MIL-M-38510/2G
8 February 2005
SUPERSEDING
MIL-M-38510/2E
24 December 1974
MIL-M-0038510/2F (USAF)
24 OCTOBER 1975
MILITARY SPECIFICATION
MICROCIRCUITS, DIGITAL, TTL, FLIP-FLOPS, MONOLITHIC SILICON
This specification is approv ed for use by all Departments
and Agencies of the Department of Defense.
The requirements for acquiring the prod uct herein shall consist of this specification sheet and MIL-PRF 38535
1. SCOPE
1.1 Scope. This specification covers the det ail requirements for monolithic silicon, TTL, bistable logic
microcircuits. Three product assurance classes and a c hoice of case outlines/lead finish are provided for each type
and are reflected in the compl ete part number. For this product, the requirements of MIL-M-38510 h ave been
superseded by MIL-PRF-385 35, (see 6.4).
1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herei n.
1.2.1 Device types. The device types are as follows:
Device type Circuit
01 Single J-K master-slave flip-flop
02 Dual J-K master-slave flip-flop, no preset
03 Dual J-K master-slave flip-flop, no preset
04 Dual J-K master-slave flip-flop
05 Dual D-type edge-triggere d fli p-flop
06 Single edge-triggered J-K flip-flop
07 Dual D-type edge-triggered fli p-flop, buffered output
1.2.2 Device class. The device class is the product assur ance level as defined in MIL-PRF-38535.
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, P. O. Box 3990, Columbus, OH 43218-3990, or emailed to
bipolar@dscc.dla.mil. Since contact information can change, you may want to verify the currency of this
address information using the ASSIST Online database at http://assist.daps.dla.mil
AMSC N/A FSC 5962
INCH-POUND
Inactive for new design after 7 September 1995
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1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as foll ows:
Outline letter Descriptive designator Terminals Package style
A GDFP5-F14 or CDFP6-F14 14 Flat pack
B GDFP4-F14 14 Flat pack
C GDIP1-T14 or CDIP2-T14 14 Dual-in-line
D GDFP1-F14 or CDFP2-F14 14 Flat pack
E GDIP1-T16 or CDIP2-T16 16 Dual-in-line
F GDFP2-F16 or CDFP3-F16 16 Flat pack
1.3 Absolute maximum ratings.
Supply voltage range ............................................................................. -0.5 V dc to +7.0 V dc
Input voltage range ................................................................................ -1.5 V dc at -12 mA to 5.5 V dc
Storage temperature range .................................................................... -65° to +150°C
Maximum power dissipation, (PD)
flip-flop, 1/....................................................................................... 110 mW 1/
Lead temperature (soldering, 10 seconds).............................................. 300°C
Thermal resistance, junction to case (θJC):.............................................. 0.09°C/mW for flat packs
0.08°C/mW for dual-in-line pack
Junction temperature (TJ)........................................................................ 175°C
1.4 Recommended operating conditions.
Supply voltage (VCC) .............................................................................. 4.5 V dc minimum to
5.5 V dc maximum
Minimum high-level input voltage (VIH) ................................................... 2.0 V dc
Maximum low-level input voltage (VIL) .................................................... 0.8 V dc
Normalized fanout (each output) 2/....................................................... 10 maximum
Case operating temperature rang e (TC).................................................. -55 °C to +125 °C
Input set up time:
Device type 01, 02, 03 and 04, ......................................................... ≥ clock pulse width
Device type 05, 06, and 07................................................................ 20 ns
Input hold time
Device types 01, 02, 03 and 04......................................................... 0 ns
Device type 05, 06 and 07 ................................................................ 5 ns
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification.
This section does not include documents cited in other sections of this specification or recommended for
additional information or as e xam ples. While every effort has been made to ensure the completeness of this list,
document users are cautioned that they must meet all specified requirements of documents cited in sections 3,
4, or 5 of this specification, whether or not they are listed.
_______
1/ Must withstand the added PD due to short circuit cond ition (e.g. IOS) at one output for 5 seconds
duration
2/ Device will fanout in both high and lo w levels to the specified number of IIL1/IIH1 inputs of the same device type
as that being tested.
MIL-M-38510/2G
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2.2 Government documents.
2.2.1 Specifications and Standards. The following specifications and standards form a p art of this
specification to the extent specified h erei n. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard for Microelectronics.
MIL-STD-1835 - Interface Standard Electronic Comp onent Case Outlines
(Copies of these documents a r e available online at http://assist.daps.dla.mil/quicksearch/ or
http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Bu ilding 4D,
Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this specification and the references
cited herein, the text of this document takes precedence. Nothing i n this do cument, however, supersedes
applicable la ws and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this spec ification shall be products that are manufactur ed by
a manufacturer authorized b y the qualifying activity for listing on the applicable qualified manufactur ers list before
contract award (see 4.3 and 6.3).
3.2 Item requirements. The individual item requirements shall be in accordanc e with MIL-PRF-38535 and
as specified herein or as modi fied in the device manufacturer's Quality Manag ement (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dime nsions. The design, construction, and physical dimensions shall
be as specified in MIL-PRF-38 535 and herein.
3.3.1 Terminal connections and logic diagrams. The terminal connections and lo gic diagrams shall be as
specified on figures 1.
3.3.2 Truth tables and logic equations. The truth tables and logic equations shall be as specified on figure 2.
3.3.3 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available
to the qualifying activity and t he preparing activity (DSCC-VAS) upon request.
3.3.4 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see
6.6).
3.5 Electrical performance characteristics . The electrical performance characteristics ar e as specified in
table I, and apply over the full recommended case operating temperature rang e, unless otherwise specified.
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the
subgroups specified in table II. The electrical tests for each subgroup are described in table III. Subgroups 7
and 8 testing requires onl y a summary of attributes data.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
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TABLE I. Electrical performance characteristics.
Limits Test Symbol Conditions 9/ Device
Type Min Max
Units
High-level output voltage VOH V
CC=4.5 V
IOH = -400 µA All 2.4 -- Volts
Low-level output voltage VOL V
CC = 4.5 V, IOL=16 mA All 0.4 Volts
Input clamp voltage VIC V
CC = 4.5 V, IIC = -12 mA
TC = 25ºC All -1.5 Volts
01, 02, 03, 04,
05, 06 -0.7 -1.6 mA Low-level input current IIL1 V
CC = 5.5 V
VIN = 0.4 V 1/ 07 -0.5 -1.6 mA
01, 02, 03, 04,
05 -1.4 -3.2 mA Low-level input current IIL2 V
CC = 5.5 V
VIN = 0.4 V 2/ 07 -1.0 -3.2 mA
Low-level input current IIL3 V
CC = 5.5 V
VIN = 0.4 V 6/ 01, 02, 03, 04 -0.7 -3.2 mA
High-level input current IIH1 V
CC = 5.5 V
VIN = 2.4 V 5/ All
40 µA
High-level input current IIH2 V
CC = 5.5 V
VIN = 5.5 V 5/ All
100 µA
High-level input current IIH3 V
CC = 5.5 V
VIN = 2.4 V 3/ All 11/
80 µA
High-level input current IIH4 V
CC = 5.5 V
VIN = 5.5 V 3/ 7/ All
200 µA
High-level input current IIH5 V
CC = 5.5 V
VIN = 2.4 V 7/ 8/ 01, 02, 03, 04,
05, 07 -50
-850
120 µA
µA
High-level input current IIH6 V
CC = 5.5 V
VIN = 5.5 V 8/ 05, 07 300 µA
Short-circuit output current IOS V
CC = 5.5 V
VIN = 0 4/ All -20 -57 mA
01 20 mA
02, 03, 04 40
Supply current per device ICC V
CC = 5.5 V
VIN = 5 V 05, 06, 07 30
01, 02, 03
04, 05, 07 10 Maximum clock frequency 10/
fMAX
06 15
MHz
01, 02, 03, 04,
05 5 39
06 5 62
Propagation delay to high logic level
(clear or preset to output) tPLH
07 5 31
ns
01, 02, 03, 04,
05 5 50
06 5 62
Propagation delay to low logic level
(clear or preset to output) tPHL
07 5 39
ns
06 5 62
01, 02, 03, 04,
05 5 39
Propagation delay to high logic level
(clock to output) tPLH
07 5 31
ns
06 5 62
01, 02, 03, 04,
05 5 50
Propagation delay to low logic level
(clock to output) tPHL
VCC = 5 V
CL = 50 pF minimum
RL = 390Ω ± 5%
07 5 39
ns
1/ Input condition – J or K for device types 01, 02, 03, 04, 06, and preset or D for device types 05 a nd 07, and
clock, clear or preset for device type 06.
2/ Input condition – Clock for device types 01, 02, 03 and 04, and clear or clock for device types 05 and 07.
3/ Input condition – Clear or preset for device types 01, 02, 03, 04, 05, 06 and 07 and clock for device types 05
and 07.
4/ No more than one output should be shorted at a time.
5/ Input condition – J or K for device types 01, 02, 03, 04, 06, and D for device types 05 and 07, and clock for
device type 06.
6/ Input condition – Clear or preset for device types 01, 02, 03 and 04.
7/ Input condition – Clock for device types 01, 02, 03 and 04.
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8/ Input condition – Clear for device types 05 and 07.
9/ See table III for complete terminal conditions.
10/ Minimum limit specified is the freque ncy of the input pulse. The output frequency shall be one-half of
the input frequency.
11/ For device types 02 and 03,limits are 0 to 120 µA.
TABLE II. Electrical test requirements.
Subgroups (see table III)
MIL-PRF-38535
test requirements Class S
devices Class B
devices
Interim electrical parameters
1 1
Final electrical test parameters
1*, 2, 3, 7,
8, 9 1*, 2, 3,
7, 9
Group A test requirements
1, 2, 3, 7, 8,
9, 10, 11 1, 2, 3, 7
9
Group B test when using the method 5005
QCI option 1, 2, 3,
N/A
Group C end-point electrical
parameters 1, 2, 3,
1, 2, 3
Additional electrical subgroups for
Group C periodic inspections N/A 10, 11
Group D end-point electrical parameters 1, 2, 3 1, 2, 3
*PDA applies to subgroup 1.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-
38535 or as modified in the d evice ma nufacturer's Quality Management (QM) plan. T he modification in the QM
plan shall not effect the form, fit, or function as described her ein.
4.2 Screening. Screening shall b e in accordance with MIL-PRF-38535 and shall be conducted on all devices
prior to qualification and quality conformance inspection. The following additional criteria shall app ly:
a. The burn-in test duration, test condition, and test temperature, or approved altern atives shall be as
specified in the device manufacturer' s QM plan in accordance with MIL-PRF-38535. The burn-i n test
circuit shall be maintained under document control by the device manuf acturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-
883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535, appen dix B.
4.3 Qualification inspection. Qualification inspection shall be in accord ance with MIL-PRF-38535.
4.4 Technology Conformance inspection (TCI ). Technolo gy conformance inspection sha ll be in accordance
with MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
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4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, and 6 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and
as follows:
a. End-point electrical parameters shall be as specified in tabl e II herein.
b. The steady-state life test duration, test condition, and test temperatur e, or approved alternatives shall
be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-
in test circuit shall be maintained under document control by the device manufactur er' s Technology
Review Board (TRB) in accordance with MIL-PRF-38535 and sha ll be made available to the acqu iring
or preparing activity upon requ est. The test circuit shall specify the inputs, outputs, biases, and
power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-
STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-
point electrical parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be specifi ed and as follows:
4.5.1 Voltage and current. All voltages give n are referenced to the microcircuit ground terminal. Currents
given are conventional and positive when flowing into the referenc ed terminal.
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FIGURE 1. Logic diagram and terminal connectio ns.
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FIGURE 1. Logic diagram and terminal connectio ns – Continued.
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Device type 01
Truth table
tn t
n + 1
J K Q
L L Qn
L H L
H L H
H H
Qn
Positive logic: Low input to preset sets Q to high-level
Low input to clear sets Q to low-level
Preset and clear are independent of clock and dominate
regardless of the state of clock or J of K inputs.
NOTES: 1. J = J1 • J2 • J3
2. K = K1 • K2 • K3
3. tn = Bit time before clock pulse.
4. tn + 1 = Bit time after clock pulse.
Device type 02 and 03
Truth table
each flip-flop
tn t
n + 1
J K Q
L L Qn
L H L
H L H
H H
Qn
Positive logic: Low input to clear sets Q to low-level
Clear is independent of clock and domin ate
regardless of the state of clock or J or K inputs.
NOTES: 1. tn = Bit time before clock pulse.
2. tn + 1 = Bit time after clock pulse.
FIGURE 2. Truth tables.
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Device type 04
Truth table
each flip-flop
tn t
n + 1
J K Q
L L Qn
L H L
H L H
H H
Qn
Positive logic: Low input to preset sets Q to high-level
Low input to clear sets Q to low-level
Preset and clear are independent of clock and dominate
regardless of the state of clock or J of K inputs.
NOTES: 1. tn = Bit time before clock pulse.
2. tn + 1 = Bit time after clock pulse.
Device type 05 and 07
Truth table
each flip-flop
tn t
n + 1
INPUT
D OUTPUT
Q OUTPUT
Q
L L H
H H L
Positive logic: Low input to preset sets Q to high-level
Low input to clear sets Q to low-level
Preset and clear are independent of clock and dominate
regardless of the state of clock or D input.
NOTES: 1. tn = Bit time before clock pulse.
2. tn + 1 = Bit time after clock pulse.
FIGURE 2. Truth tables – Continued.
MIL-M-38510/2G
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Device type 06
Truth table
tn t
n + 1
J K Q
L L Qn
L H L
H L H
H H
Qn
Positive logic: Low input to preset sets Q to high-level
Low input to clear sets Q to low-level
Preset or clear function can occur only
When clock input is low.
NOTES: 1. J = J1 • J2 • *J
2. K = K1 • K2 • *K
3. tn = Bit time before clock pulse.
4. tn + 1 = Bit time after clock pulse.
5. If inputs J* or K* are not used must be grounded.
FIGURE 2. Truth tables – Continued.
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FIGURE 3. Schematic circuits.
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FIGURE 3. Schematic circuits – Continued.
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FIGURE 3. Schematic circuits – Continued.
MIL-M-38510/2G
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NOTES:
1. Circuits A, B, and C are the only acceptable variati ons for device types 02 and 03.
2. All resistance values shown are nominal.
FIGURE 3. Schematic circuits – Continued.
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FIGURE 3. Schematic circuits – Continued.
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FIGURE 3. Schematic circuits – Continued.
MIL-M-38510/2G
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NOTES:
1. Circuits A, B and C are the only acceptable variation for device type 04.
2. All resistance values shown are nominal.
FIGURE 3. Schematic circuits – Continued.
MIL-M-38510/2G
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NOTES:
1. Circuits A, B, and C are the only acceptable variati ons for device type 05.
2. All resistance values shown are nominal.
FIGURE 3. Schematic circuits – Continued.
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FIGURE 3. Schematic circuits – Continued.
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NOTE: All resistance values sho wn are no m inal.
FIGURE 3. Schematic circuits – Continued.
MIL-M-38510/2G
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NOTES:
1. Circuits A and B are the onl y acceptable variations for devic e type 07.
2. All resistance values shown are nominal.
FIGURE 3. Schematic circuits – Continued.
MIL-M-38510/2G
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NOTES:
1. Clear or preset inputs dominate regardless of the state of clock or J-K inputs.
2. Clear or preset input pulse characteristics: Vgen = 3 V, t0 = t1 = 10 ns, tp(clear) =
tp(preset) = 30 ns, PRR = 1 MHz, and ZOUT ≈ 50Ω.
