Product Specification 108-40005 02Feb09 Rev E AMPLIMITE* HDP-20 Subminiature D Connector With F Crimp Contacts 1. SCOPE 1.1. Content This specification covers the perform ance, test and quality requirem ents for the AMPLIMITE* HDP-20 subm iniature D connectors with rem ovable F crim p contacts. The assem bly consists of a two piece plastic housing which has integral plastic retention tines and two m etal shells which secure the housing com ponents. 1.2. Qualification W hen tests are perform ed on the subject product line, the procedures specified in Figure 1 shall be used. All inspections shall be perform ed using the applicable inspection plan and product drawing. 1.3. Qualification Test Results Successful qualification testing on the subject product line was com pleted on 06Oct89. The Qualification Test Report num ber for this testing is 501-99. This docum entation is on file at and available from Engineering Practices and Standards (EPS). 2. APPLICABLE DOCUM ENTS The following docum ents form a part of this specification to the extent specified herein. Unless otherwise specified, the latest edition of the docum ent applies. In the event of conflict between the requirem ents of this specification and the product drawing, the product drawing shall take precedence. In the event of conflict between the requirem ents of this specification and the referenced docum ents, this specification shall take precedence. 2.1. Tyco Electronics Docum ents ! ! 2.2. 114-40030: Application Specification (AMPLIMITE* HDP-20 & Econom y Crim p Snap Subm iniature D Com m ercial Connectors) 501-99: Qualification Test Report (AMPLIMITE* HDP-20 Subm iniature D Connector W ith F Crim p Contacts) Industry Standard EIA-364: Electrical Connector/Socket Test Procedures Including Environm ental Classifications 2.3. Reference Docum ent 109-197: Test Specification (AMP Test Specifications vs EIA and IEC Test Methods) 3. REQUIREM ENTS 3.1. Design and Construction Product shall be of the design, construction and physical dim ensions specified on the applicable product drawing. (c)2009 Tyco Electronics Corporation Harrisburg, PA All International Rights Reserved. * Trademark | Indicates change For latest revision, visit our website at www.tycoelectronics.com\documents. For Regional Customer Service, visit our website at www.tycoelectronics.com 1 of 10 LOC B 108-40005 3.2. Material Materials used in the construction of this product shall be as specified on the applicable product drawing. 3.3. Ratings ! ! | | ! 3.4. Voltage: 250 volts AC Current: Fully loaded and energized connectors, see Figure 4 * 18 AW G: 3.1 am peres * 22 AW G: 2.0 am peres * 28 AW G: 1.2 am peres Tem perature: -55 to 105/C Perform ance and Test Description Product is designed to m eet the electrical, m echanical and environm ental perform ance requirem ents specified in Figure 1. Unless otherwise specified, all tests are perform ed at am bient tem perature. 3.5. Test Requirem ents and Procedures Sum m ary Test Description Requirem ent Procedure Exam ination of product. Meets requirem ents of product drawing and Application Specification 114-40030. EIA-364-18. Visual and dim ensional (C of C) inspection per product drawing. Final examination of product. Meets visual requirem ents. EIA-364-18. Visual inspection. ELECTRICAL Low level contact resistance. Contact resistance, specified current. 15 m illiohm s m axim um . W ire Test Size Current (AW G) (am peres) 18 3.1 20 2.4 22 2.0 24 1.6 26 1.3 28 1.2 Resistance Maxim um (m illiohm s) 15 15 15 15 15 15 EIA-364-23. Subject specim ens to 100 m illiam peres m axim um and 20 m illivolts m axim um open circuit voltage. See Figure 3. EIA-364-6. Measure potential drop of m ated contacts assem bled in housing. Calculate resistance. See Figure 3. Insulation resistance. 5000 m egohm s m inim um initial. 500 m egohm s m inim um final. EIA-364-21. Test between adjacent contacts of unm ated specim ens. W ithstanding voltage. One m inute hold with no breakdown EIA-364-20, Condition I. or flashover. 