HY5PG1G431C(L)FP HY5PG1G831C(L)FP 1Gb DDR2 SDRAM HY5PG1G431C(L)FP HY5PG1G831C(L)FP This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any responsibility for use of circuits described. No patent licenses are implied. Rev. 1.1 / November2008 1 HY5PG1G431C(L)FP HY5PG1G831C(L)FP Revision Details Rev. History Draft Date 0.01 Initial data sheet released Jan. 2008 0.1 IDD added & typo corrected June 2008 1.0 Datasheet Revision changed June 2008 1.1 Editorial change on TOPER Rev. 1.1 / November 2008 November 2008 2 HY5PG1G431C(L)FP HY5PG1G831C(L)FP Contents 1. Description 1.1 Device Features and Ordering Information 1.1.1 Key Features 1.1.2 Ordering Information 1.1.3 Operating Frequency 1.2 Pin configuration 1.3 Pin Description 2. Maximum DC ratings 2.1 Absolute Maximum DC Ratings 2.2 Operating Temperature Condition 3. AC & DC Operating Conditions 3.1 DC Operating Conditions 3.1.1 Recommended DC Operating Conditions(SSTL_1.8) 3.1.2 ODT DC Electrical Characteristics 3.2 DC & AC Logic Input Levels 3.2.1 Input DC Logic Level 3.2.2 Input AC Logic Level 3.2.3 AC Input Test Conditions 3.2.4 Differential Input AC Logic Level 3.2.5 Differential AC Output Parameters 3.3 Output Buffer Levels 3.3.1 Output AC Test Conditions 3.3.2 Output DC Current Drive 3.3.3 OCD default characteristics 3.4 IDD Specifications & Measurement Conditions 3.5 Input/Output Capacitance 4. AC Timing Specifications 5. Package Dimensions Rev. 1.1 / November 2008 3 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 1. Description 1.1 Device Features & Ordering Information 1.1.1 Key Features * * * * * * * * * * * * * * * * * * * * * * * * * * VDD = 1.55 +/- 0.05V VDDQ = 1.55 +/- 0.05V All inputs and outputs are compatible with SSTL_15 interface 8 banks Fully differential clock inputs (CK, /CK) operation Double data rate interface Source synchronous-data transaction aligned to bidirectional data strobe (DQS, DQS) Differential Data Strobe (DQS, DQS) Data outputs on DQS, DQS edges when read (edged DQ) Data inputs on DQS centers when write (centered DQ) On chip DLL align DQ, DQS and DQS transition with CK transition DM mask write data-in at the both rising and falling edges of the data strobe All addresses and control inputs except data, data strobes and data masks latched on the rising edges of the clock Programmable CAS latency 3, 4, 5 and 6 supported Programmable additive latency 0, 1, 2, 3, 4 and 5 supported Programmable burst length 4/8 with both nibble sequential and interleave mode Internal eight bank operations with single pulsed RAS Auto refresh and self refresh supported tRAS lockout supported 8K refresh cycles /64ms JEDEC standard 60ball FBGA(x4/x8) Full strength driver option controlled by EMR On Die Termination supported Off Chip Driver Impedance Adjustment supported Read Data Strobe supported (x8 only) Self-Refresh High Temperature Entry Rev. 1.1 / November 2008 4 HY5PG1G431C(L)FP HY5PG1G831C(L)FP Ordering Information Part No. Configuration HY5PG1G431C(L)FP-XX* 256Mx4 HY5PG1G831C(L)FP-XX* 128Mx8 Package 60 Ball Note: -XX* is the speed bin, refer to the Operating Frequency table for complete part number. Hynix lead-free products are compliant to RoHS. Operating Frequency Grade tCK(ns) CL tRCD tRP Unit C4 3.75 4 4 4 Clk Y5 3 5 5 5 Clk Rev. 1.1 / November 2008 5 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 1.2 Pin Configuration & Address Table 256Mx4 DDR2 Pin Configuration(Top view: see balls through package) 7 8 9 A VSSQ DQS VDDQ DM B DQS VSSQ NC DQ1 VDDQ C VDDQ DQ0 VDDQ NC VSSQ DQ3 D DQ2 VSSQ NC VDDL VREF VSS E VSSDL CK VDD CKE WE F RAS CK ODT BA0 BA1 G CAS CS A10 A1 H A2 A0 A3 A5 J A6 A4 A7 A9 K A11 A8 A12 NC L NC A13 1 2 3 VDD NC VSS NC VSSQ VDDQ BA2 VSS VDD VDD VSS ROW AND COLUMN ADDRESS TABLE Rev. 1.1 / November 2008 ITEMS 256Mx4 # of Bank 8 Bank Address BA0,BA1,BA2 Auto Precharge Flag A10/AP Row Address A0 - A13 Column Address A0-A9, A11 Page size 1 KB 6 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 128Mx8 DDR2 PIN CONFIGURATION(Top view: see balls through package) 7 8 9 A VSSQ DQS VDDQ DM/RDQS B DQS VSSQ DQ7 DQ1 VDDQ C VDDQ DQ0 VDDQ DQ4 VSSQ DQ3 D DQ2 VSSQ DQ5 VDDL VREF VSS E VSSDL CK VDD CKE WE F RAS CK ODT BA0 BA1 G CAS CS A10 A1 H A2 A0 A3 A5 J A6 A4 A7 A9 K A11 A8 A12 NC L NC A13 1 2 3 VDD NU/RDQS VSS DQ6 VSSQ VDDQ BA2 VSS VDD VDD VSS ROW AND COLUMN ADDRESS TABLE Rev. 1.1 / November 2008 ITEMS 128Mx8 # of Bank 8 Bank Address BA0, BA1, BA2 Auto Precharge Flag A10/AP Row Address A0 - A13 Column Address A0-A9 Page size 1 KB 7 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 1.3 PIN DESCRIPTION PIN TYPE DESCRIPTION CK, CK Input Clock: CK and CK are differential clock inputs. All address and control input signals are sampled on the crossing of the positive edge of CK and negative edge of CK. Output (read) data is referenced to the crossings of CK and CK (both directions of crossing). CKE Input Clock Enable: CKE HIGH activates, and CKE LOW deactivates internal clock signals, and device input buffers and output drivers. Taking CKE LOW provides PRECHARGE POWER DOWN and SELF REFRESH operation (all banks idle), or ACTIVE POWER DOWN (row ACTIVE in any bank). CKE is synchronous for POWER DOWN entry and exit, and for SELF REFRESH entry. CKE is asynchronous for SELF REFRESH exit. After VREF has become stable during the power on and initialization sequence, it must be maintained for proper operation of the CKE receiver. For proper self-refresh entry and exit, VREF must be maintained to this input. CKE must be maintained HIGH throughout READ and WRITE accesses. Input buffers, excluding CK, CK and CKE are disabled during POWER DOWN. Input buffers, excluding CKE are disabled during SELF REFRESH. CS Input Chip Select: All commands are masked when CS is registered HIGH. CS provides for external bank selection on systems with multiple banks. CS is considered part of the command code. ODT Input On Die Termination Control: ODT (registered HIGH) enables on die termination resistance internal to the DDR2 SDRAM. When enabled, ODT is only applied to DQ, DQS, DQS, RDQS, RDQS, and DM signal for x4,x8 configurations. For x16 configuration ODT is applied to each DQ, UDQS/UDQS.LDQS/LDQS, UDM and LDM signal. The ODT pin will be ignored if the Extended Mode Register(EMR(1)) is programmed to disable ODT. RAS, CAS, WE Input Command Inputs: RAS, CAS and WE (along with CS) define the command being entered. DM (LDM, UDM) Input Input Data Mask: DM is an input mask signal for write data. Input Data is masked when DM is sampled High coincident with that input data during a WRITE access. DM is sampled on both edges of DQS, Although DM pins are input only, the DM loading matches the DQ and DQS loading. For x8 device, the function of DM or RDQS/ RDQS is enabled by EMR command to EMR(1). BA0 - BA2 Input Bank Address Inputs: BA0 - BA2 define to which bank an ACTIVE, Read, Write or PRECHARGE command is being applied (For 256Mb and 512Mb, BA2 is not applied). Bank address also determines if one of the mode register or extended mode register is to be accessed during a MR or EMR command cycle. A0 -A15 Input Address Inputs: Provide the row address for ACTIVE commands, and the column address and AUTO PRECHARGE bit for READ/WRITE commands to select one location out of the memory array in the respective bank. A10 is sampled during a precharge command to determine whether the PRECHARGE applies to one bank (A10 LOW) or all banks (A10 HIGH). If only one bank is to be precharged, the bank is selected by BA0-BA2. The address inputs also provide the op code during MRS or EMRS commands. DQ Input/Output Data input / output: Bi-directional data bus Data Strobe: Output with read data, input with write data. Edge aligned with read data, centered in write data. For the x16, LDQS correspond to the data on DQ0~DQ7; UDQS corresponds to the data on DQ8~DQ15. For the x8, an RDQS option using DM pin can be enabled via the EMR(1) to simplify read timing. The data strobes DQS, LDQS, UDQS, and RDQS may be used in single ended mode or paired with optional complementary signals DQS, LDQS,UDQS and RDQS to provide differential pair signaling to the system during both reads and writes. An EMR(1) control bit enables or disables all complementary data strobe signals. DQS, (DQS) (UDQS),(UDQS) (LDQS),(LDQS) (RDQS),(RDQS) Input/Output