
NE555, NE555Y, SA555, SE555, SE555C
PRECISION TIMERS
SLFS022 – SEPTEMBER 1973 – REVISED FEBRUAR Y 1992
5
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics, VCC = 5 V to 15 V, TA = 25°C (unless otherwise noted)
PARAMETER TEST CONDITIONS SE555 NE555, SA555,
SE555C UNIT
MIN TYP MAX MIN TYP MAX
VCC = 15 V 9.4 10 10.6 8.8 10 11.2
v
v
VCC = 5 V 2.7 3.3 4 2.4 3.3 4.2
THRES current (see Note 2) 30 250 30 250 nA
VCC = 15 V 4.8 5 5.2 4.5 5 5.6
v
v
VCC = 5 V 1.45 1.67 1.9 1.1 1.67 2.2
TRIG current TRIG at 0 V 0.5 0.9 0.5 2µA
RESET voltage level 0.3 0.7 1 0.3 0.7 1 V
RESET at VCC 0.1 0.4 0.1 0.4
u
RESET at 0 V –0.4 –1 –0.4 –1.5
DISCH switch off-state current 20 100 20 100 nA
p
VCC = 15 V 9.6 10 10.4 9 10 11
v
u
VCC = 5 V 2.9 3.3 3.8 2.6 3.3 4
IOL = 10 mA 0.1 0.15 0.1 0.25
IOL = 50 mA 0.4 0.5 0.4 0.75
p
CC =
IOL = 100 mA 2 2.2 2 2.5
w-
v
u
u
v
IOL = 200 mA 2.5 2.5
IOL = 5 mA 0.1 0.2 0.1 0.35
CC =
IOL = 8 mA 0.15 0.25 0.15 0.4
IOH = –100 mA 13 13.3 12.75 13.3
High-level output voltage
CC =
IOH = –200 mA 12.5 12.5 V
VCC = 5 V IOH = –100 mA 3 3.3 2.75 3.3
p
VCC = 15 V 10 12 10 15
pp
u
u
w,
VCC = 5 V 3 5 3 6
u
y
u
p
VCC = 15 V 9 10 9 13
u
u
,
VCC = 5 V 2 4 2 5
NOTE 2: This parameter influences the maximum value of the timing resistors RA and RB in the circuit of Figure 12. For example, when
VCC = 5 V, the maximum value is R = RA + RB ≈ 3.4 MΩ, and for VCC = 15 V, the maximum value is 10 MΩ.
operating characteristics, VCC = 5 V and 15 V
PARAMETER TEST
SE555 NE555, SA555,
SE555C UNIT
MIN TYP MAX MIN TYP MAX
Initial error of timing interval‡
Each timer , monostable§
°
0.5% 1.5% 1% 3%
Each timer, astable¶
A =
1.5% 2.25%
Temperature coefficient Each timer, monostable§
30 100 50 pp
°
of timing interval Each timer, astable¶
A =
90 150
Supply voltage sensitivity Each timer , monostable§
°
0.05 0.2 0.1 0.5
of timing interval Each timer, astable¶
A =
0.15 0.3
Output pulse rise time C
= 15 pF, 100 200 100 300
Output pulse fall time
TA = 25°C100 200 100 300
†For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
‡Timing interval error is defined as the difference between the measured value and the average value of a random sample from each process
run.
§Values specified are for a device in a monostable circuit similar to Figure 9, with component values as follow: RA = 2 kΩ to 100 kΩ, C = 0.1 µF.
¶Values specified are for a device in an astable circuit similar to Figure 12, with component values as follow: RA = 1 kΩ to 100 kΩ, C = 0.1 µF.