ee FAIRCHILD ee SEMICONDUCTOR 100319 March 1998 Low Power Hex Line Driver with Cut-Off General Description The 100319 is a Hex Line Driver with output cut-off capabil- ity. The 100319 has single ended ECL inputs and differential ECL outputs, designed to drive a differential, doubly termi- nated 50 transmission line (25Q equivalent impedance) in an ECL backplane. A LOW on the Output Enable (OE) will set both the true and complementary outputs, to a high im- pedance or cut-off state. The cut-off state is designed to be more negative than a normal ECL LOW state. Features Differential outputs Output cut-off capability Drives a 25Q ECL load 2000V ESD protection Voltage compensated range = 4.2V to -5.7V Available to industrial grade temperature range Ordering Code: Logic Symbol BD) =Dp)SigitiS:Ci(<siS GTYHRRBEYYGEE & OG IPP TPIT PlT ele DS010923-1 Connection Diagrams 24-Pin PCC wr ai 241-& a2 23 FO es 22 =D, a4 21,0, Vocgo | 5 20;D, Voo 6 19;-0E Yoca 7 187Vee a-48 17 -Veeg a,-19 16;D; a410 15 =D, Qt 145-0, Onq12 13 =a, DS010923-2 Pin Names Description Dn Data Inputs Q, Data Outputs on Complementary Data Outputs OE Output Enable 28-Pin PCC Dg Ds 5 Yees U5 Oy Oy Hee [tat el eed tad ed el) LAL FA) ( Eo Gd 2a BS e4 Dg 2% %VeEs % % Q% DS010923-3 1998 Fairchild Semiconductor Corporation DS010923 www fairchildsemi.com HO-IND YM J9ALQ SUI] X9H JOMOd MOT 6LE001Logic Diagram Truth Table Inputs Outputs Da OE Q, a, L H L H H H H L xX L Cut-Off Cut-Off X = Don't Care H = HIGH Voltage Level L = LOW Voltage Level Cut-off = Lower-than-Low State Dy MMMM MM DS010823-5 www fairchildsemi.com hmAbsolute Maximum Ratings (note 1) Above which the useful life may be impaired Storage Temperature (Tota) Maximum Junction Temperture (TJ) Ceramic Plastic Pin Potential to Ground Pin (Vee) Input Voltage (DC) Output Current (DC Output HIGH) ESD (Note 2) Commercial Version DC Electrical Characteristics Vee = -4.2V to -5.7V, Voc = Veca = GND, Te = 0C to +85C (Note 3) -65C to +150C +175C +150C -7.0V to +0.5V Veg to +0.5V -100 mA 2>2000V Recommended Operating Conditions Case Temperature (Tg) Commercial Industrial Military Supply Voltage (Vee) OC to +85C -40C to +85C -55C to +125C -5.7V to -4.2V Note 1: Absolute maximum ratings are those values beyond which the de- vice may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Symbol Parameter Min Typ Max Units Conditions Vou Output HIGH Voltage -1025 -955 -870 mV Vin = Vinqmax) Loading with Voi Output LOW Voltage -1830 -1705 -1620 mV or Vitqminy 25Q to -2.0V Vouc Output HIGH Voltage -1035 mV Vin = Vincminy Loading with Vote Output LOW Voltage -1610 mV or Vit(max 25 to -2.0V Voiz Cut-Off LOW -1950 mV Vin = Vinqminy OE = LOW Voltage or Vit(max Vin Input HIGH Voltage -1110 -870 mV Guaranteed HIGH Signal for All Inputs Vit Input LOW Voltage -1830 -1530 mV Guaranteed LOW Signal for All Inputs lit Input LOW Current 100 HA Vin = Vicawiny liq Input HIGH Current 360 HA Vin = Vinqmax lee Power Supply Current, Normal -119 -30 mA leez Power Supply -219 -75 mA Inputs Open, Current, Cut-Off OE = LOW Note 3: The specified limits represent the "worst case