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LF198-N
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LF298
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LF398-N
LF198A-N
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LF398A-N
SNOSBI3B JULY 2000REVISED NOVEMBER 2015
LF298, LFx98x Monolithic Sample-and-Hold Circuits
1 Features 3 Description
The LF298 and LFx98x devices are monolithic
1 Operates from ±5-V to ±18-V Supplies sample-and-hold circuits that use BI-FET technology
Less than 10-μs Acquisition Time to obtain ultrahigh DC accuracy with fast acquisition
Logic Input Compatible With TTL, PMOS, CMOS of signal and low droop rate. Operating as a unity-
gain follower, DC gain accuracy is 0.002% typical and
0.5-mV Typical Hold Step at Ch = 0.01 µF acquisition time is as low as 6 µs to 0.01%. A bipolar
Low Input Offset input stage is used to achieve low offset voltage and
0.002% Gain Accuracy wide bandwidth. Input offset adjust is accomplished
with a single pin and does not degrade input offset
Low Output Noise in Hold Mode drift. The wide bandwidth allows the LF198-N to be
Input Characteristics Do Not Change During Hold included inside the feedback loop of 1-MHz
Mode operational amplifiers without having stability
High Supply Rejection Ratio in Sample or Hold problems. Input impedance of 1010 Ωallows high-
Wide Bandwidth source impedances to be used without degrading
accuracy.
Space Qualified, JM38510 P-channel junction FETs are combined with bipolar
2 Applications devices in the output amplifier to give droop rates as
low as 5 mV/min with a 1-µF hold capacitor. The
Ramp Generators With Variable Reset Level JFETs have much lower noise than MOS devices
Integrators With Programmable Reset Level used in previous designs and do not exhibit high
Synchronous Correlators temperature instabilities. The overall design ensures
no feedthrough from input to output in the hold mode,
2-Channel Switches even for input signals equal to the supply voltages.
DC and AC Zeroing Logic inputs on the LF198-N are fully differential with
Staircase Generators low input current, allowing for direct connection to
TTL, PMOS, and CMOS. Differential threshold is
1.4 V. The LF198-N will operate from ±5-V to ±18-V
supplies.
An A version is available with tightened electrical
specifications.
Device Information(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
SOIC (14) 8.65 mm × 3.91 mm
LF298, LFx98x TO-99 (8) 9.08 mm × 9.08 mm
PDIP (8) 9.81 mm × 6.35 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Typical Connection Acquisition Time
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
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Table of Contents
8.2 Functional Block Diagram....................................... 12
1 Features.................................................................. 18.3 Feature Description................................................. 12
2 Applications ........................................................... 18.4 Device Functional Modes........................................ 12
3 Description............................................................. 19 Application and Implementation ........................ 13
4 Revision History..................................................... 29.1 Application Information............................................ 13
5 Pin Configuration and Functions......................... 39.2 Typical Applications ................................................ 15
6 Specifications......................................................... 410 Power Supply Recommendations ..................... 24
6.1 Absolute Maximum Ratings ...................................... 411 Layout................................................................... 25
6.2 Recommended Operating Conditions....................... 411.1 Layout Guidelines ................................................. 25
6.3 Thermal Information.................................................. 411.2 Layout Example .................................................... 25
6.4 Electrical Characteristics, LF198-N and LF298 ........ 512 Device and Documentation Support................. 26
6.5 Electrical Characteristics, LF398-N........................... 612.1 Device Support...................................................... 26
6.6 Typical Characteristics.............................................. 712.2 Related Links ........................................................ 26
7 Parameter Measurement Information ................ 10 12.3 Community Resources.......................................... 26
7.1 TTL and CMOS 3 V VLOGIC (Hi State) 7 V ....... 10 12.4 Trademarks........................................................... 26
7.2 CMOS 7 V VLOGIC (Hi State) 15 V.................... 10 12.5 Electrostatic Discharge Caution............................ 26
7.3 Operational Amplifier Drive..................................... 11 12.6 Glossary................................................................ 27
8 Detailed Description............................................ 12 13 Mechanical, Packaging, and Orderable
8.1 Overview................................................................. 12 Information........................................................... 27
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision A (July 2000) to Revision B Page
Added ESD Ratings table, Thermal Information table, Feature Description section, Device Functional Modes,
Application and Implementation section, Power Supply Recommendations section, Layout section, Device and
Documentation Support section, and Mechanical, Packaging, and Orderable Information section....................................... 1
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5 Pin Configuration and Functions
P Package D Package
8-Pin PDIP 14-Pin SOIC
Top View Top View
LMC Package
8-Pin TO-99
Top View
A military RETS electrical test specification is available on request. The LF198-N may also be procured to Standard
Military Drawing #5962-8760801GA or to MIL-STD-38510 part ID JM38510/12501SGA.
