1.35V DDR3L SDRAM VLP UDIMM
MT18KDF2G72AZ – 16GB
Features
DDR3L functionality and operations supported as
defined in the component data sheet
240-pin, very low profile, unbuffered dual in-line
memory module (VLP UDIMM)
Fast data transfer rates: PC3-14900 or PC3-12800
16GB (2 Gig x 72)
VDD = 1.35V (1.235–1.45V)
VDD = 1.5V (1.425–1.575V)
Backward compatible to VDD = 1.5V ±0.075V
VDDSPD = 3.0–3.6V
Supports ECC error detection and correction
Nominal and dynamic on-die termination (ODT) for
data, strobe, and mask signals
Dual-rank
Onboard I2C temperature sensor with integrated
serial presence-detect (SPD) EEPROM
8 internal device banks
Fixed burst chop (BC) of 4 and burst length (BL) of 8
via the mode register set (MRS)
Selectable BC4 or BL8 on-the-fly (OTF)
Gold edge contacts
Halogen-free
Fly-by topology
Terminated control, command, and address bus
Figure 1: 240-Pin VLP UDIMM (MO-269 R/C-K0)
Module Height: 18.75mm (0.738in)
Options Marking
Operating temperature
Commercial (0°C TA 70°C) None
Package
240-pin DIMM (halogen-free) Z
Frequency/CAS latency
1.07ns @ CL = 13 (DDR3-1866) -1G9
1.25ns @ CL = 11 (DDR3-1600) -1G6
Table 1: Key Timing Parameters
Speed
Grade
Industry
Nomenclature
Data Rate (MT/s)
tRCD
(ns)
tRP
(ns)
tRC
(ns)
CL =
13
CL =
11
CL =
10 CL = 9 CL = 8 CL = 7 CL = 6 CL = 5
-1G9 PC3-14900 1866 1600 1333 1333 1066 1066 800 667 13.125 13.125 47.125
-1G6 PC3-12800 1600 1333 1333 1066 1066 800 667 13.125 13.125 48.125
-1G4 PC3-10600 1333 1333 1066 1066 800 667 13.125 13.125 49.125
-1G1 PC3-8500 1066 1066 800 667 13.125 13.125 50.625
-1G0 PC3-8500 1066 800 667 15 15 52.5
-80B PC3-6400 800 667 15 15 52.5
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
Features
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kdf18c2gx72az.pdf – Rev. B 2/15 EN 1Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.
Products and specifications discussed herein are subject to change by Micron without notice.
Table 2: Addressing
Parameter 16GB
Refresh count 8K
Row address 64K A[15:0]
Device bank address 8 BA[2:0]
Device configuration 8Gb (1 Gig x 8)
Column address 2K A[11, 9:0]
Module rank address 2 S#[1:0]
Table 3: Part Numbers and Timing Parameters – 16GB Modules
Base device: MT41K1G8,11.35V 8Gb DDR3L SDRAM
Part Number2
Module
Density Configuration
Module
Bandwidth
Memory Clock/
Data Rate
Clock Cycles
(CL-tRCD-tRP)
MT18KDF2G72AZ-1G9__ 16GB 2 Gig x 72 14.9 GB/s 1.07/1866 MT/s 13-13-13
MT18KDF2G72AZ-1G6__ 16GB 2 Gig x 72 12.8 GB/s 1.25/1600 MT/s 11-11-11
Notes: 1. The data sheet for the base device can be found on micron.com.
2. All part numbers end with a two-place code (not shown) that designates component and PCB revisions. Con-
sult factory for current revision codes. Example: MT18KDF2G72AZ-1G6A1.
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
Features
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kdf18c2gx72az.pdf – Rev. B 2/15 EN 2Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.
