REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor CAGE 69210. Add case outline U. Editorial changes throughout. 91-05-07 M. A. FRYE B Changes in accordance with NOR 5962-R088-93. 93-03-15 M. A. FRYE C Changes in accordance with NOR 5962-R206-94. 94-06-14 M. A. FRYE D Changes in accordance with NOR 5962-R216-96. 96-09-12 R. MONNIN E Add radiation hardness requirements. Redrawn. - rrp 00-04-19 R. MONNIN F Add case outline Y. - ro 02-04-30 R. MONNIN G Drawing updated to reflect current requirements. - rrp 05-07-19 R. MONNIN H Make correction to Load regulation test unit column as specified under Table I. Make a change to IOUT under footnote 3/ as specified under Table I. - ro 05-08-10 R. MONNIN J Update drawing as part of the 5 year review. - jt 10-11-17 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV J J J J J J J J J J J J OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY MARCIA B. KELLEHER STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http://www.dscc.dla.mil CHECKED BY CHARLES REUSING APPROVED BY THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A MICHAEL A. FRYE DRAWING APPROVAL DATE MICROCIRCUIT, LINEAR, NEGATIVE ADJUSTABLE REGULATOR MONOLITHIC SILICON 88-01-08 REVISION LEVEL J SIZE CAGE CODE A 67268 SHEET DSCC FORM 2233 APR 97 5962-87741 1 OF 12 5962-E084-11 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87741 01 X A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number 01 Circuit function 1033 3.0 A negative regulator, adjustable 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals T See figure 1 3 U See figure 1 3 X Y MBFM1-P2 See figure 1 2 3 Package style TO-257 flange mounted with non-isolated tab and glass sealed TO-257 flange mounted with isolated tab and glass sealed TO-3 can Flange mount, glass sealed with gull wing leads 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Input to output voltage differential ................................................................... Power dissipation (PD) ................................................................................... Lead temperature (soldering, 10 seconds) ..................................................... Junction temperature (TJ) ............................................................................... Storage temperature range ............................................................................. Thermal resistance, junction-to-case (JC): Case T ........................................................................................................ Cases U and Y ............................................................................................ Case X ........................................................................................................ 35 V dc Internally limited +300C +150C -65C to +150C 2.3C/W 3.5C/W 3.0C/W 1.4 Recommended operating conditions. Ambient operating temperature range (TA) .................................................... -55C to +125C 1.5 Radiation features: Maximum total dose available (dose rate = 50 - 300 rads(Si) / s) ................... 30 Krads (Si) 1/ ______ 1/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87741 A REVISION LEVEL J SHEET 2 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 MIL-HDBK-780 - List of Standard Microcircuit Drawings. Standard Microcircuit Drawings. (Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for nonJAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MILPRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MILPRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device. 