Rev. 1.1 / November 2008 In this data sheet, "differential DQS signals" refers to any of the following with A10 = 0 of EMR(1) x4 DQS/DQS x8 DQS/DQS if EMR(1)[A11] = 0 x8 DQS/DQS, RDQS/RDQS, if EMR(1)[A11] = 1 x16 LDQS/LDQS and UDQS/UDQS "single-ended DQS signals" refers to any of the following with A10 = 1 of EMR(1) x4 DQS x8 DQS if EMR(1)[A11] = 0 x8 DQS, RDQS, if EMR(1)[A11] = 1 x16 LDQS and UDQS 8 HY5PG1G431C(L)FP HY5PG1G831C(L)FP -ContinuedPIN TYPE DESCRIPTION No Connect: No internal electrical connection is present. NC VDDQ Supply DQ Power Supply: 1.55V +/- 0.05V VSSQ Supply DQ Ground VDDL Supply DLL Power Supply: 1.55V +/- 0.05V VSSDL Supply DLL Ground VDD Supply Power Supply: 1.55V +/- 0.05V VSS Supply Ground VREF Supply Reference voltage. Rev. 1.1 / November 2008 9 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 2. Maximum DC Ratings 2.1 Absolute Maximum DC Ratings Symbol Rating Units Notes Voltage on VDD pin relative to Vss - 1.0 V ~ 2.3 V V 1 VDDQ Voltage on VDDQ pin relative to Vss - 0.5 V ~ 2.3 V V 1 VDDL Voltage on VDDL pin relative to Vss - 0.5 V ~ 2.3 V V 1 Voltage on any pin relative to Vss - 0.5 V ~ 2.3 V V 1 -55 to +100 C 1, 2 VDD VIN, VOUT TSTG Parameter Storage Temperature II Input leakage current; any input 0V VIN VDD; all other balls not under test = 0V) -2 uA ~ 2 uA uA IOZ Output leakage current; 0V VOUT VDDQ; DQ and ODT disabled -5 uA ~ 5 uA uA Note: 1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. Storage Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement conditions. please refer to JESD51-2 standard. 2.2 Operating Temperature Condition Symbol Parameter Rating Units Notes TOPER Operating Temperature 0 to 95 C 1,2 Note: 1. Operating Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement conditions, please refer to JESD51-2 standard. 2. At 85~95 TOPER , Double refresh rate(tREFI: 3.9us) is required, and to enter the self refresh mode at this temperature range it must be required an EMRS command to change itself refresh rate. Rev. 1.1 / November 2008 10 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 3. AC & DC Operating Conditions 3.1 DC Operating Conditions 3.1.1 Recommended DC Operating Conditions (SSTL_1.8) Symbol Rating Parameter Min. Typ. Max. Units Notes VDD Supply Voltage 1.5 1.55 1.6 V 1 VDDL Supply Voltage for DLL 1.5 1.55 1.6 V 1,2 VDDQ Supply Voltage for Output 1.5 1.55 1.6 V 1,2 VREF Input Reference Voltage 0.49*VDDQ 0.50*VDDQ 0.51*VDDQ mV 3,4 VTT Termination Voltage VREF-0.04 VREF VREF+0.04 V 5 Note: 1. Min. Typ. and Max. values increase by 100mV for C3(DDR2-533 3-3-3) speed option. 2. VDDQ tracks with VDD,VDDL tracks with VDD. AC parameters are measured with VDD,VDDQ and VDD. 3. The value of VREF may be selected by the user to provide optimum noise margin in the system. Typically the value of VREF is expected to be about 0.5 x VDDQ of the transmitting device and VREF is expected to track variations in VDDQ 4. Peak to peak ac noise on VREF may not exceed +/-2% VREF (dc). 5. VTT of transmitting device must track VREF of receiving device. 6. It is backward compatible with DDR2 1.8V +/-0.1V power supply. 3.1.2 ODT DC electrical characteristics PARAMETER/CONDITION SYMBOL MIN NOM MAX UNITS NOTES Rtt effective impedance value for EMR(A6,A2)=0,1; 75 ohm Rtt1(eff) 60 75 90 ohm 1 Rtt effective impedance value for EMR(A6,A2)=1,0; 150 ohm Rtt2(eff) 120 150 180 ohm 1 Rtt effective impedance value for EMR(A6,A2)=1,1; 50 ohm Rtt3(eff) 40 50 60 ohm 1 Deviation of VM with respect to VDDQ/2 delta VM -6 +6 % 1 Note: 1. Test condition for Rtt measurements Measurement Definition for Rtt(eff): Apply VIH (ac) and VIL (ac) to test pin separately, then measure current I(VIH (ac)) and I(VIL(ac)) respectively. VIH (ac), VIL (ac), and VDDQ values defined in SSTL_18 Rtt(eff) = VIH (ac) - VIL (ac) I(VIH (ac)) - I(VIL (ac)) Measurement Definition for VM: Measurement Voltage at test pin (mid point) with no load. 2 x Vm delta VM =( Rev. 1.1 / November 2008 VDDQ - 1) x 100% 11 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 3.2 DC & AC Logic Input Levels 3.2.1 Input DC Logic Level Symbol Parameter Min. Max. Units VIH(dc) dc input logic HIGH VREF + 0.125 VDDQ + 0.3 V VIL(dc) dc input logic LOW - 0.3 VREF - 0.125 V Notes 3.2.2 Input AC Logic Level Symbol DDR2 400,533 Parameter Min. VIH (ac) ac input logic HIGH VREF + 0.250 VIL (ac) ac input logic LOW - DDR2 667,800 Units Max. Min. Max. - VREF + 0.200 - V VREF - 0.250 - VREF - 0.200 V Notes 3.2.3 AC Input Test Conditions Symbol Condition Value Units Notes VREF Input reference voltage V 1 VSWING(MAX) Input signal maximum peak to peak swing 0.5 * VDDQ 1.0 V 1 SLEW Input signal minimum slew rate 1.0 V/ns 2, 3 Note: 1. Input waveform timing is referenced to the input signal crossing through the VREF level applied to the device under test. 2. The input signal minimum slew rate is to be maintained over the range from VREF to VIH(ac) min for rising edges and the range from VREF to VIL(ac) max for falling edges as shown in the figure below. 3. AC timings are referenced with input waveforms switching from VIL(ac) to VIH(ac) on the positive transitions and VIH(ac) to VIL(ac) on the negative transitions. VDDQ VIH(ac) min VIH(dc) min VREF VSWING(MAX) VIL(dc) max delta TF Falling Slew = VREF - VIL(ac) max delta TF delta TR VIL(ac) max VSS Rising Slew = VIH(ac) min - VREF delta TR < Figure: AC Input Test Signal Waveform> Rev. 1.1 / November 2008 12 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 3.2.4 Differential Input AC logic Level Symbol Parameter VID (ac) ac differential input voltage VIX (ac) ac differential cross point voltage Min. Max. Units Notes 0.5 VDDQ + 0.6 V 1 0.5 * VDDQ - 0.175 0.5 * VDDQ + 0.175 V 2 Note: 1. VIN(DC) specifies the allowable DC execution of each input of differential pair such as CK, CK, DQS, DQS, LDQS, LDQS, UDQS and UDQS. 2. VID(DC) specifies the input differential voltage |VTR -VCP | required for switching, where VTR is the true input (such as CK, DQS, LDQS or UDQS) level and VCP is the complementary input (such as CK, DQS, LDQS or UDQS) level. The minimum value is equal to VIH(DC) - V IL(DC). VDDQ VTR Crossing point VID VIX or VOX VCP VSSQ < Differential signal levels > Note: 1. VID(AC) specifies the input differential voltage |VTR -VCP | required for switching, where VTR is the true input signal (such as CK, DQS, LDQS or UDQS) and VCP is the complementary input signal (such as CK, DQS, LDQS or UDQS). The minimum value is equal to V IH(AC) - V IL(AC). 2. The typical value of VIX(AC) is expected to be about 0.5 * VDDQ of the transmitting device and VIX(AC) is expected to track variations in VDDQ. VIX(AC) indicates the voltage at which differential input signals must cross. 3.2.5 Differential AC output parameters Symbol VOX (ac) Parameter ac differential cross point voltage Min. Max. Units Notes 0.5 * VDDQ - 0.125 0.5 * VDDQ + 0.125 V 1 Note: 1. The typical value of VOX(AC) is expected to be about 0.5 * V DDQ of the transmitting device and VOX(AC) is expected to track variations in VDDQ. VOX(AC) indicates the voltage at which differential output signals must cross. Rev. 1.1 / November 2008 13 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 3.3 Output Buffer Characteristics 3.3.1 Output AC Test Conditions Symbol VOTR Parameter Output Timing Measurement Reference Level SSTL_18 Class II Units Notes 0.5 * VDDQ V 1 SSTl_18 Units Notes - 13.4 mA 1, 3, 4 13.4 mA 2, 3, 4 Note: 1. The VDDQ of the device under test is referenced. 