Pin Assignments
Table 4: Pin Assignments
240-Pin DDR3 UDIMM Front 240-Pin DDR3 UDIMM Back
Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol
1 VREFDQ 31 DQ25 61 A2 91 DQ41 121 VSS 151 VSS 181 A1 211 VSS
2 VSS 32 VSS 62 VDD 92 VSS 122 DQ4 152 DM3 182 VDD 212 DM5
3 DQ0 33 DQS3# 63 CK1 93 DQS5# 123 DQ5 153 NC 183 VDD 213 NC
4 DQ1 34 DQS3 64 CK1# 94 DQS5 124 VSS 154 VSS 184 CK0 214 VSS
5 VSS 35 VSS 65 VDD 95 VSS 125 DM0 155 DQ30 185 CK0# 215 DQ46
6 DQS0# 36 DQ26 66 VDD 96 DQ42 126 NC 156 DQ31 186 VDD 216 DQ47
7 DQS0 37 DQ27 67 VREFCA 97 DQ43 127 VSS 157 VSS 187 EVENT# 217 VSS
8 VSS 38 VSS 68 NC 98 VSS 128 DQ6 158 CB4 188 A0 218 DQ52
9 DQ2 39 CB0 69 VDD 99 DQ48 129 DQ7 159 CB5 189 VDD 219 DQ53
10 DQ3 40 CB1 70 A10 100 DQ49 130 VSS 160 VSS 190 BA1 220 VSS
11 VSS 41 VSS 71 BA0 101 VSS 131 DQ12 161 DM8 191 VDD 221 DM6
12 DQ8 42 DQS8# 72 VDD 102 DQS6# 132 DQ13 162 NC 192 RAS# 222 NC
13 DQ9 43 DQS8 73 WE# 103 DQS6 133 VSS 163 VSS 193 S0# 223 VSS
14 VSS 44 VSS 74 CAS# 104 VSS 134 DM1 164 CB6 194 VDD 224 DQ54
15 DQS1# 45 CB2 75 VDD 105 DQ50 135 NC 165 CB7 195 ODT0 225 DQ55
16 DQS1 46 CB3 76 S1# 106 DQ51 136 VSS 166 VSS 196 A13 226 VSS
17 VSS 47 VSS 77 ODT1 107 VSS 137 DQ14 167 NU 197 VDD 227 DQ60
18 DQ10 48 NC 78 VDD 108 DQ56 138 DQ15 168 RESET# 198 NC 228 DQ61
19 DQ11 49 NC 79 NC 109 DQ57 139 VSS 169 CKE1 199 VSS 229 VSS
20 VSS 50 CKE0 80 VSS 110 VSS 140 DQ20 170 VDD 200 DQ36 230 DM7
21 DQ16 51 VDD 81 DQ32 111 DQS7# 141 DQ21 171 A15 201 DQ37 231 NC
22 DQ17 52 BA2 82 DQ33 112 DQS7 142 VSS 172 A14 202 VSS 232 VSS
23 VSS 53 NC 83 VSS 113 VSS 143 DM2 173 VDD 203 DM4 233 DQ62
24 DQS2# 54 VDD 84 DQS4# 114 DQ58 144 NC 174 A12 204 NC 234 DQ63
25 DQS2 55 A11 85 DQS4 115 DQ59 145 VSS 175 A9 205 VSS 235 VSS
26 VSS 56 A7 86 VSS 116 VSS 146 DQ22 176 VDD 206 DQ38 236 VDDSPD
27 DQ18 57 VDD 87 DQ34 117 SA0 147 DQ23 177 A8 207 DQ39 237 SA1
28 DQ19 58 A5 88 DQ35 118 SCL 148 VSS 178 A6 208 VSS 238 SDA
29 VSS 59 A4 89 VSS 119 SA2 149 DQ28 179 VDD 209 DQ44 239 VSS
30 DQ24 60 VDD 90 DQ40 120 VTT 150 DQ29 180 A3 210 DQ45 240 VTT
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
Pin Assignments
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Pin Descriptions
The pin description table below is a comprehensive list of all possible pins for all DDR3
modules. All pins listed may not be supported on this module. See Pin Assignments for
information specific to this module.
Table 5: Pin Descriptions
Symbol Type Description
Ax Input Address inputs: Provide the row address for ACTIVE commands, and the column ad-
dress and auto precharge bit (A10) for READ/WRITE commands, to select one location
out of the memory array in the respective bank. A10 sampled during a PRECHARGE
command determines whether the PRECHARGE applies to one bank (A10 LOW, bank
selected by BAx) or all banks (A10 HIGH). The address inputs also provide the op-code
during a LOAD MODE command. See the Pin Assignments table for density-specific ad-
dressing information.
BAx Input Bank address inputs: Define the device bank to which an ACTIVE, READ, WRITE, or
PRECHARGE command is being applied. BA define which mode register (MR0, MR1,
MR2, or MR3) is loaded during the LOAD MODE command.