3. CL = 50 pF, minimum (CL includes probe and jig capacitance).
4. RL = 390Ω ±5%.
5. All diodes are 1N3064, or equivalent.
6. When testing clear to output switching, prese t input shall have a negative pulse. When
testing preset output switching, clear shall have a negative pulse (see table III).
FIGURE 4. Clear and preset switching test circuit and waveforms for device type 01.
MIL-M-38510/2G
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NOTES:
1. Clock input characteristics for tPLH, tPHL (clock to output), Vgen = 3 V, t1 = t0 ≤ 10 ns, tp (clock)
= 25 ns, and PRR = 1 MHz. All J and K inputs are at 2.4 V. When testing fMAX the clock
input characteristics are Vgen = 3 V, t1 = t0 ≤ 10 ns, tp (clock) = 20 ns, and PRR = see table
III.
2. J = J1 • J2 • J3; and K = K1 • K2 • K3
3. All diodes are 1N3064, or equivalent.
4. CL = 50 pF minimum (CL includes probe and jig capacitance).
5. RL = 390Ω ±5%
FIGURE 5. Synchronous switching test circuit for device type 01.
MIL-M-38510/2G
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NOTES:
1. Clear inputs dominate regardless of the state of clock or J-K inputs.
2. Clear input pulse characteristics: Vgen = 3 V, t0 = t1 = 10 ns, tp(clear) = 30 ns, PRR = 1 MHz.
3. All diodes are 1N3064, or equivalent.
4. CL = 50 pF, minimum (CL includes probe and jig capacitance).
5. RL = 390Ω ±5%.
6. Clock input puls e characteristics: Vgen = 3 V, tp (clock) ≥ 25 ns, PRR = 1 MHz.
FIGURE 6. Clear switching test circuit and waveforms for device types 02 and 03.
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NOTES:
1. Clock input characteristics for tPLH, tPHL (clock to output), Vgen = 3 V, t1 = t0 ≤ 10 ns, tp (clock)
= 25 ns, and PRR = 1 MHz. All J and K inputs are at 2.4 V. When testing fMAX the clock
input characteristics are Vgen = 3 V, t1 = t0 ≤ 10 ns, tp (clock) = 20 ns, and PRR = 10 MHz for
subgroups 9, 10, and 11.
2. All diodes are 1N3064, or equivalent.
3. CL = 50 pF minimum (including jig and probe capacitance).
4. RL = 390Ω ±5%
FIGURE 7. Synchronous switching test circuit for device type 02 and 03.
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NOTES:
1. Clear or preset inputs dominate regardless of the stat e of clock or J-K inputs.
2. Clear or preset input pulse characteristics: Vgen = 3 V, t0 = t1 = 10 ns, tp(clear) = tp(preset) = 30 ns, PRR = 1
MHz, and ZOUT ≈ 50Ω.
3. CL = 50 pF, minimum (including jig and probe capacitance).
4. RL = 390Ω ±5%.
5. All diodes are 1N3064, or equivalent.
6. When testing clear to output switching, preset input shall have a negative pulse. When testing
preset to output switching, clear input shall have a negative pulse (see table III).
FIGURE 8. Clear and preset switching test circuit and waveforms for device type 04.
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NOTES:
1. Clock input characteristics for tPLH, tPHL (clock to output), Vgen = 3 V, t1 = t0 ≤ 10 ns, tp (clock)
= 25 ns, and PRR = 1 MHz. All J and K inputs are at 2.4 V. When testing fMAX the clock
input characteristics are Vgen = 3 V, t1 = t0 ≤ 10 ns, tp (clock) = 20 ns, and PRR = see table
III.
2. All diodes are 1N3064, or equivalent.
3. CL = 50 pF minimum (including jig and probe capacitance).
4. RL = 390Ω ±5%
FIGURE 9. Synchronous switching test circuit for device type 04.
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NOTES:
1. Clear and preset inputs dominate regardless of the state of clock or D inputs.
2. All diodes are 1N3064, or equivalent.
3. Clear or preset input pulse characteristics: Vgen = 3 V, to ≤ 7 ns, tp (clear) = tp (preset) = 35 ns, and PRR =
1 MHz.
4. CL = 50 pF, minimum (including jig and probe capacitance).
5. RL = 390Ω ±5%.
6. When testing clear to output switching, preset input shall have a negative pulse. When testing preset to
output switching, clear input shall have a negative pulse (see table III).
FIGURE 10. Clear and preset switching test circuit and waveforms for device types 05 and 07.
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NOTES:
1. Clock input pulse has the following characteristics: Vgen = 3 V, to = t1 ≤ 10 ns, tp (clock) = 30
ns, and PRR = 1 MHz. When testing fMAX, PRR = see table III.
2. D input (pulse A ) has the following characte ristics: Vgen = 3 V, to = t1 ≤ 10 ns, tSETUP = 25 ns,
tp = 60 ns, and PRR is 50% of the clock PRR. D input (pulse B) has the foll owing
characteristics: Vgen = 3 V, to = t1 < 7 ns, thold = 6 ns, tp = 60 ns, and PRR is 50% of the clock
PRR.
3. All diodes are 1N3064, or eq uivalent.
4. CL = 50 pF minimum (including jig and probe capacitance).
5. RL = 390Ω ±5%
FIGURE 11. Synchronous switching test circuit (high level data) for device types 05 and 07.
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FIGURE 12. Synchronous s witching test circuit (low-level data) for device types 05 and 07.
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NOTES:
1. Clock input pulse has the following characteristics: Vgen = 3 V, to = t1 < 10 ns, tp (clock) = 30
ns, and PRR = 1 MHz.
2. D input (pulse A ) has the following characte ristics: Vgen = 3 V, to = t1 ≤ 10 ns, tSETUP = 25 ns,
tp = 60 ns, and PRR is 50% of the clock PRR. D input (pulse B) has the foll owing
characteristics: Vgen = 3 V, to = t1 < 10 ns, thold = 6 ns, tp = 60 ns, and PRR is 50% of the
clock PRR.
3. All diodes are 1N3064, or eq uivalent.
4. CL = 50 pF minimum (including jig and probe capacitance).
5. RL = 390Ω ±5%
FIGURE 12. Synchronous s witching test circuit (low-level data) for device types 05 and 07 – Continued.
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NOTES:
1. Preset or clear function can occur only when clock input is lo w. Gated inputs are inhibited.
2. All diodes are 1N3064, or equivalent.
3. CL = 50 pF, minimum, including jig an d probe capacitance.
4. Clear or preset input pulse characteristics: Vgen = 3.0 V, to = 5 ns, t1 ≤ 10 ns, tp = 25 ns.
5. RL = 390Ω ±5%.
FIGURE 13. Clear and preset switching test circuit and waveforms for device types 06.
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NOTES:
1. Clock input pulse has the following characteristics: Vgen = 3 V, t1 = t0 ≤ 10 ns, tp = 30 ns, and
PRR = 1 MHz. When testing fMAX, PRR = see table III.
2. All diodes are 1N3064, or equivalent.
3. CL = 50 pF minimum including jig an d probe capacitance.
4. RL = 390Ω ±5%
FIGURE 14. Synchronous switching test circuit for device type 06.
MIL-M-38510/2G
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NOTES:
1. Apply normal clock pulse, then sink -12 mA on the clock input.
2. The output Q is measured after -12 mA is applied to the clock to insure it is still in the low state.
FIGURE 15. Input clamp voltage test circuit for device types 01, 02, 03, and 04 (circuit B).
TABLE III. Group A inspection for device type 01. 1/
Case A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits
Case C 9 12 13 14 2 1 3 4 5 6 7 8 10 11
Subgroup Symbol MIL-
STD-883
method Test No. K1 Clock Preset VCC Clear NC J1 J2 J3 Q GND Q K2 K3
Meas.
terminal Min Max Unit
1 2/ VOH 3006 1 0.8 V A 4.5 V 2.0 V 2.0 V 2.0 V “ -.4 mA 0.8 V 0.8 V Q 2.4 V
TC = 25°C “ “ 2 2.0 V A “ 0.8 V 0.8 V 0.8 V -.4 mA “ 2.0 V 2.0 V Q “ “
“ “ “ 3 0.8 V “ 2.0 V “ -.4 mA Q “ “
“ “ “ 4 2.0 V “ 0.8 V -.4 mA “ Q “ “
“ VOL 3007 5 2.0 V A “ 0.8 V 0.8 V 0.8 V “ 16 mA 2.0 V 2.0 V Q 0.4 “
“ “ “ 6 0.8 V A “ 2.0 V 2.0 V 2.0 V 16 mA “ 0.8 V 0.8 V Q “ “
“ “ “ 7 0.8 V “ 2.0 V 16 mA “ Q “ “
“ “ “ 8 2.0 V “ 0.8 V “ 16 mA Q “ “
“ VIC “ 9 “ -12 mA “ J1 -1.5 “
“ “ “ 10 “ -12 mA “ J2 “ “
“ “ “ 11 “ -12 mA “ J3 “ “
“ “ “ 12 -12 mA “ “ K1 “ “
“ “ “ 13 “ “ -12 mA K2 “ “
“ “ “ 14 “ “ -12 mA K3 “ “
“ “ “ 15 “ -12 mA “ Clear “ “
“ “ “ 16 -12 mA “ “ Preset “ “
“ “ “ 17 -12 mA “ “ Clock “ “
“ “ “ 17 CKT B 0.8 V A* “ 4.5 V 4.5 V 4.5 V 4.5 V 0.8 V 0.8 V Clock 0.5 “
“ IIL1 3009 18 GND 4.5 V 5.5 V B 0.4 V 4.5 V 4.5 V “ GND GND J1 -0.7 -1.6 mA
“ “ “ 19 “ “ “ B 4.5 V 0.4 V 4.5 V “ GND GND J2 “ “ “
“ “ “ 20 “ “ “ B 4.5 V 4.5 V 0.4 V “ GND GND J3 “ “ “
“ “ “ 21 0.4 V “ B “ GND GND GND “ 4.5 V 4.5 V K1 “ “ “
“ “ “ 22 4.5 V “ B “ GND GND GND “ 0.4 V 4.5 V K2 “ “ “
“ “ “ 23 4.5 V “ B “ GND GND GND “ 4.5 V 0.4 V K3 “ “ “
“ IIL2 “ 24 4.5 V 0.4 V B “ 4.5 V 4.5 V 4.5 V “ 4.5 V 4.5 V Cl ock -1.4 -3.2 mA
“ IIL2 “ 25 “ 0.4 V “ B “ “ “ “ “ “ Clock -1.4 -3.2 “
“ IIL3 “ 26 CKT A “ 4.5 V 0.4 V “ “ “ “ “ “ “ Preset -0.7 -1.6 “
“ “ “ 26 CKT B “ “ 0.4 V “ “ “ “ “ “ “ Preset -1.4 -3.2 “
“ “ “ 27 CKT A “ “ “ 0.4 V “ “ “ “ “ “ Clear -0.7 -1.6 “
“ “ “ 27 CKT B “ “ “ 0.4 V “ “ “ “ “ “ Clear -1.4 -3.2 “
“ IIH1 3010 28 GND “ GND 2.4 V GND GND “ J1 40 µA
“ “ “ 29 “ “ GND GND 2.4 V GND “ J2 “ “
“ “ “ 30 “ “ GND GND GND 2.4 V “ J3 “ “
“ “ “ 31 2.4 V “ GND “ “ GND GND K1 “ “
“ “ “ 32 GND “ GND “ “ 2.4 V GND K2 “ “
“ “ “ 33 GND “ GND “ “ GND 2.4 V K3 “ “
“ IIH2 “ 34 “ “ GND 5.5 V GND GND “ J1 100 “
“ “ “ 35 “ “ GND GND 5.5 V GND “ J2 “ “
“ “ “ 36 “ “ GND GND GND 5.5 V “ J3 “ “
“ “ “ 37 5.5 V “ GND “ “ GND GND K1 “ “
“ “ “ 38 GND “ GND “ “ 5.5 V GND K2 “ “
“ “ “ 39 GND “ GND “ “ GND 5.5 V K3 “ “
“ IIH3 “ 40 4.5 V A “ 2.4 V GND GND GND “ 4.5 V 4.5 V Clear 80 “
“ IIH3 “ 41 GND A 2.4 V “ GND 4.5 V 4.5 V 4.5 V “ GND GND Preset 80 “
“ IIH4 “ 42 GND A 5.5 V “ GND 4.5 V 4.5 V 4.5 V “ GND GND Preset 200 “
“ “ “ 43 4.5 V A “ 5.5 V GND GND GND “ 4.5 V 4.5 V Cl ear “ “
“ “ “ 44 GND 5.5 V “ GND GND GND GND “ GND GND Clock “ “
“ “ “ 45 GND 5.5 V GND “ GND GND GND “ GND GND Clock “ “
See notes at end of device type 01.
MIL-M-38510/2G
36
TABLE III. Group A inspection for device type 01. 1/ - Continued.
Case A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits
Case C 9 12 13 14 2 1 3 4 5 6 7 8 10 11
Subgroup Symbol MIL-
STD-883
method Test No. K1 Clock Preset VCC Clear NC J1 J2 J3 Q GND Q K2 K3
Meas.
terminal Min Max Unit
1 IIH5 3010 46 CKT A GND 2.4 V 5.5 V GND GND GND GND GND GND GND Clock -50 -700
µA
TC = 25°C “ “ 46 CKT B “ “ “ GND “ “ “ “ “ “ “ -200 -850 “
“ “ “ 46 CKT C “ “ “ GND “ “ “ “ “ “ “ -400 -1000 “
“ “ “ 47 CKT A “ “ GND “ “ “ “ “ “ “ “ -50 -700 “
“ “ “ 47 CKT B “ “ GND “ “ “ “ “ “ “ “ -200 -850 “
“ “ “ 47 CKT C “ “ GND “ “ “ “ “ “ “ “ -400 -1000 “
“ IOS 3011 48 4.5 V GND GND 5.5 V 4.5 V 4.5 V 4.5 V “ 4.5 V 4.5 V Q -20 -57 mA
“ IOS 3011 49 4.5 V “ “ GND 4.5 V 4.5 V 4.5 V GND “ 4.5 V 4.5 V Q -20 -57 “
“ ICC 3005 50 GND “ GND “ GND GND GND “ GND GND VCC 20 “
“ ICC 3005 51 GND “ “ GND GND GND GND “ GND GND VCC 20 “
2 Same tests, terminal conditions and limits as for subgroup 1, except TC = 125ºC and VIC tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except TC = -55ºC and VIC tests are omitted.
