MIL-M-38510/1F
16 March 2005
SUPERSEDING
MIL-M-38510/1E
1 June 1982
MILITARY SPECIFICATION
MICROCIRCUITS, DIGITAL, TTL, NAND GATES,
MONOLITHIC SILICON
This specification is approv ed for use by all Departments
and Agencies of the Department of Defense.
The requirements for acquiring the prod uct herein shall consist of this specification sheet and MIL-PRF 38535
1. SCOPE
1.1 Scope. This specification covers the det ail requirements for monolithic silicon, TTL, positive NAND logic
gating microcircuits. Two product assurance classes an d a choice of case outlines and lead finishes are provi ded for
each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 h ave
been superseded by MIL-PRF-38535, (see 6.3).
1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types are as follows:
Device type Circuit
01 Single, 8-input positive NAND gate
02 Dual, 4-input positive NAND gate
03 Triple, 3-input positive NAND gate
04 Quadruple, 2-input positive NAND gate
05 Hex, 1-input inverter gate
06 Triple, 3-input positive NAND gate (open collector output)
07 Quadruple, 2-input positive NAND gate (o pen collector output)
08 Hex, 1-input inverter gate (open collector o utput)
09 Same as device type 07, except different pin conn ections
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style
A GDFP5-F14 or CDFP6-F14 14 Flat
B GDFP4-F14 14 Flat
C GDIP1-T14 or CDIP2-T14 14 Dual-in-line
D GDFP1-F14 or CDFP2-F14 14 Flat
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to
bipolar@dla.mil . Since contact information can change, you may want to verify the currency of this address
information using the ASSIST Online database at http://assist.daps.dla.mil .
AMSC N/A FSC 5962
INCH-POUND
MIL-M-38510/1F
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1.3 Absolute maximum ratings.
Supply voltage range ..............................................................................-0.5 V to +7.0 V
Input voltage range .................................................................................-1.5 V at -12 mA to +5.5 V
Storage temperature range .................................................................... -65° to +150°C
Maximum power dissipation per gate (PD) 1/.......................................... 40 mW
Lead temperature (soldering, 10 seconds) ............................................. 300°C
Thermal resistance, junction to case (θJC) ............................................. (See MIL-STD-1835)
Junction temperature (TJ) 2/................................................................... 175°C
1.4 Recommended operating conditions.
Supply voltage........................................................................................ +4.5 V minimum to +5.5 V maximum
Minimum high level input voltage .......................................................... +2.0 V
Maximum low level input voltage (VIL) ................................................... +0.8 V
Normalized fanout (each output) 3/ ........................................................ 10 maximum
Case operating temperature range ......................................................... -55° to +125°C
_______
1/ Must withstand the added PD due to short-circuit test (e.g., IOS).
2/ Maximum junction temperature shall not be exceeded except for allowable short duration burn-in
screening conditions in accordance with MIL-PRF-38535.
3/ Device will fanout in both high and lo w levels to the specified number of inputs of the same device type
as that being tested.
MIL-M-38510/1F
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2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specificatio n.
This section does not include documents cited in other sections of this specification or recommended for
additional information or as examples. While every effort has been made to ensure th e completeness of this
list, document users are cautioned that they must meet all specifi ed requirements of documents cited in
sections 3, 4, or 5 of this specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications and Standards. The following specifications and standards form a part of this specification to
the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard for Microelectronics.
MIL-STD-1835 - Interface Standard Electronic Comp onent Case Outlines
(Copies of these documents ar e available online at http://assist.daps.dla.mil/quicksearch/ or
http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Bu ilding 4D,
Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited
herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws
and regulations unless a sp ecific exemption has been obtaine d.
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the a pplicable qualified ma nufacturers list before
contract award (see 4.3 and 6.4).
3.2 Item requirements. The individual item requirements shall be in accor dance with MIL-PRF-38535 and as
specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the
QM plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dime nsions. The design, construction, and physical dimensions shall be
as specified in MIL-PRF-38535 and herein.
3.3.1 Terminal connections and logic diagrams. The terminal connections and lo gic diagrams shall be as
specified on figure 1.
3.3.2 Truth tables and logic equations. The truth tables and logic equations shall be as specified on figure 2.
3.3.3 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to
the qualifying ac tivity and the preparing activity upon request.
3.3.4 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics . The electrical performance characteristics are as specifi ed in table I,
and apply over the full recom m ended case operating temp erature range, unless other wise specifi ed.
MIL-M-38510/1F
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TABLE I. Electrical performance characteristi cs.
Test Symbol Conditions Device Limits Unit
-55°C ≤ TC ≤ +125°C types Min Max
High level output
voltage VOH V
CC = 4.5 V, VIN = 0.8 V,
IOH = -400 µA 1/ 01, 02,
03, 04,
05
2.4 - - - V
Low level output
voltage VOL V
CC = 4.5 V, IOL = 16 mA,
VIN = 2.0 V for all inputs of gate under
test 1/
All 0.4 V
Input clamp voltage VI C V
CC = 4.5 V, IIN = -12 mA
TC = 25°C All -1.5 V
Maximum collector
cut-off current ICEX V
CC = 4.5 V, VIN = 0.8 V,
VOH = 5.5 V
06, 07
08, 09 250
µA
High level input
current IIH1 V
CC = 5.5 V, VIN = 2.4 V 2/ All 40
µA
High level input
current IIH2 V
CC = 5.5 V, VIN = 5.5 V 2/ All 100
µA
Low level input
current IIL V
CC = 5.5 V, VIN = 0.4 V 1/ All -0.7 -1.6 mA
Short circuit output
current I OS V
CC = 5.5 V 2/ 3/ 01, 02,
03, 04,
05
-20 -55 mA
High level supply
current per gate I CCH V
CC = 5.5 V, VIN = 0 V 2/ All 1.65 mA
Low level supply
current per gate I CCL V
CC = 5.5 V, VIN = 5.5 V 1/ All 5.0 mA
Propagation delay time,
high-to-low level tPHL C
L = 50 pF,
RL = 390Ω 01, 02,
03, 04,
05
3 24 ns
06, 07,
08, 09 3 29 ns
Propagation delay time,
low-to-high level tPLH C
L = 50 pF,
RL = 390Ω 01, 02,
03, 04,
05
3 27 ns
06, 07,
08, 09 3 35 ns
1/ All unspecified inputs at 5.5 volts.
2/ All unspecified inputs grounded.
3/ Not more than one output should be shorte d at a time.
MIL-M-38510/1F
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3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups
specified in table II. The electrical tests for each subgroup are described in table III.
TABLE II. Electrical test requirements.
Subgroups (see table III)
MIL-PRF-38535
test requirements Class S
devices Class B
devices
Interim electrical parameters
1 1
Final electrical test parameters
1*, 2, 3, 9
10, 11 1*, 2, 3, 9
Group A test requirements
1, 2, 3, 9,
10, 11 1, 2, 3, 9
Group B electrical test parameters
when using the method 5005 QCI option 1, 2, 3, 9,
10, 11 N/A
Group C end-point electrical
parameters 1, 2, 3, 9,
10, 11 1, 2, 3
Additional electrical parameters for
group C periodic inspections N/A 10, 11
Group D end-point electrical parameters
1, 2, 3 1, 2, 3
*PDA applies to subgroup 1.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group
number 1 (see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF- 38535
or as modified in the device manufacturer' s Quality Management (QM) plan. The modification in the QM plan shall
not affect the form, fit, or function as described herein.
