEAK > TD.
The parasitic elements in the transformer model: LLS, LSP, CWS, CWP may result in the oscillating component
superimposed on the dominant impulse response waveform shown in Figure 20. The oscillation should be
controlled so that the condition TPEAK> TD is maintained. The typical method for controlling this parasitic
oscillation is to insert a damping element into the signal path. A small resistance in series with transformer
winding is such damping element. The typical application example in Typical Application illustrates this.
The delay around the SWIF input latch, from DIN to DBACK, TD is specified in Electrical Characteristics.
Copyright © 2011–2014, Texas Instruments Incorporated Submit Documentation Feedback 17
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0V
VDD
VO
VIH
0V
VS
TPEAK
Dominant response
Response due to
parasitics
DELAY=TD
CP
CDIN
A
DAC161P997
Transformer
Model B
DIN
DBACK
Tx
VP
+
-
VS
+
-
RO
VO
+
-
Use IDEAL
device models
DAC161P997
SNAS515G –JULY 2011–REVISED DECEMBER 2014
www.ti.com
Figure 19. NRZ Waveform Transmission and Recovery Circuit Model
Figure 20. SWIF Link Circuit Response to Step-Input
7.6 Register Maps
7.6.1 LCK
Address=0x00; Default=0x00
Bit Field Name Description
0x95 - registers unlocked
0x** - any value written locks registers
7:0 A register lock prevents inadvertent changes to the configuration. The DAC output cannot be
updated while software configuration registers are unlocked.
7.6.2 CONFIG1
Address=0x01; Default=0x08
Bit Field Name Description
7:5 RESERVED. Always write 0.
0b00 - NOP
0b01 - set error
0b10 - clear error
0b11 - NOP
4:3 SERR Sets or clears the error condition. At power-on the error is set. Error is also cleared after
reception of valid SWIF frame. These bits are self clearing.
This functionality can be used for diagnostic purposes, e.g. Master can use SERR to force
ILOOP into an error band, and then return it to previously held output level.
2:1 RESERVED. Always write 0.
0 - NOP
0 RST 1- same as power-on reset. Once device is reset to default state the bit clears automatically
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7.6.3 CONFIG2
Address=0x02; Default=0x1F
Bit Field Name Description
7:5 RESERVED. Always write 0.
Set to enable ACK
4 ACK_EN When enabled, an acknowledgement is indicated on the serial interface upon detection of
each valid frame. See Frame Format.
3 FRAME Set to enable framing error reporting. See table in Error Detection and Reporting.
2 PARITY Set to enable parity error reporting. See table in Error Detection and Reporting.
1 CHANNEL Set to enable channel-inactive reporting. See table in Error Detection and Reporting.
0 LOOP Set to enable loop error reporting. See table in Error Detection and Reporting.
7.6.4 CONFIG3
Address=0x03; Default=0x08
Bit Field Name Description
7:4 RESERVED. Always write 0.
0 <= RX_ERR_CNT ≤15 Threshold = 1 + RX_ERR_CNT
The slave enters the error state once ‘Threshold’ number of consecutive FRAME or PARITY
3:0 RX_ERR_CNT errors are counted. The threshold is programmable to prevent occasional errors from being
reported. See table in Error Detection and Reporting.
7.6.5 ERR_LOW
Address=0x04; Default=0x24
Bit Field Name Description
8-bit value. If ERRLVL = LOW, the DAC will use the value stored in ERR_LOW register to set
the output current sourced from OUT pin when reporting an error condition. The ERR_LOW
7:0 value is used as the upper byte of the DACCODE, while the lower byte is forced to 0x00. At
power up the ERR_LOW defaults to a value which forces IERRL output current. See Electrical
Characteristics.
7.6.6 ERR_HIGH
Address=0x05; Default=0xE8
Bit Field Name Description
If ERRLVL = HIGH, the DAC will use the value stored in ERR_HIGH register to set the output
current sourced from OUT pin when reporting an error condition. The ERR_HIGH value is used
7:0 as the upper byte of the DACCODE, while the lower byte is forced to 0x00. At power-up the
ERR_HIGH defaults to a value which forces IERRH output current. See Electrical
Characteristics.
