K3P6C1000B-TC CMOS MASK ROM
ABSOLUTE MAXIMUM RATINGS
NOTE : Permanent device damage may occur if "ABSOLUTE MAXIMUM RATINGS" are exceeded. Functional operation should be restricted to the con-
ditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may
affect device reliability.
Item Symbol Rating Unit
Voltage on Any Pin Relative to VSS VIN -0.3 to +7.0 V
Temperature Under Bias TBIAS -10 to +85 °C
Storage Temperature TSTG -55 to +150 °C
RECOMMENDED OPERATING CONDITIONS(Voltage reference to VSS, TA=0 to 70°C)
Item Symbol Min Typ Max Unit
Supply Voltage VCC 4.5 5.0 5.5 V
Supply Voltage VSS 000V
DC CHARACTERISTICS
NOTE : Minimum DC Voltage(VIL) is -0.3V an input pins. During transitions, this level may undershoot to -2.0V for periods <20ns.
Maximum DC voltage on input pins(VIH) is VCC+0.3V which, during transitions, may overshoot to VCC+2.0V for periods <20ns.
Parameter Symbol Test Conditions Min Max Unit
Operating Current ICC Cycle=5MHz, all outputs open
CE=OE=VIL, VIN=0.6V to 2.4V (AC Test Condition) -150 mA
Standby Current(TTL) ISB1 CE=VIH, all outputs open -1mA
Standby Current(CMOS) ISB2 CE=VCC, all outputs open -50 µA
Input Leakage Current ILI VIN=0 to VCC -10 µA
Output Leakage Current ILO VOUT=0 to VCC -10 µA
Input High Voltage, All Inputs VIH 2.2 VCC+0.3 V
Input Low Voltage, All Inputs VIL -0.3 0.8 V
Output High Voltage Level VOH IOH=-400µA2.4 -V
Output Low Voltage Level VOL IOL=2.1mA -0.4 V
MODE SELECTION
CE OE BHE Q15/A-1 Mode Data Power
HXXXStandby High-Z Standby
LHX X Operating High-Z Active
L L HOutput Operating Q0~Q15 : Dout Active
LInput Operating Q0~Q7 : Dout
Q8~Q14 : Hi-Z Active
CAPACITANCE(TA=25°C, f=1.0MHz)
NOTE : Capacitance is periodically sampled and not 100% tested.
Item Symbol Test Conditions Min Max Unit
Output Capacitance COUT VOUT=0V -12 pF
Input Capacitance CIN VIN=0V -12 pF