3.3.2 Output DC Current Drive Symbol Parameter IOH(dc) Output Minimum Source DC Current IOL(dc) Output Minimum Sink DC Current Note: 1. VDDQ = 1.7 V; VOUT = 1420 mV. (VOUT - VDDQ)/IOH must be less than 21 ohm for values of VOUT between VDDQ and VDDQ - 280 mV. 2. VDDQ = 1.7 V; VOUT = 280 mV. VOUT/IOL must be less than 21 ohm for values of VOUT between 0 V and 280 mV. 3. The dc value of VREF applied to the receiving device is set to VTT 4. The values of IOH(dc) and IOL(dc) are based on the conditions given in Notes 1 and 2. They are used to test device drive current capability to ensure VIH min plus a noise margin and VIL max minus a noise margin are delivered to an SSTL_18 receiver. The actual current values are derived by shifting the desired driver operating point (see Section 3.3) along a 21 ohm load line to define a convenient driver current for measurement. Rev. 1.1 / November 2008 14 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 3.3.3 OCD default characteristics Description Parameter Min Output impedance - Output impedance step size for OCD calibration Pull-up and pull-down mismatch Output slew rate Sout Nom Unit Notes - ohms 1 0 1.5 ohms 6 0 4 ohms 1,2,3 5 V/ns 1,4,5,6,7,8 1.5 - Max - Note : 1. Absolute Specifications ( Toper; VDD = +1.8V 0.1V, VDDQ = +1.8V 0.1V) 2. Impedance measurement condition for output source dc current: VDDQ=1.7V; VOUT=1420mV; (VOUTVDDQ)/Ioh must be less than 23.4 ohms for values of VOUT between VDDQ and VDDQ-280mV. Impedance measurement condition for output sink dc current: VDDQ = 1.7V; VOUT = 280mV; VOUT/Iol must be less than 23.4 ohms for values of VOUT between 0V and 280mV. 3. Mismatch is absolute value between pull-up and pull-dn, both are measured at same temperature and voltage. 4. Slew rate measured from vil(ac) to vih(ac). 5. The absolute value of the slew rate as measured from DC to DC is equal to or greater than the slew rate as measured from AC to AC. This is guaranteed by design and characterization. 6. This represents the step size when the OCD is near 18 ohms at nominal conditions across all process corners/variations and represents only the DRAM uncertainty. A 0 ohm value(no calibration) can only be achieved if the OCD impedance is 18 ohms +/- 0.75 ohms under nominal conditions. Output Slew rate load: VTT 25 ohms Output (Vout) Reference point 7. DRAM output slew rate specification applies to 400, 533 and 667 MT/s speed bins. 8. Timing skew due to DRAM output slew rate mis-match between DQS / DQS and associated DQs is included in tDQSQ and tQHS specification. Rev. 1.1 / November 2008 15 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 3.4 IDD Specifications & Test Conditions IDD Specifications(max) DDR2 533 Symbol DDR2 667 Units x4 x8 x4 x8 IDD0 42 42 45 45 mA IDD1 47 47 50 50 mA IDD2P 5 5 5 5 mA IDD2Q 13 13 15 15 mA IDD2N 17 17 20 20 mA F 9 9 10 10 mA S 6 6 7 7 mA IDD3N 23 23 25 25 mA IDD4W 95 95 110 110 mA IDD4R 85 85 95 95 mA IDD5 120 120 125 125 mA 5 5 5 5 mA 160 160 170 170 mA IDD3P IDD6 Normal IDD7 Rev. 1.1 / November 2008 16 HY5PG1G431C(L)FP HY5PG1G831C(L)FP IDD Test Conditions (IDD values are for full operating range of Voltage and Temperature, Notes 1-5) Symbol Conditions Units IDD0 Operating one bank active-precharge current; tCK = tCK(IDD), tRC = tRC(IDD), tRAS = tRAS min(IDD); CKE is HIGH, CS is HIGH between valid commands;Address bus inputs are SWITCHING;Data bus inputs are SWITCHING mA IDD1 Operating one bank active-read-precharge current; IOUT = 0mA;BL = 4, CL = CL(IDD), AL = 0; tCK = tCK(IDD), tRC = tRC (IDD), tRAS = tRASmin(IDD), tRCD = tRCD(IDD); CKE is HIGH, CS is HIGH between valid commands; Address bus inputs are SWITCHING; Data pattern is same as IDD4W mA IDD2P Precharge power-down current; All banks idle; tCK = tCK(IDD); CKE is LOW; Other control and address bus inputs are STABLE; Data bus inputs are FLOATING mA IDD2Q Precharge quiet standby current;All banks idle; tCK = tCK(IDD);CKE is HIGH, CS is HIGH; Other control and address bus inputs are STABLE; Data bus inputs are FLOATING mA IDD2N Precharge standby current; All banks idle; tCK = tCK(IDD); CKE is HIGH, CS is HIGH; Other control and address bus inputs are SWITCHING; Data bus inputs are SWITCHING mA IDD3P Active power-down current; All banks open; tCK = tCK(IDD); CKE is LOW; Other control and address bus inputs are STABLE; Data bus inputs are FLOATING Fast PDN Exit MR(12) = 0 mA Slow PDN Exit MR(12) = 1 mA IDD3N Active standby current; All banks open; tCK = tCK(IDD), tRAS = tRASmax(IDD), tRP =tRP(IDD); CKE is HIGH, CS is HIGH between valid commands; Other control and address bus inputs are SWITCHING; Data bus inputs are SWITCHING mA IDD4W Operating burst write current; All banks open, Continuous burst writes; BL = 4, CL = CL(IDD), AL = 0; tCK = tCK(IDD), tRAS = tRASmax(IDD), tRP = tRP(IDD); CKE is HIGH, CS is HIGH between valid commands; Address bus inputs are SWITCHING; Data bus inputs are SWITCHING mA IDD4R Operating burst read current; All banks open, Continuous burst reads, IOUT = 0mA; BL = 4, CL = CL(IDD), AL = 0; tCK = tCK(IDD), tRAS = tRASmax(IDD), tRP = tRP(IDD); CKE is HIGH, CS is HIGH between valid commands; Address bus inputs are SWITCHING; Data pattern is same as IDD4W mA IDD5B Burst refresh current; tCK = tCK(IDD); Refresh command at every tRFC(IDD) interval; CKE is HIGH, CS is HIGH between valid commands; Other control and address bus inputs are SWITCHING; Data bus inputs are SWITCHING mA IDD6 Self refresh current; CK and CK at 0V; CKE 0.2V; Other control and address bus inputs are FLOATING; Data bus inputs are FLOATING mA IDD7 Operating bank interleave read current; All bank interleaving reads, IOUT = 0mA; BL = 4, CL = CL(IDD), AL = tRCD(IDD)-1*tCK(IDD); tCK = tCK(IDD), tRC = tRC(IDD), tRRD = tRRD(IDD), tRCD = 1*tCK(IDD); CKE is HIGH, CS is HIGH between valid commands; Address bus inputs are STABLE during DESELECTs; Data pattern is same as IDD4R; - Refer to the following page for detailed timing conditions mA Rev. 1.1 / November 2008 17 HY5PG1G431C(L)FP HY5PG1G831C(L)FP Note : 1. 2. 3. 4. 5. VDDQ = 1.55 +/- 0.05V ; VDD = 1.55 +/- 0.05V IDD specifications are tested after the device is properly initialized Input slew rate is specified by AC Parametric Test Condition IDD parameters are specified with ODT disabled. Data bus consists of DQ, DM, DQS, DQS, RDQS, RDQS, LDQS, LDQS, UDQS, and UDQS. IDD values must be met with all combinations of EMR bits 10 and 11. 6. For DDR2-667 testing, tCK in the COnditions should be interpreted as tCK (avg). 7. Definitions for IDD LOW is defined as Vin VILAC (max) HIGH is defined as Vin VIHAC (min) STABLE is defined as inputs stable at a HIGH or LOW level FLOATING is defined as inputs at VREF = VDDQ/2 SWITCHING is defined as: inputs changing between HIGH and LOW every other clock cycle (once per two clocks) for address and control signals, and inputs changing between HIGH and LOW every other data transfer (once per clock) for DQ signals not including masks or strobes. Rev. 1.1 / November 2008 18 HY5PG1G431C(L)FP HY5PG1G831C(L)FP IDD Testing Parameters For purposes of IDD testing, the following parameters are to be utilized. DDR2-667 DDR2-533 Parameter 5-5-5 4-4-4 Units CL(IDD) 5 4 tCK tRCD(IDD) 15 15 ns tRC(IDD) 60 60 ns tRRD(IDD)-x4/x8 7.5 7.5 ns tRRD(IDD)-x16 10 10 ns tCK(IDD) 3 3.75 ns tRASmin(IDD) 45 45 ns tRASmax(IDD) 70000 70000 ns tRP(IDD) 15 15 ns tRFC(IDD)-256Mb 75 75 ns tRFC(IDD)-512Mb 105 105 ns tRFC(IDD)-1Gb 127.5 127.5 ns tRFC(IDD)-2Gb 197.5 197.5 ns Detailed IDD7 The detailed timings are shown below for IDD7. Changes will be required if timing parameter changes are made to the specification. Legend: A = Active; RA = Read with Autoprecharge; D = Deselect IDD7: Operating Current: All Bank Interleave Read operation All banks are being interleaved at minimum tRC(IDD) without violating tRRD(IDD) and tFAW (IDD) using a burst length of 4. Control and address bus inputs are STABLE during DESELECTs. IOUT = 0mA Timing Patterns for 4 bank devices x4/ x8/ x16 -DDR2-400 4/4/4: A0 RA0 A1 RA1 A2 RA2 A3 RA3 D D D D D -DDR2-400 3/3/3: A0 RA0 A1 RA1 A2 RA2 A3 RA3 D D D D -DDR2-533 4/4/4: A0 RA0 D A1 RA1 D A2 RA2 D A3 RA3 D D D -DDR2-533 4/4/4: A0 RA0 D A1 RA1 D A2 RA2 D A3 RA3 D D D -DDR2-667 5/5/5: A0 RA0 D D A1 RA1 D D A2 RA2 D D A3 RA3 -DDR2-667 4/4/4: A0 RA0 D D A1 RA1 D D A2 RA2 D D A3 RA3 -DDR2-800 6/6/6: A0 RA0 D D A1 RA1 D D A2 RA2 D D A3 RA3 -DDR2-800 5/5/5: A0 RA0 D D A1 RA1 D D A2 RA2 D D A3 RA3 -DDR2-800 4/4/4: A0 RA0 D D A1 RA1 D D A2 RA2 D D A3 RA3 D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D DDDDD DDDD DDD Timing Patterns for 8 bank devices x4/8 -DDR2-400 all bins: A0 RA0 A1 RA1 A2 RA2 A3 RA3 A4 RA4 A5 RA5 A6 RA6 A7 RA7 -DDR2-533 all bins: A0 RA0 A1 RA1 A2 RA2 A3 RA3 D D A4 RA4 A5 RA5 A6 RA6 A7 RA7 D D -DDR2-667 all bins: A0 RA0 D A1 RA1 D A2 RA2 D A3 RA3 D D A4 RA4 D A5 RA5 D A6 RA6 D A7 RA7 D D -DDR2-800 all bins: A0 RA0 D A1 RA1 D A2 RA2 D A3 RA3 D D D A4 RA4 D A5 RA5 D A6 RA6 D A7 RA7 D D D Rev. 1.1 / November 2008 19 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 3.5. Input/Output Capacitance Parameter Symbol DDR2 533 DDR2 667 Min Max Min Max Units Input capacitance, CK and CK CCK 1.0 2.0 1.0 2.0 pF Input capacitance delta, CK and CK CDCK x 0.25 x 0.25 pF Input capacitance, all other input-only pins CI 1.0 2.0 1.0 2.0 pF Input capacitance delta, all other input-only pins CDI x 0.25 x 0.25 pF Input/output capacitance, DQ, DM, DQS, DQS CIO 2.5 4.0 2.5 3.5 pF Input/output capacitance delta, DQ, DM, DQS, DQS CDIO x 0.5 x 0.5 pF Rev. 1.1 / November 2008 20 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 4. Electrical Characteristics & AC Timing Specification (TOPER; VDDQ = 1.55 +/- 0.05V; VDD = 1.55 +/- 0.05V) Refresh Parameters by Device Density Parameter Symbol Refresh to Active/Refresh command time tRFC Average periodic refresh interval tREFI 256Mb 512Mb 1Gb 2Gb 4Gb Units Notes 75 105 127.5 195 327.5 ns 1 0 TCASE 85 7.8 7.8 7.8 7.8 7.8 us 1 85 TCASE 95 3.9 3.9 3.9 3.9 3.9 us 1,2 Note: 1: If refresh timing is violated, data corruption may occur and the data must be re-written with valid data before a valid READ can be executed. 