4.2 Screening. Screening shall b e in accordance with MIL-PRF-38535 and shall be co nducted on all devices prior
to qualification and conformance inspection. The follo wing additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperatur e, or approved alternatives shall be as
specified in the device manufacturer' s QM plan in accordance with MIL-PRF-38535. The burn-i n test
circuit shall be maintained under document control by the device manufacturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made avail ab le to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, out puts, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space leve l product shall be as specified i n MIL-PRF - 38535, Appendix B.
MIL-M-38510/1F
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4.3 Qualification inspection. Qualification inspection shall be in accord ance with MIL-PRF-38535.
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with
MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
follows:
a. Tests shall be as specifi ed in table II herein.
b. Subgroups 4, 5, 6, 7, and 8 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as
follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be
as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test
circuit shall be maintained under document control by the device manufacturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made avail ab le to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, out puts, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
electrical parameters shal l be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be a s specified and as follows:
4.5.1 Voltage and current. All voltages give n are referenced to the microcircuit ground terminal. Currents given
are conventional and positive when flowing into the referen c ed terminal.
MIL-M-38510/1F
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FIGURE 1. Terminal connections and logic d iagrams.
MIL-M-38510/1F
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FIGURE 1. Terminal connections and logic d iagrams - Continued.
MIL-M-38510/1F
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FIGURE 1. Terminal connections and logic d iagrams - Continued.
MIL-M-38510/1F
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Device type 01 Device types 03 and 06
Truth table Truth table
Input Output Input Output
A B C D E F G H Y A B C Y
H H H H H H H H L L L L H
H L L H All other combinations of H and L
at the inputs give H output. L H L H
H H L H
Positive logic Y = ABCDEFGH L L H H
H L H H
L H H H
H H H L
Positive logic Y = ABC
Device type 02 Device types 04, 07, and 09
Truth table Truth table each gate
Input Output Input Output
A B C D Y A B Y
L L L L H L L H
H L L L H H L H
L H L L H L H H
H H L L H H H L
L L H L H
H L H L H Positive logic Y = AB
L H H L H
H H H L H
L L L H H
H L L H H
L H L H H Device types 05 and 08
H H L H H Truth table each gate
L L H H H Input Input
H L H H H A Y
L H H H H L H
H H H H L H L
Positive logic Y = ABCD Positive logic Y = A
FIGURE 2. Truth tables and logic equations.
MIL-M-38510/1F
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NOTES:
1. CL = 50 pF minimum, including scope probe, wiring and stray capacitance, without package in test fixture.
2. Voltage measurements are to be made with respect to network ground terminal.
3. All diode are 1N3064 or equivalent.
4. RL = 390 ohm ±5%.
FIGURE 3. Test circuit and switchin g waveforms.
TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Case C 13 1 2 14 3 4 5 6 11 12 7 8 9 10 Measured Limits Unit
method Test no. NC A B VCC C D E F G H GND Y NC NC terminal Min Max
1 VOL 3007 1 2.0 V 2.0 V 4.5 V 2.0 V 2.0 V 2.0 V 2.0 V 2.0 V 2.0 V GND 16mA Y 0.4 V
Tc = 25°C VOH 3006 2 0.8 V 5.5 V 4.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND -.4mA Y 2.4 V
3 5.5 V 0.8 V " " " " " " " " " Y " "
4 " 5.5 V " 0.8 V " " " " " " " Y " "
5 " " " 5.5 V 0.8 V " " " " " " Y " "
6 " " " " 5.5 V 0.8 V " " " " " Y " "
7 " " " " " 5.5 V 0.8 V " " " " Y " "
8 " " " " " " 5.5 V 0.8 V " " " Y " "
9 " " " " " " " 5.5 V 0.8 V " " Y " "
I
OS 3011 10 GND GND 5.5 V GND GND GND GND GND GND GND GND Y -20 -55 mA
I
IH1 3010 11 2.4 V GND 5.5 V GND GND GND GND GND GND GND A 40 µA
12 GND 2.4 V " " " " " " " " B " "
13 " GND " 2.4 V " " " " " " C " "
14 " " " GND 2.4 V " " " " " D " "
15 " " " " GND 2.4 V " " " " E " "
16 " " " " " GND 2.4 V " " " F " "
17 " " " " " " GND 2.4 V " " G " "
18 " " " " " " " GND 2.4 V " H " "
I
IH2 3010 19 5.5 V GND 5.5 V GND GND GND GND GND GND GND A 100 µA
20 GND 5.5 V " " " " " " " " B " "
21 " GND " 5.5 V " " " " " " C " "
22 " " " GND 5.5 V " " " " " D " "
23 " " " " GND 5.5 V " " " " E " "
24 " " " " " GND 5.5 V " " " F " "
25 " " " " " " GND 5.5 V " " G " "
26 " " " " " " " GND 5.5 V " H " "
I
IL 3009 27 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND A -0.7 -1.6 mA
28 5.5 V 0.4 V " " " " " " " " B " " "
29 " 5.5 V " 0.4 V " " " " " " C " " "
30 " " " 5.5 V 0.4 V " " " " " D " " "
31 " " " " 5.5 V 0.4 V " " " " E " " "
32 " " " " " 5.5 V 0.4 V " " " F " " "
33 " " " " " " 5.5 V 0.4 V " " G " " "
34 " " " " " " " 5.5 V 0.4 V " H " " "
I
CCL 3005 35 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND VCC 5.0 mA
I
CCH 3005 36 GND GND 5.5 V GND GND GND GND GND GND GND VCC 1.65 mA
V
I C 37 -12 mA 4.5 V GND A -1.5 V
38 -12 mA " " B " "
39 " -12 mA " C " "
40 " -12 mA " D " "
41 " -12 mA " E " "
42 " -12 mA " F " "
43 " -12 mA " G " "
44 " -12 mA " H " "
2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C an d VI C tests are omitted.