Pin Functions
PIN TYPE(1) DESCRIPTION
NAME SOIC TO-99 PDIP
V+12 1 1 P Positive supply
OFFSET ADJUST 14 2 2 A DC offset compensation pin
INPUT 1 3 3 A Analog Input
V3 4 4 P Negative supply
OUTPUT 7 5 5 O Output
Ch8 6 6 A Hold capacitor
LOGIC REFERENCE 10 7 7 I Reference for LOGIC input
LOGIC 11 8 8 I Logic input for Sample and Hold modes
NC 2, 4, 5, 6, 9, 13 NA No connect
(1) P = Power, G = Ground, I = Input, O = Output, A = Analog
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6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)(2)
MIN MAX UNIT
Supply voltage ±18 V
Power dissipation (Package limitation, see (3)) 500 mW
LF198-N, LF198A-N –55 125 °C
Operating ambient temperature LF298 –25 85 °C
LF398-N, LF398A-N 0 70 °C
Input voltage ±18 V
Logic-to-logic reference differential voltage (see (4)) 7 30 V
Output short circuit duration Indefinite
Hold capacitor short circuit duration 10 sec
H package (soldering, 10 sec.) 260 °C
N package (soldering, 10 sec.) 260 °C
Lead temperature M package: vapor phase (60 sec.) 215 °C
Infrared (15 sec.) 220 °C
Storage temperature, Tstg –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) If Military/Aerospace specified devices are required, please contact the TI Sales Office/ Distributors for availability and specifications.
(3) The maximum power dissipation must be derated at elevated temperatures and is dictated by TJMAX, RθJA, and the ambient
temperature, TA. The maximum allowable power dissipation at any temperature is PD= (TJMAX TA) / RθJA, or the number given in the
Absolute Maximum Ratings, whichever is lower. The maximum junction temperature, TJMAX, for the LF198-N and LF198A-N is 150°C;
for the LF298, 115°C; and for the LF398-N and LF398A-N, 100°C.
(4) Although the differential voltage may not exceed the limits given, the common-mode voltage on the logic pins may be equal to the
supply voltages without causing damage to the circuit. For proper logic operation, however, one of the logic pins must always be at least
2 V below the positive supply and 3 V above the negative supply.
6.2 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT
Supply voltage ±15 V
LF198-N, LF198A-N –55 125
TJAmbient temperature LF298 –25 85 °C
LF398-N, LF398A-N 0 70
6.3 Thermal Information LF398-N LF298, LF398-N LFx98x
THERMAL METRIC(1) P (PDIP) D (SOIC) LMC (TO-99) UNIT
8 PINS 14 PINS 8 PINS
RθJA Junction-to-ambient thermal resistance 48.9 80.6 85(2) °C/W
RθJC(top) Junction-to-case (top) thermal resistance 37.3 38.1 20 °C/W
RθJB Junction-to-board thermal resistance 26.2 35.4 °C/W
ψJT Junction-to-top characterization parameter 14.3 5.8 °C/W
ψJB Junction-to-board characterization parameter 26.0 35.1 °C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
(2) Board mount in 400 LF/min air flow.
