PE29102
Document Category: Product Specification
UltraCMOS® High-speed FET Driver, 40 MHz
©2017, Peregrine Semiconductor Corporation. All rights reserved. • Headquarters: 9380 Carroll Park Drive, San Diego, CA, 92121
Product Specification DOC-81227-4 – (10/2017)
www.psemi.com
Features
• High- and Low-side FET drivers
• Dead-time control
• Fast propagation delay, 9 ns
• Tri-state enable mode
• Sub-nanosecond rise and fall time
• 2A/4A peak source/sin k current
• Package – Flip chip
Applications
• Class D audio
• DC–DC / AC–DC converters
• Wireless charging
• Envelope tracking
•LiDAR
Product Description
The PE29102 is an integrated high-speed driver designed to control the gates of external power devices, such
as enhancement mode gallium nitride (GaN) FETs. The outputs of the PE29102 are capable of providing
switching transition speeds in the sub-nanosecon d range for sw itching applica tions up to 40 MHz. The PE2910 2
is optimized for matched dead time and offers best-in-class propagation delay to improve system bandwidth.
High switching speeds result in smaller peripheral components and enable innovative designs for applications
such as class D audio and wireless charging. The PE29102 is available in a flip chip package.
The PE29102 is manufactured on Peregrine’s UltraCMOS process, a patented advanced form of silicon-on-
insulator (SOI) technology, offering the performance of GaAs with the economy and integration of conventional
CMOS.
Figure 1 • PE29102 Functional Diagram
PE29102
High-speed FET Driver
Page 2 DOC-81227-4 – (10/2017)
www.psemi.com
Absolute Maximum Ratings
Exceeding absolute maximum ratings listed in Table 1 may cause permanent damage. Operation should be
restricted to the limits in Table 2. Operation between operating range maximum and absolute maximum for
extended periods may reduce reliability.
ESD Precautions
When handling this UltraCMOS device, observe the same precautions as with any other ESD-sensitive devices.
Although this device contains circuitry to protect it from damage due to ESD, precautions should be taken to
avoid exceeding the rating specified in Table 1.
Latch-up Immunity
Unlike conventional CMOS devices, UltraCMOS devices are immune to latch-up.
Table 1 • Absolute Maximum Ratings for PE29102
Parameter/Condition Min Max Unit
Low-side bias (LSB) to low-side source (LSS) –0.3 7 V
High-side bias (HSB) to high-side source (HSS) –0.3 7 V
Input signal –0.3 7 V
HSS to LSS –1 100 V
ESD voltage HBM(*), all pins 500 V
Note: * Human body mo del ( J EDE C JS –0 01, Table 2A).
DOC-81227-4 – (10/2017) Page 3
www.psemi.com
PE29102
High-speed FET Driver
Recommended Operating Conditions
Table 2 lists the recommended operating conditions for the PE29102. Devices should not be operated outside
the recommended operating conditions listed below.
Electrical Specifications
Table 3 provides the key electrical specifications @ +25 °C, VDD = 5V, 100 pF load, HSB and LSB bootstrap
diode included unless otherwise specified.
Table 2 • Recommended Operating Conditions for PE29102
Parameter Min Typ Max Unit
Supply for driver front-end, VDD 4.0 5.0 6.0 V
Supply for high-side driver, HSB 4.0 5.0 6.0 V
Supply for low-side driver, LSB 4.0 5.0 6.0 V
HIGH level input voltage, VIH 1.6 6.0 V
LOW level input voltage, VIL 0 0.6 V
HSS range 0 60 V
Operating temperature –40 +105 °C
Junction temperature –40 +125 °C
Table 3 • DC Characteristics
Parameter Condition Min Typ Max Unit
DC Characteristics
VDD quiescent current VDD = 5V 1.3 mA
HSB quiescent current VDD = 5V 2.7 mA
LSB quiescent current VDD = 5V 2.7 mA
Total quiescent current VDD = 5V 6.7 9.0 mA
VDD quiescent current VDD = 6V 1.6 mA
HSB quiescent current VDD = 6V 3.6 mA
LSB quiescent current VDD = 6V 3.6 mA
Total quiescent current VDD = 6V 9.0 11.6 mA
Under Voltage Lockout
Under voltage release (risi ng) 3.6 3.8 V
Under voltage hysteresis 400 mV
Gate Drivers
HSGPU/LSGPU pull-up resistan ce 1.9 Ω
HSGPD/LSGPD pull-down resistance 1.3 Ω
HSGPU/LSGPU leakage current HSB–HSGPU = 5V, LSB–LSGPU = 5V 10 µA
HSGPD/LSGPD leakage current HSGPD–HSS = 5V, LSGPD–LSS = 5V 10 µA
PE29102
High-speed FET Driver
Page 4 DOC-81227-4 – (10/2017)
www.psemi.com
Control Logic
Table 4 provides the control logic truth table for the PE29102.
