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Document Number: 73142
S-81529-Rev. E, 30-Jun-08
Vishay Siliconix
Si7106DN
Notes:
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolut e Maximum Ratings” may cause permanent damage to t he device. These are stress rating s only, and functiona l operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect devi ce reliability.
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
MOSFET SPECIFICATIONS TJ = 25 °C, unless otherwise noted
Parameter Symbol Test Conditions Min. Typ. Max. Unit
Static
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250 µA 0.6 1.5 V
Gate-Body Leakage IGSS VDS = 0 V, VGS = ± 12 V ± 100 nA
Zero Gate Voltage Drain Current IDSS
VDS = 20 V, VGS = 0 V 1µA
VDS = 20 V, VGS = 0 V, TJ = 55 °C 5
On-State Drain CurrentaID(on) V
DS ≥ 5 V, VGS = 4.5 V 40 A
Drain-Source On-State ResistanceaRDS(on)
VGS = 4.5 V, ID = 19.5 A 0.0051 0.0062 Ω
VGS = 2.5 V, ID = 15.5 A 0.0081 0.0098
Forward Transconductanceagfs VDS = 15 V, ID = 19.5 A 105 S
Diode Forward VoltageaVSD IS = 3.2 A, VGS = 0 V 0.8 1.2 V
Dynamicb
Total Gate Charge Qg
VDS = 10 V, VGS = 4.5 V, ID = 19.5 A
17.5 27
nCGate-Source Charge Qgs 6.6
Gate-Drain Charge Qgd 2.8
Gate Resistance Rgf = 1 MHz 0.7 1.4 2.1 Ω
Tur n - O n D e l ay Time td(on)
VDD = 10 V, RL = 10 Ω
ID ≅ 1 A, VGEN = 10 V, Rg = 6 Ω
25 40
ns
Rise Time tr15 25
Turn-Off Delay Time td(off) 50 75
Fall Time tf12 20
Source-Drain Reverse Recovery Time trr IF = 3.2 A, dI/dt = 100 A/µs 30 60
Output Characteristics
0
12
24
36
48
60
0.0 0.5 1.0 1.5 2.0 2.5 3.0
VGS = 10 thru 2.5 V
1.5 V
VDS - Drain-to-Source Voltage (V)
- Drain Current (A)ID
2 V
Transfer Characteristics
0
12
24
36
48
60
0.0 0.5 1.0 1.5 2.0 2.5
25 °C
TC = 125 °C
- 55 °C
VGS - Gate-to-Source Voltage (V)
- Drain Current (A)I
D