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6.4 Electrical Characteristics, LF198-N and LF298
The following specifications apply for –VS+ 3.5 V VIN +VS 3.5 V, +VS= +15 V, –VS= –15 V, TA= TJ= 25°C, Ch= 0.01
µF, RL= 10 kΩ, LOGIC REFERENCE = 0 V, LOGIC HIGH = 2.5 V, LOGIC LOW = 0 V unless otherwise specified.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
TJ= 25°C 1 3 mV
Input offset voltage(1) Full temperature range 5 mV
TJ= 25°C 5 25 nA
Input bias current(1) Full temperature range 75 nA
Input impedance TJ= 25°C 10 GΩ
TJ= 25°C, RL= 10k 0.002% 0.005%
Gain error Full temperature range 0.02%
Feedthrough attenuation ratio at 1 kHz TJ= 25°C, Ch= 0.01 µF 86 96 dB
Tj= 25°C, “HOLD” mode 0.5 2 Ω
Output impedance Full temperature range 4 Ω
HOLD step(2) TJ= 25°C, Ch= 0.01 µF, VOUT = 0 0.5 2 mV
Supply current(1) TJ25°C 4.5 5.5 mA
Logic and logic reference input current TJ= 25°C 2 10 µA
Leakage current into hold capacitor(1) TJ= 25°C(3), hold mode 30 100 pA
ΔVOUT = 10 V, Ch= 1000 pF 4 µs
Acquisition time to 0.1% CH= 0.01 µF 20 µs
Hold capacitor charging current VIN VOUT = 2 V 5 mA
Supply voltage rejection ratio VOUT = 0 80 110 dB
Differential logic threshold TJ= 25°C 0.8 1.4 2.4 V
TJ= 25°C 1 1 mV
Input offset voltage(1) Full temperature range 2 mV
TJ= 25°C 5 25 nA
Input bias current(1) Full temperature range 75 nA
Input impedance TJ= 25°C 10 GΩ
TJ= 25°C, RL= 10 k 0.002% 0.005%
Gain error Full temperature range 0.01%
Feedthrough attenuation ratio at 1 kHz TJ= 25°C, Ch= 0.01 µF 86 96 dB
TJ= 25°C, “HOLD” mode 0.5 1 Ω
Output impedance Full temperature range 4 Ω
HOLD step(2) TJ= 25°C, Ch= 0.01 µF, VOUT = 0 0.5 1 mV
Supply current(1) TJ25°C 4.5 5.5 mA
Logic and logic reference input current TJ= 25°C 2 10 µA
Leakage current into hold capacitor(1) TJ= 25°C(3), hold mode 30 100 pA
ΔVOUT = 10 V, Ch= 1000 pF 4 6 µs
Acquisition time to 0.1% CH= 0.01 µF 20 25 µs
Hold capacitor charging current VIN VOUT = 2 V 5 mA
Supply voltage rejection ratio VOUT = 0 90 110 dB
Differential logic threshold TJ= 25°C 0.8 1.4 2.4 V
(1) These parameters ensured over a supply voltage range of ±5 to ±18 V, and an input range of –VS+ 3.5 V VIN +VS 3.5 V.
(2) Hold step is sensitive to stray capacitive coupling between input logic signals and the hold capacitor. 1 pF, for instance, will create an
additional 0.5-mV step with a 5-V logic swing and a 0.01-µF hold capacitor. Magnitude of the hold step is inversely proportional to hold
capacitor value.
(3) Leakage current is measured at a junction temperature of 25°C. The effects of junction temperature rise due to power dissipation or
elevated ambient can be calculated by doubling the 25°C value for each 11°C increase in chip temperature. Leakage is guaranteed over
full input signal range.
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6.5 Electrical Characteristics, LF398-N
The following specifications apply for –VS+ 3.5 V VIN +VS 3.5 V, +VS= +15 V, –VS= –15 V, TA= TJ= 25°C, Ch= 0.01
µF, RL= 10 kΩ, LOGIC REFERENCE = 0 V, LOGIC HIGH = 2.5 V, LOGIC LOW = 0 V unless otherwise specified.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
TJ= 25°C 2 7 mV
Input offset voltage(1) Full temperature range 10 mV
TJ= 25°C 10 50 nA
Input bias current(1) Full temperature range 100 nA
Input impedance TJ= 25°C 10 GΩ
TJ= 25°C, RL= 10 k 0.004% 0.01%
Gain error Full temperature range 0.02%
Feedthrough attenuation ratio at 1 kHz TJ= 25°C, Ch= 0.01 µF 80 90 dB
TJ= 25°C, “HOLD” mode 0.5 4 Ω
Output impedance Full temperature range 6 Ω
HOLD step(2) TJ= 25°C, Ch= 0.01 µF, VOUT = 0 1 2.5 mV
Supply current(1) TJ25°C 4.5 6.5 mA
Logic and logic reference input current TJ= 25°C 2 10 µA
Leakage current into hold capacitor(1) TJ= 25°C(3), hold mode 30 200 pA
ΔVOUT = 10 V, Ch= 1000 pF 4 µs
Acquisition time to 0.1% CH= 0.01 µF 20 µs
Hold capacitor charging current VIN VOUT = 2 V 5 mA
Supply voltage rejection ratio VOUT = 0 80 110 dB
Differential logic threshold TJ= 25°C 0.8 1.4 2.4 V
TJ= 25°C 2 2 mV
Input offset voltage(1) Full temperature range 3 mV
TJ= 25°C 10 25 nA
Input bias current(1) Full temperature range 50 nA
Input impedance TJ= 25°C 10 GΩ
TJ= 25°C, RL= 10 k 0.004% 0.005%
Gain error Full temperature range 0.01%
Feedthrough attenuation ratio at 1 kHz TJ= 25°C, Ch= 0.01 µF 86 90 dB
TJ= 25°C, “HOLD” mode 0.5 1 Ω
Output impedance Full temperature range 6 Ω
HOLD step(2) TJ= 25°C, Ch= 0.01 µF, VOUT = 0 1 1 mV
Supply current(1) TJ25°C 4.5 6.5 mA
Logic and logic reference input current TJ= 25°C 2 10 µA
Leakage current into hold capacitor(1) TJ= 25°C(3), hold mode 30 100 pA
ΔVOUT = 10 V, Ch= 1000 pF 4 6 µs
Acquisition time to 0.1% CH= 0.01 µF 20 25 µs
Hold capacitor charging current VIN VOUT = 2 V 5 mA
Supply voltage rejection ratio VOUT = 0 90 110 dB
Differential logic threshold TJ= 25°C 0.8 1.4 2.4 V
(1) These parameters ensured over a supply voltage range of ±5 to ±18 V, and an input range of –VS+ 3.5 V VIN +VS 3.5 V.
