ICS841S104I Data Sheet CRYSTAL-TO-HCSL 100MHZ PCI EXPRESSTM CLOCK SYNTHESIZER
ICS841S104EGI REVISION A JUNE 18, 2010 8 ©2010 Integrated Device Technology, Inc.
AC Electrical Characteristics
Table 6B. AC Characteristics, VDD = 3.3V ± 5%, TA = -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE: Characterized using a 25MHz quartz crystal.
NOTE 1: Refer to phase jitter plot.
NOTE 2: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at the differential cross
points.
NOTE 4: Spread Spectrum clocking enabled.
NOTE 5: Measurement taken from differential waveform.
NOTE 6: TSTABLE is the time the differential clock must maintain a minimum ± 150mV differential voltage after rising/falling edges before it is
allowed to drop back into the VRB ±100mV differential range.
NOTE 7: Measurement taken from single-ended waveform.
NOTE 8: Defined as the maximum instantaneous voltage including overshoot. See Parameter Measurement Information Section.
NOTE 9: Defined as the minimum instantaneous voltage including undershoot. See Parameter Measurement Information Section.
NOTE 10: Measured at crossing point where the instantaneous voltage value of the rising edge of SRCT equals the falling edge of SRCC.
NOTE 11: Refers to the total variation from the lowest crossing point to the highest, regardless of which edge is crossing. Refers to all crossing
points for this measurement.
NOTE 12: Defined as the total variation of all crossing voltages of rising SRCT and falling SRCC, This is the maximum allowed variance in
Vcross for any particular system.
NOTE 13: Measured from -150mV to +150mV on the differential waveform (SRCT minus SRCC). The signal must be monotonic through the
measurement region for rise and fall time. The 300mV measurement window is centered on the differential zero crossing.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
fMAX Output Frequency 100 MHz
fREF Reference frequency 25 MHz
tjit(Ø) Phase Jitter, RMS (Random);
NOTE 1
25MHz crystal, ƒ = 100MHz,
Integration Range: 12kHz – 20MHz 1.145 ps
tsk(o) Output Skew; NOTE 2, 3 40 ps
tjit(cc) Cycle-to-Cycle Jitter; NOTE 2 PLL Mode 20 ps
tLPLL Lock Time 50 ms
FM
SSC Modulation Frequency;
NOTE 4 25MHz Crystal 30 32 33.33 kHz
SSCRED Spectral Reduction; NOTE 4 -7 -10 dB
VRB
Ring-back Voltage Margin;
NOTE 5, 6 -100 100 mV
VMAX
Absolute Max. Output Voltage;
NOTE 7, 8 1150 mV
VMIN
Absolute Min. Output Voltage;
NOTE 7, 9 -300 mV
VCROSS
Absolute Crossing Voltage;
NOTE 7, 10, 11 250 550 mV
∆VCROSS
Total Variation of VCROSS over
all edges; NOTE 7, 10, 12 140 mV
Rise/Fall Edge Rate;
NOTE 7, 13 Measured between 150mV to +150mV 0.6 4.0 V/ns
odc Output Duty Cycle 48 52 %