100304 Low Power Quint AND/NAND Gate General Description Features The 100304 is monolithic quint AND/NAND gate. The Function output is the wire-NOR of all five AND gate outputs. All inputs have 50 kX pull-down resistors. Y Y Y Y Y Y Logic Symbol Low Power Operation 2000V ESD protection Pin/function compatible with 100104 Voltage compensated operating range e b4.2V to b 5.7V Available to industrial grade temperature range Available to MIL-STD-883 Logic Equation F e (D1a # D2a) a (D1b # D2b) a D1c # D2c) a (D1d # D2d) a (D1e # D2e). Pin Names Dna - Dne F Oa - Oe Oa - Oe Description Data Inputs Function Output Data Outputs Complementary Data Outputs TL/F/10581-1 Connection Diagrams 24-Pin DIP 28-Pin PCC 24-Pin Quad Cerpak TL/F/10581 - 4 TL/F/10581 - 3 TL/F/10581-2 C1995 National Semiconductor Corporation TL/F/10581 RRD-B30M105/Printed in U. S. A. 100304 Low Power Quint AND/NAND Gate July 1992 Absolute Maximum Ratings Recommended Operating Conditions Above which the useful life may be impaired (Note 1) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. b 65 C to a 150 C Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic Plastic VEE Pin Potential to Ground Pin Input Voltage (DC) Output Current (DC Output HIGH) ESD (Note 2) Case Temperature (TC) Commercial Industrial Military 0 C to a 85 C b 40 C to a 85 C b 55 C to a 125 C Supply Voltage (VEE) a 175 C a 150 C b 5.7V to b 4.2V b 7.0V to a 0.5V VEE to a 0.5V b 50 mA t 2000V Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Commercial Version DC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND, TC e 0 C to a 85 C (Note 3) Parameter Min Typ Max Units VOH Symbol Output HIGH Voltage b 1025 b 955 b 870 mV VOL Output LOW Voltage b 1830 b 1705 b 1620 mV VOHC Output HIGH Voltage b 1035 VOLC Output LOW Voltage VIH Input HIGH Voltage VIL Input LOW Voltage IIL Input LOW Current IIH Input High Current D2a - D2e D1a - D1e IEE Power Supply Current mV Conditions VIN e VIH (Max) or VIL (Min) Loading with 50X to b2.0V VIN e VIH(Min) or VIL (Max) Loading with 50X to b2.0V b 1610 mV b 1165 b 870 mV Guaranteed HIGH Signal for All Inputs b 1830 b 1475 mV Guaranteed LOW Signal for All Inputs mA VIN e VIL (Min) 250 350 mA VIN e VIH(Max) b 30 mA Inputs open 0.50 b 69 b 43 Note 3: The specified limits represent the ``worst case'' value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under ``worst case'' conditions. DIP AC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND Symbol Parameter TC e 0 C TC e a 25 C TC e a 85 C Min Max Min Max Min Max Units tPLH tPHL Propagation Delay Dna - Dne to O, O 0.40 1.75 0.40 1.65 0.40 1.75 ns tPLH tPHL Propagation Delay Data to F 1.00 2.60 1.00 2.60 1.15 3.20 ns tTLH tTHL Transition Time 20% to 80%, 80% to 20% 0.35 1.20 0.35 1.20 0.35 1.20 ns 2 Conditions Figures 1 and 2 Commercial Version (Continued) PCC and Cerpak AC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND Symbol TC e a 25 C TC e a 85 C Min TC e 0 C Max Min Max Min Max Parameter Units tPLH tPHL Propagation Delay Dna - Dne to O, O 0.40 1.55 0.40 1.45 0.40 1.55 ns tPLH tPHL Propagation Delay Data to F 1.00 2.40 1.00 2.40 1.15 3.00 ns tTLH tTHL Transition Time 20% to 80%, 