7 2/ 4 52 B B A 4.5 V B B B B B H 3/ GND L 3/ B B All H or L
TC = 25°C 53 B B B “ A B B B B L “ H B B output as shown 3/
54 B B A “ A B B B B L “ H A A “ “
“ 55 B A A “ A B B B B L “ H A A “ “
“ 56 B B A “ A B B B B L “ H A A “ “
“ 57 A B A “ A B B B B L “ H B A “ “
“ 58 A A A “ A B B B B L “ H B A “ “
“ 59 A B A “ A B B B B L “ H B A “ “
“ 60 A B A “ A B B B B L “ H A B “ “
“ 61 A A A “ A B B B B L “ H A B “ “
“ 62 A B A “ A B B B B L “ H A B “ “
“ 63 A B A “ B B B B B H “ L A B “ “
“ 64 B B A “ A B B A A H “ L B B “ “
“ 65 B A A “ A B B A A H “ L B B “ “
“ 66 B B A “ A B B A A H “ L B B “ “
“ 67 B B A “ A B A B A H “ L B B “ “
“ 68 B A A “ A B A B A H “ L B B “ “
“ 69 B B A “ A B A B A H “ L B B “ “
“ 70 B B A “ A B A A B H “ L B B “ “
“ 71 B A A “ A B A A B H “ L B B “ “
“ 72 B B A “ A B A A B H “ L B B “ “
“ 73 A B A “ A B A A A H “ L A A “ “
“ 74 A A A “ A B A A A H “ L A A “ “
“ 75 A B A “ A B A A A L “ H A A “ “
“ 76 A A A “ A B A A A L “ H A A “ “
“ 77 A B A “ A B A A A H “ L A A “ “
“ 78 A B A “ B B A A A H “ L A A “ “
“ 79 A A A “ B B A A A H “ L A A “ “
“ 80 A B A “ B B A A A H “ L A A “ “
“ 81 A B B “ B B A A A H “ H A A “ “
“ 82 A A B “ B B A A A H “ H A A “ “
“ 83 A B B “ B B A A A H “ H A A “ “
“ 84 A A B “ A B A A A L “ H A A “ “
“ 85 A A A “ A B A A A L “ H A A “ “
“ 86 B A A “ A B A A A L “ H A A “ “
“ 87 B A A “ A B B A A L “ H A A “ “
“ 88 B B A “ A B B A A H “ L A A “ “
“ 89 A A A “ A B A A A H “ L A A “ “
“ 90 A A A “ A B B A A H “ L A A “ “
See notes at end of device type 01.
37
MIL-M-38510/2G
TABLE III. Group A inspection for device type 01. 1/ - Continued.
Case A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits
Case C 9 12 13 14 2 1 3 4 5 6 7 8 10 11
Subgroup Symbol MIL-
STD-883
method Test No. K1 Clock Preset VCC Clear NC J1 J2 J3 Q GND Q K2 K3
Meas.
terminal Min Max Unit
7 2/ 4/ 91 B A A 4.5 V A B B A A H GND L A A All H or L
TC = 25°C 92 B B A 4.5 V A B B A A L GND H A A output As shown 3/
8 2/ 4/ Same tests, terminal conditions and limits as for subgroup 7, except TC = 125 and -55°C.
9 FMAX 5/ (Fig. 5) 93 2.4 V IN 5.0 V 5.0 V 5.0 V 2.4 V 2.4 V 2.4 V GND OUT 2.4 V 2.4 V Q 10 MHz
TC = 25°C FMAX 5/ (Fig. 5) 94 “ IN 5.0 V “ 5.0 V “ “ “ OUT “ “ “ Q 10 MHz
“ tPLH1 3003 95 “ 2.4 V J “ IN “ “ “ OUT “ “ “ Clear to Q 5 25 ns
“ tPLH1 (Fig. 4) 96 “ “ IN “ J “ “ “ “ OUT “ “ Preset
to Q “ 25 “
“ tPHL1 “ 97 “ “ J “ IN “ “ “ “ OUT “ “ Clear to Q “ 40 “
“ tPHL1 “ 98 “ “ IN “ J “ “ “ OUT “ “ “ Preset
to Q
“ 40 “
“ tPLH2 3003
(Fig 5 99 “ IN 5.0 V “ 5.0 V “ “ “ OUT “ “ “ Clock to Q “ 30 ns
“ tPLH2 “ 100 “ “ “ “ “ “ “ “ “ OUT “ “ Clock to Q “ 30 “
“ tPHL2 “ 101 “ “ “ “ “ “ “ “ OUT “ “ “ Clock to Q “ 40 “
“ tPHL2 “ 102 “ “ “ “ “ “ “ “ “ OUT “ “ Clock to Q 40 “
10 FMAX 5/ (Fig 5) 103 “ “ “ “ “ “ “ “ “ OUT “ “ Q 10 MHz
TC = 125°C FMAX 5/ (Fig 5) 104 “ “ “ “ “ “ “ “ OUT “ “ “ Q 10 MHz
“ tPLH1 3003
(Fig. 4) 105 “ 2.4 V J “ IN “ “ “ OUT “ “ “ Clear to Q 5 39 ns
“ tPLH1 “ 106 “ “ IN “ J “ “ “ “ OUT “ “ Preset
to Q “ 39 “
“ tPHL1 “ 107 “ “ J “ IN “ “ “ OUT “ “ Clear to Q “ 50 “
“ tPHL1 “ 108 “ “ IN “ J “ “ “ OUT “ “ “ Preset
to Q
“ 50 “
“ tPLH2 (Fig 5) 109 “ IN 5.0 V “ 5.0 V “ “ “ OUT “ “ “ Clock to Q “ 39 ns
“ tPLH2 “ 110 “ “ “ “ “ “ “ “ “ OUT “ “ Clock to Q “ 39 “
“ tPHL2 “ 111 “ “ “ “ “ “ “ “ OUT “ “ “ Clock to Q “ 50 “
“ tPHL2 “ 112 “ “ “ “ “ “ “ “ OUT “ “ Clock to Q “ 50 “
11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
NOTES:
A = Normal clock pulse.
B = Momentary GND, then 4.5 V.
J = Input pulse tp = 100 ns, PRR = 1 MHz, VOL = 0 V, VOH = 4.5 V
*After clock pulse apply –12 mA to clock pin to insure Q is still in the low state (see figure 15).
1/ Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
2/ Input voltages shown are: A= 2.0 volts minimum and B = 0.8 volts maximum.
3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker
double camparator; or (b) H ≥ 1.5 V and L < 1.5 V when using a high speed checker single comparator.
4/ Tests shall be performed in sequence.
5/ FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
38
MIL-M-38510/2G
TABLE III. Group A inspection for device type 02. 1/
Case A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits
Case C 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol MIL-
STD-883
method Test No. Clock 1 Clear 1 K1 VCC Clock 2 Clear 2 J2 Q2 Q2 K2 GND Q1
Q1 J1
Meas.
terminal Min Max Unit
1 VOH 3006 1 A 0.8 V 4.5 V GND -.4 mA 2.0 V Q 2.4 V
TC = 25°C “ “ 2 A 2.0 V “ “ -.4 mA 0.8 V
Q1 “ “
“ “ “ 3 0.8 V “ “ -.4 mA
Q1 “ “
“ “ “ 4 “ A 2.0 V -.4 mA 0.8 V “ Q2 “ “
“ “ “ 5 “ A 0.8 V -.4 mA 2.0 V “ Q2 “ “
“ “ “ 6 “ 0.8 V -.4 mA “
Q2 “ “
“ VOL 3007 7 A 2.0 V “ “ 16 mA 0.8 V Q1 0.4 “
“ “ “ 8 A 0.8 V “ “ 16 mA 2.0 V Q1 “ “
“ “ “ 9 0.8 V “ “ 16 mA Q1 “ “
“ “ “ 10 “ A 0.8 V 16 mA 2.0 V “ Q2 “ “
“ “ “ 11 “ A 2.0 V 16 mA 0.8 V “
Q2 “ “
“ “ “ 12 “ 0.8 V 16 mA “ Q2 “ “
“ VIC 13 “ “ -12 mA J1 -1.5 “
“ “ 14 “ -12 mA “ J2 “ “
“ “ 15 -12 mA “ “ K1 “ “
“ “ 16 “ -12 mA “ K2 “ “
“ “ 17 -12 mA “ “ Clear 1 “ “
18 -12 mA “ “ Clock 1 “
“ “ 18 CKT B A* 4.5 V 0.8 V “ “ 4.5 V Clock 1 -0.5 “
“ “ 19 “ -12 mA “ Clear 2 -1.5 “
“ “ 20 “ -12 mA “ Clock 2 -1.5 “
“ “ 20 CKT B “ A* 4.5 V 4.5 V 0.8 V “ Clock 2 -0.5
“ IIL1 3009 21 5/ 4.5 V 5.5 V “ 0.4 V J1 -0.7 -1.6 mA
“ “ “ 22 5/ 4.5 V 0.4 V “ “ K1 “ “ “
“ “ “ 23 “ 5/ 4.5 V 0.4 V “ J2 “ “ “
“ “ “ 24 “ 5/ 4.5 V 0.4 V “ K2 “ “ “
“ IIL2 “ 25 0.4 V B 4.5 V “ “ 4.5 V Clock 1 -1.4 -3.2 “
“ IIL2 “ 26 “ 0.4 V B 4.5 V 4.5 V “ Clock 2 -1.4 -3.2 “
“ IIL3 “ 27 CKT A, C 4.5 V 0.4 V “ “ 4.5 V Clear 1 -0.7 -1.6 “
“ “ “ 27 CKT B 4.5 V 0.4 V “ “ 4.5 V Clear 1 -1.4 -3.2 “
“ “ “ 28 CKT A, C “ 4.5 V 0.4 V 4.5 V “ Clear 2 -0.7 -1.6 “
“ “ “ 28 CKT B “ 4.5 V 0.4 V 4.5 V “ Clear 2 -1.4 -3.2 “
“ IIH1 3010 29 GND GND 5.5 V “ 2.4 V J1 40 µA
“ “ “ 30 GND B 2.4 V “ “ K1 “ “
“ “ “ 31 “ GND GND 2.4 V “ J2 “ “
“ “ “ 32 “ GND B 2.4 V “ K2 “ “
“ IIH2 “ 33 GND GND “ “ 5.5 V J1 100 “
“ “ “ 34 GND B 5.5 V “ “ K1 “ “
“ “ “ 35 “ GND GND 5.5 V “ J2 “ “
“ “ “ 36 “ GND B 5.5 V “ K2 “ “
“ IIH3 7/ “ 37 GND E “ “ GND Clear 1 80 “
“ IIH3 7/ “ 38 “ GND E GND “ Clear 2 80 “
“ IIH4 “ 39 5.5 V 5.5 V GND “ “ GND Clock 1 200 “
“ “ “ 40 GND E “ “ GND Clear 1 “ “
“ “ “ 41 “ 5.5 V 5.5 V GND GND “ Clock 2 “ “
“ “ “ 42 “ GND F GND “ Clear 2 “ “
“ IIH5 “ 43 CKT A, C 2.4 V E GND “ “ GND Clock 1 -50 -700 “
“ “ “ 43 CKT B 2.4 V 2.4 V GND “ “ GND Clock 1 -200 -850 “
“ “ “ 44 CKT A, C “ 2.4 V E GND GND “ Clock 2 -50 -700 “
“ “ “ 44 CKT B “ 2.4 V 2.4 V GND GND “ Clock 2 -200 -850 “
See notes at end of device type 02.
39
MIL-M-38510/2G
TABLE III. Group A inspection for device type 02. 1/ - Continued.
Case A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits
Case C 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol MIL-
STD-883
method Test No. Clock 1 Clear 1 K1 VCC Clock 2 Clear 2 J2 Q2 Q2 K2 GND Q1 Q1 J1
Meas.
terminal Min Max Unit
1
TC = 25°C IOS 3011 45 2.4 V GND 2.4 V 5.5 V GND GND 2.4 V
Q1 -20 -57 mA
“ “ 3011** 46 A 4.5 V 0 “ “ GND 4.5 V Q1 “ “ “
“ “ 3011** 47 “ GND 4.5 V 4.5 V GND 0 V “ Q2 “ “ “
“ “ 3011 48 “ 2.4 V GND 2.4 V GND 2.4 V “
Q2 “ “ “
“ ICC 3005 49 D 4.5 V GND “ D 4.5 V 4.5 V GND “ 4.5 V VCC 40 “
2 Same tests, terminal conditions and limits as for subgroup 1, except TC = 125ºC and VIC tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except TC = -55ºC and VIC tests are omitted.
7 2/ 4/ 50 B B B 4.5 V B B A H 3/ L 3/ B GND L 3/ H 3/ A All H or L
TC = 25°C 51 A B B “ A B A H L B “ L H A output as shown 3/
52 B B B “ B B A H L B “ L H A “ “
“ 53 B B A “ B B A H L A “ L H A “ “
“ 54 A B A “ A B A H L A “ L H A “ “
“ 55 B B A “ B B A H L A “ L H A “ “
“ 56 B A A “ B A A H L A “ L H A “ “
“ 57 A A A “ A A A H L A “ L H A “ “
“ 58 B A A “ B A A L H A “ H L A “ “
“ 59 A A A “ A A A L H A “ H L A “ “
“ 60 B A A “ B A A H L A “ L H A “ “
“ 61 A A A “ A A A H L A “ L H A “ “
“ 62 B A A “ B A A L H A “ H L A “ “
“ 63 B A B “ B A B L H B “ H L B “ “
“ 64 A A B “ A A B L H B “ H L B “ “
“ 65 B A B “ B A B L H B “ H L B “ “
“ 66 B B B “ B B B H L B “ L H B “ “
“ 67 B A B “ B A B H L B “ L H B “ “
“ 68 A A B “ A A B H L B “ L H B “ “
“ 69 B A B “ B A B H L B “ L H B “ “
“ 70 B A B “ B A A H L B “ L H A “ “
“ 71 A A B “ A A A H L B “ L H A “ “
“ 72 B A B “ B A A L H B “ H L A “ “
“ 73 B A A “ B A B L H A “ H L B “ “
“ 74 A A A “ A A B L H A “ H L B “ “
“ 75 B A A “ B A B H L A “ L H B “ “
“ 76 A B A “ A B A H L A “ L H A “ “
“ 77 A A A “ A A A H L A “ L H A “ “
“ 78 A A A “ A A B H L A “ L H B “ “
“ 79 A A B “ A A B H L B “ L H B “ “
“ 80 B A B “ B A B L H B “ H L B “ “
“ 81 A A A “ A A A L H A “ H L A “ “
“ 82 A A B “ A A A L H B “ H L A “ “
“ 83 A A B “ A A B L H B “ H L B “ “
“ 84 B A B “ B A B H L B “ L H B “ “
“ 85 A A B “ A A A H L B “ L H A “ “
“ 86 B A B “ B A A L H B “ H L A “ “
“ 87 A A B “ A A A L H B “ H L A “ “
“ 88 A B B “ A B A H L B “ L H A “ “
8 2/ 4/ Same tests, terminal conditions and limits as for subgroup 7, except TC = 125ºC and -55°C.
See notes at end of device type 02.
40
MIL-M-38510/2G
TABLE III. Group A inspection for device type 02. 1/ - Continued.