CKx,
CKx#
Input Clock: Differential clock inputs. All control, command, and address input signals are
sampled on the crossing of the positive edge of CK and the negative edge of CK#.
CKEx Input Clock enable: Enables (registered HIGH) and disables (registered LOW) internal circui-
try and clocks on the DRAM.
DMx Input Data mask (x8 devices only): DM is an input mask signal for write data. Input data
is masked when DM is sampled HIGH, along with that input data, during a write ac-
cess. Although DM pins are input-only, DM loading is designed to match that of the
DQ and DQS pins.
ODTx Input On-die termination: Enables (registered HIGH) and disables (registered LOW) termi-
nation resistance internal to the DDR3 SDRAM. When enabled in normal operation,
ODT is only applied to the following pins: DQ, DQS, DQS#, DM, and CB. The ODT input
will be ignored if disabled via the LOAD MODE command.
Par_In Input Parity input: Parity bit for Ax, RAS#, CAS#, and WE#.
RAS#, CAS#, WE# Input Command inputs: RAS#, CAS#, and WE# (along with S#) define the command being
entered.
RESET# Input
(LVCMOS)
Reset: RESET# is an active LOW asychronous input that is connected to each DRAM
and the registering clock driver. After RESET# goes HIGH, the DRAM must be reinitial-
ized as though a normal power-up was executed.
Sx# Input Chip select: Enables (registered LOW) and disables (registered HIGH) the command
decoder.
SAx Input Serial address inputs: Used to configure the temperature sensor/SPD EEPROM ad-
dress range on the I2C bus.
SCL Input Serial clock for temperature sensor/SPD EEPROM: Used to synchronize communi-
cation to and from the temperature sensor/SPD EEPROM on the I2C bus.
CBx I/O Check bits: Used for system error detection and correction.
DQx I/O Data input/output: Bidirectional data bus.
DQSx,
DQSx#
I/O Data strobe: Differential data strobes. Output with read data; edge-aligned with
read data; input with write data; center-aligned with write data.
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
Pin Descriptions
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Table 5: Pin Descriptions (Continued)
Symbol Type Description
SDA I/O Serial data: Used to transfer addresses and data into and out of the temperature sen-
sor/SPD EEPROM on the I2C bus.
TDQSx,
TDQSx#
Output Redundant data strobe (x8 devices only): TDQS is enabled/disabled via the LOAD
MODE command to the extended mode register (EMR). When TDQS is enabled, DM is
disabled and TDQS and TDQS# provide termination resistance; otherwise, TDQS# are
no function.
Err_Out# Output
(open drain)
Parity error output: Parity error found on the command and address bus.
EVENT# Output
(open drain)
Temperature event: The EVENT# pin is asserted by the temperature sensor when crit-
ical temperature thresholds have been exceeded.
VDD Supply Power supply: 1.35V (1.283–1.45V) backward-compatible to 1.5V (1.425–1.575V). The
component VDD and VDDQ are connected to the module VDD.
VDDSPD Supply Temperature sensor/SPD EEPROM power supply: 3.0–3.6V.
VREFCA Supply Reference voltage: Control, command, and address VDD/2.
VREFDQ Supply Reference voltage: DQ, DM VDD/2.
VSS Supply Ground.
VTT Supply Termination voltage: Used for control, command, and address VDD/2.
NC No connect: These pins are not connected on the module.
NF No function: These pins are connected within the module, but provide no functional-
ity.
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
Pin Descriptions
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kdf18c2gx72az.pdf – Rev. B 2/15 EN 5Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.