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DAC
-+
IDAC
IAUX
ILOOP
LOOP+
LOOP-
R1 = 80k
+
-
IDIA
BASE
OUT
COMA
R2 = 40
IE
I2
DAC161P997
VD VA
RE
DAC161P997
SNAS515G –JULY 2011–REVISED DECEMBER 2014
www.ti.com
8 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
8.1 Application Information
8.1.1 16-BIT DAC and Loop Drive
8.1.1.1 DC Characteristics
The DAC converts the 16-bit input code in the DACCODE register to an equivalent current output. The ∑Δ DAC
output is a current pulse which is then filtered by a 3rd order RC low-pass filter and boosted to produce the loop
current ILOOP at the device OUT pin.
Figure 21 shows the principle of operation of the DAC161P997 in the Loop Powered Transmitter - the circuit
details were omitted for clarity. In this figure IDand IArepresent supply (quiescent) currents of the internal digital
and analog blocks. IAUX represents supply (quiescent) current of companion devices present in the system, such
as the voltage regulator and the SWIF channel.
By observing that the control loop formed by the amplifier and the bipolar transistor forces the voltage across R1
and R2to be equal, it can be shown that, under normal conditions, the ILOOP is dependent only on IDAC through
the following relationship:
(1)
While ILOOP has a number of component currents, ILOOP = IDAC+ID+IA+IAUX+IE, it is only IEthat is regulated by the
loop to maintain the relationship shown above.
Since it is only IE’s magnitude that is controlled, not its direction, there is a lower limit to ILOOP. This limit is
dependent on the fixed components IAand ID, and on system implementation through IAUX.
Figure 21. Loop-Powered Transmitter
Figure 22 shows the variant of the transmitter where the supply currents to the system blocks are provided by the
local supply, and not the 4 - 20 mA loop Self-Powered Transmitter. Same basic relationship between the ILOOP
and IDAC holds, but the component currents of ILOOP are only IDAC and IE.
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DAC
-+
IDAC
IAUX
ILOOP
LOOP+
LOOP-
R1 = 80k
+
-
IDIA
BASE
OUT
COMA
DAC161P997
VD VA
VLOCAL
+
-
IE
R2 = 40 I2
RE
DAC161P997
www.ti.com
SNAS515G –JULY 2011–REVISED DECEMBER 2014
Application Information (continued)
Figure 22. Self-Powered Transmitter
8.1.1.1.1 DC Input-Output Transfer Function
The output current sourced by the OUT pin of the device is expressed by:
(2)
The valid DACCODE range is the full 16-bit code space (0x0000 to 0xFFFF), which results in the IDAC range of 0
to approximately 12 μA. This, however, does not result in the ILOOP range of 0 to 24 mA.
The maximum output current sourced out of OUT pin, ILOOP, is 24 mA. The minimum output current is dependent
on the system implementation. The minimum output current is the sum of supply currents of the DAC161P997
internal blocks, IA, ID, and companion devices present in the system, IAUX. The last component current IEcan
theoretically be controlled down to 0 but, due to the stability considerations of the control loop, it is advised not to
allow the IEto drop below 200 μA.
The graph in Figure 23 shows the DC transfer characteristic of the 4 - 20 mA transmitter, including minimum
current limits. The minimum current limit for the Loop-Powered Transmitter is typically around 400 μA
(ID+IA+IAUX+IE). The minimum current limit for the Self-Powered Transmitter is typically around 200 μA (IE).
Typical values for IDand IAare listed in Electrical Characteristics. IEdepends on the BJT device used.
Copyright © 2011–2014, Texas Instruments Incorporated Submit Documentation Feedback 21
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ILOOP (mA)
DACCODE (hex)
full accuracy range
24.0
21.5
20.0
4.0
3.5
0.4
0.2
0000
0222
2500
2AAA
D555
E500
FFFF
0444
Programmable IERROR
Programmable IERROR
MIN(ILOOP) ± Loop Powered
MIN(ILOOP) ± Self Powered
DAC161P997
SNAS515G –JULY 2011–REVISED DECEMBER 2014
www.ti.com
Application Information (continued)
Figure 23. DAC-DC Transfer Function
8.1.1.1.2 Loop Interface
The DAC161P997 cannot directly interface to the typical 4 - 20 mA loop due to the excessive loop supply
voltage. The loop interface has to provide the means of stepping down the LOOP Supply down to 3.6V. This can
be accomplished with either a linear regulator (LDO) or switching regulator while keeping in mind that the
regulator’s quiescent current will have direct effect on the minimum achievable ILOOP (see DC Input-Output
Transfer Function).
