POE International Corp
M01-00-E-07
SPECIFICATION OF HIGH POWER CHIP RESISTOR
Ver: 1
Page: 6 of 7
TEST AND REQUIREMENTS
Basic specification : JIS C 5201-1 : 1998
TEST PROCEDURE REQUIREMENT
clause 4.8
Temperature
Coefficient of
Resistance (TCR )
Natural resistance change per change in degree centigrade.
( )
6
121
12 10×
−
ttR RR (ppm/°C)
R1 : Resistance at reference temperature
R2 : Resistance at test temperature
t1 : 25°C
Test temperature –55~+155°C
>10Ω, ≤ ±200ppm/°C
≦10Ω, -300 ~ +500ppm/°C
clause 4.13
Short time overload
Permanent resistance change after a 5
5 times rated power or twice of the limiting element voltage,
whichever is less.
no visible damage
∆R/R max. ±(2.0%+0.1Ω)
clause 4.17
Solderability
Termination SnPb base : Unmounted chips completely
immersed for 2±0.5 sec. in a solder bath at 235±5ºC
Termination Sn base (lead free) : Unmounted chip
completely immersed in a lead free solder bath, 245°C±5°C,
3±1 sec
good tinning (>95% covered)
no visible damage
clause 4.18
Resistance to
soldering heat
After immersion into the flux, the immersion into solder shall
be carried out in solder bath at 5±1 seconds, 260±5ºC no visible damage
∆ R/R max. ±(1.0%+0.05Ω)
clause 4.19
Temperature cycling
1. 30 minutes at -55°C±3°C,
2. 2~3 minutes at room temperature,
3. 30 minutes at +125°±3°C,
4. 2~3 minutes at room temperature,
Total 5 continuous cycles
no visible damage
∆R/R max. ±(1.0%+0.05Ω)
clause 4.24
Load life in Humidity
1000 hours, at rated continuous working voltage in humidity
chamber controller at 40°C±2°C and 90~95% relative
humidity, 1.5hours on and 0.5 hours off
no visible damage
∆R/R max. ±(5%+0.1Ω)
clause 4.25.1
Load life (endurance)
70±2ºC, 1000 hours, loaded with RCWV or Vmax,1.5 hours
on and 0.5 hours off no visible damage
∆R/R max. ±(5%+0.1Ω)
clause 4.25.3
Endurance at the
upper category
temperature
125ºC, 1000 hours, no load. no visible damage
∆R/R max. ±(5%+0.1Ω)
clause 4.32
Bending and
Termination strength
Resistors mounted on a 90mm glass epoxy resin PCB(FR4);
bending : 3 mm, once for 10 seconds
Pulling test : 5N, 10 seconds
no visible damage
∆R/R max. ±(1.0%+0.05Ω)