2. This is an optional feature. For detailed information, please refer to "operating temperature condition" in this data sheet. DDR2 SDRAM speed bins and tRCD, tRP and tRC for corresponding bin Speed DDR2-667 DDR2-533 Units Notes Parameter min min min Bin(CL-tRCD-tRP) 4-4-4 5-5-5 4-4-4 CAS Latency 4 5 4 tCK tRCD 12 15 15 ns 2 tRP 12 15 15 ns 2 tRAS 45 45 45 ns 2,3 tRC 57 60 60 ns 2 *1 Note: 1. 8 bank device Precharge All Allowance: tRP for a Precharge All command for an 8 Bank device will equal to tRP+1*tCK, where tRP are the values for a single bank Precharge, which are shown in the table above. 2. Refer to Specific Notes 32. 3. Refer to Specific Notes 3. Rev. 1.1 / November 2008 21 HY5PG1G431C(L)FP HY5PG1G831C(L)FP Timing Parameters by Speed Grade (DDR2-533) DDR2-533 Symbol Parameter Unit min max Note DQ output access time from CK/CK tAC -500 +500 ps DQS output access time from CK/CK tDQSCK -450 +450 ps CK HIGH pulse width tCH 0.45 0.55 tCK CK LOW pulse width tCL 0.45 0.55 tCK tHP min(tCL, tCH) - ps 11,12 Clock cycle time, CL=x tCK 3750 8000 ps 15 DQ and DM input setup time(differential strobe) tDS(base) 100 - ps 6,7,8,20,28 DQ and DM input hold time(differential strobe) tDH(base) 225 - ps 6,7,8,21,28 DQ and DM input setup time(single ended strobe) tDS(base) -25 - ps 6,7,8,25 DQ and DM input hold time(single ended strobe) tDH(base) -25 - ps 6,7,8,26 Control & Address input pulse width for each input tIPW 0.6 - tCK DQ and DM input pulse width for each input tDIPW 0.35 - tCK Data-out high-impedance time from CK/CK tHZ - tAC max ps 18 DQS low-impedance time from CK/CK tLZ (DQS) tAC min tAC max ps 18 DQ low-impedance time from CK/CK tLZ (DQ) 2*tAC min tAC max ps 18 DQS-DQ skew for DQS and associated DQ signals tDQSQ - 300 ps 13 DQ hold skew factor tQHS - 400 ps 12 DQ/DQS output hold time from DQS tQH tHP - tQHS - ps Write command to first DQS latching transition tDQSS WL - 0.25 WL + 0.25 tCK DQS input HIGH pulse width tDQSH 0.35 - tCK DQS input LOW pulse width tDQSL 0.35 - tCK DQS falling edge to CK setup time tDSS 0.2 - tCK DQS falling edge hold time from CK tDSH 0.2 - tCK Mode register set command cycle time tMRD 2 - tCK Write preamble tWPRE 0.35 - tCK Write postamble tWPST 0.4 0.6 tCK 10 Address and control input setup time tIS 250 - ps 5,7,9,23 Address and control input hold time tIH 375 - ps 5,7,9,23 Read preamble tRPRE 0.9 1.1 tCK 19 Read postamble tRPST 0.4 0.6 tCK 19 Active to active command period for 1KB page size products (x4, x8) tRRD 7.5 - ns 4 Active to active command period for 2KB page size products (x16) tRRD 10 - ns 4 CK half period Rev. 1.1 / November 2008 22 HY5PG1G431C(L)FP HY5PG1G831C(L)FP -ContinuedParameter DDR2-533 Symbol Units min max Notes Four Active Window for 1KB page size products tFAW 37.5 - Four Active Window for 2KB page size products tFAW 50 - CAS to CAS command delay tCCD 2 Write recovery time tWR 15 - ns Auto precharge write recovery + precharge time tDAL WR+tRP* - tCK 14 Internal write to read command delay tWTR 7.5 - ns 24 Internal read to precharge command delay tRTP 7.5 ns 3 Exit self refresh to a non-read command tXSNR tRFC + 10 ns Exit self refresh to a read command tXSRD 200 - tCK Exit precharge power down to any non-read command tXP 2 - tCK Exit active power down to read command tXARD 2 tCK 1 Exit active power down to read command (Slow exit, Lower power) tXARDS 6 - AL tCK 1, 2 CKE minimum pulse width (HIGH and LOW pulse width) ns ns tCK tCKE 3 tAOND 2 2 tCK 16 tAON tAC(min) tAC(max)+1 ns 16 tAONPD tAC(min)+2 2tCK+tAC(max) +1 ns tAOFD 2.5 2.5 tCK 17,44 tAOF tAC(min) tAC(max)+ 0.6 ns 17,44 ODT turn-off (Power-Down mode) tAOFPD tAC(min)+2 2.5tCK+tAC(ma x)+1 ns ODT to power down entry latency tANPD 3 tCK ODT power down exit latency tAXPD 8 tCK OCD drive mode output delay tOIT 0 tDelay tIS+tCK+tIH ODT turn-on delay ODT turn-on ODT turn-on(Power-Down mode) ODT turn-off delay ODT turn-off Minimum time clocks remains ON after CKE asynchronously drops LOW Rev. 1.1 / November 2008 tCK 12 27 ns ns 15 23 HY5PG1G431C(L)FP HY5PG1G831C(L)FP (DDR2-667) Parameter DDR2-667 Symbol min max Unit Note DQ output access time from CK/CK tAC -450 +450 ps 40 DQS output access time from CK/CK tDQSCK -400 +400 ps 40 CK HIGH pulse width tCH(avg) 0.48 0.52 tCK(avg) 35,36 CK LOW pulse width tCL(avg) 0.48 0.52 tCK(avg) 35,36 CK half period tHP min(tCL(abs), tCH(abs)) - ps 37 Clock cycle time, CL=x tCK(avg) 3000 8000 ps 35,36 DQ and DM input setup time tDS(base) 100 - ps 6,7,8,20,28,31 DQ and DM input hold time tDH(base) 175 - ps 6,7,8,21,28,31 Control & Address input pulse width for each input tIPW 0.6 - tCK(avg) DQ and DM input pulse width for each input tDIPW 0.35 - tCK(avg) Data-out high-impedance time from CK/CK tHZ - tAC max ps 18,40 DQS low-impedance time from CK/CK tLZ(DQS) tAC min tAC max ps 18,40 DQ low-impedance time from CK/CK tLZ(DQ) 2*tAC min tAC max ps 18,40 DQS-DQ skew for DQS and associated DQ signals tDQSQ - 240 ps 13 DQ hold skew factor tQHS - 340 ps 38 DQ/DQS output hold time from DQS tQH tHP - tQHS - ps 39 First DQS latching transition to associated clock edge tDQSS - 0.25 + 0.25 tCK(avg) 30 DQS input HIGH pulse width tDQSH 0.35 - tCK(avg) DQS input LOW pulse width tDQSL 0.35 - tCK(avg) DQS falling edge to CK setup time tDSS 0.2 - tCK(avg) 30 DQS falling edge hold time from CK tDSH 0.2 - tCK(avg) 30 Mode register set command cycle time tMRD 2 - tCK(avg) Write preamble tWPRE 0.35 - tCK(avg) Write postamble tWPST 0.4 0.6 tCK(avg) 10 Address and control input setup time tIS(base) 200 - ps 5,7,9,22,29 Address and control input hold time tIH(base) 275 - ps 5,7,9,23,29 Read preamble tRPRE 0.9 1.1 tCK(avg) 19,41 Read postamble tRPST 0.4 0.6 tCK(avg) 19,42 Activate to precharge command tRAS 45 70000 ns 3 Active to active command period for 1KB page size products (x4, x8) tRRD 7.5 - ns 4,32 Active to active command period for 2KB page size products (x16) tRRD 10 - ns 4,32 Four Active Window for 1KB page size products tFAW 37.5 - ns Four Active Window for 2KB page size products tFAW 50 - ns CAS to CAS command delay tCCD 2 Write recovery time tWR 15 - ns 32 Auto precharge write recovery + precharge time tDAL WR+tnRP - nCK 33 Rev. 1.1 / November 2008 32 32 nCK 24 HY5PG1G431C(L)FP HY5PG1G831C(L)FP -Continued- Parameter DDR2-667 Symbol min max - Unit Notes ns 24,32 Internal write to read command delay tWTR 7.5 Internal read to precharge command delay tRTP 7.5 ns 3,32 Exit self refresh to a non-read command tXSNR tRFC + 10 ns 32 Exit self refresh to a read command tXSRD 200 - nCK Exit precharge power down to any non-read command tXP 2 - nCK Exit active power down to read command tXARD 2 nCK 1 Exit active power down to read command (Slow exit, Lower power) tXARDS 7 - AL nCK 1, 2 CKE minimum pulse width (HIGH and LOW pulse width) tCKE 3 nCK 27 ODT turn-on delay tAOND 2 2 nCK 16 ODT turn-on tAON tAC(min) tAC(max) +0.7 ns 6,16,40 ODT turn-on(Power-Down mode) tAONPD tAC(min)+2 2tCK(avg)+ tAC(max)+1 ns ODT turn-off delay tAOFD 2.5 2.5 nCK 17,45 ODT turn-off tAOF tAC(min) tAC(max)+ 0.6 ns 17,43,45 ODT turn-off (Power-Down mode) tAOFPD tAC(min) +2 2.5tCK(avg)+ tAC(max)+1 ns ODT to power down entry latency tANPD 3 ODT power down exit latency tAXPD 8 OCD drive mode output delay tOIT 0 Minimum time clocks remains ON after CKE asynchronously drops LOW tDelay Rev. 1.1 / November 2008 tIS + tCK (avg) + tIH nCK nCK 12 ns 32 ns 15 25 HY5PG1G431C(L)FP HY5PG1G831C(L)FP General notes, which may apply for all AC parameters 1. DDR2 SDRAM AC timing reference load The following figure represents the timing reference load used in defining the relevant timing parameters of the part. It is not intended to be either a precise representation of the typical system environment nor a depiction of the actual load presented by a production tester. System designers will use IBIS or other simulation tools to correlate the timing reference load to a system environment. Manufacturers will correlate to their production test conditions (generally a coaxial transmission line terminated at the tester electronics). VDDQ DUT DQ DQS DQS RDQS RDQS Output Timing reference point VTT = VDDQ/2 25 AC Timing Reference Load The output timing reference voltage level for single ended signals is the crosspoint with VTT. The output timing reference voltage level for differential signals is the crosspoint of the true (e.g. DQS) and the complement (e.g. DQS) signal. 