260
Specifications HA5022/883
Slew Rate +SR(+1) AV = +1, RF = 1K
VOUT = -2V to +2V 1, 4 +125oC, -55oC 300 - V/µs
-SR(+1) AV = +1, RF = 1K
VOUT = +2V to -2V 1, 4 +125oC, -55oC 270 - V/µs
+SR(+2) AV = +2, VOUT = -2V to +2V 1, 4 +125oC, -55oC 465 - V/µs
-SR(+2) AV = +2, VOUT = +2V to -2V 1, 4 +125oC, -55oC 350 - V/µs
Rise and Fall Time TRAV = +2, VOUT =-0.5V to -0.5V 1, 2 +125oC, -55oC - 5.5 ns
TFAV = +2, VOUT =+0.5V to +0.5V 1, 2 +125oC, -55oC - 6.0 ns
Overshoot +OS AV = +2, VOUT = -0.5V to +0.5V 1, 3 +125oC, -55oC - 35 %
-OS AV = +2, VOUT =+0.5V to -0.5V 1, 3 +125oC, -55oC - 27 %
Propagation Delay +TPAV = +2, RF = 681Ω
VOUT = 0V to 1V 1, 2 +125oC, -55oC - 10 ns
-TPAV = +2, RF = 681Ω
VOUT = 1V to 0V 1, 2 +125oC, -55oC - 9.5 ns
NOTES:
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These param-
eters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization
based upon data from multiple production runs which reflect lot-to-lot and within lot variation.
2. Measured between 10% and 90% points.
3. For 200ps input transition times. Overshoot decreases as input transition times increase, especially for AV= +1. Please refer to
Performance Curves.
4. Measured between 25% and 75% points.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS SUBGROUPS (SEE TABLE 1)
Interim Electrical Parameters (Pre Burn-In) 1
Final Electrical Test Parameters 1 (Note 1), 2, 3, 4
Group A Test Requirements 1, 2, 3, 4
Groups C and D Endpoints 1
NOTE:
1. PDA applies to Subgroup 1 only.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
Device Characterized at: VSUPPLY = ±5V, AV = +2, RF= 681Ω, RL = 400Ω, Unless Otherwise Specified.
PARAMETERS SYMBOL CONDITIONS NOTES TEMPERATURE
LIMITS
UNITSMIN MAX
Spec Number 511107-883