The second component of the loop interface is the external NPN transistor (BJT). This device is part of the
control circuit that regulates the transmitter’s output current (ILOOP). Since the BJT operates over the wide current
range, spanning at least 4 - 20 mA, it is necessary to degenerate the emitter in order to stabilize transistor’s
transconductance (gm). The degeneration resistor of 22Ωis suggested in typical applications. For circuit details,
see Typical Application.
The NPN BJT should not be replaced with an N-channel FET (Field Effect Transistor) for the following reasons:
discrete FET’s typically have high threshold voltages (VT), in the order of 1.5 V to 2 V, which is beyond the
BASE output maximum range; discrete FET’s present higher load capacitance which may degrade system
stability margins; and BASE output relies on the BJT’s base current for biasing.
8.1.1.1.3 Loop Compliance
The maximum V(LOOP+,LOOP-) potential is limited by the choice of step-down regulator, and the external BJT’s
Collector Emitter breakdown voltage. For minimum V(LOOP+, LOOP−) potential consider Figure 22. Here,
observe that V(LOOP+,LOOP−)≅min(VCE)+ILOOPRE+ ILOOPR2= min(VCE) + 0.53V + 0.96V = 3.66V, at ILOOP =
24mA. The voltage drop across internal R2is specified in Electrical Characteristics.
8.1.1.2 AC Characteristics
The approximate frequency dependent characteristics of the loop drive circuit can be analyzed using the circuit in
Figure 24:
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A(s) = s
Ao&o
LOOP+
LOOP-
R1R2
+
-
A(s)Gm
IDAC
IAUX
-+
ILOOP
ve
ILOOP
A(s)Gmve
ro
LOOP+
LOOP-
DAC161P997
BASE
OUT
COMA
RX1
CX1 CX2
CX3
CX4
-+
A(s) gm
+
-
IAUX
R1R2
RE
Gm
IDAC
ro
DAC161P997
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SNAS515G –JULY 2011–REVISED DECEMBER 2014
Application Information (continued)
Figure 24. Capacitances Affecting Control Loop
Here it is assumed that the internal amplifier dominates the frequency response of the system, and it has a single
pole response. The BJT’s response, in the bandwidth of the control loop, is assumed to be frequency
independent and is characterized by the transconductance gmand the output resistance ro.
As in previous sections IDAC and IAUX represent the filtered output of the ∑Δ modulator and the quiescent current
of the companion devices.
The circuit in Figure 24 can be further simplified by omitting the on-board capacitances, whose effect will be
discussed in Stability, and by combining the amplifier, the external transistor and resistor REinto one Gmblock.
The resulting circuit is shown in Figure 25.
By assuming that the BJT’s output resistance (ro) is large, the loop current ILOOP can be expressed as:
(3)
Figure 25. AC Analysis Model of a Transmitter
The sum of voltage drops around the path containing R1, R2and veis:
(4)
an assumption is made on the response of the internal amplifier::
(5)
Copyright © 2011–2014, Texas Instruments Incorporated Submit Documentation Feedback 23
Product Folder Links: DAC161P997
ILOOP = IDAC (1 + + IAUX
R1
R2)s
R2
RE
Ao&o
R2
RE
s + Ao&oR2
RE
s + Ao&o
&
R1
R2)
0 dB
AoGmR2&o
ILOOP = IDAC (1 + + IAUX
R1
R2)s
s + AoGmR2&o
AoGmR2&os + AoGmR2&o
20 log (1 +
DAC161P997
SNAS515G –JULY 2011–REVISED DECEMBER 2014
www.ti.com
Application Information (continued)
By combining the above the final expression for the ILOOP as a function of 2 inputs IDAC and IAUX is:
(6)
The result above reveals that there are 2 distinct paths from the inputs IDAC and IAUX to the output ILOOP. IDAC
follows the low-pass, and the IAUX follows the high-pass path.