Case A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits
Case C 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol MIL-
STD-883
method Test No. Clock 1 Clear 1 K1 VCC Clock 2 Clear 2 J2 Q2 Q2 K2 GND Q1
Q1 J1
Meas.
terminal Min Max Unit
9 FMAX 6/ (Fig 7) 89 IN 2.4 V 5.0 V GND OUT 2.4 V Q1 10 MHz
TC = 25°C “ “ 90 IN 2.4 V “ “ OUT 2.4 V
Q1 “ “
“ “ “ 91 “ IN 2.4 V OUT 2.4 V “ Q2 “ “
“ “ “ 92 “ IN 2.4 V OUT 2.4 V “ Q2 “ “
“ tPLH1 3003
(Fig 6) 93 IN IN GND “ “ OUT 2.4 V Clear 1
to Q1 5 25 “
“ tPLH1 “ 94 “ IN IN 2.4 V OUT GND “ Clear 2
to Q2 “ 25 “
“ tPHL1 “ 95 IN IN GND “ “ OUT 2.4 V Clear 1
to Q1 “ 40 “
“ tPHL1 “ 96 “ IN IN 2.4 V OUT GND “ Clear 2
to Q2 “ 40 “
“ tPLH2 3003
(Fig 7) 97 IN 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1 “ 30 “
“ “ “ 98 IN 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1
“ “ “
“ “ “ 99 “ IN 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2 “ “ “
“ “ “ 100 “ IN 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2
“ “ “
“ tPHL2 “ 101 IN 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1 “ 40 “
“ “ “ 102 IN 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1
“ “ “
“ “ “ 103 “ IN 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2 “ “ “
“ “ “ 104 “ IN 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2
“ “ “
10 FMAX 6/ (Fig 7) 105 IN 2.4 V “ “ OUT 2.4 V Q1 10 MHz
TC = 125°C “ “ 106 IN 2.4 V “ “ OUT 2.4 V
Q1 “ “
“ “ “ 107 “ IN 2.4 V OUT 2.4 V “ Q2 “ “
“ “ “ 108 “ IN 2.4 V OUT 2.4 V “
Q2 “ “
“ tPLH1 3003
(Fig 6) 109 IN IN GND “ “ OUT 2.4 V Clear 1
to Q1
5 39 ns
“ tPLH1 “ 110 “ IN IN 2.4 V OUT GND “ Clear 2
to Q2
“ 39 “
“ tPHL1 “ 111 IN IN GND “ “ OUT 2.4 V Clear 1
to Q1 “ 50 “
“ tPHL1 “ 112 “ IN IN 2.4 V OUT GND “ Clear 2
to Q2 “ 50 “
“ tPLH2 3003
(Fig 7) 113 IN 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1 “ 39 “
“ “ “ 114 IN 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1
“ “ “
“ “ “ 115 “ IN 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2 “ “ “
“ “ “ 116 “ IN 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2
“ “ “
See notes at end of device type 02.
41
MIL-M-38510/2G
TABLE III. Group A inspection for device type 02. 1/ - Continued.
Case A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits
Case C 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol MIL-
STD-883
method Test No. Clock 1 Clear 1 K1 VCC Clock 2 Clear 2 J2 Q2 Q2 K2 GND Q1
Q1 J1
Meas.
terminal Min Max Unit
10
TC = 125°C tPHL2 3003 117 IN 5.0 V 2.4 V 5.0 V GND OUT 2.4 V Clock 1
to Q1 5 50 ns
“ “ “ 118 IN 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1
“ “ “
“ “ “ 119 “ IN 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2 “ “ “
“ “ “ 120 “ IN 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2
“ “ “
11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
NOTES:
A = Normal clock pulse.
B = Momentary GND, then 4.5 V.
C = This note has been deleted.
D = Momentary 4.5 V, then GND.
E = Momentary ground, then 2.4 V.
F = Momentary ground, then 5.5 V.
J = This note has been deleted.
* After clock pulse apply –12 mA to clock pin to insure Q is still in the low state (see figu re 15).
** Test time limit ≤ 100 ms.
1/ Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open.)
2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum.
3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b)
H ≥ 1.5 V and L < 1.5 V when using a high speed checker single comparator.
4/ Tests shall be performed in sequence.
5/ Input shall be one normal clock pulse, then 4.5 V
6/ FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall ge one-half of the input frequency.
7/ For CKT A, IIH3 limits are 0 to 120 µA.
MIL-M-38510/2G
42
TABLE III. Group A inspection for device type 03. 1/
Case C 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits Subgroup Symbol MIL-
STD-883
method Test No. J1 Q1 Q1 K1 Q2 Q2 GND J2 Clock 2 Clear 2 K2 Clock 1 Clear 1 VCC
Meas.
terminal Min Max Unit
1 VOH 3006 1 2.0 V -.4 mA 0.8 V GND A 4.5 V Q1 2.4 V
TC = 25°C “ “ 2 0.8 V -.4 mA 2.0 V “ A “
Q1 “ “
“ “ “ 3 -.4 mA “ 0.8 V “
Q1 “ “
“ “ “ 4 -.4 mA “ 2.0 V A 0.8 V Q2 “ “
“ “ “ 5 -.4 mA “ 0.8 V A 2.0 V “ Q2 “ “
“ “ “ 6 -.4 mA “ 0.8 V
Q2 “ “
“ VOL 3007 7 0.8 V 16 mA 2.0 V “ A “ Q1 0.4 “
“ “ “ 8 2.0 V 16 mA 0.8 V “ A
Q1 “ “
“ “ “ 9 16 mA “ 0.8 V “ Q1 “ “
“ “ “ 10 16 mA “ 0.8 V A 2.0 V Q2 “ “
“ “ “ 11 16 mA “ 2.0 V A 0.8 V “ Q2 “ “
“ “ “ 12 16 mA “ 0.8 V Q2 “ “
“ VIC 13 -12 mA “ “ J1 -1.5 “
“ “ 14 -12 mA “ K1 “ “
“ “ 15 “ -12 mA “ J2 “ “
“ “ 16 “ -12 mA K2 “ “
“ “ 17 “ -12 mA “ Clear 1 “ “
“ 18 “ -1 2 mA Clock 1 “ “
“ “ 18 CKT B 4.5 V 0.8 V “ A* 4.5 V “ Clock 1 -0.5 “
“ “ 19 “ -12 mA Clear 2 -1.5 “
“ “ 20 “ -12 mA “ Clock 2 -1.5 “
“ “ 20 CKT B “ 4.5 V A* 4.5 V 0.8 V “ Clock 2 -0.5 “
“ IIL1 3009 21 0.4 V “ 5/ 4.5 V 5.5 V J1 -0.7 -1.6 mA
“ “ “ 22 0.4 V “ 5/ 4.5 V “ K1 “ “ “
“ “ “ 23 “ 0.4 V 5/ 4.5 V “ J2 “ “ “
“ “ “ 24 “ 5/ 4.5 V 0.4 V “ K2 “ “ “
“ IIL2 “ 25 4.5 V 4.5 V “ 0.4 V B “ Clock 1 -1.25 -3.2 “
“ IIL2 “ 26 “ 4.5 V 0.4 V B 4.5 V “ Clock 2 -1.25 -3.2 “
“ IIL3 “ 27 CKT A, C 4.5 V “ 4.5 V 0.4 V “ Clear 1 -0.7 -1.6 “
“ “ “ 27 CKT B 4.5 V “ 4.5 V 0.4 V “ Clear 1 -1.4 -3.2 “
“ “ “ 28 CKT A, C “ 4.5 V 4.5 V 0.4 V “ Clear 2 -0.7 -1.6 “
“ “ “ 28 CKT B “ 4.5 V 4.5 V 0.4 V “ Clear 2 -1.4 -3.2 “
“ IIH1 3010 29 2.4 V “ GND GND “ J1 40
µA
“ “ “ 30 2.4 V “ GND B “ K1 “ “
“ “ “ 31 “ 2.4 V GND GND “ J2 “ “
“ “ “ 32 “ GND B 2.4 V “ K2 “ “
“ IIH2 “ 33 5.5 V “ GND GND “ J1 100 “
“ “ “ 34 5.5 V “ GND B “ K1 “ “
“ “ “ 35 “ 5.5 V GND GND “ J2 “ “
“ “ “ 36 “ GND B 5.5 V “ K2 “ “
“ IIH3 7/ “ 37 GND “ GND E “ Clear 1 80 “
“ IIH3 7/ “ 38 “ GND GND E “ Clear 2 80 “
“ IIH4 “ 39 GND GND “ 5.5 V GND “ Clock 1 200 “
“ “ “ 40 GND “ GND F “ Clear 1 “ “
“ “ “ 41 “ GND 5.5 V GND GND “ Clock 2 “ “
“ “ “ 42 “ GND GND F “ Clear 2 “ “
“ IIH5 “ 43 CKT A, C GND GND “ 2.4 V GND “ Clock 1 -50 -700 “
“ “ “ 43 CKT B GND GND “ 2.4 V GND “ Clock 1 -200 -850 “
“ “ “ 44 CKT A, C “ GND 2.4 V GND GND “ Clock 2 -50 -700 “
“ “ “ 44 CKT B “ GND 2.4 V GND GND “ Clock 2 -80 -850 “
See notes at end of device type 03.
43
MIL-M-38510/2G
TABLE III. Group A inspection for device type 03. 1/ - Continued.
Case C 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits Subgroup Symbol MIL-
STD-883
method Test No. J1 Q1 Q1 K1 Q2 Q2 GND J2 Clock 2 Clear 2 K2 Clock 1 Clear 1 VCC
Meas.
terminal Min Max Unit
1 IOS 3011 45 2.4 V GND 2.4 V “ 2.4 V GND 5.5 V Q1 -20 -57 mA
TC = 25°C “ 3011 * 46 4.5 V GND GND 0 V “ A 4.5 V “ Q1 “ “
“ “ 3011 * 47 GND GND “ 4.5 V A 4.5 V 2.4 V “ Q2 “ “
“ “ 3011 48 GND “ 2.4 V 2.4 V GND 0 V Q2 “ “
“ ICC 3005 49 4.5 V GND “ 4.5 V D 4.5 V GND D 4.5 V “ VCC 40 “
2 Same tests, terminal conditions and limits as for subgroup 1, except TC = 125ºC and VIC tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except TC = -55ºC and VIC tests are omitted.
7 2/ 4 50 A H 3/ L 3/ B L 3/ H 3/ GND A B B B B B 4.5 V All H or L
TC = 25°C 51 A H L B L H “ A A B B A B “ output as shown 3/
“ 52 A H L B L H “ A B B B B B “ “ “
“ 53 A H L A L H “ A B B A B B “ “ “
“ 54 A H L A L H “ A A B A A B “ “ “
“ 55 A H L A L H “ A B B A B B “ “ “
“ 56 A H L A L H “ A B A A B A “ “ “
“ 57 A H L A L H “ A A A A A A “ “ “
“ 58 A L H A H L “ A B A A B A “ “ “
“ 59 A L H A H L “ A A A A A A “ “ “
“ 60 A H L A L H “ A B A A B A “ “ “
“ 61 A H L A L H “ A A A A A A “ “ “
“ 62 A L H A H L “ A B A A B A “ “ “
“ 63 B L H B H L “ B B A B B A “ “ “
“ 64 B L H B H L “ B A A B A A “ “ “
“ 65 B L H B H L “ B B A B B A “ “ “
“ 66 B H L B L H “ B B B B B B “ “ “
“ 67 B H L B L H “ B B A B B A “ “ “
“ 68 B H L B L H “ B A A B A A “ “ “
“ 69 B H L B L H “ B B A B B A “ “ “
“ 70 A H L B L H “ A B A B B A “ “ “
“ 71 A H L B L H “ A A A B A A “ “ “
“ 72 A L H B H L “ A B A B B A “ “ “
“ 73 B L H A H L “ B B A A B A “ “ “
“ 74 B L H A H L “ B A A A A A “ “ “
“ 75 B H L A L H “ B B A A B A “ “ “
“ 76 A H L A L H “ A A B A A B “ “ “
“ 77 A H L A L H “ A A A A A A “ “ “
“ 78 B H L A L H “ B A A A A A “ “ “
“ 79 B H L B L H “ B A A B A A “ “ “
“ 80 B L H B H L “ B B A B B A “ “ “
“ 81 A L H A H L “ A A A A A A “ “ “
“ 82 A L H B H L “ A A A B A A “ “ “
“ 83 B L H B H L “ B A A B A A “ “ “
“ 84 B H L B L H “ B B A B B A “ “ “
“ 85 A H L B L H “ A A A B A A “ “ “
“ 86 A L H B H L “ A B A B B A “ “ “
“ 87 A L H B H L “ A A A B A A “ “ “
“ 88 A H L B L H “ A A B B A B “ “ “
8 2/ 4/ Same tests, terminal conditions and limits as for subgroup 7, except TC = 125ºC and -55°C.
See notes at end of device type 03.
MIL-M-38510/2G
44
TABLE III. Group A inspection for device type 03. 1/ - Continued.
Case C 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits Subgroup Symbol MIL-
STD-883
method Test No. J1 Q1 Q1 K1 Q2 Q2 GND J2 Clock 2 Clear 2 K2 Clock 1 Clear 1 VCC
Meas.
terminal Min Max Unit
9 FMAX (Fig. 7) 6/ 89 2.4 V OUT 2.4 V GND IN 5.0 V 5.0 V Q1 10 MHz
TC = 25°C “ “ 90 2.4 V OUT 2.4 V “ IN 5.0 V “ Q1 “ “
“ “ “ 91 OUT “ 2.4 V IN 5.0 V 2.4 V “ Q2 “ “
“ “ “ 92 OUT “ 2.4 V IN 5.0 V 2.4 V “ Q2 “ “
“ tPLH 3003
(Fig. 6) 93 2.4 V OUT GND “ A IN “ Clr 1 to Q1 5 25 ns
“ tPLH “ 94 OUT “ 2.4 V A IN GND “ Clr 2 to Q2 “ 25 “
“ tPHL “ 95 2.4 V OUT GND “ A IN “ Clr 1 to Q1 “ 40 “
“ tPHL “ 96 OUT “ 2.4 V A IN GND “ Clr 2 to Q2 “ 40 “
“ tPLH 3003 97 2.4 V OUT 2.4 V “ IN 5.0 V “ Clk 1 to Q1 5 30 ns
“ “ (Fig. 7) 98 2.4 V OUT 2.4 V “ IN 5.0 V “ Clk 1 to Q1 “ “ “
“ “ “ 99 OUT “ 2.4 V IN 5.0 V 2.4 V “ Clk 2 to Q2 “ “ “
“ “ “ 100 OUT “ 2.4 V IN 5.0 V 2.4 V “ Clk 2 to Q2 “ “ “
“ tPHL “ 101 2.4 V OUT 2.4 V “ IN 5.0 V “ Clk 1 to Q1 “ 40 “
“ “ “ 102 2.4 V OUT 2.4 V “ IN 5.0 V “ Clk 1 to Q1 “ “ “
“ “ “ 103 OUT “ 2.4 V IN 5.0 V 2.4 V “ Clk 2 to Q2 “ “ “
“ “ “ 104 OUT “ 2.4 V IN 5.0 V 2.4 V “ Clk 2 to Q2 “ “ “
10 FMAX (Fig. 7) 6/ 105 2.4 V OUT 2.4 V “ IN 5.0 V “ Q1 10 MHz
TC = 125°C “ “ 106 2.4 V OUT 2.4 V “ IN 5.0 V “ Q1 “ “
“ “ “ 107 OUT “ 2.4 V IN 5.0 V 2.4 V “ Q2 “ “
“ “ “ 108 OUT “ 2.4 V IN 5.0 V 2.4 V “ Q2 “ “
“ tPLH 3003
(Fig 6) 109 2.4 V OUT GND “ A IN “ Clr 1 to Q1 5 39 ns
“ tPLH “ 110 OUT “ 2.4 V A IN GND “ Clr 2 to Q2 “ 39 “
“ tPHL “ 111 2.4 V OUT GND “ A IN “ Clr 1 to Q1 “ 50 “
“ tPHL “ 112 OUT “ 2.4 V A IN GND “ Clr 2 to Q2 “ 50 “
“ tPLH 3003 113 2.4 V OUT 2.4 V “ IN 5.0 V “ Clk 1 to Q1 5 39 ns
“ “ (Fig 7) 114 2.4 V OUT 2.4 V “ IN 5.0 V “ Clk 1 to Q1 “ “ “
“ “ “ 115 OUT “ 2.4 V IN 5.0 V 2.4 V “ Clk 2 to Q2 “ “ “
“ “ “ 116 OUT “ 2.4 V IN 5.0 V 2.4 V “ Clk 2 to Q2 “ “ “
“ tPHL “ 117 2.4 V OUT 2.4 V “ IN 5.0 V “ Clk 1 to Q1 “ 50 “
“ “ “ 118 2.4 V OUT 2.4 V “ IN 5.0 V “ Clk 1 to Q1 “ “ “
“ “ “ 119 OUT “ 2.4 V IN 5.0 V 2.4 V “ Clk 2 to Q2 “ “ “
“ “ “ 120 OUT “ 2.4 V IN 5.0 V 2.4 V “ Clk 2 to Q2 “ “ “
11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
See notes at end of device type 03.