value for the parameter. Since these values normally occur at the temperature extremes, additional noise im- munity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under worst case conditions. DIP AC Electrical Characteristics Vee = -4.2V to -5.7V, Veo = Veca = GND Symbol Parameter Toe =oC To = +25C To = +85C Units Conditions Min Max Min Max Min Max teLH Propagation Delay 0.65 2.30 0.65 2.30 0.65 2.30 ns TPHL Data to Output tezH Propagation Delay 1.8 43 1.8 43 1.8 43 ns Figures 1, 2 tpuz OE to Output 1.2 3.1 1.2 3.1 1.2 3.41 tH Transition Time 0.45 1.50 0.45 1.50 0.45 1.50 ns tra 20% to 80%, 80% to 20% 3 www fairchildsemi.comPCC AC Electrical Characteristics Vee = -4.2V to -5.7V, Voo = Veca = GND Symbol Parameter Te = 0C To = +25C To = +85C Units Conditions Min Max Min Max Min Max teLy Propagation Delay 0.65 2.10 0.65 2.10 0.65 2.10 ns TPHL Data to Output tezH Propagation Delay 1.8 41 1.8 41 1.8 4.1 ns . Figures 1, 2 tpuz OE to Output 1.2 2.9 1.2 2.9 1.2 2.9 tty Transition Time 0.45 1.30 0.45 1.30 0.45 1.30 ns tra 20% to 80%, 80% to 20% Industrial Version PCC DC Electrical Characteristics Vee = -4.2V to -5.7V, Voc = Voca = GND (Note 4) Symbol Parameter To = -40C To = OC to +85C Units Conditions Min Max Min Max Vou Output HIGH Voltage -1085 -870 -1025 -870 mV Vin = Vinqmax Loading with VoL Output LOW Voltage -1830 -1575 -1830 -1620 mV or Vit(miny 25 to -2.0V Voue Output HIGH Voltage -1095 -1035 mV Vin = Vincminy Loading with Voto Output LOW Voltage -1565 -1610 mV or Vit(max) 25Q to -2.0V Vie Input HIGH Voltage -1115 -870 -1110 -870 mV Guaranteed HIGH Signal for All Inputs Voiz Cut-Off LOW Voltage -1900 -1950 mV Vin = Vineiny OE = LOW or Vitimax) Vit Input LOW Voltage -1830 -1535 -1830 -1530 mV Guaranteed LOW Signal for All Inputs lit Input LOW Current 130 100 HA Vin = Vicminy liq Input HIGH Current 360 360 HA Vin = Viewmax lee Power Supply Current, -119 -30 -119 -30 mA Normal leez Power Supply Current, -219 -75 -219 -75 mA Inputs Open Cut-Off OE = LOW PCC AC Electrical Characteristics Vee = 4.2V to -5.7V, Veo = Voca = GND Note 4: The specified limits represent the "worst case value for the parameter. Since these values normally occur at the temperature extremes, additional noise im- munity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under worst case conditions. Symbol Parameter To = -40C To = +25C To = +85C Units Conditions Min Max Min Max Min Max teLy Propagation Delay 0.65 2.10 0.65 2.10 0.65 2.10 ns Figures 1, 2 tpHL Data to Output tpzH Propagation Delay 1.8 41 1.8 41 1.8 44 ns teuz OE to Output 1.2 29 1.2 29 12 2.9 tty Transition Time 0.45 1.30 0.45 1.30 0.45 1.30 ns trae 20% to 80%, 80% to 20% www fairchildsemi.comMilitary VersionPreliminary DC Electrical Characteristics Vee = -4.2V to -5.7V, Veo = Veca = GND (Note 7) Symbol Parameter Min | Typ | Max Units Te Conditions Notes Vou Output HIGH Voltage -1025 -870 mV 0C to Vin = Vintmax) Loading with 4125C or Vieminy 25Q. to -2.0V -1085 -870 mV 55C (Notes 5, 6, 7) Voi Output LOW Voltage -1830 -1620 mV 0C to +125C -1830 -1555 mV 55C Vouc Output HIGH Voltage -1035 mV 0C to Vin = Vin(Miny Loading with 4125C or Vit(max) 25Q. to -2.0V -1085 mV 55C (Notes 5, 6, 7) Vote Output LOW Voltage -1610 mV 0C to +125C -1555 mV 55C Voz Cut-Off LOW Voltage -1900 mV OC to +125C | Vin = Viniminy OE = LOW (Notes 5, 6, 7) -1950 mV 55C or Vitimaxy Vin Input HIGH Voltage -1165 -870 mV 55C to Guaranteed HIGH Signal for (Notes 5, 6, 7, 8) +125C All Inputs Vit Input LOW Voltage -1830 -1475 mV 55C to Guaranteed LOW Signal for (Notes 5, 6, 7, 8) +125C All Inputs liq Input HIGH Current 50 pA 0C to +125C Vin = Vintmax) (Notes 5, 6, 7) 70 pA 55C lee Power Supply Current, -70 40 mA 55C to +125C leez Power Supply Current, -180 -130 mA 55C to Inputs Open, OE = LOW (Notes 5, 6, 7) Cut-Off +125C Note 5: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55'C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides cold start specs which can be considered a worst case condition at cold temperatures. Note 6: Screen tested 100% on each device at -55C, +25C, and +125C, Subgroups 1, 2, 3, 7, and 8. Note 7: Sample tested (Method 5005, Table |) on each manufactured lot at -55C, +25C, and +125C, Subgroups A1, 2, 3, 7, and 8. Note 8: Guaranteed by applying specified input condition and testing VoH/VoL. AC Electrical CharacteristicsPreliminary Vee = -4.2V to -5.7V, Veo = Veca = GND Symbol Parameter To = 55C | To = +25C | To = +125C | Units | Conditions Notes Min Max | Min Max | Min Max teLy Propagation Delay 040 250 1050 2.40 | 0.50 2.90 ns (Notes 9, 10, 11) TpHL Data to Output Figures 1, 2 tty Transition Time 0.20 1.70 |0.20 1.70 | 0.20 1.50 ns (Note 12) trae 20% to 80%, 80% to 20% Note 9: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55C), then testing immediately after power-up. This provides cold start specs which can be considered a worst case condition at cold temperatures. Note 10: Screen tested 100% on each device at +25C temperature only, Subgroup AQ. Note 11: Sample tested (Method 5005, Table |) on each manufactured lot at +25C, Subgroup AQ, and at +125C and -55C temperatures, Subgroups A10 and A11. Note 12: Not tested at +25C, +125C and -55C temperature (design characterization data). www fairchildsemi.comTest Circuitry ut PULSE mh mh . SCOPE GENERATOR wi wi CHAN A | Voc LL R T T O1eF = n~ OEN = 2 PULSE ry . D 0 . SCOPE pt o GENERATOR wi CHAN B 500 t 500, R; 0.1 pF DS010923-6 i| i| <= 5 a IIH i| i| Notes: Voc. Voca = +2V, Veg = -2.5V L1 and L2 = equal length 50Q impedance lines Ry = 50Q terminator internal to scope Decoupling 0.1 HF from GND to Veg and Veg All unused outputs are loaded with 250 to GND C, = Fixture and stray capacitance < 3 pF FIGURE 1. AC Test Circuit Switching Waveforms 1.05V DATA X 0.58v Xx x x ' ! 0.31V ele a ' ttHL tty OUTPUT 1 ENABLE i f I ! I ! 1 1 1 1 I I TRUE T T I OUTPUT ! 