9 tPHL 3003 45 IN 2.4 V 5.0 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V GND OUT A to Y 3 20 ns
Tc = 25°C tPLH (Fig. 3) 46 " " " " " " " " " " " A to Y 3 25 ns
10 tPHL 3003 47 IN 2.4 V 5.0 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V GND OUT A to Y 3 24 ns
Tc = 125°C tPLH (Fig. 3) 48 " " " " " " " " " " " A to Y 3 27 ns
11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
MIL-M-38510/1F
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TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Case C 1 6 3 14 11 9 10 12 13 8 7 2 4 5 Measured Limits Unit
method Test no. 1A 1Y NC VCC NC 2A 2B 2C 2D 2Y GND 1B 1C 1D terminal Min Max
1 VOL 3007 1 2.0 V 16 mA 4.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 2.0 V 2.0 V 2.0 V 1Y 0.4 V
Tc = 25°C 2 5.5 V " 2.0 V 2.0 V 2.0 V 2.0 V 16 mA " 5.5 V 5.5 V 5.5 V 2Y " "
V
OH 3006 3 0.8 V -.4 mA 4.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 5.5 V 1Y 2.4 V
4 5.5 V " " " " " " " 0.8 V " " 1Y " "
5 " " " " " " " " 5.5 V 0.8 V " 1Y " "
6 " " " " " " " " " 5.5 V 0.8 V 1Y " "
7 " " 0.8 V " " " -.4 mA " " " 5.5 V 2Y " "
8 " " 5.5 V 0.8 V " " " " " " " 2Y " "
9 " " " 5.5 V 0.8 V " " " " " " 2Y " "
10 " " " " 5.5 V 0.8 V " " " " " 2Y " "
I
OS 3011 11 GND GND 5.5 V GND GND GND GND 1Y -20 -55 mA
12 " GND GND GND GND GND 2Y " " "
I
IH1 3010 13 2.4 V 5.5 V GND GND GND GND GND GND GND GND 1A 40 µA
14 GND " " " " " " 2.4 V " " 1B " "
15 " " " " " " " GND 2.4 V " 1C " "
16 " " " " " " " " GND 2.4 V 1D " "
17 " " 2.4 V " " " " " " GND 2A " "
18 " " GND 2.4 V " " " " " " 2B " "
19 " " " GND 2.4 V " " " " " 2C " "
20 " " " " GND 2.4 V " " " " 2D " "
I
IH2 3010 21 5.5 V 5.5 V GND GND GND GND GND GND GND GND 1A 100 µA
22 GND " " " " " " 5.5 V " " 1B " "
23 " " " " " " " GND 5.5 V " 1C " "
24 " " " " " " " " GND 5.5 V 1D " "
25 " " 5.5 V " " " " " " GND 2A " "
26 " " GND 5.5 V " " " " " " 2B " "
27 " " " GND 5.5 V " " " " " 2C " "
28 " " " " GND 5.5 V " " " " 2D " "
I
IL 3009 29 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 5.5 V 1A -0.7 -1.6 mA
30 5.5 V " " " " " " 0.4 V " " 1B " " "
31 " " " " " " " 5.5 V 0.4 V " 1C " " "
32 " " " " " " " " 5.5 V 0.4 V 1D " " "
33 " " 0.4 V " " " " " " 5.5 V 2A " " "
34 " " 5.5 V 0.4 V " " " " " " 2B " " "
35 " " " 5.5 V 0.4 V " " " " " 2C " " "
36 " " " " 5.5 V 0.4 V " " " " 2D " " "
I
CCL 3005 37 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 5.5 V VCC 10 mA
I
CCH 3005 38 GND 5.5 V GND GND GND GND GND GND GND GND VCC 3.3 mA
V
I C 39 -12 mA 4.5 V GND 1A -1.5 V
40 " " -12 mA 1B " "
41 " " -12 mA 1C " "
42 " " -12 mA 1D " "
43 " -12 mA " 2A " "
44 " -12 mA " 2B " "
45 " -12 mA " 2C " "
46 " -12 mA " 2D " "
2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C an d VI C tests are omitted.
9 tPHL 3003 47 IN OUT 5.0 V GND 2.4 V 2.4 V 2.4 V 1A to 1Y 3 20 ns
Tc = 25°C tPHL (Fig. 3) 48 " IN 2.4 V 2.4 V 2.4 V OUT " 2A to 2Y " " "
t
PLH 3003 49 IN OUT 5.0 V GND 2.4 V 2.4 V 2.4 V 1A to 1Y 3 25 ns
t
PLH (Fig. 3) 50 " IN 2.4 V 2.4 V 2.4 V OUT " 2A to 2Y " " "
10 tPHL 3003 51 IN OUT 5.0 V GND 2.4 V 2.4 V 2.4 V 1A to 1Y 3 24 ns
Tc = 125°C tPHL (Fig. 3) 52 " IN 2.4 V 2.4 V 2.4 V OUT " 2A to 2Y " " "
t
PLH 3003 53 IN OUT 5.0 V GND 2.4 V 2.4 V 2.4 V 1A to 1Y 3 27 ns
t
PLH (Fig. 3) 54 " IN 2.4 V 2.4 V 2.4 V OUT " 2A to 2Y " " "
11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
MIL-M-38510/1F
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TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Case C 1 2 12 14 6 3 4 5 9 10 7 11 8 13 Measured Limits Unit
method Test no. 1A 1B 1Y VCC 2Y 2A 2B 2C 3A 3B GND 3C 3Y 1C terminal Min Max
1 VOL 3007 1 2.0 V 2.0 V 16 mA 4.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 2.0 V 1Y 0.4 V
Tc = 25°C 2 5.5 V 5.5 V " 16 mA 2.0 V 2.0 V 2.0 V " " " " 5.5 V 2Y " "
3 " " " 5.5 V 5.5 V 5.5 V 2.0 V 2.0 V " 2.0 V 16 mA " 3Y " "
V
OH 3006 4 0.8 V 5.5 V -.4 mA 4.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 1Y 2.4 V
5 5.5 V 0.8 V " " " " " " " " " " 1Y " "
6 " 5.5 V " " " " " " " " " 0.8 V 1Y " "
7 " " " -.4 mA 0.8 V " " " " " " 5.5 V 2Y " "
8 " " " " 5.5 V 0.8 V " " " " " " 2Y " "
9 " " " " " 5.5 V 0.8 V " " " " " 2Y " "
10 " " " " " 5.5 V 0.8 V " " " -.4 mA " 3Y " "
11 " " " " " " 5.5 V 0.8 V " " " " 3Y " "
12 " " " " " " " 5.5 V " 0.8 V " " 3Y " "
I
OS 3011 13 GND GND GND 5.5 V GND GND 1Y -20 -55 mA
14 " GND GND GND GND " 2Y " " "
15 " GND GND " GND GND 3Y " " "
I
IH1 3010 16 2.4 V GND 5.5 V GND GND GND GND GND GND GND GND 1A 40
µA
17 GND 2.4 V " " " " " " " " " 1B " "
18 " GND " " " " " " " " 2.4 V 1C " "
19 " " " 2.4 V " " " " " " GND 2A " "
20 " " " GND 2.4 V " " " " " " 2B " "
21 " " " " GND 2.4 V " " " " " 2C " "
22 " " " " " GND 2.4 V " " " " 3A " "
23 " " " " " " GND 2.4 V " " " 3B " "
24 " " " " " " " GND " 2.4 V " 3C " "
I
IH2 3010 25 5.5 V GND 5.5 V GND GND GND GND GND GND GND GND 1A 100 µA
26 GND 5.5 V " " " " " " " " " 1B " "
27 " GND " " " " " " " " 5.5 V 1C " "
28 " " " 5.5 V " " " " " " GND 2A " "
29 " " " GND 5.5 V " " " " " " 2B " "
30 " " " " GND 5.5 V " " " " " 2C " "
31 " " " " " GND 5.5 V " " " " 3A " "
32 " " " " " " GND 5.5 V " " " 3B " "
33 " " " " " " " GND " 5.5 V " 3C " "
I
IL 3009 34 0.4 V 5.5 V " 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 1A -0.7 -1.6 mA
35 5.5 V 0.4 V " " " " " " " " " 1B " " "
36 " 5.5 V " " " " " " " " 0.4 V 1C " " "
37 " " " 0.4 V " " " " " " 5.5 V 2A " " "
38 " " " 5.5 V 0.4 V " " " " " " 2B " " "
39 " " " " 5.5 V 0.4 V " " " " " 2C " " "
40 " " " " " 5.5 V 0.4 V " " " " 3A " " "
41 " " " " " " 5.5 V 0.4 V " " " 3B " " "
42 " " " " " " " 5.5 V " 0.4 V " 3C " " "
I
CCH 3005 43 GND GND 5.5 V GND GND GND GND GND GND GND GND VCC 4.95 mA
I
CCL 3005 44 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V VCC 15 mA
V
I C 45 -12 mA 4.5 V GND 1A -1.5 V
46 -12mA " " 1B " "
47 " " -12 mA 1C " "
48 " -12 mA " 2A " "
49 " -12 mA " 2B " "
50 " -12 mA " 2C " "
51 " -12 mA " 3A " "
52 " -12 mA " 3B " "
53 " " -12 mA 3C " "
2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C an d VI C tests are omitted.