In both cases the corner frequency is dependent on the effective transconductance, Gm, of the external
transistor. This implies that control loop dynamics could vary with the output current ILOOP if Gmwere allowed to
be just native device transconductance gm. This undesirable behavior is mitigated by the degenerating resistor
REwhich stabilizes Gmas follows:
(7)
This results in the frequency response which is largely independent of the output current ILOOP:
(8)
While the bandwidth of the IDAC path may not be of great consequence given the low frequency nature of the 4-
20 mA current loop systems, the location of the pole in the IAUX path directly affects PSRR of the transmitter
circuit. This is further discussed in PSRR.
8.1.1.2.1 Step Response
The transient input-output characteristics of the DAC161P997 are dominated by the response of the RC filter at
the output of the ∑Δ DAC. Settling times due to step input are shown in Typical Characteristics.
8.1.1.2.2 Output Impedance
The output impedance is described as:
(9)
By considering the circuit in Figure 25, and setting IDAC = IAUX = 0, the following expression can be obtained:
(10)
As in AC Characteristics an assumption can be made on the frequency response of the internal amplifier, and
the effective transconductance Gmshould be stabilized with external REleading to:
(11)
The output impedance of the transmitter is a product of the external BJT's output resistance ro, and the frequency
characteristics of the internal amplifier. At low frequencies this results in a large impedance that does not
significantly affect the output current accuracy.
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Application Information (continued)
8.1.1.2.3 PSRR
Power Supply Rejection Ratio is defined as the ability of the current control loop to reject the variations in the
supply current of the companion devices, IAUX. Specifically:
(12)
It was shown in AC Characteristics that the IAUX affects ILOOP via the high-pass path whose corner frequency is
dependent on the effective Gm of the external BJT. If that dependence were not mitigated with the degenerating
resistor RE, the PSRR would be degraded at low output current ILOOP.
The typical PSRR performance of the transmitter shown in Typical Application is shown in Typical
Characteristics.
8.1.1.2.4 Stability
The current control loop's stability is affected by the impedances present in the system. Figure 24 shows the
simplified diagram of the control loop, formed by the on-board amplifier and an external BJT, and the lumped
capacitances CX1 through CX4 that model any other external elements.
CX1 typically represents a local step-down regulator, or LDO, and any other companion devices powered from the
LOOP+. This capacitance reduces the stability margins of the control loop, and therefore it should be limited.
RX1 can be used to isolate CX1 from LOOP+ node and thus remedy the stability margin reduction. If RX1 = 0, CX1
cannot exceed 10 nF. RX1 = 200Ωis recommended if it can be tolerated. Minimum RX1 = 40Ωif CX1 exceeds 10
nF.
CX3 also adversely affects stability of the loop and it must be limited to 20 pF. CX4 affects the control loop in the
same way as CX1, and it should be treated in the same way as CX1. CX2 is the only capacitance that improves
stability margins of the control loop. Its maximum size is limited only by the safety requirements.
Stability is a function of ILOOP as well. Since ILOOP is approximately equal to the collector current of the external
BJT, Gmof the BJT, and thus loop dynamics, depend on ILOOP. This dependence can be reduced by
degenerating the emitter of the BJT with a small resistance as discussed in Loop Interface. Inductance in series
with the LOOP+ and LOOP−do not significantly affect the control loop.
8.1.1.2.5 Noise and Ripple
The output of the DAC is a current pulse train. The transition density varies throughout the DAC input code range
(ILOOP range). At the extremes of the code range, the transition density is the lowest which results in low
frequency components of the DAC output passing through the RC filter. Hence, the magnitude of the ripple
present in ILOOP is the highest at the ends of the transfer characteristic of the device (see Typical
Characteristics).
It should be noted that at wide noise measurement bandwidth, it is the ripple due to the ∑Δ modulator that
dominates the noise performance of the device throughout the entire code range of the DAC. This results in the
“U” shaped noise characteristic as a function of output current. At narrow bandwidths, and particularly at mid-
scale output currents, it is the amplifier driving the external BJT that starts to dominate as a noise source.
8.1.1.2.6 Digital Feedthrough
Digital feedthrough is indiscernible from the ripple induced by the ∑Δ modulator.