(2) Hold step is sensitive to stray capacitive coupling between input logic signals and the hold capacitor. 1 pF, for instance, will create an
additional 0.5-mV step with a 5-V logic swing and a 0.01-µF hold capacitor. Magnitude of the hold step is inversely proportional to hold
capacitor value.
(3) Leakage current is measured at a junction temperature of 25°C. The effects of junction temperature rise due to power dissipation or
elevated ambient can be calculated by doubling the 25°C value for each 11°C increase in chip temperature. Leakage is guaranteed over
full input signal range.
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6.6 Typical Characteristics
Figure 1. Aperture Time Figure 2. Dielectric Absorption Error in Hold Capacitor
Figure 3. Dynamic Sampling Error Figure 4. Output Droop Rate
Figure 5. Hold Step Figure 6. Hold Settling Time
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Typical Characteristics (continued)
Figure 7. Leakage Current into Hold Capacitor Figure 8. Phase and Gain (Input to Output, Small Signal)
Figure 10. Power Supply Rejection
Figure 9. Gain Error
Figure 11. Output Short Circuit Current Figure 12. Output Noise
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Typical Characteristics (continued)
Figure 14. Feedthrough Rejection Ratio (Hold Mode)
Figure 13. Input Bias Current
Figure 15. Hold Step vs Input Voltage Figure 16. Output Transient at Start of Sample Mode
Figure 17. Output Transient at Start of Hold Mode
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7 Parameter Measurement Information
7.1 TTL and CMOS 3 V VLOGIC (Hi State) 7 V
Threshold = 1.4 V
Figure 18. Sample When Logic High With TTL and CMOS Biasing
Threshold = 1.4 V
Select for 2.8 V at pin 8
Figure 19. Sample When Logic Low With TTL and CMOS Biasing
7.2 CMOS 7 V VLOGIC (Hi State) 15 V
Threshold = 0.6 (V+) + 1.4 V
Figure 20. Sample When Logic High With CMOS Biasing
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CMOS 7 V VLOGIC (Hi State) 15 V (continued)
Threshold = 0.6 (V+) –1.4V
Figure 21. Sample When Logic Low With CMOS Biasing
7.3 Operational Amplifier Drive
Threshold +4 V
Figure 22. Sample When Logic High With Operational Amplifier Biasing
Threshold = 4 V
Figure 23. Sample When Logic Low With Operational Amplifier Biasing
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8 Detailed Description
8.1 Overview
The LF298 and LFx98x devices are monolithic sample-and-hold circuits that utilize BI-FET technology to obtain
ultrahigh DC accuracy with fast acquisition of signal and low droop rate. Operating as a unity-gain follower, DC
gain accuracy is 0.002% typical and acquisition time is as low as 6 µs to 0.01%. A bipolar input stage is used to
achieve low offset voltage and wide bandwidth. Input offset adjust is accomplished with a single pin, and does
not degrade input offset drift. The wide bandwidth allows the LF198-N to be included inside the feedback loop of
1-MHz operational amplifier without having stability problems. Input impedance of 1010 Ωallows high-source
impedances to be used without degrading accuracy.
8.2 Functional Block Diagram
8.3 Feature Description
The LF298 and LFx98x OUTPUT tracks the INPUT signal by charging and discharging the hold capacitor. The
OUTPUT can be held at any given time by pulling the LOGIC input low relative to the LOGIC REFERENCE
voltage and resume sampling when LOGIC returns high. Additionally, the OFFSET pin can be used to zero the
offset voltage present at the INPUT.