DQ Map
Table 6: Component-to-Module DQ Map
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
U1 0 6 128 U2 0 14 137
1 5 123 1 13 132
2 7 129 2 15 138
3 4 122 3 12 131
4 2 9 4 10 18
5 0 3 5 8 12
6 3 10 6 11 19
7 1 4 7 9 13
U3 0 22 146 U4 0 30 155
1 21 141 1 29 150
2 23 147 2 31 156
3 20 140 3 28 149
4 18 27 4 26 36
5 16 21 5 24 30
6 19 28 6 27 37
7 17 22 7 25 31
U5 0 CB6 164 U6 0 38 206
1 CB5 159 1 37 201
2 CB7 165 2 39 207
3 CB4 158 3 36 200
4 CB2 45 4 34 87
5 CB0 39 5 32 81
6 CB3 46 6 35 88
7 CB1 40 7 33 82
U7 0 46 215 U8 0 54 224
1 45 210 1 53 219
2 47 216 2 55 225
3 44 209 3 52 218
4 42 96 4 50 105
5 40 90 5 48 99
6 43 97 6 51 106
7 41 91 7 49 100
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
DQ Map
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Table 6: Component-to-Module DQ Map (Continued)
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
U9 0 62 233 U11 0 61 228
1 61 228 1 62 233
2 63 234 2 60 227
3 60 227 3 63 234
4 58 114 4 57 109
5 56 108 5 59 115
6 59 115 6 56 108
7 57 109 7 58 114
U12 0 53 219 U13 0 45 210
1 54 224 1 46 215
2 52 218 2 44 209
3 55 225 3 47 216
4 49 100 4 41 91
5 51 106 5 43 97
6 48 99 6 40 90
7 50 105 7 42 96
U14 0 37 201 U15 0 CB5 159
1 38 206 1 CB6 164
2 36 200 2 CB4 158
3 39 207 3 CB7 165
4 33 82 4 CB1 40
5 35 88 5 CB3 46
6 32 81 6 CB0 39
7 34 87 7 CB2 45
U16 0 29 150 U17 0 21 141
1 30 155 1 22 146
2 28 149 2 20 140
3 31 156 3 23 147
4 25 31 4 17 22
5 27 37 5 19 28
6 24 30 6 16 21
7 26 36 7 18 27
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
DQ Map
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© 2014 Micron Technology, Inc. All rights reserved.
Table 6: Component-to-Module DQ Map (Continued)
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
U18 0 13 132 U19 0 5 123
1 14 137 1 6 128
2 12 131 2 4 122
3 15 138 3 7 129
4 9 13 4 1 4
5 11 19 5 3 10
6 8 12 6 0 3
7 10 18 7 2 9
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
DQ Map
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kdf18c2gx72az.pdf – Rev. B 2/15 EN 8Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.
Functional Block Diagram
Figure 2: Functional Block Diagram
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DM CS# DQS DQS#
U1
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U19
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
U6
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U14
DQS0
DQS0#
DM0
DQS4
DQS4#
DM4
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
U2
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U18
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
U7
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U13
DQS1
DQS1#
DM1
DQS5
DQS5#
DM5
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
U3
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U17
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
U8
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U12
DQS2
DQS2#
DM2
DQS6
DQS6#
DM6
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
U4
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U16
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
U9
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U11
DQS3
DQS3#
DM3
DQS7
DQS7#
DM7
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
U5
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U15
DQS8
DQS8#
DM8
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
S1#
S0#
ZQ
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
VSS VSS
VSS VSS
VSS VSS
VSS VSS
VSS
Rank 0: U1–U9
Rank 1: U11–U19
DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS#
DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS#
DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS#
DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS#
DM CS# DQS DQS# DM CS# DQS DQS#
BA[2:0]
A[15:0]
RAS#
CAS#
WE#
CKE0
CKE1
ODT0
ODT1
RESET#
BA[2:0]: DDR3 SDRAM
A[15:0]: DDR3 SDRAM
RAS#: DDR3 SDRAM
CAS#: DDR3 SDRAM
WE#: DDR3 SDRAM
CKE0: Rank 0
CKE1: Rank 1
ODT0: Rank 0
ODT1: Rank 1
RESET#: DDR3 SDRAM
Rank 0
CK0
CK0#
CK1
CK1#
VREFCA
VSS
DDR3 SDRAM
DDR3 SDRAM
VDD
Command, control,and
address termination
VDDSPD Temperature sensor/
SPD EEPROM
VTT
DDR3 SDRAMs
DDR3 SDRAM
VREFDQ
Rank 1
A0
Temperature
sensor/
SPD EEPROM
A1 A2
SA0 SA1
SDA
SCL
EVT
U10
EVENT#
SA2
Clock, command, control, and address line terminations:
DDR3
SDRAM
VTT
CK
CK#
DDR3
SDRAM
VDD
CKE[1:0], A[15:0], RAS#
CAS#, WE#, ODT[1:0]
BA[2:0], S#[1:0]
Note: 1. The ZQ ball on each DDR3 component is connected to an external 240Ω ±1% resistor
that is tied to ground. It is used for the calibration of the component’s ODT and output
driver.