0.5 m illiam pere 1000 volts AC at sea level. m axim um leakage current. Test between adjacent contacts of unm ated specim ens. Figure 1 (continued) Rev E 2 of 10 108-40005 Test Description Tem perature rise vs current. Requirem ent Procedure 30/C m axim um tem perature rise at specified current. EIA-364-70, Method 1. Stabilize at a single current level until 3 readings at 5 m inute intervals are within 1/C. See Figure 4. MECHANICAL Vibration, random . No discontinuities of 1 m icrosecond EIA-364-28, Test Condition V, or longer duration. Condition F. See Note. Subject m ated specim ens to 20.71 G's rm s between 50 to 2000 Hz. Fifteen m inutes in each of 3 m utually perpendicular planes. See Figure 5. Mechanical shock. No discontinuities of 1 m icrosecond EIA-364-27, Method A. or longer duration. Subject m ated specim ens to 50 G's See Note. half-sine shock pulses of 11 m illiseconds duration. Three shocks in each direction applied along 3 m utually perpendicular planes, 18 total shocks. See Figure 5. Durability. See Note. EIA-364-9. Mate and unm ate gold flash specim ens for 100 cycles, and 30 :in gold specim ens for 500 cycles at a m axim um rate of 200 cycles per hour. Mating force. W ithout W ith Ground Indents Size Posn (N [lbf] m axim um ) 1 9 12.5 [2.8] 133.4 [30] 2 15 20.9 [4.7] 146.8 [33] 3 25 34.7 [7.8] 164.6 [37] 4 37 51.6 [11.6] 177.9 [40] 5 50 69.4 [15.6] 195.7 [44] EIA-364-13. Measure force necessary to m ate specim ens at a m axim um rate of 25.4 m m [1 in] per m inute. Unm ating force. W ithout W ith Ground Indents Size Posn (N [lbf] m axim um ) 1 9 12.5 [2.8] 133.4 [30] 2 15 20.9 [4.7] 146.8 [33] 3 25 34.7 [7.8] 164.6 [37] 4 37 51.6 [11.6] 177.9 [40] 5 50 69.4 [15.6] 195.7 [44] EIA-364-13. Measure force necessary to unm ate specim ens at a m axim um rate of 25.4 m m [1 in] per m inute. Contact insertion force. 13.3 N [3 lbf] m axim um per contact. EIA-364-5. Measure force necessary to insert contact into housing. Figure 1 (continued) Rev E 3 of 10 108-40005 Test Description Requirem ent Procedure Contact retention force. Contacts shall nor dislodge from housing when subjected to a m inim um force of 44.5 N [10 lbf]. EIA-364-29. Apply specified to contacts in an axial direction and hold for 6 seconds. Contact engaging force. 2.2 N [8 ozf] m axim um per contact. EIA-364-37. Measure force necessary to insert gage A to a depth of 5.6 m m [.220 in]. See Figure 6. Contact separating force. 0.208 N [.75 ozf] m inim um per contact. EIA-364-37. Size 2 tim es using gage A. Insert gage B to a depth of 5.6 m m [.220 in] and m easure force necessary to separate gage B. See Figure 6. Crim p tensile. W ire Size (AW G) 18 20 22 24 26 28 Crim p Tensile (N [lbf] m inim um ) 120.1 [27] 89 [20] 53.4 [12] 35.6 [8] 20 [4.5] 12 [2.7] EIA-364-8. Determ ine crim p tensile at a m axim um rate of 25.4 m m [1 in] per m inute. ENVIRONMENTAL Therm al shock. See Note. EIA-364-32, Test Condition VII. Subject unm ated specim ens to 5 cycles between -55 and 105/C. Hum idity/tem perature cycling. See Note. EIA-364-31, Method III with cold shock. Subject m ated specim ens to 10 cycles (10 days) between 25 and 65/C at 80 to 100% RH. Tem perature life. See Note. EIA-364-17, Method A, Test Condition 4, Test Tim e Condition C. Subject m ated specim ens to 105/C for 500 hours. Mixed flowing gas. See Note. EIA-364-65, Class IIIA (4 gas). Subject m ated specim ens to environm ental Class IIIA for 20 days. NOTE Shall meet visual requirements, show no physical damage, and meet requirements of additional tests as specified in the Product Qualification and Requalification Test Sequence shown in Figure 2. Figure 1 (end) Rev E 4 of 10 108-40005 3.6. Product Qualification and Requalification Test Sequence Test Group (a) Test or Exam ination 1 2 3 4 5 Test Sequence (b) Initial exam ination of product 1 1 Low level contact resistance 3,7 2,8 Contact resistance, specified current 1 1 1 8 Insulation resistance 3,7 W ithstanding voltage 4,8 Tem perature rise vs current 3,9 Vibration, random 5 7(c) Mechanical shock 6 Durability 4 Mating force 2 2,5 Unm ating force 9 3,6 4 4 Contact insertion force 2 Contact retention force 9 Contact engaging force 2 Contact separating force 3 Crim p tensile 4 Therm al shock 5 Hum idity/tem perature cycling 6 Tem perature life 6 Mixed flowing gas 