HI-SINCERITY
MICROELECTRONICS CORP.
Spec. No. : MOS200401
Issued Date : 2004.04.01
Revised Date : 2005. 04.22
Page No. : 2/6
HIRF630, HIRF630F HSMC Product Specification
ELectrical Characteristics (Tj=25°C, unless otherwise specified)
Symbol Characteristic Min. Typ. Max. Unit
V(BR)DSS Drain-S ourc e Br eakdown Vo ltage (VGS=0V, ID=250uA) 200 - - V
Drain-Source Leakage Current (VDS=200V, VGS=0V) - - 1 uA
IDSS Drain-Source Leakage Current (VDS=160V, VGS=0V, Tj=125°C) 50 uA
IGSSF Gate-Source Leakage Current-Forward (Vgsf=30V, VDS=0V) - - 100 nA
IGSSR Gate-Source Leakage Current-Reverse (Vgsr=-30V, VDS=0V) - - -100 nA
VGS(th) Gate Threshold V oltage (VDS=VGS, ID=250uA) 2 - 4 V
RDS(on) Static Drain-Source On-Resistance (VGS=10V, ID=5.4A)(*4) - - 0.4 Ω
gFS Forward Transconductance (VDS=50V, ID=5.4A)(*4) 3.8 - - S
Ciss Input Capacitance - 800 -
Coss Output Capacitance - 240 -
Crss Reverse Transfer Capacitance VDS=25V, VGS=0V, f=1MHz -76-pF
td(on) Turn-on Delay Time - 9.4 -
trRise T i me - 28 -
td(off) Turn-off Delay Time - 39 -
tfFall Time
(VDD=100V, ID=5.9A, RG=12Ω,
RD=16Ω)(*4)
-20-
ns
QgTotal Gate Charge - - 43
Qgs Gate-Source Charge - - 7
Qgd Gate-Drain Charge
(VDS=160V, ID=5.9 A, VGS=10V)
(*4) --23
nC
LDInternal Drain Inductance (Measured from the drain lead 0.25” from
package to center of die) -4.5-nH
LSInternal Drain Inductance (Measured from the drain lead 0.25” from
package to source bond pad) -7.5-nH
*3: ISD≤9A, di /dt≤120A/us, VDD≤V(BR) DSS , TJ≤150°C
*4: Pulse Test: Pulse Width≤300us, Duty Cycl e≤2%
Source-Drain Diode
Symbol Characteristic Min. Typ. Max. Units
Qrr Reverse Recovery Charge - 1.1 2.2 uC
ton Forw ard T u rn -On Time - ** -
trr Reverse Recovery Time IF=5.9A, di/dt=100A/us, Tj=25°C (*4) - 170 340 ns
VSD Diode Forward Voltage IS=9A, VGS=0V, Tj=25°C (*4) --2V
**: Negligibl e, Dominated by circui t inductance