MIL-M-38510/2G
45
NOTES:
A = Normal clock pulse.
B = Momentary GND, then 4.5 V.
C = This note has been deleted.
D = Momentary 4.5 V, then GND.
E = Momentary ground, then 2.4 V.
F = Momentary ground, then 5.5 V.
* After clock pulse apply –12 mA to clock pin to insure Q is still in the low state (see figure 15).
** Test time limit ≤100 ms.
1/ Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum.
3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b)
H ≥ 1.5 V and L < 1.5 V when using a high speed checker single comparator.
4/ Tests shall be performed in sequence.
5/ One normal clock pulse, then 4.5 V.
6 FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
7/ For CKT A, IIH3 limits are 0 to 120 µA.
46
MIL-M-38510/2G
TABLE III. Group A inspection for device type 04. 1/
Case E & F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Test limits Subgroup Symbol MIL-
STD-883
method Test No. Clock 1 Preset 1 Clear 1 J1 VCC Clock 2 Preset 2 Clear 2 J2 Q2 Q2 K2 GND
Q1
Q1 K1
Meas.
terminal Min Max Unit
1 VOH 3006 1 A 2.0 V 4.5 V GND -.4 mA 0.8 V Q1 2.4 V
TC = 25°C “ “ 2 A 0.8 V “ “ -.4 mA 2.0 V Q1 “ “
“ “ “ 3 2.0 V 0.8 V “ “ -.4 mA Q1 “ “
“ “ “ 4 0.8 V 2.0 V “ “ -.4 mA Q1 “ “
“ “ “ 5 “ A 2.0 V -.4 mA 0.8 V “ Q2 “ “
“ “ “ 6 “ A 0.8 V -.4 mA 2.0 V “ Q2 “ “
“ “ “ 7 “ 2.0 V 0.8 V -.4 mA “ Q2 “ “
“ “ “ 8 “ 0.8 V 2.0 V -.4 mA “ Q2 “ “
“ VOL 3007 9 A 0.8 V “ “ 16 mA 2.0 V Q1 0.4 “
“ “ “ 10 A 2.0 V “ “ 16 mA 0.8 V Q1 “ “
“ “ “ 11 0.8 V 2.0 V “ “ 16 mA Q1 “ “
“ “ “ 12 2.0 V 0.8 V “ “ 16 mA Q1 “ “
“ “ “ 13 “ A 0.8 V 16 mA 2.0 V “ Q2 “ “
“ “ “ 14 “ A 2.0 V 16 mA 0.8 V “ Q2 “ “
“ “ “ 15 “ 0.8 V 2.0 V 16 mA “ Q2 “ “
“ “ “ 16 “ 2.0 V 0.8 V 16 mA “ Q2 “ “
“ VIC 17 -12 mA “ “ J1 -1.5 “
“ “ 18 “ “ -12 mA K1 “ “
“ “ 19 “ -12 mA “ J2 “ “
“ “ 20 “ -12 mA “ K2 “ “
“ “ 21 -12 mA “ “ Clock 1 “ “
“ “ 22 -12 mA “ “ Preset 1 “ “
“ “ 23 -12 mA “ “ Clear 1 “ “
“ “ 24 “ -12 mA “ Clock 2 “ “
“ “ 25 “ -12 mA “ Preset 2 “ “
“ “ 26 “ -12 mA “ Clear 2 “ “
“ IIL1 3009 27 4.5 V B 0.4 V 5.5 V “ J1 -0.7 -1.6 mA
“ “ “ 28 4.5 V B 4.5 V “ “ 0.4 V K1 “ “ “
“ “ “ 29 “ 4.5 V B 0.4 V “ J2 “ “ “
“ “ “ 30 “ 4.5 V B 4.5 V 0.4 V “ K2 “ “ “
“ IIL2 “ 31 0.4 V B 4.5 V “ “ 4.5 V Clock 1 -1.25 -3.2 “
“ “ “ 32 0.4 V B 4.5 V “ “ 4.5 V Clock 1 “ “ “
“ “ “ 33 “ 0.4 V B 4.5 V 4.5 V “ Clock 2 “ “ “
“ “ “ 34 “ 0.4 V B 4.5 V 4.5 V “ Clock 2 “ “ “
“ IIL3 “ 35 A, C 4.5 V 0.4 V 4.5 V “ “ 4.5 V Clear 1 -0.7 -1.6 “
“ “ “ 35 B 4.5 V 0.4 V 4.5 V “ “ 4.5 V Clear 1 -1.4 -3.2 “
“ “ “ 36 A, C 4.5 V 0.4 V 4.5 V “ “ 4.5 V Preset 1 -0.7 -1.6 “
“ “ “ 36 B 4.5 V 0.4 V 4.5 V “ “ 4.5 V Preset 1 -1.4 -3.2 “
“ “ “ 37 A, C “ 4.5 V 0.4 V 4.5 V 4.5 V “ Clear 2 -0.7 -1.6 “
“ “ “ 37 B “ 4.5 V 0.4 V 4.5 V 4.5 V “ Clear 2 -1.4 -3.2 “
“ “ “ 38 A, C “ 4.5 V 0.4 V 4.5 V 4.5 V “ Preset 2 -0.7 -1.6 “
“ “ “ 38 B “ 4.5 V 0.4 V 4.5 V 4.5 V “ Preset 2 -1.4 -3.2 “
“ IIH1 3010 39 GND GND 2.4 V “ “ J1 40 µA
“ “ “ 40 GND GND “ “ 2.4 V K1 “ “
“ “ “ 41 “ GND GND 2.4 V “ J2 “ “
“ “ “ 42 “ GND GND 2.4 V “ K2 “ “
“ IIH2 “ 43 GND GND 5.5 V “ “ J1 100 “
“ “ “ 44 GND GND “ “ 5.5 V K1 “ “
“ “ “ 45 “ GND GND 5.5 V “ J2 “ “
“ “ “ 46 “ GND GND 5.5 V “ K2 “ “
See notes at end of device type 04.
MIL-M-38510/2G
47
TABLE III. Group A inspection for device type 04. 1/ - Continued.
Case E & F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Test limits Subgroup Symbol MIL-
STD-883
method Test No. Clock 1 Preset 1 Clear 1 J1 VCC Clock 2 Preset 2 Clear 2 J2 Q2 Q2 K2 GND
Q1
Q1 K1
Meas.
terminal Min Max Unit
1 IIH3 3010 47 GND E GND 5.5 V GND 4.5 V Clear 1 160 µA
TC = 25°C “ “ 48 GND E 4.5 V “ “ GND Preset 1 “ “
“ “ “ 49 “ GND E GND 4.5 V “ Clear 2 “ “
“ “ “ 50 “ GND E 4.5 V GND “ Preset 2 “ “
“ IIH4 “ 51 GND F GND “ “ 4.5 V Clear 1 200 “
“ “ “ 52 GND F 4.5 V “ “ GND Preset 1 “ “
“ “ “ 53 “ GND F GND 4.5 V “ Clear 2 “ “
“ “ “ 54 “ GND F 4.5 V GND “ Preset 2 “ “
“ “ “ 55 5.5 V GND GND “ “ GND Clock 1 “ “
“ “ “ 56 “ 5.5 V GND GND GND “ Clock 2 “ “
“ IIH5 “ 57 CKT A, C 2.4 V GND GND “ “ GND Clock 1 -50 -700 “
“ “ “ 57 CKT B 2.4 V GND GND “ “ GND Clock 1 -200 -850 “
“ “ “ 58 CKT A, C “ 2.4 V GND GND GND “ Clock 2 -50 -700 “
“ “ “ 58 CKT B “ 2.4 V GND GND GND “ Clock 2 -200 -850 “
“ IOS 3011 59 ** 2.4 V GND 4.5 V 2.4 V “ “ GND 2.4 V Q1 -20 -57 mA
“ “ “ 60 2.4 V 4.5 V GND 2.4 V “ “ GND 2.4 V Q1 “ “ “
“ “ “ 61** “ 2.4 V GND 4.5 V 2.4 V GND 2.4 V “ Q2 “ “ “
“ “ “ 62 “ 2.4 V 4.5 V GND 2.4 V GND 2.4 V “ Q2 “ “ “
“ ICC 3005 63 GND 4.5 V GND GND “ GND 4.5 V GND GND GND “ GND VCC 40 “
“ ICC 3005 64 GND GND 4.5 V GND “ GND GND 4.5 V GND GND “ GND VCC 40 “
2 Same tests, terminal conditions and limits as for subgroup 1, except TC = 125ºC and VIC tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except TC = -55ºC and VIC tests are omitted.
7 2/ 4/ 65 B A B A 4.5 V B A B A H 3/ L 3/ B GND H 3/ L 3/ B All H or L
TC = 25°C 66 A A B A “ A A B A H L B “ H L B output as shown 3/
“ 67 B A B A “ B A B A H L B “ H L B " “
“ 68 B A B A “ B A B A H L A “ H L A " “
“ 69 A A B A “ A A B A H L A “ H L A " “
“ 70 B A B A “ B A B A H L A “ H L A " “
“ 71 B B A A “ B B A A L H A “ L H A " “
“ 72 A B A A “ A B A A L H A “ L H A " “
“ 73 B B A A “ B B A A L H A “ L H A " “
“ 74 B B A B “ B B A B L H A “ L H A " “
“ 75 A B A B “ A B A B L H A “ L H A " “
“ 76 B B A B “ B B A B L H A “ L H A " “
“ 77 B A A B “ B A A B L H B “ L H B " “
“ 78 A A A B “ A A A B L H B “ L H B " “
“ 79 B A A B “ B A A B L H B “ L H B " “
“ 80 B A B B “ B A B B H L B “ H L B " “
“ 81 B A A B “ B A A B H L B “ H L B " “
“ 82 A A A B “ A A A B H L B “ H L B " “
“ 83 B A A B “ B A A B H L B “ H L B " “
“ 84 B A A A “ B A A A H L B “ H L B " “
“ 85 A A A A “ A A A A H L B “ H L B " “
“ 86 B A A A “ B A A A L H B “ L H B " “
See notes at end of device type 04.
MIL-M-38510/2G
48
TABLE III. Group A inspection for device type 04. 1/ - Continued.
Case E & F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Test limits Subgroup Symbol MIL-
STD-883
method Test No. Clock 1 Pre set 1 Clear 1 J1 VCC Clock 2 Preset 2 Clear 2 J2 Q2 Q2 K2 GND
Q1
Q1 K1
Meas.
terminal Min Max Unit
7 2/ 4/ 87 B A A B 4.5 V B A A B L 3/ H 3/ A GND L 3/ H 3/ A All H or L
TC = 25°C 88 A A A B “ A A A B L H A “ L H A Output as shown 3/
“ 89 B A A B “ B A A B H L A “ H L A “ “
“ 90 B A A A “ B A A A H L A “ H L A “ “
“ 91 A A A A “ A A A A H L A “ H L A “ “
“ 92 B A A A “ B A A A L H A “ L H A “ “
“ 93 A A A A “ A A A A L H A “ L H A “ “
“ 94 B A A A “ B A A A H L A “ H L A “ “
“ 95 A B B B “ A B B B H H B “ H H B “ “
“ 96 A B A A “ A B A A L H A “ L H A “ “
“ 97 A A A A “ A A A A L H A “ L H A “ “
“ 98 A A A A “ A A A A L H B “ L H B “ “
“ 99 A A A B “ A A A B L H B “ L H B “ “
“ 100 B A A B “ B A A B H L B “ H L B “ “
“ 101 A A A A “ A A A A H L A “ H L A “ “
“ 102 A A A B “ A A A B H L A “ H L A “ “
“ 103 A A A B “ A A A B H L B “ H L B “ “
“ 104 B A A B “ B A A B L H B “ L H B “ “
8 2/ 4/ Same tests, terminal conditions and limits as for subgroup 7, except TC = 125ºC and -55ºC.
9 FMAX (Fig. 9) 105 IN 5.0 V 2.4 V 5.0 V GND OUT 2.4 V Q1 10 MHz
TC = 25°C “ 5/ 106 IN 5.0 V 2.4 V “ “ OUT 2.4 V Q1 “ “
“ “ “ 107 “ IN 5.0 V 2.4 V OUT 2.4 V “ Q2 “ “
“ “ “ 108 “ IN 5.0 V 2.4 V OUT 2.4 V “ Q2 “ “
“ tPLH1 3003
(Fig 8) 109 2.4 V 5.0 V IN 2.4 V “ “ OUT 2.4 V Clear 1
to Q1
5 25 ns
“ “ “ 110 2.4 V IN 5.0 V 2.4 V “ “ OUT 2.4 V Preset 1
to Q1 “ “ “
“ “ “ 111 “ 2.4 V 5.0 V IN 2.4 V OUT 2.4 V “ Clear 2
to Q2
“ “ “
“ “ “ 112 “ 2.4 V IN 5.0 V 2.4 V OUT 2.4 V “ Preset 2
to Q2 “ “ “
“ tPHL1 “ 113 2.4 V 5.0 V IN 2.4 V “ “ OUT 2.4 V Clear 1
to Q1 “ 40 “
“ “ “ 114 2.4 V IN 5.0 V 2.4 V “ “ OUT 2.4 V Preset 1
to Q1
“ “ “
“ “ “ 115 “ 2.4 V 5.0 V IN 2.4 V OUT 2.4 V “ Clear 2
to Q2 “ “ “
“ “ “ 116 “ 2.4 V IN 5.0 V 2.4 V OUT 2.4 V “ Preset 2
to Q2
“ “ “
“ tPLH2 3003
(Fig 9) 117 IN 5.0 V 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1 5 30 ns
“ “ “ 118 IN 5.0 V 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1
“ “ “
“ “ “ 119 “ IN 5.0 V 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2 “ “ “
“ “ “ 120 “ IN 5.0 V 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2
“ “ “
“ tPHL2 “ 121 IN 5.0 V 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1 “ 40 “
See notes at end of device type 04.
MIL-M-38510/2G
49
TABLE III. Group A inspection for device type 04. 1/ - Continued.
