749808-9 - Tyco Electronics

Product

Specification 108-40005

02Feb09 Rev E

AMPLIMITE* HDP-20 Subminiature D Connector With F

Crimp Contacts

Harrisburg , PA

All International Rights Reserved.

* Trademark

| Indicates change For latest revision, visit our website at www.tycoelectroni cs.com\documents.

For Regional Customer Service, visit our website at www.tycoelectronics.com 1 of 10

LOC B

1. SCOPE

1.1. Content

This specification covers the perform ance, test and quality requirem ents for the AM PLIMITE* HD P-20

subm iniature D connectors with removable F crim p contacts. The assem bly consists of a two piece

plastic housing which has integral plastic retention tines and two m etal shells which secure the housing

components.

1.2. Qualification

Wh e n te s ts a re p e r for me d o n th e s ub j e c t p r o d u ct lin e, t h e p roce du r e s s pe cif ie d in F igu r e 1 s h a ll b e

used. All inspections shall be perform ed using the applicable inspection plan and product drawing.

1.3 . Q u a lification T e s t R e su lts

Successful qualification testing on the subject product line was com pleted on 06O ct89. T he

Q ualification Test R eport num ber for this testing is 501-99. T his documentation is on file at and

availab le from E ngineering Prac tic es and S tanda rds (EP S).

2. APPLICABLE DOCUMENTS

The following docum ents form a part of this specification to the extent specified herein. Unless

otherwise specified, the latest edition of the docum ent applies. In the event of conflict between the

requirem ents of this specification and the product drawing, the product drawing shall take precedence.

In the event of conflict between the requirem ents of this specification and the referenced docum ents,

this specification shall take precedence.

2.1 . T yc o E lec tro nic s D o cu me n ts

!114-40030: Application Specification (AM PLIMIT E* HDP-20 & Econom y Crimp Snap

Subm iniature D Comm ercial Connectors)

!5 0 1 - 9 9 : Qu a lif ic a tio n Te s t Re p o r t ( A MP L IMITE* HD P-2 0 Su bmin ia tu r e D Co n n e c tor With F C r imp

Contacts)

2.2. Ind us try Stan dard

EIA-364: Electrical Connector/Sock et Test Procedures Including Environm ental Classifications

2.3. Reference D ocum ent

109-197: Test Specification (AMP T est Specifications vs EIA and IEC Test Methods)

3. REQUIREMENTS

3.1. Design and Construction

Product shall be of the design, construction and physical dim ensions specified on the applicable product

drawing.

108-40005

R ev E 2 of 10

3.2. Material

Materials used in the construction of this product shall be as specified on the applicable product

drawing.

3.3. Ratings

!Voltage: 250 volts AC

!Current: Fully loaded and energized connectors, see Figure 4

| • 18 AWG: 3.1 am peres

| • 22 AWG: 2.0 am peres

• 28 AWG: 1.2 am peres

!Temperature: -55 to 105/C

3.4. Performance and Test Description

P ro du c t is de s ign e d to me et th e e lec trica l, mec h a nic al an d en v iron me nta l pe rfo rman c e req u iremen ts

specified in Figure 1. Unless otherwise specified, all tests are performed at am bient tem perature.

3.5. Tes t Req uirem en ts and P roc edure s S ummary

T est D esc ription R equirement Proc edure

Exam ination of product. Meets requirements of product

drawing and Application

Specification 114-40030.

EIA-364-18.

Visual and dim ensional (C of C)

inspection per product drawing.

Final exam ination of product. Meets visual requirements. EIA-364-18.

Visual inspection.

ELECTRICAL

Low level contact resistance. 15 m illiohm s m axim um . EIA-364-23.

Subject specimens to 100

m illiamperes m axim um and 20

milliv o lts ma x imu m o p e n c ir c u it

voltage.

See Figure 3.

Contact resistance, specified

current. Wire T est Resistance

Size Current Maximum

(AWG ) (amperes) (m illiohms)

18 3.1 15

20 2.4 15

22 2.0 15

24 1.6 15

26 1.3 15

28 1.2 15

EIA-364-6.

Measure potential drop of mated

contacts assem bled in housing.

Calculate resistance.

See Figure 3.

In s u la tion re sis tan c e . 5 0 0 0 me g o h ms min imum in itia l.

5 0 0 me g o h ms min imu m f in a l. EIA-364-21.

Test between adjacent contacts of

unm ated specimens.

Withstanding voltage. O ne m inute hold with no breakdown

or flas ho ver. 0.5 m illiampere

ma ximu m lea k a g e c u rre n t.

E IA -36 4 -2 0 , C on d ition I.

1 0 0 0 v o lts AC a t s e a le v e l.

Test between adjacent contacts of

unm ated specimens.

Figure 1 (continued)

108-40005

T est D esc ription R equirement Proc edure

R ev E 3 of 10

Temperature rise vs current. 30/C maxim um tem perature rise at

sp e c ified c u rre n t. EIA-364-70, M ethod 1.