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
Functional Block Diagram
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General Description
DDR3 SDRAM modules are high-speed, CMOS dynamic random access memory mod-
ules that use internally configured 8-bank DDR3 SDRAM devices. DDR3 SDRAM mod-
ules use DDR architecture to achieve high-speed operation. DDR3 architecture is essen-
tially an 8n-prefetch architecture with an interface designed to transfer two data words
per clock cycle at the I/O pins. A single read or write access for the DDR3 SDRAM mod-
ule effectively consists of a single 8n-bit-wide, one-clock-cycle data transfer at the inter-
nal DRAM core and eight corresponding n-bit-wide, one-half-clock-cycle data transfers
at the I/O pins.
DDR3 modules use two sets of differential signals: DQS, DQS# to capture data and CK
and CK# to capture commands, addresses, and control signals. Differential clocks and
data strobes ensure exceptional noise immunity for these signals and provide precise
crossing points to capture input signals.
Fly-By Topology
DDR3 modules use faster clock speeds than earlier DDR technologies, making signal
quality more important than ever. For improved signal quality, the clock, control, com-
mand, and address buses have been routed in a fly-by topology, where each clock, con-
trol, command, and address pin on each DRAM is connected to a single trace and ter-
minated (rather than a tree structure, where the termination is off the module near the
connector). Inherent to fly-by topology, the timing skew between the clock and DQS sig-
nals can be easily accounted for by using the write-leveling feature of DDR3.
Temperature Sensor with Serial Presence-Detect EEPROM
Thermal Sensor Operations
The temperature from the integrated thermal sensor is monitored and converts into a
digital word via the I2C bus. System designers can use the user-programmable registers
to create a custom temperature-sensing solution based on system requirements. Pro-
gramming and configuration details comply with JEDEC standard No. 21-C page 4.7-1,
"Definition of the TSE2002av, Serial Presence Detect with Temperature Sensor."
Serial Presence-Detect EEPROM Operation
DDR3 SDRAM modules incorporate serial presence-detect. The SPD data is stored in a
256-byte EEPROM. The first 128 bytes are programmed by Micron to comply with JE-
DEC standard JC-45, "Appendix X: Serial Presence Detect (SPD) for DDR3 SDRAM Mod-
ules." These bytes identify module-specific timing parameters, configuration informa-
tion, and physical attributes. The remaining 128 bytes of storage are available for use by
the customer. System READ/WRITE operations between the master (system logic) and
the slave EEPROM device occur via a standard I2C bus using the DIMM’s SCL (clock)
SDA (data), and SA (address) pins. Write protect (WP) is connected to V SS, permanently
disabling hardware write protection. For further information refer to Micron technical
note TN-04-42, "Memory Module Serial Presence-Detect."
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
General Description
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Electrical Specifications
Stresses greater than those listed may cause permanent damage to the module. This is a
stress rating only, and functional operation of the module at these or any other condi-
tions outside those indicated in each device's data sheet is not implied. Exposure to ab-
solute maximum rating conditions for extended periods may adversely affect reliability.
Table 7: Absolute Maximum Ratings
Symbol Parameter Min Max Units
VDD VDD supply voltage relative to VSS –0.4 1.975 V
VIN, VOUT Voltage on any pin relative to VSS –0.4 1.975 V
Table 8: Operating Conditions
Symbol Parameter Min Nom Max Unit Notes
VDD VDD supply voltage 1.283 1.35 1.45 V
1.425 1.5 1.575 V 1
VREFCA(DC) Input reference voltage command/
address bus
0.49 × VDD 0.5 × VDD 0.51 × VDD V
VREFDQ(DC) I/O reference voltage DQ bus 0.49 × VDD 0.5 × VDD 0.51 × VDD V
IVTT Termination reference current from VTT –600 600 mA
VTT Termination reference voltage (DC) –
command/address bus
0.49 × VDD - 20mV 0.5 × VDD 0.51 × VDD + 20mV V 2
IIInput leakage current;
Any input 0V VIN VDD;
VREF input 0V VIN 0.95V
(All other pins not under
test = 0V)
Address
inputs,
RAS#,
CAS#, WE#,
BA
–36 0 36 µA
S#, CKE,
ODT, CK,
CK#
–18 0 18
DM –4 0 4
IOZ Output leakage current;
0V VOUT VDDQ;
DQ and ODT are disabled;
ODT is HIGH
DQ, DQS,
DQS#
–10 0 10 µA
IVREF VREF supply leakage current;
VREFDQ = VDD/2 or VREFCA = VDD/2
(All other pins not under test = 0V)
–18 0 18 µA
TAModule ambient operating
temperature
Commer-
cial
0 70 °C 3, 4
TCDDR3 SDRAM component
case operating temperature
Commer-
cial
0 95 °C 3, 4, 5
Notes: 1. Module is backward compatible with 1.5V operation. Refer to device specification for
details and operation guidance.