Dead-time Control
Dead-time control voltages 80 kΩ resistor to GND 1.3 V
Dead-time from HSG going low to
LSG going high
RDHL = 30 kΩ1.9 ns
RDHL = 80.6 kΩ7.0 ns
RDHL = 150 kΩ13.6 ns
RDHL = 255 kΩ23.5 ns
Dead-time from LSG going low to
HSG going high
RDLH = 30 kΩ1.8 ns
RDLH = 80.6 kΩ6.7 ns
RDLH = 150 kΩ13.2 ns
RDLH = 255 kΩ22.7 ns
Switching Characteristics
LSG turn-off propagation delay At min dead time 9.1 ns
HSG rise time 10 - 90% with 100pF load 0.9 ns
LSG rise time 10 - 90% with 100pF load 0.9 ns
HSG fall time 90 - 10% with 100pF load 0.8 ns
LSG fall time 90 - 10% with 100pF load 0.9 ns
Minimum output pulse width 2.8 5.0 ns
Max switching frequency @ 50% duty
cycle RDHL = RDLH = 80 kΩ40 MHz
Table 3 • DC Characteristics (Cont.)
Parameter Condition Min Typ Max Unit
Table 4 • Truth Table for PE29102
EN IN HSGPU–HSS HSGPD–HSS LSGPU–LSS LSGPD–LSS
L L Hi–Z L H Hi–Z
L H H Hi–Z Hi–Z L
H L Hi–Z L Hi–Z L
H H Hi–Z L Hi–Z L
DOC-81227-4 – (10/2017) Page 5
www.psemi.com
PE29102
High-speed FET Driver
Typical Performance Data
Figure 2 through Figure 4 show the typical performance data @ +25 °C, VDD = 5V, load = 2.2Ω resistor in series
with 100 pF capacitor, HSB and LSB bootstrap diode included, unless otherwise specified.
Figure 2 • Total Quiescent Current (mA)
0
1
2
3
4
5
6
7
8
9
10
-40 25 105
Total Quiescent Current (mA)
Temperature (°C)
VDD = 4V VDD = 5V VDD = 6V
DOC-81227-4 – (10/2017) Page 7
www.psemi.com
PE29102
High-speed FET Driver
Test Diagram
Figure 5 shows the test circuit used for obtaining measurements. The two bootstrap diodes shown in the
schematic are used for symmetry purposes in characterization. In practice, only the HSB diode is required.
Removing the LSB diode will result in higher low-side supply voltage since the diode drop is eliminated. As a
result, the dead-time resistor can be adjusted to compensate for any changes in propagation delay.
Figure 5 • Test Circuit for PE29102
RDHL
GND
IN
HSB
VDD
HSGPU
HSGPD
HSS
LSB
LSS
RDLH
PHCTL
LSGPU
LSGPD
Dead
Time
Controller
UVLO Level
Shifter
Output
Driver
Logic Phase
Control
Level
Shifter
Output
Driver
VDD
VIN
Q1
Q2
VSW
EN
PE29102
High-speed FET Driver
Page 8 DOC-81227-4 – (10/2017)
www.psemi.com
Theory of Operation
General
The PE29102 is intended to drive both the high-side (HS) and the low-side (LS) gates of external power FETs,
such as enhancement mode GaN FETs, for power management applications. The PE29102 is suited for applica-
tions requiring higher switching speeds due to the reduced parasitic properties of the high resistivity insulating
substrate inherent with Peregrine’s UltraCMOS process.
The driver uses a single-ended pulse width modulation (PWM) input that feeds a dead-time controller, capable
of generating a small and accurate dead-time. The dead-time circuit prevents shoot-through current in the
output stage. The propagation delay of the dead-time controller must be small to meet the fast switching require-
ments when driving GaN FETs. The differential outputs of the dead-time controller are then level-shifted from a
low-voltage domain to a high-voltage domain required by the output drivers.
Each of the output drivers includes two separate pull-up and pull-down outputs allowing independent control of
the turn-on and turn-off gate loop resistance. The low impedance output of the drivers improves external power
FETs switching speed and efficiency, and minimizes the effects of the voltage rise time (dv/dt) transients.
Under-voltage Lockout
An internal under-voltage lockout (UVLO) feature prevents the PE29102 from powering up before input voltage
rises above the UVLO threshold of 3.6V (typ), and 400 mV (typ) of hysteresis is built in to prevent false
triggering of the UVLO circuit. The UVLO must be cleared and the EN pin must be released before the part will
be enabled.