8.4 Device Functional Modes
The LF298 and LFx98x devices have a sample mode and hold mode controlled by the LOGIC voltage relative to
the LOGIC REFERENCE voltage. The device is in sample mode when the LOGIC input is pulled high relative to
the LOGIC REFERENCE voltage and in hold mode when the LOGIC input is pulled low relative to the LOGIC
REFERENCE. In sample mode, the output is tracking the input signal by charging and discharging the hold
capacitor. Smaller values of hold capacitance will allow the output to track faster signals. In hold mode the input
signal is disconnected from the signal path and the output retains the value on the hold capacitor. Larger values
of capacitance will have a smaller droop rate as shown in Figure 4.
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
9.1.1 Hold Capacitor
Hold step, acquisition time, and droop rate are the major trade-offs in the selection of a hold capacitor value. Size
and cost may also become important for larger values. Use of the curves included with this data sheet should be
helpful in selecting a reasonable value of capacitance. Keep in mind that for fast repetition rates or tracking fast
signals, the capacitor drive currents may cause a significant temperature rise in the LF198-N.
A significant source of error in an accurate sample and hold circuit is dielectric absorption in the hold capacitor. A
mylar cap, for instance, may sag back up to 0.2% after a quick change in voltage. A long sample time is required
before the circuit can be put back into the hold mode with this type of capacitor. Dielectrics with very low
hysteresis are polystyrene, polypropylene, and Teflon. Other types such as mica and polycarbonate are not
nearly as good. The advantage of polypropylene over polystyrene is that it extends the maximum ambient
temperature from 85°C to 100°C. Most ceramic capacitors are unusable with > 1% hysteresis. Ceramic NPO or
COG capacitors are now available for 125°C operation and also have low dielectric absorption. For more exact
data, see Figure 2. The hysteresis numbers on the curve are final values, taken after full relaxation. The
hysteresis error can be significantly reduced if the output of the LF198-N is digitized quickly after the hold mode
is initiated. The hysteresis relaxation time constant in polypropylene, for instance, is 10 to 50 ms. If A-to-D
conversion can be made within 1 ms, hysteresis error will be reduced by a factor of ten.
9.1.2 DC and AC Zeroing
DC zeroing is accomplished by connecting the offset adjust pin to the wiper of a 1-kΩpotentiometer, which has
one end tied to V+ and the other end tied through a resistor to ground. The resistor should be selected to give
approximately 0.6 mA through the 1-kΩpotentiometer.
AC zeroing (hold step zeroing) can be obtained by adding an inverter with the adjustment pot tied input to output.
A 10-pF capacitor from the wiper to the hold capacitor will give ±4-mV hold step adjustment with a 0.01-µF hold
capacitor and 5-V logic supply. For larger logic swings, a smaller capacitor (< 10 pF) may be used.
9.1.3 Logic Rise Time
For proper operation, logic signals into the LF198-N must have a minimum dV/dt of 1.0 V/µs. Slower signals will
cause excessive hold step. If a R/C network is used in front of the logic input for signal delay, calculate the slope
of the waveform at the threshold point to ensure that it is at least 1.0 V/µs.
9.1.4 Sampling Dynamic Signals
Sample error to moving input signals probably causes more confusion among sample-and-hold users than any
other parameter. The primary reason for this is that many users make the assumption that the sample and hold
amplifier is truly locked on to the input signal while in the sample mode. In actuality, there are finite phase delays
through the circuit creating an input-output differential for fast moving signals. In addition, although the output
may have settled, the hold capacitor has an additional lag due to the 300-Ωseries resistor on the chip. This
means that at the moment the hold command arrives, the hold capacitor voltage may be somewhat different than
the actual analog input. The effect of these delays is opposite to the effect created by delays in the logic which
switches the circuit from sample to hold. For example, consider an analog input of 20 Vp–p at 10 kHz. Maximum
dV/dt is 0.6 V/µs. With no analog phase delay and 100-ns logic delay, one could expect up to (0.1 µs) (0.6V/µs)
= 60 mVerror if the hold signal arrived near maximum dV/dt of the input. A positive-going input would give a
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Application Information (continued)
60-mV error. Now assume a 1-MHz (3-dB) bandwidth for the overall analog loop. This generates a phase delay
of 160 ns. If the hold capacitor sees this exact delay, then error due to analog delay will be (0.16 µs) (0.6 V/µs) =
–96 mV. Total output error is 60 mV (digital) –96 mV (analog) for a total of –36 mV. To add to the confusion,
analog delay is proportioned to hold capacitor value while digital delay remains constant. A family of curves
(dynamic sampling error) is included to help estimate errors.