14
MIL-M-38510/1F
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Case C 1 2 12 14 6 3 4 5 9 10 7 11 8 13 Measured Limits Unit
method Test no. 1A 1B 1Y VCC 2Y 2A 2B 2C 3A 3B GND 3C 3Y 1C terminal Min Max
9 tPHL 3003 54 IN 2.4 V OUT 5.0 V GND 2.4 V 1A to 1Y 3 20 ns
Tc = 25°C (Fig. 3) 55 " OUT IN 2.4 V 2.4 V " 2A to 2Y " " "
56 " IN 2.4 V " 2.4 V OUT 3A to 3Y " " "
t
PLH 3003 57 IN 2.4 V OUT 5.0 V GND 2.4 V 1A to 1Y 3 25 ns
(Fig. 3) 58 " OUT IN 2.4 V 2.4 V " 2A to 2Y " " "
59 " IN 2.4 V " 2.4 V OUT 3A to 3Y " " "
10 tPHL 3003 60 IN 2.4 V OUT 5.0 V GND 2.4 V 1A to 1Y 3 24 ns
Tc = 125°C (Fig. 3) 61 " OUT IN 2.4 V 2.4 V " 2A to 2Y " " "
62 " IN 2.4 V " 2.4 V OUT 3A to 3Y " " "
t
PLH 3003 63 IN 2.4 V OUT 5.0 V GND 2.4 V 1A to 1Y 3 27 ns
(Fig. 3) 64 " OUT IN 2.4 V 2.4 V " 2A to 2Y " " "
65 " IN 2.4 V " 2.4 V OUT 3A to 3Y " " "
11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
15
MIL-M-38510/1F
TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Case C 1 2 3 14 6 4 5 8 9 10 7 12 13 11 Measured Limits Unit
method Test no. 1A 1B 1Y VCC 2Y 2A 2B 3Y 3A 3B GND 4A 4B 4Y terminal Min Max
1 VOL 3007 1 2.0 V 2.0 V 16 mA 4.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 1Y 0.4 V
Tc = 25°C 2 5.5 V 5.5 V " 16 mA 2.0 V 2.0 V " " " " " 2Y " "
3 " " " 5.5 V 5.5 V 16 mA 2.0 V 2.0 V " " " 3Y " "
4 " " " " " 5.5 V 5.5 V " 2.0 V 2.0 V 16 mA 4Y " "
V
OH 3006 5 0.8 V 5.5 V -.4 mA 4.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 1Y 2.4 V
6 5.5 V 0.8 V " " " " " " " " " 1Y " "
7 " 5.5 V " -.4 mA 0.8 V " " " " " " 2Y " "
8 " " " " 5.5 V 0.8 V " " " " " 2Y " "
9 " " " " 5.5 V -.4 mA 0.8 V " " " " 3Y " "
10 " " " " " " 5.5 V 0.8 V " " " 3Y " "
11 " " " " " " 5.5 V " 0.8 V " -.4 mA 4Y " "
12 " " " " " " " " 5.5 V 0.8 V " 4Y " "
I
OS 3011 13 GND GND GND 5.5 V GND 1Y -20 -55 mA
14 " GND GND GND " 2Y " " "
15 " GND GND GND " 3Y " " "
16 " " GND GND GND 4Y " " "
I
IH1 3010 17 2.4 V GND 5.5 V GND GND GND GND GND GND GND 1A 40 µA
18 GND 2.4 V " " " " " " " " 1B " "
19 " GND " 2.4 V " " " " " " 2A " "
20 " " " GND 2.4 V " " " " " 2B " "
21 " " " " GND 2.4 V " " " " 3A " "
22 " " " " " GND 2.4 V " " " 3B " "
23 " " " " " " GND " 2.4 V " 4A " "
24 " " " " " " " " GND 2.4 V 4B " "
I
IH2 3010 25 5.5 V GND 5.5 V GND GND GND GND GND GND GND 1A 100 µA
26 GND 5.5 V " " " " " " " " 1B " "
27 " GND " 5.5 V " " " " " " 2A " "
28 " " " GND 5.5 V " " " " " 2B " "
29 " " " " GND 5.5 V " " " " 3A " "
30 " " " " " GND 5.5 V " " " 3B " "
31 " " " " " " GND " 5.5 V " 4A " "
32 " " " " " " " " GND 5.5 V 4B " "
I
IL 3009 33 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 1A -0.7 -1.6 mA
34 5.5 V 0.4 V " " " " " " " " 1B " " "
35 " 5.5 V " 0.4 V " " " " " " 2A " " "
36 " " " 5.5 V 0.4 V " " " " " 2B " " "
37 " " " " 5.5 V 0.4 V " " " " 3A " " "
38 " " " " " 5.5 V 0.4 V " " " 3B " " "
39 " " " " " " 5.5 V " 0.4 V " 4A " " "
40 " " " " " " " " 5.5 V 0.4 V 4B " " "
I
CCH 3005 41 GND GND 5.5 V GND GND GND GND GND GND GND VCC 6.6 mA
I
CCL 3005 42 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V VCC 20 mA
V
I C 43 -12 mA 4.5 V GND 1A -1.5 V
44 -12mA " " 1B " "
45 " -12 mA " 2A " "
46 " -12 mA " 2B " "
47 " -12 mA " 3A " "
48 " -12 mA " 3B " "
49 " " -12 mA 4A " "
50 " " -12 mA 4B " "
2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C an d VI C tests are omitted.