2. Slew Rate Measurement Levels a. Output slew rate for falling and rising edges is measured between VTT - 250 mV and VTT + 250 mV for single ended signals. For differential signals (e.g. DQS - DQS) output slew rate is measured between DQS - DQS = -500 mV and DQS - DQS = +500mV. Output slew rate is guaranteed by design, but is not necessarily tested on each device. b. Input slew rate for single ended signals is measured from dc-level to ac-level: from VREF - 125 mV to VREF + 250 mV for rising edges and from VREF + 125 mV and VREF - 250 mV for falling edges. For differential signals (e.g. CK - CK) slew rate for rising edges is measured from CK - CK = -250 mV to CK - CK = +500 mV (+250mV to -500 mV for falling edges). c. VID is the magnitude of the difference between the input voltage on CK and the input voltage on CK, or between DQS and DQS for differential strobe. 3. DDR2 SDRAM output slew rate test load Output slew rate is characterized under the test conditions as shown below. VDDQ DUT DQ DQS, DQS RDQS, RDQS Output Test point VTT = VDDQ/2 25 Slew Rate Test Load Rev. 1.1 / November 2008 26 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 4. Differential data strobe DDR2 SDRAM pin timings are specified for either single ended mode or differential mode depending on the setting of the EMR "Enable DQS" mode bit; timing advantages of differential mode are realized in system design. The method by which the DDR2 SDRAM pin timings are measured is mode dependent. In single ended mode, timing relationships are measured relative to the rising or falling edges of DQS crossing at VREF. In differential mode, these timing relationships are measured relative to the crosspoint of DQS and its complement, DQS. This distinction in timing methods is guaranteed by design and characterization. Note that when differential data strobe mode is disabled via the EMR, the complementary pin, DQS, must be tied externally to VSS through a 20 to 10 K resistor to insure proper operation. tDQSH DQS DQS/ DQS tDQSL DQS tWPRE tWPST VIH(dc) VIH(ac) DQ D D VIL(ac) VIL(dc) tDS VIH(ac) tDS DM D D DMin DMin tDH DMin VIL(ac) tDH VIH(dc) DMin VIL(dc) Figure -- Data input (write) timing tCH tCL CK CK/CK CK DQS DQS/DQS DQS tRPRE tRPST DQ Q Q tDQSQmax Q Q tDQSQmax tQH tQH Figure -- Data output (read) timing 5. AC timings are for linear signal transitions. See System Derating for other signal transitions. 6. All voltages referenced to VSS. 7. These parameters guarantee device behavior, but they are not necessarily tested on each device. They may be guaranteed by device design or tester correlation. 8. Tests for AC timing, IDD, and electrical (AC and DC) characteristics, may be conducted at nominal reference/supply voltage levels, but the related specifications and device operation are guaranteed for the full voltage range specified. Rev. 1.1 / November 2008 27 HY5PG1G431C(L)FP HY5PG1G831C(L)FP Specific Notes for dedicated AC parameters 1. User can choose which active power down exit timing to use via MRS(bit 12). tXARD is expected to be used for fast active power down exit timing. tXARDS is expected to be used for slow active power down exit timing where a lower power value is defined by each vendor data sheet. 2. AL = Additive Latency 3. This is a minimum requirement. Minimum read to precharge timing is AL + BL/2 providing the tRTP and tRAS(min) have been satisfied. 4. A minimum of two clocks (2 * tCK or 2 * nCK) is required irrespective of operating frequency 5. Timings are specified with command/address input slew rate of 1.0 V/ns. See System Derating for other slew rate values. 6. Timings are guaranteed with DQs, DM, and DQS's (DQS/RDQS in singled ended mode) input slew rate of 1.0 V/ns. See System Derating for other slew rate values. 7. Timings are specified with CK/CK differential slew rate of 2.0 V/ns. Timings are guaranteed for DQS signals with a differential slew rate of 2.0 V/ns in differential strobe mode and a slew rate of 1V/ns in single ended mode. See System Derating for other slew rate values. 8. tDS and tDH derating tDS, tDH Derating Values for DDR2-400, DDR2-533(ALL units in 'ps', Note 1 applies to entire Table) DQS, DQS Differential Slew Rate 4.0 V/ns DQ Slew rate V/ns 3.0 V/ns 2.0 tDS 125 tDH 45 tDS 125 1.5 83 21 83 1.0 0 0 0 0 0.9 - - -11 -14 0.8 - - - - 0.7 - - - 0.6 - - - 0.5 - - - 2.0 V/ns 1.8 V/ns 1.6 V/ns 1.4 V/ns 1.2 V/ns 1.0 V/ns 0.8 V/ns tDH tDS tDH 45 +125 +45 tDS - tDH - tDS - tDH - tDS - tDH - tDS - tDH - tDS - tDH - tDS - tDH - 21 +21 95 33 - - - - - - - - - - 0 0 12 12 24 24 - - - - - - - - -11 -14 1 -2 13 10 25 22 - - - - - - -25 -31 -13 -19 -1 -7 11 5 23 17 - - - - - - - -31 -42 -42 -19 -7 -8 5 -6 17 6 - - - - - - - -43 -59 -31 -47 -19 -35 -7 -23 5 -11 - - - - - - - -74 -89 -62 -77 -50 -65 -38 -53 +83 0.4 tDS, - tDH Derating - Values - for- DDR2-667, - units- in 'ps', - Note- 1 applies -127 -140 -115 -128 -103 -116 DDR2-800(ALL to entire Table) DQS, DQS Differential Slew Rate 4.0 V/ns DQ Slew rate V/ns 3.0 V/ns 2.0 V/ns 1.8 V/ns 2.0 tDS 100 tDH 45 tDS 100 tDH 45 tDS 100 tDH 45 tDS - tDH - 1.5 67 21 67 21 67 21 79 33 1.0 0 0 0 0 0 0 12 12 0.9 - - -5 -14 -5 -14 7 -2 0.8 - - - - -13 -31 -1 -19 0.7 - - - - - - -10 0.6 - - - - - - 0.5 - - - - - 0.4 - - - - - 1.6 V/ns tDS - 1.4 V/ns 1.2 V/ns 1.0 V/ns 0.8 V/ns tDH - tDS - tDH - tDS - tDH - tDS - tDH - tDS - tDH - - - - - - - - - - - 24 24 - - - - - - - - 19 10 31 22 - - - - - - 11 -7 23 5 35 17 - - - - -42 2 -30 14 -18 26 -6 38 6 - - - - -10 -59 2 -47 14 -35 26 -23 38 -11 - - - - - -24 -89 -12 -77 0 -65 12 -53 - - - - - - - -52 -140 -40 -128 -28 -116 1) For all input signals the total tDS(setup time) and tDH(hold time) required is calculated by adding the datasheet value to the derating Rev. 1.1 / November 2008 28 HY5PG1G431C(L)FP HY5PG1G831C(L)FP tDS, tDH Derating Values for DDR2-400, DDR2-533(ALL units in 'ps', Note 1 applies to entire Table) DQS, DQS Single-ended Slew Rate 4.0 V/ns DQ Slew rate V/ns 3.0 V/ns 2.0 V/ns 1.8 V/ns tDS 1.6 V/ns 1.4 V/ns 1.2 V/ns tDS tDH tDS tDH tDS tDH 2.0 188 188 167 146 125 63 1.5 146 167 125 125 83 42 1.0 63 125 42 83 0 0 0.9 - - 31 69 -11 -14 0.8 - - - - -25 -31 -27 -30 -32 -44 -43 -62 -60 0.7 - - - - - - -45 -53 -50 -67 -61 -85 -78 0.6 - - - - - - - - -74 -96 0.5 - - - - - - - - - - 0.4 - - - - - - - - - - 1.0 V/ns 0.8 V/ns tDH tDS tDH tDS tDH tDS tDH tDS tDH tDS tDH - - - - - - - - - - - - 81 43 - - - - - - - - - - -2 1 -7 -13 - - - - - - - - -13 -13 -18 -27 -29 -45 - - - - - - -86 - - -85 -109 -108 -152 - - - - -114 -102 -138 -132 -181 -183 -248 -128 -156 -145 -180 -175 -223 -226 -288 - - -210 -243 -240 -286 -291 -351 value listed in Table x. Setup(tDS) nominal slew rate for a rising signal is defined as the slew rate between the last crossing of VREF(dc) and the first crossing of Vih(ac)min. Setup(tDS) nominal slew rate for a falling signal is defined as the slew rate between the last crossing of VREF(dc) and the first crossing of Vil(ac)max. If the actual signal is always earlier than the nominal slew rate line between shaded ` VREF(dc) to ac region', use nominal slew rate for derating value(see Fig a.) If the actual signal is later than the