Figure 1 has been included for sampling conditions where the input is steady during the sampling period, but
may experience a sudden change nearly coincident with the hold command. This curve is based on a 1-mV error
fed into the output.
Figure 6 indicates the time required for the output to settle to 1 mV after the hold command.
9.1.5 Digital Feedthrough
Fast rise time logic signals can cause hold errors by feeding externally into the analog input at the same time the
amplifier is put into the hold mode. To minimize this problem, board layout should keep logic lines as far as
possible from the analog input and the Chpin. Grounded guarding traces may also be used around the input line,
especially if it is driven from a high impedance source. Reducing high amplitude logic signals to 2.5 V will also
help.
Use 10-pin layout. Guard around CHis tied to output.
Figure 24. Guarding Technique
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9.2 Typical Applications
9.2.1 X1000 Sample and Hold
The circuit configuration in Figure 25 shows how to incorporate an amplification factor of 1000 into the sample
and hold stage. This may be particularly useful if the input signal has a very low amplitude. Equation 1 provides
the appropriate value of capacitance for the COMP 2 pin capacitance of the LM108.
*For lower gains, the LM108 must be frequency compensated
Figure 25. X1000 Sample and Hold
(1)
9.2.1.1 Design Requirements
Assume an unbuffered analog to digital converter with 1-Vpp dynamic range is used in a system which needs to
sample an input signal with only 1-mVpp amplitude. Using the LF198-N and LM108 connect the input signal so
that the maximum dynamic range is used by the 1-Vpp data converter.
9.2.1.2 Detailed Design Procedure
Connect the LF198-N and LM108 as shown in Figure 25. To maximize the dynamic range of 1 Vpp a gain factor
of 1000x is needed. Set R3 to 1 MΩand R4 to 1 kΩto give a noninverting gain of 1001. The calculated value of
C1 is 0.1 pF according to Equation 1, which is negligibly small and may be left off of the design.
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,
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Typical Applications (continued)
9.2.1.3 Application Curves
The feedthrough rejection ratio of the LF198-N is extremely good and provides good isolation for a wide variety
of hold capacitors as Figure 26 shows. Additionally, the output transient settles almost completely after 0.8 µs
and would be ready to sample as shown in Figure 27.
Figure 26. Feedthrough Rejection Ratio (Hold Mode) Figure 27. Output Transient at Start of Hold Mode
9.2.2 Sample and Difference Circuit
The LF198-N may be used as a sample and difference circuit as shown in Figure 28 where the output follows the
input in hold mode.
VOUT = VB+VIN (HOLD MODE)
Figure 28. Sample and Difference Circuit
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Product Folder Links: LF198-N LF298 LF398-N LF198A-N LF398A-N
t
OUT IN R
0
h
1
V (Hold Mode) V dt V
(R1) (C )
é ù
= + é ù
ê ú ë û
ë û
ò
h
V 1.2V
T (R2) (C )
D=
D
LF198-N
,
LF298
,
LF398-N
LF198A-N
,
LF398A-N
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Typical Applications (continued)
9.2.3 Ramp Generator With Variable Reset Level
The circuit configuration shown in Figure 29 generates a ramp signal with variable reset level. The rise or fall
time may be computed by Equation 2.
Figure 29. Ramp Generator With Variable Reset Level
(2)
9.2.4 Integrator With Programmable Reset Level
The LF398-N may be used with LM308 to create an integrator circuit with programmable reset level as shown in
Figure 30. The integrated output voltage in hold mode is computed with Equation 3.
Figure 30. Integrator With Programmable Reset Level
(3)
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h h
IN
1
Select (R ) (C ) 2 f (Min)p
?
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,
LF298
,
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,
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Typical Applications (continued)
9.2.5 Output Holds at Average of Sampled Input
The LF198-N can be used to identify the average value of the input signal and hold the corresponding voltage on
the output. Connect Rhand Chas shown in Figure 31. The corresponding values may be calculated with
Equation 4.
Figure 31. Output Holds at Average of Sampled Input
(4)
9.2.6 Increased Slew Current
The slew current can be increased by connecting opposing diodes from the OUTPUT to the HOLD CAPACITOR
pins as shown in Figure 32.
Figure 32. Increased Slew Current
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OS
V30 V / sec
t
D» m
D
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,
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,
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,
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Typical Applications (continued)
9.2.7 Reset Stabilized Amplifier
The LF398-N may be used with LH0042H to create a reset stabilized amplifier with a gain of 1000 as shown in
Figure 33.
VOS 20 µV (No trim) ZIN 1 MΩ
Figure 33. Reset Stabilized Amplifier
(5)
(6)
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Typical Applications (continued)
9.2.8 Fast Acquisition, Low Droop Sample and Hold
Two LF398-N devices may be used along with LM3905 TIMER to create a fast acquisition, low droop sample
and hold circuit as shown in Figure 34.