80% to 20% 0.35 1.10 0.35 1.15 0.35 1.10 ns Conditions Figures 1 and 2 Industrial Version PCC DC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND, TC e b40 C to a 85 C (Note 1) Symbol Parameter TC e b40 C Min VOH TC e 0 C to a 85 C Max Min Output HIGH Voltage b 1085 b 870 b 1025 b 870 VOL Output LOW Voltage b 1830 b 1575 b 1830 b 1620 VOHC Output HIGH Voltage b 1095 VOLC Output LOW Voltage VIH Input HIGH Voltage VIL Input LOW Voltage IIL Input LOW Current IIH Input HIGH Current D2a - D2e D1a - D1e IEE Power Supply Current b 1035 b 1565 Units Conditions Max mV VIN e VIH (Max) or VIL (Min) Loading with 50X to b2.0V mV VIN e VIH(Min) or VIL (Max) Loading with 50X to b2.0V b 1610 b 1170 b 870 b 1165 b 870 mV Guaranteed HIGH Signal for All Inputs b 1830 b 1480 b 1830 b 1475 mV Guaranteed LOW Signal for All Inputs mA VIN e VIL (Min) 250 350 mA VIN e VIH (Max) b 30 mA Inputs Open 0.50 0.50 250 350 b 69 b 30 b 69 Note 1: The specified limits represent the ``worst case'' value for the parameter. Since these values normally occur at the temperature extremes, additional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under ``worst case'' conditions. 3 Industrial Version (Continued) PCC AC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND Symbol TC e 40 C Parameter TC e a 25 C TC e a 85 C Units Min Max Min Max Min Max tPLH tPHL Propagation Delay Dna - Dne to O, O 0.35 1.55 0.40 1.45 0.40 1.55 ns tPLH tPHL Propagation Delay Data to F 1.00 2.40 1.00 2.40 1.15 3.00 ns tTLH tTHL Transition Time 20% to 80%, 80% to 20% 0.35 1.10 0.35 1.15 0.35 1.10 ns Conditions Figures 1 and 2 Military Version DC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND, TC e b55 C to a 125 C Symbol Parameter VOH Output HIGH Voltage VOL Output LOW Voltage VOHC Output HIGH Voltage VOLC Output LOW Voltage VIH Input HIGH Voltage VIL Input LOW Voltage IIL Input LOW Current Min b 1025 b 870 b 1085 b 870 b 1830 b 1620 b 1830 b 1555 IEE TC mV 0 C to a 125 C mV b 55 C mV 0 C to a 125 C mV b 55 C Conditions Notes VIN e VIH (Max) or VIL (Min) Loading with 50X0 to b2.0V 1, 2, 3 VIN e VIH (Min) or VIL (Max) Loading with 50X to b2.0V 1, 2, 3 0 C to mV b 1085 mV b 55 C b 1610 mV 0 C to a 125 C b 1555 mV b 55 C b 1165 b 870 mV b 55 C a 125 C Guaranteed HIGH Signal for All Inputs 1, 2, 3, 4 b 1830 b 1475 mV b 55 C to a 125 C Guaranteed LOW Signal for All Inputs 1, 2, 3,4 mA b 55 C to a 125 C VEE e b4.2V VIN e VIL (Min) 1, 2, 3 VEE e b5.7V VIN e VIH (Max) 1, 2, 3 Inputs Open 1, 2, 3 0.50 D2a - D2e D1a - D1e Power Supply Current Units b 1035 Input High Current D2a - D2e D1a - D1e IIH Max b 75 a 125 C 250 350 mA 0 C to 350 500 mA b 55 C b 25 mA b 55 C to a 125 C a 125 C Note 1: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals b 55 C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides ``cold start'' specs which can be considered a worst case condition at cold temperatures. Note 2: Screen tested 100% on each device at b 55 C, a 25 C, and a 125 C, Subgroups, 1, 2 3, 7, and 8. Note 3: Sample tested (Method 5005, Table I) on each manufactured lot at b 55 C, a 25 C, and a 125 C, Subgroups A1, 2, 3, 7, and 8. Note 4: Guaranteed by applying