8.1.1.2.7 HART Signal Injection
The HART specification requires minimum suppression of the sensor signal in the HART signal band (1-2 kHz) of
about 60 dB. The filter in Figure 26 below meets that requirement.
Copyright © 2011–2014, Texas Instruments Incorporated Submit Documentation Feedback 25
Product Folder Links: DAC161P997
OE1
OE4
OE3
OE2
A1
A2
A3
A4
Y1
Y2
Y3
Y4
DBACK
DIN
ACKB
VAVD
COMACOMD
LOW
ERRLVL C1
C2
C3
BASE
OUT
IN
OUT
GND
TPS79801 22P
22
40
40
1n
1n
100n 100n
20
100
300p
2.2n 2.2n 2.2n
74LVC125
DAC161P997
PRI_RX
PRI_TX
PRI_TX_EN
1k
IN
OUT
OUT
PC
1P
100n
LOOP+
LOOP-
Coilcraft
S5394
EN
FB
3.3P
100k
158k
4.1V
IDAC
ILOOP
LOOP+
LOOP-
80k 40
15k 15k 15k
390n 6.8n 220n 1n
VHART
15 mV
1 mA
500 mV
VH
VH
DAC161P997
C1 C2 C3
BASE
OUT
COMA
virtual ground
500 nA
IHART
RE
DAC161P997
SNAS515G –JULY 2011–REVISED DECEMBER 2014
www.ti.com
Application Information (continued)
Figure 26. HART Signal Injection
8.1.1.2.8 RC Filter Limitation
In an effort to speed up the transient response of the device the user can reduce the capacitances associated
with the low-pass filter at the output of the ∑Δ modulator. However, to maintain stability margins of the current
control loop it is necessary to have at least C1= C2= C3= 1nF.
8.2 Typical Application
26 Submit Documentation Feedback Copyright © 2011–2014, Texas Instruments Incorporated
Product Folder Links: DAC161P997
pri_tx / pri_rx
pri_tx_en_n
1:1
DAC161P997
(Slave)
a
d
c
b
DIN
DBACK
ACKB
Master
COMD
74LVC125
pri_tx / pri_rx
pri_tx_en_n
74LVC125
1:1
DAC161P997
(Slave)
a
d
c
b
DIN
DBACK
ACKB
Master
COMD
DAC161P997
www.ti.com
SNAS515G –JULY 2011–REVISED DECEMBER 2014
Typical Application (continued)
8.2.1 Design Requirements
An example of implementation of the SWIF data link is shown in Detailed Design Procedure below. This
implementation uses the components already present in the systems employing the standard methods for PWM
signal transmission over an isolation boundary. Additional configuration examples show how the system can be
expanded or simplified depneding on the requirements of hte system and capabilities of the Master controller.
8.2.2 Detailed Design Procedure
In this example Master uses 2 digital I/Os:
• One bidirectional port for transmitting encoded data to, and receiving the acknowledge signal from the slave –
pri_tx/pri_rx.
• One output sourcing the pri_tx_en_n signal that governs the direction of the data flow over the SWIF link.
While transmitting, Master drives the pri_tx_en_n LOW and sources data stream onto the pri_tx. The circuit path
is through buffer ‘a’, transformer primary winding, DC blocking capacitor to GND.
While receiving, Master drives the pri_tx_en_n HIGH and ‘listens’ for acknowledge signal pri_rx. In this mode the
buffers ‘a’ and ‘b’ form the latch around the transformer winding, and buffer ‘c’ floats the DC blocking capacitor.
Figure 27. Typical SWIF Implementation
The interface implementation shown in Figure 27 can be expanded or simplified depending on the requirements
of the system and capabilities of the Master controller. A number of other possible implementations are shown in
the figures below.
Figure 28 shows the circuit analogous in its functionality to the circuit in Figure 27 but with fewer active
components. Here instead of disabling ‘b’ buffer during data transmission, its output impedance is increased to
the point where its drive is significant only during the data reception form the Slave.
