FODM214, FODM217 Series
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2
SAFETY AND INSULATIONS RATING
As per DIN EN/IEC 60747−5−5, this optocoupler is suitable for “safe electrical insulation” only within the safety limit data.
Compliance with the safety ratings shall be ensured by means of protective circuits.
Parameter Characteristics
Installation Classifications per DIN VDE 0110/1.89 Table 1,
For Rated Mains Voltage
< 150 VRMS I–IV
< 300 VRMS I–III
Climatic Classification 55/110/21
Pollution Degree (DIN VDE 0110/1.89) 2
Comparative Tracking Index 175
Symbol Parameter Value Unit
VPR Input−to−Output Test Voltage, Method A, VIORM x 1.6 = VPR,
Type and Sample Test with tm = 10 s, Partial Discharge < 5 pC
904 Vpeak
Input−to−Output Test Voltage, Method B, VIORM x 1.875 = VPR,
100% Production Test with tm = 1 s, Partial Discharge < 5 pC
1060 Vpeak
VIORM Maximum Working Insulation Voltage 565 Vpeak
VIOTM Highest Allowable Over−Voltage 4,000 Vpeak
External Creepage ≥ 5 mm
External Clearance ≥ 5 mm
DTI Distance Through Insulation (Insulation Thickness) ≥ 0.4 mm
TSCase Temperature (Note 1) 150 °C
IS,INPUT Input Current (Note 1) 200 mA
PS,OUTPUT Output Power (Note 1) 300 mW
RIO Insulation Resistance at TS, VIO = 500 V (Note 1) > 109W
1. Safety limit values – maximum values allowed in the event of a failure.
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise specified.)
Symbol Parameter Value Units
TSTG Storage Temperature −55 to +150 °C
TOPR Operating Temperature −55 to +110 °C
TJJunction Temperature −55 to +125 °C
TSOL Lead Solder Temperature
(Refer to Reflow Temperature Profile)
260 for 10 sec °C
EMITTER
IF(average) Continuous Forward Current 50 mA
IF(peak) Peak Forward Current (1 ms pulse, 300 pps) 1 A
VRReverse Input Voltage 6 V
PDLED Power Dissipation (Note 2) 70 mW
DETECTOR
IC(average) Continuous Collector Current 50 mA
VCEO Collector−Emitter Voltage 80 V
VECO Emitter−Collector Voltage 7 V
PDCCollector Power Dissipation (Note 2) 150 mW
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
2. Functional operation under these conditions is not implied. Permanent damage may occur if the device is subjected to conditions outside
these ratings.