ANALOG Microprocessor-Compatible DEVICES 12-Bit D/A Converter AD767 REV. B 1.1 Scope. This specification covers the detail requirements for a complete 12-bit digital-to-analog converter with microprocessor interface, buried Zener reference and output amplifier. 1.2 Part Number. The complete part number per Table 1 of this specification is as follows: Device Part Number! ~-1 AD767SD/883B NOTE 'See paragraph 1.2.3 for package identifier. 1.2.3 Case Outline. See Appendix 1 of General Specification ADI-M-1000: package outline: D-24B 1.3 Absolute Maximum Ratings. (T= + 25C unless otherwise noted) Voc to Power Ground 2... et et ee ees OV to + 18V Ver to Power Ground... 1... tt tt te ee ee ees OV to 18V Digital Inputs (Pins 11, 13-24) to Power Ground ... 0.0.0... 0 eee eee -1.0V to +7.0V Ref In to Reference Ground. . 2... ee ee ee ee ee ee es +12V Bipolar Offset to Reference Ground... 1... ec tt ee ee ew ee ees +12V 10V Span R to Reference Ground... 1... ee ee ee ea +12V 20V Span R to Reference Ground .. 2... ee ee ee ees +24V Ref Out, Vour (Pins 6,9) 2.0... es Indefinite Short to Power Ground Momentary Short to Vcc Power Dissipation... 2. ee ee te ee eee 1000mW Storage Temperature Range... 2... ee ee ee 65C to + 150C Lead Temperature (Soldering 10sec) . 2... ee ee ee es + 300C 1.5 Thermal Characteristics. Thermal Resistance 6; = 25C/W Qa = 80C DIGITAL-TO-ANALOG CONVERTERS 8-57 DIGITAL-TO-ANALOG CONVERTERS = AD767 SPECIFICATIONS Table 1. Design Sub Sub Limit Group | Group Test Symbol | Device | @+25C | 1 2,3 Test Condition Units Relative Accuracy RA -1 1 1 1 All Bits With Positive + LSB max Errors On. All Bits with Negative Errors On Differential Nonlinearity DNL -1 1 1 1 Major Carry Errors + LSB max Gain Error Ag -1 0.20 0.20 All Bits On + % FSR max Gain Temperature Coefficient TCAE -1 30 30 All Bits On + ppm/C max Unipolar Offset Error Vos -1 2 2 All Bits Off + LSB max Temperature Coefficient : Unipolar Offset TCVgs | -1 3 3 All Bits Off + ppm/C max Bipolar Zero Error Beze -1 0.10 0.10 MSB On, All +% FSR max Other Bits Off Bipolar Mode B/P Zero Temperature TCBpzge| -1 10 10 MSB On, All + ppm/C max Coefficient Other Bits Off Bipolar Mode Input Resistance Rw -1 15 kQ min 25 kf max Reference Output Voltage VREF -1 9.9 9.9 9.9 Unipolar Mode 1.1mA +Vmin 10.10 10.10 { 10.10 | External Load +V max Output Current lout -) 5 +mA min Output Short-Circuit Current | Isc -1 40 +mA max Power Supply Rejection Ratio | PSRR -1 10 10 All Bits On + ppm of FSR/% +11.4V<Vocs + 16.5V max 10 10 All Bits On 11.4V<Vees 16.5V Power Supply Current lec -1 13 13 Vec= + 16.5V, Veg= ~16.5V j +mAmax Icc: All Bits On IgE -1 23 23 Teg: All Bits Off mA max Digital Input High Voltage Vin -1 2.0 2.0 2.0 + Vmin 5.5 +V max Digital Input Low Voltage Vu. -1 0.8 0.8 0.7 + Vmax Digital Input High Current In -1 10 10 Vin =5.5V + pA max Digital Input Low Current lin -1 5 5 Vn. =0.0V +A max Data Setup Time? toc -1 90 ns min Data Hold Time? toy -1 20 ns min CS Pulse Width? tcp -1 ns min Output Voltage Settling Time? | ts1. -1 4 Reg = 10k R, = 2k||S00pF ps max 3 Rep = 5k NOTES Vec= + 1SV, Vee = ~ 15V, SOM resistor Pin 610 Pin7, CS = LOGIC 0, Vy = 2.0V, Vi. = 0.8V, Unipolar configuration unless otherwise specified. Unipolar Configuration ~ Pins | and 2 to Pin, Pin 4 to Pin 5. Bipolar Configuration Pin | to Pin 9, S00 resistor Pin 4 to Pin6. 2 Adjustable toOV. 3See Figure t. 8-58 DIGITAL-TO-ANALOG CONVERTERS REV. B AD767 3.2.1 Functional Block Diagram and Terminal Assignments. PIN CONFIGURATION (mse) (SB) Bw Vec BSC. ~~ === === 066 OFF WU 8 4 24 134 zov sean [| 24] De11(MsB) 1) 20V SPAN oe 6 + Ov oe 10V SPAN I [23] B10 > 12-BIT PARALLEL DATA LATCH 996k 2) 10V SPAN sum ser. [3 | [22] ops sh sp or (| 21] ops 3) SUM UCT medial novo Fs] om iN 12-817 HIGH-SPEED DAC - +) Voor serout[e] _An7e7 [13] oes 7 + TOP VEW S 20k nee w (7 | {Not to Seale] [18] 088 v AD767 +Vee [8] 17] pes Vour[ 9 16] oF b $o Mo Vee DGNO AGNO Ve fo} 45} DB2 es fa 4] pat Functional Block Diagram penp [12 13] DBOILSB) 3.2.4 Microcircuit Technology Group. This microcircuit is covered by technology group (56). 4.2.1 Life Test/Burn-In Circuit. Steady state life test is per MIL-STD-883 Method 1005. Burn-in is per MIL-STD-883 Method 1015 test condition (B). TOP VIEW (Not to Scale} +15V -56Vv O__ GND o____1 - = ~ FRE Oooo +5V 0 REV. B DIGITAL-TO-ANALOG CONVERTERS 8-59 DIGITAL-TO-ANALOG CONVERTERS a AD767 Timing Specifications. Vee = +12V or +15V, Veg = -12V or 15V. ter a Letom tee L__t cs Vour = ae Figure 1. 8-60 DIGITAL-TO-ANALOG CONVERTERS REV. B