Figure 28. SWIF Link With Simplified Control
Copyright © 2011–2014, Texas Instruments Incorporated Submit Documentation Feedback 27
Product Folder Links: DAC161P997
pri_tx
ackb
DAC161P997
(Slave)
DIN
DBACK
ACKB
Master
COMD
pri_tx
1:1
DAC161P997
(Slave)
DIN
DBACK
ACKB
Master
COMD
pri_rx
pri_tx_en_n
1:1
DAC161P997
(Slave)
a
d
c
b
DIN
DBACK
ACKB
Master
pri_tx
COMD
74LVC125
DAC161P997
SNAS515G –JULY 2011–REVISED DECEMBER 2014
www.ti.com
Typical Application (continued)
Figure 29 shows the SWIF link circuit when the Master does not have a bidirectional I/O available. The Master
output driving pri_tx is split away from the Master receiving pri_rx input by using a buffer ‘d’, until now unused, on
74LVC125.
Figure 29. Master Without Bidirectional I/O
Figure 30 shows the trivial circuit realization of the SWIF link in simplex mode, unidirectional data flow.
Figure 30. SWIF Without Acknowledge Capability
Figure 31 shows the DC coupled SWIF link realization. In this example ACKB output is used to generate the
Acknowledge pulse. This is equivalent to the Acknowledge pulse generated at DBACK, since in transformer
coupled application both ACKB and DBACK have to be pulsed to transmit back to the Master. Note that the
pulse generated by ACKB is active LOW.
Figure 31. DC-Coupled SWIF Link
28 Submit Documentation Feedback Copyright © 2011–2014, Texas Instruments Incorporated
Product Folder Links: DAC161P997
4 6 8 10 12 14 16 18 20
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
2.0
2.5
INL ( µA)
OUTPUT CURRENT (mA)
DAC161P997
(Slave)
DIN
DBACK
ACKB
COMD
Master
pri_tx_b
pri_rx_b
DAC161P997
www.ti.com
SNAS515G –JULY 2011–REVISED DECEMBER 2014
Typical Application (continued)
The SWIF link realization using opto-couplers (opto-isolators) is shown in Figure 32. Points of note here are: the
opto-couplers invert the SWIF symbol waveform, and there is increased power consumption due to the relatively
large currents required to turn on the internal diodes and standing current in the pull-up resistors.
Figure 32. SWIF Link Realized With Octo-Couplers
8.2.3 Application Curve
Unless otherwise noted, these specifications apply for VA = VD = 3.3 V, COMA = COMD = 0 V, TA= 25°C, external bipolar
transistor: 2N3904, RE = 22 Ω, C1 = C2 = C3 = 2.2 nF.
Figure 33. Linearity vs ILOOP
Copyright © 2011–2014, Texas Instruments Incorporated Submit Documentation Feedback 29
Product Folder Links: DAC161P997
DAC161P997
SNAS515G –JULY 2011–REVISED DECEMBER 2014
www.ti.com
9 Power Supply Recommendations
The DAC161P997 requires a voltage supply within 2.7 V and 3.6 V. Multilayer ceramic bypass X7R capacitors of
0.1μF between the VA and GND pins, and between the VD and GND pins are recommended. If the supply is
located more than a few inches from the DAC161P997, additional bulk capacitance may be required in addition
to the ceramic bypass capacitors. An electrolytic capacitor with a value of 10 μF or 22 μF is a typical choice
10 Layout
10.1 Layout Guidelines
To maximize the performance of the DAC161S997 in any application, good layout practices and proper circuit
design must be followed. A few recommendations specific to the DAC161S997 are:
• Make sure that VD and VA have decoupling capacitors local to the respective terminals.
• Minimize trace length between the C1, C2, and C3 capacitors and the DAC161S997 pins.
10.2 Layout Example
Figure 34 and Figure 35 show the DAC161S997 evaluation module (EVM) layout
Figure 34. Example PCB layout: Top Layer
Figure 35. Example PCB layout: Bottom Layer
30 Submit Documentation Feedback Copyright © 2011–2014, Texas Instruments Incorporated
Product Folder Links: DAC161P997
DAC161P997
www.ti.com
SNAS515G –JULY 2011–REVISED DECEMBER 2014
11 Device and Documentation Support
11.1 Third-Party Products Disclaimer
TI'S PUBLICATION OF INFORMATION REGARDING THIRD-PARTY PRODUCTS OR SERVICES DOES NOT
CONSTITUTE AN ENDORSEMENT REGARDING THE SUITABILITY OF SUCH PRODUCTS OR SERVICES
OR A WARRANTY, REPRESENTATION OR ENDORSEMENT OF SUCH PRODUCTS OR SERVICES, EITHER
ALONE OR IN COMBINATION WITH ANY TI PRODUCT OR SERVICE.