nominal slew rate line anywhere between shaded `VREF(dc) to ac region', the slew rate of a tangent line to the actual signal from the ac level to dc level is used for derating value(see Fig b.) Hold(tDH) nominal slew rate for a rising signal is defined as the slew rate between the last crossing of Vil(dc) max and the first crossing of VREF(dc). Hold (tDH) nominal slew rate for a falling signal is defined as the slew rate between the last crossing of Vih(dc) min and the first crossing of VREF(dc). If the actual signal is always later than the nominal slew rate line anywhere between shaded `dc to VREF(dc) region', the slew rate of a tangent line to the actual signal from the dc level to VREF(dc) level is used for derating value(see Fig c.) If the actual signal is earlier than the nominal slew rate line anywhere between shaded `dc to VREF(dc) region', the slew rate of a tangent line to the actual signal from the dc level to VREF(dc) level is used for derating value(see Fig d.) Although for slow slew rates the total setup time might be negative(i.e. a valid input signal will not have reached VIH/IL(ac) at the time of the rising clock transition) a valid input signal is still required to complete the transition and reach VIH/IL(ac). For slew rate in between the values listed in table x, the derating valued may obtained by linear interpolation. These values are typically not subject to production test. They are verified by design and characterization. Rev. 1.1 / November 2008 29 HY5PG1G431C(L)FP HY5PG1G831C(L)FP Fig. a. Illustration of nominal slew rate for tIS,tDS CK,DQS CK, DQS tIS, tDS tIH, tDH tIS, tDS tIH, tDH VDDQ VIH(ac)min VIH(dc)min nominal slew rate VREF(dc) nominal slew rate VIL(dc)max VREF to ac region VIL(ac)max Vss Delta TF Setup Slew Rate = Falling Signal Rev. 1.1 / November 2008 VREF(dc)-VIL(ac)max Delta TF Delta TR Setup Slew Rate = Rising Signal VIH(ac)min-VREF(dc) Delta TR 30 HY5PG1G431C(L)FP HY5PG1G831C(L)FP Fig. b. Illustration of tangent line for tIS,tDS CK, DQS CK, DQS tIS, tDS tIH, tDH tIS, tDS tIH, tDH VDDQ nominal line VIH(ac)min VIH(dc)min tangent line VREF(dc) Tangent line VIL(dc)max VREF to ac region VIL(ac)max Nomial line Vss Delta TR Delta TF Setup Slew Rate Tangent line[VIH(ac)min-VREF(dc)] = Rising Signal Delta TR Setup Slew Rate Tangent line[VREF(dc)-VIL(ac)max] = Falling Signal Delta TF Rev. 1.1 / November 2008 31 HY5PG1G431C(L)FP HY5PG1G831C(L)FP Fig. c. Illustration of nominal line for tIH, tDH CK, DQS CK, DQS tIS, tDS tIH, tDH tIS, tDS tIH, tDH VDDQ VIH(ac)min VIH(dc)min dc to VREF region VREF(dc) nominal slew rate nominal slew rate VIL(dc)max VIL(ac)max Vss Delta TR Hold Slew Rate = Rising Signal Rev. 1.1 / November 2008 VREF(dc)-VIL(dc)max Delta TR Delta TF VIH(dc)min - VREF(dc) Hold Slew Rate = Falling Signal Delta TF 32 HY5PG1G431C(L)FP HY5PG1G831C(L)FP Fig. d. Illustration of tangent line for tIH, tDH CK, DQS CK, DQS tIS, tDS tIH, tDH tIS, tDS tIH, tDH VDDQ VIH(ac)min nominal line VIH(dc)min tangent line VREF(dc) dc to VREF region Tangent line nominal line VIL(dc)max VIL(ac)max Vss Delta TR Delta TF Hold Slew Rate Tangent line[VREF(dc)-VIL(ac)max] = Rising Signal Delta TR Tangent line[VIH(ac)min-VREF(dc)] Hold Slew Rate = Falling Signal Delta TF Rev. 1.1 / November 2008 33 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 9. tIS and tIH (input setup and hold) derating tIS, tIH Derating Values for DDR2-400, DDR2-533 CK, CK Differential Slew Rate 2.0 V/ns 1.5 V/ns 1.0 V/ns tIS tIH tIS tIH tIS tIH Units Note s 4.0 +187 +94 +217 +124 +247 +154 ps 1 3.5 +179 +89 +209 +119 +239 +149 ps 1 3.0 +167 +83 +197 +113 +227 +143 ps 1 2.5 +150 +75 +180 +105 +210 +135 ps 1 2.0 +125 +45 +155 +75 +185 +105 ps 1 1.5 +83 +21 +113 +51 +143 +81 ps 1 1.0 +0 0 +30 +30 +60 +60 ps 1 0.9 -11 -14 +19 +16 +49 +46 ps 1 -25 -31 +5 -1 +35 +29 ps 1 -43 -54 -13 -24 +17 +6 ps 1 -67 -83 -37 -53 -7 -23 ps 1 0.5 -110 -125 -80 -95 -80 -65 ps 1 0.4 -175 -188 -145 -158 -115 -128 ps 1 0.3 -285 -292 -255 -262 -225 -232 ps 1 0.25 -350 -375 -320 -345 -290 -315 ps 1 0.2 -525 -500 -495 -470 -465 -440 ps 1 0.15 -800 -708 -770 -678 -740 -648 ps 1 0.1 -1450 -1125 -1420 -1095 -1390 -1065 ps 1 Command / 0.8 Address Slew 0.7 rate(V/ns) 0.6 Rev. 1.1 / November 2008 34 HY5PG1G431C(L)FP HY5PG1G831C(L)FP tIS, tIH Derating Values for DDR2-667, DDR2-800 CK, CK Differential Slew Rate 2.0 V/ns 1.5 V/ns 1.0 V/ns tIS tIH tIS tIH tIS tIH Uni ts Note s 4.0 +15 +94 +180 +124 +210 +154 ps 1 3.5 +143 +89 +173 +119 +203 +149 ps 1 3.0 +133 +83 +163 +113 +193 +143 ps 1 2.5 +120 +75 +150 +105 +180 +135 ps 1 2.0 +100 +45 +130 +75 +150 +105 ps 1 1.5 +67 +21 +97 +51 +127 +81 ps 1 1.0 0 0 +30 +30 +60 +60 ps 1 0.9 -5 -14 +25 +16 +55 +46 ps 1 -13 -31 +17 -1 +47 +29 ps 1 -22 -54 +8 -24 +38 +6 ps 1 -34 -83 -4 -53 +26 -23 ps 1 0.5 -60 -125 -30 -95 0 -65 ps 1 0.4 -100 -188 -70 -158 -40 -128 ps 1 Command / 0.8 Address Slew 0.7 rate(V/ns) 0.6 0.3 -168 -292 -138 -262 -108 -232 ps 1 0.25 -200 -375 -170 -345 -140 -315 ps 1 0.2 -325 -500 -395 -470 -265 -440 ps 1 0.15 -517 -708 -487 -678 -457 -648 ps 1 0.1 -1000 -1125 -970 -1095 -940 -1065 ps 1 1) For all input signals the total tIS(setup time) and tIH(hold) time) required is calculated by adding the datasheet value to the derating value listed in above Table. Setup(tIS) nominal slew rate for a rising signal is defined as the slew rate between the last crossing of VREF(dc) and the first crossing of VIH(ac)min. Setup(tIS) nominal slew rate for a falling signal is defined as the slew rate between the last crossing of VREF(dc) and the first crossing of VIL(ac)max. If the actual signal is always earlier than the nominal slew rate for line between shaded `VREF(dc) to ac region', use nominal slew rate for derating value(see fig a.) If the actual signal is later than the nominal slew rate line anywhere between shaded `VREF(dc) to ac region', the slew rate of a tangent line to the actual signal from the ac level to dc level is used for derating value(see Fig b.) Hold(tIH) nominal slew rate for a rising signal is defined as the slew rate between the last crossing of VIL(dc)max and the first crossing of VREF(dc). Hold(tIH) nominal slew rate for a falling signal is defined as the slew rate between the last crossing of VREF(dc). If the actual signal is always later than the nominal slew rate line between shaded `dc to VREF(dc) region', use nominal slew rate for derating value(see Fig.c) If the actual signal is earlier than the nominal slew rate line anywhere between shaded `dc to VREF(dc) region', the slew rate of a tangent line to the actual signal from the dc level to VREF(dc) level is used for derating value(see Fig d.) Although for slow rates the total setup time might be negative(i.e. a valid input signal will not have reached VIH/IL(ac) at the time of the rising clock transition) a valid input signal is still required to complete the transition and reach VIH/IL(ac). For slew rates in between the values listed in table, the derating values may obtained by linear interpolation. These values are typically not subject to production test. They are verified by design and characterization. Rev. 1.1 / November 2008 35 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 10. The maximum limit for this parameter is not a device limit. The device will operate with a greater value for this parameter, but system performance (bus turnaround) will degrade accordingly. 11. MIN (t CL, t CH) refers to the smaller of the actual clock LOW time and the actual clock HIGH time as provided to the device (i.e. this value can be greater than the minimum specification limits for t CL and t CH). For example, t CL and t CH are = 50% of the period, less the half period jitter (t JIT(HP)) of the clock source, and less the half period jitter due to crosstalk (t JIT(crosstalk)) into the clock traces. 12. t QH = t HP - t QHS, where: tHP = minimum half clock period for any given cycle and is defined by clock HIGH or clock LOW (tCH, tCL). tQHS accounts for: 1) The pulse duration distortion of on-chip clock circuits; and 2) The worst case push-out of DQS on one transition followed by the worst case pull-in of DQ on the next transition, both of which are, separately, due to data pin skew and output pattern effects, and p-channel to n-channel variation of the output drivers. 