MIL-M-38510/1F
16
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Case C 1 2 12 14 6 3 4 5 9 10 7 11 8 13 Measured Limits Unit
method Test no. 1A 1B 1Y VCC 2Y 2A 2B 3Y 3A 3B GND 4A 4B 4Y terminal Min Max
9 tPHL 3003 51 IN 2.4 V OUT 5.0 V GND 1A to 1Y 3 20 ns
Tc = 25°C (Fig. 3) 52 " OUT IN 2.4 V " 2A to 2Y " " "
53 " OUT IN 2.4 V " 3A to 3Y " " "
54 " " IN 2.4 V OUT 4A to 4Y " " "
t
PLH 3003 55 IN 2.4 V OUT 5.0 V GND 1A to 1Y 3 25 ns
(Fig. 3) 56 " OUT IN 2.4 V " 2A to 2Y " " "
57 " OUT IN 2.4 V " 3A to 3Y " " "
58 " " IN 2.4 V OUT 4A to 4Y " " "
10 tPHL 3003 59 IN 2.4 V OUT 5.0 V GND 1A to 1Y 3 24 ns
Tc = 125°C (Fig. 3) 60 " OUT IN 2.4 V " 2A to 2Y " " "
61 " OUT IN 2.4 V " 3A to 3Y " " "
62 " " IN 2.4 V OUT 4A to 4Y " " "
t
PLH 3003 63 IN 2.4 V OUT 5.0 V GND 1A to 1Y 3 27 ns
(Fig. 3) 64 " OUT IN 2.4 V " 2A to 2Y " " "
65 " OUT IN 2.4 V " 3A to 3Y " " "
66 " " IN 2.4 V OUT 4A to 4Y " " "
11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
17
MIL-M-38510/1F
TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Case C 11 4 3 14 5 6 9 8 11 10 7 12 13 2 Measured Limits Unit
method Test no. 1A 2Y 2A VCC 3A 3Y 4A 4Y 5A 5Y GND 6Y 6Y 6A terminal Min Max
1 VOL 3007 1 2.0 V 5.5 V 4.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 16mA 1Y 0.4 V
Tc = 25°C 2 5.5 V 16 mA 2.0 V " " " " " " 2Y " "
3 " 5.5 V " 2.0 V 16mA " " " " 3Y " "
4 " " " 5.5 V 2.0 V 16mA " " " 4Y " "
5 " " " " 5.5 V 2.0 V 16mA " " 5Y " "
6 " " " " " 5.5 V " 16mA 2.0 V 6Y " "
V
OH 3006 7 0.8 V 5.5 V 4.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V -.4mA 1Y 2.4 V
8 5.5 V -.4 mA 0.8 V " " " " " " 2Y " "
9 " 5.5 V " 0.8 V -.4 mA " " " " 3Y " "
10 " " " 5.5 V 0.8 V -.4 mA " " " 4Y " "
11 " " " " 5.5 V 0.8 V -.4 mA " " 5Y " "
12 " " " " " 5.5 V " -.4 mA 0.8 V 6Y " "
I
OS 3011 13 GND 5.5 V GND GND 1Y -20 -55 mA
14 GND GND " " 2Y " " "
15 " GND GND " 3Y " " "
16 " GND GND " 4Y " " "
17 " GND GND " 5Y " " "
18 " " GND GND 6Y " " "
I
IH1 3010 19 2.4 V GND 5.5 V GND GND GND GND GND 1A 40
µA
20 GND 2.4 V " " " " " " 2A " "
21 " GND " 2.4 V " " " " 3A " "
22 " " " GND 2.4 " " " 4A " "
23 " " " " GND 2.4 V " " 5A " "
24 " " " " " GND " 2.4 V 6A " "
I
IH2 3010 25 5.5 V GND 5.5 V GND GND GND GND GND 1A 100
µA
26 GND 5.5 V " " " " " " 2A " "
27 " GND " 5.5 V " " " " 3A " "
28 " " " GND 5.5 V " " " 4A " "
29 " " " " GND 5.5 V " " 5A " "
30 " " " " " GND " 5.5 V 6A " "
I
IL 3009 31 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 1A -0.7 -1.6 mA
32 5.5 V 0.4 V " " " " " " 2A " " "
33 " 5.5 V " 0.4 V " " " " 3A " " "
34 " " " 5.5 V 0.4 V " " " 4A " " "
35 " " " " 5.5 V 0.4 V " " 5A " " "
36 " " " " " 5.5 V " 0.4 V 6A " " "
I
CCL 3005 37 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V VCC 30 mA
I
CCH 3005 38 GND GND 5.5 V GND GND GND GND GND VCC 9.9 mA
V
I C 39 -12 mA 4.5 V GND 1A -1.5 V
40 -12 mA " " 2A " "
41 " -12 mA " 3A " "
42 " -12 mA " 4A " "
43 " -12 mA " 5A " "
44 " " -12 mA 6A " "
2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C an d VI C tests are omitted.
MIL-M-38510/1F
18
TABLE III. Group A inspection for device type 05 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Case C 1 2 12 14 6 3 4 5 9 10 7 11 8 13 Measured Limits Unit
method Test no. 1A 1B 1Y VCC 2Y 2A 2B 3Y 3A 3B GND 4A 4B 4Y terminal Min Max
9 tPHL 3003 45 IN 5.0 V GND OUT 1A to 1Y 3 20 ns
Tc = 25°C (Fig. 3) 46 OUT IN " " 2A to 2Y " " "
47 " IN OUT " 3A to 3Y " " "
48 " IN OUT " 4A to 4Y " " "
49 " IN OUT " 5A to 5Y " " "
50 " " OUT IN 6A to 6Y " " "
t
PLH 3003 51 IN 5.0 V GND OUT 1A to 1Y 3 25 ns
(Fig. 3) 52 OUT IN " " 2A to 2Y " " "
53 " IN OUT " 3A to 3Y " " "
54 " IN OUT " 4A to 4Y " " "
55 " IN OUT " 5A to 5Y " " "
56 " " OUT IN 6A to 6Y " " "
10 tPHL 3003 57 IN 5.0 V GND OUT 1A to 1Y 3 24 ns
Tc = 125°C (Fig. 3) 58 OUT IN " " 2A to 2Y " " "
59 " IN OUT " 3A to 3Y " " "
60 " IN OUT " 4A to 4Y " " "
61 " IN OUT " 5A to 5Y " " "
62 " " OUT IN 6A to 6Y " " "
t
PLH 3003 63 IN 5.0 V GND OUT 1A to 1Y 3 27 ns
(Fig. 3) 64 OUT IN " " 2A to 2Y " " "
65 " IN OUT " 3A to 3Y " " "
66 " IN OUT " 4A to 4Y " " "
67 " IN OUT " 5A to 5Y " " "
68 " " OUT IN 6A to 6Y " " "
11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
19
MIL-M-38510/1F
TABLE III. Group A inspection for device type 06.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B,
Subgroup Symbol 883 C, and D 1 2 12 14 6 3 4 5 9 10 7 11 8 13 Measured Limits Unit
method Test no. 1A 1B 1Y VCC 2Y 2A 2B 2C 3A 3B GND 3C 3Y 1C terminal Min Max
1 VOL 3007 1 2.0 V 2.0 V 16 mA 4.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 2.0 V 1Y 0.4 V
Tc = 25°C 2 5.5 V 5.5 V " 16 mA 2.0 V 2.0 V 2.0 V " " " " 5.5 V 2Y " "
3 " " " 5.5 V 5.5 V 5.5 V 2.0 V 2.0 V " 2.0 V 16 mA " 3Y " "
I
CEX 4 0.8 V 5.5 V 5.5 V 4.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 1Y 250 µA
5 5.5 V 0.8 V " " " " " " " " " " 1Y " "
6 " 5.5 V " " " " " " " " " 0.8 V 1Y " "
7 " " " 5.5 V 0.8 V " " " " " " 5.5 V 2Y " "
8 " " " " 5.5 V 0.8 V " " " " " " 2Y " "
9 " " " " " 5.5 V 0.8 V " " " " " 2Y " "
10 " " " " " 5.5 V 0.8 V " " " 5.5 V " 3Y " "
11 " " " " " " 5.5 V 0.8 V " " " " 3Y " "
12 " " " " " " " 5.5 V " 0.8 V " " 3Y " "
V
I C 13 -12 mA 4.5 V GND 1A -1.5 V
14 -12 mA " " 1B " "
15 " " -12 mA 1C " "
16 " -12 mA " 2A " "
17 " -12 mA " 2B " "
18 " -12 mA " 2C " "
19 " -12 mA " 3A " "
20 " -12 mA " 3B " "
21 " " -12 mA 3C " "
I
IH1 3010 22 2.4 V GND 5.5 V GND GND GND GND GND GND GND GND 1A 40 µA
23 GND 2.4 V " " " " " " " " " 1B " "
24 " GND " " " " " " " " 2.4 V 1C " "
20 " " " 2.4 V " " " " " " GND 2A " "
26 " " " GND 2.4 V " " " " " " 2B " "
27 " " " " GND 2.4 V " " " " " 2C " "
28 " " " " " GND 2.4 V " " " " 3A " "
29 " " " " " " GND 2.4 V " " " 3B " "
30 " " " " " " " GND " 2.4 V " 3C " "
I
IH2 3010 31 5.5 V GND 5.5 V GND GND GND GND GND GND GND GND 1A 100 µA
32 GND 5.5 V " " " " " " " " " 1B " "
33 " GND " " " " " " " " 5.5 V 1C " "
34 " " " 5.5 V " " " " " " GND 2A " "
35 " " " GND 5.5 V " " " " " " 2B " "
36 " " " " GND 5.5 V " " " " " 2C " "
37 " " " " " GND 5.5 V " " " " 3A " "
38 " " " " " " GND 5.5 V " " " 3B " "
39 " " " " " " " GND " 5.5 V " 3C " "
I
I L 3009 40 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 1A -0.7 -1.6 mA
41 5.5 V 0.4 V " " " " " " " " " 1B " " "
42 " 5.5 V " " " " " " " " 0.4 V 1C " " "
43 " " " 0.4 V " " " " " " 5.5 V 2A " " "
44 " " " 5.5 V 0.4 V " " " " " " 2B " " "
45 " " " " 5.5 V 0.4 V " " " " " 2C " " "
46 " " " " " 5.5 V 0.4 V " " " " 3A " " "
47 " " " " " " 5.5 V 0.4 V " " " 3B " " "
48 " " " " " " " 5.5 V " 0.4 V " 3C " " "
I
CCL 3005 49 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V VCC 15 mA
I
CCH 3005 50 GND GND 5.5 V GND GND GND GND GND GND GND GND VCC 4.95 mA
2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C an d VI C tests are omitted.