11.2 Trademarks
All trademarks are the property of their respective owners.
11.3 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
11.4 Glossary
SLYZ022 —TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
Copyright © 2011–2014, Texas Instruments Incorporated Submit Documentation Feedback 31
Product Folder Links: DAC161P997
PACKAGE OPTION ADDENDUM
www.ti.com 13-Sep-2014
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead/Ball Finish
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
DAC161P997CISQ/NOPB ACTIVE WQFN RGH 16 1000 Green (RoHS
& no Sb/Br) CU SN Level-3-260C-168 HR -40 to 105 161P997
DAC161P997CISQX/NOPB ACTIVE WQFN RGH 16 4500 Green (RoHS
& no Sb/Br) CU SN Level-3-260C-168 HR -40 to 105 161P997
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
PACKAGE OPTION ADDENDUM
www.ti.com 13-Sep-2014
Addendum-Page 2
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
DAC161P997CISQ/NOPB WQFN RGH 16 1000 178.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
DAC161P997CISQX/NOP
BWQFN RGH 16 4500 330.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
PACKAGE MATERIALS INFORMATION
www.ti.com 20-Sep-2016
Pack Materials-Page 1
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
DAC161P997CISQ/NOPB WQFN RGH 16 1000 210.0 185.0 35.0
DAC161P997CISQX/NOP
BWQFN RGH 16 4500 367.0 367.0 35.0
PACKAGE MATERIALS INFORMATION
www.ti.com 20-Sep-2016
Pack Materials-Page 2
www.ti.com
PACKAGE OUTLINE
C
SEE TERMINAL
DETAIL
16X 0.3
0.2
2.6 0.1
16X 0.5
0.3
0.8 MAX
(A) TYP
0.05
0.00
12X 0.5
4X
1.5
B4.1
3.9 A
4.1
3.9 0.3
0.2
0.5
0.3
WQFN - 0.8 mm max heightRGH0016A
PLASTIC QUAD FLATPACK - NO LEAD
4214978/B 01/2017
DIM A
OPT 1 OPT 1
(0.1) (0.2)
PIN 1 INDEX AREA
0.08
SEATING PLANE
1
49
12
58
16 13
(OPTIONAL)
PIN 1 ID
0.1 C A B
0.05
EXPOSED
THERMAL PAD
17 SYMM
SYMM
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for optimal thermal and mechanical performance.
SCALE 3.000
DETAIL
OPTIONAL TERMINAL
TYPICAL
www.ti.com
EXAMPLE BOARD LAYOUT
0.07 MIN
ALL AROUND
0.07 MAX
ALL AROUND
16X (0.25)
16X (0.6)
( 0.2) TYP
VIA
12X (0.5)
(3.8)
(3.8)
(1)
( 2.6)
(R0.05)
TYP
(1)
WQFN - 0.8 mm max heightRGH0016A
PLASTIC QUAD FLATPACK - NO LEAD
4214978/B 01/2017
SYMM
1
4
58
9
12
13
16
SYMM
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE:15X
17
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
SOLDER MASK
OPENING
METAL UNDER
SOLDER MASK
SOLDER MASK
DEFINED
EXPOSED METAL
METAL
SOLDER MASK
OPENING
SOLDER MASK DETAILS
NON SOLDER MASK
DEFINED
(PREFERRED)
EXPOSED METAL
www.ti.com
EXAMPLE STENCIL DESIGN
16X (0.6)
16X (0.25)
12X (0.5)
(3.8)
(3.8)
4X ( 1.15)
(0.675)
TYP
(0.675) TYP
(R0.05)
TYP
WQFN - 0.8 mm max heightRGH0016A
PLASTIC QUAD FLATPACK - NO LEAD
4214978/B 01/2017
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
SYMM
TYP
EXPOSED METAL
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
EXPOSED PAD 17
78% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGE
SCALE:20X
SYMM
1
4
58
9
12
13
16
17
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