13. tDQSQ: Consists of data pin skew and output pattern effects, and p-channel to n-channel variation of the output drivers as well as output slew rate mismatch between DQS/ DQS and associated DQ in any given cycle. 14. t DAL = (nWR) + (tRP/tCK): For each of the terms above, if not already an integer, round to the next highest integer. tCK refers to the application clock period. nWR refers to the t WR parameter stored in the MR. Example: For DDR533 at t CK = 3.75 ns with t WR programmed to 4 clocks. tDAL = 4 + (15 ns / 3.75 ns) clocks =4 +(4)clocks=8clocks. 15. The clock frequency is allowed to change during self-refresh mode or precharge power-down mode. In case of clock frequency change during precharge power-down, a specific procedure is required as described in section 2.9. 16. ODT turn on time min is when the device leaves high impedance and ODT resistance begins to turn on. ODT turn on time max is when the ODT resistance is fully on. Both are measured from tAOND. 17. ODT turn off time min is when the device starts to turn off ODT resistance. ODT turn off time max is when the bus is in high impedance. Both are measured from tAOFD. 18. tHZ and tLZ transitions occur in the same access time as valid data transitions. Thesed parameters are referenced to a specific voltage level which specifies when the device output is no longer driving (tHZ), or begins driving (tLZ). Below figure shows a method to calculate the point when device is no longer driving (tHZ), or begins driving (tLZ) by measuring the signal at two different voltages. The actual voltage measurement points are not critical as long as the calculation is consistent. 19. tRPST end point and tRPRE begin point are not referenced to a specific voltage level but specify when the Rev. 1.1 / November 2008 36 HY5PG1G431C(L)FP HY5PG1G831C(L)FP device output is no longer driving (tRPST), or begins driving (tRPRE). Below figure shows a method to calculate these points when the device is no longer driving (tRPST), or begins driving (tRPRE). Below Figure shows a method to calculate these points when the device is no longer driving (tRPST), or begins driving (tRPRE) by measuring the signal at two different voltages. The actual voltage measurement points are not critical as long as the calculation is consistent. VTT + 2xmV VOH + xmV VTT + xmV VOH + 2xmV tLZ tRPRE begin point tHZ tRPST end point T1 T2 T1 VOL + 1xmV VTT -xmV VOL + 2xmV VTT - 2xmV T2 tHZ , tRPST end point = 2*T1-T2 tLZ , tRPRE begin point = 2*T1-T2 20. Input waveform timing with differential data strobe enabled MR[bit10] =0, is referenced from the input signal crossing at the VIH(ac) level to the differential data strobe crosspoint for a rising signal, and from the input signal crossing at the VIL(ac) level to the differential data strobe crosspoint for a falling signal applied to the device under test. 21. Input waveform timing with differential data strobe enabled MR[bit10]=0, is referenced from the input signal crossing at the VIH(dc) level to the differential data strobe crosspoint for a rising signal and VIL(dc) to the differential data strobe crosspoint for a falling signal applied to the device under test. Differential Input waveform timing DQS DQS tDS tDH tDS tDH VDDQ VIH(ac)min VIH(dc)min VREF(dc) VIL(dc)max VIL(ac)max VSS 22. Input waveform timing is referenced from the input signal crossing at the VIH(ac) level for a rising sigRev. 1.1 / November 2008 37 HY5PG1G431C(L)FP HY5PG1G831C(L)FP nal and VIL(ac) for a falling signal applied to the device under test. 23. Input waveform timing is referenced from the input signal crossing at the VIL(dc) level for a rising signal and VIH(dc) for a falling signal applied to the device under test. 24. tWTR is at least two clocks (2 x tCK or 2 x nCK) independent of operation frequency. 25. Input waveform timing with single-ended data strobe enabled MR[bit10] = 1, is referenced from the input signal crossing at the VIH (ac) level to the single-ended data strobe crossing VIH/L (dc) at the start of its transition for a rising signal, and from the input signal crossing at the VIL (ac) level to the singleended data strobe crossing VIH/L (dc) at the start of its transition for a falling signal applied to the device under test. The DQS signal must be monotonic between Vil(dc)max and Vih (dc) min. 26. Input waveform timing with single-ended data strobe enabled MR[bit10] = 1, is referenced from the input signal crossing at the VIH(dc) level to the single-ended data strobe crossing VIH/L(ac) at the end of its transition for a rising signal, and from the input signal crossing at the VIL(dc) level to the single-ended data strobe crossing VIH/L(ac) at the end of its transition for a falling signal applied to the device under test. The DQS signal must be monotonic between Vil(dc)max and Vih (dc) min. 27. tCKEmin of 3 clocks means CKE must be registered on three consecutive positive clock edges. CKE must remain at the valid input level the entire time it takes to achieve the 3 clocks of registration. Thus, after any CKE transition, CKE may not transition from its valid level during the time period of tIS + 2 x tCK + tIH. 28. If tDS or tDH is violated, data corruption may occur and the data must be re-written with valid data before a valid READ can be executed. 29. These parameters are measured from a command/address signal (CKE, CS, RAS, CAS, WE, ODT, BA0, A0, A1, etc.) transition edge to its respective clock signal (CK/CK) crossing. The spec values are not affected by the amount of clock jitter applied (i.e. tJIT (per), tJIT (cc), etc.), as the setup and hold are relative to the clock signal crossing that latches the command/address. That is, these parameters should be met whether clock jitter is present or not. 30. These parameters are measured from a data strobe signal ((L/U/R)DQS/DQS) crossing to its respective clock signal (CK/CK) crossing. The spec values are not affected by the amount of clock jitter applied (i.e. tJIT (per), tJIT (cc), etc.), as these are relative to the clock signal crossing. That is, these parameters should be met whether clock jitter is present or not. 31. These parameters are measured from a data signal ((L/U) DM, (L/U) DQ0, (L/U) DQ1, etc.) transition edge to its respective data strobe signal ((L/U/R)DQS/DQS) crossing. 32. For these parameters, the DDR2 SDRAM device is characterized and verified to support tnPARAM = RU {tPARAM / tCK (avg)}, which is in clock cycles, assuming all input clock jitter specifications are satisfied. Rev. 1.1 / November 2008 38 HY5PG1G431C(L)FP HY5PG1G831C(L)FP For example, the device will support tnRP = RU {tRP / tCK (avg)}, which is in clock cycles, if all input clock jitter specifications are met. This means: For DDR2-667 5-5-5, of which tRP = 15ns, the device will support tnRP =RU {tRP / tCK (avg)} = 5, i.e. as long as the input clock jitter specifications are met, Precharge command at Tm and Active command at Tm+5 is valid even if (Tm+5 - Tm) is less than 15ns due to input clock jitter. 33. tDAL [nCK] = WR [nCK] + tnRP [nCK] = WR + RU {tRP [ps] / tCK (avg) [ps]}, where WR is the value programmed in the mode register set. 34. New units, `tCK (avg)' and `nCK', are introduced in DDR2-667 and DDR2-800. Unit `tCK (avg)' represents the actual tCK (avg) of the input clock under operation. Unit `nCK', represents one clock cycle of the input clock, counting the actual clock edges. Note that in DDR2-400 and DDR2-533, `tCK', is used for both concepts. ex) tXP = 2 [nCK] means; if Power Down exit is registered at Tm, an Active command may be registered at Tm+2, even if (Tm+2 - Tm) is 2 x tCK (avg) + tERR(2per),min. 35. Input clock jitter spec parameter. These parameters and the ones in the table below are referred to as 'input clock jitter spec parameters' and these parameters apply to DDR2-667 and DDR2-800 only. The jitter specified is a random jitter meeting a Gaussian distribution. DDR2-667 Parameter DDR2-800 Symbol Units Notes 100 ps 35 -80 80 ps 35 250 -200 200 ps 35 -200 200 -160 160 ps 35 tERR(2per) -175 175 -150 150 ps 35 Cumulative error across 3 cycles tERR(3per) -225 225 -175 175 ps 35 Cumulative error across 4 cycles tERR(4per) -250 250 -200 200 ps 35 Cumulative error across 5 cycles tERR(5per) -250 250 -200 200 ps 35 Cumulative error across