MIL-M-38510/1F
20
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B,
Subgroup Symbol 883 C, and D 1 2 12 14 6 3 4 5 9 10 7 11 8 13 Measured Limits Unit
method Test no. 1A 1B 1Y VCC 2Y 2A 2B 2C 3A 3B GND 3C 3Y 1C terminal Min Max
9 tPHL 3003 51 IN 2.4 V OUT 5.0 V GND 2.4 V 1A to 1Y 3 23 ns
Tc = 25°C (Fig. 3) 52 " OUT IN 2.4 V 2.4 V " 2A to 2Y " " "
53 " IN 2.4 V " 2.4 V OUT 3A to 3Y " " "
t
PLH 3003 54 IN 2.4 V OUT 5.0 V GND 2.4 V 1A to 1Y 3 28 ns
(Fig. 3) 55 " OUT IN 2.4 V 2.4 V " 2A to 2Y " " "
56 " IN 2.4 V " 2.4 V OUT 3A to 3Y " " "
10 tPHL 3003 57 IN 2.4 V OUT 5.0 V GND 2.4 V 1A to 1Y 3 29 ns
Tc = 125°C (Fig. 3) 58 " OUT IN 2.4 V 2.4 V " 2A to 2Y " " "
59 " IN 2.4 V " 2.4 V OUT 3A to 3Y " " "
t
PLH 3003 60 IN 2.4 V OUT 5.0 V GND 2.4 V 1A to 1Y 3 35 ns
(Fig. 3) 61 " OUT IN 2.4 V 2.4 V " 2A to 2Y " " "
62 " IN 2.4 V " 2.4 V OUT 3A to 3Y " " "
11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
21
MIL-M-38510/1F
TABLE III. Group A inspection for device type 07.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Case C 2 3 1 14 4 5 6 10 8 9 7 11 12 13 Measured Limits Unit
method Test no. 1A 1B 1Y VCC 2Y 2A 2B 3Y 3A 3B GND 4A 4B 4Y terminal Min Max
1 VOL 3007 1 2.0 V 2.0 V 16 mA 4.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 1Y 0.4 V
Tc = 25°C 2 5.5 V 5.5 V " 16 mA 2.0 V 2.0 V " " " " " 2Y " "
3 " " " 5.5 V 5.5 V 16 mA 2.0 V 2.0 V " " " 3Y " "
4 " " " " " 5.5 V 5.5 V " 2.0 V 2.0 V 16 mA 4Y " "
I
CEX 5 0.8 V 4.5 V 5.5 V 4.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 1Y 250 µA
6 4.5 V 0.8 V " " " " " " " " " 1Y " "
7 5.5 V 5.5 V " 5.5 V 0.8 V 4.5 V " " " " " 2Y " "
8 " " " " 4.5 V 0.8 V " " " " " 2Y " "
9 " " " 5.5 V 5.5 V 5.5 V 0.8 V 4.5 V " " " 3Y " "
10 " " " " " " 4.5 V 0.8 V " " " 3Y " "
11 " " " " " 5.5 V 5.5 V " 0.8 V 4.5 V 5.5 V 4Y " "
12 " " " " " " " " 4.5 V 0.8 V " 4Y " "
I
IH1 3010 13 2.4 V GND 5.5 V GND GND GND GND GND GND GND 1A 40 µA
14 GND 2.4 V " " " " " " " " 1B " "
15 " GND " 2.4 V " " " " " " 2A " "
16 " " " GND 2.4 V " " " " " 2B " "
17 " " " " GND 2.4 V " " " " 3A " "
18 " " " " " GND 2.4 V " " " 3B " "
19 " " " " " " GND " 2.4 V " 4A " "
20 " " " " " " " " GND 2.4 V 4B " "
I
IH2 3010 21 5.5 V GND 5.5 V GND GND GND GND GND GND GND 1A 100 µA
22 GND 5.5 V " " " " " " " " 1B " "
23 " GND " 5.5 V " " " " " " 2A " "
24 " " " GND 5.5 V " " " " " 2B " "
25 " " " " GND 5.5 V " " " " 3A " "
26 " " " " " GND 5.5 V " " " 3B " "
27 " " " " " " GND " 5.5 V " 4A " "
28 " " " " " " " " GND 5.5 V 4B " "
I
I L 3009 29 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 1A -0.7 -1.6 mA
30 5.5 V 0.4 V " " " " " " " " 1B " " "
31 " 5.5 V " 0.4 V " " " " " " 2A " " "
32 " " " 5.5 V 0.4 V " " " " " 2B " " "
33 " " " " 5.5 V 0.4 V " " " " 3A " " "
34 " " " " " 5.5 V 0.4 V " " " 3B " " "
35 " " " " " " 5.5 V " 0.4 V " 4A " " "
36 " " " " " " " " 5.5 V 0.4 V 4B " " "
I
CCL 3005 37 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V VCC 20 mA
I
CCH 3005 38 GND GND 5.5 V GND GND GND GND GND GND GND VCC 6.6 mA
V
I C 39 -12mA 4.5 V GND 1A -1.5 V
40 -12mA " " 1B " "
41 " -12mA " 2A " "
42 " -12mA " 2B " "
43 " -12mA " 3A " "
44 " -12mA " 3B " "
45 " " -12mA 4A " "
46 " " -12mA 4B " "
2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C an d VI C tests are omitted.