Stabilize at a single current level

u n til 3 read in gs a t 5 min u te in terv a ls

are within 1/C.

See Figure 4.

MECHANICAL

Vibration, random . No discontinuities of 1 m icrosecond

or longer duration.

See Note.

EIA-364-28, Test Condition V,

Condition F.

Subject m ated specimens to 20.71

G 's rms b etw e en 5 0 to 2 00 0 H z.

Fifteen minutes in eac h of 3

m utually perpendicular planes.

See Figure 5.

Mechanical shock. No discontinuities of 1 m icrosecond

or longer duration.

See Note.

EIA-364-27, Method A.

S u b je c t ma te d s p e c ime n s to 50 G's

half-sine shock pulses of 11

m illiseconds duration. Three shocks

in each direction applied along 3

m utually perpendicular planes, 18

total shocks.

See Figure 5.

Durability. See Note. EIA-364-9.

Mate and unm ate gold flash

specimens for 100 cycles, and 30

:in gold specim ens for 500 cycles

at a maximum rate of 200 cycles

per hou r.

M a ting fo rc e. Witho ut With

G ro u nd In de n ts

Size Posn (N [lbf] maxim um )

1 9 12.5 [2.8] 133.4 [30]

2 15 20.9 [4.7] 146.8 [33]

3 25 34.7 [7.8] 164.6 [37]

4 37 51.6 [11.6] 177.9 [40]

5 50 69.4 [15.6] 195.7 [44]

EIA-364-13.

M e a s ure fo rc e ne c es s a ry to ma te

specimens at a m axim um rate of

25.4 mm [1 in] per m inute.

U n ma ting forc e . With ou t With

G ro u nd In de n ts

Size Posn (N [lbf] m axim um )

1 9 12.5 [2.8] 133.4 [30]

2 15 20.9 [4.7] 146.8 [33]

3 25 34.7 [7.8] 164.6 [37]

4 37 51.6 [11.6] 177.9 [40]

5 50 69.4 [15.6] 195.7 [44]

EIA-364-13.

M e a s ure fo rc e ne c es s a ry to u nmate

specimens at a m axim um rate of

25.4 mm [1 in] per m inute.

Contact insertion force. 13.3 N [3 lbf] maximum per contact. EIA-364-5.

M ea sure force nec ess ary to insert

contact into housing.

Figure 1 (continued)

108-40005

T est D esc ription R equirement Proc edure

R ev E 4 of 10

Contact retention force. Contacts shall nor dislodge from

housing when subjected to a

minimu m fo rc e of 4 4 .5 N [1 0 lb f].

EIA-364-29.

Apply specified to contacts in an

axial direc tion and h old for 6

seconds.

Contact engaging force. 2.2 N [8 ozf] maxim um per contact. EIA-364-37.

M ea sure force nec ess ary to insert

gage A to a depth of 5.6 mm [.220

in].

See Figure 6.

Contact separating force. 0.208 N [.75 ozf] minim um per

contact. EIA-364-37.

Size 2 times us ing gage A. Insert

gage B to a depth of 5.6 mm [.220

in] an d me as u re fo rc e n e c es s a ry to

separate gage B.

See Figure 6.

C r imp te n s ile . Wir e S ize C r imp Te n s ile

(AWG ) (N [lbf] minim um)

18 120.1 [27]

20 89 [20]

22 53.4 [12]

24 35.6 [8]

26 20 [4.5]

28 12 [2.7]

EIA-364-8.

D e termine crimp te ns ile a t a

m axim um rate of 25.4 m m [1 in] per

minute.

ENVIRONMENTAL

T h e rma l sh oc k . S ee N o te . EIA -3 6 4-3 2 , T e s t C on d ition V II.

Subject unm ated specim ens to 5

cycles between -55 and 105/C.

H umid ity/ te mp e rature c yclin g. S e e No te . EIA-36 4- 3 1 , Me thod II I w ith c old

shock.

Subject m ated specimens to 10

cycles (10 days) between 25 and

65/C at 80 to 100% RH.

Temperature life. See Note. EIA-364-17, M ethod A, Test

Condition 4, Test Tim e Condition C.

Subject m ated specimens to 105/C

for 500 hours.

M ixed flowing gas. See N ote. EIA-364-6 5, Class IIIA (4 ga s).

S ub je c t ma te d s p e cime n s to

environm ental Class IIIA for 20

days.

Shall meet visual requirements, show no physical damage, and m eet requirem ents of additional

NOTE tests as sp ec ified in the Prod uct Q ua lification and Req ua lification T est Seq uenc e s how n in Figure

Figure 1 (end)

108-40005

R ev E 5 of 10

3.6. Product Qualification and Requalification Test Sequence

Test or Examination

Test Group (a)

12345

Test Sequence (b)

Initial examination of product 1 1 1 1 1

Lo w lev el co n tac t re s istan c e 3,7 2 ,8

Contact resistance, specified current 8

Ins u lation re sis tan c e 3,7

With sta n din g vo ltag e 4,8

T e mp era tu re rise vs c urr e nt 3,9

Vibration, random 5 7(c)

Mechanical shock 6

Durability 4 4 4

M a ting fo rc e 2 2 ,5

U n ma ting forc e 9 3 ,6

Contact insertion force 2

Contact retention force 9

Contact engaging force 2

Contact separating force 3

C r imp te n s ile 4

Therm al shock 5

Humidity/temperature cycling 6

T empe rature life 6

Mixed flowing gas 5

F ina l ex amina tion o f p ro du c t 1 0 10 1 0 5 1,7

(a) See paragraph 4.1.A.

