SCOPE: CMOS HIGHSPEED 8-BIT A/D CONVERTER WI TH TRACK AND HOLD
Device Type Generic Number
01 MX7820U(x)/883B
02 MX7820T(x)/883B
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter Mil-Std-1835 Case Outline Package Code
MAXIM SMD
Q R GDIP1-T20 or CDIP2-T20 20 LEAD CERDIP J20
E 2 CQCCI-N20 20 LEADLESS CHIP CARRIER L20
A bsolu te Maximum Ratings
Supply Voltage to GND ................................................................................... 0V, +7V
Digital Input Voltage ................................................................................... -0.3V, VDD
Digital Output Voltage ................................................................................. -0.3V, VDD
Positive Reference Voltage ..................................................................... VREF- to VDD
Negative Reference Voltage ..................................................................... 0V to VREF+
Input Voltage (VIN) .................................................................................... -0.3V to VDD
Lead Temperature (soldering, 10 seconds) ............................................................... +300°C
Storage Temperature .................................................................................. -65°C to +150 °C
Continuous Power Dissipation ............................................................................ TA=+70°C
20 pin CERDIP(derate 11.1mW/°C above +70°C) .................................................. 889mW
20 pin LCC(derate 9.1mW/°C above +70°C) ........................................................... 727mW
Junct ion Temper atur e TJ ........................................................................................ +150°C
Thermal Resista nce, J unction to Case, ΘJC
20 pin CERDIP.................................................................................................... 40°C/W
20 pin LCC ......................................................................................................... 20°C/W
Thermal Resistance, Junction to Ambient, ΘJA:
20 pin CERDIP................................................................................................... 90°C/W
20 pin LCC ...................................................................................................... 110°C/W
Recommended Operating Co ndit ions
Ambient Operating Range (TA) ......................................................…... -55°C to +125°C
Supply Voltage Range (VDD) ............................................................….. +4.75V to 5.25V
Positive Reference Voltage (VREF+) ................................................................….. +5.0V
Negative Reference Voltage (VREF-) ....................................................................….. 0V
Ground Potential (GND) .......................................................................................….... 0V
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational section s of the sp ecifica tions is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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TABLE 1. ELECTRICAL TE STS:
TEST Symbol
CONDITIONS
-55 °C TA +125°C 1/ 2/
Unless otherwise specified Group A
Subgroup Device
type Limits
Min Limits
Max Units
Resolution RES This is the mini mum resolution
for which no missing codes are
guaranteed.
1,2,3 All 8LSB
Total Unadjusted Error TUE Includes gain error, offset error
and linearity error. 1
2,3,12
1,2,3
01
02
±1.0
±0.5
±1.0
LSB
Analog Input Leakage
Current IIN 1,2,3 All ± 3.0 µA
Analog Input Capacitance CIA NOTE 3 4 All 60 pF
Reference Input Resistance RIN 1,2,3 All 1.0 4.0 k
Digital Input High Level
Voltage VIH
__ ___ ___
CS, WR, and RD inputs
Mode Input (Pin 7) 1,2,3 All 2.4
3.5 V
Digital Input Low Level
Voltage VIL
__ ___ ___
CS, WR, and RD inputs
Mode Input (Pin 7) 1,2,3 All 0.8
1.5 V
Digital Input High Level
Current IIH
__ ___
CS and RD inputs
___
WR Inputs
Mode Input (Pin 7)
1,2,3 All
±1.0
±3.0
±200
µA
Digital Input Low Current IIL __ ___ ___
CS, WR, RD and mode inputs 1,2,3 All -1.0 µA
Digital Input Capacitance CID __ ___ ___ NOTE 3
CS, WR, RD and mode inputs 4All 8.0 pF
Digital O utput High Level
Voltage VOH ___ ___