MIL-M-38510/1F
22
TABLE III. Group A inspection for device type 07 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Case C 2 3 1 14 4 5 6 10 8 9 7 11 12 13 Measured Limits Unit
method Test no. 1A 1B 1Y VCC 2Y 2A 2B 3Y 3A 3B GND 4A 4B 4Y terminal Min Max
9 tPHL 3003 47 IN 2.4 V OUT 5.0 V GND 1A to 1Y 3 23 ns
Tc = 25°C (Fig. 3) 48 " OUT IN 2.4 V " 2A to 2Y " " "
49 " OUT IN 2.4 V " 3A to 3Y " " "
50 IN 2.4 V OUT 4A to 4Y
t
PLH 3003 51 IN 2.4 V OUT 5.0 V GND 1A to 1Y 3 28 ns
(Fig. 3) 52 " OUT IN 2.4 V " 2A to 2Y " " "
53 " OUT IN 2.4 V " 3A to 3Y " " "
54 IN 2.4 V OUT 4A to 4Y
10 tPHL 3003 55 IN 2.4 V OUT 5.0 V GND 1A to 1Y 3 29 ns
Tc = 125°C (Fig. 3) 56 " OUT IN 2.4 V " 2A to 2Y " " "
57 " OUT IN 2.4 V " 3A to 3Y " " "
58 IN 2.4 V OUT 4A to 4Y
t
PLH 3003 59 IN 2.4 V OUT 5.0 V GND 1A to 1Y 3 35 ns
(Fig. 3) 60 " OUT IN 2.4 V " 2A to 2Y " " "
61 " OUT IN 2.4 V " 3A to 3Y " " "
62 IN 2.4 V OUT 4A to 4Y
11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
23
MIL-M-38510/1F
TABLE III. Group A inspection for device type 08.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Case C 1 4 3 14 5 6 9 8 11 10 7 12 13 2 Measured Limits Unit
method Test no. 1A 2Y 2A VCC 3A 3Y 4A 4Y 5A 5Y GND 6Y 6A 1Y terminal Min Max
1 VOL 3007 1 2.0 V 5.5 V 4.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 16 mA 1Y 0.4 V
Tc = 25°C 2 5.5 V 16 mA 2.0 V " " " " " " 2Y " "
3 " 5.5 V " 2.0 V 16 mA " " " " 3Y " "
4 " " " 5.5 V 2.0 V 16 mA " " " 4Y " "
5 " " " " 5.5 V 2.0 V 16 mA " " 5Y " "
6 " " " " " 5.5 V " 16 mA 2.0 V 6Y " "
I
CEX 7 0.8 V 5.5 V 4.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 1Y 250 µA
8 5.5 V 5.5 V 0.8 V " " " " " " 2Y " "
9 " 5.5 V " 0.8 V 5.5 V " " " " 3Y " "
10 " " " 5.5 V 0.8 V 5.5 V " " " 4Y " "
11 " " " " 5.5 V 0.8 V 5.5 V " " 5Y " "
12 " " " " " 5.5 V " 5.5 V 0.8 V 6Y " "
V
I C 13 -12mA 4.5 V GND 1A -1.5 V
14 -12mA " " 2A " "
15 " -12mA " 3A " "
16 " -12mA " 4A " "
17 " -12mA " 5A " "
18 " " -12mA 6A " "
I
IH1 3010 19 2.4 V GND 5.5 V GND GND GND GND GND 1A 40
µA
20 GND 2.4 V " " " " " " 2A " "
21 " GND " 2.4 V " " " " 3A " "
22 " " " GND 2.4 V " " " 4A " "
23 " " " " GND 2.4 V " " 5A " "
24 " " " " " GND " 2.4 V 6A " "
I
IH2 3010 25 5.5 V GND 5.5 V GND GND GND GND GND 1A 100
µA
26 GND 5.5 V " " " " " " 2A " "
27 " GND " 5.5 V " " " " 3A " "
28 " " " GND 5.5 V " " " 4A " "
29 " " " " GND 5.5 V " " 5A " "
30 " " " " " GND " 5.5 V 6A " "
I
IL 3009 31 0.4 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V " 5.5 V 1A -0.7 -1.6 mA
32 5.5 V 0.4 V " " " " " " 2A " " "
33 " 5.5 V " 0.4 V " " " " 3A " " "
34 " " " 5.5 V 0.4 V " " " 4A " " "
35 " " " " 5.5 V 0.4 V " " 5A " " "
36 " " " " " 5.5 V " 0.4 V 6A " " "
I
CCL 3005 37 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V VCC 30 mA
I
CCH 3005 38 GND GND 5.5 V GND GND GND GND GND VCC 9.9 mA
2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C an d VI C tests are omitted.
MIL-M-38510/1F
24
TABLE III. Group A inspection for device type 08 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Cases A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Case C 1 4 3 14 5 6 9 8 11 10 7 12 13 2 Measured Limits Unit
method Test no. 1A 2Y 2A VCC 3A 3Y 4A 4Y 5A 5Y GND 6Y 6A 1Y terminal Min Max
9 tPHL 3003 39 IN 5.0 V GND OUT 1A to 1Y 3 23 ns
Tc = 25°C (Fig. 3) 40 OUT IN " " 2A to 2Y " " "
41 " IN OUT " 3A to 3Y " " "
42 " IN OUT " 4A to 4Y " " "
43 " IN OUT " 5A to 5Y " " "
44 " " OUT IN 6A to 6Y " " "
t
PLH 3003 45 IN 5.0 V GND OUT 1A to 1Y 3 28 ns
(Fig. 3) 46 OUT IN " " 2A to 2Y " " "
47 " IN OUT " 3A to 3Y " " "
48 " IN OUT " 4A to 4Y " " "
49 " IN OUT " 5A to 5Y " " "
50 " " OUT IN 6A to 6Y " " "
10 tPHL 3003 51 IN 5.0 V GND OUT 1A to 1Y 3 29 ns
Tc = 125°C (Fig. 3) 52 OUT IN " " 2A to 2Y " " "
53 " IN OUT " 3A to 3Y " " "
54 " IN OUT " 4A to 4Y " " "
55 " IN OUT " 5A to 5Y " " "
56 " " OUT IN 6A to 6Y " " "
t
PLH 3003 57 IN 5.0 V GND OUT 1A to 1Y 3 35 ns
(Fig. 3) 58 OUT IN " " 2A to 2Y " " "
59 " IN OUT " 3A to 3Y " " "
60 " IN OUT " 4A to 4Y " " "
61 " IN OUT " 5A to 5Y " " "
62 " " OUT IN 6A to 6Y " " "
11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
25
MIL-M-38510/1F
TABLE III. Group A inspection for device type 09.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Case C 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Measured Limits Unit
method Test no. 1A 1B 1Y 2A 2B 2Y GND 3Y 3A 3B 4Y 4A 4B VCC terminal Min Max
1 VOL 3007 1 2.0 V 2.0 V 16 mA 5.5 V 5.5 V GND 5.5 V 5.5 V 5.5 V 5.5 V 4.5 V 1Y 0.4 V
Tc = 25°C 2 5.5 V 5.5 V 2.0 V 2.0 V 16 mA " " " " " " 2Y " "
3 " " 5.5 V 5.5 V " 16 mA 2.0 V 2.0 V " " " 3Y " "
4 " " " " " 5.5 V 5.5 V 16 mA 2.0 V 2.0 V " 4Y " "
I
CEX 5 0.8 V 4.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 5.5 V 5.5 V 4.5 V 1Y 250 µA
6 4.5 V 0.8 V " " " " " " " " " 1Y " "
7 5.5 V 5.5 V 0.8 V 4.5 V 5.5 V " " " " " " 2Y " "
8 " " 4.5 V 0.8 V " " " " " " " 2Y " "
9 " " 5.5 V 5.5 V " 5.5 V 0.8 V 4.5 V " " " 3Y " "
10 " " " " " " 4.5 V 0.8 V " " " 3Y " "
11 " " " " " 5.5 V 5.5 V 5.5 V 0.8 V 4.5 V " 4Y " "
12 " " " " " " " " 4.5 V 0.8 V " 4Y " "
V
I C 13 -12mA GND 4.5 V 1A -1.5 V
14 -12mA " " 1B " "
15 -12mA " " 2A " "
16 -12mA " " 2B " "
17 " -12mA " 3A " "
18 " -12mA " 3B " "
19 " -12mA " 4A " "
20 " -12mA " 4B " "
I
IH1 3010 21 2.4 V GND GND GND GND GND GND GND GND 5.5 V 1A 40
µA
22 GND 2.4 V " " " " " " " " 1B " "
23 " GND 2.4 V " " " " " " " 2A " "
24 " " GND 2.4 V " " " " " " 2B " "
25 " " " GND " 2.4 V " " " " 3A " "
26 " " " " " GND 2.4 V " " " 3B " "
27 " " " " " " GND 2.4 V " " 4A " "
28 " " " " " " " GND 2.4 V " 4B " "
I
IH2 3010 29 5.5 V GND GND GND GND GND GND GND GND 5.5 V 1A 100
µA
30 GND 5.5 V " " " " " " " " 1B " "
31 " GND 5.5 V " " " " " " " 2A " "
32 " " GND 5.5 V " " " " " " 2B " "
33 " " " GND " 5.5 V " " " " 3A " "
34 " " " " " GND 5.5 V " " " 3B " "
35 " " " " " " GND 5.5 V " " 4A " "
36 " " " " " " " GND 5.5 V " 4B " "
I
I L 3009 37 0.4 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 1A -0.7 -1.6 mA
38 5.5 V 0.4 V " " " " " " " " 1B " " "
39 " 5.5 V 0.4 V " " " " " " " 2A " " "
40 " " 5.5 V 0.4 V " " " " " " 2B " " "
41 " " " 5.5 V " 0.4 V " " " " 3A " " "
42 " " " " " 5.5 V 0.4 V " " " 3B " " "
43 " " " " " " 5.5 V 0.4 V " " 4A " " "
44 " " " " " " " 5.5 V 0.4 V " 4B " " "
I
CCL 3005 45 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V VCC 20 mA
I
CCH 3005 46 GND GND GND GND GND GND GND GND GND 5.5 V VCC 6.6 mA
2 Same tests, terminal conditions and limits as for subgroup 1, except Tc = 125°C and VI C tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except Tc = -55°C an d VI C tests are omitted.