Dead-time Adjustment
The PE29102 features a dead-time adjustment that allows the user to control the timing of the LS and HS gates
to eliminate any large shoot-through currents, which could dramatically reduce the efficiency of the circuit and
potentially damage the GaN FETs. Two external resistors contro l the timing of outputs in the dead-time controller
block. The timing waveforms are illustrated in Figure 6.
The dead-time resistors only af fect the rising edge of the low-side gate (LSG) and high -side gate (HSG) outputs.
Dead-time resistor RDLH will delay the rising edge of HSG, thus providing the desired dead-time between LSG
falling and HSG rising. Likewise, dead-time resistor RDHL will delay the rising edge of LSG, thus providing the
desired dead-time between HSG falling and LSG rising. Figure 7 shows the resulting dead-time versus the
external resistor values with both HS and LS bias diode/capacitors installed as indicated in Figure 5. The LS
bias diode and capacitor are included for symmetry only and are not required for the part to function. Removing
the LS bias diode will in crease th e LSG voltag e by a pproximately 0.3V, resulting in a wider separation of the tDHL
and tDLH curves in Figure 7.
Phase Control
Pin 10 (PHCTL) controls the polarity of the gate driver outputs. When PHCTL is high, the HSG will be in phase
with the input signal. When PHCTL is low, the LSG will be in phase with the input signal. The PHCTL pin
includes an internal pull-down resistor and can be left floating.
DOC-81227-4 – (10/2017) Page 9
www.psemi.com
PE29102
High-speed FET Driver
Figure 6 and Figure 7 provide the dead-time description for the PE29102.
Figure 6 • Dead-time Description
IN
HSG-HSS
LSG-LSS
tIN
tDLH
tHON
tDHL
tLON
Figure 7 • Dead-time between HSG and LSG (ns)
0
5
10
15
20
25
0 50 100 150 200 250 300
Dead-time between HSG and LSG (ns)
Dead-time Resistance (kΩ)
RDLH RDHL
PE29102
High-speed FET Driver
Page 10 DOC-81227-4 – (10/2017)
www.psemi.com
Application Circuit
Figure 8 shows a class-D audio amplifier application diagram using two PE29102 gate drivers in a full-bridge
configuration. The full-bridge circuit comprises two half bridge topologies that share a common supply and load.
The low-level logic circuitry is powered by the gate drive regulator that supplies the PE29102 drivers, logic buf fer
and phase splitter. The PWM input signal feeds a single logic buffer, which drives a common logic X-OR gate
Phase Splitter that provides phase inverted signals to each driver. VIN is designed to operate at 60V DC (max.)
to provide between 100 — 120W of power into an 8Ω load.
Figure 8 • PE29102 Class D Audio Amplifier Block Diagram
Gate
Drive
Regulator
Logic
Buffer
PE29102
Gate Driver
#1
Logic
Phase
Splitter
PE29102
Gate Driver
#2
VIN VIN
L1L2
C
L.S.
GND
VSW1 VSW2
DOC-81227-4 – (10/2017) Page 11
www.psemi.com
PE29102
High-speed FET Driver
Evaluation Board
The PE29102 evaluation board (EVB) allows the user to evaluate the PE29102 gate driver in either a full-bridge
configuration or two independent half-bridge configurations. The EVB is assembled with two PE29102 FET
drivers and four GS61004B E-mode GaN FETs. Refer to Peregrine Semiconductor DOC-82956 for more
information.
Because the PE29102 is capable of generating fast switching speeds, the printed circuit board (PCB) layout is a
critical component of the design. The layout should occupy a small area with the power FETs and external
bypass capacitors placed as close as possible to the driver to reduce any resonances associated with the gate
loops, common source and power loop inductances. Since the maximum allowable gate-to-source voltage for
the GS61004B FETs is 7V, resonance in the gate loops can generate ringing that can degrade the performance
and potentially damage the power devices d ue to high voltage spikes. Additionally, it is important to keep ground
paths short.
The PCB is fabricated on FR4 material, with a total thickness of 0.062 inches. A minimum copper thickness of
1.5 ounces or more is recommended on the PCB outer layers to limit resistive losses and improve thermal
spreading.
Figure 9 • PE29102 Evaluation Board Assembly
PE29102
High-speed FET Driver
Page 12 DOC-81227-4 – (10/2017)
www.psemi.com
Pin Configuration
This section provides pin information for the
PE29102. Figure 10 shows the pin map of this device
for the available package. Table 5 provides a
description for each pin.