Case E & F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Test limits Subgroup Symbol MIL-
STD-883
method Test No. Clock 1 Pre set 1 Clear 1 J1 VCC Clock 2 Preset 2 Clear 2 J2 Q2 Q2 K2 GND
Q1
Q1 K1
Meas.
terminal Min Max Unit
9
TC = 25°C tPHL2 3003
(Fig 8) 122 IN 5.0 V 2.4 V 5.0 V GND OUT OUT 2.4 V Cl ock 1
to Q1
5 40 ns
“ “ “ 123 “ IN 5.0 V 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2 “ “ “
“ “ “ 124 “ IN 5.0 V 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2
“ “ “
10 FMAX 5/ (Fig 9) 125 IN 5.0 V 2.4 V “ “ OUT 2.4 V Q1 10 MHz
TC = 125°C “ “ 126 IN 5.0 V 2.4 V “ “ OUT 2.4 V Q1 “ “
“ “ “ 127 “ IN 5.0 V 5.0 V 2.4 V OUT 2.4 V “ Q2 “ “
“ “ “ 128 “ IN 5.0 V 5.0 V 2.4 V OUT 2.4 V “ Q2 “ “
“ tPLH1 3003
(Fig 8) 129 2.4 V 5.0 V IN 2.4 V “ “ OUT 2.4 V Clear 1
to Q1
5 39 ns
“ “ “ 130 2.4 V IN 5.0 V 2.4 V “ “ OUT 2.4 V Preset 1
to Q1 “ “ “
“ “ “ 131 “ 2.4 V 5.0 V IN 2.4 V OUT 2.4 V “ Clear 2
to Q2
“ “ “
“ “ “ 132 “ 2.4 V IN 5.0 V 2.4 V OUT 2.4 V “ Preset 2
to Q2 “ “ “
“ tPHL1 “ 133 2.4 V 5.0 V IN 2.4 V “ “ OUT 2.4 V Clear 1
to Q1 “ 50 “
“ “ “ 134 2.4 V IN 5.0 V 2.4 V “ “ OUT 2.4 V Preset 1
to Q1
“ “ “
“ “ “ 135 “ 2.4 V 5.0 V IN 2.4 V OUT 2.4 V “ Clear 2
to Q2 “ “ “
“ “ “ 136 “ 2.4 V IN 5.0 V 2.4 V OUT 2.4 V “ Preset 2
to Q2
“ “ “
“ tPLH2 3003
(Fig 9) 137 IN 5.0 V 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1 5 39 ns
“ “ “ 138 IN 5.0 V 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1
“ “ “
“ “ “ 139 “ IN 5.0 V 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2 “ “ “
“ “ “ 140 “ IN 5.0 V 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2
“ “ “
“ tPHL2 “ 141 IN 5.0 V 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1 “ 50 “
“ “ “ 142 IN 5.0 V 5.0 V 2.4 V “ “ OUT 2.4 V Clock 1
to Q1
“ “ “
“ “ “ 143 “ IN 5.0 V 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2 “ “ “
“ “ “ 144 “ IN 5.0 V 5.0 V 2.4 V OUT 2.4 V “ Clock 2
to Q2
“ “ “
11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
See notes at end of device type 04.
MIL-M-38510/2G
50
NOTES:
A = Normal clock pulse.
B = Momentary GND, then 4.5 V.
C = This note has been deleted.
E = Momentary ground, then 2.4 V.
F = Momentary ground, then 5.5 V.
** = Test time limit ≤ 100 ms.
J = This note has been deleted.
1/ Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open.)
2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum.
3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b)
H ≥ 1.5 V and L < 1.5 V when using a high speed checker single comparator.
4/ Tests shall be performed in sequence.
5 FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
MIL-M-38510/2G
51
TABLE III. Group A inspection for device type 05. 1/
Case A, B D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Case C 3 2 1 14 13 12 11 10 9 8 7 6 5 4 T est limits Subgroup Symbol MIL-STD-
883
method Test No. Clock 1 D1 Clear 1 VCC Clear 2 D2 Clock
2 Preset
2 Q2 Q2 GND Q1
Q1 Preset
1
Meas.
terminal Min Max Unit
1 VOH 3006 1 A 2.0 V 4.5 V GND -.4 mA Q1 2.4 V
TC = 25°C “ “ 2 A 0.8 V “ “ -.4 mA Q1 “ “
“ “ “ 3 GND 0.8 V “ “ -.4 mA GND Q1 “ “
“ “ “ 4 GND “ “ -.4 mA 0.8 V Q1 “ “
“ “ “ 5 “ 2.0 V A -.4 mA “ Q2 “ “
“ “ “ 6 “ 0.8 V A -.4 mA “ Q2 “ “
“ “ “ 7 “ 0.8 V GND GND -.4 mA “ Q2 “ “
“ “ “ 8 “ GND 0.8 V -.4 mA “ Q2 “ “
“ VOL 3007 9 A 2.0 V “ “ 16 mA Q1 0.4 “
“ “ “ 10 A 0.8 V “ “ 16 mA Q1 “ “
“ “ “ 11 0.8 V “ “ 16 mA 2.0 V Q1 “ “
“ “ “ 12 2.0 V “ “ 16 mA 0.8 V Q1 “ “
“ “ “ 13 “ 2.0 V A 16 mA “ Q2 “ “
“ “ “ 14 “ 0.8 V A 16 mA “ Q2 “ “
“ “ “ 15 “ 0.8 V 2.0 V 16 mA “ Q2 “ “
“ “ “ 16 “ 2.0 V 0.8 V 16 mA “ Q2 “ “
“ VIC 17 -12 mA “ “ D1 -1.5 “
“ “ 18 -12 mA “ “ Clock 1 “ “
“ “ 19 -12 mA “ “ Clear 1 “ “
“ “ 20 “ “ -12 mA Preset 1 “ “
“ “ 21 “ -12 mA “ D2 “ “
“ “ 22 “ -12 mA “ Clock 2 “ “
“ “ 23 “ -12 mA “ Clear 2 “ “
“ “ 24 “ -12 mA “ Preset 2 “ “
“ IIL1 3009 25 4.5 V 0.4 V 4.5 V 5.5 V “ GND D1 -0.7 -1.6 mA
“ “ “ 26 “ 4.5 V 0.4 V 4.5 V GND “ D2 -0.7 -1.6 “
“ “ “ 27 GND GND GND “ “ 0.4 V Preset 1 -1.4 -3.2 “
“ “ “ 28 “ GND GND GND 0.4 V “ Preset 2 -1.4 -3.2 “
“ IIL2 “ 29 0.4 V GND 4.5 V “ “ GND Clock 1 -1.4 -3.2 “
“ “ “ 30 7/ 4.5 V 4.5 V 0.4 V “ “ GND Clear 1 -2.1 -4.8 “
“ “ “ 31 “ 4.5 V GND 0.4 V GND “ Clock 2 -1.4 -3.2 “
“ “ “ 32 7/ “ 0.4 V 4.5 V 4.5 V GND “ Clear 2 -2.1 -4.8 “
“ IIH1 3010 33 4.5 V 2.4 V GND “ “ 4.5 V D1 40
µA
“ IIH1 “ 34 “ GND 2.4 V 4.5 V 4.5 V “ D2 40 “
“ IIH2 “ 35 4.5 V 5.5 V GND “ “ 4.5 V D1 100 “
“ IIH2 “ 36 “ GND 5.5 V 4.5 V 4.5 V “ D2 100 “
“ IIH3 “ 37 2.4 V 4.5 V GND “ “ 4.5 V Clock 1 80 “
“ “ “ 38 B 4.5 V 4.5 V “ “ 2.4 V Preset 1 “ “
“ “ “ 39 “ GND 4.5 V 2.4 V 4.5 V “ Clock 2 “ “
“ “ “ 40 “ 4.5 V 4.5 V B 2.4 V “ Preset 2 “ “
“ IIH4 “ 41 5.5 V 4.5 V GND “ “ 4.5 V Clock 1 200 “
“ “ “ 42 B 4.5 V 4.5 V “ “ 5.5 V Preset 1 “ “
“ “ “ 43 “ GND 4.5 V 5.5 V 4.5 V “ Clock 2 “ “
“ “ “ 44 “ 4.5 V 4.5 V B 5.5 V “ Preset 2 “ “
“ IIH5 “ 45 B GND 2.4 V “ “ 4.5 V Clear 1 120 “
“ IIH5 “ 46 “ 2.4 V GND B 4.5 V “ Clear 2 120 “
“ IIH6 “ 47 B GND 5.5 V “ “ 4.5 V Clear 1 300 “
“ IIH6 “ 48 “ 5.5 V GND B 4.5 V “ Clear 2 300 “
See notes at end of device type 05.
MIL-M-38510/2G
52
TABLE III. Group A inspection for device type 05. 1/ - Continued.
Case A, B D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Case C 3 2 1 14 13 12 11 10 9 8 7 6 5 4 T est limits Subgroup Symbol MIL-STD-
883
method Test No. Clock 1 D1 Clear 1 VCC Clear 2 D2 Clock Preset
2 Q2 Q2 GND Q1
Q1 Preset
1
Meas.
terminal Min Max Unit
1 IOS 3011 49 5.5 V GND GND GND Q1 -20 -57 mA
TC = 25°C “ “ 50 GND “ “ GND Q1 “ “ “
“ “ “ 51 “ GND GND “ Q2 “ “ “
“ “ “ 52 “ GND GND “ Q2 “ “ “
“ ICC 3005 53 GND GND “ GND GND GND “ GND VCC 30 “
“ ICC 3005 54 GND GND GND “ GND GND GND “ V
CC 30 “
2 Same tests, terminal conditions and limits as for subgroup 1, except TC = 125ºC and VIC tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except TC = -55ºC and VIC tests are omitted.
7 2/ 4/ 55 B B B 4.5 V B B B B H 3/ H 3/ GND H 3/ H B All H or L
TC = 25°C 56 B B B “ B B B A L H “ H L A outputs as shown 3/
“ 57 B B A “ A B B A L H “ H L A “ “
“ 58 B B A “ A B B B H L “ L H B “ “
“ 59 A B A “ A B A B H L “ L H B “ “
“ 60 A B B “ B B A B H H “ H H B “ “
“ 61 A A B “ B A A B H H “ H H B “ “
“ 62 A A B “ B A A A L H “ H L A “ “
“ 63 A A A “ A A A A L H “ H L A “ “
“ 64 A A A “ A A A B H L “ L H B “ “
“ 65 A A A “ A A A A H L “ L H A “ “
“ 66 B A A “ A A B A H L “ L H A “ “
“ 67 B B A “ A B B A H L “ L H A “ “
“ 68 A B A “ A B A A L H “ H L A “ “
“ 69 A B A “ A B A B H L “ L H B “ “
“ 70 A A B “ B A A B H H “ H H B “ “
“ 71 A B B “ B B A B H H “ H H B “ “
“ 72 A B B “ B B A A L H “ H L A “ “
“ 73 A B A “ A B A A L H “ H L A “ “
“ 74 B A A “ A A B A L H “ H L A “ “
“ 75 A A A “ A A A A H L “ L H A “ “
“ 76 A A A “ A A A B H L “ L H B “ “
“ 77 A A A “ A A A A H L “ L H A “ “
“ 78 A A B “ B A A A L H “ H L A “ “
“ 79 A A A “ A A A A L H “ H L A “ “
“ 80 A B A “ A B A B H L “ L H B “ “
“ 81 A B A “ A B A A H L “ L H A “ “
“ 82 A B B “ B B A A L H “ H L A “ “
“ 83 A B A “ A B A A L H “ H L A “ “
“ 84 A A A “ A A A A L H “ H L A “ “
8 2/ 4/ Same tests, terminal conditions and limits as for subgroup 7, except TC = 125ºC and -55ºC.
9 FMAX 6/ (Fig. 11) 85 IN E 5.0 V GND OUT 5.0 V Q1 10 MHz
TC = 25°C “ “ 86 IN E “ “ OUT 5.0 V Q1 “ “
“ “ “ 87 “ E IN 5.0 V OUT “ Q2 “ “
“ “ “ 88 “ E IN 5.0 V OUT “ Q2 “ “
See notes at end of device type 05.
MIL-M-38510/2G
53
TABLE III. Group A inspection for device type 05. 1/ - Continued.
Case A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits
Case C 3 2 1 14 13 12 11 10 9 8 7 6 5 4
Subgroup Symbol MIL-
STD-883
method Test No. Clock 1 D1 Clear 1 VCC Clear 2 D2 Clock 2 Preset 2 Q2 Q2 GND Q1 Q1 Preset 1
Meas.
terminal Min Max Unit
9
TC = 25°C tPLH1 3003
(Fig 10) 89 IN 5.0 V GND OUT J Clear 1
to Q1
5 25 ns
“ “ “ 90 J “ “ OUT IN Preset 1
to Q1 “ “ “
“ “ “ 91 “ IN J OUT “ Clear 2
to Q2
“ “ “
“ “ “ 92 “ J IN OUT “ Preset 2
to Q2 “ 40 “
“ tPHL1 “ 93 IN “ “ OUT J Clear 1
to Q1 “ “ “
“ “ “ 94 J “ “ OUT IN Preset 1
to Q1
“ “ “
“ “ “ 95 “ IN J OUT “ Clear 2
to Q2 “ “ “
“ “ “ 96 “ J IN OUT “ Preset 2
to Q2
“ “ “
“ tPLH2 3003 5/
(Fig 11) 97 IN IN (A) B “ “ OUT 5.0 V Clock 1
to Q1 5 30 ns
“ “ (Fig 12) 98 IN IN (A) 5.0 V “ “ OUT B Clock 1
to Q1
“ “ “
“ “ (Fig 11) 99 “ B IN (A) IN 5.0 V OUT “ Clock 2
to Q2 “ “ “
“ “ (Fig 12) 100 “ 5.0 V IN (A) IN B OUT “ Clock 2
to Q2
“ “ “
“ tPHL2 (Fig 12) 101 IN IN (B) 5.0 V “ “ OUT B Clock 1
to Q1 “ 40 “
“ “ (Fig 11) 102 IN IN (B) B “ “ OUT 5.0 V Clock 1
to Q1
“ “ “
“ “ (Fig 12) 103 “ 5.0 V IN (B) IN B OUT “ Clock 2
to Q2 “ “ “
“ “ (Fig 11) 104 “ B IN (B) IN 5.0 V OUT “ Clock 2
to Q2
“ “ “
10
TC = 125°C FMAX 6/ (Fig 11) 105 IN E “ “ OUT 5.0 V Q1 10 “ MHz
“ “ 106 IN E “ “ OUT 5.0 V Q1 “ “ “
“ “ “ 107 “ E IN 5.0 V OUT “ Q2 “ “ “
“ “ “ 108 “ E IN 5.0 V OUT “ Q2 “ “
“ tPLH1 3003
(Fig 10) 109 IN “ “ OUT J Clear 1
to Q1
5 39 ns
“ “ “ 110 J “ “ OUT IN Preset 1
to Q1 “ “ “
“ “ “ 111 “ IN J OUT “ Clear 2
to Q2
“ “ “
“ “ “ 112 “ J IN OUT “ Preset 2
to Q2 “ “ “
“ tPHL1 “ 113 IN “ “ OUT J Clear 1
to Q1 “ 50 “
“ “ “ 114 J “ “ OUT IN Preset 1
to Q1
“ “ “
“ “ “ 115 “ IN J OUT “ Clear 2
to Q2 “ “ “
“ “ “ 116 “ J IN OUT “ Preset 2
to Q2
“ “ “
MIL-M-38510/2G
54
See notes at end of device type 05.
TABLE III. Group A inspection for device type 05. 1/ - Continued.
Case A, B, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Test limits
Case C
Subgroup Symbol MIL-
STD-883
method Test No. Clock 1 D1 Clear 1 VCC Clear 2 D2 Clock 2 Preset 2 Q2 Q2 GND Q1 Q1 Preset 1
Meas.
terminal Min Max Unit
10
TC = 125°C tPLH2 3003 5/
(Fig 11) 117 IN IN (A) B “ “ OUT 5.0 V Clock 1
to Q1 5 39 ns
“ (Fig 12) 118 IN IN (A) 5.0 V “ “ OUT B Clock 1
to Q1
“ “ “
“ “ (Fig 11) 119 “ B IN (A) IN 5.0 V OUT “ Clock 2
to Q2 “ “ “
“ “ (Fig 12) 120 “ 5.0 V IN (A) IN B OUT “ Clock 2
to Q2
“ “ “
“ tPHL2 (Fig 12) 121 IN IN (B) 5.0 V “ “ OUT B Clock 1
to Q1 “ 40 “
“ “ (Fig 11) 122 IN IN (B) B “ “ OUT 5.0 V Clock 1
to Q1
“ “ “
“ “ (Fig 12) 123 “ 5.0 V IN (B) IN B OUT “ Clock 2
to Q2 “ “ “
“ “ (Fig 11) 124 “ B IN (B) IN 5.0 V OUT “ Clock 2
to Q2
“ “ “
11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
NOTES:
A = Normal clock pulse.