NOTE (b) N um bers indicate sequence in which tests are performed.

per Quality Specification 102-950.

Figure 2

108-40005

R ev E 6 of 10

4. QUALITY ASSURANCE PROVISIONS

4.1. Qualification Testing

A. Specimen Selection

Connector housings and contacts shall be prepared in accordance with applicable Instruction

Sheets and selected at random from current production. T est groups shall consist of the following:

1. Tes t G roups 1 and 3 sha ll co nsist of 10, size 1 (9 pos ition ) crimp-s na p con nec tor m ated pairs

(plugs without grounding indents), fully loaded with crim p-snap contacts with insulation

support and crimped to 24 AWG wire. Group 1 uses gold flash and 30 gold contacts. G roup 3

uses only gold flash contacts. Cable clamps are to be used on all connectors. During vibration

and physical shock tests, screwlocks and m ale screws are to be used to secure the

connectors.

2. Tes t G roup 2 shall cons ist of 15 m ated pairs, size 5 (50 p os ition ) crimp-s na p con nec tors. Five

m ated pairs are loaded with 18 AWG wires, 5 with 24 AWG wire and 5 with 28 AWG wire.

The plugs have no grounding indents, and the wires are crimped to contacts without

in s u la tio n s up po r t. T h e c o ntac ts a r e g o ld f la s h p la te d . Ca b le c lamp s a r e to b e u se d o n a ll

connectors.

3. Test Group 4 shall consist of 30 each of contacts with insulation support crimped to 24, 26,

and 28 AWG wire. The 18, 20 and 22 AWG wires are crimped to contacts without insulation

support. The contacts are gold flash plated.

4. Test Group 5 shall consist of 5 of each size of mated pairs fully loaded with contacts. T he

plugs have grounding indents. The contacts are gold flash plated.

B. Test Sequence

Q ualification inspection shall be verified by testing specimens as specified in Figure 2.

4.2. Requalification T esting

If changes significantly affecting form , fit or function are m ade to the product or m anufacturing process,

product assurance shall coordinate requalification testing, consisting of all or part of the original testing

sequence as determ ined by developm ent/product, quality and reliability engineering.

4.3. Acceptance

Acceptance is based on verification that the product m eets the requirements of Figure 1. Failures

attributed to equipm ent, test setup or operator deficiencies shall not disqualify the product. If product

fa ilure o c cu rs , c orr e ctive ac tion s ha ll be ta k e n a n d s p e cime n s re s u bmitted fo r q u a lific a tion . T es ting to

c o n f irm c o r rectiv e a ction is r e q u ir e d b e f o re r e s u b mitt a l.

4.4. Quality Conformance Inspection

The applicable quality inspection plan shall specify the sam pling acceptable quality level to be used.

Dim ensional and functional requirements shall be in accordance with the applicable product drawing

and this specification.

108-40005

R ev E 7 of 10

Figure 3

Lo w L ev el C o n tac t R e s ista nc e M e a su re me n t P oin ts

108-40005

R ev E 8 of 10

Rated Current vs Am bient Tem perature Rating For

RMS DC

Single Circuit, I or I , M aximum Wire Gage, C ontinuous Operation

Figure 4A

C u rre n t C arr ying Ca p ab ility

Percent

Connector Loading Wire Size AWG

28 26 24 22 20 18

Single contact .384 .450 .536 .647 .795 1

26 .237 .278 .342 .400 .491 .618

50 .164 .193 .229 .277 .341 .428

76 .132 .155 .184 .222 .273 .344

100 .114 .134 .159 .192 .236 .297

To determ ine acceptable current carrying capacity per contact for percentage connector loading

NOTE and wire gage indicated, use the Multiplication Factor (F) from the above chart and multiply it tim es

th e B ase r a te d Cu r re nt f o r a s ing le cir c u it a t t h e ma x imu m a mb ie n t o p e r a ting temp er a tu r e s h o wn in

Figure 4A.

Figure 4B

Current Rating

108-40005

R ev E 9 of 10

Figure 5

Vibration and Mecha nical Shoc k M ounting Fixture

108-40005

R ev E 10 of 10

G age Part Number “A” Diameter

A 92-944011-1 .0410 +.0000/-.0001

B 92-944011-2 .0390 +.0001/-0000

1. G age Material: High speed steel lapped finish to 1 m icroinch.

NOTE 2. Do not change size or finish of "A" D iam eter w here spherical radius blends.

3. Heat Treat to RC 62-64.

4. This gage is for contact size 20.

Figure 6