26
MIL-M-38510/1F
TABLE III. Group A inspection for device type 09 - Continued.
Terminal conditions (pins not designated may be high ≥ 2.0 V, low ≤ 0.8 V or open)
MIL-STD- Case C 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol 883 Measured Limits Unit
method Test no. 1A 1B 1Y 2A 2B 2Y GND 3Y 3A 3B 4Y 4A 4B VCC terminal Min Max
9 tPHL 3003 47 IN 2.4 V OUT GND 5.0 V 1A to 1Y 3 23 ns
Tc = 25°C (Fig. 3) 48 IN 2.4 V OUT " " 2A to 2Y " " "
49 " OUT IN 2.4 V " 3A to 3Y " " "
50 " OUT IN 2.4 V " 4A to 4Y
t
PLH 3003 51 IN 2.4 V OUT GND 5.0 V 1A to 1Y 3 28 ns
(Fig. 3) 52 IN 2.4 V OUT " " 2A to 2Y " " "
53 " OUT IN 2.4 V " 3A to 3Y " " "
54 " OUT IN 2.4 V " 4A to 4Y
10 tPHL 3003 55 IN 2.4 V OUT GND 5.0 V 1A to 1Y 3 29 ns
Tc = 125°C (Fig. 3) 56 IN 2.4 V OUT " " 2A to 2Y " " "
57 " OUT IN 2.4 V " 3A to 3Y " " "
58 " OUT IN 2.4 V " 4A to 4Y
t
PLH 3003 59 IN 2.4 V OUT GND 5.0 V 1A to 1Y 3 35 ns
(Fig. 3) 60 IN 2.4 V OUT " " 2A to 2Y " " "
61 " OUT IN 2.4 V " 3A to 3Y " " "
62 " OUT IN 2.4 V " 4A to 4Y
11 Same tests, terminal conditions and limits as for subgroup 10, except Tc = -55°C.
27
MIL-M-38510/1F
MIL-M-38510/1F
28
5. PACKAGING
5.1 Packaging requir ements. For acquisition purposes, the packaging requirements shall be as specified in the
contract or order (see 6.2). When actual packaging of materiel is to be performed by DoD or in-house contractor
personnel, these personnel need to contact the responsible packag i ng activity to ascerta in packaging requirements.
Packaging requirements are maintained b y the Inventory Control Point's packaging acti vity within the Military Service
or Defense Agency, or within the militar y service's system command. Packaging data retrieval is available from the
managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting
the responsible packaging activity.
6. NOTES
(This section contains information of a g eneral or explanatory nature that may be helpful, but is not mandatory.)
6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design
applications and logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a. Title, number, and date of the specification.
b. PIN and compliance identifier, if applicable (see 1.2).
c. Requirements for delivery of one copy of the conformance inspection data pertinent to the device
inspection lot to be supplied with each shipment by the device manufacturer, if applicable.
d. Requirements for certificate of compliance, if applicable.
e. Requirements for notification of change of product or process t o contracting activit y in add ition to
notification to the qualifying activity, if applicable.
f. Requirements for failure analysis (including required test condition of method 5003 of MIL-ST D-883),
corrective action, and reporting of results, if applicable.
g. Requirements for product assurance options.
h. Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should
not affect the part number. Unless otherwise specified, these requirements will not apply to direct
purchase by or direct shipment to the Government.
i. Requirements for "JAN" marking.
J. Packaging requirements (see 5.1).
6.3 Superseding inf ormation. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M-
38510 in this docume nt have been replaced by appropriate references to MIL-PRF-38535. All technical requirements
now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have
been retained t o avoid adversely impacting existing government logistics systems and contractor's parts lists.
6.4 Qualification. With respect to products requiring qualification, awards will b e made only for products which
are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or n ot
such products have actually been so listed by that date. The attention of the contractors is called to these
requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal
Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for
the products covered by this specification. Inf ormation pertaining to qualifi cation of products may be obtained from
DSCC-VQ, P.O. Box 3990, Columbus, Ohio 43218-3990.
MIL-M-38510/1F
29
6.5 Abbreviations, symbols, and def initions. The abbreviations, symbols, and definitions used herein are defined
in MIL-PRF-38535, MIL-HDBK-1331, and as follows:
GND ............................................ Ground zero voltage potential
V
IN ............................................... Voltage level at an input terminal
V
I C .............................................. Input clamp voltage
I
IN ................................................ Current flowing into an input terminal
6.6 Logistic support. Lead materials and finishes (see 3.3) are interchangeable. Unless otherwise specified,
microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material
and finish A (see 3.3). Longer length leads and lead forming should not affect the part number.
6.7 Substitutability. The cross-reference information below is presented for the convenience of users.
Microcircuits covered by this specific ation will functio nally replace the listed generic-industry type. Generic-industry
microcircuit types may not have equivalent operational performance characteristics across military temperature
ranges or reliability factors equivalent to MIL-M-35810 device types and may have slight physical variations in relation
to case size. The presence of this information should not be deemed as p ermitting substi tution of generi c-industry
types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535.
Military device
type Generic-industry
type
01 5430
02 5420
03 5410
04 5400
05 5404
06 5412
07 5401
08 5405
09 5403
6.8 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect
to the previous issue due to the extensiveness of the changes.
Custodians: Preparing activity:
Army - CR DLA - CC
Navy - EC
Air Force - 11 (Project 5962-2072)
DLA - CC
Review activities:
Army - MI, SM
Navy - AS, CG, MC, SH, TD
Air Force - 03, 19, 99
NOTE: The activities listed above were interested in this document as of the dat e of this document . Since
organizations and responsibilities can change, you should verify the currency of the information above using
the ASSIST Online database at http://assist.daps.dla.mil.