50% X \ 1 COMPLEMENT . ' es 'L ! ' rot rot ! ' rot rot roto eh te tpuz tezu DS010923-7 Note: The output AC measurement point for cut-off propagation delay testing = the 50% voltage point between active Vo, and Voy. FIGURE 2. Propagation Delay, Cut-Off and Transition Times Ordering Information The device number is used to form part of a simplified purchasing code where a package type and temperature range are defined as follows: 100319 D G QB Device Number (Basic) Special Variation QB = Military grade device with Package Code environmental and burn-in D = Cermaic DIP processing Q = Plastic Leaded Chip Carrier (PCC) P = Plastic DIP Temperature Range C = Commercial (0C to + 85C) | = Industrial ( 40C to + 85C) (PCG Only) M = Military (55C to + 125C) DS010923-8 www fairchildsemi.com 6Physical DimeNnSiONS inches (millimeters) unless otherwise noted 1.215 (30.86) 0.025 MAX 0.0300.055 (0.64) 24 13 (0.76 1.40) RAD PIII I RAD TYP 0.390 (9.91) MAX ) \ / ber he he he he be he he 2 > je BOB 0.005 GLASS 0.0500.060 Bh 0.400 0.430 0.180 TYP |< | (0.13) SEALANT (1.27 1.52) rye 0.015 0.055 1, (10.16 10.92) (4.57) MIN TYP (0.38 1.40) 1 MAX L + 9.225 |f | TH ne MAX TYP 86 94 A 4 \ 90 - 100 0.008 ~0.012 | nm TYP (a.200.30) 0.125 TYP 0.055 0.090- 0.110 _ | 0.015- 0.021 _ (3.18) 0.435 0.535 (1.40) (2.29 2.79) MIN (11.05-13.59) MAX TYP TYP TYP BOTH ENDS J2aE (REV J} 24-Lead Ceramic Dual-In-Line Package (0.400" Wide) (D) Package Number J24E 1.194-1.214 [30.33-30.84] 0.202 24 [5.13] 13 PEP a pp 0.035-0.045 f [0.88-1.14] SD 0.337-0.347 [8.56-8.81] u A A a a u 1 12 PIN NO. 1 IDENT 9 0:15 [3.18] 0.125-0.135 4 0.060 0.039 [3.18-3.43] TYP] bee 4X ay ee 0.390-0.410 [1.52] [0.99] 0.065 [9.91-10.41] [1.65] 0.145-0.200 | f } 90-100 [3.68-5.08] _ B6-94 0.380 9.020 iy J L_ 0.125-0.140 5, , | LE [9.65] "IN ost) [5.18-3.56] | | | |.0.047-0.057 +0.040 9.050 tp le >| T1.19-1.45] TYP 0.428 015 [1.27] [10 a7 11-02] 0.015-0.021 0.090-0.110 0.009-0.015 7 ~0,38] [o.38-0.53] VY? [2.29-2.79] TYP [0.23-0.38] N24E (REV A) 24-Lead Plastic Dual-In-Line Package (P) Package Number N24E www fairchildsemi.com100319 Low Power Hex Line Driver with Cut-Off Physical DimensiON$ inches (millimeters) unless otherwise noted (Continued) 0.459 70-006 -0.000 +0.15 [11.43] -0.00 PIN #1 IDENT 4 1 26 0.490+0.005 TYP [12.45+0.13] 0.165-0.180 +5 [4.19-4.57] 0.045 45 X [1.14] 9.017+0.004 TYP 0.0290.003 rp [0.4340.10] S [0.7440.08] | -| _ 0.41040.020 [10.41#0.51] [7 SEATING PLANE 0.020 [0.51] 0.10540.015 [2.670.38] | [<x MIN TYP @ ]0.004 [0.10] V2BA (REV K} 28-Lead Plastic Chip Carrier (Q) Package Number V28A LIFE SUPPORT POLICY FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DE- VICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMI- CONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or sys- tems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 2. Accritical component in any component of a life support device or system whose failure to perform can be rea- sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. Fairchild Semiconductor Corporation Americas Customer Response Center Tal: 1-888-522-5372 www fairchildsemi.com Fairchild Semiconductor Europe Fax: +49 (0) 1 80-530 85 86 Email: europe.support@nsc.com Deutsch Tel: +49 (0) 8 141-35-0 English Tel: +44 (0) 1 793-85-68-56 Italy Tel: +39 (0) 2 57 5631 Fairchild Semiconductor Hong Kong Ltd. 13th Floor, Straight Block, Ocean Centre, & Canton Rd. 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