
MIXA300PF1200TSF
tentative
-di /dt = A/µs
T = °C
V
CES
V1200
collector emitter voltage
collector emitter saturation voltage
T = 25°C
collect or current A
465
A
C
VJ
Symbol Definition
Ratings
typ. max.min.Conditions Unit
325
V
V
CE(sat)
total power dissipation 1500 W
collector emitter leakage current
6.5 V
turn-on delay time 110 ns
t
reverse bias safe operating area
A
V
GES
V±20
V
GEM
max. transient gat e e mi t te r v oltage
T = °C
C
V
P
tot
gate emitter threshold voltage
RBSOA
650
±30
T = °C
T = °C
VJ
V
max. DC gate voltage
I
C25
I
C
T = 25°C
VJ
I = A; V = 15 V
CGE
T = 25°C
VJ
V
GE(th)
I
CES
I = mA; V = V
CGECE
V = V ; V = 0 V
CE CES GE
I
GES
T = 25°C
VJ
gate emitter leakage current V = ±20 V
GE
2.1
2.15
5.95.4
mA
0.3 mA
0.3
1.5
G(on)
total gate charge V = V; V = 15 V; I = A
CE
Q
GE C
885 nC
t
t
t
E
E
d(on)
r
d(off)
f
on
off
68 ns
290 ns
345 ns
20 mJ
42 mJ
current rise time
turn-off delay time
current fall time
turn-on energy per pulse
turn-off energy per pulse
inductive load
V = V; I = A
V = ±15 V; R = Ω
CE C
GE G
V = ±15 V; R = Ω
GE G
V = V
CEmax
1200
short circuit safe operating area
µs
SCSOA
10T = °C
VJ
V = V; V = ±15 V
CE GE
short circuit duration
t
short circuit current
I
SC
SC
R = Ω; non-repetitive
G
tbd A
R
thJC
thermal resistance junction to case 0.085 K/W
V
RRM
V1200
max. repetitive rev ers e voltage T = 25°C
VJ
T = 25°C
forward current A
265
A
C
185T = °C
C
I
F25
I
F
T = 25°C
forward voltage V
2.20
V
VJ
1.90T = 125°C
VJ
V
F
I = A
F
T = 25°C
reverse current mA
*
mA
VJ
*T = 125°C
VJ
I
RR RRM
T = 125°C
VJ
Q
I
t
rr
RM
rr
38 µC
300 A
350 ns
reverse recovery charge
max. reverse recovery current
reverse recovery time
V =
I = A; V = 0 V
F
FGE
E
rec
15 mJ
reverse recovery energy
R
R
thJC
thermal resistance junction to case 0.145 K/W
V = V
T = 25°C
C
T = 25°C
VJ
T = °C
VJ
VJ
300
12
300
300
300
300
2.2
2.2
2.2
600
900
4500
600
I
CM
1.8
R
thCH
thermal resistance case to heatsink 0.04 K/W
R
thCH
thermal resistance case to heatsink 0.05 K/W
* not applicable, see Ices value above
IGBT
Diode
600 V
V = V
CEmax
1200
80
80
80
80
125
125
125
125
125
µA
IXYS reserves the right to change limits, conditions and dimensions. 20121105Data according to IEC 60747and per semiconductor unless otherwise specified
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