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
Electrical Specifications
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2. VTT termination voltage in excess of the stated limit will adversely affect the command
and address signals’ voltage margin and will reduce timing margins.
3. TA and TC are simultaneous requirements.
4. For further information, refer to technical note TN-00-08: ”Thermal Applications,”
available on micron.com.
5. The refresh rate is required to double when 85°C < TC 95°C.
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
Electrical Specifications
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DRAM Operating Conditions
Recommended AC operating conditions are given in the DDR3 component data sheets.
Component specifications are available at micron.com. Module speed grades correlate
with component speed grades, as shown below.
Table 9: Module and Component Speed Grades
DDR3 components may exceed the listed module speed grades; module may not be available in all listed speed grades
Module Speed Grade Component Speed Grade
-2G1 -093
-1G9 -107
-1G6 -125
-1G4 -15E
-1G1 -187E
-1G0 -187
-80C -25E
-80B -25
Design Considerations
Simulations
Micron memory modules are designed to optimize signal integrity through carefully de-
signed terminations, controlled board impedances, routing topologies, trace length
matching, and decoupling. However, good signal integrity starts at the system level.
Micron encourages designers to simulate the signal characteristics of the system's
memory bus to ensure adequate signal integrity of the entire memory system.
Power
Operating voltages are specified at the DRAM, not at the edge connector of the module.
Designers must account for any system voltage drops at anticipated power levels to en-
sure the required supply voltage is maintained.
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
DRAM Operating Conditions
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IDD Specifications
Table 10: DDR3 IDD Specifications and Conditions – 16GB (Die Revision A)
Values are for the MT41K1G8 DDR3L SDRAM only and are computed from values specified in the 1.35V 8Gb (1 Gig x 8)
component data sheet
Parameter Symbol 1866 1600 Units
Operating current 0: One bank ACTIVATE-to-PRECHARGE IDD01720 702 mA
Operating current 1: One bank ACTIVATE-to-READ-to-PRECHARGE IDD11828 801 mA
Precharge power-down current: Slow exit IDD2P02198 198 mA
Precharge power-down current: Fast exit IDD2P12288 252 mA
Precharge quiet standby current IDD2Q2648 612 mA
Precharge standby current IDD2N2684 648 mA
Precharge standby ODT current IDD2NT2477 459 mA
Active power-down current IDD3P2684 648 mA
Active standby current IDD3N2954 918 mA
Burst read operating current IDD4R11314 1224 mA
Burst write operating current IDD4W11314 1224 mA
Refresh current IDD5B12349 2304 mA
Self refresh temperature current:
MAX TC = 85°C
IDD62
432 432 mA
Self refresh temperature current (SRT-enabled):
MAX TC = 95°C
IDD6ET2
612 612 mA
All banks interleaved read current IDD711899 1809 mA
Reset current IDD82234 234 mA
Notes: 1. One module rank in the active IDD; the other rank in IDD2P0 (slow exit).
2. All ranks in this IDD condition.
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
IDD Specifications
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Temperature Sensor with Serial Presence-Detect EEPROM
The temperature sensor continuously monitors the module's temperature and can be
read back at any time over the I2C bus shared with the SPD EEPROM. Refer to JEDEC
standard No. 21-C page 4.7-1, "Definition of the TSE2002av, Serial Presence Detect with
Temperature Sensor."
Serial Presence-Detect
For the latest SPD data, refer to Micron's SPD page: micron.com/SPD.