3.5.1 Certification/compliance mark. A compliance indicator "C" shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator "C" shall be replaced with a "Q" or "QML" certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87741 A REVISION LEVEL J SHEET 3 TABLE I. Electrical performance characteristics. Test Symbol Reference voltage 4/ VREF Conditions 1/ 2/ 3/ -55C TA +125C unless otherwise specified Group A subgroups Device type 1 01 |VIN - VOUT| = 5.0 V, Limits Unit Min -1.238 Max -1.262 1 -1.238 -1.262 1,2,3 -1.215 -1.285 1 -1.215 -1.285 1,2,3 -1.215 -1.285 1 -1.215 -1.285 1,2,3 -1.215 -1.285 1 -1.215 -1.285 1,2,3 -1.215 -1.285 1 -1.215 -1.285 1,2,3 -1.215 -1.285 1 -1.215 -1.285 V IOUT = 5.0 mA, TA = +25C M,D,P |VIN - VOUT| = 3 V, IOUT = 5 mA, 3 A M,D,P |VIN - VOUT| = 10 V, IOUT = 5 mA, 3 A M,D,P |VIN - VOUT| = 20 V, IOUT = 5 mA, 1.5 A M,D,P |VIN - VOUT| = 30 V, IOUT = 5 mA, 0.7 A M,D,P |VIN - VOUT| = 35 V, IOUT = 5 mA, 0.5 A Line regulation 5/ VOUT/ M,D,P 1 3.0 V |VIN - VOUT| 35 V M,D,P VIN 3.0 V |VIN - VOUT| 35 V Load regulation 5/ VOUT/ 10 mA IOUT 3 A, IOUT |VOUT| 5.0 V 10 mA IOUT 3 A, 0.015 1 0.015 2,3 0.04 1 M,D,P 01 01 50 1 50 2,3 75 1 1.0 1 1.0 2,3 1.5 %/V mV |VOUT| 5.0 V 10 mA IOUT 3 A, |VOUT| 5.0 V M,D,P 10 mA IOUT 3 A, % |VOUT| 5.0 V Thermal regulation --- 1 10 ms pulse, TA = +25C M,D,P 01 0.02 1 %/W 0.02 See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87741 A REVISION LEVEL J SHEET 4 TABLE I. Electrical performance characteristics - Continued. Test Symbol Ripple rejection 6/ Conditions 1/ 2/ 3/ -55C TA +125C unless otherwise specified VIN / VOUT = -10 V, f = 120 Hz, VREF CADJ = 0 Group A subgroups Device type 4 01 M,D,P VOUT = -10 V, f = 120 Hz, Limits Min 56 4 56 5, 6 53 4 70 4 70 5, 6 60 Unit Max dB CADJ = 0 VOUT = -10 V, f = 120 Hz, CADJ = 10 F M,D,P VOUT = -10 V, f = 120 Hz, CADJ = 10 F Adjust pin current IADJ 1,2,3 VDIFF = 35 V, IL = 10 mA M,D,P Adjust pin current change IADJ 1,2,3 10 mA IOUT 3 A 3.0 V |VIN - VOUT| 35 V M,D,P IMIN |VIN - VOUT| 10 V M,D,P 4/ ICL 01 2.0 2.0 1,2,3 5.0 1 5.0 01 5.0 1 5.0 1,2,3 3.0 1 3.0 1 3.0 6.0 1 3.0 6.0 |VIN - VOUT| 10 V 2,3 3.0 |VIN - VOUT| = 20 V 1,2,3 1.5 1 1.5 |VIN - VOUT| 10 V M,D,P M,D,P A 100 1 1,2,3 |VIN - VOUT| 35 V M,D,P Current limit 100 1 M,D,P Minimum load current 01 01 A mA A See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87741 A REVISION LEVEL J SHEET 5 TABLE I. Electrical performance characteristics - Continued. Test Symbol Current limit 4/ ICL Conditions 1/ 2/ 3/ -55C TA +125C unless otherwise specified Group A subgroups Device type 1,2,3 01 |VIN - VOUT| = 30 V M,D,P VOUT / A 1 0.5 2.5 1 0.5 2.5 |VIN - VOUT| = 35 V 2,3 0.5 -55C TJ +125C 1,2,3 01 Unit Max 0.7 M,D,P 6/ Min 0.7 1 |VIN - VOUT| = 35 V Temperature stability Limits 1.5 % T M,D,P Long term stability 6/ VOUT/ TA = +125C, t t = 1000 hours 1 2 1.5 01 1.0 % 1/ Devices supplied to this drawing will meet all levels M, D, P of irradiation. However, this device is only tested at the `P' level. Pre and Post irradiation values are identical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TA = +25C. 2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. 3/ Unless otherwise specified, these specifications apply for |VIN - VOUT| = 5.0 V and IOUT = 5 mA. 4/ Current limit is folded back for input to output voltage above 10 V. 30 W power dissipation is guaranteed only for 10 V VIN - VOUT 20 V. Below 10 V, the 3 A current limit applies, and above 20 V, guaranteed current limit will reduce maximum guaranteed power to less than 30 W. 5/ Regulation is measured on the output at a point 1/8 inch below the base of the package using a pulsed low duty cycle technique. 6/ Guaranteed, if not tested, to the limits specified in table I herein. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87741 A REVISION LEVEL J SHEET 6 Case outlines T and U Letter A A1 A2 b D D1 D3 e E L O P Inches Min .190 .035 Millimeters Max .200 .045 Min 4.83 0.89 .035 .665 .430 .065 0.64 16.38 10.41 0.00 .422 .750 .537 .150 10.41 12.70 13.39 3.56 .120 BSC .025 .645 .410 .000 3.05 BSC .100 BSC .410 .500 .527 .140 Max 5.08 1.14 0.89 16.89 10.92 1.65 2.54 BSC 10.72 19.05 16.64 3.81 NOTE: The U.S. government preferred system of measurement is the metric SI system. However, since this item was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch-pound units, the inch-pound units shall take precedence. FIGURE 1. Case outline. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87741 A REVISION LEVEL J SHEET 7 Case outline Y Symbol Inches Min .190 --.410 .580 ----.410 .090 .115 A b D D1 e e1 E L1 L N Millimeters Min Max 4.83 5.33 --0.76 10.41 10.92 14.73 15.49 --2.54 --5.08 10.41 10.67 2.29 2.79 2.92 3.18 3 Max .210 .030 .430 .610 .100 .200 .420 .110 .125 3 NOTE: The U.S. government preferred system of measurement is the metric SI system. However, since this item was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch-pound units, the inch-pound units shall take precedence. FIGURE 1. Case outline - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87741 A REVISION LEVEL J SHEET 8 Device type 01 Case outlines X U T Y Terminal number 1 Terminal symbol ADJUST ADJUST ADJUST ADJUST 2 VOUT VIN VIN VIN 3 VIN (CASE) --- VOUT VOUT VOUT NC VIN --- 4 NC = No connection FIGURE 2. Terminal connections. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87741 A REVISION LEVEL J SHEET 9 Case U FIGURE 3. Radiation exposure circuit. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87741 A REVISION LEVEL J SHEET 10 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Interim electrical parameters (method 5004) Final electrical test parameters (method 5004) Group A test requirements (method 5005) Groups C and D end-point electrical parameters (method 5005) Group E end-point electrical parameters (method 5005) Subgroups (in accordance with MIL-STD-883, method 5005, table I) 1 1*, 2, 3, 4, 5, 6 1, 2, 3, 4, 5, 6 1 1, 4 * PDA applies to subgroup 1. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87741 A REVISION LEVEL J SHEET 11 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA = +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.3 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). RHA levels shall be as specified in MIL-PRF-38535 or MIL-PRF-38535, Appendix A. End-point parameters shall be as specified in table II herein. 4.3.3.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883 method 1019, condition A and as specified herein. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform DLA Land and Maritime when a system application requires configuration control and the applicable SMD to that system. DLA Land and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DLA Land and Maritime -VA, telephone (614) 692-0547. 6.5 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbus, Ohio 432183990, or telephone (614) 692-0540. 6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MILHDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DLA Land and Maritime -VA. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-87741 A REVISION LEVEL J SHEET 12 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 10-11-17 Approved sources of supply for SMD 5962-87741 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/. Standard microcircuit drawing PIN 1/ 5962-8774101TA Vendor CAGE number 3/ Vendor similar PIN 2/ OM3914NT/883B 5962-8774101UA 3/ 3/ 60264 3/ 60264 3/ 3/ 60264 3/ FM1033S7 OM3914ST/883B MTLT1033QP OM3914NKM/883B MTLT1033QK LT1033MK/883 OM3914SRM/883B MTLT1033QU OMR3914STM/883B 5962-8774101XA 5962-8774101YA 5962P8774101UA 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. 3/ Not available from an approved source of supply. Vendor CAGE number 60264 Vendor name and address Minco Technology Labs, Inc. 1805 Rutherford Lane Austin, TX 78754-5101 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.