5 Final exam ination of product NOTE (a) (b) (c) 10 10 10 5 1,7 See paragraph 4.1.A. Numbers indicate sequence in which tests are performed. Discontinuities shall not be measured. Energize at 18/C level for 100% loadings per Quality Specification 102-950. Figure 2 Rev E 5 of 10 108-40005 4. QUALITY ASSURANCE PROVISIONS 4.1. Qualification Testing A. Specim en Selection Connector housings and contacts shall be prepared in accordance with applicable Instruction Sheets and selected at random from current production. Test groups shall consist of the following: B. 1. Test Groups 1 and 3 shall consist of 10, size 1 (9 position) crim p-snap connector m ated pairs (plugs without grounding indents), fully loaded with crim p-snap contacts with insulation support and crim ped to 24 AW G wire. Group 1 uses gold flash and 30 gold contacts. Group 3 uses only gold flash contacts. Cable clam ps are to be used on all connectors. During vibration and physical shock tests, screwlocks and m ale screws are to be used to secure the connectors. 2. Test Group 2 shall consist of 15 m ated pairs, size 5 (50 position) crim p-snap connectors. Five m ated pairs are loaded with 18 AW G wires, 5 with 24 AW G wire and 5 with 28 AW G wire. The plugs have no grounding indents, and the wires are crim ped to contacts without insulation support. The contacts are gold flash plated. Cable clam ps are to be used on all connectors. 3. Test Group 4 shall consist of 30 each of contacts with insulation support crim ped to 24, 26, and 28 AW G wire. The 18, 20 and 22 AW G wires are crim ped to contacts without insulation support. The contacts are gold flash plated. 4. Test Group 5 shall consist of 5 of each size of m ated pairs fully loaded with contacts. The plugs have grounding indents. The contacts are gold flash plated. Test Sequence Qualification inspection shall be verified by testing specim ens as specified in Figure 2. 4.2. Requalification Testing If changes significantly affecting form , fit or function are m ade to the product or m anufacturing process, product assurance shall coordinate requalification testing, consisting of all or part of the original testing sequence as determ ined by developm ent/product, quality and reliability engineering. 4.3. Acceptance Acceptance is based on verification that the product m eets the requirem ents of Figure 1. Failures attributed to equipm ent, test setup or operator deficiencies shall not disqualify the product. If product failure occurs, corrective action shall be taken and specim ens resubm itted for qualification. Testing to confirm corrective action is required before resubm ittal. 4.4. Quality Conform ance Inspection The applicable quality inspection plan shall specify the sam pling acceptable quality level to be used. Dim ensional and functional requirem ents shall be in accordance with the applicable product drawing and this specification. Rev E 6 of 10 108-40005 Figure 3 Low Level Contact Resistance Measurem ent Points Rev E 7 of 10 108-40005 Rated Current vs Am bient Tem perature Rating For Single Circuit, IRMS or IDC, Maxim um W ire Gage, Continuous Operation Figure 4A Current Carrying Capability NOTE W ire Size AW G Percent Connector Loading 28 26 24 22 20 18 Single contact .384 .450 .536 .647 .795 1 26 .237 .278 .342 .400 .491 .618 50 .164 .193 .229 .277 .341 .428 76 .132 .155 .184 .222 .273 .344 100 .114 .134 .159 .192 .236 .297 To determine acceptable current carrying capacity per contact for percentage connector loading and wire gage indicated, use the Multiplication Factor (F) from the above chart and multiply it times the Base rated Current for a single circuit at the maximum ambient operating temperature shown in Figure 4A. Figure 4B Current Rating Rev E 8 of 10 108-40005 Figure 5 Vibration and Mechanical Shock Mounting Fixture Rev E 9 of 10 108-40005 NOTE 1. 2. 3. 4. Gage Part Num ber "A" Diam eter A 92-944011-1 .0410 +.0000/-.0001 B 92-944011-2 .0390 +.0001/-0000 Gage Material: High speed steel lapped finish to 1 microinch. Do not change size or finish of "A" Diameter where spherical radius blends. Heat Treat to RC 62-64. This gage is for contact size 20. Figure 6 Rev E 10 of 10