B = Momentary GND, then 4.5 V.
E = Input D connected to Q.
J = Input pulse, tp ≥ 100 ns, PRR = 1 MHz, VOL = 0 V, VOH = 4.5 V.
1/ Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum.
3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b)
H ≥ 1.5 V and L < 1.5 V when using a high speed checker single comparator.
4/ Tests shall be performed in sequence .
5/ Tests shall be performed for bot h D input p ul ses (A and B).
6 FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
7/ CKT C limits are –0.7 to -4.8 mA for these tests.
MIL-M-38510/2G
55
TABLE III. Group A inspection for device type 06. 1/
Case A, B D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Case C 10 12 13 14 2 1 3 4 5 6 7 8 9 11 Test limits Subgroup Symbol MIL-STD-
883
method Test No. K1 Clock P reset VCC Clear NC J1 J2 J* Q GND Q K* K2
Meas.
terminal Min Max Unit
1 VOH 3006 1 0.8 V A 4.5 V 2.0 V 2.0 V 0.8 V GND -.4 mA 2.0 V 0.8 V Q 2.4 V
TC = 25°C “ “ 2 2.0 V A “ 0.8 V 0.8 V 2.0 V -.4 mA “ 0.8 V 2.0 V Q “ “
“ “ “ 3 GND 2.0 V “ 0.8 V GND -.4 mA “ GND Q “ “
“ “ “ 4 GND 0.8 V “ 2.0 V GND “ -.4 mA GND Q “ “
“ VOL 3007 5 2.0 V A “ 0.8 V 0.8 V 2.0 V “ 16 mA 0.8 V 2.0 V Q 0.4 “
“ “ “ 6 0.8 V A “ 2.0 V 2.0 V 0.8 V 16 mA “ 2.0 V 0.8 V Q “ “
“ “ “ 7 GND 0.8 V “ 2.0 V GND 16 mA “ Q “ “
“ “ “ 8 GND 2.0 V “ 0.8 V GND “ 16 mA Q “ “
“ VIC 9 “ -12 mA “ J1 -1.5 “
“ “ 10 “ -12 mA “ J2 “ “
“ “ 11 “ -12 mA “ J* “ “
“ “ 12 -12 mA “ “ K1 “ “
“ “ 13 “ “ -12 mA K2 “ “
“ “ 14 “ “ -12 mA K* “ “
“ “ 15 -12 mA “ “ Clock “ “
“ “ 16 -12 mA “ “ Preset “ “
“ “ 17 “ -12 mA “ Clear “ “
“ IIL1 3009 18 GND 5.5 V B 0.4 V 4.5 V 0.4 V “ J1 -0.7 -1.6 mA
“ “ “ 19 GND “ B 4.5 V 0.4 V 0.4 V “ J2 “ “ “
“ “ “ 20 “ 0.4 V “ J* “ “ “
“ “ “ 21 0.4 V GND B “ “ 0.4 V 4.5 V K1 “ “ “
“ “ “ 22 4.5 V GND B “ “ 0.4 V 0.4 V K2 “ “ “
“ “ “ 23 “ “ 0.4 V K* “ “ “
“ “ “ 24 0.4 V “ “ Clock “ “ “
“ “ “ 25 4.5 V GND 0.4 V “ “ 0.4 V 4.5 V Preset “ “ “
“ “ “ 26 GND “ 0.4 V 4.5 V 4.5 V 0.4 V “ Clear “ “ “
“ IIH1 3010 27 “ GND 2.4 V GND 4.5 V “ J1 40 µA
“ “ “ 28 “ GND GND 2.4 V 4.5 V “ J2 “ “
“ “ “ 29 “ 2.4 V “ J* “ “
“ “ “ 30 2.4 V GND “ “ 4.5 V GND K1 “ “
“ “ “ 31 GND GND “ “ 4.5 V 2.4 V K2 “ “
“ “ “ 32 “ “ 2.4 V K* “ “
“ “ “ 33 2.4 V “ “ Clock “ “
“ IIH2 “ 34 “ GND 5.5 V GND 4.5 V “ J1 100 “
“ “ 35 “ GND GND 5.5 V 4.5 V “ J2 “ “
“ “ 36 “ 5.5 V “ J* “ “
“ “ “ 37 5.5 V GND “ “ 4.5 V GND K1 “ “
“ “ “ 38 GND GND “ “ 4.5 V 5.5 V K2 “ “
“ “ “ 39 “ “ 5.5 V K* “ “
“ “ “ 40 5.5 V “ “ Clock “ “
“ IIH3 “ 41 GND A 2.4 V “ 4.5 V 4.5 V GND “ 4.5 V GND Preset 80 “
“ “ “ 42 4.5 V A “ 2.4 V GND GND 4.5 V “ GND 4.5 V Clear 80 “
“ IIH4 “ 43 GND A 5.5 V “ 4.5 V 4.5 V GND “ 4.5 V GND Preset 200 “
“ “ “ 44 4.5 V A “ 5.5 V GND GND 4.5 V “ GND 4.5 V Clear 200 “
“ IOS 3011 45 GND GND “ GND “ GND GND Q -20 -57 mA
“ “ “ 46 GND “ GND GND GND “ GND Q -20 -57 “
“ ICC 3005 47 “ GND “ V
CC 30 “
“ “ “ 48 GND “ “ V
CC 30 “
2 Same tests, terminal conditions and limits as for subgroup 1, except TC = 125ºC and VIC tests are omitted.
3 Same tests, terminal conditions and limits as for subgroup 1, except TC = -55ºC and VIC tests are omitted.
See notes at end of device type 06.
56
MIL-M-38510/2G
TABLE III. Group A inspection for device type 06. 1/ - Continued.
Case A, B D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Case C 10 12 13 14 2 1 3 4 5 6 7 8 9 11 Test limits Subgroup Symbol MIL-STD-
883
method Test No. K1 Clock P reset VCC Clear NC J1 J2 J* Q GND Q K* K2
Meas.
terminal Min Max Unit
7 2/ 4/ 49 B B A 4.5 V B B B B A H 3/ GND L 3/ A B All H or L
TC = 25°C 50 B B B “ A B B B A L “ H A B output as shown 3/
“ 51 B B A “ A B B B A L “ H B A “ “
“ 52 B A A “ A B B B A L “ H B A “ “
“ 53 B B A “ A B B B A L “ H B A “ “
“ 54 A B A “ A B B B A L “ H B B “ “
“ 55 A A A “ A B B B A L “ H B B “ “
“ 56 A B A “ A B B B A L “ H B B “ “
“ 57 A B A “ A B B B A L “ H A A “ “
“ 58 A A A “ A B B B A L “ H A A “ “
“ 59 A B A “ A B B B A L “ H A A “ “
“ 60 A B A “ B B B B A H “ L A A “ “
“ 61 B B A “ A B A B B H “ L A B “ “
“ 62 B A A “ A B A B B H “ L A B “ “
“ 63 B B A “ A B A B B H “ L A B “ “
“ 64 B B A “ A B B A B H “ L A B “ “
“ 65 B A A “ A B B A B H “ L A B “ “
“ 66 B B A “ A B B A B H “ L A B “ “
“ 67 B B A “ A B A A A H “ L A B “ “
“ 68 B A A “ A B A A A H “ L A B “ “
“ 69 B B A “ A B A A A H “ L A B “ “
“ 70 A B A “ A B A A B H “ L B A “ “
“ 71 A A A “ A B A A B L “ H B A “ “
“ 72 A B A “ A B A A B L “ H B A “ “
“ 73 A A A “ A B A A B H “ L B A “ “
“ 74 A B A “ A B A A B H “ L B A “ “
“ 75 A B A “ B B A A B H “ L B A “ “
“ 76 A A A “ B B A A B H “ L B A “ “
“ 77 A B A “ B B A A B H “ L B A “ “
“ 78 A B B “ B B A A B L “ L B A “ “
“ 79 A A B “ B B A A B L “ L B A “ “
“ 80 A B B “ B B A A B L “ L B A “ “
“ 81 B B A “ B B B B A H “ L A B “ “
“ 82 B B A “ A B B B A H “ L A B “ “
“ 83 B A A “ A B B B A H “ L A B “ “
“ 84 B A B “ A B B B A L “ L A B “ “
“ 85 B B B “ A B B B A L “ H A B “ “
“ 86 B B A “ A B B B A L “ H A B “ “
“ 87 B A A “ A B B B A L “ H A B “ “
“ 88 B A A “ B B B B A L “ L A B “ “
“ 89 B A A “ A B B B A L “ H A B “ “
“ 90 A B A “ A B A A B L “ H B A “ “
“ 91 A B B “ A B A A B L “ H B A “ “
“ 92 A A B “ A B A A B L “ H B A “ “
8 2/ 4/ Same tests, terminal conditions and limits as for subgroup 7, except TC = 125ºC and -55°C.
See notes at end of device type 06.
57
MIL-M-38510/2G
TABLE III. Group A inspection for device type 06. 1/ - Continued.
Case A, B D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Case C 10 12 13 14 2 1 3 4 5 6 7 8 9 11 Test limits Subgroup Symbol MIL-STD-
883
method Test No. K1 Clock Preset VCC Clear NC J1 J2 J* Q GND Q K* K2
Meas.
terminal Min Max Unit
9 FMAX 5/ (Fig. 14) 93 2.4 V IN 5.0 V 5.0 V 5.0 V 2.4 V 2.4 V GND GND OUT GND 2.4 V Q 20 MHz
TC = 25°C FMAX 5/ (Fig. 14) 94 2.4 V IN 5.0 V “ 5.0 V 2.4 V 2.4 V GND OUT “ GND 2.4 V Q 20 MHz
“ tPLH 3003
(Fig. 13) 95 5.0 V 0.8 V IN “ IN 5.0 V 5.0 V GND OUT “ GND 5.0 V Clear to Q 5 50 ns
“ tPLH “ 96 “ “ “ “ “ “ “ “ “ OUT “ “ Preset to Q “ “ “
“ tPHL “ 97 “ “ “ “ “ “ “ “ “ OUT “ “ Clear to Q “ “ “
“ tPHL “ 98 “ “ “ “ “ “ “ “ OUT “ “ “ Preset to Q “ “ “
“ (Fig. 15) 3003 99 2.4 V IN 5.0 V “ 5.0 V 2.4 V 2.4 V GND “ OUT GND 2.4 V Clock to Q 5 50 ns
“ tPLH (Fig. 14) 100 “ “ “ “ “ “ “ “ OUT “ “ “ Clock to Q “ “ “
“ tPHL “ 101 “ “ “ “ “ “ “ “ “ OUT “ “ Clock to Q “ “ “
“ tPHL “ 102 “ “ “ “ “ “ “ “ OUT “ “ “ Clock to Q “ “ “
10 FMAX 5/ (Fig. 14) 103 2.4 V IN 5.0 V “ 5.0 V 2.4 V 2.4 V GND “ OUT GND 2.4 V Q 15 MHz
TC = 125°C FMAX 5/ (Fig. 14) 104 2.4 V IN 5.0 V “ 5.0 V 2.4 V 2.4 V GND OUT “ GND 2.4 V Q 15 MHz
“ tPLH 3003
(Fig. 13) 105 5.0 V 0.8 V IN “ IN 5.0 V 5.0 V GND OUT “ GND 5.0 V Clear to Q 5 62 ns
“ tPLH “ 106 “ “ “ “ “ “ “ “ “ OUT “ “ Preset to Q “ “ “
“ tPHL “ 107 “ “ “ “ “ “ “ “ “ OUT “ “ Clear to Q “ “ “
“ tPHL “ 108 “ “ “ “ “ “ “ “ OUT “ “ “ Preset to Q “ “ “
“ tPLH 3003 109 2.4 V IN 5.0 V “ 5.0 V 5.0 V 5.0 V GND “ OUT GND 2.4 V Clock to Q 5 62 ns
“ tPLH (Fig. 14) 110 “ “ “ “ “ “ “ “ OUT “ “ “ Clock to Q “ “ “
“ tPHL “ 111 “ “ “ “ “ “ “ “ “ OUT “ “ Clock to Q “ “ “
“ tPHL “ 112 “ “ “ “ “ “ “ “ OUT “ “ “ Clock to Q “ “ “
11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
NOTES:
A = Normal clock pulse.
B = Momentary GND, then 4.5 V.
1/ Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum.
3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b)
H ≥ 1.5 V and L < 1.5 V when using a high speed checker single comparator.
4/ Tests shall be performed in sequence .
5 FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
MIL-M-38510/2G
58
TABLE III. Group A inspection for device type 07. 1/
Case A, B D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Case C 3 2 1 14 13 12 11 10 9 8 7 6 5 4 Test limits Subgroup Symbol MIL-STD-
883
method Test No. Clock
1 D1 Clear
1 VCC Clear
2 D2 Clock
2 Preset
2 Q2 Q2 GND Q1
Q1 Preset
1
Meas.
terminal Min Max Unit
1 VOH 3006 1 A 2.0 V 4.5 V GND -.4 mA Q1 2.4 V
TC = 25°C “ “ 2 A 0.8 V “ “ -.4 mA Q1 “ “
“ “ “ 3 0.8 V “ “ -.4 mA 2.0 V Q1 “ “
“ “ “ 4 2.0 V “ “ -.4 mA 0.8 V Q1 “ “
“ “ “ 5 “ 2.0 V A -.4 mA “ Q2 “ “
“ “ “ 6 “ 0.8 V A -.4 mA “
Q2 “ “
“ “ “ 7 “ 0.8 V 2.0 V -.4 mA “
Q2 “ “
“ “ “ 8 “ 2.0 V 0.8 V -.4 mA “ Q2 “ “
“ VOL 3007 9 A 2.0 V “ “ 16 mA Q1 0.4 V “
“ “ “ 10 A 0.8 V “ “ 16 mA Q1 “ “
“ “ “ 11 0.8 V “ “ 16 mA 2.0 V Q1 “ “
“ “ “ 12 2.0 V “ “ 16 mA 0.8 V Q1 “ “
“ “ “ 13 “ 2.0 V A 16 mA “
Q2 “ “
“ “ “ 14 “ 0.8 V A 16 mA “ Q2 “ “
“ “ “ 15 “ 0.8 V 2.0 V 16 mA “ Q2 “ “
“ “ “ 16 “ 2.0 V 0.8 V 16 mA “
Q2 “ “
“ VIC 17 -12 mA “ “ D1 -1.5 “
“ “ 18 -12 mA “ “ Clock 1 “ “
“ “ 19 -12 mA “ “ Clear 1 “ “
“ “ 20 “ “ -12 mA Preset 1 “ “
“ “ 21 “ -12 mA “ D2 “ “
“ “ 22 “ -12 mA “ Clock 2 “ “
“ “ 23 “ -12 mA “ Clear 2 “ “
“ “ 24 “ -12 mA “ Preset 2 “ “
“ IIL1 3009 25 4.5 V 0.4 V 4.5 V 5.5 V “ 0.4 V D 1 -0.5 -1.6 mA
“ “ “ 26 0.4 V 0.4 V 4.5 V “ “ 0.4 V Preset 1 “ “ “
“ “ “ 27 “ 4.5 V 0.4 V 4.5 V 0.4 V “ D 2 “ “ “
“ “ “ 28 “ 4.5 V 0.4 V 0.4 V 0.4 V “ Preset 2 “ “ “
“ IIL2 “ 29 0.4 V 0.4 V 4.5 V “ “ GND Clock 1 -1.0 -3.2 “
“ “ “ 30 0.8 V 4.5 V 0.4 V “ “ 4.5 V Clear 1 “ “ “
“ “ “ 31 “ 4.5 V 0.4 V 0.4 V GND “ Clock 2 “ “ “
“ “ “ 32 “ 0.4 V 4.5 V 0.8 V 4.5 V “ Clear 2 “ “ “
“ IIH1 3010 33 4.5 V 2.4 V GND “ “ GND D1 40
µA
“ “ “ 34 “ GND 2.4 V 4.5 V GND “ D2 40 “
“ IIH2 “ 35 4.5 V 5.5 V GND “ “ GND D1 100 “
“ “ “ 36 “ GND 5.5 V 4.5 V GND “ D2 100 “
“ IIH3 “ 37 2.4 V B “ “ GND Clock 1 80 “
“ “ “ 38 B 4.5 V 4.5 V “ “ 2.4 V Preset 1 “ “
“ “ “ 39 “ B 2.4 V GND “ Clock 2 “ “
“ “ “ 40 “ 4.5 V 4.5 V B 2.4 V “ Preset 2 “ “
“ IIH4 “ 41 5.5 V B “ “ GND Clock 1 200 “
“ “ “ 42 B 4.5 V 4.5 V “ “ 5.5 V Preset 1 “ “
“ “ “ 43 “ B 5.5 V GND “ Clock 2 “ “
“ “ “ 44 “ 4.5 V 4.5 V B 5.5 V “ Preset 2 “ “
“ IIH5 “ 45 GND GND 2.4 V “ “ Clear 1 120 “
“ “ “ 46 “ 2.4 v GND GND “ Clear 2 120 “
“ IIH6 “ 47 GND GND 5.5 V “ “ Clear 1 300 “
“ “ “ 48 “ 5.5 V GND GND “ Clear 2 300 “
See notes at end of device type 07.