Table 11: Temperature Sensor with SPD EEPROM Operating Conditions
Parameter/Condition Symbol Min Max Units
Supply voltage VDDSPD 3.0 3.6 V
Supply current: VDD = 3.3V IDD 2.0 mA
Input high voltage: Logic 1; SCL, SDA VIH VDDSPD x 0.7 VDDSPD + 1 V
Input low voltage: Logic 0; SCL, SDA VIL –0.5 VDDSPD x 0.3 V
Output low voltage: IOUT = 2.1mA VOL 0.4 V
Input current IIN –5.0 5.0 µA
Temperature sensing range –40 125 °C
Temperature sensor accuracy (class B) –1.0 1.0 °C
Table 12: Temperature Sensor and SPD EEPROM Serial Interface Timing
Parameter/Condition Symbol Min Max Units
Time bus must be free before a new transition can
start
tBUF 4.7 µs
SDA fall time tF 20 300 ns
SDA rise time tR 1000 ns
Data hold time tHD:DAT 200 900 ns
Start condition hold time tH:STA 4.0 µs
Clock HIGH period tHIGH 4.0 50 µs
Clock LOW period tLOW 4.7 µs
SCL clock frequency tSCL 10 100 kHz
Data setup time tSU:DAT 250 ns
Start condition setup time tSU:STA 4.7 µs
Stop condition setup time tSU:STO 4.0 µs
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
Temperature Sensor with Serial Presence-Detect EEPROM
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EVENT# Pin
The temperature sensor also adds the EVENT# pin (open-drain). Not used by the SPD
EEPROM, EVENT# is a temperature sensor output used to flag critical events that can be
set up in the sensor’s configuration register.
EVENT# has three defined modes of operation: interrupt mode, compare mode, and
critical temperature mode. Event thresholds are programmed in the 0x01 register using
a hysteresis. The alarm window provides a comparison window, with upper and lower
limits set in the alarm upper boundary register and the alarm lower boundary register,
respectively. When the alarm window is enabled, EVENT# will trigger whenever the
temperature is outside the MIN or MAX values set by the user.
The interrupt mode enables software to reset EVENT# after a critical temperature
threshold has been detected. Threshold points are set in the configuration register by
the user. This mode triggers the critical temperature limit and both the MIN and MAX of
the temperature window.
The compare mode is similar to the interrupt mode, except EVENT# cannot be reset by
the user and returns to the logic HIGH state only when the temperature falls below the
programmed thresholds.
Critical temperature mode triggers EVENT# only when the temperature has exceeded
the programmed critical trip point. When the critical trip point has been reached, the
temperature sensor goes into comparator mode, and the critical EVENT# cannot be
cleared through software.
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
Temperature Sensor with Serial Presence-Detect EEPROM
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Module Dimensions
Figure 3: 240-Pin DDR3 VLP UDIMM
18.9 (0.744)
18.6 (0.732)
Pin 1
2.50 (0.098) D
(2X)
2.30 (0.091) TYP
5.0 (0.197) TYP
123.0 (4.84)
TYP
1.0 (0.039)
TYP
0.80 (0.031)
TYP
0.75 (0.03) R
(6X)
0.76 (0.030) R Pin 120
Front View
133.50 (5.256)
133.20 (5.244)
47.0 (1.85)
TYP
71.0 (2.79)
TYP
9.5 (0.374)
TYP
Back View
Pin 240 Pin 121
1.37 (0.054)
1.17 (0.046)
4.0 (0.157)
MAX
2.20 (0.087) TYP
1.45 (0.057) TYP
3.05 (0.12) TYP
54.68 (2.15)
TYP
3.0 (0.118) TYP 2X
45° 2X
U1
U10
U2 U3 U4 U5 U6 U7 U8 U9
U11 U12 U13 U14 U15 U16 U17 U18 U19
Notes: 1. All dimensions are in millimeters (inches); MAX/MIN or typical (TYP) where noted.
2. The dimensional diagram is for reference only.
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-4000
www.micron.com/products/support Sales inquiries: 800-932-4992
Micron and the Micron logo are trademarks of Micron Technology, Inc.
All other trademarks are the property of their respective owners.
This data sheet contains minimum and maximum limits specified over the power supply and temperature range set forth herein.
Although considered final, these specifications are subject to change, as further product development and data characterization some-
times occur.
16GB (x72, ECC, DR) 240-Pin DDR3L VLP UDIMM
Module Dimensions
PDF: 09005aef85e70df7
kdf18c2gx72az.pdf – Rev. B 2/15 EN 17 Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.