DB0-DB7, OFL and INT outputs
ISOURCE=360µA
1,2,3 All 4.0 V
Digital Output Low Level
Voltage VOL ___ ___
DB0-DB7, OFL and INT outputs
ISINK=1.6mA
1,2,3 All 0.4 V
Floating State Leakage
Current IOUT DB0-DB7 1,2,3 All ±3.0 µA
Digital Output Capacitance COUT NOTE 3 4 All 8.0 pF
Supply Current from VDD IDD __ ___
CS=RD=0V 1,2,3 All 20.0 mA
Power Supply Sensitivity PSS VDD=5.0V±5% 1,2,3 All ±.25 LSB
__ __ ___
CS to RD/WR Setup Time tCSS NOTE 6 and 7 9,10,11 All 0ns
__ __ ___
CS to RD/WR Hold Time tCSH NOTE 6 and 7 9,10,11 All 0ns
__
CS to RDY delay tRDY NOTE 6 and 7, CL=50pF, pull-
up resistor=2.0k9
10,11 All 70
100 ns
---------------------------- Electrical Characteristics of MX7820/883B 19-0072 Rev. C
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TEST Symbol
CONDITIONS
-55 °C TA +125°C 1/ 2/
Unless otherwise specified Group A
Subgroup Device
type Limits
Min Limits
Max Units
___ Conversion Time
(RD mode) tCRD See Figure 3 in Commercial
Datasheet. NOTE 7 9
10,11 All 1.6
2.5 µs
___ Data Access Time
(RD mode) tACCO NOTE 4 and 7 9
10,11 All 1.62
2.55 µs
___ ___
__ RD to INT Delay
(RD mode)
tINTH NOTE 7, CL=50pF 9
10,11 All 175
225 ns
Data Hold Time tDH NOTE 5, 6, 7 9
10,11 All 60
100 ns
Delay Time Between
Conversion tPNOTE 6, 7 9
10,11 All 500
600 ns
Write Pulse Wid th tWR NOTE 6 9,10,11 All 0.6 50 µs
Delay Time between
___ ___
WR and RD Pulses
tRD NOTE 6 9
10,11 All 600
700 ns
Delay Access Time
___ __
WR/RD mode
tACC1 NOTE 4, 6 9
10,11 All 160
250 ns
___ ___
RD to INT d elay tR1 NOTE 6 9
10,11 All 140
225 ns
___ ___
WR to INT delay tINTL NOTE 6, CL=50pF 9
10,11 All 1.0
1.7 µs
Data Access Time
___ ___
WR/RD mode
tACC2 NOTE 4, 6 9
10,11 All 70
110 ns
___ ___
WR to INT delay, Stand
alone operation
tIHWR NOTE 6, CL=50pF 9
10,11 All 100
150 ns
Data access time ___
after INT
Stand alone operation
tID NOTE 6 9
10,11 All 50
75 ns
NOTE 1: VDD=+5V, VREF(+)=+5V; VREF(-)=GND=0V, unless other wise specified.__
Specifications apply for RD mode (pin 7=0V).
NOTE 2: All input control signals are specified with tr=tf=20ns (10 percent to 90 percent of +5.0V) and
timed from a voltage level of 1.6V.
NOTE 3: Tested at initial release and upon redesign. Sample size will be 116 units.
NOTE 4: Measured with load circuits of Figure 2 in the Commercial Datasheet and defined as the time
required for an output to cross 0.8V to 2.4V.
NOTE 5: Defined as the time required for the data lines to change 0.5V when loaded with the circuits of
Figures 2 in the Commercial Datasheet and is measured only for the initial test and after process
or design changes which may affect tDH.
NOTE 6: Refer to timing diagrams of Figure 3 of Commercial Datasheet. T hese parameters, if not tested,
shall be guaranteed to the limits specified in Table 1.
__
NOTE 7: Refer to timing diagram of Figure 3 (RD mode). These parameters are tested to Subgroup 9 under
Group A test requirements.
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TERMINAL CONNECTIONS
J20, L20 J20, L20
1V
IN 11 VREF-
2 DB0(LSB) 12 VREF+
3DB1 13CS
4DB2 14DB4
5DB3 15DB5
6 ___
WR/RDY 16 DB6
7 Mode 17 DB7(MSB)
8__
RD 18 ___
OFL
9 ___
INT 19 NC
10 GND 20 VDD
Package ORDERING INFORMATION: SMD NUMBER
01 20 pin CERDIP MX7820UQ/883B 5962-8865001RA
01 20 pin LCC MX7820UE/883B 5962-88650012C
02 20 pin CERDIP MX7820TQ/883B 5962-8865002RA
02 20 pin LCC MX7820TE/883B 5962-88650022C
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QUALITY ASSURAN CE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2. ELECTRICAL TEST REQUIR EMENTS
Mil-Std-883 Test Requirements Subgroups
per Method 5005, Table 1
Interim Electric Parameters
Method 5004 1
Final Electrical Parameters
Method 5005 1*, 2, 3, 4**, 9, 10, 11***
Group A Test Requirements
Method 5005 1, 2, 3, 4**, 9, 10, 11***
Group C and D End-Point Electrical Parameters
Method 5005 1
* PDA applies to Subgroup 1 only.
** Subgroup 4, Capacitance tests are performed at initial qual and upon redesign.
Sample size will be 116 units.
*** Subgroups 10 and 11 if not tested, are guaranteed to the limits specified in Table 1.
---------------------------- Electrical Characteristics of MX7820/883B 19-0072 Rev. C
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