Figure 10 • Pin Configuration (Bumps Up)
NCHSBHSSHSGPD
HSGPU
LSGPU
LSG
PD
LSS LSB V
DD
RDHL
GND
INEN
PHCTL
RDLH
5
8
11
1615141312
9
6
1234
7
10
Table 5 • Pin Descriptions for PE29102
Pin No. Pin
Name Description
1HSGPD High-side gate drive pull-down
2 HSS High-side source
3 HSB High-side bias
4 NC No connect (tie to board ground)
5RDLH
Dead-time control resistor sets LSG
falling to HSG rising delay (external
resistor to GND)
6HSGPU High-side gate drive pull-up
7(*) EN Enable active low, tri-state outputs
when high
8(*) IN Control input
9LSGPU Low-side gate drive pull-up
10(*) PHCTL Controls the polarity of the gate driver
outputs
11 GND Ground
12 LSGPD Low-side gate drive pull-down
13 LSS Low-side source
14 LSB Low-side bias
15 VDD +5V supply vol tage
16 RDHL Dead-time control resistor sets HSG
falling to LSG rising delay (external
resistor to ground)
Note: * Internal 100k pull down resistor
DOC-81227-4 – (10/2017) Page 13
www.psemi.com
PE29102
High-speed FET Driver
Die Mechanical Specifications
This section provides the die mechanical specifications for the PE29102.
Table 6 • Die Mechanical Specifications for PE29102
Parameter Min Typ Max Unit Test Condition
Die size, singulated (x,y) 2040 × 1640 µm Including sapphire,
max tolerance = –20/+30
Wafer thickness 180 200 220 µm
Wafer size µm
Bump pitch 400 µm
Bump height 85 µm
Bump diameter 110 µm max tolerance = ±17
Table 7 • Pin Coordinates for PE29102(*)
Pin # Pin Name Pin Center (µm)
X Y
1HSGPD –800 600
2 HSS –400 600
3HSB0600
4 NC 400 600
5 RDLH 800 600
6HSGPU –800 200
7EN400 200
8 IN 800 200
9LSGPU –800 –200
10 PHCTL 400 –200
11 GND 800 –200
12 LSGPD –800 –600
13 LSS –400 –600
14 LSB 0 –600
15 VDD 400 –600
16 RDHL 800 –600
Note: * All pin locations originate from the die center and refer to the
center of the pin.
Figure 11 • Pin Layout for PE29102(1)(2)
Notes:
1) Drawings are not drawn to scale.
2) Singulated d i e size sho wn , bum p sid e up .
NC
1640 µm (−20 / +30 µm)
2040 µm (−20 / +30 µm)
HSBHSSHSGPD
HSGPU
LSGPU
LSG
PD
LSS LSB V
DD
RDHL
GND
IN
PHCTL
RDLH
5
8
11
1615141312
9
6
1234
7
10
EN
PE29102 High-speed FET Driver
Product Specification www.psemi.com DOC-81227-4 – (10/2017)
Document Categories
Advance Information
The product is in a formative or design stage. The datasheet contains design target specifications for product development. Specifications and
features may change in any manner without notice.
Preliminary Specification
The datasheet contains preliminary data. Additional data may be added at a later date. Peregrine reserves the right to change specifications at any
time without notice in order to supply the best possible product.
Product Specification
The datasheet contains final data. In the event Peregrine decides to change the specifications, Peregrine will notify customers of the intended
changes by issuing a CNF (Customer Notification Form).
Sales Contact
For additional information, contact Sales at sales@psemi.com.
Disclaimers
The information in this document is believed to be reliable. However, Peregrine assumes no liability for the use of this information. Use shall be
entirely at the user’s own risk. No patent rights or licenses to any circuits described in this document are implied or granted to any third party.
Peregrine’s products are not designed or intended for use in devices or systems intended for surgical implant, or in other applications intended to
support or sustain life, or in any application in which the failure of the Peregrine product could create a situation in which personal injury or death
might occur. Peregrine assumes no liability for damages, including consequential or incidental damages, arising out of the use of its products in
such applications.
Patent Statement
Peregrine products are protected under one or more of the following U.S. patents: patents.psemi.com
Copyright and Trademark
©2017, Peregrine Semiconductor Corporation. All rights reserved. The Peregrine name, logo, UTSi and UltraCMOS are registered trademarks and
HaRP, MultiSwitch and DuNE are trademarks of Peregrine Semiconductor Corp.
Ordering Information
Table 8 lists the available ordering code for the PE29102.
Table 8 • Order Code for PE29102
Order Codes Description Packaging Shipping Method
PE29102A-X PE29102 flip chip Die on tape and reel 500 units/T&R
PE29102A-Z PE29102 flip chip Die on tape and reel 3000 units/T&R