n cycles, n=6...10, inclusive tERR(6~10per) -350 350 -300 300 ps 35 Cumulative error across n cycles, n=11...50, inclusive tERR(11~50per) -450 450 -450 450 ps 35 tJIT (duty) -125 125 -100 100 ps 35 min max min max tJIT (per) -125 125 -100 tJIT (per, lck) -100 100 tJIT (cc) -250 Cycle to cycle clock period jitter during DLL locking period tJIT (cc, lck) Cumulative error across 2 cycles Clock period jitter Clock period jitter during DLL locking period Cycle to cycle clock period jitter Duty cycle jitter 36. These parameters are specified per their average values, however it is understood that the following Rev. 1.1 / November 2008 39 HY5PG1G431C(L)FP HY5PG1G831C(L)FP relationship between the average timing and the absolute instantaneous timing holds at all times. (Min and max of SPEC values are to be used for calculations in the table below.) Parameter Symbol min max Units Absolute clock period tCK (abs) tCK (avg), min + tJIT (per), min tCK (avg), max + tJIT (per), max ps Absolute clock HIGH pulse width tCH (abs) tCH (avg), min* tCK (avg), min + tJIT (per), min tCH (avg), max* tCK (avg), max + tJIT (per), max ps Absolute clock LOW pulse width tCL (abs) tCL (avg), min* tCK (avg), min + tCL (avg), max* tCK (avg), max + tJIT (per), min tJIT (per), max ps Example: For DDR2-667, tCH (abs), min = (0.48 x 3000 ps) - 125 ps = 1315 ps 37. tHP is the minimum of the absolute half period of the actual input clock. tHP is an input parameter but not an input specification parameter. It is used in conjunction with tQHS to derive the DRAM output timing tQH. The value to be used for tQH calculation is determined by the following equation; tHP = Min (tCH (abs), tCL (abs)), where, tCH (abs) is the minimum of the actual instantaneous clock HIGH time; tCL (abs) is the minimum of the actual instantaneous clock LOW time; 38. tQHS accounts for: 1) The pulse duration distortion of on-chip clock circuits, which represents how well the actual tHP at the input is transferred to the output; and 2) The worst case push-out of DQS on one transition followed by the worst case pull-in of DQ on the next transition, both of which are independent of each other, due to data pin skew, output pattern effects, and p-channel to n-channel variation of the output drivers 39. tQH = tHP? tQHS, where: tHP is the minimum of the absolute half period of the actual input clock; and tQHS is the specification value under the max column. {The less half-pulse width distortion present, the larger the tQH value is; and the larger the valid data eye will be.} Examples: 1) If the system provides tHP of 1315 ps into a DDR2-667 SDRAM, the DRAM provides tQH of 975 ps minimum. 2) If the system provides tHP of 1420 ps into a DDR2-667 SDRAM, the DRAM provides tQH of 1080 ps minimum. 40. When the device is operated with input clock jitter, this parameter needs to be derated by the actual tERR(6-10per) of the input clock. (output deratings are relative to the SDRAM input clock.) For example, if the measured jitter into a DDR2-667 SDRAM has tERR(6-10per),min = - 272 ps and tERR(6-10per), max = + 293 ps, then tDQSCK, min (derated) = tDQSCK, min - tERR(6-10per),max = 400 ps - 293 ps = - 693 ps and tDQSCK, max (derated) = tDQSCK, max - tERR(6-10per),min = 400 ps + 272 ps = + 672 ps. Similarly, tLZ (DQ) for DDR2-667 derates to tLZ (DQ), min (derated) = - 900 ps - 293 Rev. 1.1 / November 2008 40 HY5PG1G431C(L)FP HY5PG1G831C(L)FP ps = - 1193 ps and tLZ (DQ), max (derated) = 450 ps + 272 ps = + 722 ps. (Caution on the min/max usage!) 41. When the device is operated with input clock jitter, this parameter needs to be derated by the actual tJIT (per) of the input clock. (output deratings are relative to the SDRAM input clock.) For example, if the measured jitter into a DDR2-667 SDRAM has tJIT (per), min = - 72 ps and tJIT (per), max = + 93 ps, then tRPRE, min (derated) = tRPRE, min + tJIT (per), min = 0.9 x tCK (avg) - 72 ps = + 2178 ps and tRPRE, max (derated) = tRPRE, max + tJIT (per), max = 1.1 x tCK (avg) + 93 ps = + 2843 ps. (Caution on the min/max usage!) 42. When the device is operated with input clock jitter, this parameter needs to be derated by the actual tJIT (duty) of the input clock. (output deratings are relative to the SDRAM input clock.) For example, if the measured jitter into a DDR2-667 SDRAM has tJIT (duty), min = - 72 ps and tJIT (duty), max = + 93 ps, then tRPST, min (derated) = tRPST, min + tJIT (duty), min = 0.4 x tCK (avg) - 72 ps = + 928 ps and tRPST, max (derated) = tRPST, max + tJIT (duty), max = 0.6 x tCK (avg) + 93 ps = + 1592 ps. (Caution on the min/max usage!) 43. When the device is operated with input clock jitter, this parameter needs to be derated by {tJIT (duty), max - tERR(6-10per),max} and {- tJIT (duty), min - tERR(6-10per),min} of the actual input clock.(output deratings are relative to the SDRAM input clock.) For example, if the measured jitter into a DDR2-667 SDRAM has tERR(6-10per),min = - 272 ps, tERR(610per), max = + 293 ps, tJIT (duty), min = - 106 ps and tJIT (duty), max = + 94 ps, then tAOF, min (derated) = tAOF, min + {- tJIT (duty), max - tERR(6-10per),max} = - 450 ps + {- 94 ps - 293 ps} = - 837 ps and tAOF, max (derated) = tAOF, max + {- tJIT (duty), min - tERR(6-10per),min} = 1050 ps + {106 ps + 272 ps} = + 1428 ps. (Caution on the min/max usage!) 44. For tAOFD of DDR2-400/533, the 1/2 clock of tCK in the 2.5 x tCK assumes a tCH, input clock HIGH pulse width of 0.5 relative to tCK. tAOF, min and tAOF, max should each be derated by the same amount as the actual amount of tCH offset present at the DRAM input with respect to 0.5. For example, if an input clock has a worst case tCH of 0.45, the tAOF, min should be derated by subtracting 0.05 x tCK from it, whereas if an input clock has a worst case tCH of 0.55, the tAOF, max should be derated by adding 0.05 x tCK to it. Therefore, we have; tAOF, min (derated) = tAC, min - [0.5 - Min(0.5, tCH, min)] x tCK tAOF, max (derated) = tAC, max + 0.6 + [Max(0.5, tCH, max) - 0.5] x tCK or tAOF, min (derated) = Min (tAC, min, tAC, min - [0.5 - tCH, min] x tCK) tAOF, max (derated) = 0.6 + Max (tAC, max, tAC, max + [tCH, max - 0.5] x tCK) where tCH, min and tCH, max are the minimum and maximum of tCH actually measured at the DRAM input balls. 45. For tAOFD of DDR2-667/800, the 1/2 clock of nCK in the 2.5 x nCK assumes a tCH (avg), average input clock HIGH pulse width of 0.5 relative to tCK (avg). tAOF, min and tAOF, max should each be derated by the same amount as the actual amount of tCH (avg) offset present at the DRAM input with respect to 0.5. For example, if an input clock has a worst case tCH (avg) of 0.48, the tAOF, min should be derated by subtracting 0.02 x tCK (avg) from it, whereas if an input clock has a worst case tCH (avg) of 0.52, the Rev. 1.1 / November 2008 41 HY5PG1G431C(L)FP HY5PG1G831C(L)FP tAOF, max should be derated by adding 0.02 x tCK (avg) to it. Therefore, we have; tAOF, min (derated) = tAC, min - [0.5 - Min(0.5, tCH (avg), min)] x tCK (avg) tAOF, max (derated) = tAC, max + 0.6 + [Max(0.5, tCH (avg), max) - 0.5] x tCK (avg) or tAOF, min (derated) = Min (tAC, min, tAC, min - [0.5 - tCH (avg), min] x tCK (avg)) tAOF, max (derated) = 0.6 + Max (tAC, max, tAC, max + [tCH (avg), max - 0.5] x tCK (avg)) where tCH (avg), min and tCH (avg), max are the minimum and maximum of tCH (avg) actually measured at the DRAM input balls. Note that these deratings are in addition to the tAOF derating per input clock jitter, i.e. tJIT (duty) and tERR(6-10per). However tAC values used in the equations shown above are from the timing parameter table and are not derated. Thus the final derated values for tAOF are; tAOF, min (derated_final) = tAOF, min (derated) + {- tJIT (duty), max - tERR(6-10per),max} tAOF, max (derated_final) = tAOF, max (derated) + {- tJIT (duty), min - tERR(6-10per),min} Rev. 1.1 / November 2008 42 HY5PG1G431C(L)FP HY5PG1G831C(L)FP 5. Package Dimensions Package Dimension(x4,x8) 60Ball Fine Pitch Ball Grid Array Outline 8.00 0.10 0.15 0.05 11.40 0.10 A1 BALL MARK < Top View> < SIDE View> 1.10 0.10 0.80 X 8 = 6.40 0.34 0.05 2.10 0.10 9 8 7 2-R0.13MAX A1 BALL MARK 3 2 1 0.80 A B C D E F G H J K L 60X 0.45 0.05 1.60 1.60 0.80 < Bottom View> Note: All dimensions are in millimeters. Rev. 1.1 / November 2008 43