specified input condition and testing VOH/VOL. 4 Military Version (Continued) AC Electrical Characteristics VEE e b4.2V to b5.7V, VCC e VCCA e GND Symbol Parameter TC e b55 C TC e a 25 C Min Max Min Max TC e a 125 C Min Max Units tPLH tPHL Propagation Delay Dna - Dne to O, O 0.30 1.90 0.40 1.80 0.30 2.30 ns tPLH tPHL Propagation Delay Data to F 0.80 2.90 0.90 2.80 0.90 3.40 ns tTLH tTHL Transition Time 20% to 80%, 80% to 20% 0.20 1.80 0.30 1.60 0.20 2.00 ns Conditions Notes 1, 2, 3 Figures 1 and 2 4 Note 1: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals b 55 C), then testing immediately after power-up. This provides ``cold start'' specs which can be considered a worst case condition at cold temperatures. Note 2: Screen tested 100% on each device at a 25 C temperature only, Subgroup A9. Note 3: Sample tested (Method 5005, Table I) on each mfg. lot at a 25 C, Subgroup A9, and at a 125 C and b 55 C temperatures, Subgroups A10 and A11. Note 4: Not tested at a 25 C, a 125 C, and b 55 C temperature (design characterization data). Test Circuitry Switching Waveforms TL/F/10581 - 5 Notes: VCC, VCCA e a 2V, VEE e b 2.5V L1 and L2 e equal length 50X impedance lines RT e 50X terminator internal to scope Decoupling 0.1 mF from GND to VCC and VEE All unused outputs are loaded with 50X to GND CL e Fixture and stray capacitance s 3 pF TL/F/10581 - 6 FIGURE 2. Propagation Delay and Transition Times FIGURE 1. AC Test Circuit 5 Ordering Information The device number is used to form part of a simplified purchasing code where a package type and temperature range are defined as follows: 100304 D C QB Device Type (Basic) Special Variation QB e Military grade device with environmental and burn-in processing Package Code D e Ceramic DIP F e Quad Cerpak Q e Plastic Leaded Chip Carrier (PCC) P e Plastic DIP Temperature Range C e Commercial (0 C to a 85 C) I e Industrial (b40 C to a 85 C) (PCC only) M e Military (b55 C to a 125 C) Physical Dimensions inches (millimeters) 24-Pin Ceramic Dual-In-Line Package (D) NS Package Number J24E 6 Physical Dimensions inches (millimeters) (Continued) 24-Pin Plastic Dual-In-Line Package (P) NS Package Number N24E 24-Pin Quad Cerpak (F) NS Package Number W24B 7 100304 Low Power Quint AND/NAND Gate Physical Dimensions inches (millimeters) (Continued) Lit. Y 114902 28-Pin Plastic Leaded Chip Carrier (Q) NS Package Number V28A LIFE SUPPORT POLICY NATIONAL'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. National Semiconductor Corporation 1111 West Bardin Road Arlington, TX 76017 Tel: 1(800) 272-9959 Fax: 1(800) 737-7018 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. National Semiconductor Europe Fax: (a49) 0-180-530 85 86 Email: cnjwge @ tevm2.nsc.com Deutsch Tel: (a49) 0-180-530 85 85 English Tel: (a49) 0-180-532 78 32 Fran3ais Tel: (a49) 0-180-532 93 58 Italiano Tel: (a49) 0-180-534 16 80 National Semiconductor Hong Kong Ltd. 13th Floor, Straight Block, Ocean Centre, 5 Canton Rd. Tsimshatsui, Kowloon Hong Kong Tel: (852) 2737-1600 Fax: (852) 2736-9960 National Semiconductor Japan Ltd. Tel: 81-043-299-2309 Fax: 81-043-299-2408 National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.