Figure 34. Fast Acquisition, Low Droop Sample and Hold
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Typical Applications (continued)
9.2.9 Synchronous Correlator for Recovering Signals Below Noise Level
The LF198-N may be used with two LM122H TIMER devices to create a synchronous correlator for recovering
signals below noise level as shown in Figure 35.
Figure 35. Synchronous Correlator for Recovering Signals Below Noise Level
9.2.10 2-Channel Switch
The HOLD CAPACITOR pin could be alternatively used as a second input to create a 2-channel switch shown
Figure 36
Figure 36. 2-Channel Switch
In the configuration of Figure 36, input signal A and input signal B have the characteristics listed in Table 1.
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Typical Applications (continued)
Table 1. 2-Channel Switch Characteristics
A B
Gain 1 ± 0.02% 1 ± 0.2%
ZIN 1010 Ω47 kΩ
BW 1 MHz 400 kHz
Crosstalk @ 1 kHz –90 dB –90 dB
Offset 6 mV 75 mV
9.2.11 DC and AC Zeroing
The LF198-N features an OFFSET ADJUST pin which can be connected to a potentiometer to zero the DC
offset. Additionally, an inverter may be connected with an AC-coupled potentiometer to the HOLD CAPACITOR
pin to create a DC- and AC-zeroing circuit as shown in Figure 37.
Figure 37. DC and AC Zeroing
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9.2.12 Staircase Generator
The LF368 can be connected as shown in Figure 38 to create a staircase generator.
*Select for step height: 50 kΩ 1-V Step.
Figure 38. Staircase Generator
9.2.13 Differential Hold
Two LF198-N devices may be connected as shown in Figure 39 to create a differential hold circuit.
Figure 39. Differential Hold
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9.2.14 Capacitor Hysteresis Compensation
The LF298 and LFx98x devices may be used for capacitor hysteresis compensation as shown in Figure 40.
*Select for time constant C1 = τ/100 kΩ
**Adjust for amplitude
Figure 40. Capacitor Hysteresis Compensation
10 Power Supply Recommendations
The LF298 and LFx98x devices are rated for a typical supply voltage of ±15 V. To achieve noise immunity as
appropriate to the application, it is important to use good printed-circuit-board layout practices for power supply
rails and planes, as well as using bypass capacitors connected between the power supply pins and ground. All
bypass capacitors must be rated to handle the supply voltage and be decoupled to ground. TI recommends to
decouple each supply with two capacitors; a small value ceramic capacitor (approximately 0.1 μF) placed close
to the supply pin in addition to a large value Tantalum or Ceramic (10 μF). The large capacitor can be shared
by more than one device if necessary. The small ceramic capacitor maintains low supply impedance at higher
frequencies while the large capacitor will act as the charge bucket for fast load current spikes at the op amp
output. The combination of these capacitors will provide supply decoupling and will help maintain stable
operation for most loading conditions.
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NC
V-
V±
C4
10 µF
C3
0.1 µF
CH
INPUT 1
2
3
4
14
13
12
11
INPUT
NC
NC
OFFSET
ADJUST
V+
LOGIC
U1 LFx98M
6
7
9
8
LOGIC
REFERENCE
CH
NC
5 10
NCNC
OUTPUT
V±
NC
OUTPUT
C2
0.1 µF
C1
10 µF
V+
OFF ADJ
LOGIC
LOG REF
Ch
LF198-N
,
LF298
,
LF398-N
LF198A-N
,
LF398A-N
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11 Layout
11.1 Layout Guidelines
Take care to minimize the loop area formed by the bypass capacitor connection between supply pins and
ground. A ground plane underneath the device is recommended; any bypass components to ground should have
a nearby via to the ground plane. The optimum bypass capacitor placement is closest to the corresponding
supply pin. Use of thicker traces from the bypass capacitors to the corresponding supply pins will lower the
power supply inductance and provide a more stable power supply. The feedback components should be placed
as close to the device as possible to minimize stray parasitics.
11.2 Layout Example
Figure 41 shows an example schematic and layout for the LFx98x 8-pin PDIP package.
Figure 41. Schematic Example
Figure 42. Layout Example
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12 Device and Documentation Support
12.1 Device Support
12.1.1 Device Nomenclature
Hold Step: The voltage step at the output of the sample and hold when switching from sample mode to hold
mode with a steady (DC) analog input voltage. Logic swing is 5 V.