59
MIL-M-38510/2G
TABLE III. Group A inspection for device type 07. 1/ - Continued.
Case A, B D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Case C 3 2 1 14 13 12 11 10 9 8 7 6 5 4 Test limits Subgroup Symbol MIL-STD-
883
method Test No. Clock
1 D1 Clear
1 VCC Clear
2 D2 Clock
2 Preset
2 Q2 Q2 GND Q1
Q1 Preset
1
Meas.
terminal Min Max Unit
1 IOS 3011 49 5.5 V GND GND GND Q1 -20 -57 mA
TC = 25°C “ “ 50 GND “ “ GND Q1 “ “ “
“ “ “ 51 “ GND GND “ Q2 “ “ “
“ “ “ 52 “ GND GND “
Q2 “ “ “
“ ICC 3005 53 GND GND “ GND GND GND GND “ GND VCC 30 “
“ ICC 3005 54 GND GND GND “ GND GND GND GND “ V
CC 30 “
2 Same tests, terminal conditions and limits as subgroup 1, except TC = 125ºC and VIC tests are omitted.
3 Same tests, terminal conditions and limits as subgroup 1, except TC = -55ºC and VIC tests are omitted.
7 2/ 4/ 55 B B B 4.5 V B B B B H 3/ H 3/ GND H 3/ H 3/ B All H or L
TC = 25°C 56 B B B “ B B B A L H “ H L A outputs as shown 3/
“ 57 B B A “ A B B A L H “ H L A “ “
“ 58 B B A “ A B B B H L “ L H B “ “
“ 59 A B A “ A B A B H L “ L H B “ “
“ 60 A B B “ B B A B H H “ H H B “ “
“ 61 A A B “ B A A B H H “ H H B “ “
“ 62 A A B “ B A A A L H “ H L A “ “
“ 63 A A A “ A A A A L H “ H L A “ “
“ 64 A A A “ A A A B H L “ L H B “ “
“ 65 A A A “ A A A A H L “ L H A “ “
“ 66 B A A “ A A B A H L “ L H A “ “
“ 67 B B A “ A B B A H L “ L H A “ “
“ 68 A B A “ A B A A L H “ H L A “ “
“ 69 A B A “ A B A B H L “ L H B “ “
“ 70 A A B “ B A A B H H “ H H B “ “
“ 71 A B B “ B B A B H H “ H H B “ “
“ 72 A B B “ B B A A L H “ H L A “ “
“ 73 A B A “ A B A A L H “ H L A “ “
“ 74 B A A “ A A B A L H “ H L A “ “
“ 75 A A A “ A A A A H L “ L H A “ “
“ 76 A A A “ A A A B H L “ L H B “ “
“ 77 A A A “ A A A A H L “ L H A “ “
“ 78 A A B “ B A A A L H “ H L A “ “
“ 79 A A A “ A A A A L H “ H L A “ “
“ 80 A B A “ A B A B H L “ L H B “ “
“ 81 A B A “ A B A A H L “ L H A “ “
8 2/ 4/ Same tests, terminal conditions and limits as for subgroup 7, except TC = 125ºC and -55°C.
See notes at end of device type 07.
60
MIL-M-38510/2G
TABLE III. Group A inspection for device type 07. 1/ - Continued.
Case A, B D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Case C 3 2 1 14 13 12 11 10 9 8 7 6 5 4 Test limits Subgroup Symbol MIL-STD-
883
method Test No. Clock
1 D1 Clear
1 VCC Clear
2 D2 Clock
2 Preset
2 Q2 Q2 GND Q1
Q1 Preset
1
Meas.
terminal Min Max Unit
9 FMAX (Fig. 11) 82 IN E 5.0 V 5.0 V GND OUT 5.0 V Q1 10 MHz
TC = 25°C “ “ 83 IN E 5.0 V “ “ OUT 5.0 V
Q1 “ “
“ “ “ 84 “ 5.0 V E IN 5.0 V OUT “ Q2 “ “
“ “ “ 85 “ 5.0 V E IN 5.0 V OUT “
Q2 “ “
“ tPLH 3003
((Fig. 10) 86 IN “ “ OUT IN Clear 1
to Q1
5 25 ns
“ “ “ 87 IN “ “ OUT IN Preset 1
to Q1 “ “ “
“ “ “ 88 “ IN IN OUT “ Clear 2
to Q2
“ “ “
“ “ “ 89 “ IN IN OUT “ Preset 2
to Q2 “ “ “
“ tPHL “ 90 IN “ “ OUT IN Clear 1
to Q1 “ 33 “
“ “ “ 91 IN “ “ OUT IN Preset 1
to Q1
“ 36 “
“ “ “ 92 “ IN IN OUT “ Clear 2
to Q2
“ 36 “
“ “ “ 93 “ IN IN OUT “ Preset 2
to Q2 “ 33 “
“ tPLH 3003 5/
(Fig. 11) 94 IN IN (A) B “ “ OUT 5.0 V Clock 1
to Q1 5 25 ns
“ “ (Fig. 12) 95 IN IN (A) 5.0 V “ “ OUT B Clock 1
to Q1
“ “ “
“ “ (Fig. 11) 96 “ B IN (A) IN 5.0 V OUT “ Clock 2
to Q2 “ “ “
“ “ (Fig. 12) 97 “ 5.0 V IN (A) IN B OUT “ Clock 2
to Q2
“ “ “
“ tPHL (Fig. 12) 98 IN IN (B) 5.0 V “ “ OUT B Clock 1
to Q1 “ 33 “
“ “ (Fig. 11) 99 IN IN (B) B “ “ OUT 5.0 V Clock 1
to Q1
“ “ “
“ “ (Fig. 12) 100 “ 5.0 V IN (B) IN B OUT “ Clock 2
to Q2 “ “ “
“ “ (Fig. 11) 101 “ B IN (B) IN 5.0 V OUT “ Clock 2
to Q2
“ “ “
See notes at end of device type 07.
61
MIL-M-38510/2G
TABLE III. Group A inspection for device type 07. 1/ - Continued.
Case A, B D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Case C 3 2 1 14 13 12 11 10 9 8 7 6 5 4 Test limits Subgroup Symbol MIL-STD-
883
method Test No. Clock
1 D1 Clear
1 VCC Clear
2 D2 Clock
2 Preset
2 Q2 Q2 GND Q1
Q1 Preset
1
Meas.
terminal Min Max Unit
10 FMAX 6/ (Fig. 11) 102 IN E 5.0 V 5.0 V GND OUT 5.0 V Q1 10 MHz
TC = 125°C “ “ 103 IN E 5.0 V “ “ OUT 5.0 V
Q1 “ “
“ “ “ 104 “ 5.0 V E IN 5.0 V OUT “ Q2 “ “
“ “ “ 105 “ 5.0 V E IN 5.0 V OUT “
Q2 “ “
“ tPLH 3003
((Fig. 10) 106 IN “ “ OUT IN Clear 1
to Q1
5 31 ns
“ “ 107 IN “ “ OUT IN Preset 1
to Q1 “ “
“ “ “ 108 “ IN IN OUT “ Clear 2
to Q2
“ “ “
“ “ “ 109 “ IN IN OUT “ Preset 2
to Q2 “ “ “
“ tPHL “ 110 IN “ “ OUT IN Clear 1
to Q1 “ 39 “
“ “ 111 IN “ “ OUT IN Preset 1
to Q1
“ 42 “
“ “ “ 112 “ IN IN OUT “ Preset 2
to Q2
“ 42 “
“ “ “ 113 “ IN IN OUT “ Clear 2
to Q2 “ 39 “
“ tPLH 3003 5/
(Fig. 11) 114 IN IN (A) B “ “ OUT 5.0 V Clock 1
to Q1 5 31 ns
“ “ (Fig. 12) 115 IN IN (A) 5.0 V “ “ OUT B Clock 1
to Q1
“ “ “
“ “ (Fig. 11) 116 “ B IN (A) IN 5.0 V OUT “ Clock 2
to Q2 “ “ “
“ “ (Fig. 12) 117 “ 5.0 V IN (A) IN B OUT “ Clock 2
to Q2
“ “ “
“ tPHL (Fig. 12) 118 IN IN (B) 5.0 V “ “ OUT B Clock 1
to Q1 “ 39 “
“ “ (Fig. 11) 119 IN IN (B) B “ “ OUT 5.0 V Clock 1
to Q1
“ “ “
“ “ (Fig. 12) 120 “ 5.0 V IN (B) IN B OUT “ Clock 2
to Q2 “ “ “
“ “ (Fig. 11) 121 “ B IN (B) IN 5.0 V OUT “ Clock 2
to Q2
“ “ “
11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55°C.
NOTES:
A = Normal clock pulse.
B = Momentary GND, then 4.5 V.
E = Input D connected to Q .
1/ Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum.
3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b)
H ≥ 1.5 V and L < 1.5 V when using a high speed checker single comparator.
4/ Tests shall be performed in sequence .
5/ Tests shall be performed for bot h D input p ul ses (A and B).
6/ FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
62
MIL-M-38510/2G
MIL-M-38510/2G
63
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the
contract or order (see 6.2). When packaging of materiel is to be performed b y DoD or in-house contractor personnel,
these personnel need to contact the responsible packaging activity to ascertain packaging req uirements. Packaging
requirements are maintained by the Inventory Control Point's packaging activit y within the Military Service or Defense
Agency, or within the military service's system command. Packaging data retrieval is availabl e from the managing
Military Department's or Defe nse Agency's automated packaging files, CD-ROM products, or by contacting the
responsible packaging activity.
6. NOTES
(This section contains information of a g eneral or explanatory nature which may be helpful, but is not
mandatory.)
6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design
applications and logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a. Title, number, and date of the specification.
b. PIN and compliance i dentifier, if applicable (see 1.2).
c. Requirements for delivery of one cop y of the conformance inspection data pertinent to the device
inspection lot to be supplied with eac h shipment by the device manufacturer, if applicable.
d. Requirements for certificate of compliance, if applicable.
e. Requirements for notificati on of change of product or process to contracting activity in addition to
notification to the qualifying activity, if applicable.
f. Requirements for failure analysis (including required test conditi on of method 5003 of MIL-STD-883),
corrective action, and reporting of results, if applicable.
g. Requirements for prod uct assurance options.
h. Requirements for speci al carriers, lead lengths, or lead forming, if applicable. T hese requirements shall
not affect the part number. Unless otherwise specified, these requirements will not apply to direct
purchase by or direct shipment to the Government.
I Req uirements for "JAN" marking.
j. Packaging Requirements (see 5.1)
6.3 Qualification. With respect to products requiring qua lification, awards will be made only for products which are,
at the time of award of contract, qualified for inclusion in Qualified Manufac turers List QML-38535 whether or not
such products have actually been so listed b y that date. The attention of the contractors is called to these
requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal
Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for
the products covered by this specification. Information pertaining to qual ification of products may be obtained from
DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43218-3990.
6.4 Superseding information. The requirements of MIL-M-38510 have been supersed ed to take advantage of the
available Qualified Manufactur er Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M-
38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements
now consist of this specification and MIL-PRF-385 35. The MIL-M-38510 specification sheet number and PIN have
been retained to avoid adversely impacting existing g overnment logistics systems and contractor's parts lists.
MIL-M-38510/2G
64
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and d efin itions used herein are defined
in MIL-PRF-38535, MIL-HDBK-1331, and as follows:
GND ............................................ Electrical ground (common terminal)
V
IN ............................................... Voltage level at an input terminal
6.6 Logistic support. Lead materials and fini shes (see 3.4) are interchangeable. Unl ess otherwise specified,
microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material
and finish A (see 3.4). Longer length leads and l ead forming should not affect the part number.
6.7 Substitutability. T he cross-reference information below is presented for the convenience of users.
Microcircuits covered by this specification will functio nally replace the listed generic-industry type. Generic-industry
microcircuit types may not have equivalent op erational performance characteristics across military temperature
ranges or reliability factors equivalent to MIL-M-38510 device types and may have slight physical variations in relation
to case size. The presence of this information should not be deemed as p ermitting su bstitution of generic-industry
types for MIL-M-38510 types or as a waiver of any of the provisio ns of MIL-PRF-38535.
Military device Generic-industry
type____ type_____
01 SN5472 (Circuit A)
01 DM5472 (Circuit B)
01 MC5472 (Circuit C)
02 SN5473 (Circuit A)
02 DM5473 (Circuit B)
02 S5473 (Circuit C)
03 SN54107 (Circuit A)
03 DM54107 (Circuit B)
03 S54107 (Circuit C)
04 SN5476 (Circuit A)
04 DM5476 (Circuit B)
04 S5476 (Circuit C)
05 5474 (Circuit A)
05 DM5474 (Circuit B)
06 5470
07 SN5479 (Circuit A)
07 MC5479 (Circuit B)
6.8 Change from previous issue. Marginal n otations are not used in this revision to identify changes with respect to
the previous issue, due to the extensiveness of the changes.
MIL-M-38510/2G
65
Custodians: Preparing activity:
Army - CR DLA - CC
Navy - EC
Air Force - 11
DLA - CC
Review activities: (Project 5962-2096)
Army – SM, MI
Navy - AS, CG, MC, SH TD
Air Force – 03, 19, 99
NOTE: The activities listed above were inte rested in this docume nt as of the date of this document. Since
organization and responsi bilities can change, you should verify the currency of the inform ation above using the
ASSIST Online database at http://assist.daps.dla.mil.