Acquisition Time: The time required to acquire a new analog input voltage with an output step of 10 V.
Acquisition time is not just the time required for the output to settle, but also includes the time required for all
internal nodes to settle so that the output assumes the proper value when switched to the hold mode.
Gain Error: The ratio of output voltage swing to input voltage swing in the sample mode expressed as a per
cent difference.
Hold Settling Time: The time required for the output to settle within 1 mV of final value after the hold logic
command.
Dynamic Sampling Error: The error introduced into the held output due to a changing analog input at the
time the hold command is given. Error is expressed in mV with a given hold capacitor value and input slew
rate. This error term occurs even for long sample times.
Aperture Time: The delay required between hold command and an input analog transition, so that the
transition does not affect the held output.
12.2 Related Links
The table below lists quick access links. Categories include technical documents, support and community
resources, tools and software, and quick access to sample or buy.
Table 2. Related Links
TECHNICAL TOOLS & SUPPORT &
PARTS PRODUCT FOLDER SAMPLE & BUY DOCUMENTS SOFTWARE COMMUNITY
LF198-N Click here Click here Click here Click here Click here
LF298 Click here Click here Click here Click here Click here
LF398-N Click here Click here Click here Click here Click here
LF198A-N Click here Click here Click here Click here Click here
LF398A-N Click here Click here Click here Click here Click here
12.3 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.4 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
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12.6 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
www.ti.com 29-Jun-2017
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead/Ball Finish
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
LF198AH/NOPB ACTIVE TO-99 LMC 8 500 Green (RoHS
& no Sb/Br) Call TI Level-1-NA-UNLIM -55 to 125 ( LF198AH ~
LF198AH)
LF198H ACTIVE TO-99 LMC 8 500 TBD Call TI Call TI -55 to 125 ( LF198H ~ LF198H)
LF198H/NOPB ACTIVE TO-99 LMC 8 500 Green (RoHS
& no Sb/Br) Call TI Level-1-NA-UNLIM -55 to 125 ( LF198H ~ LF198H)
LF298M NRND SOIC D 14 55 TBD Call TI Call TI -25 to 85 LF298M
LF298M/NOPB ACTIVE SOIC D 14 55 Green (RoHS
& no Sb/Br) CU SN Level-1-260C-UNLIM -25 to 85 LF298M
LF298MX NRND SOIC D 14 2500 TBD Call TI Call TI -25 to 85 LF298M
LF298MX/NOPB ACTIVE SOIC D 14 2500 Green (RoHS
& no Sb/Br) CU SN Level-1-260C-UNLIM -25 to 85 LF298M
LF398AN/NOPB ACTIVE PDIP P 8 40 Green (RoHS
& no Sb/Br) CU SN Level-1-NA-UNLIM 0 to 70 LF
398AN
LF398M NRND SOIC D 14 55 TBD Call TI Call TI 0 to 70 LF398M
LF398M/NOPB ACTIVE SOIC D 14 55 Green (RoHS
& no Sb/Br) CU SN Level-1-260C-UNLIM 0 to 70 LF398M
LF398MX/NOPB ACTIVE SOIC D 14 2500 Green (RoHS
& no Sb/Br) CU SN Level-1-260C-UNLIM 0 to 70 LF398M
LF398N/NOPB ACTIVE PDIP P 8 40 Green (RoHS
& no Sb/Br) CU SN Level-1-NA-UNLIM 0 to 70 LF
398N
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
PACKAGE OPTION ADDENDUM
www.ti.com 29-Jun-2017
Addendum-Page 2
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
IMPORTANT NOTICE
Texas Instruments Incorporated (TI) reserves the right to make corrections, enhancements, improvements and other changes to its
semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. Buyers
should obtain the latest relevant information before placing orders and should verify that such information is current and complete.
TI’s published terms of sale for semiconductor products (http://www.ti.com/sc/docs/stdterms.htm) apply to the sale of packaged integrated
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Reproduction of significant portions of TI information in TI data sheets is permissible only if reproduction is without alteration and is
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TI’s provision of technical, application or other design advice, quality characterization, reliability data or other services or information,
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and ISO 26262), TI is not responsible for any failure to meet such industry standard requirements.
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products are intended to help enable customers to design and create their own applications that meet applicable functional safety standards
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ensure compliance with safety-related requirements and standards applicable to their applications. Designer may not use any TI products in
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Designers agree that it has the necessary expertise to select the product with the appropriate qualification designation for their applications
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Designer will fully indemnify TI and its representatives against any damages, costs, losses, and/or liabilities arising out of Designer’s non-
compliance with the terms and provisions of this Notice.
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